DE69621739D1 - Verfahren, vorrichtung und system zur bestimmung der änderungen eines prüfkörpers - Google Patents

Verfahren, vorrichtung und system zur bestimmung der änderungen eines prüfkörpers

Info

Publication number
DE69621739D1
DE69621739D1 DE69621739T DE69621739T DE69621739D1 DE 69621739 D1 DE69621739 D1 DE 69621739D1 DE 69621739 T DE69621739 T DE 69621739T DE 69621739 T DE69621739 T DE 69621739T DE 69621739 D1 DE69621739 D1 DE 69621739D1
Authority
DE
Germany
Prior art keywords
determining
changes
test example
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69621739T
Other languages
English (en)
Other versions
DE69621739T2 (de
Inventor
Ryoji Ohba
Yoshihito Tamanoi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Represented By President
Hokkaido University NUC
Yamatake Industrial Systems Co Ltd
Original Assignee
Japan Represented By President
Hokkaido University NUC
Yamatake Industrial Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Represented By President, Hokkaido University NUC, Yamatake Industrial Systems Co Ltd filed Critical Japan Represented By President
Application granted granted Critical
Publication of DE69621739D1 publication Critical patent/DE69621739D1/de
Publication of DE69621739T2 publication Critical patent/DE69621739T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4427Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/14Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object using acoustic emission techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/38Detecting the response signal, e.g. electronic circuits specially adapted therefor by time filtering, e.g. using time gates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/40Detecting the response signal, e.g. electronic circuits specially adapted therefor by amplitude filtering, e.g. by applying a threshold or by gain control
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/449Statistical methods not provided for in G01N29/4409, e.g. averaging, smoothing and interpolation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/044Internal reflections (echoes), e.g. on walls or defects
DE69621739T 1995-05-12 1996-02-08 Verfahren, vorrichtung und system zur bestimmung der änderungen eines prüfkörpers Expired - Lifetime DE69621739T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP11436695A JP3358167B2 (ja) 1995-05-12 1995-05-12 被検体同定方法、装置およびシステム
PCT/JP1996/000266 WO1996035926A1 (fr) 1995-05-12 1996-02-08 Procede, dispositif et systeme de determination de changements dans un specimen

Publications (2)

Publication Number Publication Date
DE69621739D1 true DE69621739D1 (de) 2002-07-18
DE69621739T2 DE69621739T2 (de) 2002-12-19

Family

ID=14635923

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69621739T Expired - Lifetime DE69621739T2 (de) 1995-05-12 1996-02-08 Verfahren, vorrichtung und system zur bestimmung der änderungen eines prüfkörpers

Country Status (7)

Country Link
US (1) US5798459A (de)
EP (1) EP0770854B1 (de)
JP (1) JP3358167B2 (de)
KR (1) KR100426227B1 (de)
DE (1) DE69621739T2 (de)
DK (1) DK0770854T3 (de)
WO (1) WO1996035926A1 (de)

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US6389881B1 (en) 1999-05-27 2002-05-21 Acoustic Systems, Inc. Method and apparatus for pattern match filtering for real time acoustic pipeline leak detection and location
JP2002312870A (ja) * 2001-04-13 2002-10-25 Tlv Co Ltd 携帯型ガス検出器
KR100838877B1 (ko) 2001-07-09 2008-06-16 시게이트 테크놀로지 엘엘씨 저밀도 가스를 함유한 디스크 드라이브용 초기 누출 검출시스템
US6819517B2 (en) 2001-07-31 2004-11-16 Seagate Technology Llc Disc drive servo track writer gas leak detector and method
JP2003106893A (ja) * 2001-09-28 2003-04-09 Yamatake Sangyo Systems Co Ltd 異常監視装置および異常監視プログラム
DE10297387T5 (de) 2001-10-30 2005-02-24 Seagate Technology Llc, Scotts Valley Ein Gas geringer Dichte anwendender Plattenlaufwerk-Servo-Spurschreiber
US6898043B2 (en) * 2002-05-20 2005-05-24 Seagate Technology Llc Dual stage enclosure for servo track writer utilizing low-density gas
JP2004020484A (ja) * 2002-06-19 2004-01-22 Yamatake Corp 異常監視装置および異常監視プログラム
US8105239B2 (en) * 2006-02-06 2012-01-31 Maui Imaging, Inc. Method and apparatus to visualize the coronary arteries using ultrasound
EP2088932B1 (de) * 2006-10-25 2020-04-08 Maui Imaging, Inc. Verfahren und vorrichtung zur herstellung von ultraschallbildern mithilfe mehrerer öffnungen
US9282945B2 (en) 2009-04-14 2016-03-15 Maui Imaging, Inc. Calibration of ultrasound probes
JP5193714B2 (ja) * 2008-07-18 2013-05-08 Jx日鉱日石エネルギー株式会社 配管亀裂診断装置及び配管の亀裂診断方法
JP5666446B2 (ja) 2008-08-08 2015-02-12 マウイ イマギング,インコーポレーテッド マルチアパーチャ方式の医用超音波技術を用いた画像形成方法及びアドオンシステムの同期方法
KR101659723B1 (ko) 2009-04-14 2016-09-26 마우이 이미징, 인코포레이티드 복수 개구 초음파 어레이 정렬 설비
KR102121040B1 (ko) 2010-02-18 2020-06-09 마우이 이미징, 인코포레이티드 초음파 이미지를 구성하는 방법 및 이를 위한 다중-개구 초음파 이미징 시스템
WO2012051305A2 (en) 2010-10-13 2012-04-19 Mau Imaging, Inc. Multiple aperture probe internal apparatus and cable assemblies
WO2012051308A2 (en) 2010-10-13 2012-04-19 Maui Imaging, Inc. Concave ultrasound transducers and 3d arrays
TW201336478A (zh) 2011-12-01 2013-09-16 Maui Imaging Inc 使用以回音為基及多孔徑都卜勒超音波之移動偵測
WO2013101988A1 (en) 2011-12-29 2013-07-04 Maui Imaging, Inc. M-mode ultrasound imaging of arbitrary paths
KR102134763B1 (ko) 2012-02-21 2020-07-16 마우이 이미징, 인코포레이티드 다중의 어퍼처 초음파를 사용한 물질 강성의 결정
EP2833791B1 (de) 2012-03-26 2022-12-21 Maui Imaging, Inc. Verfahren zur verbesserung der ultraschallbildqualität durch anwendung von gewichtungsfaktoren
CN104620128B (zh) 2012-08-10 2017-06-23 毛伊图像公司 多孔径超声探头的校准
KR102176319B1 (ko) 2012-08-21 2020-11-09 마우이 이미징, 인코포레이티드 초음파 이미징 시스템 메모리 아키텍처
US9510806B2 (en) 2013-03-13 2016-12-06 Maui Imaging, Inc. Alignment of ultrasound transducer arrays and multiple aperture probe assembly
US9883848B2 (en) 2013-09-13 2018-02-06 Maui Imaging, Inc. Ultrasound imaging using apparent point-source transmit transducer
WO2016028787A1 (en) 2014-08-18 2016-02-25 Maui Imaging, Inc. Network-based ultrasound imaging system
JP6463205B2 (ja) * 2015-04-02 2019-01-30 株式会社テイエルブイ 蒸気システムの故障判定装置および故障判定方法
US10856846B2 (en) 2016-01-27 2020-12-08 Maui Imaging, Inc. Ultrasound imaging with sparse array probes
GB2563351B (en) * 2016-02-26 2021-07-21 Nec Corp Piping diagnostic device, piping diagnostic method, discriminant-problem optimizing device, discriminant-problem optimizing method, criteria distribution ge
JP6694320B2 (ja) * 2016-04-28 2020-05-13 株式会社工技研究所 地下タンクの漏洩検査装置及び検査方法
US10620170B2 (en) 2017-01-30 2020-04-14 Latency, LLC Systems, methods, and media for detecting abnormalities in equipment that emit ultrasonic energy into a solid medium during failure
JP7035442B2 (ja) * 2017-10-18 2022-03-15 中国電力株式会社 ホール検知装置
DE102022122295A1 (de) 2022-09-02 2024-03-07 Gestra Ag Verfahren und Sensoreinrichtung zur akustischen Überwachung einer Messstelle an einer fluiddurchströmten Armatur und betreffende Sensoreinrichtung

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JPS59142424A (ja) * 1983-02-03 1984-08-15 Mitsubishi Electric Corp 異常検出装置
JPS60123730A (ja) * 1983-12-07 1985-07-02 Mitsubishi Electric Corp 異常検出装置
JPS60146834A (ja) * 1983-12-29 1985-08-02 Kitasato Inst:The 歯周炎抑制用抗体の製法及び同抗体を含有する歯周炎抑制用組成物
JPS60146834U (ja) * 1984-03-09 1985-09-30 東京瓦斯株式会社 ガスの漏洩位置検知器
GB8727178D0 (en) * 1987-11-20 1987-12-23 British Petroleum Co Plc Monitoring accoustic emissions
US4882668A (en) * 1987-12-10 1989-11-21 General Dynamics Corp., Pomona Division Adaptive matched filter
US4980844A (en) * 1988-05-27 1990-12-25 Victor Demjanenko Method and apparatus for diagnosing the state of a machine
JP3020349B2 (ja) * 1992-05-29 2000-03-15 北海道大学長 異常検出方法及び装置
JP2919685B2 (ja) * 1992-11-02 1999-07-12 シャープ株式会社 信号識別回路
US5477730A (en) * 1993-09-07 1995-12-26 Carter; Duncan L. Rolling element bearing condition testing method and apparatus
US5623402A (en) * 1994-02-10 1997-04-22 Schenck Pegasus Corporation Multi-channel inverse control using adaptive finite impulse response filters

Also Published As

Publication number Publication date
WO1996035926A1 (fr) 1996-11-14
DE69621739T2 (de) 2002-12-19
JP3358167B2 (ja) 2002-12-16
DK0770854T3 (da) 2002-07-15
EP0770854A4 (de) 1999-12-01
KR100426227B1 (ko) 2004-07-01
EP0770854A1 (de) 1997-05-02
EP0770854B1 (de) 2002-06-12
US5798459A (en) 1998-08-25
JPH08304124A (ja) 1996-11-22

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