DE69422258D1 - Verbindungseinrichtung - Google Patents

Verbindungseinrichtung

Info

Publication number
DE69422258D1
DE69422258D1 DE69422258T DE69422258T DE69422258D1 DE 69422258 D1 DE69422258 D1 DE 69422258D1 DE 69422258 T DE69422258 T DE 69422258T DE 69422258 T DE69422258 T DE 69422258T DE 69422258 D1 DE69422258 D1 DE 69422258D1
Authority
DE
Germany
Prior art keywords
connecting device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69422258T
Other languages
English (en)
Other versions
DE69422258T2 (de
Inventor
Durwood Airhart
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE69422258D1 publication Critical patent/DE69422258D1/de
Application granted granted Critical
Publication of DE69422258T2 publication Critical patent/DE69422258T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425—Test clips, e.g. for IC's
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S439/00—Electrical connectors
    • Y10S439/912—Electrical connectors with testing means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE69422258T 1993-10-26 1994-10-25 Verbindungseinrichtung Expired - Fee Related DE69422258T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/143,004 US5391082A (en) 1993-10-26 1993-10-26 Conductive wedges for interdigitating with adjacent legs of an IC or the like

Publications (2)

Publication Number Publication Date
DE69422258D1 true DE69422258D1 (de) 2000-01-27
DE69422258T2 DE69422258T2 (de) 2000-05-18

Family

ID=22502162

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69422258T Expired - Fee Related DE69422258T2 (de) 1993-10-26 1994-10-25 Verbindungseinrichtung

Country Status (4)

Country Link
US (1) US5391082A (de)
EP (1) EP0650062B1 (de)
JP (1) JPH07191089A (de)
DE (1) DE69422258T2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5701086A (en) * 1993-10-26 1997-12-23 Hewlett-Packard Company Connecting test equipment to adjacent legs of an IC or the like by interdigitating conductive wedges with the legs
US6773291B1 (en) * 1993-11-12 2004-08-10 Intel Corporation Compliant communications connectors
US5561653A (en) * 1994-11-10 1996-10-01 Acer Peripherals Inc. Ejector for a tray device
US5507652A (en) * 1995-02-17 1996-04-16 Hewlett-Packard Company Wedge connector for integrated circuits
ATE297262T1 (de) * 1996-01-11 2005-06-15 Gregory Edye Ross Perimeter beschichtungsverfahren
US6668242B1 (en) * 1998-09-25 2003-12-23 Infineon Technologies North America Corp. Emulator chip package that plugs directly into the target system
DE20002713U1 (de) * 2000-02-16 2001-06-28 Weidmueller Interface Teststecker für Reihenklemmen
US6518780B1 (en) * 2000-07-31 2003-02-11 Lecroy Corporation Electrical test probe wedge tip
US20050086037A1 (en) * 2003-09-29 2005-04-21 Pauley Robert S. Memory device load simulator
JP2006261144A (ja) * 2005-03-15 2006-09-28 Minowa Koa Inc 抵抗器の製造法及び抵抗器の検測装置
FR2897503B1 (fr) * 2006-02-16 2014-06-06 Valeo Sys Controle Moteur Sas Procede de fabrication d'un module electronique par fixation sequentielle des composants et ligne de production correspondante
JP5351453B2 (ja) * 2008-07-09 2013-11-27 日本電子材料株式会社 コンタクトプローブ複合体
US10197599B2 (en) 2015-12-16 2019-02-05 Infineon Technologies Ag Test pin configuration for test device for testing devices under test

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2752749C3 (de) * 1977-11-25 1980-06-04 Siemens Ag, 1000 Berlin Und 8000 Muenchen Kontaktiervorrichtung
US4339651A (en) * 1980-09-08 1982-07-13 Siemens Aktiengesellschaft Method for soldering leads to electrical components
JPS6174355A (ja) * 1984-09-19 1986-04-16 Hitachi Hokkai Semiconductor Kk ハンドラ
DE3446622A1 (de) * 1984-12-20 1986-06-26 Krone Gmbh, 1000 Berlin Steckereinsatz fuer stecker mit hoher steckhaeufigkeit
JPS63149576A (ja) * 1986-12-12 1988-06-22 Mitsubishi Electric Corp 基板検査装置
EP0305951B1 (de) * 1987-08-31 1994-02-02 Everett/Charles Contact Products Inc. Prüfen von integrierten Schaltungen auf einer bestückten Leiterplatte
US4996476A (en) * 1989-11-06 1991-02-26 Itt Corporation Test clip for surface mount device
US5015946A (en) * 1990-02-26 1991-05-14 Tektronix, Inc. High density probe
US5071363A (en) * 1990-04-18 1991-12-10 Minnesota Mining And Manufacturing Company Miniature multiple conductor electrical connector
DE69224473T2 (de) * 1992-06-03 1998-10-08 Itt Mfg Enterprises Inc IC Testklemme mit federnden Kontakten
TW238431B (de) * 1992-12-01 1995-01-11 Stanford W Crane Jr
JPH06174355A (ja) * 1992-12-04 1994-06-24 Sanyo Electric Co Ltd 低温庫
US5330372A (en) * 1993-05-13 1994-07-19 Minnesota Mining And Manufacturing Company High-density connector
US5345364A (en) * 1993-08-18 1994-09-06 Minnesota Mining And Manufacturing Company Edge-connecting printed circuit board

Also Published As

Publication number Publication date
JPH07191089A (ja) 1995-07-28
DE69422258T2 (de) 2000-05-18
EP0650062A2 (de) 1995-04-26
EP0650062B1 (de) 1999-12-22
US5391082A (en) 1995-02-21
EP0650062A3 (de) 1996-01-10

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: HEWLETT-PACKARD CO. (N.D.GES.D.STAATES DELAWARE),

8339 Ceased/non-payment of the annual fee