DE69906699D1 - Quadrupl ionenfalle und flugzeitmassenspektrometer mit einer solchen ionen falle - Google Patents
Quadrupl ionenfalle und flugzeitmassenspektrometer mit einer solchen ionen falleInfo
- Publication number
- DE69906699D1 DE69906699D1 DE69906699T DE69906699T DE69906699D1 DE 69906699 D1 DE69906699 D1 DE 69906699D1 DE 69906699 T DE69906699 T DE 69906699T DE 69906699 T DE69906699 T DE 69906699T DE 69906699 D1 DE69906699 D1 DE 69906699D1
- Authority
- DE
- Germany
- Prior art keywords
- ion trap
- quadrupl
- mass spectrometer
- flight time
- time mass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005040 ion trap Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
- H01J49/427—Ejection and selection methods
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9802111.6A GB9802111D0 (en) | 1998-01-30 | 1998-01-30 | Time-of-flight mass spectrometer |
PCT/GB1999/000084 WO1999039368A2 (en) | 1998-01-30 | 1999-01-12 | Time-of-flight mass spectrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69906699D1 true DE69906699D1 (de) | 2003-05-15 |
DE69906699T2 DE69906699T2 (de) | 2003-10-23 |
Family
ID=10826236
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69906699T Expired - Lifetime DE69906699T2 (de) | 1998-01-30 | 1999-01-12 | Quadrupl ionenfalle und flugzeitmassenspektrometer mit einer solchen ionen falle |
Country Status (7)
Country | Link |
---|---|
US (1) | US6380666B1 (de) |
EP (1) | EP1051730B1 (de) |
JP (1) | JP4132667B2 (de) |
AU (1) | AU2065199A (de) |
DE (1) | DE69906699T2 (de) |
GB (1) | GB9802111D0 (de) |
WO (1) | WO1999039368A2 (de) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000038312A1 (en) | 1998-12-21 | 2000-06-29 | Shimadzu Research Laboratory (Europe) Ltd | Method of fast start and/or fast termination of a radio frequency resonator |
US6545268B1 (en) | 2000-04-10 | 2003-04-08 | Perseptive Biosystems | Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis |
US20020104962A1 (en) * | 2000-06-14 | 2002-08-08 | Minoru Danno | Device for detecting chemical substance and method for measuring concentration of chemical substance |
JP3990889B2 (ja) * | 2001-10-10 | 2007-10-17 | 株式会社日立ハイテクノロジーズ | 質量分析装置およびこれを用いる計測システム |
US6770871B1 (en) | 2002-05-31 | 2004-08-03 | Michrom Bioresources, Inc. | Two-dimensional tandem mass spectrometry |
GB2390935A (en) | 2002-07-16 | 2004-01-21 | Anatoli Nicolai Verentchikov | Time-nested mass analysis using a TOF-TOF tandem mass spectrometer |
US7196324B2 (en) | 2002-07-16 | 2007-03-27 | Leco Corporation | Tandem time of flight mass spectrometer and method of use |
GB0218454D0 (en) * | 2002-08-08 | 2002-09-18 | Micromass Ltd | Mass spectrometer |
US6875980B2 (en) | 2002-08-08 | 2005-04-05 | Micromass Uk Limited | Mass spectrometer |
US6794642B2 (en) | 2002-08-08 | 2004-09-21 | Micromass Uk Limited | Mass spectrometer |
US7102126B2 (en) | 2002-08-08 | 2006-09-05 | Micromass Uk Limited | Mass spectrometer |
JP3800178B2 (ja) | 2003-01-07 | 2006-07-26 | 株式会社島津製作所 | 質量分析装置及び質量分析方法 |
JP4738326B2 (ja) | 2003-03-19 | 2011-08-03 | サーモ フィニガン リミテッド ライアビリティ カンパニー | イオン母集団内複数親イオン種についてのタンデム質量分析データ取得 |
US7947950B2 (en) | 2003-03-20 | 2011-05-24 | Stc.Unm | Energy focus for distance of flight mass spectometry with constant momentum acceleration and an ion mirror |
US7041968B2 (en) | 2003-03-20 | 2006-05-09 | Science & Technology Corporation @ Unm | Distance of flight spectrometer for MS and simultaneous scanless MS/MS |
JP3960306B2 (ja) * | 2003-12-22 | 2007-08-15 | 株式会社島津製作所 | イオントラップ装置 |
JP4033133B2 (ja) | 2004-01-13 | 2008-01-16 | 株式会社島津製作所 | 質量分析装置 |
GB0404285D0 (en) * | 2004-02-26 | 2004-03-31 | Shimadzu Res Lab Europe Ltd | A tandem ion-trap time-of flight mass spectrometer |
US7456388B2 (en) * | 2004-05-05 | 2008-11-25 | Mds Inc. | Ion guide for mass spectrometer |
CN1326191C (zh) * | 2004-06-04 | 2007-07-11 | 复旦大学 | 用印刷电路板构建的离子阱质量分析仪 |
GB0511386D0 (en) * | 2005-06-03 | 2005-07-13 | Shimadzu Res Lab Europe Ltd | Method for introducing ions into an ion trap and an ion storage apparatus |
EP1971998B1 (de) * | 2006-01-11 | 2019-05-08 | DH Technologies Development Pte. Ltd. | Fragmentierung von ionen in der massenspektrometrie |
CN100424039C (zh) * | 2006-03-10 | 2008-10-08 | 中国科学院金属研究所 | 一种原位反应热压合成TiB2-NbC-SiC高温陶瓷复合材料的制备方法 |
GB0620398D0 (en) * | 2006-10-13 | 2006-11-22 | Shimadzu Corp | Multi-reflecting time-of-flight mass analyser and a time-of-flight mass spectrometer including the time-of-flight mass analyser |
US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
US7973277B2 (en) | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
RU2447539C2 (ru) * | 2009-05-25 | 2012-04-10 | Закрытое акционерное общество "Геркон-авто" | Анализатор пролетного квадрупольного масс-спектрометра (типа фильтр масс, "монополь" и "триполь") |
EP2507815A4 (de) * | 2009-11-30 | 2016-12-28 | Ionwerks Inc | Tof-spektrometrie und spektroskopie von oberflächen |
DE102012013038B4 (de) | 2012-06-29 | 2014-06-26 | Bruker Daltonik Gmbh | Auswerfen einer lonenwolke aus 3D-HF-lonenfallen |
DE102013208959A1 (de) * | 2013-05-15 | 2014-11-20 | Carl Zeiss Microscopy Gmbh | Vorrichtung zur massenselektiven Bestimmung eines Ions |
CN104377109B (zh) * | 2013-08-16 | 2017-10-03 | 中国人民解放军63975部队 | 一种线性离子阱质量分析器 |
JP6437002B2 (ja) * | 2013-12-24 | 2018-12-12 | ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド | 高速極性スイッチ飛行時間型質量分析計 |
GB201409074D0 (en) | 2014-05-21 | 2014-07-02 | Thermo Fisher Scient Bremen | Ion ejection from a quadrupole ion trap |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5569917A (en) * | 1995-05-19 | 1996-10-29 | Varian Associates, Inc. | Apparatus for and method of forming a parallel ion beam |
-
1998
- 1998-01-30 GB GBGB9802111.6A patent/GB9802111D0/en not_active Ceased
-
1999
- 1999-01-12 JP JP2000529737A patent/JP4132667B2/ja not_active Expired - Lifetime
- 1999-01-12 AU AU20651/99A patent/AU2065199A/en not_active Abandoned
- 1999-01-12 EP EP99901017A patent/EP1051730B1/de not_active Expired - Lifetime
- 1999-01-12 WO PCT/GB1999/000084 patent/WO1999039368A2/en active IP Right Grant
- 1999-01-12 DE DE69906699T patent/DE69906699T2/de not_active Expired - Lifetime
- 1999-01-12 US US09/530,091 patent/US6380666B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69906699T2 (de) | 2003-10-23 |
GB9802111D0 (en) | 1998-04-01 |
JP2002502095A (ja) | 2002-01-22 |
WO1999039368A2 (en) | 1999-08-05 |
JP4132667B2 (ja) | 2008-08-13 |
US6380666B1 (en) | 2002-04-30 |
EP1051730A2 (de) | 2000-11-15 |
WO1999039368A3 (en) | 1999-09-23 |
EP1051730B1 (de) | 2003-04-09 |
AU2065199A (en) | 1999-08-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |