DE69320894T2 - Apparat zur Messung elektrischer Felder - Google Patents

Apparat zur Messung elektrischer Felder

Info

Publication number
DE69320894T2
DE69320894T2 DE69320894T DE69320894T DE69320894T2 DE 69320894 T2 DE69320894 T2 DE 69320894T2 DE 69320894 T DE69320894 T DE 69320894T DE 69320894 T DE69320894 T DE 69320894T DE 69320894 T2 DE69320894 T2 DE 69320894T2
Authority
DE
Germany
Prior art keywords
electric fields
measuring electric
measuring
fields
electric
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69320894T
Other languages
English (en)
Other versions
DE69320894D1 (de
Inventor
Hironori Takahashi
Shinichiro Aoshima
Isuke Hirano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of DE69320894D1 publication Critical patent/DE69320894D1/de
Application granted granted Critical
Publication of DE69320894T2 publication Critical patent/DE69320894T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
DE69320894T 1992-07-24 1993-07-23 Apparat zur Messung elektrischer Felder Expired - Fee Related DE69320894T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19879192 1992-07-24

Publications (2)

Publication Number Publication Date
DE69320894D1 DE69320894D1 (de) 1998-10-15
DE69320894T2 true DE69320894T2 (de) 1999-03-04

Family

ID=16396972

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69320894T Expired - Fee Related DE69320894T2 (de) 1992-07-24 1993-07-23 Apparat zur Messung elektrischer Felder

Country Status (3)

Country Link
US (1) US5592101A (de)
EP (1) EP0580446B1 (de)
DE (1) DE69320894T2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3323572B2 (ja) * 1993-03-15 2002-09-09 浜松ホトニクス株式会社 電圧測定装置のｅ−ｏプローブ位置決め方法
JP2000214230A (ja) * 1999-01-20 2000-08-04 Ando Electric Co Ltd 電気光学サンプリングプロ―バ
US6906506B1 (en) 2001-06-08 2005-06-14 The Regents Of The University Of Michigan Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe
US7667854B2 (en) * 2006-12-18 2010-02-23 Battelle Energy Alliance, Llc Hand-held survey probe
DE102007049530A1 (de) * 2007-10-15 2009-04-16 Eltex-Elektrostatik Gmbh Vorrichtung zur kontaktlosen Bestimmung eines elektrischen Feldes auf oder in einem Medium
JP6266813B2 (ja) 2015-10-16 2018-01-24 Ｊｘ金属株式会社 光変調素子および電界センサ

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
EP0293497B1 (de) * 1987-05-26 1993-03-10 Ibm Deutschland Gmbh Kontaktsonden-Anordnung mit Feinpositionier-Vorrichtung
US4996475A (en) * 1987-05-31 1991-02-26 Hamamatsu Photonics Kabushiki Kaisha Electro-optic voltage detector having a transparent electrode
US5272434A (en) * 1987-06-20 1993-12-21 Schlumberger Technologies, Inc. Method and apparatus for electro-optically testing circuits
JP2588965B2 (ja) * 1989-03-13 1997-03-12 日本電信電話株式会社 電界測定用プローブ
US4928058A (en) * 1989-05-23 1990-05-22 The University Of Rochester Electro-optic signal measurement
JPH0810776B2 (ja) * 1990-06-28 1996-01-31 浜松ホトニクス株式会社 狭スペクトル短パルス光源装置及び電圧検出装置
US5274325A (en) * 1991-03-18 1993-12-28 Nippon Telegraph And Telephone Corporation Method and apparatus for electro-optic sampling measurement of electrical signals in integrated circuits
US5406213A (en) * 1991-09-10 1995-04-11 Photon Dynamics, Inc. Instrument for testing liquid crystal display base plates
JP3122190B2 (ja) * 1991-10-15 2001-01-09 浜松ホトニクス株式会社 電圧検出装置
US5412330A (en) * 1993-06-16 1995-05-02 Tektronix, Inc. Optical module for an optically based measurement system

Also Published As

Publication number Publication date
DE69320894D1 (de) 1998-10-15
US5592101A (en) 1997-01-07
EP0580446B1 (de) 1998-09-09
EP0580446A1 (de) 1994-01-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee