DE69835988D1 - Doppelseitenreinigungsmaschine für ein Substrat - Google Patents

Doppelseitenreinigungsmaschine für ein Substrat

Info

Publication number
DE69835988D1
DE69835988D1 DE69835988T DE69835988T DE69835988D1 DE 69835988 D1 DE69835988 D1 DE 69835988D1 DE 69835988 T DE69835988 T DE 69835988T DE 69835988 T DE69835988 T DE 69835988T DE 69835988 D1 DE69835988 D1 DE 69835988D1
Authority
DE
Germany
Prior art keywords
substrate
cleaning machine
double side
side cleaning
double
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69835988T
Other languages
English (en)
Other versions
DE69835988T2 (de
Inventor
Satoshi Nakashima
Takanori Miyazaki
Hiroki Taniyama
Toshikazu Arihisa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP23653197A external-priority patent/JP3377414B2/ja
Priority claimed from JP08491998A external-priority patent/JP3401428B2/ja
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of DE69835988D1 publication Critical patent/DE69835988D1/de
Application granted granted Critical
Publication of DE69835988T2 publication Critical patent/DE69835988T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67046Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S134/00Cleaning and liquid contact with solids
    • Y10S134/902Semiconductor wafer
DE69835988T 1997-08-18 1998-08-17 Doppelseitenreinigungsmaschine für ein Substrat Expired - Lifetime DE69835988T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP23653197A JP3377414B2 (ja) 1997-08-18 1997-08-18 処理装置
JP23653197 1997-08-18
JP8491998 1998-03-16
JP08491998A JP3401428B2 (ja) 1998-03-16 1998-03-16 処理装置

Publications (2)

Publication Number Publication Date
DE69835988D1 true DE69835988D1 (de) 2006-11-09
DE69835988T2 DE69835988T2 (de) 2007-06-21

Family

ID=26425881

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69835988T Expired - Lifetime DE69835988T2 (de) 1997-08-18 1998-08-17 Doppelseitenreinigungsmaschine für ein Substrat

Country Status (4)

Country Link
US (2) US6115867A (de)
EP (1) EP0898301B1 (de)
KR (2) KR100530700B1 (de)
DE (1) DE69835988T2 (de)

Families Citing this family (64)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0898301B1 (de) 1997-08-18 2006-09-27 Tokyo Electron Limited Doppelseitenreinigungsmaschine für ein Substrat
JP3563605B2 (ja) * 1998-03-16 2004-09-08 東京エレクトロン株式会社 処理装置
JP3111979B2 (ja) * 1998-05-20 2000-11-27 日本電気株式会社 ウエハの洗浄方法
US6269510B1 (en) * 1999-01-04 2001-08-07 International Business Machines Corporation Post CMP clean brush with torque monitor
US6543461B2 (en) * 1999-02-11 2003-04-08 Nova Measuring Instruments Ltd. Buffer system for a wafer handling system field of the invention
JP3395696B2 (ja) 1999-03-15 2003-04-14 日本電気株式会社 ウェハ処理装置およびウェハ処理方法
JP4327304B2 (ja) * 1999-07-27 2009-09-09 芝浦メカトロニクス株式会社 スピン処理装置
US6295683B1 (en) * 1999-12-09 2001-10-02 United Microelectronics Corp. Equipment for brushing the underside of a semiconductor wafer
US6497241B1 (en) * 1999-12-23 2002-12-24 Lam Research Corporation Hollow core spindle and spin, rinse, and dry module including the same
FR2808120B1 (fr) * 2000-04-20 2002-07-26 Karl Suss France Procede et dispositif pour le traitement du substrat d'un circuit integre ou d'un produit analogue en cours de fabrication
US6634370B2 (en) * 2000-05-08 2003-10-21 Tokyo Electron Limited Liquid treatment system and liquid treatment method
US7451774B2 (en) * 2000-06-26 2008-11-18 Applied Materials, Inc. Method and apparatus for wafer cleaning
JP2004515053A (ja) * 2000-06-26 2004-05-20 アプライド マテリアルズ インコーポレイテッド ウェーハ洗浄方法及び装置
US6536454B2 (en) * 2000-07-07 2003-03-25 Sez Ag Device for treating a disc-shaped object
JP4172567B2 (ja) * 2000-09-22 2008-10-29 東京エレクトロン株式会社 基板洗浄具及び基板洗浄装置
KR100877044B1 (ko) * 2000-10-02 2008-12-31 도쿄엘렉트론가부시키가이샤 세정처리장치
JP2002233829A (ja) * 2001-02-06 2002-08-20 Tokyo Ohka Kogyo Co Ltd 基板洗浄装置および洗浄方法
US7601112B2 (en) * 2001-03-13 2009-10-13 Jackson David P Dense fluid cleaning centrifugal phase shifting separation process and apparatus
US6823880B2 (en) * 2001-04-25 2004-11-30 Kabushiki Kaisha Kobe Seiko Sho High pressure processing apparatus and high pressure processing method
US7000623B2 (en) 2001-05-18 2006-02-21 Lam Research Corporation Apparatus and method for substrate preparation implementing a surface tension reducing process
US20020170574A1 (en) * 2001-05-21 2002-11-21 Speedfam-Ipec Corporation Differential Cleaning for semiconductor wafers with copper circuitry
JP2002353181A (ja) 2001-05-30 2002-12-06 Ses Co Ltd 枚葉式基板洗浄方法および枚葉式基板洗浄装置
JP2003007664A (ja) * 2001-06-22 2003-01-10 Ses Co Ltd 枚葉式基板洗浄方法および枚葉式基板洗浄装置
JP3849921B2 (ja) * 2001-09-26 2006-11-22 大日本スクリーン製造株式会社 基板処理装置
DE10154885A1 (de) * 2001-11-05 2003-05-15 Schmid Gmbh & Co Geb Verfahren zur Behandlung von Gegenständen mittels einer Flüssigkeit
KR100445259B1 (ko) * 2001-11-27 2004-08-21 삼성전자주식회사 세정방법 및 이를 수행하기 위한 세정 장치
US6455330B1 (en) * 2002-01-28 2002-09-24 Taiwan Semiconductor Manufacturing Company Methods to create high-k dielectric gate electrodes with backside cleaning
JP2003273064A (ja) * 2002-03-15 2003-09-26 Fujitsu Ltd 堆積物の除去装置及び除去方法
US20040045578A1 (en) * 2002-05-03 2004-03-11 Jackson David P. Method and apparatus for selective treatment of a precision substrate surface
JP3980941B2 (ja) * 2002-06-04 2007-09-26 東京エレクトロン株式会社 基板処理装置
US6824622B2 (en) * 2002-06-27 2004-11-30 Taiwan Semiconductor Manufacturing Co., Ltd Cleaner and method for removing fluid from an object
KR20040003714A (ko) * 2002-07-03 2004-01-13 (주)케이.씨.텍 웨이퍼 세정 장치
CH696188A5 (de) * 2002-07-29 2007-02-15 Brooks Pri Automation Switzerl Detektions- und Reinigungsvorrichtung in einer Handhabungsvorrichtung für Photomasken.
KR100457053B1 (ko) * 2002-07-30 2004-11-10 삼성전자주식회사 웨이퍼 세정 장치
JP3890025B2 (ja) * 2003-03-10 2007-03-07 東京エレクトロン株式会社 塗布処理装置及び塗布処理方法
EP1737025A4 (de) * 2004-04-06 2009-03-11 Tokyo Electron Ltd Board-reinigungsvorrichtung, board-reinigungsverfahren und medium mit aufgezeichnetem programm zur verwendung für das verfahren
JP2005327807A (ja) * 2004-05-12 2005-11-24 Sony Corp 枚葉式洗浄装置及びその洗浄方法
JP4486649B2 (ja) * 2004-10-28 2010-06-23 東京エレクトロン株式会社 液処理装置
JP2006128458A (ja) * 2004-10-29 2006-05-18 Toshiba Corp 半導体基板洗浄装置及びその方法
US8392021B2 (en) * 2005-02-18 2013-03-05 Irobot Corporation Autonomous surface cleaning robot for wet cleaning
EP1708249A2 (de) * 2005-03-31 2006-10-04 Kaijo Corporation Reinigungsgerät und Reinigungsverfahren
KR100691212B1 (ko) * 2006-11-17 2007-03-12 애플티(주) 반도체 웨이퍼 세정장치 및 이를 이용한 반도체 웨이퍼제조 장치
US8578953B2 (en) 2006-12-20 2013-11-12 Tokyo Electron Limited Substrate cleaning apparatus, substrate cleaning method, and computer-readable storage medium
JP2008183532A (ja) * 2007-01-31 2008-08-14 Dainippon Screen Mfg Co Ltd 基板処理装置および基板処理方法
KR100871476B1 (ko) * 2007-03-12 2008-12-05 송종호 기판 세정장치
TWI490930B (zh) * 2007-05-23 2015-07-01 Semes Co Ltd 乾燥基板的裝置及方法
JP4939376B2 (ja) * 2007-11-13 2012-05-23 株式会社Sokudo 基板処理装置
JP5091687B2 (ja) * 2008-01-08 2012-12-05 株式会社Sokudo 基板処理装置
KR101140376B1 (ko) 2011-05-23 2012-05-03 주식회사 쓰리디플러스 기판 제조용 공정 챔버
US9421617B2 (en) 2011-06-22 2016-08-23 Tel Nexx, Inc. Substrate holder
US8967935B2 (en) 2011-07-06 2015-03-03 Tel Nexx, Inc. Substrate loader and unloader
US9176173B2 (en) * 2011-11-28 2015-11-03 Texas Instruments Incorporated Method for detecting imperfect mounting of a rod-shaped metallic object in a metallic hollow shaft and a device
US9483055B2 (en) 2012-12-28 2016-11-01 Irobot Corporation Autonomous coverage robot
US9282867B2 (en) 2012-12-28 2016-03-15 Irobot Corporation Autonomous coverage robot
US9460944B2 (en) * 2014-07-02 2016-10-04 SCREEN Holdings Co., Ltd. Substrate treating apparatus and method of treating substrate
US10250097B2 (en) * 2015-04-17 2019-04-02 Harmonic Drive Systems Inc. Static pressure seal-equipped motor
US11094548B2 (en) * 2016-06-27 2021-08-17 Ebara Corporation Apparatus for cleaning substrate and substrate cleaning method
JP6684191B2 (ja) * 2016-09-05 2020-04-22 株式会社Screenホールディングス 基板洗浄装置およびそれを備える基板処理装置
JP7056969B2 (ja) * 2017-03-30 2022-04-19 エーシーエム リサーチ (シャンハイ) インコーポレーテッド 基板洗浄装置
JP7041011B2 (ja) 2018-06-22 2022-03-23 株式会社スギノマシン 乾燥機
KR102085941B1 (ko) * 2018-08-14 2020-03-06 (주)아이케이텍 반도체 웨이퍼용 에칭 장치
KR102245294B1 (ko) 2019-06-21 2021-04-28 세메스 주식회사 기판 지지 유닛 및 이를 갖는 기판 처리 장치
CN111958493B (zh) * 2020-07-28 2022-06-21 天津市通洁高压泵制造有限公司 一种高稳定性水射流清洗盘
KR102535766B1 (ko) * 2021-08-24 2023-05-26 (주)디바이스이엔지 백 노즐 어셈블리를 포함하는 기판 처리장치

Family Cites Families (62)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5861632A (ja) * 1981-10-07 1983-04-12 Matsushita Electric Ind Co Ltd 洗浄槽
JPS5866333A (ja) * 1981-10-14 1983-04-20 Matsushita Electric Ind Co Ltd 洗浄槽
JPS6148258A (ja) * 1984-08-15 1986-03-08 Toshiba Corp シリアルデ−タ伝送装置
JPS6116528A (ja) * 1985-06-14 1986-01-24 Hitachi Ltd ウエハ洗浄装置
US4795497A (en) * 1985-08-13 1989-01-03 Mcconnell Christopher F Method and system for fluid treatment of semiconductor wafers
JPS6247153A (ja) * 1985-08-27 1987-02-28 Ibiden Co Ltd 半導体装置
JPS62252147A (ja) * 1986-04-25 1987-11-02 Hitachi Ltd 半導体ウエハ移し替え装置
JPS63185029A (ja) * 1987-01-28 1988-07-30 Hitachi Ltd ウエハ処理装置
JPS6438721A (en) * 1987-08-04 1989-02-09 Fujikura Ltd Branching ratio variable type optical fiber coupler
JPS6457624A (en) 1987-08-28 1989-03-03 Kurita Water Ind Ltd Cleaning equipment
JPS6481230A (en) 1987-09-24 1989-03-27 Hitachi Ltd Treatment device
JPH01120828A (ja) * 1987-11-04 1989-05-12 Oki Electric Ind Co Ltd 半導体ウエハの自動洗浄装置
JPH01184926A (ja) * 1988-01-20 1989-07-24 Matsushita Electric Ind Co Ltd 洗浄装置および洗浄方法
KR970003907B1 (ko) * 1988-02-12 1997-03-22 도오교오 에레구토론 가부시끼 가이샤 기판처리 장치 및 기판처리 방법
JPH02130827A (ja) * 1988-11-10 1990-05-18 Mitsubishi Electric Corp 半導体基板の洗浄方法およびそれに用いる洗浄装置
US5061144A (en) * 1988-11-30 1991-10-29 Tokyo Electron Limited Resist process apparatus
KR0134962B1 (ko) * 1989-07-13 1998-04-22 나까다 구스오 디스크 세척장치
JP2746669B2 (ja) * 1989-07-20 1998-05-06 東京エレクトロン株式会社 洗浄装置及び洗浄方法
JP2746670B2 (ja) * 1989-07-20 1998-05-06 東京エレクトロン株式会社 洗浄装置
JP2683940B2 (ja) * 1989-08-09 1997-12-03 信越半導体 株式会社 ワークの自動洗浄装置
JPH03116731A (ja) * 1989-09-28 1991-05-17 Dan Kagaku:Kk 半導体ウエハ用移送装置
JPH0414494A (ja) * 1990-05-07 1992-01-20 Toppan Printing Co Ltd 印刷物
JPH0415920A (ja) * 1990-05-09 1992-01-21 Mitsubishi Electric Corp ウエハの洗浄用保持装置およびその洗浄方法
JPH0456321A (ja) * 1990-06-26 1992-02-24 Fujitsu Ltd 半導体ウエハの洗浄装置
JP2926944B2 (ja) * 1990-09-18 1999-07-28 松下電器産業株式会社 光ディスク装置用クリーナー
JPH04130724A (ja) * 1990-09-21 1992-05-01 Hitachi Ltd 洗浄装置
JP3165435B2 (ja) * 1990-11-17 2001-05-14 東京エレクトロン株式会社 洗浄装置
JP3214503B2 (ja) * 1990-11-28 2001-10-02 東京エレクトロン株式会社 洗浄装置
JP3162704B2 (ja) * 1990-11-28 2001-05-08 東京エレクトロン株式会社 処理装置
US5226437A (en) * 1990-11-28 1993-07-13 Tokyo Electron Limited Washing apparatus
US5297910A (en) * 1991-02-15 1994-03-29 Tokyo Electron Limited Transportation-transfer device for an object of treatment
US5144711A (en) * 1991-03-25 1992-09-08 Westech Systems, Inc. Cleaning brush for semiconductor wafer
JPH04304652A (ja) * 1991-04-01 1992-10-28 Hitachi Ltd 熱処理装置用ボート
JP2901098B2 (ja) * 1991-04-02 1999-06-02 東京エレクトロン株式会社 洗浄装置および洗浄方法
JP2913119B2 (ja) * 1991-05-07 1999-06-28 東京エレクトロン株式会社 被洗浄体の移載方法及びその装置並びに被移載体の位置決め装置
JPH0553241A (ja) * 1991-06-10 1993-03-05 Fuji Photo Film Co Ltd ハロゲン化銀写真感光材料
JPH0536815A (ja) * 1991-07-25 1993-02-12 Canon Inc ウエハ搬送装置
JPH0536814A (ja) * 1991-07-31 1993-02-12 Sony Corp ウエハ移載装置
JPH05121361A (ja) * 1991-10-28 1993-05-18 Mitsubishi Electric Corp 半導体ウエハ冷却装置
JP2571487B2 (ja) * 1991-12-27 1997-01-16 信越半導体株式会社 薄円板状ワークのスクラバー洗浄装置
JPH05182946A (ja) * 1991-12-27 1993-07-23 Shimada Phys & Chem Ind Co Ltd 洗浄装置
KR0163362B1 (ko) * 1992-03-05 1999-02-01 이노우에 아키라 세정장치용 처리조
JP3113411B2 (ja) * 1992-03-18 2000-11-27 東京エレクトロン株式会社 洗浄装置
KR0170421B1 (ko) * 1992-04-16 1999-03-30 이노우에 아키라 스핀 드라이어
US5345639A (en) * 1992-05-28 1994-09-13 Tokyo Electron Limited Device and method for scrubbing and cleaning substrate
JP2739419B2 (ja) * 1992-09-25 1998-04-15 大日本スクリーン製造株式会社 基板処理装置
JP3194209B2 (ja) * 1992-11-10 2001-07-30 東京エレクトロン株式会社 洗浄処理装置
JP3052105B2 (ja) * 1992-11-20 2000-06-12 東京エレクトロン株式会社 洗浄処理装置
US5503171A (en) * 1992-12-26 1996-04-02 Tokyo Electron Limited Substrates-washing apparatus
US5485644A (en) * 1993-03-18 1996-01-23 Dainippon Screen Mfg. Co., Ltd. Substrate treating apparatus
JP3347814B2 (ja) * 1993-05-17 2002-11-20 大日本スクリーン製造株式会社 基板の洗浄・乾燥処理方法並びにその処理装置
US5509464A (en) * 1993-07-30 1996-04-23 Applied Materials, Inc. Method and apparatus for cooling rectangular substrates
US5518542A (en) * 1993-11-05 1996-05-21 Tokyo Electron Limited Double-sided substrate cleaning apparatus
US5626675A (en) * 1993-11-18 1997-05-06 Tokyo Electron Limited Resist processing apparatus, substrate processing apparatus and method of transferring a processed article
JPH07169732A (ja) * 1993-12-13 1995-07-04 Ebara Corp ウエハ洗浄装置
US5730162A (en) * 1995-01-12 1998-03-24 Tokyo Electron Limited Apparatus and method for washing substrates
JP3625331B2 (ja) * 1995-01-19 2005-03-02 東京エレクトロン株式会社 洗浄装置および洗浄方法
TW316995B (de) * 1995-01-19 1997-10-01 Tokyo Electron Co Ltd
JPH09148295A (ja) * 1995-11-27 1997-06-06 Dainippon Screen Mfg Co Ltd 回転式基板処理装置
US5927305A (en) * 1996-02-20 1999-07-27 Pre-Tech Co., Ltd. Cleaning apparatus
JP3071398B2 (ja) * 1996-02-20 2000-07-31 株式会社プレテック 洗浄装置
EP0898301B1 (de) 1997-08-18 2006-09-27 Tokyo Electron Limited Doppelseitenreinigungsmaschine für ein Substrat

Also Published As

Publication number Publication date
US6115867A (en) 2000-09-12
KR20050054493A (ko) 2005-06-10
KR100530700B1 (ko) 2006-04-06
KR100513438B1 (ko) 2005-09-07
DE69835988T2 (de) 2007-06-21
EP0898301B1 (de) 2006-09-27
KR19990023678A (ko) 1999-03-25
EP0898301A2 (de) 1999-02-24
US6276378B1 (en) 2001-08-21
EP0898301A3 (de) 2000-11-22

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