DE69331433T2 - Einrichtung zur automatischen optischen Prüfung von Leiterplatten mit darin verlegten Drähten - Google Patents

Einrichtung zur automatischen optischen Prüfung von Leiterplatten mit darin verlegten Drähten

Info

Publication number
DE69331433T2
DE69331433T2 DE69331433T DE69331433T DE69331433T2 DE 69331433 T2 DE69331433 T2 DE 69331433T2 DE 69331433 T DE69331433 T DE 69331433T DE 69331433 T DE69331433 T DE 69331433T DE 69331433 T2 DE69331433 T2 DE 69331433T2
Authority
DE
Germany
Prior art keywords
printed circuit
circuit boards
optical inspection
automatic optical
wires laid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69331433T
Other languages
English (en)
Other versions
DE69331433D1 (de
Inventor
Edward P Luke
Damien W P Creavin
Robert R Reetz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advanced Interconnection Technology Inc
Original Assignee
Advanced Interconnection Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Interconnection Technology Inc filed Critical Advanced Interconnection Technology Inc
Publication of DE69331433D1 publication Critical patent/DE69331433D1/de
Application granted granted Critical
Publication of DE69331433T2 publication Critical patent/DE69331433T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30141—Printed circuit board [PCB]
DE69331433T 1992-10-22 1993-10-20 Einrichtung zur automatischen optischen Prüfung von Leiterplatten mit darin verlegten Drähten Expired - Fee Related DE69331433T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US96470592A 1992-10-22 1992-10-22

Publications (2)

Publication Number Publication Date
DE69331433D1 DE69331433D1 (de) 2002-02-14
DE69331433T2 true DE69331433T2 (de) 2002-10-02

Family

ID=25508874

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69331433T Expired - Fee Related DE69331433T2 (de) 1992-10-22 1993-10-20 Einrichtung zur automatischen optischen Prüfung von Leiterplatten mit darin verlegten Drähten

Country Status (5)

Country Link
US (1) US5483603A (de)
EP (1) EP0594146B1 (de)
JP (1) JP2824552B2 (de)
CA (1) CA2108915C (de)
DE (1) DE69331433T2 (de)

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JP5320967B2 (ja) * 2008-10-14 2013-10-23 日立化成株式会社 配線検査装置及び配線検査方法
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KR20150001094A (ko) * 2013-06-26 2015-01-06 삼성디스플레이 주식회사 기판 검사 방법
CN105810134A (zh) * 2016-04-04 2016-07-27 合肥博雷电子信息技术有限公司 一种led显示屏现场测试装置
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KR102078133B1 (ko) * 2018-06-25 2020-02-17 주식회사 수아랩 데이터의 어노말리 감지 방법
CN113118474B (zh) * 2021-03-31 2022-05-03 常州大谷液压器材有限公司 一种免检测的法兰台阶孔加工方法
CN113052829B (zh) * 2021-04-07 2022-06-28 深圳市磐锋精密技术有限公司 一种基于物联网的主板aoi检测方法
CN113375568B (zh) * 2021-05-12 2023-03-31 苏州阿普奇物联网科技有限公司 一种基于激光扫描的金属拉丝抛光不良检测方法

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Also Published As

Publication number Publication date
DE69331433D1 (de) 2002-02-14
EP0594146B1 (de) 2002-01-09
EP0594146A3 (de) 1994-12-07
US5483603A (en) 1996-01-09
CA2108915A1 (en) 1994-04-23
JPH0777496A (ja) 1995-03-20
EP0594146A2 (de) 1994-04-27
CA2108915C (en) 1999-07-13
JP2824552B2 (ja) 1998-11-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee