DE69933339D1 - Nachweisvorrichtung für kleine Kapazitätsänderungen - Google Patents

Nachweisvorrichtung für kleine Kapazitätsänderungen

Info

Publication number
DE69933339D1
DE69933339D1 DE69933339T DE69933339T DE69933339D1 DE 69933339 D1 DE69933339 D1 DE 69933339D1 DE 69933339 T DE69933339 T DE 69933339T DE 69933339 T DE69933339 T DE 69933339T DE 69933339 D1 DE69933339 D1 DE 69933339D1
Authority
DE
Germany
Prior art keywords
detection device
small capacity
capacity changes
changes
small
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69933339T
Other languages
English (en)
Other versions
DE69933339T8 (de
DE69933339T2 (de
Inventor
Hiroki Morimura
Satoshi Shigematsu
Katsuyuki Machida
Akihiko Hirata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP18722798A external-priority patent/JP3356401B2/ja
Priority claimed from JP19345598A external-priority patent/JP3314355B2/ja
Priority claimed from JP23268998A external-priority patent/JP3444399B2/ja
Priority claimed from JP23386798A external-priority patent/JP3333959B2/ja
Priority claimed from JP23385898A external-priority patent/JP3270927B2/ja
Priority claimed from JP11157755A external-priority patent/JP3082141B1/ja
Priority claimed from JP11157763A external-priority patent/JP3044660B1/ja
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Publication of DE69933339D1 publication Critical patent/DE69933339D1/de
Publication of DE69933339T2 publication Critical patent/DE69933339T2/de
Application granted granted Critical
Publication of DE69933339T8 publication Critical patent/DE69933339T8/de
Active legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V40/00—Recognition of biometric, human-related or animal-related patterns in image or video data
    • G06V40/10—Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
    • G06V40/12—Fingerprints or palmprints
    • G06V40/13—Sensors therefor
    • G06V40/1306—Sensors therefor non-optical, e.g. ultrasonic or capacitive sensing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/24—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using capacitors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element
    • G11C27/028—Current mode circuits, e.g. switched current memories
DE69933339T 1998-07-02 1999-07-01 Nachweisvorrichtung für kleine Kapazitätsänderungen Active DE69933339T8 (de)

Applications Claiming Priority (14)

Application Number Priority Date Filing Date Title
JP18722798A JP3356401B2 (ja) 1998-07-02 1998-07-02 表面形状認識用センサ
JP18722798 1998-07-02
JP19345598 1998-07-08
JP19345598A JP3314355B2 (ja) 1998-07-08 1998-07-08 表面形状認識用センサ回路
JP23268998A JP3444399B2 (ja) 1998-08-19 1998-08-19 波形整形回路
JP23268998 1998-08-19
JP23386798 1998-08-20
JP23385898A JP3270927B2 (ja) 1998-08-20 1998-08-20 表面形状認識用センサ回路
JP23386798A JP3333959B2 (ja) 1998-08-20 1998-08-20 表面形状認識用センサ回路
JP23385898 1998-08-20
JP11157755A JP3082141B1 (ja) 1999-06-04 1999-06-04 表面形状認識用センサ回路
JP15776399 1999-06-04
JP11157763A JP3044660B1 (ja) 1999-06-04 1999-06-04 表面形状認識用センサ回路
JP15775599 1999-06-04

Publications (3)

Publication Number Publication Date
DE69933339D1 true DE69933339D1 (de) 2006-11-09
DE69933339T2 DE69933339T2 (de) 2007-05-16
DE69933339T8 DE69933339T8 (de) 2007-09-13

Family

ID=27566200

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69933339T Active DE69933339T8 (de) 1998-07-02 1999-07-01 Nachweisvorrichtung für kleine Kapazitätsänderungen

Country Status (3)

Country Link
US (1) US6438257B1 (de)
EP (1) EP0969477B1 (de)
DE (1) DE69933339T8 (de)

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JP4403471B2 (ja) * 1999-08-18 2010-01-27 ソニー株式会社 指紋照合装置及び指紋照合方法
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JP2003028607A (ja) * 2001-07-12 2003-01-29 Sony Corp 静電容量検出装置およびこれを用いた指紋照合装置
US6636053B1 (en) 2001-11-02 2003-10-21 Stmicroelectronics, Inc. Capacitive pixel for fingerprint sensor
JP3806044B2 (ja) * 2002-02-08 2006-08-09 日本電信電話株式会社 表面形状認識用センサおよびその製造方法
JP3858728B2 (ja) * 2002-03-04 2006-12-20 セイコーエプソン株式会社 静電容量検出装置
KR100443081B1 (ko) * 2002-03-09 2004-08-04 (주)멜파스 지문신호의 시변화 특성을 이용한 지문감지장치 및지문감지방법
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US20040155752A1 (en) * 2002-11-27 2004-08-12 Jory Radke Reading fingerprints
FR2849244B1 (fr) * 2002-12-20 2006-03-10 Sagem Procede de determination du caractere vivant d'un element porteur d'une empreinte digitale
US7019563B2 (en) * 2003-01-23 2006-03-28 Nippon Telegraph And Telephone Corporation Waveform shaping circuit
JP3775601B2 (ja) 2003-04-17 2006-05-17 セイコーエプソン株式会社 静電容量検出装置及びその駆動方法、指紋センサ並びにバイオメトリクス認証装置
JP4036798B2 (ja) * 2003-07-29 2008-01-23 アルプス電気株式会社 容量検出回路および検出方法並びに指紋センサ
JP4396814B2 (ja) * 2003-09-01 2010-01-13 セイコーエプソン株式会社 静電容量検出装置及び電子機器
JP3909712B2 (ja) 2003-10-10 2007-04-25 セイコーエプソン株式会社 静電容量検出装置
EP1548409A1 (de) * 2003-12-23 2005-06-29 Dialog Semiconductor GmbH Kapazitive Differenzmessung
KR100564915B1 (ko) * 2004-02-10 2006-03-30 한국과학기술원 정전용량방식 지문센서 및 이를 이용한 지문 센싱방법
JP4443322B2 (ja) * 2004-06-23 2010-03-31 アルプス電気株式会社 押圧センサ
WO2006009110A1 (ja) * 2004-07-23 2006-01-26 Nippon Telegraph And Telephone Corporation 表面形状認識センサ装置
JP2006071579A (ja) * 2004-09-06 2006-03-16 Alps Electric Co Ltd 容量検出回路及び容量検出方法
JP4363281B2 (ja) * 2004-09-08 2009-11-11 オムロン株式会社 容量計測装置および方法、並びにプログラム
CN101902958B (zh) 2007-11-28 2012-07-04 加利福尼亚大学董事会 无接触生物电势传感器
TWI394485B (zh) * 2008-06-18 2013-04-21 Ite Tech Inc 發光元件驅動電路及其方法
US8544336B2 (en) * 2009-11-26 2013-10-01 Xsensor Technology Corporation Sealed conductive grid capacitive pressure sensor
US9360501B2 (en) 2010-06-01 2016-06-07 The Regents Of The University Of California Integrated electric field sensor
US10112556B2 (en) 2011-11-03 2018-10-30 Ford Global Technologies, Llc Proximity switch having wrong touch adaptive learning and method
DE102013102557B4 (de) * 2012-03-16 2014-07-10 Intel Mobile Communications GmbH Erfassung von Umgebungsbedingungen in einem Halbleiterchip
US9793220B2 (en) 2012-03-16 2017-10-17 Intel Deutschland Gmbh Detection of environmental conditions in a semiconductor chip
US9559688B2 (en) * 2012-04-11 2017-01-31 Ford Global Technologies, Llc Proximity switch assembly having pliable surface and depression
US9660644B2 (en) 2012-04-11 2017-05-23 Ford Global Technologies, Llc Proximity switch assembly and activation method
US9531379B2 (en) * 2012-04-11 2016-12-27 Ford Global Technologies, Llc Proximity switch assembly having groove between adjacent proximity sensors
US9520875B2 (en) 2012-04-11 2016-12-13 Ford Global Technologies, Llc Pliable proximity switch assembly and activation method
US9831870B2 (en) 2012-04-11 2017-11-28 Ford Global Technologies, Llc Proximity switch assembly and method of tuning same
US9568527B2 (en) 2012-04-11 2017-02-14 Ford Global Technologies, Llc Proximity switch assembly and activation method having virtual button mode
US9944237B2 (en) 2012-04-11 2018-04-17 Ford Global Technologies, Llc Proximity switch assembly with signal drift rejection and method
CN107273790A (zh) 2013-07-09 2017-10-20 指纹卡有限公司 指纹感测系统和方法
US9245649B2 (en) * 2013-12-17 2016-01-26 Intermolecular, Inc. Resistive switching sample and hold
US20160078269A1 (en) * 2014-09-15 2016-03-17 Fingerprint Cards Ab Fingerprint sensor with sync signal input
US10038443B2 (en) 2014-10-20 2018-07-31 Ford Global Technologies, Llc Directional proximity switch assembly
KR101659492B1 (ko) * 2014-11-10 2016-09-23 한신대학교 산학협력단 정전 용량 감지용 전하 전송 회로 및 이를 포함하는 지문인식장치
US9654103B2 (en) 2015-03-18 2017-05-16 Ford Global Technologies, Llc Proximity switch assembly having haptic feedback and method
KR101596377B1 (ko) * 2015-04-08 2016-02-22 실리콘 디스플레이 (주) 정전용량 지문센서
US9548733B2 (en) 2015-05-20 2017-01-17 Ford Global Technologies, Llc Proximity sensor assembly having interleaved electrode configuration
KR20170019581A (ko) * 2015-08-12 2017-02-22 삼성전자주식회사 지문 감지 센서, 이를 포함하는 전자 장치 및 지문 감지 센서의 동작 방법
TWI621997B (zh) * 2016-02-04 2018-04-21 速博思股份有限公司 高效能指紋辨識裝置
CN105911362A (zh) * 2016-04-22 2016-08-31 福州福大海矽微电子有限公司 一种基于电容移相效应的微弱电容检测电路及方法
US10205895B2 (en) * 2017-07-05 2019-02-12 Sunasic Technologies Limited Capacitive image sensor with noise reduction feature and method operating the same
JP7193203B2 (ja) * 2018-11-16 2022-12-20 ミネベアミツミ株式会社 検出装置
KR20210048952A (ko) * 2019-10-24 2021-05-04 삼성전자주식회사 지문 영상을 생성하는 방법 및 지문 센서
TW202213175A (zh) * 2020-09-29 2022-04-01 神盾股份有限公司 用於感測手指生物特徵的光學感測裝置及使用其的電子裝置

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Also Published As

Publication number Publication date
EP0969477A1 (de) 2000-01-05
DE69933339T8 (de) 2007-09-13
EP0969477B1 (de) 2006-09-27
DE69933339T2 (de) 2007-05-16
US6438257B1 (en) 2002-08-20

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Legal Events

Date Code Title Description
8381 Inventor (new situation)

Inventor name: MORIMURA, HIROKI, SHINJUKU-KU, TOKIO, JP

Inventor name: SHIGEMATSU, SATOSHI, SHINJUKU-KU, TOKIO, JP

Inventor name: MACHIDA, KATSUYUKI, SHINJUKU-KU, TOKIO, JP

Inventor name: HIRATA, AKIHIKO, SHINJUKU-KU, TOKIO, JP

8364 No opposition during term of opposition