DE69833603D1 - Speicherzelle mit programmierter Spielraumprüfung - Google Patents
Speicherzelle mit programmierter SpielraumprüfungInfo
- Publication number
- DE69833603D1 DE69833603D1 DE69833603T DE69833603T DE69833603D1 DE 69833603 D1 DE69833603 D1 DE 69833603D1 DE 69833603 T DE69833603 T DE 69833603T DE 69833603 T DE69833603 T DE 69833603T DE 69833603 D1 DE69833603 D1 DE 69833603D1
- Authority
- DE
- Germany
- Prior art keywords
- memory cell
- travel test
- programmed travel
- programmed
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3436—Arrangements for verifying correct programming or erasure
- G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
- G11C16/3459—Circuits or methods to verify correct programming of nonvolatile memory cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3436—Arrangements for verifying correct programming or erasure
- G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/954,152 US5796655A (en) | 1997-10-20 | 1997-10-20 | Memory cell having programmed margin verification |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69833603D1 true DE69833603D1 (de) | 2006-04-27 |
Family
ID=25495006
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69833603T Expired - Lifetime DE69833603D1 (de) | 1997-10-20 | 1998-09-23 | Speicherzelle mit programmierter Spielraumprüfung |
Country Status (4)
Country | Link |
---|---|
US (1) | US5796655A (de) |
EP (1) | EP0911832B1 (de) |
JP (1) | JPH11203898A (de) |
DE (1) | DE69833603D1 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6195289B1 (en) * | 1998-07-22 | 2001-02-27 | Stmicroelectronics, S.R.L. | Device for reading analog nonvolatile memory cells, in particular flash cells |
US6836238B1 (en) * | 2001-10-09 | 2004-12-28 | Escort Inc. | Police radar/laser detector with integral vehicle parameter display using a vehicle interface |
US6762453B1 (en) * | 2002-12-19 | 2004-07-13 | Delphi Technologies, Inc. | Programmable memory transistor |
US10255987B1 (en) * | 2017-10-11 | 2019-04-09 | Globalfoundries Inc. | Margin test for one-time programmable memory (OTPM) array with common mode current source |
US11169587B2 (en) * | 2020-01-10 | 2021-11-09 | Micron Technology, Inc. | Feedback for power management of a memory die using a dedicated pin |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5014098A (en) * | 1990-02-26 | 1991-05-07 | Delco Electronic Corporation | CMOS integrated circuit with EEPROM and method of manufacture |
JP3171599B2 (ja) * | 1991-03-05 | 2001-05-28 | 沖電気工業株式会社 | 半導体記憶装置 |
DE4342821C1 (de) * | 1993-12-15 | 1994-12-15 | Sgs Thomson Microelectronics | Elektronische Speicherschaltung |
US5572472A (en) * | 1995-04-14 | 1996-11-05 | Delco Electronics Corporation | Integrated zener-zap nonvolatile memory cell with programming and pretest capability |
-
1997
- 1997-10-20 US US08/954,152 patent/US5796655A/en not_active Expired - Lifetime
-
1998
- 1998-09-23 EP EP98203192A patent/EP0911832B1/de not_active Expired - Lifetime
- 1998-09-23 DE DE69833603T patent/DE69833603D1/de not_active Expired - Lifetime
- 1998-10-20 JP JP29767398A patent/JPH11203898A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0911832A3 (de) | 2001-03-07 |
EP0911832B1 (de) | 2006-03-01 |
JPH11203898A (ja) | 1999-07-30 |
US5796655A (en) | 1998-08-18 |
EP0911832A2 (de) | 1999-04-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |