DE69421226D1 - Auswahlschaltung, die eine Spannung auswählt, welche an einer ersten oder einer zweiten Klemme angelegt ist, in Abhängigkeit vom an der ersten Klemme angelegten Spannungspegel - Google Patents

Auswahlschaltung, die eine Spannung auswählt, welche an einer ersten oder einer zweiten Klemme angelegt ist, in Abhängigkeit vom an der ersten Klemme angelegten Spannungspegel

Info

Publication number
DE69421226D1
DE69421226D1 DE69421226T DE69421226T DE69421226D1 DE 69421226 D1 DE69421226 D1 DE 69421226D1 DE 69421226 T DE69421226 T DE 69421226T DE 69421226 T DE69421226 T DE 69421226T DE 69421226 D1 DE69421226 D1 DE 69421226D1
Authority
DE
Germany
Prior art keywords
terminal
voltage
selects
depending
selection circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69421226T
Other languages
English (en)
Other versions
DE69421226T2 (de
Inventor
Shyuichi Tsukada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Electronics Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of DE69421226D1 publication Critical patent/DE69421226D1/de
Application granted granted Critical
Publication of DE69421226T2 publication Critical patent/DE69421226T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409—Read-write [R-W] circuits 
    • G11C11/4099—Dummy cell treatment; Reference voltage generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
    • G11C29/787—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes using a fuse hierarchy

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE69421226T 1993-08-13 1994-08-12 Auswahlschaltung, die eine Spannung auswählt, welche an einer ersten oder einer zweiten Klemme angelegt ist, in Abhängigkeit vom an der ersten Klemme angelegten Spannungspegel Expired - Fee Related DE69421226T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5201341A JP2727921B2 (ja) 1993-08-13 1993-08-13 半導体集積回路装置

Publications (2)

Publication Number Publication Date
DE69421226D1 true DE69421226D1 (de) 1999-11-25
DE69421226T2 DE69421226T2 (de) 2000-05-31

Family

ID=16439425

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69421226T Expired - Fee Related DE69421226T2 (de) 1993-08-13 1994-08-12 Auswahlschaltung, die eine Spannung auswählt, welche an einer ersten oder einer zweiten Klemme angelegt ist, in Abhängigkeit vom an der ersten Klemme angelegten Spannungspegel

Country Status (5)

Country Link
US (1) US5563546A (de)
EP (1) EP0638902B1 (de)
JP (1) JP2727921B2 (de)
KR (1) KR100193307B1 (de)
DE (1) DE69421226T2 (de)

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US5671189A (en) * 1996-05-28 1997-09-23 Etron Technology, Inc. Low standby power redundancy circuit
US5852378A (en) * 1997-02-11 1998-12-22 Micron Technology, Inc. Low-skew differential signal converter
US5940608A (en) 1997-02-11 1999-08-17 Micron Technology, Inc. Method and apparatus for generating an internal clock signal that is synchronized to an external clock signal
US6104209A (en) 1998-08-27 2000-08-15 Micron Technology, Inc. Low skew differential receiver with disable feature
US5946244A (en) 1997-03-05 1999-08-31 Micron Technology, Inc. Delay-locked loop with binary-coupled capacitor
US6173432B1 (en) 1997-06-20 2001-01-09 Micron Technology, Inc. Method and apparatus for generating a sequence of clock signals
JPH1166890A (ja) * 1997-08-12 1999-03-09 Mitsubishi Electric Corp 半導体集積回路装置
US6108804A (en) * 1997-09-11 2000-08-22 Micron Technology, Inc. Method and apparatus for testing adjustment of a circuit parameter
US6269451B1 (en) 1998-02-27 2001-07-31 Micron Technology, Inc. Method and apparatus for adjusting data timing by delaying clock signal
US6212482B1 (en) 1998-03-06 2001-04-03 Micron Technology, Inc. Circuit and method for specifying performance parameters in integrated circuits
JP3173727B2 (ja) * 1998-03-10 2001-06-04 日本電気株式会社 電圧検出回路
US6338127B1 (en) 1998-08-28 2002-01-08 Micron Technology, Inc. Method and apparatus for resynchronizing a plurality of clock signals used to latch respective digital signals, and memory device using same
US6349399B1 (en) 1998-09-03 2002-02-19 Micron Technology, Inc. Method and apparatus for generating expect data from a captured bit pattern, and memory device using same
US6279090B1 (en) 1998-09-03 2001-08-21 Micron Technology, Inc. Method and apparatus for resynchronizing a plurality of clock signals used in latching respective digital signals applied to a packetized memory device
US6430696B1 (en) 1998-11-30 2002-08-06 Micron Technology, Inc. Method and apparatus for high speed data capture utilizing bit-to-bit timing correction, and memory device using same
US6374360B1 (en) 1998-12-11 2002-04-16 Micron Technology, Inc. Method and apparatus for bit-to-bit timing correction of a high speed memory bus
US6470060B1 (en) 1999-03-01 2002-10-22 Micron Technology, Inc. Method and apparatus for generating a phase dependent control signal
JP2002015599A (ja) * 2000-06-27 2002-01-18 Oki Electric Ind Co Ltd 半導体記憶装置
US6801989B2 (en) 2001-06-28 2004-10-05 Micron Technology, Inc. Method and system for adjusting the timing offset between a clock signal and respective digital signals transmitted along with that clock signal, and memory device and computer system using same
US6744271B2 (en) * 2002-04-30 2004-06-01 Infineon Technologies Ag Internal generation of reference voltage
US7053691B2 (en) * 2003-05-06 2006-05-30 Hewlett-Packard Development Company, L.P. Electrical circuit for selecting a desired power source
US7168027B2 (en) 2003-06-12 2007-01-23 Micron Technology, Inc. Dynamic synchronization of data capture on an optical or other high speed communications link
JP2005038482A (ja) * 2003-07-17 2005-02-10 Toshiba Microelectronics Corp 半導体装置
KR100542695B1 (ko) * 2003-11-13 2006-01-11 주식회사 하이닉스반도체 반도체 소자의 테스트 모드 회로
US7250795B2 (en) * 2005-03-29 2007-07-31 Promos Technologies Pte. Ltd. High-speed, low-power input buffer for integrated circuit devices
KR100799109B1 (ko) * 2006-06-30 2008-01-29 주식회사 하이닉스반도체 반도체 소자
US8212544B2 (en) * 2007-08-13 2012-07-03 SK hynix, Inc. Semiconductor integrated circuit having level regulation for reference voltage
JP2009289784A (ja) * 2008-05-27 2009-12-10 Nec Electronics Corp 半導体集積回路装置
US8222886B2 (en) 2008-06-18 2012-07-17 Hioki Denki Kabushiki Kaisha Voltage detecting apparatus and line voltage detecting apparatus having a detection electrode disposed facing a detected object
WO2010113263A1 (ja) * 2009-03-31 2010-10-07 富士通株式会社 半導体集積回路及び電源電圧制御方法
US8482339B1 (en) * 2009-06-12 2013-07-09 National Acquisition Sub, Inc. Method and apparatus for temperature compensation of filter circuits
US8289062B2 (en) * 2010-09-16 2012-10-16 Micron Technology, Inc. Analog delay lines and adaptive biasing
JP6370151B2 (ja) * 2014-07-31 2018-08-08 エイブリック株式会社 半導体集積回路装置及びその出力電圧調整方法
US9792979B1 (en) * 2016-11-30 2017-10-17 Apple Inc. Process, voltage, and temperature tracking SRAM retention voltage regulator
JP6746659B2 (ja) * 2018-11-09 2020-08-26 華邦電子股▲ふん▼有限公司Ｗｉｎｂｏｎｄ Ｅｌｅｃｔｒｏｎｉｃｓ Ｃｏｒｐ． メモリデバイス及びその内蔵セルフテスト方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5744291A (en) * 1980-08-27 1982-03-12 Toshiba Corp Drive pulse generating circuit of charge transfer element
US4469959A (en) * 1982-03-15 1984-09-04 Motorola, Inc. Input buffer
JPS5974721A (ja) * 1982-10-21 1984-04-27 Toshiba Corp シユミツト・トリガ回路
US4556804A (en) * 1983-11-17 1985-12-03 Motorola, Inc. Power multiplexer switch and method
US4617473A (en) * 1984-01-03 1986-10-14 Intersil, Inc. CMOS backup power switching circuit
US4694430A (en) * 1985-03-21 1987-09-15 Sprague Electric Company Logic controlled switch to alternate voltage sources
US4763020B1 (en) * 1985-09-06 1997-07-08 Ricoh Kk Programmable logic device having plural programmable function cells
JP2605687B2 (ja) * 1986-04-17 1997-04-30 三菱電機株式会社 半導体装置
JP2733796B2 (ja) * 1990-02-13 1998-03-30 セイコーインスツルメンツ株式会社 スイッチ回路
JPH041992A (ja) * 1990-04-18 1992-01-07 Toshiba Corp 半導体記憶装置
JPH04172011A (ja) * 1990-11-05 1992-06-19 Mitsubishi Electric Corp 半導体集積回路
US5187396A (en) * 1991-05-22 1993-02-16 Benchmarq Microelectronics, Inc. Differential comparator powered from signal input terminals for use in power switching applications

Also Published As

Publication number Publication date
US5563546A (en) 1996-10-08
EP0638902B1 (de) 1999-10-20
KR950006850A (ko) 1995-03-21
JP2727921B2 (ja) 1998-03-18
JPH0758297A (ja) 1995-03-03
EP0638902A2 (de) 1995-02-15
DE69421226T2 (de) 2000-05-31
KR100193307B1 (ko) 1999-06-15
EP0638902A3 (de) 1995-05-17

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP

8339 Ceased/non-payment of the annual fee