DE69616859T2 - Verfahren zur Stabilisierung von Spektren in der Spektrometrie - Google Patents
Verfahren zur Stabilisierung von Spektren in der SpektrometrieInfo
- Publication number
- DE69616859T2 DE69616859T2 DE69616859T DE69616859T DE69616859T2 DE 69616859 T2 DE69616859 T2 DE 69616859T2 DE 69616859 T DE69616859 T DE 69616859T DE 69616859 T DE69616859 T DE 69616859T DE 69616859 T2 DE69616859 T2 DE 69616859T2
- Authority
- DE
- Germany
- Prior art keywords
- spectrometry
- spectra
- stabilizing
- stabilizing spectra
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title 1
- 238000004611 spectroscopical analysis Methods 0.000 title 1
- 238000001228 spectrum Methods 0.000 title 1
- 230000000087 stabilizing effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP08679595A JP3476958B2 (ja) | 1995-04-12 | 1995-04-12 | 分光測定におけるスペクトルの安定化法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69616859D1 DE69616859D1 (de) | 2001-12-20 |
DE69616859T2 true DE69616859T2 (de) | 2002-06-27 |
Family
ID=13896727
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69616859T Expired - Lifetime DE69616859T2 (de) | 1995-04-12 | 1996-04-12 | Verfahren zur Stabilisierung von Spektren in der Spektrometrie |
Country Status (6)
Country | Link |
---|---|
US (1) | US5615009A (de) |
EP (1) | EP0737849B1 (de) |
JP (1) | JP3476958B2 (de) |
KR (1) | KR960038364A (de) |
CN (1) | CN1143188A (de) |
DE (1) | DE69616859T2 (de) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6826422B1 (en) | 1997-01-13 | 2004-11-30 | Medispectra, Inc. | Spectral volume microprobe arrays |
US5798837A (en) | 1997-07-11 | 1998-08-25 | Therma-Wave, Inc. | Thin film optical measurement system and method with calibrating ellipsometer |
US6278519B1 (en) | 1998-01-29 | 2001-08-21 | Therma-Wave, Inc. | Apparatus for analyzing multi-layer thin film stacks on semiconductors |
EP1095246B1 (de) * | 1998-07-14 | 2010-06-23 | The Government of the United States of America, represented by the Secretary, Department of Health and Human Services | Infrarotspektroskopie mit hohem durchsatz |
US6483112B1 (en) | 1998-07-14 | 2002-11-19 | E. Neil Lewis | High-throughput infrared spectroscopy |
US6411838B1 (en) | 1998-12-23 | 2002-06-25 | Medispectra, Inc. | Systems and methods for optical examination of samples |
US6690464B1 (en) * | 1999-02-19 | 2004-02-10 | Spectral Dimensions, Inc. | High-volume on-line spectroscopic composition testing of manufactured pharmaceutical dosage units |
WO2002007066A1 (en) * | 2000-07-14 | 2002-01-24 | Spectral Dimensions, Inc. | High-volume on-line spectroscopic composition testing of pharmaceutical dosage units |
US6839661B2 (en) * | 2000-12-15 | 2005-01-04 | Medispectra, Inc. | System for normalizing spectra |
US6894772B2 (en) * | 2001-02-12 | 2005-05-17 | Analytical Spectral Devices | System and method for grouping reflectance data |
US6853447B2 (en) * | 2001-02-12 | 2005-02-08 | Analytical Spectral Devices, Inc. | System and method for the collection of spectral image data |
US7050157B2 (en) * | 2001-11-08 | 2006-05-23 | Optiscan Biomedical Corp. | Reagent-less whole-blood glucose meter |
US6771369B2 (en) * | 2002-03-12 | 2004-08-03 | Analytical Spectral Devices, Inc. | System and method for pharmacy validation and inspection |
US6818903B2 (en) | 2002-07-09 | 2004-11-16 | Medispectra, Inc. | Method and apparatus for identifying spectral artifacts |
US6768918B2 (en) | 2002-07-10 | 2004-07-27 | Medispectra, Inc. | Fluorescent fiberoptic probe for tissue health discrimination and method of use thereof |
US7233396B1 (en) * | 2006-04-17 | 2007-06-19 | Alphasniffer Llc | Polarization based interferometric detector |
CN101131349B (zh) * | 2006-08-24 | 2010-04-21 | 河南工业大学 | 非荧光物体光谱测量的非分光全静态方法 |
US7868296B2 (en) * | 2009-03-30 | 2011-01-11 | Honeywell Asca Inc. | Spectroscopy having correction for broadband distortion for analyzing multi-component samples |
CN104931434B (zh) * | 2015-07-13 | 2017-11-14 | 北京航空航天大学 | 一种光谱匹配方法 |
CN105158161B (zh) * | 2015-09-21 | 2018-01-12 | 中国科学院国家天文台 | 对空间物体的一维光谱进行自动的波长定标和流量定标方法 |
CN109269643B (zh) * | 2018-11-02 | 2021-05-11 | 天津津航技术物理研究所 | 基于移动设备屏幕光源的光谱解调系统及方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60192229A (ja) * | 1984-03-14 | 1985-09-30 | Hitachi Ltd | 多波長同時測光光度計 |
US4916645A (en) * | 1988-06-02 | 1990-04-10 | The Perkin-Elmer Corporation | Continuous monochrometer drift compensation of a spectral monochromator |
JPH06105217B2 (ja) * | 1990-01-11 | 1994-12-21 | 倉敷紡績株式会社 | 分光測定法 |
US5396440A (en) * | 1993-01-12 | 1995-03-07 | The Dow Chemical Company | Optimum calibration frequency determination |
-
1995
- 1995-04-12 JP JP08679595A patent/JP3476958B2/ja not_active Expired - Lifetime
-
1996
- 1996-04-12 CN CN96106014A patent/CN1143188A/zh active Pending
- 1996-04-12 KR KR1019960011058A patent/KR960038364A/ko not_active Application Discontinuation
- 1996-04-12 US US08/630,974 patent/US5615009A/en not_active Expired - Lifetime
- 1996-04-12 DE DE69616859T patent/DE69616859T2/de not_active Expired - Lifetime
- 1996-04-12 EP EP96105781A patent/EP0737849B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0737849B1 (de) | 2001-11-14 |
EP0737849A3 (de) | 1997-04-09 |
DE69616859D1 (de) | 2001-12-20 |
EP0737849A2 (de) | 1996-10-16 |
US5615009A (en) | 1997-03-25 |
CN1143188A (zh) | 1997-02-19 |
JP3476958B2 (ja) | 2003-12-10 |
KR960038364A (ko) | 1996-11-21 |
JPH08285684A (ja) | 1996-11-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8327 | Change in the person/name/address of the patent owner |
Owner name: ARKRAY, INC., KYOTO, JP |
|
8364 | No opposition during term of opposition |