DE69614195T2 - Vielchip pre-kontaktierter Halbleiter - Google Patents

Vielchip pre-kontaktierter Halbleiter

Info

Publication number
DE69614195T2
DE69614195T2 DE69614195T DE69614195T DE69614195T2 DE 69614195 T2 DE69614195 T2 DE 69614195T2 DE 69614195 T DE69614195 T DE 69614195T DE 69614195 T DE69614195 T DE 69614195T DE 69614195 T2 DE69614195 T2 DE 69614195T2
Authority
DE
Germany
Prior art keywords
chip pre
contacted semiconductor
contacted
semiconductor
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69614195T
Other languages
English (en)
Other versions
DE69614195D1 (de
Inventor
Satoshi Teramae
Michiaki Hiyoshi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=15128656&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69614195(T2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE69614195D1 publication Critical patent/DE69614195D1/de
Publication of DE69614195T2 publication Critical patent/DE69614195T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/71—Means for bonding not being attached to, or not being formed on, the surface to be connected
    • H01L24/72—Detachable connecting means consisting of mechanical auxiliary parts connecting the device, e.g. pressure contacts using springs or clips
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/70—Bipolar devices
    • H01L29/74—Thyristor-type devices, e.g. having four-zone regenerative action
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
    • H01L25/072—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01004—Beryllium [Be]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01005—Boron [B]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01006—Carbon [C]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01013—Aluminum [Al]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01015—Phosphorus [P]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01023—Vanadium [V]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01029—Copper [Cu]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01033—Arsenic [As]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01042—Molybdenum [Mo]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01047—Silver [Ag]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/12—Passive devices, e.g. 2 terminal devices
    • H01L2924/1203—Rectifying Diode
    • H01L2924/12035—Zener diode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304—Transistor
    • H01L2924/1305—Bipolar Junction Transistor [BJT]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304—Transistor
    • H01L2924/1305—Bipolar Junction Transistor [BJT]
    • H01L2924/13055—Insulated gate bipolar transistor [IGBT]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/1901—Structure
    • H01L2924/1904—Component type
    • H01L2924/19041—Component type being a capacitor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/1901—Structure
    • H01L2924/1904—Component type
    • H01L2924/19043—Component type being a resistor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/30107—Inductance
DE69614195T 1995-05-31 1996-05-31 Vielchip pre-kontaktierter Halbleiter Expired - Lifetime DE69614195T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13445195A JP3258200B2 (ja) 1995-05-31 1995-05-31 圧接型半導体装置

Publications (2)

Publication Number Publication Date
DE69614195D1 DE69614195D1 (de) 2001-09-06
DE69614195T2 true DE69614195T2 (de) 2002-04-18

Family

ID=15128656

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69614195T Expired - Lifetime DE69614195T2 (de) 1995-05-31 1996-05-31 Vielchip pre-kontaktierter Halbleiter

Country Status (5)

Country Link
US (1) US5708299A (de)
EP (1) EP0746023B1 (de)
JP (1) JP3258200B2 (de)
KR (1) KR100203533B1 (de)
DE (1) DE69614195T2 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7449774B1 (en) 1999-10-01 2008-11-11 Fairchild Korea Semiconductor Ltd. Semiconductor power module having an electrically insulating heat sink and method of manufacturing the same

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6452261B1 (en) * 1997-03-26 2002-09-17 Hitachi, Ltd. Flat semiconductor device and power converter employing the same
JP3421544B2 (ja) * 1997-07-14 2003-06-30 株式会社東芝 半導体モジュール
JP3480811B2 (ja) 1997-07-15 2003-12-22 株式会社東芝 電圧駆動型電力用半導体装置
JP3344552B2 (ja) * 1997-09-17 2002-11-11 株式会社東芝 圧接型半導体装置
US6020636A (en) * 1997-10-24 2000-02-01 Eni Technologies, Inc. Kilowatt power transistor
GB9725960D0 (en) 1997-12-08 1998-02-04 Westinghouse Brake & Signal Encapsulating semiconductor chips
JP2930074B1 (ja) 1998-06-02 1999-08-03 富士電機株式会社 半導体装置
JP2000091485A (ja) 1998-07-14 2000-03-31 Denso Corp 半導体装置
US6072240A (en) * 1998-10-16 2000-06-06 Denso Corporation Semiconductor chip package
JP4085536B2 (ja) 1998-11-09 2008-05-14 株式会社日本自動車部品総合研究所 電気機器およびその製造方法並びに圧接型半導体装置
US6703707B1 (en) 1999-11-24 2004-03-09 Denso Corporation Semiconductor device having radiation structure
US6693350B2 (en) 1999-11-24 2004-02-17 Denso Corporation Semiconductor device having radiation structure and method for manufacturing semiconductor device having radiation structure
JP3676240B2 (ja) 2000-02-07 2005-07-27 株式会社東芝 圧接型半導体装置
GB0015484D0 (en) * 2000-06-23 2000-08-16 Westcode Semiconductors Limite Housing semiconductor chips
EP1168446A3 (de) 2000-06-23 2008-01-23 Westcode Semiconductors Limited Gehäuse von Halbleiterchips
DE10048436A1 (de) * 2000-09-29 2002-04-18 Siemens Ag Elektronische Leistungsschaltervorrichtung
JP3954314B2 (ja) * 2001-01-23 2007-08-08 株式会社東芝 圧接型半導体装置
JP4479121B2 (ja) 2001-04-25 2010-06-09 株式会社デンソー 半導体装置の製造方法
JP2004023083A (ja) * 2002-06-20 2004-01-22 Toshiba Corp 圧接型半導体装置
US6678163B1 (en) 2002-12-19 2004-01-13 Westcode Semiconductors Limited Housing for semiconductor chips
JP4157001B2 (ja) * 2003-08-28 2008-09-24 株式会社東芝 マルチチップ圧接型半導体装置
JP4802210B2 (ja) * 2008-05-13 2011-10-26 株式会社東芝 マルチチップ圧接型半導体装置
US8531027B2 (en) * 2010-04-30 2013-09-10 General Electric Company Press-pack module with power overlay interconnection
CN104183556B (zh) * 2013-05-23 2018-09-14 国家电网公司 一种全压接式绝缘栅双极晶体管器件
US9177943B2 (en) * 2013-10-15 2015-11-03 Ixys Corporation Power device cassette with auxiliary emitter contact
DE102014104718B3 (de) * 2014-04-03 2015-08-20 Infineon Technologies Ag Halbleiterbaugruppe mit Chiparrays
CN110050341A (zh) 2016-12-06 2019-07-23 株式会社东芝 半导体装置
JP2018133448A (ja) 2017-02-15 2018-08-23 株式会社東芝 半導体装置
JP6922002B2 (ja) 2018-02-07 2021-08-18 株式会社東芝 半導体装置
EP3863388A4 (de) 2018-10-05 2022-06-15 Kabushiki Kaisha Toshiba Halbleitergehäuse
JP7395452B2 (ja) * 2020-09-23 2023-12-11 株式会社東芝 半導体装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH081914B2 (ja) * 1987-03-31 1996-01-10 株式会社東芝 圧接型半導体装置
JPH0693468B2 (ja) * 1988-08-09 1994-11-16 株式会社東芝 圧接平型半導体装置
JP2739970B2 (ja) * 1988-10-19 1998-04-15 株式会社東芝 圧接型半導体装置
JP2755761B2 (ja) * 1990-01-26 1998-05-25 株式会社東芝 半導体装置
JP3137375B2 (ja) * 1990-09-20 2001-02-19 株式会社東芝 圧接型半導体装置
JP3074736B2 (ja) * 1990-12-28 2000-08-07 富士電機株式会社 半導体装置
DE59107655D1 (de) * 1991-02-22 1996-05-09 Asea Brown Boveri Abschaltbares Hochleistungs-Halbleiterbauelement
EP0514615B1 (de) * 1991-05-23 1995-05-03 STMicroelectronics S.r.l. Elektronische Leistungsanordnung realisiert durch eine Reihe elementarer Halbleiterbauelemente in Parallelverbindung und verwandtes Herstellungsverfahren
JPH05152574A (ja) * 1991-11-29 1993-06-18 Fuji Electric Co Ltd 半導体装置
DE59304797D1 (de) * 1992-08-26 1997-01-30 Eupec Gmbh & Co Kg Leistungshalbleiter-Modul
JP3180863B2 (ja) * 1993-07-27 2001-06-25 富士電機株式会社 加圧接触形半導体装置およびその組立方法
JP2991010B2 (ja) * 1993-09-29 1999-12-20 富士電機株式会社 半導体装置およびその製造方法
JP2845739B2 (ja) * 1993-11-29 1999-01-13 三菱電機株式会社 圧接型半導体装置及びその製造方法
JP3256636B2 (ja) * 1994-09-15 2002-02-12 株式会社東芝 圧接型半導体装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7449774B1 (en) 1999-10-01 2008-11-11 Fairchild Korea Semiconductor Ltd. Semiconductor power module having an electrically insulating heat sink and method of manufacturing the same
US7501700B2 (en) 1999-10-01 2009-03-10 Fairchild Korea Semiconductor Ltd. Semiconductor power module having an electrically insulating heat sink and method of manufacturing the same
DE10048377B4 (de) * 1999-10-01 2010-11-11 Fairchild Korea Semiconductor Ltd., Bucheon Halbleiter-Leistungsmodul mit elektrisch isolierender Wärmesenke und Verfahren zu seiner Herstellung

Also Published As

Publication number Publication date
US5708299A (en) 1998-01-13
JPH08330338A (ja) 1996-12-13
EP0746023A2 (de) 1996-12-04
EP0746023A3 (de) 1997-10-29
KR100203533B1 (ko) 1999-07-01
KR960043269A (ko) 1996-12-23
EP0746023B1 (de) 2001-08-01
JP3258200B2 (ja) 2002-02-18
DE69614195D1 (de) 2001-09-06

Similar Documents

Publication Publication Date Title
DE69614195T2 (de) Vielchip pre-kontaktierter Halbleiter
KR960038755U (ko) 반도체 패키지
KR970046979U (ko) 반도체패키지 구조
KR970046932U (ko) 반도체패키지
KR970046772U (ko) 반도체 패키지
KR970019769U (ko) 반도체 패키지
KR970046894U (ko) 멀티칩 반도체패키지
KR960038724U (ko) 반도체 칩
KR970015328U (ko) 반도체 패키지 구조
KR970046933U (ko) 반도체패키지 구조
KR970046935U (ko) 반도체패키지 구조
KR970025861U (ko) 반도체 패키지
KR970046902U (ko) 반도체 패키지
KR960038753U (ko) 반도체 패키지
KR960038761U (ko) 반도체 패키지
KR970003282U (ko) 반도체 패키지
KR970003287U (ko) 반도체 패키지
KR970003288U (ko) 반도체 패키지
KR970007239U (ko) 반도체 패키지
KR970015329U (ko) 반도체 패키지
KR960035636U (ko) 반도체 시엘시시 패키지
KR970025859U (ko) 반도체 패키이지
KR970025860U (ko) 반도체 패캐이지
KR960032759U (ko) 반도체 패키지
KR970025862U (ko) 반도체 패키지

Legal Events

Date Code Title Description
8364 No opposition during term of opposition