DE69717538T2 - Konfokales Rastermikroskop - Google Patents

Konfokales Rastermikroskop

Info

Publication number
DE69717538T2
DE69717538T2 DE69717538T DE69717538T DE69717538T2 DE 69717538 T2 DE69717538 T2 DE 69717538T2 DE 69717538 T DE69717538 T DE 69717538T DE 69717538 T DE69717538 T DE 69717538T DE 69717538 T2 DE69717538 T2 DE 69717538T2
Authority
DE
Germany
Prior art keywords
scanning microscope
confocal scanning
confocal
microscope
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69717538T
Other languages
English (en)
Other versions
DE69717538D1 (de
Inventor
Matthew C Boettner
Steven J Ouderkirk
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kovex Corp
Original Assignee
Kovex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kovex Corp filed Critical Kovex Corp
Application granted granted Critical
Publication of DE69717538D1 publication Critical patent/DE69717538D1/de
Publication of DE69717538T2 publication Critical patent/DE69717538T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0028—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders specially adapted for specific applications, e.g. for endoscopes, ophthalmoscopes, attachments to conventional microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
DE69717538T 1996-05-31 1997-05-20 Konfokales Rastermikroskop Expired - Fee Related DE69717538T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/656,668 US5880465A (en) 1996-05-31 1996-05-31 Scanning confocal microscope with oscillating objective lens

Publications (2)

Publication Number Publication Date
DE69717538D1 DE69717538D1 (de) 2003-01-16
DE69717538T2 true DE69717538T2 (de) 2003-09-25

Family

ID=24634053

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69717538T Expired - Fee Related DE69717538T2 (de) 1996-05-31 1997-05-20 Konfokales Rastermikroskop

Country Status (4)

Country Link
US (1) US5880465A (de)
EP (1) EP0810457B1 (de)
JP (1) JPH1090606A (de)
DE (1) DE69717538T2 (de)

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CN102934005B (zh) * 2010-06-03 2016-06-15 株式会社尼康 显微镜装置
DE102011121928B4 (de) * 2011-08-01 2015-03-05 Physik Instrumente (Pi) Gmbh & Co. Kg Anordnung zum Betreiben eines dynamischen Nanofokussiersystems
JP6243110B2 (ja) * 2012-10-15 2017-12-06 アストロデザイン株式会社 レーザー走査顕微鏡装置
JP6043623B2 (ja) * 2012-12-25 2016-12-14 アイシン・エィ・ダブリュ株式会社 内径測定装置
JP6148852B2 (ja) * 2012-12-25 2017-06-14 アイシン・エィ・ダブリュ株式会社 内径測定装置
DE102013012941A1 (de) 2013-07-31 2015-02-05 Johannes Kindt Langreichweitiger Mehrachsen-Scanner im Mikroskop-Objektivformat
JP2015125177A (ja) 2013-12-25 2015-07-06 ソニー株式会社 顕微鏡システムおよびその画像データ転送方法
JP6171970B2 (ja) 2014-02-10 2017-08-02 ソニー株式会社 レーザ走査型顕微鏡装置および制御方法
CZ2014184A3 (cs) * 2014-03-26 2015-08-26 Tescan Orsay Holding, A.S. Analytický systém s Ramanovým mikroskopem a elektronovým mikroskopem
CN115919266A (zh) * 2016-03-08 2023-04-07 恩斯派克特拉健康公司 皮肤疾病的非侵入式检测
WO2018201082A1 (en) 2017-04-28 2018-11-01 Zebra Medical Technologies, Inc. Systems and methods for imaging and measurement of sarcomeres
US10976562B2 (en) * 2017-10-10 2021-04-13 Kla Corporation Nano-structured non-polarizing beamsplitter
US11933729B2 (en) * 2020-08-07 2024-03-19 Abberior Instruments Gmbh Method, computer program, and apparatus for adapting an estimator for use in a microscope
CN113566716B (zh) * 2021-08-27 2023-04-28 西安应用光学研究所 振动环境下反射镜组件微小相对位移测量装置及测量方法

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Also Published As

Publication number Publication date
EP0810457A1 (de) 1997-12-03
EP0810457B1 (de) 2002-12-04
JPH1090606A (ja) 1998-04-10
DE69717538D1 (de) 2003-01-16
US5880465A (en) 1999-03-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee