EP0119198A1 - Automatic semiconductor surface inspection apparatus and method - Google Patents

Abstract

In an apparatus and a method for automatically inspecting a surface of semiconductor wafers, lighting on a black background (12) is used to illuminate a wafer surface (20) in order to detect the edges of the material thereon. . The surface (20) is examined (30, 52) and an edge analysis (14) is carried out to automatically determine the edge limits of the material from the spatial distribution of the reflected energy. The edge boundaries are compared (126) with a reference model (120) and further analysis (128) determines the location of the boundary differences between the material boundaries and the reference model. Next is provided a report (130) which may contain for example information for replacement or cleaning of the reticle, defective positions and classification of defects, including defects that can render the slice unusable ("killer defects") .

Description

AUTOMATIC SEMICONDUCTOR SURFACE INSPECTION APPARATUS AND METHOD

Background of the Invention

The invention relates generally to the inspection of semiconductor wafers during manufacture, and in particular to a method and apparatus for the automatic inspection of semiconductor wafers during manufacture to determine the quality of the post-development photoresist and post-etch material structure.

Very Large Scale Integration (VLSI) technology and the immense packing density of the products resulting therefrom have, in recent years, required significant time to perform even small inspections of the semiconductor wafer as it is being processed. Such inspection typically requires a method for finding defects such as relatively small feature distortions and small size particulate contaminates.

The defects to be identified during semiconductor manufacture generally come from either the photolithographic process employed during manufacture or the properties of the photoresist with which the photolithographic process interacts. For example, the mask through which the semiconductor is exposed can have acquired a defect during handling or the photoresist can develop in a non-uniform manner thereby causing a defect to occur on the semiconductor surface. Other defects can occur due to particulate contaminates such as dirt particles which "land" on the semiconductor wafer surface during processing. Contaminates may also result from a "dirty" developer photoresist. These defects and contaminates, very small features in a relatively large inspection area, are important because they identify or help to correct potential problems prior to the completion of the manufacturing process. This early identification enables individual wafers containing critical defects to be disposed of at a stage prior to the completion of the manufacturing process. In addition, such information can be employed for monitoring the various stages of the fabrication process and can significantly affect the yield of the production line and hence the cost of manufacture. For example, early detection of a defect may allow the wafer to be reworked and the defect corrected.

Presently, inspection is performed either manually on selected semiconductor wafers or by machine. The manual or machine inspection processes often make decisions based only upon the relative feature differences between repeating patterns on the wafer surface.

An object of the invention is therefore an automatic inspection method and apparatus for semiconductor wafers which reliably and automatically identify sub-micron defects on the surface of the semiconductor element during manufacture. Other objects of the invention are a method and apparatus for the automatic inspection of semiconductor surfaces which detect both distortions or anomolies in the geometry on the surface as well as the presence of particulate contaminates. A further object of the invention is a method and apparatus for the automatic inspection of wafer surfaces which operate in real time and which reduce the manufacturing cost of the fabrication process.

Summary of the Invention

The invention relates to a method and apparatus for the automatic inspection of a semiconductor wafer surface. The apparatus features an illumination system for illuminating the wafer surface to be inspected. Preferably, the illumination system employs dark field illumination for highlighting the material edges of the surface. A scanning system is provided for forming in a storage array a representation of the spatial distribution of illumination energy reflected from the surface. This spatial distribution represents, when dark field illumination is employed, the material edges of the wafer which has been illuminated. In a preferred embodiment of the invention the scanning system moves the wafer for scanning the inspection area' while maintaining the optical illumination and receptor system stationary.

An edge analysis circuit automatically analyzes the reflected energy spatial distribution, which is represented in the array, for determining edge boundaries occurring on the wafer surface. A comparison circuit then compares the located edge boundaries (found by the analysis circuit) with a reference pattern which describes the expected geometrical layout of the wafer surface. The comparison circuit then determines the location of boundary disagreements between the analysis circuit edge boundaries and the reference pattern description. The boundary disagreements are then output, for example visually shown on a display, whereby the equipment user can personally view the defects. In other aspects, the invention features a circuit employing an edge threshold level to discriminate between potential edge boundaries of different intensities, that is, to discriminate signal from noise. Thresholding acts as an amplitude filter. In addition, the boundaries are preferably spatially filtered (as described hereinafter) to form a more continuous edge pattern.

In the preferred embodiment, the apparatus further features a circuit for classifying the boundary disagreements and in particular for providing a class for "killer defects", that is, defects which prevent proper operation of a completed semiconductor circuit.

The apparatus further features circuitry for automatically determining, for a wafer having a repeating reticle pattern thereon (that is, a pattern formed using a reticle and which repeats on the wafer surface), whether a defect in the reticle has occurred and therefore whether the reticle should be cleaned or replaced. Furthermore, the apparatus provides circuitry for automatically repositioning the wafer surface for visual inspection of the surface at a selected boundary. In addition, circuitry is preferably provided to enable a more tolerant thereshold to be applied to matching edge corners on the wafer surface to the reference pattern.

In another aspect, the invention relates to a method for the automatic inspection of a semiconductor wafer surface. The method features the steps of illuminating the wafer surface to be inspected, preferably employing dark field illumination for highlighting the edges of the surface. The method further features forming, in a storage array, a representation of the spatial distribution of illumination energy reflected from the surface; automatically analyzing the reflected energy spatial distribution for determining edge boundaries occurring on the wafer surface; comparing the edge boundaries found by the analysis step with a reference pattern description which describes the expected geometrical layout of the wafer surface; and then determining the location of boundary disagreements between the analysis edge boundaries and the reference pattern description. The boundary disagreements are then output, for example shown on a display, whereby the equipment user can view the defects.

In other aspects, the method features locating potential edge boundaries on the wafer using local differences in reflection values and then employing a threshold level to determine which edge boundaries are to be maintained and stored. The illustrated method also features spatially filtering the edge boundaries to form a more continuous edge pattern.

In the preferred embodiment of the invention, the method features classifying the various boundary disagreements, and in particular provides for a class for "killer defects", that is, defects which prevent proper operation of the semiconductor circuit. The method further features, in the illustrated embodiment, automatically determining, for a wafer surface having a repeating reticle pattern thereon, whether a defect in the reticle has occurred and therefore whether the reticle should be cleaned or replaced. Furthermore, the illustrated method provides for automatic repositioning the wafer surface for visual inspection at a selected boundary and for providing a more tolerant threshold to be applied to matching corner edges of the wafer to the reference pattern.

Brief Description of the Drawings

Other objects, features, and advantages of the invention will appear from the following description taken together with the drawings in which:

Figure 1 is a schematic representation of the automatic inspection apparatus according to a preferred embodiment of the invention;

Figure 2 is a more detailed schematic of the image storage array according to a preferred embodiment of the invention;

Figure 3 is a diagrammatic representation of the convolution functions employed in connection with a preferred embodiment of the invention;

Figure 4 is a flow chart of the edge detection section according to a preferred embodiment of the invention;

Figure 5 is a flow chart of the edge pruning section according to a preferred embodiment of the invention;

Figure 6 is a flow chart of the edge comparison and report section according to a preferred embodiment of the invention; Figure 7 is a diagrammatic representation of a lessening of tolerance with respect to a corner edge detection; and

Figure 8 is a schematic circuit diagram of the automatic detection apparatus according to a preferred embodiment of the invention.

Description of a Preferred Embodiment General Structure

Referring to Figure 1, an automatic inspection apparatus 10 has an optical section 12, an image storage array 13, an image processing and analysis section 14, and a display section 16. In general operation, a semiconductor wafer 18 having a surface 20 to be inspected is mounted in a stable jig structure 22. The wafer surface is illuminated by the optical section 12. In particular, the preferred embodiment employs a 360° dark field presentation to highlight the edge structure present on the semiconductor surface. (In many applications bright field illumination can also be employed.) Reflected light is directed through the central image forming optics 26 of a microscope 27 (for example a Leitz Ergolus), and is focused on a photosensitive sensor 28 which may be for example a Fairchild Model CCD-133 having a 1024 x 1 linear element arrangement. The wafer surface is moved, by a step and repeat mechanism 30 attached to jig 22, in a direction transverse to the length of the optical array. Thereby, the image of the wafer surface scans across the sensor 28. The output of optical sensor 28 is stored in the storage array 13.

The image processing and analysis circuitry 14 accesses the stored data of array 13 and processes the data to locate edge boundaries on the semiconductor wafer surface. These edge boundaries may be photoresist edge conductors, or other material edges on the semiconductor surface. Circuitry 14 can be implemented in either hardware, software, or a combination of the two. When a software implemention is employed, illustrated circuitry 14 is implemented using a general purpose digital computer, such as a Digital Equipment Corporation Model PDP-11/23 computer.

The image processing and analysis section 14 determines the locations of the edge boundaries on the wafer, smoothes and links those boundaries to form a more continuous edge pattern, and compares the edge boundary locations with a reference pattern of the design structure of the wafer surface. Any distortions from or disagreements with the expected pattern are flagged and become potential boundary disagreements. Each of the possible boundary disagreements is preferably classified and a disagreement list results therefrom. The group of boundary disagreements resulting from the analysis of a scanned frame by the image processing and analysis section is displayed, for example on a visual display. The visually presented information can describe the class and location of the defects or can automatically display the actual defects for visual inspection.

Background

As noted above, the present invention can be employed for monitoring a VLSI semiconductor fabrication. Typically, integrated circuits are fabricated by forming the circuit directly on a silicon crystal substrate. The substrate is typically a circular wafer, having a diameter of between three and six inches, and on each wafer will be fabricated several hundred complete circuits of the same type. Each complete circuit is on a die or chip which is generally rectangular in shape, several millimeters on a side. Following fabrication, the wafer is scribed to obtain the individual die for packaging or integration onto a more complex circuit. Each of the die patterns is typically made by using either a mask or a reticle. The term "mask" is used to denote a patterned target which contains the patterns of all of the die on the wafer. The mask is generally a one-to-one image of the entire wafer and when a wafer is exposed through a mask, the entire wafer is effectively exposed at once. The term "reticle" is generally used to denote a patterned target which contains the pattern of at most a few die on the wafer. In the limit, the reticle may contain the pattern for only one die on the wafer. When using a reticle, the entire wafer is exposed by a step and repeat process. That is, one part of the wafer is exposed; the wafer is then stepped in a known direction; and the exposure is then repeated. By continuing the process, the entire wafer is covered with a repeating pattern. Thus, when exposing with a reticle, and especially a single die reticle, a defect in the reticle affects every group of die on the wafer made with that reticle. Since the VLSI technology is moving the industry away from masks and toward reticles, the inspection of the wafer surface for reticle defects is extremely important.

In the illustrated example, the semiconductor wafer 20 is assumed to have thereon a developed photoresist pattern. According to the invention, the photoresist pattern is being automatically inspected for defects such as geometric anomalies. Geometric anomalies occur, for example, as a result of errors or defects on the mask or reticle, particles which settle on or near the mask or reticle during exposure, particles which settle on the wafer during exposure, or development induced defects. In addition, the inspection process is designed to detect and locate dimensional errors, which can occur when the photoresist pattern is geometrically correct but has certain critical dimensions which are out of specification, and particulate contaminates, that is, particles which fall onto a patterned photoresist.

In accordance with the invention therefore, the developed photoresist is illuminated, with dark field illumination in this preferred embodiment of the invention, for highlighting the edge information available on the wafer surface, and a digital image of the area to be inspected is acquired. The digital image is processed to generate or derive a description of the area being inspected in terms of the edges in the area. The edge information is presumed to completely define the boundaries of the photoresist and/or particulate contaminates lying thereon. In the case of the photoresist, the edges can be closely spaced to define conductors or can be spaced much further apart to define active areas such as the base or emitter of a transistor. With respect to particulate contaminates, the edges are spaced apart somewhat and form, generally speaking, a relatively ragged closed loop.

The Illumination System

The illustrated illumination system, as noted above, is a reflective or incident dark field illumination system which directs light energy from a source 40 onto a beam splitter 42 and through a mirrored collar 44 of the microscope 27 and onto the wafer surface 18 at an oblique angle. The incident illumination is then reflected back into and is collected by the microscope optics 26. The illuminated wafer surface image is focused by the microscope objective and subsequent optics 48 (if needed) onto the surface of the optical sensor 28.

Because the wafer is opaque, it can only be imaged by light which is reflected from the surface. In dark field illumination, light is directed onto the object at a highly oblique angle through the mirrored collar 44 which surrounds the image forming lens system 26 of the objective. The light energy from source 40 is directed toward beam splitter 46 in an annulus configuration toward the sample semiconductor wafer. An opaque blocking member 50 is employed to prevent energy from being directed into the microscope image forming optics 26.

As is well known, the effect of using dark field illumination is to provide a highly specular reflection from an optically smooth, mirror-like surface such as is typical of the polished surface of an unpatterned silicon wafer. However with an optically rough surface, that is, one in which there are material discontinuities, the reflection is diffuse and in that case, reflective rays are scattered in all directions. Some of the reflected energy is captured by the microscope objective and the object appears bright at these areas. Thus, generally speaking, the unpatterned or optically smooth silicon substrate surface appears dark while the photoresist edges and particulate contaminates appear bright. (If bright field illumination had been employed, the silicon substrate would have appeared bright, while the photoresist edges would have appeared dark. Later image processing would proceed accordingly.) Semiconductor Scanning

As noted above, the dark field image is formed by the microscope optics 26, and further focusing optics 48 if needed, at the image plane of the electro-optical sensor or detector 28. The sensor converts the reflected illumination incident thereon into an electrical signal which is later scaled and quantized into a discrete set of levels. Each level represents a small interval of illumination power and in the illustrated invention the total illumination range has two hundred and fifty-six levels. Sensor 28 is preferably a solid state sensor and in the illustrated embodiments is a linear photoresistive array. An alternate sensor could be a television-type vidicon camera.

The linear array approach thus employs a solid state image sensor having a plurality of distinguishable elements arranged in a rectilinear array. In the illustrated embodiment of the invention, the sensor 28 provides 1,024 distinguishable elements arranged in a straight line linear array. The area of the wafer imaged upon the array (a scan line) is thus spatially quantized into the 1,024 picture elements (pixels). Each pixel in the illustrated embodiment corresponds to 0.5 microns on the wafer surface. The illumination falls onto the array for a preset integration time during which light produced charge is collected in each of the distinguishable elements. At the end of the integration time, the charge accummulated at each element is read out and transduced into a voltage signal. The voltage is then scaled (or amplified) and quantized with the result being a spatial (1,024 elements) and voltage (256 levels) quantization of the line of the image. In order to scan and produce an entire two-dimensional image, relative movement must be provided between the array and the wafer. Either the array must be moved across the stationary image or the image must be moved across the stationary array (a combination of the two could also be employed). As noted above, in the illustrated embodiment, the image is moved across the array. Thus, a mechanical stage 52 supporting the wafer 18 and jig 22 moves in a direction perpendicular to the array line under the control of a step and repeat mechanism.

An alternate approach, which reduces the movement required to produce a two-dimensional image of a selected surface area, is to employ an area array solid state sensor such as the Fairchild Model CCD-221. This sensor has a 488 x 380 element array.

No matter how the raw image is acquired, the resulting electrical data signals are stored in memory array 13 for later image processing. Referring to Fig. 2, in the illustrated embodiment of the invention, the storage array 13 has first and second random access memory (RAM) elements 54 and 56, one of which is being filled by the sensor 28 of scanning system while the other memory is being processed by the image processing and analysis section 14. Switches 58 and 60, which control the flow of data into and from elements 54 and 56, are preferably digital gating structures.

Image Processing

Referring now to the image processing and analysis section, the raw image data stored in memory array 13 represents the image as a two-dimensional matrix of numbers. The "numbers" represent the image intensity across the spatial extent of the wafer surface being scanned. The image processing and analysis circuitry operates upon this raw image data to derive a description of the image in terms of potential edge boundaries (the edge finding procedure). Thereafter the edge boundary data (which identifies potential edge boundaries) is pruned or massaged to eliminate false boundaries and "clean-up" true boundaries (edge boundary pruning) . Finally the edge boundaries are compared against a reference pattern, and defects or disagreement boundaries are recorded (edge boundary comparison).

Edge Finding

In the illustrated embodiment of the invention, the process of edge finding is implemented using convolution masks (or filters) operating along orthogonal axes. In the illustrated embodiment, these masks align with the horizontal and vertical axes with which most of the edges of the image will also align.

Referring to Fig. 3, ideally, a photoresist or other material edge, when illuminated with dark field illumination, produces a bell-shaped light intensity distribution (intensity as a function of distance) in a direction perpendicular to the edge. Thus, if the edge runs parallel to one orthogonal axis, the light distribution profile will be exclusively directed parallel to the other orthogonal axis.

An optically rough particle (such as a contaminant) will produce, in response to dark field illumination, a signal waveform (representing light intensity versus distance), having a rising and a falling edge plus an intermediate region of relatively constant high intensity. To find and distinguish the material edges and the particle edges, two different convolution masks or patterns are employed. A peak finding convolution pattern w is designed to provide a zero crossing when the peak of an intensity distribution is crossed. A typical and preferred peak finding mask w has weighting factors w^ equal to -0.3, -0.1, 0, 0.1, 0.3 (for i = -2, -1, 0, 1, and 2, respectively), so that during the convolution process as defined by equation 1 below, a zero crossing indicates the center of the peak.

where l_i represents a new sequence of numbers created by convolving an original sequence of numbers (h_i) with the weighting sequence w_i corresponding to the convolution mask. Thus, to find a horizontal edge, the convolution is performed upon a vertical line of data, and to find a vertical edge, the convolution is performed upon a horizontal line of data. For edges which are neither horizontal or vertical, a combination of the results of the horizontal and vertical peak finding convolution must be considered. It is important at this point to note, however, that the zero crossings resulting from the convolution process only provide the location of a potential edge point. Further processing (edge pruning) is required to determine whether the potential edge point is part of a material edge boundary.

The second convolution mask W, a step finding function, provides a data set for finding the edge boundaries of a particle contaminant. A similar convolution approach is employed; however, the convolution mask is modified to provide a zero crossing where the edge has the appearance of a step with relatively wide pateaus extending from the step in both directions. Thus, the step finding convolution mask is designed to provide zero crossings at the center of an edge bounding a relatively large area or plateau. A typical step finding convolution mask, and the one employed in the illustrated embodiment, uses the weighting sequence W_i: -.4, -.1, 1, -.1, -.4 (for i = -2, -1, 0, 1, and 2, respectively). The results of using these convolution masks with a photoresist edge structure and a particle contaminate edge structure are illustrated in Figure 3.

Referring to Figure 4, which is a flow chart for that portion of the image processing and analysis section which relates to edge detection, the acquired image represented by block 60 is first spatially smoothed to help eliminate the noise "ripples" inherent in the digitization process of a noisy analog signal. The spatial filter provides low pass filtering which also helps eliminate invalid peaks due to system noise. The spatial filtering, represented by block 62, is applied along each of the orthogonal axes. A Gaussian function could be used, however it is much simpler to approximate the Gaussian by a weighting function having weights: 1/4, 1/2, 1/4. Thus, the value of each picture element intensity is replaced by an average equal to 1/4 of the previous value, plus 1/4 of the succeeding value, plus 1/2 of the present value. The smoothed data resulting from the operation indicated by block 62 is preferably stored in the same memory as the acquired raw image data. Next, assuming that the orthogonal axes are the vertical and horizontal axes, the smoothed image is convolved in both the horizontal and vertical directions with the peak finding and step finding convolution functions respectively. This is indicated at blocks 64, 66, 68, and 70. The reuslt of the respective convolution processes is then searched for possible zero crossings. This is indicated at blocks 72, 74, 76, and 78. For each detected zero crossing, the strength of the crossing, is, for example, set equal to the peak amplitude of the other convolution function for that axis and within a small range of pixels of the zero crossing. The strengths are stored, as indicated at 80, 82, 84, and 86, preferably in the same storage array which originally stored the raw image data.

At this point, the strengths resulting from the step finding convolution are made positive. This is indicated at 88 and 90. Also, the zero crossings for the peak finding convolution result are reviewed by eliminating invalid zero crossings, i.e., those zero crossings representative of noise. These are generally weak zero crossings which do not have associated with them strong related zero crossings. This is represented by blocks 92 and 94 of Figure 4.

The edge detection process, by eliminating weak zero crossings of the peak finding convolution, discriminates between noise and potential photoresist edges. The strength measurement discriminator, in the illustrated embodiment, is a threshold value fixed prior to processing and in general depends upon the materials being employed. In other embodiments, the threshold value can be varied dynamically during processing to take account of local variations in both noise and signal strength as a result of the semiconductor fabrication process.

The strength measurement for a zero crossing is, in the illustrated embodiment, the maximum value of the step finding convolution output within plus or minus one picture element of where the peak finding convolution output goes through zero. Importantly the strength of the step finding convolution will not be "confused" with noise since it is not a peak finding element but instead effectively locates inflection points, that is, the position at which the first derivative of the image signal passes through a minimum or maximum.

The strengths are coded at 96, 98, 100, and

102 and are stored in coded fashion in the same memory used to first acquire the raw image data. Coding can be accomplished by allocating to each word of the array (one word representing one pixel), preassigned bits representing the vertical and horizontal axes, and the peak finding or step finding strength result. Alternately, the word can be divided to indicate whether the strength stored there is strong or weak, is the result of a step or peak finding convolution, and is for the horizontal or vertical axis.

During storage as indicated at block 104, the horizontal and vertical strengths for the peak finding convolutions, and the horizontal and vertical strengths for the step finding convolutions, are summed. This accommodates edge boundaries which are neither horizontal nor vertical but at an angle oblique thereto such as at a 45° angle. The stored and coded zero crossing strengths are then analyzed to detect valid edge boundaries and to discard invalid boundaries. This is referred to as the pruning process and is indicated at block 106 of Figure 4.

The Edge Boundary Pruning

Referring to Fig. 5, once the coded strength of the convolution edge detection process has been stored (block 108), and prior to forming the edge boundaries, the data must be further analyzed to remove invalid edge points. There is also a need to discriminate between edges representing, for example, a photoresist edge (Block 110) and those which are part of a particle contaminant edge (Block 112).

Thus, in the illustrated embodiment, if there is a peak finding convolution zero crossing within three picture elements of a step finding convolution zero crossing, then the step finding zero crossing is eliminated (Block 112). This occurs because it is assumed that the step finding zero crossing is erroneous, and it occurred in connection with and in the middle of a relatively wide photoresist area. Similarly, there might occur between two distant step finding convolution zero crossings, a peak finding convolution zero crossing. This can occur for example in the middle of a particle contaminant. In this case, the peak finding convolution zero crossing would be discarded (Block 110) although it is not generally necessary for later processing to do so. As a result of the pruning process therefore all that is left in the storage array 13, are edge boundaries because the discarded zero crossings will have been "zeroed". The edge boundaries which remain however may or may not be complete and continuous. Thus, even though most of an edge boundary may be found, there can further be a gap in the edge boundary which should be filled in. The gap may occur because the edge point had a small strength. According to the preferred embodiment of the invention, these apparent discontinuities are smoothed and filtered by filling in the gaps between edge boundary points so that the edge is continuous along its boundary. This is indicated at block 116 of Figure 5.

Edge Boundary Comparison

Referring to Figure 6, the "pruned" edge boundaries are available to a comparison circuit as indicated at block 118. Initially, the "pruned" edge boundaries are aligned with a reference pattern (block 120). The reference pattern is provided from a reference data source such as a computer aided design (CAD) tape which is processed at 122 to provide data to the reference pattern, block 120. The alignment, indicated by block 124, is achieved primarily by "dead reckoning". That is, two relatively long edge boundaries, one parallel to one orthogonal axis and the other parallel to the other orthogonal axis, are selected in the reference pattern and the corresponding edge boundaries are "found" in the pruned edge boundary data memory. This process is practical only because the alignment of the wafer is known to within a few microns. Thus, the alignment search is carried out over a very small section of the memory and can be performed in a short time. The result of the alignment search is to provide horizontal and vertical offsets between the reference pattern and the stored data. Thereafter, as indicated by block 126, edges in the reference block and the stored data are compared. Corresponding points, that is, points appearing in the same location in both patterns, are eliminated from the storage array 13, and, in the illustrated embodiment, non-corresponding points, that is, points in the reference pattern which do not appear in the storage array are written into the storage array at their appropriate locations. Points in the storage array which do not have a corresponding point in the reference pattern are kept. As a result, when the matching indicated by block 126 is completed, there results in the storage array 13 a set of disagreement boundaries which define distortions and particle contaminants, if any, on the image surface.

The disagreements are examined at block 128; and as a result, the disagreements or defects are classified. One particularly important class of defects or disagreements are those disagreements which materially affect proper operation of the semiconductor circuitry. These defects, if critical, are called

"killer defects" and can be determined by defined areas of activity whose location can be provided by the reference pattern 120. Thus, a particle contaminant at a location spaced apart from the operating circuitry of the semiconductor wafer does not normally affect circuit operation whereas a contaminant on the circuit itself may cause the circuit to fail. In either case, a report is compiled, in the illustrated embodiment at block 130, and is provided to the display device 16 of Figure 1.

It is important to note, that a defect in one layer of a semiconductor structure can materially affect semiconductor circuit operation on another layer of the structure. Therefore, the "defined areas of activity" provided by reference pattern 120 will relate not only to activity on the layer being formed, but also to the effect of a defect on a subsequently, or previously formed layer. In the illustrated embodiment of the invention, it is the CAD tape (or other reference source) which is processed at 122 to provide the multi-layer activity volumes in which a defect can have an adverse effect, and in particular where the defect is properly classified as a "killer defect".

In determining the "alignment" at block 124, it has been tacitly assumed that the "pruned" edges align with the horizontal and vertical axes as defined by the analysis process. This may not be the case however. Nevertheless, since the resolution of the system tends to be on the order of one-tenth of a micron per pixel, it has been found satisfactory to provide a plus or minus one picture element deviation in determining the alignment. A similar alignment tolerance has also been provided for determining whether other lines of the reference pattern and the stored detected edge boundaries "correspond" to one another.

A major concern which occurs during the comparison process of block 126 relates to the physical processes by which corners are formed during the semiconductor fabrication process. Due to the frequency response of the optical system employed in forming the photoresist corners, and further due to the effects of the chemical process by which the photoresist is layed down and developed, corners generally become rounded so that a truly "squared" edge does not occur. As a result, corners would almost always be "flagged" as a defect absent any provision for loosening the tolerance of the system at the photoresist corner. As a result, referring to Figure 7, a loosening of the tolerance, or a window, is provided at the corner 132 defined by the reference pattern. The tolerance is illustrated by dashed lines 134, which allow the physical phenomena of a rounded corner represented by the dot-dash line 136 to be accommodated without being flagged defect. Clearly other tolerance windows could be employed although the illustrated window is particularly easy to implement.

The illustrated embodiment can also be employed to implement automatic focusing of the optical system, by testing for the "sharpness" of the image at the optical sensor 28. The automatic focusing mechanism adjusts the microscope optics to provide as sharp an image as possible at the image plane of sensor 28. This can be accomplished for example by mounting the microscope illumination system on a jig as indicated by dotted lines 140 (Fig. 1) and moving the jig up or down under the control of a drive mechanism 142. The drive mechanism 142 is controlled by the image processing and analysis section 14.

As another feature, the step and repeat mechanism 30 can, under the control of the image processing and analysis section 14, reposition the semiconductor wafer to provide for a visual review of a defect on the semiconductor surface by the apparatus operator. The defect review can be accomplished using either the dark field illumination employed in connection with edge detection or bright field illumination for visual inspection. As noted above, it is the trend in today's VSLI technology to use a repeating pattern on a semiconductor wafer surface. The apparatus herein is arranged to review the disagreements at block 128 for repeating patterns to find repeating defects, if any. Repeating defects are then reported as a possible and likely reticle defect which must be cured, for example, by cleaning the reticle or replacing it with. a new element. This is accomplished at block 128 of Figure 6.

The entire analysis system can be implemented in either hardware or software. Preferably, hardware is employed since the throughput and process time can be decreased by use of special purpose hardware such as an array processor employing a pipeline processing approach. Nevertheless, a software implementation can also be satisfactory. The flow charts of Figures 4, 5, and 6 have been implemented in using a Digital Equipment Corporation PDP-11/23. The software programs, including interactive operating system programs, are attached hereto as Appendix A. While the programs themselves do not form part of the invention, they do provide one particular implementation of the concepts and structure of the invention. In addition, the invention can be implemented in hardware as described in detail hereinafter.

Hardware Implementation

As noted above, the automatic inspection system of the invention can also be implemented in hardware. Referring to Figure 8, the hardware embodiment employs a process control and sequence timing circuit 148 adapted to provide an orderly transition of the data from the microscope optics illustrated by block 150 to the eventual report generation and display. The process control and timing circuit can be a hardwired apparatus, as is well known in the art, adapted to fix the timing of a plurality of elements or can be a special or general purpose computer which provides greater flexibility in changing the timing and control of the apparatus.

The image from the illumination optics 150 is provided through the sensor element which forms part of an image acquisition section 152. The image acquisition provides the scanned image for storage in a dual memory storage array 154 corresponding to image storage array 13. The scanning of the wafer is under the control of a wafer scan control circuit 156 as is well known in the art which is interactive with the process control and sequence timing circuit 148.

The image, once stored, is continually modified within the storage element so that minimal additional RAM storage is needed. Therefore, the raw data stored in memory 154 is filtered using a spatial filtering network 158. The spatial filtering network is adapted to sequentially read out the raw data from memory 154, and to effectively low pass filter it as described above using its digitial hardwired circuitry.

After spatial filtering, the smoothed image data is convolved, by a convolution circuit 158 operating under the control of the control and timing circuit 148, for each of the convolution functions described in connection with Figure 3 so that a peak finding and step finding data is read into memory 154. The convolution circuit 158 is preferably built around an array processor employing pipelined processing. The convolved (or filtered) data, in this illustrated embodiment, is then "pruned" for noise and similar anomalies by an edge pruning circuit element 162. The edge pruning circuit removes invalid edge points using the criteria described above in connection with Fig. 5. After the stored data in element 154 is "pruned", an edge boundary comparison circuit 164, also operating under the control of the process control and timing circuit 148, compares the data stored in the image storage array 154 with the reference model stored in a reference memory circuit 166. The output of the comparison, as described in connection with the flow chart of Figure 6, is stored back in storage array 154. As a result, there is found in storage array 154 the disagreement boundaries determined by a comparison of the processed scanned data with the reference model storage information. This stored information is then analyzed by the classification network 168. This network, after reference to memory 166, maps the boundary disagreements into classes depending in part upon the effect of the defect upon semiconductor operation, and provides detailed information regarding the defect and its classification to a report generating circuit 170. The report generating circuit provides a suitable format for either a visual or printed display. A display element 172 can thus be either a visual monitor which is preferred or a printer, or both. With reference to the generation of the reference pattern stored in memory 166, a CAD model is stored in memory, for example a disk memory 174 and the memory 174 is read and processed by a controller 176 for providing to the memory 166 both a suitable definition of the edge boundaries and a definition of the active volumes of the final semiconductor structure which can be severely and adversely affected by defects in or near those reference boundaries.

The key to proper operation of the hardware is to provide sufficient timing and control via the process control and timing network 148 to enable the various elements to operate in a sequential manner and to use pipeline array processing as needed, such as, for example, the time consuming convolution process which involves a series of time consuming multiplications.

Additions, subtractions, deletions, and other modifications of this preferred embodiment of the invention will appear to those practiced in the art and are within the scope of the following claims.

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;set def 5,5

;run SY: [5,5] INIAP / par : ctask1

; s e t de f 5 , 1

;run SY : [5 , 5 ] STARTAP / par : ctask1

;copv wafvis.txt tto:

.ifins VIDEOT rem VIDEOT

.ifins MATCHT rem MATCHT ifins DEFECT rem DEFECT

.ifins CEDGET rem CEDGET ifins STAGET rem STAGET ins/par : CTASK2 /TA-VIDECT SY :WFVIDEOT ins/pri : 65/TA=MATCHT SY:WFMATCHT ins/TA=DEFECT SY :WFDEFECT ins/par :CTASK1 /TA=CEDGET SY:WFCEDGET ins/TA=STAGET sy:WFSTAGET run [5 , 1 ]wf2000c1/task=master rem VIDEOT rem MATCHT rem DEFECT rem CEDGET rem STAGET

<*

MASTER TASK: MASTERT.TSK

*>

ext MACOMM ; Intertask communication support ext PDPID ; lsi-11 assembler symbol def ext MAWIN ; Memory management support ext INSPLAN ; The Inspection Flan and Inspection Status ext IPSDBM ; The Inspection Data Base Management ext VDT ; Miscellaneous terminal I/O routines ext MAINIT ; Master Initialization

mvstr ( "master" , promstr ) SRESTART := base MAlNIT SAVE MASTERT

<* Global event flags for synchronization. TASK holds the names of the tasks with whom we are communicating in RADSO . THESE MUST BE GLOBAL *> parameter TABLEN : = 12. record TASKTAB integer TAS ( 2 ) endrecord integer SYNC1 ( TABLEN ) SYNC2 ( TABLEN ) TAPTR TASKTAB TASK ( TABLEN ) with TASK ( 0 ) TAPTR OFF

(* Define executive directives to be used for tasking with Control *) make 'WAIT rszcall bytewd ( 2 , 41. ) make 'CLEAR rszcall bytewd ( 2 , 31. ) make 'READ rsxcall bytewd ( 2 , 39. ) make 'SET rszcall bytewd ( 2 , 33. ) make "RCVDs rszcall bytewd ( 4 , 75. ) make 'SDRC$ rszcall bytewd ( 7 , 141. ) make ' SDAT$ rszcall bytewd ( 5 , 71. ) make 'WTLO$ rszcall bytewd ( 3 , 43. ) make 'MRKT$ rszcall bytewd ( 5 , 23. )

<* Execute a subroutine call, the arguments and subroutine name are in EUFF. BUFF contains: TASK1 , TASK2 , 0 or -2 . #ARGS , argl , arg2 , .. argn , subrout ine

TASK1 and 2 make up the taskname of the caller *> define DOROUTINE integer BUFF ( 1 ) local integer ADR OFFST OFFST1 OFFST := 4 OFFST1 := 0 if ( BUFF ( 2 ) ) ptr ( BUFF ( 4 ) ) OFFST1 := 1

OFFST := OFFST + length ( ptr ( BUFF ( 4 ) ) ) / 2 + 1 end i f lookup ( ptr ( BUFF ( BUFF ( 3 ) + OFFST - OFFST1 ) ) ) ; ADR := lastword DROP iter BUFF ( 3 ) - OFFST1 ( BUFF ( I + OFFST ) ) ; store args on stack

loop exec ( ADR ) end

<* Wait for a logical or of event flags *> define WAITLO local integer MASK

MASK off iter TAPTR setbit ( SYNC1 ( i ) - 33 , ptr ( MASK ) )

Ioop

WTLOS ( 2 , MASK ) end define DELAY integer DTIM MRKT$ ( 23. , DTIM * 6 , 1 , 0 ) WAIT ( 23. ) end

<* Return the index into the task table, called with the task name in RAD50 *) define STASGET integer integer T ( 1 ) STASGET on iter TABLEN with TASK ( i ) if ( T ( 0 ) TAS ( 0 ) and T ( 1 ) == TAS ( 1 ) )

(TASGET : = i endif loop end

<* Return the index into the task table of a task, task name is in ascii *> define TASGET integer integer T ( 1 ) local integer R ( 2 )

TASGET on clue ( T ) if < ascr5 ( T , R ) ) TASGET := sTASGET ( R ) endif end

<* Primitive to send data to another task *> define SENDDATA integer INDEX , BUFF ( 1 )

CLEAR ( SYNC2 ( INDEX ) ) with TASK ( INDEX )

SDATS ( TAS ( 0 ) , TAS ( 1 ) , BUFF , SYNC1 ( INDEX ) ) ;; loerr end

<* Wait for another task *> define WTASK

integer TSKNAM ( 1 ) local integer INDEX detterm

INDEX : = TASGET ( TSKNAM ) if ( INDEX == -1 ) print "Task not connected" else

WAIT ( SYNC2 ( INDEX ) ) endif at term end

<* Connect to a task It seems that RSX needs to have the terminal when the other task starts, we detach ourself and wait until the other task has initialised before we attach ourself again. Start up synchronization

Call: CONNECT ( "TSKNAM" SYNC1 SYNC 2 ) TSKNAK must be 6 characters, is CONNECT ( "DRW " , 33 ,34 ) *) define CONNECT integer TASKNAM ( 1 ) SYN1 SYN2 Iocal integer BUFF ( 13 ) clue ( TASKNAM ) if ( ascr5 ( TASKNAM , TASK ( TAPTR ) ) ==0 ) print "Bad taskname" else detterm

SYNC1 ( TAPTR ) := SYN1 ;; SYNC 2 ( TAPTR ) := SYN2 BUFF ( 0 ) := SYN1 ; ; BUFF ( 1 ) := SYN2 CLEAR ( SYNC1 ( TAPTR ) ) CLEAR ( SYNC2 ( TAPTR ) ) with TASK ( TAPTR ) SDRCS ( TAS ( 0 ) , TAS ( 1 ) BUFF bytewd 16. 2 ) 0 0 ) ;; ioerr WAIT ( SYNC2 ( TAPTR ) ) increment TAPTR atterm endif end

< * Send a buffer of data to the task we are connected to EUFF ( 0 ) must be greater than C. This can be used in the receiver as a code for what d&ta has been sent. The buffer can be no longer than 13 words *> define SEND integer T ( 1 ) BUFF ( 1 ) local integer 2 FLAGS ( 4 ) Z := TASGET ( T ) if ( Z == -1 ) print "Task not connected" else

READ ( FLAGS ) if ( getbit ( SYNC2 ( 2 ) - 33. , ptr ( FLAGS ( 2 ) ) ) ) ; I f they are done

SENDDATA ( Z , BUFF ) else

iter 3

DELAY ( 100 ) READ ( FLAGS ) if ( getbit ( SYNC2 ( Z ) - 33 , PTR ( FLAGS ( 2 ) ) ) ) SENDDATA ( Z , BUFF ) exit else print str ( T ) , " is hung" endif loop endif endif end

<* Call a subroutine that is in the task we are connected to. Call: CALL TASK ROUTINE ARG1 , ARG2 , .. , ARGN where N <= 13 - < #char s_in_routine / 2 + 1 ) - 1 - 1 string length code targs this uses the code of 0 in the buffer *> define CALL command integer ARG local integer BUFF ( 13 ) T ( 4 ) T1 ( 8 ) OFFST OFFST1 detterm mvzer ( BUFF , 13 ) BUFF ( 1 ) := cmdcnt - 3 OFFST1 off

OFFST := 2 mvstr ( ARG , T ) nxtarg mvstr ( ARG , T1 ) nxtarg if ( ARG )

BUFF ( 0 ) := -2

BUFF ( 1 ) := cmdcnt - 2 mvstr ( ARG . ptr ( BUFF ( 2 ) ) )

OFFST1 := length ( ARG ) / 2 + 1

OFFST := OFFST + OFFST1 endif mvstr ( T1 , ptr ( BUFF ( cmdcnt + - 1 ) ) ) nxtarg iter cmdcnt - 3

BUFF ( I + OFFST ) := ARG nztarg loop

SEND ( T , BUFF ) atterm end

<* Call a subroutine in another task and wart for it to finish

Equivalent to CALL "TASK" "SUBROUTINE" 0 ; ; WTASK ( "TASK" ) define CALLW command integer ARG

local integer T ( 3 ) mvstr ( ARG , T ) exec ( base CALL )

WTASK ( T ) end

<* Receive data from that task we are connected to and put it in a buffer Call: RECEIVE C BUFFER > Note: if these routines are overlaid , BUFFER must be global. The buffer must be at least 15 words. EUFFER contains:

TASK1 , TASK2 , CODE , DATA where TASK1 AND 2 make the name of the task which is sending the message. CODE is 0 if we are calling a routine, -1 if the other task is informing us of its rundown, and >0 if other data has been sent *> define RECEIVE integer BUFF ( 1 ) local integer Z

VAITLO wait for flag from any task

RCVDS ( 0 , 0 , BUFF ) ; ; ioerr

Z := sTASGET ( BUFF )

CLEAR ( SYNC1 ( Z ) ) if ( BUFF ( 2 ) == -1 ) ; rundown

SET ( SYNC2 ( Z ) ) ; acknowledge receipt if ( BUFF ( 3 ) == 0 ) bye else return endif else if ( BUFF ( 2 ) == 0 or BUFF ( 2 ) == -2 ) DOROUTINE ( BUFF ) endif

SET ( SYNC2 ( Z ) ) end if end

<* Inform the other task that we are stopping. Call : RUNDOWN ( arg ) arg = 0 if we want the other task to bye as well. arg > 0 if we want the other task to stay alive or do something else before dying *> define RUNDOWN integer T < 1 > ARG locaI integer BUFF ( 15 ) INDEX INDEX := TASGET ( T ) if ( INDEX == -1 ) print "Task not connected" else

BUFF ( 1 ) OFF if ( ARG ) BUFF ( 1 ) : = ARG ;; ENDIF BUFF ( 0 ) ON SEND ( T BUFF ) end if end

<* Set up communications with the task that requested us.

receives the two flags that the tasks will use for synchronization. and the name of the task with whom we are communicated. Any task that gets connected to must issue an INITREC command before proceeding . * > define INITREC local integer BUFF ( 15 ) detterm

RCVDS ( 0 , 0 , BUFF ) ;; ioerr with TASK ( TAPTR ) iter 2

TAS ( I ) := BUFF ( i ) loop

SYNC1 ( TAPTR ) := BUFF ( 2 )

SYNC2 ( TAPTR ) : = BUFF ( 3 )

SET ( SYNC 2 ( TAPTR ) ) increment TAPTR end <* The REGION Definition Block *> record MEM_REC integer RGDB ( 0 ) ; Pointer to Region Definition Block in t e g er REG ID ; REGION ID integer REGSZ ; REGION SIZE ( to be set ) integer REGNM ( 2 ) ; REGION NAME IN RADIX50.(NO NAME) integer PARNM ( 2 ) ; NAME OF THE PARTITION IN RADIX50(to be set) integer REGST ; STATUS : USE DEFAULTS ( or to be set ) integer REGPR ; NOT PROTECTED AT ALL

<* The WINDOW Definition block *> integer WNDB ( 0 ) ; Pointer to Window Definition Block integer WNDAPR ; HIGH BYTE HAS THE APR, LOW BYTE IS THE WINDOW

ID integer WNDADR ; VIRTUAL BASE ADDRESS IN TASK'S VIRTUAL SPACE integer WNDSZ ; WINDOW SIZE IN 32WORD BLOCKS integer WNDREG ; REGION ID integer WNDOFF ; OFSSET IN REGION IN 32 WORD BLOCKS integer WNDL ; LENGTH TO MAP IN 32WORD BLOCKS integer WNDST ; WINDOW STATUS WORD integer WNDSRB ; SEN/RECEIVE BUFFER ADDRESS end record

MEM_REC M_IPSDB ; Memory blocks for model access. MEM_REC M_EDGE ; for creation of EDGE IMAGE Region

MEM_REC M_MODEL ; for creation of MODEL for MATCHING region

MEM_REC M_MATCH ; for creation of IMAGE region for MATCHT and DEFECT.

<* Define the memory mngnment executives directives *> make "CRRG rsxcall bytewd ( 2 , 55. ) make ' DTRC rszcall bytewd ( 2 , 59. ) make 'CRAW rsxcall bytewd ( 2 , 117. ) make 'MAPW rsxcall bytewd ( 2 , 121. ) make ' UMAPW rszcall bytewd ( 2 , 123. ) make 'ELAW rsxcall bytewd ( 2 , 119. )

define CREGION integer REGNAM PARNAM REGSIZ

REGSZ : = REGSIZ

ASCR5 ( REGNAM , REGNM ) drop

ASCRS ( PARNAM , PARNM ) drop

REGST := 57K ; attach it and allow all access

CRRG ( RGDB ) ; create the region and attache it ioerr end define DREGION

DTRG ( RGDB ) ,: ioerr if ( REGST )= 40000k ) print "Window unmaped" endif end

define cwndow integer APR , WNRID , WNSIZ , WNOFF

WNDAPR := urshift ( APR , 5 ) ; APR in the upper byte

WNDSZ := WNSIZ ; MUST BE LESS THAN 4K

WNDREG := WNRID ; THE REGION'S ID WHERE THE MAPPING TAKES PLACE ; THIS IS KIND OF TRIKY NO SO IT MUST BE FETCHED ; FROM THE REGION DEFINITION BLOCK ( RGDB )

WNDOFF := WNOFF ; WINDOW OFFSET IN THE REGION

WNDL off ; TAKE THE DEFAULT. CAN BE CHECKED FOR THE ACTUAL ; WINDOW SIZE AFTER THE CALL

WNDST := 202K ; MAP IT AND ALLOW WRITE ACCESS

CRAU ( WNDE ) ; CREATE AND MAP THE WINDOW

IOERR

END

<* INITRC ( REGNAM , PARNAM REGSIZ VADDR ) creates a named region and an initial mapping of a 4k window at the begining of the region * > define INITRG integer REGNAM PARNAME REGSIZ VADDR

CREGION ( REGNAM , PARNAME , REGSIZ ) create a 32kwords dynamic region. CWNDOW ( VADDR , REG ID , 200K , 0 ) ; create a window at VADDR absolute address ; of 4k words. Map it at the offset 0 in the ; region end

parameter MAX_FRAMES := 32 parameter MAX_SITES : = 2 parameter MAX_PATTERNS := 1 parameter MAx_RETICLES : = 2 parameter MAX_REVS : = 1 parameter MAX_TEST_DIE := 2 parameter MAX_DIE_ROW := 10 parameter MAX_LAYERS := 1 parameter MAX_DEFECT : = 14 parameter FALSE := 0 parameter TRUE := -1 parameter PRIMARY := 0 parameter CONFIRM := 1 parameter BRIGHT : = 0 parameter DARK := 1 record x_y integer X integer Y endrecord record ID integer ROW integer CLMN endrecord record DEFECT

integer XCOM integer YCOM integer DELX integer DELY endrecord record DEFECT_BUFFER integer #_DFCTS DEFECT DEFECTS ( MAX_DEFECT ) endrecord record D_ROW integer lST_D_# integer LAST_D_# endrecord record F_DTL χ_Y F_SZ

X_Y F_OLAP endrecord record F_TO_INSP integer #_FS

ID FRAMES ( MAX_FRAMES )

DEFECT_BUFFER F_DEFCTS ( MAX_FRAMES ) endrecord record P_DTL char P_DESCR ( 80 ) integer MIN_DEF_SZ integer MIN_P_SZ integer P_MAG integer #_SITES

X_Y S_ORG ( MAX_SITES )

X_Y F_ORG

F_DTL F_DESCR

F_TO_INSP INSP_FR ( MAX_SITES ) endrecord record D_DTL

X_Y D_DIM integer D_ST_HGT integer D_AV_WDTH integer #_PATTERNS

P_DTL D_PATTERNS ( MAX_PATTERNS ) (* PATTERNS_TO_INSPECT DI E_INSPECTION ( MAX_PATTERNS ) *) endrecord record R_TO_INSP integer *_TO_INSP

ID INSP_R ( MAX_RETICLES ) endrecord r e c o r d R_DTL

X_Y R_DIM integer R_ST_HGT integer R_AV_WDTH

D_DTL RETICLE_DIE

<* DIE_TO_INSPECT RETICLE_INSPECTION *> endrecord record L_DTL char L_REV_# ( 80 )

R_DTL L_RETICLE

R_TO_INSP L_INSPECTION end record record L_REVS char L_DESCR ( 80 ) integer LAYER_# integer #_REVS

L_DTL DTL_LAYER_REV ( MAX_REVS ) endrecord record PLAN_HDR char PRODUCT_NAME ( 80 ) integer WAFER_SZ real DIE_X real DIE_Y

X_Y FLAT_TO_ORIGIN

ID REFERENCE_DIE integer #_TEST_DIE ID TEST_DIE ( MAX_TEST_DIE ) integer #_DIE_ROWS D_ROW WAFER_MAP ( MAX_DIE_ROW ) endrecord record INSP_PLAN

PLAN_HDR HEADER integer #_LAYERS

L_REVS LAYERS ( MAX_LAYERS ) endrecord

DEFECT_BUFFER CONF_DEFECTS DEFECT_BUFFER REPT_DEFECTS

record INSP_STATUS integer I-MODE Primary or confirm integer STAGE_ERR True , False integer STAGE_BUSY True , False integer LENSE_BUSY True , False integer FOCUS_BUSY True , False integer ILLUM_BUSY True , False integer REG_X

integer REG_Y

ID MOD_RET ; integer, MOD_SITE (1..15) integer MOD_FRAME integer MOD_ILLUM Bright , Dark integer MOD_MAGNF (1x .. 500x) integer MOD_LAYER integer MOD_PATTERN

ID CUR_RET ; integer CUR_SITE ; (1..15) integer CUR_FRAME integer CUR_ILLUM Bright , Dark integer CUR_MAGNF (1x 500x) integer CUR_LAYER integer CUR_PATTERN

ID DES_RET ; integer DES_SITE ; (1..15) integer DES_FRAME ; integer DES_ILLUM ; Bright , Dark integer DES_MAGNF ; (1x .. 500x) integer OES_LAYER integer DES_PATTERN

X_Y DES_DISPLAY only screen coordinates endrecord record IPSDB_REC

INSP_PLAN INSP_PLN INSP_STATUS INSP_DATA_BASE end record

define STORE_IPSDB address NAME PLAN local integer OUTCH OUTCH := open ( NAME , ' RWCT ) wrs ( OUTCH , PLAN , SIZE IPSDB_REC ) DROP close ( OUTCH ) end define READ_IPSDB address NAME PLAN local integer INCH INCH := open ( NAME , 'R ) rds ( INCH , PLAN , SIZE IPSDB_REC ) DROP close ( INCH ) end

<* Miscellaneous terminal I/O routines for MASTERT *>

APUSH RADIX OCTAL

<* GET AN INTEGER

GETNUM ( PROMPT . DEFAULT ) * >

DEFINE GETNUM INTEGER

INTEGER ARG1 ARG2 GETNUM := ARG2

PRINT STR ( ARG1 ) , " [ " , #I O , ARG2 , "]: " , #Z IF ( RDLINE )

IF ( ILITERAL ( LBUF ) )

GETNUM := ILVAL ENDIF ENDIF END

<* Routines to set up a io/wait from the terminal *>

INTEGER QIOW ( 0 )

.WORD BYTEWD ( 12 . , 3 ) .WORD 1030K READ .WORD 0 .WORD 24. EVENT FLAG .BLKW 3

.WORD 1 .BLKW 4

DEFINE TYI INTEGER

QIOW ( 2 ) := CICH

QIOW ( 6 ) := PTR ( TYI )

TYI OFF

RSXDIR ( QIOW ) ; ; IOERR END

<* GETFNUM ( REAL , PROMPT ) GET A REAL NUMBER *> DEFINE GETFNUM REAL

REAL FARG1 INTEGER ARG3 GETFNUM := FARG1

PRINT STR ( ARG3 ) , "[" , #F 10 2 , FARG1 , " ] : " #Z IF ( RDLINE )

IF ( ILITERAL ( LBUF ) )

GETFNUM := FLOAT ( ILVAL ) ENDIF

IF ( RLITERAL ( LBUF ) ) GETFNUM := RL AL ENDIF ENDIF END *> <* GETSTRING ( BUFFER , PROMPT ) *> DEFINE GETSTRING

INTEGER ARG1 ARG2 WHILE ( not WORD )

PRINT STR ( ARG2 ) , #Z RDLINE

REPEAT

MVSTR ( TBUF ARG1 ) END

<* Get a string with a default

GSTRING ( BUFFER . PROMPT , DEFAULT_STRING ) *> define GSTRING integer BUFFER ( 1 ) PROMPT ( 1 ) DEFAULT ( 1 ) mvstr ( DEFAULT , BUFFER ) print, str ( PROMPT ) , " [ " , str ( DEFAULT ) , " ] " #z rdline if ( word ) mvstr ( tbuf , BUFFER ) endif end

DEFINE YESNO INTEGER

INTEGER ARG1

LOCAL INTEGER ANSWER

PRINT STR ( ARG1 ) , " (Y/N) : " , #Z

ANSWER : = TY I

PRINT #A ANSWER

YESNO := ( ANSWER and 137 ) == ASCII Y

END

INTEGER PAUSECHAR ; Bucket for read in character

<* PAUSE ROUTINES *>

DEFINE VDT_IN address PROMPT

PRINT str ( PROMPT > , #Z PAUSECHAR := TYI PRINT #λ PAUSECHAR

CR END

APOP <* Initializion section of the master *>

<* Initialize region allocation *> <* and Connect the module tasks *> define MAINIT with M_EDGE

CREGION ( "EDGING" , "EDGIMR" , 2000K ) with M_MODEL

CREGION ( "MODELR" , "GEN , 200K ) with M_MATCH

CREGION < "MTCHIM" . "GEN , 2000K ) with M_IPSDB

INITRG ( "IPSDBR" , "GEN " , 200K , 160000k )

print "VIDEOT is being connected."

CONNECT ( "VIDEOT" 41. 42. ) ; Initialize the Video Monitor Task VIDEOT print "MATCHT is being connected."

CONNECT ( "MATCHT" 35. 36. ) ; Initialize the Registration and Mathcing print "DEFECT is being connected."

CONNECT ( "DEFECT" 37. 38. ) ; Initialize the Defect Analysis Task print "CEDGET is being connected."

CONNECT ( "CEDGET" 39. 40. ) ; Initialize the Edge Detection Task print "STAGET is being connected."

CONNECT ( "STAGET" 33. 34. ) ; Initialize the SStage Positioning Task

end de f ine RUNDOWNΛLL

RUNDOWN ( "VIDEOT" 0 )

RUNDOWN C "MATCHT" 0 )

RUNDOWN ( "DEFECT" 0 )

RUNDOWN t "CEDGET" 0 )

RUNDOWN ( "STAGET" 0 ) end define BYE

RUNDOWNΛLL bye end

<* VIDOET Commands *> define CGRAB IM integer X0 Y0 CALL "VIDEOT" "GRABIM" 0 X0 Y0 end define CVDRAW integer FNAME X0 Y0 CALL "VIDEOT" "VDRAW" FNAME X0 Y0 end define CDRAW integer X0 Y0 CALL "VIDEOT" "DRAW" 0 X0 Y0 end define CMDRAW integer X0 Y0 CALL "VIDEOT" "MDRAW" 0 X0 Y0 end define CSAVE integer FNAME CALL "VIDEOT" "MSAVE" FNAME end

define CVSAVE integer FNAME CALL "VIDEOT" "VSAVE" FNAME end define CFILLREG integer FEDGE CALL "VIDEOT" "FILLREG" FEDGE end define CREGFILL integer FEDGE CALL "VIDEOT" "REGFILL" FEDGE ' end define CWFMAP integer X0 Y0 SZ CALL "VIDEOT" "WFMAP" 0 X0 Y0 SZ ; DI SPLAY_WAFER_MAP end define CDISPMODEL integer X0 Y0 CALL "VIDEOT" "DISPMODEL" 0 X0 Y0 end define CBNDRCTS i n t eg er X0 Y0 CALL "VIDEOT" "BNDRCTS" 0 X0 Y0 end define STF-VIDEOT ; disconnect "VIDEOT" task and attached to the terminal integer TERM

CALL "VIDEOT" "STOPCO" TERM

WTASK ( "VIDEOT" ) end

<* CEDGE Commands *> define CEDGE

CALL "CEDGET" "DOEDGE" 0 end define CSTARTAP

CALL "CEDGET" "START_AP" 0

WTASK ( "CEDGET" ) end define STP-EDGET ; disconnect "EDGET" task and attached to the terminal integer TERM

CALL "EDGET" "STOPCO" TERM

WTASK ( "EDGET" ) end

<* MATCH Commands *> define STP-MATCHT ; disconnect "MATCHT" task and attached to the terminal integer TERM

CALL "MATCHT" "STOPCO" TERM

WTASK ( "MATCHT" ) end define CREGISTER

CALL "MATCHT" "REGISTER" 0 end define CMATCH CALL "MATCHT" "MATCH" 0 end define CGETIM

CALL "MATCHT" "GETIM" 0 end define COPYIM

CALL "MATCHT" "COPYIM" 0 end define CGETMODEL integer FNAME CALL "MATCHT" "GET_MODEL" FNAME end

<* DEFECT Commands *> define STP-DEFECT disconnect "DEFECT" task and attached to the terminal integer TERM

CALL "DEFECT" "STOPCO" TERM

WTASK ( "DEFECT" ) end define CDETECT

CALL "DEFECT" "DETECT" 0 end

.< * STAGE Commands *> define STP-STAGET disconnect "STAGET" task and attached to the terminal integer TERM

CALL "STAGET" "STOPCO" TERM

WTASK ( "STAGET" ) end define CCALSTG calibrate the stage

CALL "STAGET" "CALSTG" 0 WTASK ( "STAGET" ) end define CSTGINI ; calibrate the stage

CALL "STAGET" "STGINI" 0

VTASK ( "STAGET" ) end define CSTAGEM ; stage move according to inspection plan

CALL "STAGET" "STAGEM" 0 end define CILLSW ; D/B field switch

CALL "STAGET" "ILLSW" 0 end define CFOCUS ; autofocus

CALL "STAGET" "FOCUS" 0 end define CERRCOR ; autofocus

CALL "STAGET" "ERRCORR" 0

WTASK ( "STAGET" ) end ext MACOMANDS

<* The demo section *> integer DSKFLAG IMCNT ; flag and image counter for EDGE image

; saving on the disk char IMBASE ( 0 ) text "LNF" integer RDSKFLAG RIMCNT ; flag and image counter for BRIGHT ( RAW ) image

; saving on the disk char RIMBASE ( 0 ) text "RNF" char MDLBASE ( 0 ) text "LNF"

DSKFLAG on RDSKFLAG on integer YESSTAGE ; &&&

YESSTAGE off char ANSWER ( 20 )

define GET_LAYER

DES_LAYER := GETNUM ( "Which mask level do you want to inspect " , 1 ) - 1 ; i gnore user

; DISPLAY_INSFECTION_DIE CUR_LAYER := DES_LAYER with LAYERS ( CUR_LAYER ) with DTL_LAYER_REV ( #_REVS - 1 ) print "Mask revision number is .... " , str ( L_REV_# ) print "Mask layer description is .. " , str ( L_DESCR ) print "View screen to see preconfigured inspection die" print " The blue reticle is the reference die" print " The red reticles are the die to inspect" end

<* START_DEMO

Initialises the Inspection Data Base by reading from disk the IPSDB.DAT and placing it in the common region IFSDBR. The Inspection Status is

Initialized.

*> define START_DEMO

IMCNT off with M_IPSDB

GSTRING ( ANSWER , "Please input Product Name to be inspected" , "SEMIEAST" )

READ_IPSDB ( "IPSDB.DAT" , WNDADR ) ptr ( IPSDB_REC ) := WNDADR with INSP_DATA_BASE with INSP_PLN wi th HEADER print "Wafer size is ... WAFER_SZ , " mm" print "Die width is .... DIE_X , " microns" print "Die height is ... DIE_Y , " microns " GET_LAYER

CWFMAP ( 96. 383. 128. ) mvstr ( 'LNF , IMBASE ) mvstr ( 'RNF , RIMBASE ) end

define SHOW_ME iter #_SITES with INSP_FR ( i ) iter #_FS with F_DEFCTS ( i ) if ( #_DFCTS )

DES_SITE := j

DES_FRAME : = i with DES_RET

ROW . = INSP_R ( 0 ) : ROW

CLMN : = INSP_R ( 0 ) : CLMN

CSTAGEM

CFOCUS

VDT_IN ( "Hit (return) to continue " )

ROW := INSP_R ( 1 ) : ROW

CLMN : = INSP_R ( 1 ) : CLMN

CSTAGEM

CFOCUS print "Hit (return) to continue" VDT_IN ( "Hit ! to abort inspection: " ) if ( PAUSECHAR == ascii ! ) exit endif endif loop if ( PAUSECHAR == ascii ! ) exit endif loop end

define DOPRINTS och : = open ( 'REPORT.DAT , ' wn ) print #t 30 , "C O N T R E X " print #t 28 , "Wafervision 2000" print print print #T 30 "Defect Report" iter 3 print loop print "Product Name: " , str ( PRODUCT_NAME ) print "Layer Description: " , str ( L_DESCR ) print "Layer Revision Number: " , str ( L_REV_# ) iter 3 print loop print #T 25 "Repeating Defects" print print #T 10 "Number" , #T 30 , "X Location" , #T 50 , "Y Location" print #t 30 "( Microns )" , #t 50 , "( Microns )" end define REPORT_DEMO local integer DFCTCNT TEMP TEMP1 real CONVFACT DOPRINTS DFCTCNT := 1 CONVFACT := .5 * 80.0 / FLOAT ( CUR_MAGNF ) ; .5 microns/pix @ 80X adjust with F_DESCR iter #_SITES with S_ORG ( i ) with INSP_FR ( i ) iter #_FS with FRAMES ( i ) with F_DEFCTS ( i ) iter #_DFCTS with DEFECTS ( i ) TEMP : = fix ( float ( XCOM ) * CONVFACT ) + ( F_SZ : X * ROW ) + X TEMP1 := fix ( float ( YCOM ) * CONVFACT ) + ( F_SZ : Y * CLMN ) + Y print #T 5 , DFCTCNT , #T 29 TEMP , #T 49 , TEMP1 increment DFC TCNT loop

loop loop close ( och ) och on end

define GETEDGES local char PNAME ( 30. ) CALL "VIDEOT" "ACQMSG" 0 WTASK ( "VIDEOT" ) if ( DSKFLAG ) print str ( IMBASE ) , #p 60k , #i 2 , CUR_FRAME #n encode ( PNAME ) CFILLREG ( PNAME ) WTASK ( "VIDEOT" ) end if end

define GETBFIMG integer X0 Y0 local char PNAME ( 30. ) if ( RDSKFLAG ) print str ( RIMBASE ) #p 60k , #i 2 , CUR_FRAME , #n encode ( PNAME ) CVDRAW ( PNAME , X0 Y0 ) WTASK ( "VIDEOT" ) endif end define 1STFOCUS if ( not RDSKFLAG )

DES_ILLUM := DARK ; MUST START WITH DARK ILLUMINATION!!!!!

CILLSW ; switch illumination end if if ( YESSTAGE ) ; & & &

CSTAGEM ; move the. stage to the very first position

; &&& CFOCUS ; and focus on it else

CUR_FRAME := DES_FRAME endif end define DBF ; display bright field

CALL "VIDEOT" "GEAR" 0 32 256. 0 256 0

WTASK ( "VIDEOT" ) if ( not RDSKFLAG )

DES_ILLUM : = BRIGHT ; meanwhile change illumination to bright

CILLSW ;; WTASK ( "STAGET" ) end if

if ( RDSKFLAG )

GETBFIMG ( 32 0 ) else

CGRABIM ( 32. 0 ) ;; WTASK ( "VIDEOT" ) endif

DES_ILLUM := DARK end define RTMOD

; preserve the current status in MOD_ status for inspection

MOD_LAYER : = CUR_LAYER

MOD_PATTERN : = CUR_PATTERN

MOD_RET := CUR_RET

MOD_SITE := CUR_SITE

MOD_FRAME : = CUR_FRAME end define GMLRGR ; gat and display the model and register local char PNAME ( 30. ) print str ( MDLBASE ) , tp 60k , #i 2 , MOD_FRAME , ".MDL' #n encode ( FNAME )

CALL "VIDEOT" "IPRMSG" 0 ; ; WTASK ( "VIDEOT" ) CGETMODEL ( PNAME ) ; ; WTASK ( "MATCHT" ) CDISPMODEL ( 352. 0 ) ;; WTASK ( "VIDEOT" )

; back to EDGE detection" WTASK ( "CEDGET" > ; Before registration, EDGE must finish

COPYIM WTASK ( 'MATCHT ) ; Copy EDGIMG to MTCHIM.

CREGISTER

WTASK ( "MATCHT" ) end define MCHDEF ; matchin and defect analysis COMPLETE DEFECTS

CALL "VIDEOT" "MDLMSG" 0

WTASK ( "VIDEOT" )

CMATCH

WTASK ( "MATCHT" )

CALL "VIDEOT" "DFTMSG" 0

WTASK ( "VIDEOT" )

CDETECT ; ; WTASK ( "DEFECT" )

CBNDRCTS ( 32. 0 ) ;; WTASK ( "VIDEOT" ) ; Display the defects

VDT_IN ( "Please contemplate and evaluate! !!" ) end define CONFIRM_INSPECT iter #_SITES with INSP_FR ( i ) iter #_FS with F_DEFCTS ( i ) if ( #_DFCTS )

DES_SITE := J

DES_FRAME : ₌ I

; if ( i + j ==0 ) 1STFOCUS

; else

WTASK ( "STAGET" ) CALL "VIDEOT" "LMAG" 0 WTASK ( "VIDEOT" ) if ( DSKFLAG )

GETEDGES else

CGETIM get the DF image

WTASK ( "MATCHT" )

CSTARTAP start the array processor

CEDGE EDGE DETECTION

WTASK ( "CEDGET" ) ; print "; while EDGE is working do the following" endif

DBF display BF image RTMOD set the model infer for real-time work GMLRGR get and display the model and register MCHDEF match and defect analysis ; endif endif loop if ( PAUSECHAR == ascii ! ) exit endif loop end define PRIMARY_INSPECT iter #_SITES DES_SITE := i with INSP_FR ( DES_SITE ) print "frames to inspect = " , #_FS iter #_FS

DES_FRAME := I

; if ( i + j ==0 ) 1STFOCUS ; else WTASK ( "STAGET" ) CALL "VIDEOT" "LMAG" 0 WTASK ( "VIDEOT" ) if ( DSKFLAG )

GETEDCES else

CGETIM ; get the DF image

WTASK ( "MATCHT" )

CSTARTAP ; start the array processor

CEDGE ; EDGE DETECTION

WTASK ( "CEDGET" ) ; print "; while EDGE is working do the following" end if

DBF ; display BF image

RTMOD ; set the model infor for real-time work

GMLRGR ; get and display the model and register

MCHDEF ; match and defect analysis ; endif

loop loop end integer NOFRAMES ; &&& FOR TESTING PURPOSE ONLY integer NOSITES ; &&&

NOFRAMES := 6 ; &&& FOR TESTING PURPOSES ONLY NOSITES :- 1 define INSFECT_DEMO with L_INSPECTION with L_RETICLE with RETICLE_DIE DES_PATTERN := 0 ; initialise the pattern with D_PATTERNS ( DES_ PATTERN ) #_SITES := NOSITES &&& iter #_SITES with INSP_FR ( i ) #_FS := NOFRAMES ; &&& FOR TESTING PURPOSES ONLY iter #_FS with F_DEFCTS ( i ) #_DFCTS := 0 ; initialize number of defects loop loop with DES_RET

ROW := INSP_R ( 0 ) ROW CLMN := INSP_R ( 0 ) : CLMN I-MODE := PRIMARY

CALL "VIDEOT" "SHOWDIE" 0

WTASK ( "VIDEOT" )

PRIMARY_INSPECT if ( YESNO ( "Do you want to confirm the frames processed so far ? " ) )

ROW := INSP_R ( 1 ) : ROW CLMN := INSP_R ( 1 ) : CLMN

I -MODE := CONFIRM mvstr ( 'CLN , IMBASE ) mvstr ( 'RCL . RIMBASE )

CALL "VIDEOT" "GBAR" 0 0 288. 254. 90. 0

WTASK ( "VIDEOT" )

CALL "VIDEOT" "SHOWDIE" 0

WTASK ( "VIDEOT" )

CONFIRM_INSPECT endif end define DEMO

CALL "MATCHT" "WINDOW" 0 4 4

START_DEMO

CUR_ILLUM := BRIGHT if ( YESNO ( "Do you want to calibrate the stage ? " ) )

CCALSTG endif

CALL "VIDEOT" "VDRAW" "JOE" 352. 256. WTASK ( "VIDEOT" )

INSFECT_DEMO

REPORT_DEMO ; CALL "VIDEOT" "ENDMSG" 0 print "End of Demo end

DEFINE HAROLD_DEMO

START__DEMO

CGETMODEL ( "LNF03.MDL" )

WTASK ( "MATCHT" )

CALL "VIDEOT" "HAROLD_DEMO" 0

WTASK ( "VIDEOT" ) END endfile

<* ***********************************************************************

VIDEOT. MG - THIS MODULE LOADS ALL OF THE MODULES USED IN "VIDEOT. TSK"

************************************************************************ *>

ext MAKLEX ext PDPID ext DMISC ext VIDREG ext FLUT ext FXMON ext 22BADDR ext VIDDISP ext FDMACO ex t VIDCOM ext [5, 1]INSPLAN mvstr ( "videot" , promstr ) parameter GRNGL : = 1 parameter REDGL : = 2 parameter BLUGL := 3 define LLUSETUP

TPLANE : = 3

GPLANE := 3

IPLANE := 252.

DSCHAN ( TPLANE , GPLANE _, IPLANE )

CLRMAP ( 0 ) iter 256.

DSLLU ( GREEN + GRNGL + I , 255 , GREEN + GRNGL + I , 255 )

DSLLU ( RED + REDGL + I , 255 , RED + REDGL + I , 255 )

; DSLLU ( GREEN + BLUGL + I , 128. , GREEN + BLUCL + I , 128

; DSLLU ( RED + BLUCL + I , 255 , RED + BLUGL + I , 255 )

DSLLU ( BLUE + BLUGL + I , 255 , BLUE + BLUGL + I , 255 )

DSLLU ( GREEN + 1 , I , GREEN + I , I )

DSLLU ( RED + I , I , RED ) + I , I )

DSLLU ( BLUE + I , I , BLUE + I , I ) loop ( 4. ) end define INITD

DSOPN ( 8 ) drop

DSPLD

DSCLR ( 255. ) DSCXY ( 0 0 )

LLUSETUP end

save VIDEO <* THE MAKE OF THE LEXIDATA 3400 LIBRARY ROUTINES *> APUSH RADIX octal

MAKE 'DSOPN RSXFUNC 60

MAKE 'DSCLS RSXFUNC 62

MAKE 'DSCFG RSXFUNC 64

MAKE 'DSMRG RSXFUNC 66

MAKE 'DS20M RSXFUNC 70

MAKE 'DSMOV RSXFUNC 72

MAKE 'DSLLU RSXFUNC 74

MAKE 'DSLWT RSXFUNC 76

MAKE 'DSLRD RSXFUNC 100

MAKE 'DSCHAN RSXFUNC 102

MAKE 'DSVEC RSXFUNC 104

MAKE 'DSCLR RSXFUNC 106

MAKE 'DSCIR RSXFUNC 110

MAKE 'DSPNT RSXFUNC 112

MAKE 'DSLIM RSXFUNC 114

MAKE 'DSPUT RSXFUNC 116

MAKE 'DSGET RSXFUNC 120

MAKE 'DSOWT RSXFUNC 122

MAKE 'DSIWT RSXFUNC 124

MAKE 'DSRNW RSXFUNC 126

MAKE 'DSRNR RSXFUNC 130

MAKE 'DSSAO RSXFUNC 132

MAKE 'DSTXT RSXFUNC 134

MAKE 'DSCSL RSXFUNC 136

MAKE 'DSCER RSXFUNC 140

MAKE 'DSCLD RSXFUNC 142

MAKE 'DSCXY RSXFUNC 144

MAKE 'DSBLIN RSXFUNC 146

MAKE 'DSBLOC RSXFUNC 150

MAKE 'DSBLR RSXFUNC 152

MAKE 'DSGXY RSXFUNC 154

MAKE 'DSPLD RSXFUNC 156

APOP

< * Miscellaneous routines for DEMO *>

APUSH RADIX OCTAL

DEFINE LIMIT INTEGER

INTECER ARG1 ARG2 ARG3 LIMIT := MAX ( ARG2 , MIN ( ARG1 , ARG3 ) ) END

DEFINE GETNUM INTEGER

INTEGER ARG1 ARG2 GETNUM : ι ARG2

PRINT STR ( ARG1 ) , "t" , #I 0 , ARG2 , " 3 : " , #Z IF ( RDLINE )

IF ( ILITERAL ( LBUF ) )

GETNUM := ILVAL ENDIF ENDIF END

DEFINE BEEP

PRINT #A 7 , #Z END

<* Routines to set up a io/wait from the terminal *>

INTEGER QIOW ( 0 )

.WORD BYTEWD ( 12. , 3 )

.WORD 1030K READ

.WORD 0

.WORD 24. EVENT FLAG

.BLKW 3

.WORD 1

.BLKW 4

DEFINE TYI INTEGER

QIOW ( 2 ) := CICH

QIOW ( 6 ) :₌ PTR ( TYI )

TYI OFF

RSXDIR ( QIOW ) ;; IOERR END

DEFINE ERWNA

PRINT "ERROR: WRONG NUMBER OF ARGUMENTS"

END

<* GETFNUM ( REAL , PROMPT ) Commented out for RSX-11M. no floating point DEFINE GETFNUM REAL

REAL FARG1

INTEGER ARG3 GETFNUM := FARG1

PRINT STR ( ARG3 ) , "[" . #F 6 2 , FARG1 , " J : " , #Z

IF ( RDLINE )

IF ( ILITERAL ( LBUF ) )

GETFNUM := FLOAT ( ILVAL ) ENDIF

IF ( RLITERAL ( LBUF ) ) GETFNUM := RLVAL' ENDIF ENDIF END *>

<* GETSTRING ( BUFFER , PROMPT ) *> DEFINE GETSTRING

INTEGER ARG1 ARG2 WHILE ( not WORD )

PRINT STR ( ARG2 ) , #Z RDLINE REPEAT

MVSTR ( TBUF ARG1 ) END

DEFINE YESNO INTEGER

INTEGER ARG1 LOCAL INTEGER ANSWER

PRINT STR ( ARG1 ) , " (Y/N) : " , #Z

ANSWER := TYI

PRINT #A ANSWER

YESNO := ( ANSWER and 137 ) == ASCII Y

END

<* MCONCAT - Concatenates the strings specified as arguments MCONCAT dest-string( 1st source string) , source-string arg-count *>

DEFINE MCONCAT COMMAND INTEGER STR I ITER CMDCNT - 1

PRINT STR ( STRI ) , #N NXTARG LOOP

NXTARG ( -- ( CMDCNT - 1 ) ) ENCODE ( STRI ) END

<* IFCR performes a CR if not at the begining of the line *> DEFINE IFCR IF ( #COLUMN ) PRINT

ENDIF END

<* Allows for recursion in MAGIC/L. Calling RECURSE ( Arg1 , Arg2 , ... ) calls the current subroutine with optional input arguments. *> DEFINE RECURSE IMMFUNC

CCWD ( . + 1 ) END MAC

<* drop 2 things off the stack *>

ENTRY 2DROP

ADD # 2 , MSP

NEXT

(* divide by 2. done by shifting. 2/ ( -5 ) results in -3 , not -2 as -5 / 2 in MAGIC *) ENTRY 2/ INTEGER

ASR (MSP) NEXT

<* exchange 2 variables, expects pointers as arguments. call: xchg ( ptr ( x ) , ptr ( y ) ) *> ENTRY XCHG

MOV @ 0 (MSP) , RO MOV @ 2 (MSP) , Rl MOV R1 , @ (MSP)+ MOV R0 , @ (MSP)+ NEXT

<* Move a given number of bytes into the same number of words. MVBYWD ( BYTE_ARRAY , BYTE_OFFSET , WORD_ARRAY , #_BYTES ) *> entry MVBYWD mov (msp ) + r0 ; Get number of bytes to transfer. mov (msp ) + r1 ; Get pointer to word array. mo v (msp > + r2 ; Cet pointer to byte array add (msp ) + r2 ; plus the offset.

0S . movb (r2)+ , (r1 ) + ;Transfer byte. Increment pointers . clrb (r1 ) + ;Clear high order byta of word. dec r0 ; Decrement the count. bgt OS ;Branch if count not 0. next

<* Move a given number of words into the same number of bytes

MVBYWD ( BYTE_ARRAY , BYTE_OFFSET , WORD_ARRAY , #_WORDS ) *> entry MVWDBY mo v (msp ) + r0 ; Get number of bytes to transfer. mov (msp ) + r1 ;Get pointer to word array. mov (msp) + , r2 ; Get pointer to byte array add (msp ) + , r2 ; plus the offset.

1S : movb (rl)+ , (r2) + ; Transfer word. Increment pointers. inc r1 ; Increment word pointer one more. dec r0 ; Decrement the count. bgt 1s ; Branch if count not 0. next

.END

INTEGER PAUSECHAR Bucket for read in character INTEGER SLOW Flag set if slow mode desired INTEGER FAST Flag set if fast mode desired

<* PAUSE ROUTINES *>

DEFINE PAUSE

IF ( FAST ) RETURN ENDIF

IFCR

PRINT "TYPE ANY KEY TO CONTINUE' #Z

PAUSECHAR :- TYI

CR END

DEFINE IFPAUSE

IF ( SLOW ) PAUSE ENDIF END

APOP

<* The REGION Definition Block *> record MEM_REC integer RGDB ( 0 ) ; Pointer to Region Definition Block. integer REGID ; REGION ID integer REGSZ : REGION SIZE ( to be set ) integer REGNM ( 2 ) ; REGION NAME IN RADIX50=(NO NAME) integer PARNM ( 2 ) ; NAME OF THE PARTITION IN RADIX50(to be set) integer REGST ; STATUS : USE DEFAULTS(or to be set ) integer REGPR ; NOT PROTECTED AT ALL

<* The WINDOW Definition block *> integer WNDB ( 0 ) ; Pointer to Window Definition Block integer WNDAPR ; HIGH BYTE HAS THE APR, LOW BYTE IS THE WINDOW

ID

Integer WNDADR ; VIRTUAL BASE ADDRESS IN TASK'S VIRTUAL SPACE integer WNDSZ ; WINDOW SIZE IN 32WORD BLOCKS integer WNDREG ; REGION ID integer WNDOFF ; OFSSET IN REGION IN 32 WORD BLOCKS integer WNDL ; LENGTH TO MAP IN 32WORD BLOCKS integer WNDST ; WINDOW STATUS WORD integer WNDSRB ; SEN/RECEIVE BUFFER ADDRESS endrecord

MEM_REC M_MODEL Memory blocks for model access.

MEM_REC M_EDGE Memory blocks for edge image access.

<* Define the memory mngnment executives directives *> make ΑTRG rsxcall bytewd ( 2 , 57. ) make ' DTRG rsxcall bytewd ( 2 , 59. ) make 'CRAW rsxcall bytewd ( 2 , 112. ) make ' MAPW rsxcall bytewd ( 2 , 121. ) make 'UMAPW rsxcall bytewd ( 2 , 123. ) make 'ELAW rsxcall bytewd ( 2 , 119. )

define AREGION integer REGNAM

ASCRS ( REGNAM , REGNM ) drop

REGST : = 57K ; attach it and allow all access

ATRG ( RGDB ) ; create the region and attache it ioerr end

define DREGION DTRG ( RGDB ) ; ; ioerr ; if ( REGST )= 40000K ) print "Window unmaped' endif end define cwndow integer APR WNRID , WNSIZ , WNOFF

WNDAPR := urshift ( APR , 5 ) ; APR in the upper byte

WNDSZ := WNSIZ ; MUST BE LESS THAN 4K

WNDREG := WNRID ; THE REGION'S ID WHERE THE MAPPINC TAKES PLACE ; THIS IS KIND OF TRIKY NO. SO IT MUST BE FETCHED ; FROM THE REGION DEFINITION BLOCK ( RGDB )

WNDOFF := WNOFF ; WINDOW OFFSET IN THE REGION WNDL off ; TAKE THE DEFAULT. CAN BE CHECKED FOR THE ACTUAL ; WINDOW SIZE AFTER THE CALL

WNDST := 202K ; MAP IT AND ALLOW WRITE ACCESS CRAW ( WNDB ) ; CREATE AND MAP THE WINDOW IOERR END

<* This part concerns with random access of a 32kword chunk of rnemory ( region) . The region is "looked at" through a 4kword window which starts at 160000k absolute address in the Magic task.

The region can be viewed as 256 x 256 area where each byte corresponds to a (X,Y) set of coordinates.

The main access routnes will be:

- MRDPIX ( X , Y ) for reading a value

- MWRPIX ( X , Y , VAL ) for writing a value

Additional routine are provided for setting up the windowing scheme

and filling the region with data from the disk *> integer YLOW , YHIGH ; the Y coordinates corresponding to the first and

; last raster in the current window relative to ; whole region.

<* ATTRG ( REGNAM , VADDR ) at t aches s a named region and an initial mapping of a 4k window at the begining of the region *> define ATTRG integer REGNAM VADDR AREGION ( REGNAM ) ; create a 32kwords dynamic region. CWNDOW ( VADDR , REG ID , 20 OK . 0 )

; create a window at 160000 absolute address ; of 4k words. Map it at the offset 0 in the ; region YLOW := 0 ; init to the very first raster YHIGH := 31 ; init to 32-nd raster end

mac

(* PIXVAL := MGPIX ( X , YREL ) gives the value of the pixel given the relative coodinate in the window and the X. *) entry MGPIX integer mov (msp)+ r1 Y-coo mov (msp)+ , r0 ; X-coo swab r1 ; Y * 256. add r1 , r0 ; relative address from begiinig of the window mov @ # ptr ( MEM_REC ) , r2 ; Add active record base address add So WNDADR (r2) , r0 clr r1 bisb. (r0) , r1 ; get the pixel value mov r1 , -(msp) ; return argument next

<* MPPIX ( X , YREL , PIXVAL ) gives the value of the pixel given the relative coodinate in the window and the X. * > entry MPPIX mov (msp)+ , r2 ; value to be written mov (msp)+ , r1 ; Y-coo mov (msp)+ , r0 ; X-coo swab r1 ; Y * 256. add r1 , r0 ; relative address from begiinig of the window mov @ # ptr ( MEM_REC ) , r3 ; Add active record base address add So WNDADR (r3) , r0 movb r2 , (r0) ; return argument next

<* YREL := REMAP (-Y-COO ) gives the relative coordinates in the region corresponding to Y-COO. It remaps the window if required. * >

<* define REMAP integer integer YCOO if ( not elm ( YCOO , YLOW , YHIGH > )

YLOW := Ishift ( urshift ( YCOO , 5 ) , 5 ) ; YCOO / 32.*32. YHIGH := YLOW + 31. ; 32 rasters per window

WNOOFF :- YLOW * 4 ; OFFSE in region is YLOW*256/64

MAPW ( WNDB ) ; remap the window in the same region endif

REMAP := YCOO - YLOW output YREL end *>

entry REMAP integer mov (msp) , r0 Get desired line number . emp r0 , @ * ptr ( YHIGH ) If it is ) YHIGH bgt 9s go to 9s (Remap ) . emp r0 , @ * ptr ( YLOW ) Else If it is )= YLOW bge Bs go to 8s (No remap)

9s : bic * 37k . r0 Form YLOW. mov r0 . @ * ptr ( YLOW ) Store YLOW in YLOW . mov r0 , @ * ptr ( YHIGH ) Store YLOW + 3 1 i n YH I GH . add # 31. , @ # ptr ( YHIGH ) asl r0 ; Multiply YLOW by 4. asI r0 mo v @ # ptr ( MEM_REC ) r1 ; Active MEM_REC address -> r1. mov r0 , so WNDOFF (r1) ; Place YLOW * 4 in current WNDOFF. mov r1 , -(msp) ; Push active address add # so WNDAPR , (msp) ; + WNDAPR offset (WNDB pointer) . mov # base MAPW , r3 ; Load base address of MAPW routine. jsr pc , xeq ; Execute the MAPW (Remap).

8s : bic # 177740k , (msp) Return line number - YLOW. next end

<* PIXVAL := MRDPIX ( XCOO , YCOO ) reads a pixel at XCOO.YCOO *> define MRDPIX integer integer XCOO YCOO MRDPIX := MGPIX. ( XCOO , REMAP ( YCOO ) ) end

<* MWRPIX ( XCOO , YCOO , PIXVAL ) writes a pixel at XCOO.YCOO *> def ine MWRPIX integer XCOO YCOO PIXVAL

MPPIX ( XCOO , REMAP ( YCOO ) , PIXVAL > end

This part deals with filling in the region with data from the disk *) record WNO_REC integer WNDARR ( 0 > the window is looked at as an array endrecord

<* FILLREC ( IMFILE ) fills the region with the data provided from the image file IMFILE.

It assumes previous call to INITRG ; i.e. region and fist window mapped * > define FILLREC integer IMFILE local integer IWNDARR IMCH char PNAME ( 30 ) with M_EDGE

ATTRG ( "EDGIMG" , 160000k ) ptr ( WND_REC ) := WNDADR ; set begining of the array at window virtual ; address mvstr ( "dm3: [5, 1]" , PNAME ) cone at ( PNAME , IMFILE ) concat ( PNAME , ' .1M ) IMCH := OPEN ( PNAME , 'R ) REMAP ( 0 ) iter 8. REMAP ( YLOW ) ; ; drop

IWNDARR off iter 32. ; fill in a window

; read a raster of 256 bytes from IMFILE into WNDARR at IWNDARR rds ( IMCH , PTR ( WNDARR ( IWNDARR ) ) , 256. ) drop IWNDARR += 128. ; next blok loop

YLOW += 32. loop close ( IMCH ) DRECION end

define REGFILL integer IMFILE local integer IWNDARR RDBLK IMCH char PNAME ( 30 ) with M_EDGE

ATTRG ( "EDGIMG " , 160000k ) ptr ( WND_REC ) : = WNDADR ; set begining of the array at window virtual ; address

mvstr ( "dm3 : [ 100, 100 ]" , PNAME ) concat ( PNAME , IMFILE ) concat ( PNAME , ' .1M ) IMCH := OPEN ( PNAME , 'R ) RDBLK OFF REMAP ( 0 ) iter 8. REMAP ( YLOW ) drop IWNDARR off iter 16. ; fill in a window

; read a raster of 256 bytes from IMFILE into WNDARR at IWNDARR rdb ( IMCH , RDBLK , PTR ( WNDARR ( IWNDARR ) ) , 1 ) drop INCREMENT RDBLK

IWNDARR += 256. ; next blok loop

YLOW += 32. loop close ( IMCH ) end <*

FLUT.MG — LOOKUP TABLE SETUP ROUTINES FOR THE LEXIDATA 3400

CL CLRMAF CS RGS GOUT RGOUT SETNIL RECT STEP SETUP 8SETUP 6SETUP *>

<* Variable section: RED, GREEN, and BLUE are the memory locations in the Lexidata memory at which the lookup tables start for each color. ALL is a wildcard to effect action for each color. TPLANE, GFLANE, and IPLANE are arguments for DSCHAN, the channel enabling primitive.

*> integer RED GREEN BLUE ALL TPLANE GPLANE IPLANE RED := 1024 GREEN := 2048 BLUE := 3072 ALL on <*

CL — maps the intensity index (GLIN) into the intensity value (CLOUT) to be represented by the Lexidata. For this command to be meaningful, GLIN must be between 0 and 2S5, 1024 and 127?, 2048 and 2303, or 3072 and 3327. Only the LSB of CLOUT will be used. = = > GL ( GLIN GLOUT ) *>

define GL integer GLIN GLOUT dsllu ( GLIN GLOUT GLIN GLOUT ) end

<*

CLRMAP — sets every intensity index between 0 and 4095 to the input argument LEVEL. There is no harm in setting intensity indices that are not used, i.e. out of the range of th* memory reserved for each color. == > CLRMAP ( LEVEL ).

*> define CLRMAP integer LEVEL dsllu ( 0 , LEVEL , 4095 , LEVEL ) end

<*

GS — sets a ramped lookup table with a variety of arguments. GS takes as input (1) no arguments (2) 1-3 color names (RED, GREEN, or BLUE) or (3) ALL.

(1) GS will set up the black-and-white lookup table, from 0 to 255.

(2) GS /RED /GREEN /BLUE will set up the lookup table starting at the appropriate memory location.

(3) GS ALL will set up all four lookup tables.

GS only sets those intensities used by the Lexidata. If in 6-bit mode only intensities = 0(mod 4) will be set. All others will be set to

255 (maximum intensity).

==> CS /RED /GREEN /BLUE /ALL

*> define CS command integer COLOR local integer TEMP1 TEMP2 if ( cmdcnt ==0 ) dsllu ( 0 , 0 , 25S , 255 > else

TEMP2 : = TPLANE + GFLANE + 1 if ( COLOR == -1 ) CLRMAP ( 255 ) iter 4

TEMP1 := 1024. * 1 iter 256 ; this sets the lookup tables by

GL ( TEMP1 + I , I ) ; looping with the right index, loop ( TEMP 2 ) ; as defined by TPLANE and GPLANE. loop else iter cmdcnt dsllu ( COLOR , 255 COLOR + 255 , 255 ) iter 256 ; this sets the lookup tables by

GL ( COLOR + 1 , 1 ) ; looping with the right index, loop ( TEMP2 ) ; as defined by TPLANE and GPLANE.

nxtarg loop endif endif end

<*

RGS works much the same way as CS does, accepting the same arguments, but setting the lookup tables in a downward ramp, i.e., the higher the intensity index, the lower the intensity value. If in 6-bit mode, all unused indices are set to 0. ==> RGS /RED /GREEN /BLUE /ALL *> define RCS command integer COLOR local integer TEMP1 TEMP2 if ( cmdcnt ==0 ) dsllu ( 0 , 255 , 255 , 0 ) else

TEMP2 :- TPLANE + GPLANE + 1 if ( COLOR == ALL ) CLRMAP ( 0 ) iter 4

TEMP1 := 1024 * 1 iter 256 CL ( TEMP1 + I , I' ) loop ( TEMP2 ) loop eIse iter cmdcnt iter 256

GL ( COLOR + I , I' ) loop ( TEMP2 ) nxtarg loop endif endif end

<*

GOUT and RCOUT are merely selectors of GS and RCS. == > GOUT ==> RGOUT *> define GOUT

GS ALL end define RGOUT RCS ALL end

<*

SETNIL -- zeroes all used indices within the input color table. Used in RECT and STEP to set the indices not chosen to sero. Input is a color, or a memory location at which to start setting indices to zero. If input i s not a color, it must be <= 3739 (256 slots from the highest allowable slot). ALL may not be used with SETNIL. ==> SETNIL ( /RED /GREEN /BLUE or 0 to 3739 ) *> define SETNIL command integer COLOR iter 256

GL ( COLOR + 1 , 0 ) loop ( TPLANE + GPLANE + 1 ) end

<*

RECT -- creates a binary lookup table in a certain color, either 0 or 255 depending on the limits. The first two arguments are the indices to set to the maximum and the third is the color table in which to work. The first argument must be < = the second argument. ALL may be used as a wildcard, but only one color argument is allowed. ==> RECT ( 0-255 , 0-255 , /RED 0 LO HI 1023

/GREEN

/BLUE 255

/ALL ) ! 0 *> d e f i ne RECT integer LO HI COLOR if ( COLOR == -1 ) CLRMAP ( 0 ) dsllu ( LO , 255 HI 255 ) dsllu ( RED + LO , 255 , RED + HI 255 ) dsllo ( GREEN + LO , 255 , GREEN + HI , 255 ) dsllu ( BLUE + LO , 255 , BLUE + HI , 255 ) else

SETNIL COLOR dsllu ( COLOR + LO , 255 COLOR + HI 255 ) endif end

<*

STEP -- a limited version of RECT in which all indices are divided into two regions, instead of three. The first input is the index before which all values should be xero and after which all values should be set to 255 NOTA BENE: the first input is a RELATIVE index, from 0 to 255, not from 0 to 4095. The second input is a color table within which to make the changes. ALL may be used with STEP. ==> STEP ( 0-255 , /RED 0 THR. 1023

/GREEN

/BLUE 255

/ALL ) 0 * > define STEP

integer THRESH COLOR if ( COLOR == -1 )

CLRMAP ( 0 ) itec 4

RECT ( THRESH , 255 , 1024 * I ) loop else

SETNIL COLOR

RECT ( THRESH , 255 , CO LOR ) endif end

<*

8SETUP and 6SETUP set the plane mask variables and call SETUP. ==> 8SETUP ==) 6SETUP *> define 8SETUP TPLANE off ; if we are coming from 6-bit mode, set TPLANE GPLANE off ; and GPLANE to 0 , and IPLANE to 255, or IPLANE := 377K ; 8 planes enabled for the Lexidata. DSCHAN ( TPLANE , GPLANE , IPLANE ) DSCLR ( TPLANE + GPLANE ) DSLLU ( 0 , 0 , 255 . 255 )

DSLLU ( RED , 0 , RED + 255 , 255 ) DSLLU ( GREEN , 0 , GREEN + 255 , 255 ) DSLLU ( BLUE BLUE + 255 , 255 ) end define 6SETUP TPLANE := 1 ; if we are coming from 8-bit mode, set TPLANE GPLANE := 2 ; and GPLANE to 1 and 2 respectively, and then IPLANE := 374K ; set IPLANE to 252, or 6 planes enabled for DSCHAN ( TPLANE , IPLANE IPLANE ) DSCLR ( TPLANE + GPLANE ) GOUT end

< *

FXMON - INTERFACES TO THE STANDARD FIRMWARE "IACMON.XB" * >

APUSH RADIX OCTAL

INTEGER LEXIOFLG ; FLAG TO TELL WBUSY WHETHER TO WAIT FOR OUTPUT ; OR INPUT

< *

DMA TRANSFER ROUTINES (COMMAND 10) *>

<* DEFINE DMACT ACTION

INTEGER ARGl ARG2 ΛRG3 ARG4 ARG5 INTECER OCODE ( 1 ) WDOAS ( OCODE ( 0 ) >

WDOAS ( DCHAD ( ARGl ) ) WDOAS ( ARG2 ) WDOAS ( -- ARG3 ) WDOAS ( BYTEWD ( ARG5 , ARG4 ) ) END *>

<* WBUSY -- WAIT FOR INPUT/OUTPUT FROM LEXIDATA *>

DEFINE WBUSY

IF ( LEXIOFLG ) DSOWT

ELSE DS IWT

ENDIF END <* DMAW -- WRITE SEQUENTIAL PIXELS WITHIN AN AREA. WORD MODE CALL: DMAW ( BUFFER , X0 , XL , Y0 , YL ) *>

DEFINE DMAW

INTEGEB BUFFER ( 1 ) AXO AXL AYO AYL

DSLIM ( AXO , AYO , AXO + AXL - 1 , AYO + AYL - 1 )

DSPUT ( BUFFER , AXL * AYL )

LEXIOFLG ON END

<* DMAR -- READ SEQUENTIAL PIXELS FROM DISPLAY INTO BUFFER. WORD MODE CALL: DMAR ( BUFFER , X0 , XL , Y0 , YL ) *>

DEFINE DMAR

INTEGER BUFFER ( 1 ) AXO AXL AYO AYL

DSLIM ( AXO , AYO , AXO + AXL - 1 , AYO + AYL - 1 )

DSGET ( BUFFER , AXL * AYL )

LEXIOFLG OFF END

DEFINE PDMAR

INTEGER BUFFER AXO AXL AYO AYL

END

DEFINE PDMAW

INTEGER BUFFER AXO AXL AYO AYL

END

<* WRPIX - WRITE A SINGLE PIXEL CALL: WRPIX ( IX , IY , LEVEL *>

DEFINE WRPIX

INTEGER IX IY LEVEL LOCAL INTECER ARR ( 3 )

ARR ( 0 ) :a XX ; ; ARR ( 1 ) : = IY ; ; ARR ( 2 ) : = LEVEL

DSRNW ( 1 , ARR ) END

<* RDPIX READ A SINGLE PIXEL CALL : LEVEL := RDPIX ( IX , IY ) *>

DEFINE RDPIX INTEGER INTEGER IX IY

LOCAL INTEGER ARR ( 2 ) ARR ( 0 ) := IX ARR ( 1 ) := IY DSRNR ( 1 , ARR PTR ( RDPIX ) )

END

<* GBAR FILL A BLOCK OF PIXELS CALL: GBAR ( XO , XL , YO , YL LEVEL ) *>

DEFINE GBAR

INTEGER AXO AXL AYO AYL LEVEL IF ( AXL ==0 ) RETURN ENDIF

DO AYO , MIN ( AYO + AYL - 1 , 511. )

DSVEC ( AXO , I , MIN ( AXO + AXL - 1 , 639. ) , I , LEVEL ) LOOP END

DEFINE BLKSUM LONG

INTEGER ARGl ΛRG2 ARG3 ΛRG4 ARG5 END

<* Define DELAY function using RSX Mark Time directive and Wait for Global Event Flag directive. make 'MRKTS rsxcall bytewd ( 5 , 23. ) make 'STSES rsxcall bytewd ( 2 , 135. )

integer MRKTS ( 0 ) .word bytewd ( 5 , 23. .word 23. . bIkw 1 .word 1 . word 0 integer WTSES ( 0 ) .word bytewd ( 2 , 41. ) .word 23.

define DELAY integer DTIM MRKTs ( 2 ) := DTIM * 6 RSXDIR ( MRKTS ) ioerr RSXDIR ( WTSES ) ioerr end

APOP

apush radix octal

<_*

Subroutne 22 BADDR does a conversion of the 16-bit virtual address supplied as argument into a full 22-bit physical address of the O-bus. The MMU user map registers are used for this purpose so this subroutine must be used in a magic/I environment linked to the I/O page. For how to link to the I/O page see MGLIOP.CMD file. input: 16 bit word representing the virtual address output: long(32-bit) word representing the 22-bit address as foil owing :

- Is part is the low 16-bits

- ms part is the high 6 bits multiplied by 2. note: this format was chosen to correspond to the CCD CAMERA

CONTROLLER build by Zvi Orbach. More bit manipulations might be required if used with other devices, calling sequence: long 22b i taddr s

22bitaddr := 22baddr ( ptr ( buff ) )

*>

.mac

; the user map register addresses in i / o page label UPAR ; ; . wor d 177440k label UPDR ; ; . wor d 177600k entry 22ADDR long

mov (msp ) , r 0 ; get the virtual address mov r0 , r1 ; rol r0 ; isolate the APF ( Active Page Field ) rol r0 rol r0 rol ro ; bic # 177770k , r0 ; in r0 asI r0 . even bic # 160000k , r1 ; isolate DP ( Displacement Field ) in r1 mov r1 , r3 ; save it bic # 177700k , r1 ; isolate the displacement in block ash # 177772 , r3 ; block * in page add UPAR , r0 ; get the corresponding FAR addr in i/o page add (r0) , r3 ; 16 bits physical address in blocks elr r2 ; ( r2,r3 ) will be the 22 bit physical addr ache # 6 , r2 ; make place for the additional 6 bits add r1 , r3 ; finally... the 22 bit address mov r3 , (msp) ; least significant portion of the address asl r2 ; CCD camera controller format mov r2 , - (msp) ; push the extra 6 bits in the stack next

. end apop parameter WCR := 172410k ; DMA word count register. parameter BAR := 172412k ; Bus address register for DMA . parameter CSR := 172414k ; Control status register. parameter DBR := 172416k ; Data buffer register. long PHYADR ; Physical (22-bit) address of the buffer record DMALINE integer LNBUF ( 256. ) endrecord

DMALINE INLN ( 2 ) integer OUTLN ( 256. ) char PNAME ( 30. ) integer TXO TYO integer IFN ( 10 ) IDPN ( 20 ) integer VCH integer CFLAG CFLAG off

<* Wait until DMA operation is complete, (Monitors EUSY bit.) *> define WBUS?Y

while ( peek ( CSR ) AND 200k ) repeat end define RDLN integer BUFF ( 1 ) x 0 x1 y0 y1

PHYADR := 22ADDR ( BUFF ) poke ( 130000k + X0 - 1 , DBR ) poke ( 114000k + Y0 . DBR ) poke ( -- XL / 2 , WCR ) ; poke ( -- ( XL * YL ) , WCR ) poke ( lsword ( PHYADR ) , BAR > poke ( 0 , DBR ) poke ( msword ( PHYADR ) + 1 , CSR ) end

<* define WRTLN integer X0 Y0 LEN if ( CFLAG ==0 ) poke 130000k + X0 , DBR ) poke 134000k + Y0 , DBR ) else poke 132000k + X0 , DBR ) poke 136000k + Y0 , DBR ) endif iter LEN poke ( ( OUTLN ( i ) and 777k ) + 120000k , DBR ) loop end *> mvstr ( ' dm3 : [ 5 , 1 ] , IDPN ) define IMAGEFN integer ARGl mvstr ( ARGl , IFN ) mvstr ( IDPN , PNAME ) mconcat PNAME , ARGl im , 3 print str ( PNAME ) end

define VDRAW integer FNAME X0 Y0 local integer BUFPTR IMAGEFN ( FNAME ) VCH : = open ( PNAME , 'r ) BUFPTR off do Y0 , Y0 + 255. if ( rds ( VCH , OUTLN , 256. ) <> 256. ) print "WARNING: Unexpected end of file" exit

else

MVBYWD ( OUTLN , 0 , INLN ( BUFPTR 256. ) DMAW ( INLN ( BUFPTR ) , X0 , 256. , i , 1 ) BUFPTR : = 1 - BUFPTR endif loop WBUSY close ( VCH ) end

define REDRAW

VDRAW ( IFN ) end define VSAVE integer FNAME local integer BUFF1 BUFF2 with M_EDCE

ATTRG ( " IOPAGE" , 160000K ) IMAGEFN ( FNAME ) VCH := open ( PNAME , ' rwct ) BUFF1 := ptr ( INLN ( 0 ) ) BUFF2 := ptr ( INLN ( 1 ) ) RDLN ( BUFF1 , 128. , 256. , 128. 1 ) do 129. , 384. WBUS?Y

RDLN ( BUFF2 , 128. , 256. , i , 1 )

WRS ( VCH , BUFF1 , 256. )

XCHG ( ptr ( BUFF1 ) , ptr ( BUFF2 ) ) loop

WBUS?Y

DREG ION close ( VCH ) end

define GRABIM integer X0 Y0 local integer BUFPTR with M_EDGE

ATTRG ( "IOPAGE" . 160000K )

BUFPTR off poke ( 1000k , DBR ) delay ( 1 ) poke ( 0 , DBR ) do 128. 383.

WBUS?Y

RDLN ( INLN ( BUFPTR ) , 1280 , 256. , i , 1 )

MVBYWD ( INLN ( BUFPTR ) , 0 , OUTLN , 256. )

DMAW ( OUTLN , X0 , 256. , Y0 + i - 128. , 1 )

BUFPTR := 1 - BUFPTR

loop WBUSY DRECION end

<* integer BLKBUF ( 0 )

. word 39.

.word 1 - 256. / 2

.blkw 128. define PDMAW integer BUFFER ( 1 ) mvwds ( BUFFER , BLKBUF + 4 , 128. )

DSOWT

DSBLOC ( BLKBUF , 130. ) end

*> define sDRAW integer TX0 TY0 local integer IWNDARR LNCNT DSLIM ( TX0 , TY0 , TX0 + 255. , TY0 + 255. ) YLOW := 32 iter 256.

REMAP ( i ) drop IWNDARR := WNDADR iter 32.

MVBYWD ( IWNDARR , 0 , OUTLN , 256. )

DSPUT ( OUTLN , 256. ) WBUSY IWNDARR += 256. loop loop ( 32. ) REMAP ( 0 ) drop end

define DRAW with M_EDGE ATTRG ( "EDGIMG" 160000k ) sDRAW DREGION end

def ine MDRAW with M_EDGE ATTRG ( "MTCHIM" , 160000k ) sDRAW DREGION end

define MSAVE integer FNAME l oc a l integer OUTCH IWNDARR PNAME ( 15. ) mvstr ( "dm3 : [200 , 200]" . PNAME ) concat ( PNAME , FNAME ) concat ( PNAME , im ) OUTCH := open ( PNAME , ' rwct ) with M_EDGE ATTRG ( "EDGIMG" , 160000k ) YLOW := 32. iter 256 REMAP ( i ) drop IWNDARR := WNDADR iter 32.

WRS ( OUTCH , IWNDARR , 256. ) IWNDARR += 256. loop loop ( 32. ) REMAP ( 0 ) drop DREGION close ( OUTCH ) end

<* Global event flags for synchronisation. TASK holds the name of the task with whom we are communicating. THESE MUST BE GLOBAL *> integer SYNC1 SYNC2 TASK ( 2 )

<* Define executive directives to be used for tasking with Control *> make 'WAIT rsxcall bytewd ( 2 , 41. ) make 'CLEAR rsxcall bytewd ( 2 , 31. ) make 'READ rsxcall bytewd ( 2 , 37. ) make 'SET rsxcall bytewd ( 2 , 33. ) make 'RCVDs rsxcall bytewd ( 4 , 75. ) make 'SDATs rsxcall bytewd ( 5 , 71. )

<* Execute a subroutine call, the arguments and subroutine name are in BUFF. BUFF contains. TASKl , TASK2 , 0 or -2 , #ARGS , arg1 , arg2 , .. argn , subroutine

TASKl and 2 make up the taskname of the caller *> define DOROUTINE integer BUFF ( 1 ) l oc a l integer ADR OFFST OFFST1 OFFST := 4 OFFSTl : = 0 if ( BUFF ( 2 ) ) ptr ( BUFF ( 4 ) )

OFFST1 := 1

OFFST : = OFFST + length ( ptr ( BUFF ( 4 ) ) ) / 2 + 1 endif lookup ( ptr ( BUFF ( BUFF ( 3 ) + OFFST - OFFST1 ) ) ) ;; ADR := lastword DROP iter BUFF ( 3 ) - OFFST1

( BUFF ( I + OFFST ) ) ; store args on stack loop exec ( ADR ) end

<* Send a buffer of data to the task we are connected to BUFF ( 0 ) must be greater than 0. This can be used in the receiver as a code for what data has been sent. The buffer can be no longer than 13 words. *> define SEND integer BUFF ( 1 )

SDATS ( TASK ( 0 ) , TASK ( 1 ) , BUFF , SYNC1 ) ; ; ioerr

WAIT ( SYNC2 )

CLEAR ( SYNC2 ) end

<* Receive data from that task we are connected to and put it in a buffer Call: RECEIVE ( BUFFER ) Note: if these routines are overlaid , BUFFER must be global. The buffer must be at least 15 words. BUFFER contains:

TASKl , TASK2 , CODE , DATA where TASK1 AND 2 make the name of the task which is sending the message. CODE is 0 if we are calling a rcutine, -1 if the other task is informing us of its rundown, and > 0 if other data has been sent *> define RECEIVE integer BUFF ( 1 ) WAIT ( SYNC1 ) CLEAR ( SYNC1 )

RCVDJ ( 0 . 0 BUFF ) ;; ioerr if ( BUFF ( 2 ) == -1 ) ; rundown SET ( SYNC2 ) ; acknowledge receipt if ( BUFF ( 3 ) == 0 ) bye else return endif else if ( BUFF ( 2 ) ==0 or BUFF ( 2 ) == -2 )

DOROUTINE ( BUFF ) endif

SET ( SYNC2 ) endif end

<* Set up communications with the task that requested us receives the two flags that the tasks will use for synchronization. and the name of the task with whom we are communicated.

Any task that gets connected to must issue an INITREC command before proceeding . *> define INITREC local integer BUFF ( 15 ) detterm

RCVDs ( 0 , 0 , BUFF ) ;; ioerr iter 2

TASK ( I ) := BUFF ( i ) loop

SYNC1 := BUFF ( 2 )

SYNC2 := BUFF ( 3 )

SET ( SYNC2 ) end

EXT DISPMODEL EXT WFMP EXT BLBDISP ; blob bounding rectangles EXT HAROLD ; &&& integer STPFLAG integer VIDCBF ( 15. )

define CONNECT_2_MASTER

INITREC begin

RECEIVE ( VIDCBF ) until ( STPFLAG ) end

define RECONNECT

SET ( SYNC2 ) be g in

RECEIVE ( VIDCBF ) until ( STPFLAG ) end integer TMPICH TMPOCH def ine STOPCO integer TERM

TMPICH := cich

TMPOCH := cooh cich := open ( TERM , ' rwa ) coch : = cich poke ( 2 , fdb ( coch ) ) at term

STPFLAG on end

define STRTCO detterm close ( cich ) cich := TMPICH coch := TMPOCH STPFLAG off RECONNECT end define INITVID

INITD

CONNECT_2_MASTER end

sRESTART := base INITVID ; entry point for VIDEOT. TSK

SAVE WFVIDEOT

parameter MAX_#_ENT := 20 ; Maximum # of permissible entities. parameter *POINTS := 25 ; Maximum # of points permitted within ; an entity .

record POINT_REC integer X1 Y1 ; Coordinates of first corner point. integer CURTYPE ; Type of the line between 1st and 2nd point. integer XJ YJ ; Coordinates of second point. integer NXTTYPE ; Type of the next line (between 2nd and 3rd) . dummy -3 endrecord record ENTITY integer #PTS ; # of points.

FOINT_REC 21 ( #P0INTS ) ; See record POIKTS. endrecord

record FRAME_REC integer FRM# ; Frame # . integer #ENT ; # of ent it ies ENTITY El ( MAX_#_ENT integer HX1 HX2 HY1 Hy2 ; Horizontal landmark points. integer VX1 VX2 VY1 VY2 ; Ve r t i c a l landmark points. integer HX3 HX4 HY3 HY4 ; Horizontal landmark points.

integer VX3 VX4 VY3 VY4 Vertical landmark points. endrecord

define DISFMODEL integer TX0 TY0 GBAR ( TX0 . 256. , TY0 256 . GRNGL ) with M_EDGE

ATTRG ( "MODELR" , 160000k ) ptr ( FRAME _REC ) : = WNDADR iter #ENT with El ( i ) iter #PTS - 1 with : ZI ( i )

DSVEC ( XI + TX0 , Yl + TY0 , XJ + TX0 , YJ + TY0 , REDGL ) loop loop

DSVEC ( HX1 + TX0 , HY1 + TY0 , HX2 + TX0 , HY2 + TY0 , REDGL )

DSVEC ( VX1 + TX0 , VY1 + TY0 , VX2 + TX0 , VY2 + TY0 , REDGL )

DSVEC ( HX3 + TX0 , HY3 + TY0 , HX4 + TX0 , HY4 + TY0 , REDGL )

DSVEC ( VX3 + TX0 , VY3 + TY0 , VX4 + TX0 , VY4 + TY0 , REDGL )

DREGION end <* Display the Wafer Map module * > <* Attachement to the Inspection Plan *> MEM_REC M_IPSDB define ATIPSDB with M_IPSDB

ATTRG ( "IFSDBR" , l60000K ) ptr ( IPSDB_REC ) := WNDADR end

integer MPX0 , MPY0 ; the origin x,y of the wafer map on the screen integer MPRAD ; the map size on the screen real MPSCL ; # pixel/micron integer XPI YPI ; the pit ches integer STH AVW ; str and ave sizes integer DIH DIW ; die sizes integer XROW YROW ; current row to display integer GLDI E ; the gray level at which the die boundaries are display ed integer GLCIR ; the gray level of the circle integer CROSX ( MAX_RETICLES ) ; x location of the marker for the die being ins pected integer CROSY ( MAX_RETICLES ) ; y location of the marker for the die being ins

pected

<* Get the current row coordinates *> define GROWCOO integer ROW COL

XROW := MPX0 + COL * XPI

YROW : = MPY0 * ROW * YPI end define GTORG integer X0 Y0 SZ with FLAT_TO_ORIGIN

MPX0 := X0 + ( SZ - fix ( float ( X ) * MPSCL ) )

MPY0 := Y0 + fix ( float ( Y ) * MPSCL ) end define BOX integer XDI , YRO , GL

DSVEC ( XDI , YR0 , XDI + DIW , YR0 , GL )

DSVEC ( XDI , YR0 + DIH , XDI + DIW , YRO + DIH , GL )

DSVEC ( XDI , YR0 , XDI , YRO + DIH , GL )

DSVEC ( XDI + DIV , YR0 , XDI + DIW , YR0 + DIH , GL ) end define WFMAP

Integer X0 , Y0 , SZ local integer XDIE

ATIPSDB

GLDIE := GRNGL

GLCIR : = GRNGL with INSP_PLN with HEADER with INSE_DATA_BASE

SZ -= 10.

X0 += 5

Y0 += 5

MPRAD := SZ / 2

MPSCL := float ( MPRAD / ( float ( WAFER_SZ ) * 500.0 )

XPI := f i x ( D I E_X * MPSCL ) YP I : = fix ( DIE_Y * MPSCL ) with LAYERS ( CUR_LAYER ) with DTL_LAYER_REV ( #_REVS - 1 ) with L_RETICLE with RETICLE_DIE

STH := D_ST_HGT AVW := D_AV_WDTH DIW := YPI - fix float ( AVW ) * MPSCL ) DIH := XPI - fix float ( STH ) * MPSCL )

GTORG ( X0 Y0 MPRAD ) iter #_DIE_ROWS with WAFER_MAP ( i ) CROWCOO ( i , IST_D_* ) XDIE := XROW iter LAST_D_# _ IST_D_# BOX ( XDIE , YROW , GLDIE )

XDIE := XDIE + XPI loop loop

DSCIR ( ( X0 + MPRAD ) , ( Y0 + MPRAD ) , MPRAD , GLCIR ) with REFERENCE_DIE GROWCOO ( ROW , CLMN ) : GET COORDINATES OF REFERENCE_DIE BOX ( XROW , YROW , BLUGL ; DRAW IT IN RED with L_INSPECTION ; GET RETICLES TO INSPECT iter #_TO_INSP with INSP_R ( i )

GROWCOO ( ROW , CLMN )

CROSX ( i ) := XROW + DIW / 2 - 2

CROSY ( i ) := YROW t DIH / 2 - 3

BOX ( XROW , YROW , REDGL ) loop

DREGION end define DISPX integer X0 Y0 GL DSSAO ( X0 Y0 GL 0 1 ) DSTXT ( "X" ) end define SHOWDIE

ATIPSDB if ( I -MODE == PRIMARY ) DISPX ( CROSX ( CONFIRM ) , CROSY ( CONFIRM ) , 0 ) DISPX ( CROSX ( PRIMARY ) , CROSΫ ( PRIMARY ) , REDGL ) else

DISPX ( CROSX ( PRIMARY ) , CROSY ( PRIMARY ) , 0 ) DISPX ( CROSX ( CONFIRM ) , CROSY ( CONFIRM ) , REDGL ) endif

DREGION end define DMESSAGE address MESS

GBAR ( 0 288. 254. 90. 0 )

DSSAO ( 32. 320 REDGL 0 2 )

DSTXT ( MESS ) end define ACQOSG

DMESSAGE ( "IMAGE ACQUISITION" ) end

define IPRMSG

DMESSAGE ( "IMAGE PROCESSING" ) end define MDLMSG

DMESSAGE ( "MODEL MATCHING" ) end define DFTMSG

DMESSAGE ( "DEFECT ANALYSIS" ) end define ENDMSG

DMESSAGE ( "THAT'S ALL FOLKS!" ) end

integer MINXO MINYO MAXX1 MAXY1 define BOUND DSVEC ( MINX0 - 1 , MINY0 - 1 , MAXX1 + 1 , MINY0 - 1 , REDGL ) DSVEC ( MAXX1 + 1 , MINY0 - 1 , MAXX1 + 1 , MAXY1 + 1 , REDGL ) DSVEC ( MAXX1 + 1 , MAXY1 + 1 , MINX0 - 1 , MAXY1 + 1 , REDGL ) DSVEC ( MINX0 - 1 , MAXY1 + 1 , MINX0 - 1 , MINY0 - 1 , REDGL ) end define BNDRCTS integer TX0 TY0 ATIPSDB with INSP_DATA_BASE TX0 += REG_X TY0 += REG_Y with INSP_PLN with LAYERS ( MOD LAYER with DTL_LAYER-REV ( #_REVS - 1 ) with L_RETICLE with RETICLE_DIE with D_PATTERNS ( MOD_PATTERN ) with INSP_FR ( MOD_SITE ) with F_DEFCTS ( MOD_FRAME ) print "No of Defects " , #_DFCTS iter #_DFCTS with DEFECTS ( i ) MINX0 := XCOM - DELX + TX0

MINY0 YCOM - DELY + TY0 MAXX1 XCOM + DELX + TX0 MAXY1 YCOM + DELY + TY0

BEEF BOUND DELAY ( 5 ) loop

DREGION end

define DRAWBOX integer X0 XL Y0 YL GL local integer X1 Y1

X1 := X0 + XL : sets up the new coordinates of the

Y1 := Y0 + YL : right bottom dsvec ( X0 , Y0 . X1 , Y0 , GL ) ; draws the new box according to specs dsvee ( X1 , Y0 . X1 , Y1 , GL ) dsvec ( X1 , Y1 . X0 , Y1 , GL ) dsvec ( X0 , Y1 . X0 , Y0 , GL ) end define LOWMAG

DSCLR ( 255 )

VDRAW ( JOE 32. 256. ) iter 6

DRAWBOX ( 201 , 24 . 346. + ( I * 24 ) , 24 , REDGL )

LOOP

PAUSE end define LMAG

ATIPSDB

GBAR ( 520 . 30. 345 , 150 0 )

DRAWBOX ( 521. , 24 , 346. + ( ( 5 - CUR-FRAME ) * 24 ) 24 , BEDGL )

DREGION end

define HAROLD_DEMO

VDRAV ( "RNF03 32. 0 )

DRAWBOX ( 47. , 226. , 15. , 226. REDCL )

PAUSE

DISFMODEL ( 352. 0 )

PAUSE

VDRAW ( 'RNF03 352. 256 ) DRAWBOX ( 547. 17. 308. 18. REDGL ) DRAWBOX ( 428. 17. 357. 15. REDGL ) PAUSE DSCLR ( 255. ) WFMAP ( 220. 56. 200 ) VDRAW ( 'RNF03 32. 256. ) VDRAW ( 'RCL03 352. 256 ) DSVEC ( 318. 155. 32 254. REDGL ) DSVEC ( 318. 155. 286. 254. REDGL ) DSVEC ( 348 . 155. 352. 254. REDGL ) DSVEC ( 348. 155. 608. 254. REDGL ) DRAWBOX ( 227. 17 308. 18. REDG) ) DRAWBOX ( 547. 17 308. 18. REDGL ) end EDGE DETECTION

<* ************************************************************************

CEDGET MG - THIS MODULE LOADS ALL OF THE MODULES USED IN "CEDGET" ************************************************************************** * > ext POPID ext DMISC ext MAKAP ext EDGREG ext APDECL ext INITAP ext APEDGE ext EOGCOM

integer STPFLAG integer EDGCBF ( 15. )

define CONNECT_2_MASTER

INITREC begin

RECEIVE ( EDGCBF ) until ( STPFLAG ) end

define RECONNECT

SET ( SYNC2 ) begin

RECEIVE ( EDGCBF ) until ( STPFLAG ) end integer TMPICH TMPOCH define STOPCO integer TERM

TMPICH := cich

TMPOCH := coch cich := open ( TERM , ' rwa ) coch := cich poke ( 2 , fdb ( coch ) ) atterm

STPFLAG on end

define STRTCO detterm cIose ( cich ) cich := TMPICH coch := TMPOCH STPFLAG off RECONNECT end define EDGEINIT with M_EDCE

ATTRG ( "EDGIMG" , 140000k ) CONNECT_2_MASTER end mvstr ( 'cedget , promstr ) srestart := base EDGEINIT ; RESTART FOR EDGE DETECTION PROGRAM save CEDGET

<* Name : APEDGE.M *> integer COUNT define INIT_DBF iter 40

DBF ( I ) := I + 1

Ioop end

define FIRST

ACHN ( ptr ( N ) , FCB HN , 500. ) ; Perform 1,2,1

AADD ( DBF ( 26 ) , DBF ( 18 ) , DBF ( 18 ) ) ; hor . conv

AADD ( DBF ( 26 ) DBF ( 26 ) , DBF ( 17 ) ) ; → DBF ( 26 )

AADD ( DBF ( 26 ) DBF ( 26 ) , DBF ( 19 ) )

ACONV ( DBF ( 27 ) , DBF ( 26 ) , 1 ) HO → DBF ( 27 )

ASCDB ( -2. DBF ( 26 ) )

ACONV ( DBF ( 28 ) , DBF ( 26 ) . 2 ) HE → DBF ( 28 )

AHORZ ( DBF ( 32 ) , DBF ( 27 ) DBF ( 28 ) ) ; HEDGE ( CUR-LINE )

ASUB ( DBF ( 26 ) , DBF ( 16 ) , DBF ( 20 ) ) ; AMULS ( DBF ( 26 ) , DBF ( 26 ) , 1 ) ; Equivalent ASUB ( DBF ( 29 ) , DBF ( 17 ) , DBF ( 19 ) ) ; vert . conv. AMULS ( DBF ( 29 ) , DBF ( 29 ) , 3 ) ; with odd mask.

AADD ( DBF ( 30 ) , DBF ( 29 ) , DBF ( 26 ) ) ; VO — > DBF ( 29 )

ATFR1 ( DBF ( 29 ) DBF ( 30 ) 7 ) ASCDB ( 1 DBF ( 29 ) )

AADD ( DBF ( 26 ) , DBF ( 16 ) , DBF ( 20 ) ) ;

AMULS ( DBF ( 26 ) , DBF ( 26 ) , 2 ) ; Equivalent

AADD ( DBF ( 30 ) , DBF ( 17 ) . DBF ( 19 ) ) ; vert . conv .

AMULS ( DBF ( 30 ) , DBF ( 30 ) , 5 ) ; with even mask.

AADD ( DBF ( 30 ) , DBF ( 30 ) , DBF ( 26 ) ) ; VE — > DBF ( 30 )

AMULS ( DBF ( 26 ) , DBF ( 18 ) , 6 ) ;

AADD ( DBF ( 26 ) , DBF ( 30 ) . DBF ( 26 ) ) ;

ASCDB ( -1 DBF ( 26 ) )

ATFR1 ( DBF ( 30 ) DBF ( 26 ) 7 )

ACEND

AHIAB ( FCBCHN . 8. , N )

AXCHN ( 8. )

ARLDS ( 8. ) end define ROT_SCRATCH local integer TEMP1 TEMP2 TEMP3 TEMP4 TEMP2 := DBF ( 20 )

do 16 , 19

TEMP1 := DBF ( I' )

DBF ( I' ) := TEMP2

TEMP2 := TEMP1 loop

DBF ( 20 ) := TEMP2 end

define ROT_OUT local integer TEMP1 TEMP2 TEMP2 := DBF ( 9 ) do 10 , 15

TEMP1 := DBF ( I ) DBF ( I ) := TEMP2 TEMP2 := TEMP1 loop

DBF ( 9 ) := TEMP2 end define UPDATE ROT_SCRATCH

ACHN ( ptr ( N ) , FCBCHN . 500. ) AHIAB ( BOT , DBF ( 31 ) , 128. ) AUPAK ( DBF ( 20 ) , DBF ( 31 ) ) ADNSN ( DBF ( 20 ) )

ANRDB ( DBF ( 20 ) )

ADBDB ( DBF ( 36 ) DBF ( 29 ) )

ADBDB ( DBF ( 37 ) DBF ( 30 ) )

ADBDB ( DBF ( 9 ) DBF ( 32 ) )

AZRDE ( DBF ( 34 ) )

ADBDB ( DBF ( 34 ) DBF ( 35 ) )

AZRDB ( DBF ( 35 ) )

ACEND

AHIAB ( FCBCHN . 8. , N )

AXCHN ( 8. )

ARLDB ( 8. ) end

define DOLINES integer #LINES iter #LINCS FIRST increment COUNT if ( COUNT < 2 )

UPDATE else

AVZER ( DBF ( 36 ) DBF ( 37 ) DBF ( 29 ) DBF ( 30 ) Λ DBF ( 34 ) DBF ( 35 ) )

AORDB ( DBF ( 9 > DBF ( 34 ) )

ROT_OUT if ( COUNT ( 4 )

UPDATE else

AFRUN ( DBF ( 9 ) , DBF ( 10 ) , DBF ( 11 ) , DBF ( 12 ) , Λ

DBF ( 13 ) DBF ( 14 ) , DBF ( 15 ) ) if ( COUNT < 7 )

UPDATE else

AABHI ( TOP , DBF ( 15 ) , 256. , 0 )

MVWDBY ( TOP , 0 , TOP , 256. )

UPDATE endif endif endif ptr ( LINE_REC ) += 256. loop end

define DOEDGE COUNT off INIT_DBF ; Initilixe AP DBF values ZERO_DBF READ INIT xvser ( WNDADR , 256. )

DOLINES ( 24. ) do 64 . , 832. WNDOFF := i MAPW ( WNDB ) ptr ( LINE_REC ) := WNDADR + 1024.

DOLINES ( 16. ) loop ( 64. )

WNDOFF := 896.

MAPW ( WNDB ) ptr ( LINE_REC ) := WNDADR + 1024.

DOLINES ( 19. ) iter 4

ROT_OUT

APRUN ( DBF ( 9 ) , DBF ( 10 ) , DBF ( 11 ) , DBF ( 12 ) , Λ

DBF ( 13 ) DBF ( 14 ) , DBF ( 15 ) )

AABHI ( TOP . DBF ( 15 ) , 256. , 0 )

MVWDBY ( TOP , 0 , TOP , 256. ) ptr ( LINE_REC ) += 256. loop iter 3

ROT_OUT

AABHI ( TOP , DBF ( 15 ) , 256. , 0 ) MVWDBY ( TOP , 0 , TOP , 256. ) ptr ( LINE_REC ) += 256. loop mvrer ( TOP , 256. )

end

<* Name : APDECL.MG

This routine sets up the buffers required by the AP . *> integer DBF ( 40 ) ; Data buffers coded as follows integer N ; Chaining counter integer FCBCHN ( 500. ) ;Chaining space record LINE_REC char TOP ( 256. ) dummy 1024. char BOT ( 256. ) endrecord

<* DBF ( I ) MEANING VALUE

DBF ( 0 ) DBMO 1

DBF ( 1 ) DBME 2

DBF ( 2 ) DBMO2 3

DBF ( 3 ) DBMO3 4

DBF ( 4 ) DBME2 5

DBF ( 5 ) DBME3 6

DBF ( 6 ) DBFTR 7

DBF ( 7 ) Chaining Buffer 8

DBF ( 8 ) Chaining Buffer 9

DBF ( 9 ) OUT1 10 )

DBF ( 10 ) OUT2 11 |

DBF ( 11 ) OUT3 12 |

DBF ( 12 ) OUT4 13 | <--- OUTPUT DATA

DBF ( 13 ) OUTS 14 |

DBF ( 14 ) OUT6 15 |

DBF ( 15 ) OUT7 16 ]

DBF ( 16 ) DBF1 17 ]

DBF ( 17 ) DBF2 18 |

DBF ( 18 ) DBF3 19 | <--- RAW DATA

DBF ( 19 ) DBF4 20 |

DBF ( 20 ) DBFS 21 ]

DBF ( 21 ) DBF6 22 ]

DBF ( 22 ) DBF7 23 |

DBF ( 23 ) DBF8 24 | <--- FILTERED DATA

DBF ( 24 ) DBF9 25 |

DBF ( 25 ) DBF10 26 ]

DBF ( 26 ) DBF11 27 ]

DBF ( 27 ) DBF12 28 |

DBF ( 28 ) DBF13 29 | < EDGE DATA

DBF ( 29 ) DBF14 30 |

DBF ( 30 ) DBF15 31 ]

DBF ( 31 ) DBFD 32

DBF ( 32 ) HZER1 33

DBF ( 33 ) HZERZ 34

DBF ( 34 ) ZER1 35

DBF ( 35 ) ZER2 36 DBF ( 36 ) VO1 37 DBF ( 37 ) VE1 38

*>

<* This routine initilises the data buffers in the AP with the first five lines of the raw image data *> define READ_INIT local integer DBF1

DBF1 := 17. ; AP raw data buffers with M _EDGE ptr ( LINE_REC ) : = WNDADR - 2304.

WNDOFF off

MAPW ( WNDB )

ACHN ( ptr ( N ) , FCBCHN , 500. ) Start chaining iter 5

AHIAB ( BOT , DBF ( 31 ) , 128. ) ; (LINE) — > DBF1

AUFAK ( DBF1 , DBF ( 31 ) )

ADNSN ( DBF1 ) ; Determine Normalizing Coeff.

ANRDB ( DBFl ) ; Normalize increment DBF1 ptr ( LINE_REC ) += 256. loop

ACEND ; End chaining

AHIAB ( FCBCHN , 8. , N ) AXCHN ( 8. ) ARLDB ( 8. ) end define ZERO_DBF

AZRDB ( DBF ( 34 ) ) AZRDB ( DBF ( 35 ) ) end

<* THE MAKE OF AP400 ARRAY PROCESSOR PRIMITIVES *> APUSH RADIX

OCTAL

MAKE 'AINIT RSXFUNC 34

; MAKE 'ARESET RSXFUNC 36

; MAKE 'AABRT RSXFUNC 40

MAKE 'ACEND RSXFUNC 42

MAKE 'ACHN RSXFUNC 44

; MAKE 'ACTL RSXFUNC 46

; MAKE 'ASETV RSXFUNC 50

; MAKE 'AWAIT RSXFUNC 52

MAKE 'AWFCB RSXFUNC 54

MAKE 'AXCHN RSXFUNC 56

MAKE 'AEXIT RSXFUNC 60

MAKE 'AABHI RSXFUNC 62

MAKE 'AHIAB RSXFUNC 64

MAKE 'ADNSN RSXFUNC 66

MAKE 'ANRDB RSXFUNC 70

MAKE 'AADD RSXFUNC 72

; MAKE ' AMUL RSXFUNC 74

; MAKE 'AFTR2 RSXFUNC 76

; MAKE ' AITR1 RSXFUNC 100

MAKE 'AALDB RSXFUNC 102

MAKE ' AZRDB RSXFUNC 104

; MAKE 'ASQRT RSXFUNC 106

MAKE 'AEXPE RSXFUNC 110

MAKE 'ARLDB RSXFUNC 112

MAKE 'ASUB RSXFUNC 114

MAKE 'AMULS RSXFUNC 116

MAKE 'ATFR1 RSXFUNC 120

MAKE 'ACONV RSXFUNC 122

MAKE 'AEDGE RSXFUNC 124

MAKE 'AMOVE RSXFUNC 126

MAKE 'ADETS RSXFUNC 130

MAKE 'ADBDB RSXFUNC 132

MAKE 'APRUN RSXFUNC 134

MAKE 'ASCDB RSXFUNC 136

MAKE 'AZERO RSXFUNC 140

MAKE ' AHZER RSXFUNC 142

MAKE 'AVZER RSXFUNC 144

MAKE 'AORDB RSXFUNC 146

MAKE 'AUPAK RSXFUNC 150

MAKE 'ASCR5 RSXFUNC 152

MAKE 'AHORZ RSXFUNC 154

MAKE 'AVERZ RSXFUNC 156

MAKE 'AVCON RSXFUNC 160

APOP .TITLE LIBRARY ROUTINES FOR AP400 FUNTIONS . IDENT/01/ ; ; FUNCTION. ALLOWS THE AP400 FUNCTIONS TO BE CALLED FROM MAGIC ; ; AUTHOR : CHETANA BUCH ; ;DATE: AUG 9, 1982 ; ;REVISIONS: ; ; .SBTTL VARIABLE STORAGE FOR CALL ARGUMENTS .PSECT APDATA.D.RW ; ; ; INTERFACE BETWEEN MAGIC /L AND FORTRAN CALLING SEQUENCE

ARGLST; .BLKW ΛD 10 ARGUMENT LIST ( POINTERS ) MGLST: .BLKW ΛDIO ARGUMENT LIST ( VALUES ) SAVERS: .WORD 0 TEMPORARY STORAGE FOR R5 ;

.SBTTL MAGIC/L CALLABLE AP400 ROUTINES .PSECT APCODE ; ; ;AP RESOURCE MANAGEMENT ROUTINES ; .GLOBL KINIT

;

AINIT JSR R0 ,SAVR SAVE REGISTERS

MOV #0 ,R0 ;# OF ARGS

JSR PC,APMG1 ;SET INTERFACE

JSR PC,KINIT

JSR R0 , RSTOR ;RESTORE REGISTERS

RTS PC ; ; ; ; .GLOBL KLOAD ; ; ALOAD: : JSR R0 ,SAVR ; SAVE REGISTERS ; MOV #2,R0 ;# OF ARGUMENTS ; JSR PC,APMG4 SET INTERFACE ; JSR PC, KLOAD ; JSR RO, RSTOR RESTORE REGISTERS ; RTS PC ; ; ;

.GLOBL KRESET ;

ARESET: : JSR RO , SAVR ; SAVE REGISTERS MOV #0 , R0 ;# OF ARGS JSR P C , APMG1 ;SET INTERFACE JSR PC , KRESET JSR R0 ,RSTOR ;RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KABRT ;

AABRT: : JSR R0 ,SAVR ;SAVE REGISTERS

MOV #0 ,R0 ;# OF ARGUMENTS

JSR PC.APMG1 ; SET INTERFACE

JSR PC, KABRT ;

JSR RO , RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

GLOBL KCEND ;

ACEND: : JSR R0 ,SAVR ; SAVE REGISTERS

MOV #0 ,R0 ; # OF ARGUMENTS

JSR PCAPMG1 ;SET INTERFACE

JSR PC, KCEND ;

JSR RO .RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KCHN ;

ACHN: JSR RO ,SAVR SAVE REGISTERS

MOV • 3 ,R0 • OF ARGS

JSR PC ,APMG2 SET INTERFACE

JSR PC, KCHN

JSR RO .RSTOR RESTORE REGISTERS

RTS PC ; ;

.GLOBL KCTL ;

ACTL: JSR RO, ΞAVR SAVE REGISTERS

MOV tl ,RO • OF ARGS

JSR PCAPMG2 SET INTERFACE

JSR PC, KCTL

JSR RO , RSTOR .RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KSETW ,

ASETW: : JSR R0 ,SAVR ;SAVE REGISTERS MOV # 1 ,R0 ;# OF ARGS JSR PCAPMG2 ;SET INTERFACE JSR PC,KSETW ;

JSR RO,RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KWAIT ;

AWAIT: : JSR R0 , SAVR ; SAVE REGISTERS

MOV # 0 ,R0 ;# OF ARGS

JSR PC,APMG1 ;SET INTERFACE

JSR PC, KWAIT ;

JSR R0 , RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KWFCB ;

AWFCB : JSR R0 , SAVR ; SAVE REGISTERS

MOV #l ,R0 ;# OF ARGS

JSR PC , APMG2 ; SET INTERFACE

JSR PC , KWFCB ;

JSR R0 , RSTOR ; RESTORE REGISTERS

RTS PC

;

.GLOBL KXCHN ;

AXCHN: : JSR R0 ,SAVR ; SAVE REGISTERS

MOV #1 ,R0 ;# OF ARGS

JSR PC ,APMG1 ; SET INTERFACE

JSR PC, KXCHN ;

JSR RO , RSTOR ; RESTORE REGISTERS

RTS PC

; ; ;

.GLOBL KEXIT ;

AEXIT: : JSR R0 , SAVR ;SAVE REGISTERS

MOV #0 ,R0 ;# OF ARGS

JSR PC,APMG1 ; SET INTERFACE

JSR PC, KEXIT

JSR R0 ,RSTOR ;RESTORE REGISTERS

RTS PC ; ; ; ; AP DATA MEMORY DATA BUFFER MANAGEMENT ROUTINES ; .GLOBL KALDB ; AALDB: : JSR R0 , SAVR ;SAVE REGISTERS

MOV #2 ,R0 ; # OF ARGS

JSR PC , APMC1 ; SET INTERFACE

JSR PC ,KALDB ;

JSR R0 , RSTOR ; RESTORE REEGISTERS

RTS PC

.GLOBL KRLOB

ARLDB : : JSR R0 ,SAVR ; SAVE REGISTERS

MOV #1 ,R0 ; # OF ARGS

JSR PC , APMG1 ;SET INTERFACE

JSR PC,KRLDB ;

JSR R0 , RSTOR ; RESTORE REGISTERS

RTS PC

.GLOBL KDBTS ADBTS: : JSR R0 ,SAVR ; SAVE REGISTERS

MOV #1 ,R0 ;# OF ARGS

JSR PC,APMG1 ;SET INTERFACE

JSR PC, KDBTS ;

JSR R0 ,RSTOR ; RESTORE REGISTERS

RTS PC

DATA TRANSFER ROUTINES

.GLOBL KABHI

AABHI :: JSR R0.SAVR ; SAVE REGISTERS

MOV #4 ,R0 ;# OF ARGS

JSR PC,APMG3 ;SET INTERFACE

JSR PC, KABHI ;

JSR R0 , RSTOR ; RESTORE REGISTERS

RTS PC

.GLOBL KHlAB

AHIAB: : JSR R0 ,SAVR ; SAVE REGISTERS

MOV #3 ,R0 ; # OF ARGS

JSR PC,APMG3 ;SET INTERFACE

JSR PC,KHIAB ;

JSR R0 ,RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KMOVE ;

AMOVE : : JSR R0 ,SAVR ; SAVE REGISTERS

MOV #3 ,R0 ;# OF ARGS

JSR PC,APMG1 ; SET INTERFACE

JSR PC, KMOVE ;

JSR R0 ,RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

,LOGICAL DATA MANIPULATION ROUTINES ; .GLOBL KDNSN ;

ADNSN: : JSR R0 ,SAVR ; SAVE REGISTERS

MOV #1 ,R0 ; # OF ARGS

JSR PC.APMG1 ;SET INTERFACE

JSR PC, KDNSN ;

JSR RO .RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

GLOBL KNRDB ;

ANRDB:: JSR R0.SAVR ; SAVE REGISTERS

MOV #1 ,R0 ;# OF ARGS

JSR PC,APMG1 ; SET INTERFACE

JSR PC,KNRDB ;

JSR RO ,RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KZRDB ;

AZRDB : : JSR R0.SAVR ; SAVE REGISTERS

MOV #1 ,R0 ;# OF ARGS

JSR PC,APMG1 ;SET INTERFACE

JSR PC, KZRDB ;

JSR RO , RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KDBDB ;

ADBDB: : JSR RO ,SAVR ; SAVE REGISTERS

MOV #2,R0 ; # OF ARGS

JSR PC,APMG1 ;SET INTERFACE

JSR PC, KDBDB ;

JSR R0 ,RSTOR ; RESTOHE REGISTERS RTS PC ; ; ; ; COMPUTATION ROUTINES ;

.GLOBL KSCDB ;

ASCDB : : JSR RO ,SAVR SAVB REGISTERS

MOV # 2 ,R0 # OF ARGS

JSR PC , APMG1 SET INTERFACE

JSR PC, KSCDB

JSR RO ,RSTOR RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KTFR1 ;

ATFR1 : : JSR R0 ,SAVR ; SAVE REEGISTERS

MOV #3 ,R0 ;# OF ARGS

JSR PC,APMG1 ; SET INTERFACE

JSR PC,KTFR1 ;

JSR R0 , RSTOR ; RESTORE REGISTERS

RTS PC ; ;

;

.GLOBL KCONV ;

ACONV : : JSR R0 , SAVR ; SAVE REGISTERS

MOV # 3 ,R0 ;# OF ARGS

JSR PC,,APMG1 ; SET INTERFACE

JSR PC, KCONV ;

JSR R0 ,RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KEDGE ;

AEDGE : : JSR RO ,SAVR ; SAVE REGISTERS

MOV # 5 ,R0 ; # OF ARGS

JSR PC.APMG1 ;SET INTERFACE

JSR PC, KEDGE ;

JSR RO .RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KZERO ;

AZERO: : JSR R0 ,SAVR ;SAVE REGISTERS MOV #S ,R0 ; # OF ARGS JSR PC,APMG1 ;SET INTERFACE

JSR PC,KZERO ;

JSR R0 ,RSTOR ;RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KPRUN ;

APRUN: JSR R0 ,SAVR ; SAVE REGISTERS

MOV #7,R0 ;# OF ARGS

JSR PC,APMG1 ; SET INTERFACE

JSR PC, KPRUN ;

JSR R0 , RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

GLOBL KHZER ;

AHZER:: JSR R0,SAVR ;SAVE REGISTERS

MOV #3 ,R0 ; # OF ARGS

JSR PC ,APMG1 ;set interface

JSR PC ,KHZER ;

JSR R0 ,RSTOR ;RESTORE REGISTERS

RTS PC ;

; ; .GLOBL KVZER ;

AVZER: : JSR R0,SAVR ; SAVE REGISTERS

MOV # 6 ,R0 ; # OF ARGS

JSR PC,APMG1 ;SET INTERFACE

JSR PC,KVZER ;

JSR R0 ,RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KORDB ;

AORDB : JSR R0 ,SAVR ; SAVE REGISTERS

MOV #2 ,R0 ; # OF ARGS

JSR PC,APMG1 ;set INTERFACE

JSR PC ,KORDB ;

JSR R0 , RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KUPAK ;

AUPAK : : JSR R0 , SAVR ;SAVE REGISTERS

MOV #2 ,R0 ;# OF ARGS JSR PC , APMG1 ; SET INTERFACE

JSR PC ,KUPAK ;

JSR R0 ,RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KSUB ;

ASUB : JSR RO , SAVR ; SAVE REGISTERS

MOV #3 ,RO ;# OF ARGS

JSR PC, ,APMG1 ; SET INTERFACE

JSR PC ,KSUB ;

JSR R0 , RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KMULS ;

AMULS: : JSR R0 , SAVR ; SAVE REEGISTERS

MOV #3 ,R0 ;# OF ARGS

JSR PC , APMG1 ; SET INTERFACE

JSR PC , KMULS ;

JSR R0 , RSTOR ; RESTORE REGISTERS

RTS PC ;

; ;

.GLOBL KADD ;

AADD: JSR RO ,SAVR ; SAVE REGISTERS

MOV #3 ,R0 ; # OF ARGS

JSR PC, APMG1 ; SET INTERFACE

JSR PC, KADD ;

JSR R0,RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

. GLOBL KMUL ;

AMUL: JSR R0 ,SAVR ; SAVE REGISTERS

MOV #3 ,R0 ; # OF ARGS

JSR PC ,APMG1 ;SET INTERFACE

JSR PC,KMUL ;

JSR R0 ,RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KSQRT ;

ASORT: JSR R0,SAVR ;SAVE REGISTERS MOV #2 ,R0 ;# OF ARGS

JSR PC,APMG1 ; SET INTERFACE

JSR PC ,KSQRT ;

JSR R0 ,RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KEXPE ;

AEXFE: : JSR R0 ,SAVR ; SAVE REGISTERS

MOV #2 ,R0 ; # OF ARGS

JSR PC, APMG1 ;SET INTERFACE

JSR PC ,KEXPE ;

JSR R0 , RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KFTR2 ;

AFTR2: : JSR R0 ,SAVR ; SAVE REGISTERS

MOV #3 ,R0 ; # OF ARGS

JSR PC, APMG1 ;SET INTERFACE

JSR PCKFTR2 ;

JSR RO , RSTOR ; RESTORE REGISTERS

RTS PC ; ; ;

.GLOBL KITR1 ;

AITRl:: JSR R0 ,SAVR ,SAVE REGISTERS

MOV #3,R0 ; # OF ARGS

JSR PC, APMG1 ; SET INTERFACE

JSR PC,KITRl ;

JSR R0 ,RSTOR ; RESTORE REGISTERS

RTS PC ; ; ; ; SERVICE SUBROUTINES ; ; SAVE ALL REGSTERS ; SAVR: MOV R2,-(SP)

MOV R3,-(SP)

MOV R4 ,-(SF)

JMP (R0) ; ; ; RESTORS ALL REGISTERS ; RSTOR : TST (SP) +

MOV (SP)+,R4

MOV (SP)+,R3

MOV (SP)+,R2

MOV #-1 ,R1 ;REQ BY MAGIC

MOV SAVERS ,R5 ; RESTORE RS

RTS R0 ; ; ; ; MAGIC/L INTERFACE SETUP ROUTINES ; , THIS ROUTINE IS CALLED FOR ALL FUNCTIONS WHOSE CALL STATEMENT ; ARGUMENTS ARE OF THE FOLLOWING TYPE : ; ( NO ARGUMENT ) ; ( VAL ) ; ( VAL, VAL ) , ( VAL, VAL, VAL ) ; ( VAL, VAL, VAL, VAL ) ; WHERE VAL IS ANY INTEGER VALUE. ;

APMG1 : MOV R0 ARGLST : SET # OF ARGS

TST R0 ; # OF ARGS

BED 2s ; IF ZERO, TRANSFER CONTROL WITHOUT CHANGE

MOV RO R1

ASL R1 ;*2 FOR WORD ALLIGNMENT

ADD #ARGLST+2 ,R1 ;R1 POINTS TO ONEAFTER BOTTOM OF ARG PTR LI ST

MOV #MGLST,R2 ; R2 POINTS TO THE ARGUMENT LIST ( MAGIC CALL )

1S : MOV R2 ,-(R1 ) ;POINTER SET UP

MOV (R5)+, (R2)+ ;ARGUMENT SET UP

DEC R0

BGT 1S

2S: MOV RS ,SAVER5 ;SAVE RS

MOV #ARGLST.R5 ;FORTRAN CALL SET UP

RTS PC ; ; ; ; ; THIS ROUTINE IS CALLED BY FUNCTIONS WHOSE CALL STATEMENT ;ARGUMENTS ARE OF THE FOLLOWING TYPE: ; ( ADDR ) ; ( ADDR, ADDR ) ; ( ADDR, ADDR, VAL ) ; WHEHE ADDR IS A HOST MEMORY ADDRESS ;

APMG2 : MOV R0 ,ARGLST ;SET # OF ARGUMENTS

MOV R0,R1

ADD #-2,R1 ;TST # OF ARGS

BLE 1S

DEC R0

MOV #MGLST. ARGLST+ 6 ; SET PTR TO VAL

MOV (R5 ) + .MGLST

1S : DEC R0 BEQ 2S ; IF 1 ARG , NO CHANGE

MOV (R5 )+,ARGLST+4 ; INTERCHANGE ARGUMENT ADDRESSES ;MAGIC CALL R5 POINTS TO LAST ARG

2S : MOV (R5)+,ARGLST+2 ;FORTRAN CALL SETUP

MOV R5 ,SAVER5 ; SAVE R5

MOV #ARGLST,R5

RTS PC ; ; ; ; THIS ROUTINE IS CALLED BY FUNCTIONS WHOSE CALL STATEMENT ARGUMENTS ARE OF THE FOLLOWING TYPE: ; ( ADDR, VAL, VAL ) ; ( ADDR, VAL, VAL, VAL ) ; WHERE ADDR IS A HOST MEMORY ADDRESS ; AND VAL IS ANY INTEGER VALUE ;

APMG3 : MOV R0, ARGLST ;SET # OF ARGUMENTS

MOV R0,R1

ASL R1 ;*2 FOR WORD ALLIGNMENT

ADD #ARGLST+2,R1 ;R1 POINTS TO ONE AFTER THE BOTTOM OF

;ARG PTR LIST ( FORTRAN CALL )

MOV #MGLST,R2 ;R2 POINTS TO ARG LIST (MAGIC CALL )

DEC R0

1S : MOV R2,-(R1 ) ;ARG PTR SET UP

MOV (R5)+, (R2)+ ;ARG SET UP

DEC R0

BGT 1S

MOV (R5 )+,-(R1)

MOV RS ,SAVERS ;SAVE R5

MOV #ARGLST,R5 ; FORTRAN CALL SET UP

RTS PC ; ; ; ; ; THIS ROUTINE IS CALLED BY FUNCTIONS WHOSE CALL STATEMENT HAS ; ARGUMENTS OF THE FOLLOWING TYPE. ; ( VAL,ADDR ) ; (VAL, ADDR, VAL ) ; WHERE ADDR IS A HOST MEMORY ADDRESS ; AND VAL IS ANY INTEGER VALUE ;

APMG4: MOV R0.ARGLST SET # OF ARGUMENTS

ADD #-2,R0 CHECK # OF ARGS

BEQ 1S FOR 2 ARGS

MOV #MGLST,ARGLST+4 SET PTR LIST

MOV (R5)+,MGLST

1S : MOV (R5 )+,ARGLST+4 ;SET ADDRESS VALUE

MOV #MGLST+2 , ARGLST+2

MOV (R5)+,MGLST+2

MOV R5 ,SAVER5 ;SAVE R5

MOV #ARGLST,R5 ; FORTRAN CALL SET UP RTS PC

END

.NLIST TTM ;PRODUCE LISTING IN WIDE STYLE. . ENABL LC ;RETAIN LOWER-CASE CHARACTERS AS SUCH.

PROGRAM: HSTFNC . VECTOR ADD (REAL OR COMPLEX) PART NUMBER: VERSION DATE: AUGUST 25, 1982 AUTHOR: CHETANA BUCH HISTORY: DESCRIPTION: THIS FORTRAN-CALLABLE HOST FUNCTION CALLS UP AN AP-BASED AP FUNCTION IN ORDER TO PERFORM A "TIME DOMAIN CONVOLUTI

ON"

BFTWEEN THE RESPECTIVE ELEMENTS OF TWO AP DATA MEMORY DATA BUFFERS. ONE CONTAINS THB SIGNAL AND THE OTHER THE FILTER (MASK).

.TITLE KCONV - HSTFNC: TIME CONVOLUTION

.IDENT /V01/ ; IDENTIFIER FOR THE OBJECT MODULE. . PAGE

;ESTABLISH ASSEMBLY AND LISTING CONVENTIONS:

.NLIST TTM ;PRODUCE LISTING IN WIDE STYLE.

.DSABL GBL -FLAG NON-EXISTENT-SYMBOL REFFRENCES AS ERRORS

. ENABL LC ;RETAIN LOWER-CASE CHARACTERS AS SUCH.

.CSECT KCONV ; ESTABLISH A NAMED CSECT.

INTERNALLY DEFINED GLOBALIZED SYMBOLS: .GLOBL KCONV

;EXTERNALLY DEFINED GLOBALIZED SYMBOLS:

.GLOBL KEXFCB ; AP MANAGER'S "FCB EXECUTION" SUBROUTINE.

.GLOBL KWAIT ; AP MANAGER'S WAIT ROUTINE

.GLOBL MGRM67 ; AP MANAGER'S "FATAL ERROR #-67" EXIT ROUTINE.

.GLOBL COMCTL ; AP MANAGER'S "FCB CONTROL WORD".

;AP FUNCTION ID'S REFERENCED :

CONV = 802. ; ID FOR "TIME CONVOLUTION".

; SYMBOL DEFINITIONS: ;NONE

.TERMINOLOGY: ; FCB - FUNCTION CONTROL BLOCK, READ BY THE AP EXECUTIVE FROM HOST MEMORY .

.PAGE )+HOST FUNCTION "KCONV"

;THIS HOST FUNCTION CALLS UP A CORRESPONDING AP FUNCTION IN THE AP400.

;THIS HOST FUNCTION VERSION ASSUMBS THAT SOURCE DATA ALREADY RESIDES IN TWO AP;DATA MEMORY DATA BUFFERS, AND THAT THE RESULT DATA WILL BE PLACED IN ANOTHER

;AP DATA MEMORY DATA BUFFER .

;THE MAXIMUM MASK ( FILTER ) SIZE HANDLED BY THIS ROUTINE IS EIGHT POINTS. IF;FILTER IS SMALLER, THE REMAINING BUFFER MUST CONTAIN ZEROS ;THE TWO POINTS AT BOTH ENDS OF RESULT WILL CONTAIN ZEROS.

;THE CORRESPONDING "TIME CONVOLUTION" AP FUNCTION SHOULD BE ;REFERENCED FOR FURTHER INFORMATION. ; CALL FROM FORTRAN VIA: ; SUBROUTINE CALL: CALL KCONV( DBIa, DBIb, DBIc ) ; OR INTEGER FUNCTION CALL, AS: IERR = KCONV ( DBIa, DBIb, DBIc ) ;WHERE: ; DBIa = ID OF AP DATA BUFFER TO HOLD RESULT DATA. ; "DBIa" MUST BE A SINGLE-WORD INTEGER VARIABLE OR CONSTANT. ; DBF NEED NOT HAVE BEEN PREVIOUSLY ALLOCATED. ; IF NOT ALREADY ALLOCATED, DBF WILL BE ALLOCATED; SIZE WILL EQUAL ; THAT OF SOURCE DATA BUFFERS. ; IF RESULT DBF WAS PREVIOUSLY ALLOCATED, IT MUST BE OF SIZE EQUAL ; OR GREATER THAN SOURCE DATA BUFFERS. ; DBIb = ID OF AP DATA BUFFER HOLDING SIGNAL DATA SET. ; "DBIb" MUST BE A SINGLE-WORD INTEGER VARIABLE OR CONSTANT. ; DBF MUST HAVE BEEN PREVIOUSLY ALLOCATED IN AP DATA MEMORY. ; DBIc = ID OF AP DATA BUFFER HOLDING MASK ( FILTER ) DATA SET. ; "DBIc" MUST BE A SINGLE-WORD INTEGER VARIABLE OR CONSTANT. ; DBF MUST HAVE BEEN PREVIOUSLY ALLOCATED IN AP DATA MEMORY. ; IF LESS THAN 8 PTS.,THE REMAINING BUFFER SHOULD BE ZEROED. ;RETURNS TO FORTRAN WITH: ; ALL ARGUMENTS RETURNED AS RECEIVED. ; FUNCTION EXECUTION "IN PROGRESS" OR "COMPLETE", DEPENDING UPON CURRENT

; AP MANAGER "RETURN" STATUS. ; IF CALLED AS A FORTRAN FUNCTION, THE VALUE RETURNED WILL BE AS SPECIFIED; FOR REGISTER "R0", RETURNED FROM AN ASSEMBLY-LANGUAGE CALL. ; UPON ERROR, A STANDARD AP MANAGER ERROR EXIT WILL BE TAKEN. ; CALL FROM PDP-11 ASSEMBLY LANGUAGE VIA: ; A FORTRAN-COMPATIBLE CALL SEQUENCE. ;RETURNS TO CALL+1: (ALWAYS) ; ALL CONDITIONS AS DESCRIBED FOR THE FORTRAN FUNCTION CALL FORM, ABOVE.; R0 = STATUS VALUE. (DEFINED BY AP MANAGER.) ; "KCONV" DEFINES NO UNIQUE VALUES. ; R1 = UNDEFINED. ; R2 = UNDEFINED. ; R5 = UNDEFINED. ;UPON ERROR, WHEN CALLED FROM FORTRAN OR ASSEMBLY LANGUAGE: ; IF A FATAL BRROR OCCURS DURING EXECUTION OF THIS HOST FUNCTION OR DURING; EXECUTION OF A ROUTINE WHICH IT (IN TURN) CALLS (SUCH AS THE AP MANAGER ; OR AP DRIVER), THE AP MANAGER'S FATAL ERROR EXIT ROUTINE WILL BE CALLED.;>- .PAGE

KCONV:

CMPB (R5), #3 ; CHECK FOR PROPER NUMBER OF ARGUMENTS. BNE ERRORX ; IF NOT CORRECT NUMBER, HANDLE AS A FATAL ERROR.

TST (R5) + ;STEP POINTER AHEAD TO FIRST ARGUMENT ADDRESS.

TST FCBDON ; TEST FOR COMPLETION OF A PREVIOUS OPERATION

BNE 1S ;A ZERO "DONE" FLAG INDICATES PREVIOUS OPERATION ; STILL IN PROGRESS.

JSR PC, KWAIT WAIT FOR THE AP TO FINISH PROCESSING

1S : CLR FCBDON ; REINITIALIZE THE "DONE" FLAG.

MOV COMCTL, FCBCTL ; RETRIEVE AP MANAGER'S COMMON CONTROL WORD IN ; ORDER TO UTILIZE CURRENTLY-SELECTED OPTIONS ; PLACE IT IN FCB'S CONTROL WORD.

MOV @(RS)+, FCBARL ;MOVE RESULT DATA BUFFER ID "A" INTO FCB

; ARGUMENT LIST.

; STEP HOST MEMORY ADDRESS POINTER AHEAD.

MOV @(R5)+, FCBARL+4 ;MOVE SOURCE DATA BUFFER ID "B" INTO FCB

; ARGUMENT LIST. ; STEP HOST MEMORY ADDRESS POINTER AHEAD .

MOV @(R5)+, FCBARL+8 ;MOVB SOURCE DATA BUFFER ID "C" INTO FCB

; ARGUMENT LIST.

; ( INCREMENTING R5 , ALTHOUGH UNNECESSARY, SAVES ; EXECUTION TIME AND ONE MEMORY WORD.)

MOV #MGRARG, R5 ; SET UP ADDRESS OF ARGUMENT LIST FOR CALL TO AP ; MANAGER .

JMP KEXFCB ;CALL UP THE AP MANAGER TO PROCESS THE FCB. ; A DIRECT BRANCH IS THE EQUIVALENT OF A "JSP", ; FOLLOWED BY AN "RTS PC". ; "KEXFCB" WILL RETURN ITS STATUS VALUE IN ; PDP-11 REGISTER R0 AS WELL AS IN LOCATION ; "STATUS".

MGRARG : BR 2S ;BRANCH AROUND ARGUMENT LIST. (THIS INSTRUCTION ; PROVIDES "NUMBER OF ARGUMENTS" COUNT FOR AP ; MANAGER; THF BRANCH IS NEVER ACTUALLY TAKEN . )

.WORD FCBBLK ;ADDRESS OF FCB.

.WORD STATUS ;ADDRESS FOR RETURNED STATUS.

2S : ;THIS LABEL MARKS THE END OF THE ARGUMENT LIST.

ERRORX: JMP MCRM67 ;TAKE AN AP MANAGER STANDARD FATAL ERROR EXIT. ; RETURN STATUS CODE -47 TO INDICATE "IMPROPER ; NUMBER OF ARGUMENTS IN PARAMETER LIST".

STATUS : .WORD 0 ;TEMPORARY STORAGE LOCATION FOR RETURNED AP ; MANAGER STATUS.

.PAGE ;FUNCTION CONTROL BLOCK: FCBBLK:

FCBID. .WORD CONV ; ID OF THE AP FUNCTION.

FCBCTL: .WORD 0 ; CONTROL WORD.

FCBDON: .WORD 1 ; DONB FLAG. INITIALIZED TO "DONE" STATE.

FCBLNK: .WORD 0 ; (HIGH-ORDER.) HOST MEMORY ADDRESS LINK TO NEXT

.WORD 0 ; (LOW-ORDER.) FCB IN HOST MEMORY. (NONE.)

FCBPLT: _. WORD 1 ; FCB PARAMETER LIST TYPE. (DATA BUFFER ID'S.)

FC8NRG: .WORD 3 ; NUMBER OF ENTRIES IN ARGUMENT LIST.

FCBLEN: .WORD 6 ; LENGTH OF ARGUMENT LIST IN HOST MEMORY WORDS.

FCBARL. .WORD 0 ;RESULT DATA BUFFER ID 'A" ARGUMENT.

.WORD 0 ; FIRST WORD - DBF ID; SECOND WORD = 0.

.WORD 0 ; SIGNAL DATA BUFFER ID "B" ARGUMENT.

.WORD 0 ; FIRST WORD = DBF ID; SBCOND WORD = 0.

.WORD 0 ;FILTER DATA BUFFER ID "C" ARGUMENT.

.WORD 0 ; FIRST WORD « DBF ID; SECOND WORD = 0..

.END

PROGRAM: APFNC : TIME CONVOLUTION

PART NUMBER:

VERSION DATE: AUGUST 25, 1982

AUTHORS: CHETANA BUCH

HISTORY:

DESCRIPTION: THIS AP-BASED AP FUNCTION PERFORMS A TIME DOMAIN CONVOLU

TION

OF A SIGNAL WITH A FILTER OF MAXIMUM SIX POINTS

THIS AP FUNCTION IS NORMALLY CALLED UP BY THE AP EXECUTIVE, WHICH RETRIEVES THIS AP FUNCTION'S ID NUMBER FROM A FUNCTION CONTROL BLOCK READ FROM HOST MEMORY.

TITLE APFNC: TIME CONVOLUTION

NAME QCONV, 001 ; NAME AND VERSION FOR THE OBJECT MODULE. PAGE

RADIX H ;DEFAULT TO HEXADECIMAL RADIX.

; INTERNALLY DEFINED GLOBALIZED SYMBOLS: (IGLOBL)

; ENTRY POINTS:

;NONE ; SUBROUTINES:

; NONE ; GENERAL SYMBOLS

;NONE ; DATA MEMORY LABELS : ;NONE ; EXTERNALLY DEFINED GLOBALIZED SYMBOLS: (EGLOBL)

ENTRY POINTS:

;NONE ; SUBROUTINES :

EGLOBL FLSICE, ADDI1, FLSHAP , CETLZC. NRMCND ; GENERAL SYMBOLS: ;NONE ; DATA MEMORY LABELS :

;NONE

;SYMBOL DEFINITIONS: ;NONE

;TERMINOLOGY: ;NONE PAGE

PMORG ; START OF RELOCATABLE CODE IN PROGRAM MEMORY.

;>+AP FUNCTION "QCONV"

;; This AP function performs the time convolution. ; Call with : parameter list type = 1 , number of arguments ; parameter list length = 6 . ; word 9 argument #1 = ID of result Data Buffer "A" ; word 10 argument #1 = Ignored . ; word 11 argument #2 = ID of source Data Buffer "B" ; word 12 argument 12 = Ignored . ; word 13 argument #3 = ID of source Data Buffer "C" ; word 14 argument #3 = Ignored .

; Exits to AP Executive's "Fatal Abort" Service:

, If an error is found by AP Service Subroutine 'PLS1CE'. ; >-

PAGE

;DEFINITION OF THE FUNCTION ID FOR THE AP EXECUTIVE FUNCTION TABLE:

FUNC %D802 , QCONV ;FUNCTION ID AND ENTRY POINT NAME .

PCLRAC: EQU %D32 ; CLEAR ACC IN PIPE PAC ID.

PCONVS: .EQU %DS2 ;CONVOLUTION (INITIAL) PAC ID.

PCONVT: EQU %D83 ; CONVOLUTION (ITERATIVE) PAC ID.

QCONV:

JSR PLS1CE ; GO CHECK CORRECTNESS OF VALUES IN FCB, ; FIND SOURCE DATA BUFFERS. ; ALLOCATB RESULT DBF IF NECESSARY, ; SET UP ARGUMENTS FOR A FUNCTION ADDR CALL. ; UPON ERROR, EXIT THROUGH AP EXECUTIVE'S ; FATAL ABORT ROUTINE .

JSR ADD 11 ; FORM AND STORE RESULT BEX AND NSN ;

SET R2=R8+1 ; PTR TO FIRST RESULT DATA

SETR R3=0 ;

STREGI R3 ,R2 ; WRITE ZERO IN FIRST TWO PLACES

STREG R3 ,R2

SET R2=R2-1

SET R2=R2+R9 ; PTR TO LAST+1 RESULT DATA

STREGD R3 ,R2 ;WRITE ZERO IN LAST TWO PLACES

STREGD R3 ,R2 ; MOVE RECSCL.R3 ;CLEAR SCL/LZC REGISTER

SET R10=R9-4 ; COUNT REGISTER

SET R11=R7-1 ;INITIALIZE SIGNAL DATA POINTER

SET R13=R8+2 ; INITIALIZE RESULT DATA POINTER

AGAIN: SET R12=R6+1 ; INITIALIZE FILTER DATA POINTER

PIPE PCLRAC.SCLO, , LZCOFF ; CLEAR PIPE ACCUMULATORS

PAD R3-R3

FAD ;NOT USED

PAD ;NOT USED

PAD ;NOT USED

SETR R2-2

PIPE PCONVS.SCLO, LZCOFF ;CONV ( FOUR POINTS ) PAD R11 =R11+R2, S1

PAD R11=R11+R2 , S2 PAD R12=R12.S3 PAD R12=R12+R2,S4

PIPE PCONVT.SCL0.LZC2 ; REMAINING POINTS CONV

PAD R11=R11+R2,S1

PAD R13=R13+1 ,D2R

PAD R12=R12+R2,S3

FAD R12=R12+R2,S4

SET R11=R11-5 ; REINITIALIZE SIGNAL DATA PTR

DBNZ R10, AGAIN ; REPEAT UNTILL ALL DATA DONE

JSR FLSHAP ;FLUSH PIPELINE

JSR GETLZC ;UPDATE NSN OF RESULT

JMP NRMCND ; GO TO NORMALIZE THE RESULT DATA. IF FCB CONTROL ; BIT INDICATES SUCH REQUIREMENT. ; A DIRECT BRANCH IS THB EQUIVALENT OF A "JSR" ; FOLLOWED BY AN "RTN" .

END

. NL I ST TTM ; PRODUCE LISTING IN WIDE STYLE . .ENABL LC ;RETAIN LOWER-CASE CHARACTERS AS SUCH.

; PROGRAM: HSTFNC : EDGE PRUNING

; PART NUMBER:

; VERSION DATE: SEPTEMBER 1, 1982

; AUTHOR : CHETANA SUCH

; HISTORY:

; DESCRIPTION: THIS FORTRAN-CALLABLE HOST FUNCTION CALLS UP AN AP-BASED

AP FUNCTION IN ORDER TO PERFORM "EDGE PRUNING"

.TITLE KPRUN HSTFNC: EDGE PRUNING . IDENT /V01/ ;IDENTIFIER FOR THE OBJECT MODULE.

.PAGE ; ESTABLISH ASSEMBLY AND LISTING CONVENTIONS:

NLIST TTM ; PRODUCE LISTING IN WIDE STYLE.

DSABL GEL ; FLAG NON-EXISTENT-SYMBOL REFERENCES AS ERRORS.

ENABL LC ; RETAIN LOWER-CASE CHARACTERS AS SUCH.

CSECT KPRUN ; ESTABLISH A NAMED CSECT.

; INTERNALLY DEFINFD GLOBALIZBD SYMBOLS: .GLOBL KPRUN

;EXTERNALLY DEFINED GLOBALIZED SYMBOLS:

.GLOBL KEXFCB ; AP MANAGER'S "FCB EXECUTION" SUBROUTINE.

.GLOBL KWAIT ; AP MANAGER'S WAIT ROUTINE

.GLOBL MGRM67 ; AP MANACER'S "FATAL ERROR #-67" EXIT ROUTINE.

.GLOBL COMCTL ; AP MANAGER'S "FCB CONTROL WORD".

;AP FUNCTION ID'S RFFFRENCED:

PRUN . 806. ;ID FOR "VECTOR ADD (REAL OR COMPLEX)".

; SYMBOL DEFINITIONS: ;NONE

;TERMINOLOGY: ; FCB - FUNCTION CONTROL BLOCK, RBAD BY THE AP EXECUTIVE FROM HOST ; MEMORY .

.PAGE , >+HOST FUNCTION "KPRUN"

;THIS HOST FUNCTION CALLS UP A CORRSSPONDING AP FUNCTION IN THE AP400

;THIS HOST FUNCTION VERSION ASSUMES THAT SOURCE DATA ALREADY RESIDES IN SEVEN AP

;DATA MEMORY DATA BUFFERS, AND THAT THE PRUNING WILL BE DONE ON DATA IN THE FOUR

TH

;AP DATA MEMORY DATA BUFFER.

;THE CORRESPONDING "EDGE PRUNING" AP FUNCTION SHOULD BE .REFERENCED FOR FURTHER INFORMATION.

;CALL FROM FORTRAN VIA. ; SUBROUTINE CALL : CALL KPRUN ( DBIa.. DBIb, .. DBIg )

; OR INTEGER FUNCTION CALL, AS: IERR KADD ( DBIa, DBIb, . .. DBIg )

;WHERE: ; DBIa, DBIb, DBIc ...DBIg = ; ; ID OF AP DATA BUFFERS WHICH HOLD RESULT EDGE ; INFORMATION OF SFVEN CONSECUTIVE IMAGE LINES. DBId WILL HOLD; THE INFORMATION WHICH WILL BE THE FOCUS OF THIS PRUNER. ; . "DBIx" MUST BE A SINGLE-WORD INTEGER VARIABLE OR CONSTANT. ; DBF MUST HAVE BEEN PREVIOUSLY ALLOCATED. ; ; RETURNS TO FORTRAN WITH: ; ALL ARGUMENTS RETURNED AS RECEiVED. ; FUNCTION EXECUTION "IN PROGRESS" OR "COMPLETE" , DEPENDING UPON CURRENT , AP MANAGER "RETURN" STATUS. ; IF CALLED AS A FORTRAN FUNCTION, THE VALUE RETURNED WILL BE AS SPECIFIED; FOR RBGISTER "RO", RETURNED FROM AN ASSEMBLY-LANGUAGE CALL.

UPON ERROR, A STANDARD AP MANAGER ERROR EX IT WILL BE TAKEN.

;CALL FROM PDP-11 ASSEMBLY LANGUAGE VIA: ; A FORTRAN-COMPATIBLE CALL SEQUENCE. ;RETURNS TO CALL+1 (ALWAYS) ; ALL CONDITIONS AS DESCRIBED FOR THE FORTRAN FUNCTION CALL FORM, ABOVE. ; R0 = STATUS VALUE. (DEFINED BY AP MANAGER.) ; "KPRUN" DEFINES NO UNIQUE VALUES. , R1 = UNDEFINFD. ; R2 ₌ UNDEFINED. ; R5 = UNDEFINFD.

;UPON ERROR, WHEN CALLED FROM FORTRAN OR ASSEMBLY LANGUAGE: ; IF A FATAL ERROR OCCURS DURING EXECUTION OF THIS HOST FUNCTION OR DURING; EXECUTION OF A ROUTINE WHICH IT (IN TURN) CALLS (SUCH AS THE AP MANAGER ; OR AP DRIVER), THE AP MANAGER'S FATAL ERROR EXIT.HOUTINE WILL BE CALLED. ;>- .PAGE KPRUN: CMPB (R5), #7 ;CHECK FOR PROPER NUMBER OF ARGUMENTS. BNE ERRORX ;IF NOT CORRECT NUMBER, HANDLE AS A FATAL ERROR. TST (R5)+ ;STEP POINTER AHEAD TO FIRST ARGUMFNT ADDRESS. TST FCBDON ;TEST FOR COMPLETION OF A PREVIOUS OPERATION. BNE 1S ;A Z8RO "DONE" FLAG INDICATES PREVIOUS OPERATION ; STILL IN PROGRESS.

JSR PC,KWAIT ;WAIT FOR THE AP TO FINISH PROCESSING1S: CLR FCBDON ;REINITIALIZE THE "DONE" FLAG. MOV COMCTL, FCBCTL ;RETRIEVE AP MANAGER'S COMMON CONTROL WORD IN ; ORDER TO UTILIZE CURRENTLY-SELECTED OPTIONS ; PLACE IT IN FCB'S CONTROL WORD. MOV @(R5) +, FCBARL ;MOVE RESULT DATA BUFFER ID "A" INTO FCB ; ARGUMENT LIST. ; STEP HOST MEMORY ADDRE≤S POINTER AHEAD. MOV @(R5) +, FCBARL+4 ;MOVE SOURCE DATA BUFFER ID "B" INTO FCB ; ARGUMENT LIST. ; STEP HOST MEMORY ADDRESS POINTER AHEAD. MOV @(R5) +, FCBARL+8 ;MOVE SOURCE DATA BUFFER ID "C" INTO FCB ; ARGUMENT LIST. MOV @(R5) +, FCBARL-+12. ;MOVE SOURCE DATA BUFFER ID "D" INTO FCB ; ARGUMENT LIST. MOV @(R5) +, FCBARL+1 . ;MOVE SOURCE DATA BUFFER ID "E" INTO FCB ; ARGUMENT LIST. MOV @(R5) +, FCBARL+2 . ;MOVE SOURCE DATA BUFFER ID "F" INTO FCB ; ARGUMENT LIST. MOV @(R5) +, FCBARL+2 . ;MOVE SOURCE DATA BUFFER ID "G" INTO FCB ; ARGUMENT LIST. ; (INCREMENTING R5. ALTHOUGH UNNECESSARY, SAVES ; EXECUTION TIME AND ONE MEMORY WORD.) MOV #MGRARG , R5 ; SET UP ADDRESS OF ARGUMENT LIST FOR CALL TO AP ; MANAGER .

JMP KEXFCB ;CALL UP THE AP MANAGER TO PROCESS THE FCB. ; A DIRECT BRANCH IS THE EQUIVALENT OF A "JSR", ; FOLLOWED BY AN "RTS PC". ; "KEXFCB" WILL RETURN ITS STATUS VALUE IN ; PDP-11 REGISTER R0 AS WELL AS IN LOCATION ; "STATUS" .

MGRARG : BR 2S ;BRANCH AROUND ARGUMENT LIST. (THIS INSTRUCTION ; PROVIDES "NUMBER OF ARGUMENTS" COUNT FOR AP ; MANAGER; THE BRANCH IS NEVER ACTUALLY TAKEN. )

.WORD FCBBLK ; ADDRESS OF FCB . .WORD STATUS ;ADDRESS FOR RETURNED STATUS.

2S : ;THIS LABEL MARKS THE END OF THE ARGUMENT LIST.

ERRORX : JMP MGRM67 ; TAKE AN AP MANAGER STANDARD FATAL ERROR EXIT. ; RETURN STATUS CODE -67 TO INDICATE "IMPROPER ; NUMBER OF ARGUMENTS IN PARAMETER LIST".

STATUS: .WORD 0 ;TEMPORARY STORAGE LOCATION FOR RETURNED AP ; MANAGER STATUS.

.PAGE . FUNCTION CONTROL BLOCK :

FCBBLK:

FCBID: .WORD PRUN ; ID OF THE AP FUNCTION.

FCBCTL : .WORD 0 ; CONTROL WORD. FCBDON: .WORD 1 ;DONE FLAG. INITIALIZED TO "DONE" STATE. FCBLNK: .WORD 0 ; (HIGH-ORDER. ) HOST MEMORY ADDRESS LINK TO NEXT .WORD 0 ; (LOW-ORDER. ) FCB IN HOST MEMORY. (NONE.)

FCBPLT: .WORD 1 ;FCS PARAMETER LIST TYPE. (DATA BUFFER ID'S.) FCBNRG: .WORD 7 ;NUMBBR OF FNTRIES IN ARGUMENT LIST. FCBLEN: .WORD 14 LENGTH OF ARGUMENT LIST IN HOST MEMORY WORDS.

FCBARL: .WORD 0 ; RESULT DATA BUFFER ID "A" ARGUMENT. .WORD 0 ; FIRST WORD = DBF ID; SECOND WORD = 0.

.WORD 0 ;SOURCE DATA BUFFER ID "B" ARGUMENT. .WORD 0 ; FIRST WORD - DBF ID; SECOND WORD = 0.

.WORD 0 ; SOURCE DATA BUFFER ID "C" ARGUMENT. .WORD 0 ; FIRST WORD - DBF ID; SECOND WORD = 0.

.WORD 0 ; SOURCE DATA BUFFER ID "D" ARGUMENT. .WORD 0 ; FIRST WORD = DBF ID; SECOND WORD = 0.

.WORD 0 ;SOURCE DATA BUFFER ID "E" ARGUMENT. .WORD 0 ; FIRST WORD = DBF ID; SECOND WORD = 0.

.WORD 0 ; SOURCE DATA BUFFER ID "F" ARGUMENT. .WORD 0 ; FIRST WORD - DBF ID; SECOND WORD = 0. .WORD 0 ; SOURCE DATA BUFFER ID "G" ARGUMENT. . WORD 0 ; FIRST WORD = DBF ID; SECOND WORD = 0.

.END

; ;

; PROGRAM: APFNC : EDGE PRUNING

; PART NUMBER:

; VERSION DATE: SEFTEMBER 1, 1982

; AUTHORS : CHETANA BUCH

; HISTORY:

; DESCRIPTION: THIS AP-BASED AP FUNCTION PERFORMES EDGE PRUNING.

SEVEN DATA BUFFERS CONTAINING EDGE INFORMATION OF SEVEN

; CONSECUTIVE IMAGE DATA LINES ARE REQUIRED.

; THIS AP FUNCTION IS NORMALLY CALLED UP BY THE AP EXECUTIVE, WHICH

; RETRIEVES THIS AP FUNCTION'S ID NUMBBR FROM A FUNCTION CONTROL BLOCK

; READ FROM HOST MEMORY .

TITLE APFNC: EDGE PRUNING

NAME QPRUN, 001 ;NAME AND VERSION FOR THE OBJECT MODULE. PAGE

RADI X ;DEFAULT TO HEXADECIMAL RADIX.

; INTERNALLY DEFINED GLOBALIZED SYMBOLS: ( IGLOBL); ENTRY POINTS:

;NONE ; SUBROUTINBS :

;NONE ; GENERAL SYMBOLS

;NONE ; DATA MEMORY LABELS:

;NONE ;EXTERNALLY DEFIN8D GLOBALIZBD SYMBOLS: (EGLOBL); ENTRY POINTS:

;NONE ; SUBROUTINES:

EGLOBL PLCHK1, PLDBF , FTLABT, NRMCND ; GENERAL SYMBOLS:

;NONE ; DATA MEMORY LABELS: ;NONE

;SYMBOL DEFINITIONS: ;NONE

;TERMINOLOGY: ;NONE PAGE

PMORG ; START OF RELOCATABLE CODE IN PROGRAM MEMORY.

; >+AP FUNCTION "QPRUN' ; This AP Function scans the data in DBId to find odd zero crossings ( results ; from QEDGE ) and deletes any even zero crossings in the vicinity of three pixe 1S . ; Call with: parameter list type = 1 , number of arguments ; parameter list Iength = 14. ; word 9 argument #1 = ID of result Data Buffer "A". , word 10 argument #1 = Ignored . , word 11 argument #2 = ID of source Data Buffer "B".. ; word 12 argument #2 = Ignored. ; word 13 argument #3 = ID of source Data Buffer " C " .. ; word 14 argument #3 = Ignored . ; wcrd IS argument #4 = ID of source Data Buffer "D".. ; word lli argument #4 = Ignored . ; word 17 argument #5 = ID of source Data Buffer "E" ; word 18, argument #5 = Ignored .

; word 19 argument #4 = ID of source Data Buffer " F" . ; word 20 argument #4 = Ignored. ; word 21 argument 17 = ID of source Data Buffer "G". ; word 22 argument #7 = Ignored .

; Exits to AP Executive's "Fatal Abort" Service:

; If an error is found by AP Service Subroutine 'PLCHKl' or 'PLDBF'. ; >-

PAGE ;DEFINITION OF THE FUNCTION ID FOR THE AP EX ECUTIVE FUNCTION TABLE:

FUNC %D806, QPRUN ;FUNCTION ID AND ENTRY POINT NAME.

QPRUN: SETR R1=1 ;SET UP FOR PLCHK1 CALL

SETR R2=7 SETR R3=%D14 JSR PLCHK1 ; GO CHECK CORRECTNESS OF VALUES IN FCB, ; FIND SOURCE DATA BUFFERS, ; ALLOCATE R8SULT DBF IF NECESSARY, ; SET UP ARGUMENTS FOR A FUNCTION ADDR. CALL. ; UPON ERROR , EX IT THROUGH AP EXECUTIVE' S

JMP FTLABT ; FATAL ABORT ROUTINE.

SETR R15-7 ; ARG COUNT

FETCH: JSR PLDBF ; FFTCH DBF ADDR

JMP FTLABT ;

SET R1=R1+1 ; POINT TO FIRST DATA WORD

PUSH Rl ;SAVB ON STACK

DBNZ R 15, FETCH

POP R14 ;R14—>DBIg

POP R13 ;R13—>DBIf

POP R12 ;R12—>DBIe

POP R11 ;R11 —>DBId MAIN LINE.

SETR R3=STORE ;SAVE OTHER ADDR IN STORE

SETR R4=3

SAVE: POP R1

STREGI R1 ,R3

DBNZ R4 ,SAVE

SETR R1=0 ; COUNT POINTER

NEXT LDREGI R3,R11 ;GET DATA INTO R3

SET R4=R3 ;COPY IN R4

SET R4=R4 'AND'%H3D ;CHECK FOR CORNER

SKIPNE R4'XOR*%H3D

JMP CORNER

SET R4=R3

SET R4=R4 'AND'%H39

SKIPNE R4 -XOR'%H39 ;ODD HORZ CODE

JMP HORODD

SET R4=R3

SET R4=R4 'AND'%H35

SKIPNE R4'XOR'%H35 ;ODD VERT CODE

JMP VEROOD

DONE: SET R1=R1+1 ; UPDATE POINTER

DBNZ R2,NEXT

JMP NRMCND ;RETURN TO AP EXEC.

RTN

CORNER: SETR R15=-1 ;FLAG FOR CORNER PIXEL

HORODD : SETR R4=-1 DIRECTION FLAG

SETR R5=3 ; COUNT

SET R6=R11 ; POINTER IN FORWARD DIRECTION

CHK: LDREGI R7,R6 ; FETCH DATA

CHK1 : SET R8=R7 ;COPY IT

SKIPNE R8 'XOR' %H3A ;EVEN HORZ POSITIVE STRONG CODE JMP ZEROH

SET R8=R7

SKIPNE R8'XOR'%H3E ;EVEN CORNER STRONG CODE

JMP ZEROH

SKIPLT R4=R4 ;CHECK DIRECTION

JMP OPP

DBNZ R5 , CHK ;REPEAT

REV: SETR R4=0 ;REVERSE DIRECTION FLAG

SETR R5=3 ; COUNT

SET R4=R11-1

CHK2 : LDREGD R7 ,R6

JMP CHK1

OPP: DBNZ R5 ,CHK2

SKIPLT R15-R15

JMP DONE

SETR R15=0

JMP VERODD

ZEROH. SETR R7=0 ;KILL THE EVEN CROSSING PRESENT

SKIPLT R4=R4

JMP LEFT

SET R4=R6-1 ; CORRECT POINTER

STREG R7,R6

JMP REV ; CHECK IN OTHER DIRECTION

LEFT: STREG R7,R4

SKIPLT R15=R15

JMP DONE

SETR R15=0

VERODD: SETR R4 =-1 ;DIRECTION FLAG

SETR R5=3 ; COUNT

SET R6=R12

REPEAT: SET R6=R6+R1 ; PTR TO CORRES WORD IN ADJECENT LINE CHK3 : LDREG R7,R4 ; FETCH DATA

SET R8=R7 ; COPY IT

SKIPNE R8 'XOR'%H36. ; EVEN VERT POSITIVE STRONG CODE

JMP ZEROV

SET R8=R7

SKIPNE R8 'XOR'%H3E ; ;EVEN CORNER STRONG CODE

JMP ZEROV

DBNZ R5 ,TEST

SKIPLT R4=R4 ;CHECK DIRECTION

JMP DONE

REV1: SETR R4=0 ; FLAG FOR REVERSE DIRECTION

SETR R5=3 ; COUNT

SETR R9 =STORE ; FETCH OTHER ADDR

LDREGI R6 ,R9

JMP REPEAT

TEST: SET R7=R5

SKIPEQ R7 'XOR'%H2 JMP THIRD

SKIPLT R4=R4

JMP REV2

SET R4=R13

JMP REPEAT ;PTR TO NEXT LINE

THIRD: SKIPLT R4=R4

JMP REVS

SET R6=R14

JMP REPEAT ;PTR TO THIRD LINE

REV2: LDREGI R6 ,R9

JMP REPEAT

REV3 : LDREGI R6,R9

JMP REPEAT

ZEROV: SETR R7=0 ;KILL THE EVEN ZERO CROSSING

STREG R7,R6

SKIPLT R4=R4

JMP DONE

JMP REV1 ;CHECK IN REVERSE DIRECTION

STORE : DS 0 ; STORE FOR BUFFER ADDRESSES

DS 0

DS 0

END

.NLIST TTM ; PRODUCE LISTING IN WIDE STYLE. . ENABL LC ;RETAIN LOWER-CASE CHARACTERS AS SUCH. ; ; ; PROGRAM: HSTFNC: EDGE DETECTION FOR RAW IMAGE ; ; PART NUMBER: ;

; VBRSION DATE: SEFTEMBER 13, 1982

; AUTHOR : CHETANA BUCK ; HISTORY : ; DESCRIPTION: THIS FORTRAN-CALLABLE HOST FUNCTION CALLS UF AN AP-BASED ; AP FUNCTION IN ORDER TO PERFORM "EDGE DETECTION"; OPERATION BBTWEEN THE RESPECTIVE ELEMENTS OF TWO AP DATA MEMORY DATA BUF

FERS ; WHICH CONTAIN THE VAHIOUS CONVOLUTION RESULTS OF THE LINE IMAGE WITH A M ASK. ; ;

.TITLE KHORZ - HSTFNC: EDGE DETECTION

.IDENT /V01/ IDENTIFIER FOR THE OBJECT MODULE . .PAGE ;ESTABLISH ASSEMBLY AND LISTING CONVENTIONS:

. NLIST TTM ; PRODUCE LISTING IN WIDE STYLE. .DSABL GBL ; FLAG NON-EXISTENT-SYMBOL REFERENCES AS ERRORS. .ENABL LC ; RETAIN LOWER-CASE CHARACTERS AS SUCH.

.CSECT KHORZ ;ESTABLISH A NAMED CSECT.

; INTERNALLY DEFINED GLOBALIZED SYMBOLS: .GLOBL KHORZ

;EXTERNALLY DEFINED GLOBALIZED SYMBOLS:

.GLOBL KEXFCB ; AP MANAGER'S "FCB EXECUTION" SUBROUTINE.

.GLOBL KWAIT ; AP MANAGER'S WAIT ROUTINE

.GLOBL MGRM67 ; AP MANAGER'S "FATAL ERROR #-67" EXIT ROUTINE.

.GLOBL COMCTL ; AP MANAGER'S "FCB CONTROL WORD".

;Ap FUNCTION ID'S REFERENCED:

HORZ= ΛD820. ;ID FOR "EDGE DETECTION"

; SYMBOL DEFINITIONS: ;NONE

; TERMINOLOGY:

; FCB - FUNCTION CONTROL BLOCK, READ BY THE AP EXECUTIVE FROM HOST ; MEMORY .

.PAGE ;>+HOST FUNCTION "KHORZ"

;THIS HOST FUNCTION CALLS UP A CORRESPONDING AP FUNCTION IN THE AP400. ; THIS HOST FUNCTION VERSION ASSUMES THAT SOURCE DATA ALREADY RESIDES IN TWO AP ;DATA MEMORY DATA BUFFERS, AND THAT THE RESULT DATA WILL BE PLACED IN ANOTHER ;AP DATA MEMORY DATA BUFFFR.

;THB CORRESPONDING "EDGE DETECTlON" AP FUNCTION SHOULD BE REFERENCED FOR FURTHER ; INFORMATION.

;CALL FROM FORTRAN VIA: ; SUBROUTINE CALL: CALL XHORZ ( DBIa, DBIb, DBIc ) ; OR INTEGER FUNCTION CALL, AS: IERR = KHORZ ( DBIa, DBIb, DBIc ) ;WHERE ; DBIA = ID OF AP DATA BUFFER' TO HOLD RESULT DATA. ; "DBIa" MUST BB A SINGLE-WORD INTEGER VARIABLE OR CONSTANT. ; DBF NEED NOT HAVE BEEN PREVIOUSLY ALLOCATED. ; IF NOT ALREADY ALLOCATED. DBF WILL BE ALLOCATED; SIZE WILL EQUAL ; THAT OF SOURCE DATA BUFFERS. ; IF RESULT DBF WAS PREVIOUSLY ALLOCATED, IT MUST BE OF SIZE EQUAL ; OR GREATER THAN SOURCE DATA BUFFERS. ; DBIb = ID OF AP DATA BUFFER HOLDING SOURCE DATA SET( ODD HORZ. CONV RES ULTS ; ; "DBIb" MUST BE A SINGLE-WORD INTBGER VARIABLE OR CONSTANT. ; DBF MUST HAVE BEEN PREVIOUSLY ALLOCATED IN AP DATA MEMORY ; DATA BUFFERS DBlb . DBIc , DBId , DBIe MUST BE OF EQUAL LENGTH . ; DBIc = ID OF AP DATA BUFFER HOLDING SOURCE DATA SET(EVEN HORZ CONV RES ULTS ) . ; "DBIc" MUST BE A SINGLE-WORD INTEGER VARIABLE OR CONSTANT. ; DEF MUST HAVE BEEN PREVIOUSLY ALLOCATED IN AP DATA MEMORY. ;RETURNS TO FORTRAN WITH: ; ALL ARGUMFNTS RETURNED AS RECEIVED.

; FUNCTION EXECUTION "IN PROGRESS" OR "COMPLETE", DEPENDING UPON CURRENT ; AP MANAGER "RETURN" STATUS. ; IF CALLED AS A FORTRAN FUNCTION. THE VALUE RETURNED WILL BE AS SPECIFIED ; FOR REGISTER "RO", RETURNED FROM AN ASSEMBLY-LANGUACE CALL. ; UPON ERROR. A STANDARD AP MANAGER ERROR EXIT WILL BE TAKEN.

;CALL FROM PDP-11 ASSEMBLY LANGUAGE VIA: ; A FORTRAN-COMPATIBLE CALL SEQUENCE. ;RETURNS TO CALL+1: (ALWAYS) ; ALL CONDITIONS AS DESCRIBBD FOR THE FORTRAN FUNCTION CALL FORM, ABOVE. ; R0 = STATUS VALUE. (DEFINED BY AP MANAGER.) ; "KHORZ" DEFINES NO UNIQUE VALUES. ; R1 = UNDEFINED . ; R2 = UNDEFINFD. ; R5 = UNDEFINED.

;UPON ERROR, WHEN CALLED FROM FORTRAN OR ASSEMBLY LANGUAGE: ; IF A FATAL FRROR OCCURS DURING EXECUTION OF THIS HOST FUNCTION OR DURING; EXECUTION OF A ROUTINE WHICH IT (IN TURN) CALLS (SUCH AS THE AP MANAGER ; OR AP DRIVER), THE AP MANAGER'S FATAL ERROR EXIT ROUTINE WILL BE CALLED. ; >-

.PAGE

KHORZ:

CMPB (R5), #3 ;CHECK FOR PROPER NUMBER OF ARGUMENTS.

BNE ERRORX ;IF NOT CORRECT NUMBER, HANDLE AS A FATAL ERROR.

TST (R5) + ;STEP POINTER AHEAD TO FIRST ARGUMENT ADDRESS.

TST FCBDON ; TEST FOR COMPLETION OF A PREVIOUS OPERATION. BNE II ; A ZERO "DONE" FLAG INDICATES PREVIOUS OPERATION ; STILL IN PROGRESS.

JSR PC, KWAIT ;WAIT FOR THE AP TO FINISH PROCESSING

1S : CLR FCBDON ;REINITIALIZE THE "DONE" FLAG.

MOV COMCTL, FCBCTL ; RETRIEVE AP MANAGER'S COMMON CONTROL WORD IN ; ORDER TO UTILIZE CURRENTLY-SELECTED OPTIONS. ; PLACE IT IN FCB'S CONTROL WORD.

MOV @(R5>_*-, FCBARL ;MOVE RBSULT DATA BUFFER ID "A" INTO FCB ; ARGUMENT LIST. ; STEP HOST MEMORY ADDRESS POINTER AHEAD.

MOV @(R5)+. FC8ARL+4 ;MOVE SOURCE DATA BUFFER ID "B" INTO FCB ; ARGUMENT LIST.

; STEP HOST MEMORY ADDRESS POINTER AHEAD.

MOV @(R3)+, FCBARL+ΛD8 ;MOVE SOURCE DATA BUFFER ID "C" INTO FCB

; ARGUMENT LIST. ; (INCREMENTING R5 , ALTHOUGH UNNECESSARY, SAVES ; EXECUTION TIME AND ONE MEMORY WORD.)

MOV #MGRARG, R5 ; SET UP ADDRESS OF ARGUMENT LIST FOR CALL TO AP ; MANAGER .

JMP XEXFCB ;CALL UP THE AP MANAGER TO PROCESS THE FCB. ; A DIRECT BRANCH IS THE EQUIVALENT OF A "JSR", ; FOLLOWED BY AN "RTS PC". ; "KEXFCB" WILL RETURN ITS STATUS VALUE IN ; PDP-11 REGISTER RO AS WELL AS IN LOCATION ; "STATUS" .

MGRARG: BR 21 ; BRANCH AROUND ARGUMENT LIST. (THIS INSTRUCTION ; PROVIDES "NUMBER OF ARGUMENTS" COUNT FOR AP ; MANAGER; THE BRANCH IS NEVER ACTUALLY TAKEN.)

.WORD FCBBLK ;ADDRESS OF FCB . .WORD STATUS ;ADDRESS FOR RETURNED STATUS .

2s : ;THIS LABEL MARKS THE END OF THE ARGUMENT LIST.

ERRORX : JMP MGRM-37 ; TAKE AN AP MANAGER STANDARD FATAL ERROR EXIT. ; RETURN STATUS CODE -47 TO INDICATE "IMPROPER ; NUMBER OF ARGUMENTS IN PARAMETER LIST".

STATUS: .WORD ;TEMPORARY STORAGE LOCATION FOR RETURNED AP ; MANAGER STATUS.

.PAGE ; FUNCTION CONTROL BLOCK: FCBBLK:

FCBID: .WORD HORZ ;ID OF THE AP FUNCTION. FCBCTL. .WORD 0 ; CONTROL WORD. FCBDON: .WORD 1 ;DONE FLAG. INITIALIZED TO "DONE" STATE. FCBLNK. .WORD 0 .(HIGH-ORDER.) HOST MEMORY ADDRESS LINK TO NEXT .WORD 0 ;(LOW-ORDER. ) FCB IN HOST MEMORY . (NONE.)

FCBPLT: .WORD 1 ; FCB PARAMETER LIST TYPE. (DATA BUFFER ID'S.) FCBNRG: .WORD 3 ; NUMBER OF ENTRIES IN ARGUMENT LIST. FCBLBN: .WORD 4 ; LENGTH OF ARGUMENT LIST IN HOST MEMORY WORDS.

FCBARL : .WORD 0 ; RESULT DATA BUFFER ID "A" ARGUMENT. .WORD 0 ; FIRST WORD = DBF ID; SECOND WORD = 0.

.WORD- 0 ; SOURCE DATA BUFFER ID "B" ARGUMENT. .WORD 0 ; FIRST WORD = DBF ID; SECOND WORD = 0.

.WORD 0 ;SOURCE DATA BUFFER ID "C" ARGUMENT. .WORD 0 ; FIRST WORD = DBF ID; SECOND WORD = 0.

.END

; ;

; PROGRAM: APFNC: EDGE DETECTION

; PART NUMBER:

; VERSION DATE: SEPTEMBER 13, 1982

; AUTHORS : CHETANA BUCH

; HISTORY :

; DESCRIPTION: THIS AP-BASED AP FUNCTION PERFORMS AN EDGE DETECTION BY ; BASICALLY DETECTING A ZERO CROSSING IN THE CONVOLVED RES ULTS ; OF THE LINE OF RAW IMAGE DATA. ODD AND EVEN MASKS ARE USED ON HORIZONTAL

L ; IMAGE DATA .

; THE RESULT BUFFER CONTAINS A CODED WORD FOR EACH PIXEL.

; THIS AP FUNCTION IS NORMALLY CALLED UP BY THE AP EXECUTIVE, WHICH

; RETRIEVES THIS AP FUNCTION'S ID NUMBER FROM A FUNCTION CONTROL BLOCK

; READ FROM HOST MEMORY. ; ; TITLE APFNC: EDGE DETECTION

NAME QHORZ, 001 ; NAME AND VERSION FOR THE OBJECT MODULE .

PAGE

RADIX ;DEFAULT TO HEXADECIMAL RADIX.

; INTERNALLY DEFINED GLOBALIZED SYMBOLS: ( IGLOBL) ; ENTRY POINTS:

;NONE ; SUBROUTINES:

;NONE ; GENERAL SYMBOLS

;NONE ; DATA MEMORY LABELS:

;NONE

;EXTERNALLY DEFINED GLOBALIZED SYMBOLS: ( EGLOBL ) ; ENTRY POINTS:

;NONE ; SUBROUTINES:

EGLOBL PLCHK1 , FTLABT, PLDBF , NRMCND ; GENERAL SYMBOLS:

;NONE ; DATA MEMORY LABELS: ;NONE

; SYMBOL DEF INITI ONS : ;NONE

; TERMINOLOGY : ; NONE

PAGE

PMORG ; START OF RELOCATABLE CODE IN PROGRAM MEMORY.

;>+AP FUNCTION "QHORZ"

; This AP Function performs an edge detection. This is actually a zero crossing ; detection scheme. ; Call with: parameter list type = 1. number of arguments = 3. ; parameter list length = 6. ; word 9 argument #1 = ID of result Data Buffer "A" ; word 10 argument #1 = Ignored . ; word 11 argument #2 = ID of source Data Buffer "B" . ; word 12 argument #2 = Ignored . ; word 13 argument #3 = ID of source Data Buffer "C". ; word 14 argument #3 = Ignored .

; Exits to AP Executive's "Fatal Abort" Service:

; If an error is found by AP Service Subroutine "PLDBF* or 'PLCHK1

; >-

PAGE ;DEFINITION OF THE FUNCTION ID FOR THE AP EXECUTIVE FUNCTION TABLE:

FUNC SD820, QHORZ ; FUNCTION ID AND ENTRY POINT NAME.

QHORZ : ; SET UP FOR CALL TO PLCHK1

SETR R1=1 ;PARAMETER DESCRIPTOR TYPE

SETR R2=3 ; # OF ARGUMENTS

SETR R3=6 ; # OF WORDS IN ARG LIST

JSR PLCHK1 ; GO CHECK CORRECTNESS OF VALUES IN FCB.

JMP FTLABT ; RETURNS HERE IF ERROR ; IF OK , RETURNS HERE

JSR PLDBF ; FIND SOURCE DATA BUFFERS, ; ALLOCATE RESULT DBF IF NECESSARY, ; SET UP ARGUMENTS FOR A FUNCTION ADDR. CALL. ; UPON ERROR, EXIT THROUGH AP EXECUTIVE'S ; FATAL ABORT ROUTINE.

JMP FTLABT SET R15=R1 ; R15— >RESULT BUFFER ADDRESS.

JSR PLDBF

JMP FTLABT

SET R13=R1+1 ; R13— >HORZ. ODD CONV ( Ho ) BUFFER ADDRESS.

JSR PLDBF

JMP FTLABT

SET R14=R1+1 ; R14— >HORZ. EVEN CONV ( He ) BUFFER ADDRESS.

SETR R1=%HOF

STREG R1 ,R15 ;SET BEX OF RESULT BUFFER

SETR R1=0

STREGI R1 ,R15.L0 ;SET NSN OF RESULT

SET R12=R2 ; R12— >BUFFER LENGTH.

START: LDREGI R3,R13 ;GET FIRST Ho/Vo VALUE

LDREGI R4 ,R14 ;GET FIRST He/Ve VALUE

STREGI R1 ,R15 ; OUTPUT ZERO FOR FIRST VALUE

SET R12=R12-1 ;DECR COUNT

CHKO: SKIPLT R5=R3 ;SIGN CHECK FOR ODD VALUES

JMP POSODD

LDREGI R3 ,R13

CHKE: SKIPGE R5=R4 ;SIGN CHECK FOR EVEN VALUES

JMP NEGEVN

JMP POSEVN

;HERE IF VALUE IS ODD AND POSITIVE

POSODD: LDREGI R3,R13 ; FETCH NEXT VALUE AND COMPARE WITH PREVIOUS

SKIPLT R3=R3

JMP CHKE ; CHECK EVEN IF NO SIGN CHANGE

SET R11=R15

SKIPGE R5-R5+R3

SET R11=R11-1

JMP SELODD ;ELSE SELECT APPROPRIATE CODE FOR OUTPUT

;HERE IF VALUE IS EVEN AND POSITIVE

POSEVN: LDREGI R4,R14 ; FETCH NEXT VALUE AND COMPARE WITH PREVIOUS

SKIPLT R4=R4

JMP OUTZ ;OUTPUT ZERO, SINCE NO SIGN CHANGE

SET R2=R13-1

SET R11=R15

SKIPGE R5=R5+R4

SET R2=R2-1

SET R11=R11-1

JMP OUTEVN ;ELSE SELECT APPROPRIATE CODE TO OUTPUT

;HERE IF VALUF IS EVEN AND NEGATIVE

NEGEVN: LDREGI R4,R14 ; FETCH NEXT VALUE AND COMPARE WITH PREVIOUS

SKIPGE R4=R4

JMP OUTZ ;OUTPUT ZERO, SINCE NO SIGN CHANGE SET R11=R15

SET R2=R13-1

SKIPLT R5=R3+R4

SET R11=R11-1

SET R2=R2-1

JMP OUTEVN ;ELSE SELECT APPROPRIATE CODE TO OUTPUT

SELODD: SET R2=R14-1 ; POINTER TO EVEN DATA ; GETS THE RIGHT STRENGTH

LDREGI R5 ,R2 ; OBTAIN THE THREE CONSECUTIVE DATA VALUES

LDREGI R6. R2 ; IN R5 , R6, R7.

SKIPGE R5=R5

SETR R5=0 ; ZERO IF NEGATIVE

SKIPGE R6=R6

SETR R6=0

SET R7=R6

SKIPGE R6=R6-R5 ; COMPARE TWO STRENGTHS

SET R7=R5 ;R5 IS LARGER

OUTODD : ; POSITIVE ODD ZERO CROSSINGS

SETR R5=%H3B ; CODE FOR HORZ POS WEAK ODD PIXEL

SETR R8= %D600 ; NOISE THRESHOLD FOR ODD

SKIPGE R7=R7-R8 ; CHECK THRESHOLD

JMP CHKE ; TOO LOW , NOT VALID SO CHECK EVEN

LDREGI R4 ,R14 ; INCR EVEN PTR SINCE NO EVEN CHECK DONE

STREG R5.R11 ; STRONG CODE IN OUT BUFFER

JMP NEXT

OUTEVN : SETR R6 %K3A ; CODE FOR HORZ NEG EVEN STRONG PIXEL

LDREG R5 ,R2 ; FETCH STRENGTH

SETR R8=%D1000 ;NOISE THRESHOLD FOR EVEN

SKIPGE R5 =R5-R8 ; CHECK THRESHOLD

JMP OUTZ ;TOO LOW, SO WRITE OUT ZERO

STREG R6 ,R11 ; STRONG CODE

JMP NEXT

OUTZ: SETR R8=0

STREGI R8,R15 ;WRITE OUT A ZERO...NO EDGE

JMP NEXT1

NEXT: SKIPGE R11=R11-R15

JMP OUTZ

SET R15=R15+1

NEXT1 : DBNZ R12,CHKO ;REPEAT TILL ALL PIXELS TESTED

JMP NRMCND ; GO TO NORMALIZE THE RESULT DATA, IF FCB CONTROL ; BIT INDICATES SUCH REQUIREMENT. ; A DIRECT BRANCH IS THE EQUIVALENT OF A "JSR" ; FOLLOWED BY AN "RTN" .

RTN END

.NLIST TTM ;PRODUCE LISTING IN WIDE STYLE. .ENABL LC ; RETAIN LOWER-CASE CHARACTERS AS SUCH. ; ; ; PROGRAM: HSTFNC: EDGE DETECTION FOR RAW IMAGE ; ; PART NUMBER: ; ; VBRSION DATE SEPTEMBER 6 , 1982 ; ; AUTHOR : CHETANA BUCH ; ; HISTORY: ; ; DESCRIPTION: THIS FORTRAN-CALLABLE HOST FUNCTION CALLS UP AN AP-BASED ; AP FUNCTION IN ORDER TO PERFORM "EDGE DETECTION"; OPERATION BETWEEN THE RESPECTIVE ELEMENTS OF FOUR AP DATA MEMORY DATA BU FFERS ; WHICH CONTAIN THE VARIOUS CONVOLUTION RESULTS OF THE LINE IMAGE WITH A M ASK. ; ;

.TITLE KVZER - HSTFNC: EDGE DETECTION

.IDENT /V01/ ;IDENTIFIER FOR THE OBJECT MODULE. .PAGE ; ESTABLISH ASSEMBLY AND LISTING CONVENTIONS:

. NLIST TTM ; PRODUCE LISTING IN WIDE STYLE. .DSABL GBL ; FLAG NON-EXISTENT-SYMBOL REFFRENCES AS ERRORS .ENABL LC ; RETAIN LOWER-CASE CHARACTERS AS SUCH.

.CSECT KVZER ;ESTABLISH A NAMED CSECT.

.INTERNALLY DEFINED GLOBALIZED SYMBOLS: .GLOBL KVZER

; EXTERNALLY DEFINED GLOBALIZED SYMBOLS:

.GLOBL KBXFCB ; AP MANAGER'S "FCB EXECUTION" SUBROUTINE 0

.GLOBL KWAIT ; AP MANAGER'S WAIT ROUTINE

.GLOBL MGRM.S7 ; AP MANAGER'S "FATAL ERROR #-67" EXIT ROUTINE.

.GLOBL COMCTL ; AP MANAGER'S "FCB CONTROL WORD".

;AP FUNCTION ID'S REFERENCED:

VZER= ΛD810. ; ID FOR "VERTICAL EDGE DETECTION".

; SYMBOL DEFINITIONS: ;NONE

;TERMINOLOGY:

; FCB - FUNCTION CONTROL BLOCK, READ BY THE AP EXECUTIVE FROM HOST MEMORY.

.PAGE ;>+HOST FUNCTION "KVZER"

;THIS HOST FUNCTION CALLS UP A CORRESPONDING AP FUNCTION IN THE AP400.

;THIS HOST FUNCTION VERSION ASSUMES THAT SOURCE DATA ALREADY RESIDES IN FOUR AP; DATA MEMORY DATA BUFFERS, AND THAT THE RESULT DATA WILL BE PLACED IN ANOTHER ;AP DATA MEMORY DATA BUFFER. ;THE CORRESPONDING "EDGE DETECTION" AP FUNCTION SHOULD BE REFERENCED FOR FURTHER ; INFORMATION.

;CALL FROM FORTRAN VIA: ; SUBROUTINE CALL: CALL XVZER ( DBIa, DBIb, DBIc, DBId , DBIe, DBI f ) ; OR INTEGER FUNCTION CALL, AS: IERR = KVZER ( DBIa, DBIb, DBIc, DBId, D Ble ) )

;WHERE: ; DBIa = ID OF AP DATA BUFFER TO HOLD SOURCE DATA. ; "DBIA" MUST BE A SINGLE-WORD INTEGER VARIABLE OR CONSTANT. ; DBF NEED NOT HAVE BEEN PREVIOUSLY ALLOCATED. ; IF NOT ALREADY ALLOCATED, DBF WILL BE ALLOCATED; SIZE WILL EQUAL ; THAT OF SOURCE DATA BUFFERS. ; IF RESULT DBF WAS PREVIOUSLY ALLOCATED, IT MUST BE OF SIZE EQUAL ; OR GREATER THAN SOURCE DATA BUFFERS. ; DBIb = ID OF AP DATA BUFFER HOLDING SOURCE DATA SET ; "DBIb" MUST BE A SINGLE-WORD INTEGER VARIABLE OR CONSTANT. ; DBF MUST HAVE BEEN PREVIOUSLY ALLOCATED IN AP DATA MEMORY. ; DATA BUFFERS DBIb , DBIc , DBId , DBIc MUST BE OF EQUAL LENGTH. ; DBIc = ID OF AP DATA BUFFER HOLDING SOURCE DATA SET ; "DBIc" MUST BE A SINGLE-WORD INTEGER VARIABLE OR CONSTANT. ; DBF MUST HAVE BEEN PREVIOUSLY ALLOCATED IN AP DATA MEMORY. ; DBId = ID OF AP DATA BUFFER HOLDING SOURCE DATA SET ; SAME RESTRICTIONS AS ABOVE APPLY. ; DBIe = ID OF AP DATA BUFFER HOLDING EVEN VERT . CONV RESULTS. ; SAME RESTRICTIONS AS ABOVE APPLY.

; RETURNS TO FORTRAN WITH: ; ALL ARGUMENTS RETURNED AS RECEIVED. ; FUNCTION EXECUTION "IN PROGRESS" OR "COMPLETE", DEPENDING UPON CURRENT ; AP MANAGER "RETURN" STATUS . ; IF CALLED AS A FORTRAN FUNCTION. THE VALUE RETURNED WILL BE AS SPECIFIED ; FOR REGISTER "RO", RETURNED FROM AN ASSEMBLY-LANGUAGE CALL.

; UPON ERROR, A STANDARD AP MANAGER ERROR EXIT WILL BE TAKEN.

; CALL FROM PDP-11 ASSEMBLY LANGUACE VIA: ; A FORTRAN-COMPATIBLE CALL SEQUENCE.

;RETURNS TO CALL+1: (ALWAYS) ; ALL CONDITIONS AS DESCRIBED FOR THE FORTRAN FUNCTION CALL FORM, ABOVE.; R0 = STATUS VALUE. (DEFINED BY AP MANAGER . ) ; "KVZER" DEEINES NO UNIQUE VALUES. ; R1 = UNDEFINED. ; R2 = UNDEFINED. ; R5 = UNDEFINED.

;UPON ERROR, WHEN CALLED FROM FORTRAN OR ASSEMBLY LANGUAGE : IF A FATAL ERROR OCCURS DURING EXECUTION OF THIS HOST FUNCTION OR DURING EXECUTION OF A ROUTINE WHICH IT (IN TURN) CALLS (SUCH AS THE AP MANAGER OR AP DRIVER) , THE AP MANAGER'S FATAL ERROR EXIT ROUTINE WILL BE CALLED.

; >-

.PAGE

KVZER:

CMPB (R5). #6 ; CHECK FOR PROPER NUMBER OF ARGUMENTS BNE ERRORX ;IF NOT CORRECT NUMBER. HANDLE AS A FATAL ERROR.

TST (R5) + ;STEP POINTER AHEAD TO FIRST ARGUMENT ADDRESS .

TST FCBDON ; TEST FOR COMPLETION OF A PREVIOUS OPERATION.

BNE 1S ;A ZERO "DONE" FLAG INDICATES PREVIOUS OPERATION STILL IN PROGRESS.

JSR PC, KWAIT ;WAIT FOR THE AP TO FINISH PROCESSING

1S: CLR FCBDON ; REINITIALIZE THE "DONE" FLAG._.

MOV COMCTL, FCBCTL ; RETRIEVE AP MANAGER'S COMMON CONTROL WORD IN ; ORDER TO UTILIZE CURRENTLY-SELECTED OPTIONS. ; PLACE IT IN FCB'S CONTROL WORD.

MOV @(R5)+, FCBARL ; MOVE SOURCE DATA BUFFER ID "A" INTO FCB ; ARGUMENT LIST. ; STEP HOST MEMORY ADDRESS POINTER AHEAD.

MOV @(R5)+, FCBARL+4 ;MOVE SOURCE DATA BUFFER ID "B" INTO FCB

; ARGUMENT LIST. ; STEP HOST MEMORY ADDRESS POINTER AHEAD. MOV @(R5)+, FCBARL+ΛD8 ;MOVE SOURCE DATA BUFFER ID "C" INTO FCB ; ARGUMENT LIST.

MOV @(R5)+,FCBARL+ΛD12 ;MOVE SOURCE DATA BUFFER ID "D" INTO FCB

; ARGUMENT LIST. MOV @(R5)+,FCBARL+ΛDl6 ;MOVE SOURCE DATA BUFFER ID "E" INTO FCB

; ARGUMENT LIST. MOV @(R5) + ,FCBARL+ΛD20 ;MOVE SOURCE DATA BUFFER ID "F" INTO FCB ; ARGUMENT LIST. ; (INCREMENTING R5 , ALTHOUGH UNNECESSARY, SAVES ; EXECUTION TIME AND ONE MEMORY WORD.)

MOV #MGRARG , R5 ; SET UF ADDRESS OF ARGUMENT LIST FOR CALL TO AP ; MANAGER. JMP KEXFCB ;CALL UP THE AP MANAGER TO PROCESS THE FCB. ; A DIRECT BRANCH IS THE EQUIVALENT OF A "JSR", ; FOLLOWED BY AN "RTS PC". ; "KEXFCB" WILL RBTURN ITS STATUS VALUE IN ; PDP-11 REGISTER R0 AS WELL AS IN LOCATION ; "STATUS" .

MGRARG : BR 2S ;BRANCH AROUND ARGUMENT LIST. (THIS INSTRUCTION ; PROVIDES "NUMBER OF ARGUMENTS" COUNT FOR AP ; MANAGER; THE BRANCH IS NEVER ACTUALLY TAKEN.)

.WORD FCBBLK ; ADDRESS OF FCB. .WORD STATUS ;ADDRESS FOR RETURNED STATUS. 2S ;THIS LABEL MARKS THE END OF THE ARGUMENT LIST.

ERRORX: JMP MGRM67 ; TAKE AN AP MANAGER STANDARD FATAL ERROR EXIT. ; RETURN STATUS CODE - 67 TO INDICATE "IMPROPER ; NUMBER OF ARGUMENTS IN PARAMETER LIST".

STATUS: .WORD ;TEMPORARY STORAGE LOCATION FOR RETURNED AP ; MANAGER STATUS.

.PAGE .FUNCTION CONTROL BLOCK:

FCBBLK.

FCBID: .WORD VZER ; ID OF THE AP FUNCTION. FCBCTL: .WORD 0 ;CONTROL WORD. FCBDON: .WORD 1 ; DONE FLAG. INITIALIZED TO "DONE" STATE. FCBLNK: .WORD 0 ; (HIGH-ORDER.) HOST MEMORY ADDRESS LINK TO NEXT .WORD 0 ; (LOW-ORDER.) FCB IN HOST MEMORY. (NONE.)

FCBPLT: .WORD 1 ; FCB PARAMETER LIST TYPE. (DATA BUFFER ID'S.) FCBNRG: .WORD 6 ; NUMBER OF ENTRIES IN ARGUMENT LIST. FCBLEN: .WORD ΛD12 ; LENGTH OF ARGUMENT LIST IN HOST MEMORY WORDS.

FCBARL: .WORD 0 ;RESULT DATA BUFFER ID "A" ARGUMENT. .WORD 0 ; FIRST WORD - DBF ID; SECOND WORD = 0.

.WORD ; SOURCE DATA BUFFER ID "E" ARGUMBNT.

.WORD ; FIRST WORD * DBF ID; SBCOND WORD . WORD 0 ;SOURCR DATA BUFFBR ID "C" ARGUMENT. . WORD 0 ; FIRST WORD - DBF ID; SECOND WORD = 0 . WORD 0 ; SOURCE DATA BUFFER ID "D" ARGUMENT . WORD 0 ; FIRST WORD » DBF ID; SECOND WORD = 0 . WORD 0 ;SOURCE DATA BUFFBR ID "B" ARGUMENT. . WORD 0 ; FIRST WORD - DBF ID; SECOND WORD = 0. . WORD 0 . WORD 0

.END

PROGRAM: APFNC: EDGE DETECTION PART NUMBER: VERSION DATE: SEPTEMBER 4, 1982 AUTHORS: CHETANA BUCH HISTORY: DESCRIPTION: THIS AP-BASED AP FUNCTION PERFORMS AN EDGE DETECTION BY BASICALLY DETECTING A ZERO CROSSING IN THE CONVOLVED RES ULTS

OF THE LINE OF RAW IMAGE DATA. ODD AND EVEN MASKS ARE USED BOTH HORIZONT ALLY

AND VERTICALLY ON THE IMAGE DATA RESULTING IN FOUR DATA BUFFERS WHICH

HAVE TO BE STUDIED FOR THE EDGE DETECTION.

THE RESULT BUFFER CONTAINS A CODED WORD FOR FACH PIXEL.

THIS AP FUNCTION IS NORMALLY CALLED UP BY THE AP EXECUTIVE, WHICH RETRIEVES THIS AP FUNCTION'S ID NUMBER FROM A FUNCTION CONTROL BLOCK READ FROM HOST MEMORY .

TITLE APFNC: EDGE DETECTION

NAME QVZER, 001 ;NAME AND VERSION FOR THE OBJECT MODULE.

PAGE

RADIX ; DEFAULT TO HEXADECIMAL RADIX.

INTERNALLY DEFINED GLOBALIZED SYMBOLS: (IGLOBL) ENTRY POINTS: ;NONE

SUBROUTINES: ;NONE

GENERAL SYMBOLS ;NONE

DATA MEMORY LABELS: ;NONE ; EXTERNALLY DEFINED GLOBALIZED SYMBOLS: (EGLOBL) ; ENTRY POINTS:

;NONE ; SUBROUTINES:

EGLOBL PLCHK1, FTLABT, PLDBF, NRMCND ; GENERAL SYMBOLS:

; NONE ; DATA MEMORY LABELS:

;NONE

;SYMBOL DEFINITIONS: ;NONE

; TERMINOLOGY : ;NONE

PAGE PMORG ; START OF RELOCATABLE CODE IN PROGRAM MEMORY.

;)+AP FUNCTION "QVZER' ; This AP Function performs an edge detection. This is actually a zero crossing; detection scheme. ; Call with: parameter list type = 1, number of arguments ; parameter list length = 12. ; word 9 argument #1 = ID of result Data Buffer "A". ; word 10 argument #l = Ignored. ; word 11 argument #2 = ID of source Data Buffer "B". ; word 12 argument #2 = Ignored. ; word 13 argument #3 = ID of source Data Buffer "C". ; word 14 argument #3 = Ignored . ; word 15 argument #4 = ID of source Data Buffer "D". word 16 argument #4 = Ignored . word 17 argument #S = ID of source Data Buffer word 17 argument #5 = Ignored .

; Exits to AP Executive's "Fatal Abort" Service:

If an error is found by AP Service Subroutine 'PLDBF' or 'PLCHK1'. ; >-

PAGE ;DEFINITION OF THE FUNCTION ID FOR THE AP EXECUTIVE FUNCTION TABLE:

FUNC %D810. QVZER ; FUNCTION ID AND ENTRY POINT NAME.

QVZER : ; SET UP FOR CALL TO PLCHK1

SETR R1=1 ; PARAMETER DESCRIPTOR TYPE

SETR R2=6 ; # OF ARGUMENTS

SETR R3=%D12 ; # OF WORDS IN ARG LIST

JSR PLCHK1 ; GO CHECK CORRECTNESS OF VALUES IN FCB.

JMP FTLABT ; RETURNS HERE IF ERROR ; IF OK, RETURNS HERE

SETR Rl5=6 ;

FETCH: JSR PLDBF ; FIND SOURCE DATA BUFFERS,

JMP FTLABT ; ALLOCATE RESULT DBF IF NECESSARY,

SET R1=R1+1 ; SET UP ARGUMENTS FOR A FUNCTION ADDR. CALL.

PUSH R1 ; UPON ERROR, EXIT THROUGH AP EXECUTIVE'S

DBNZ R15, FETCH ; FATAL ABORT ROUTINE.

POP R15 ; R15 --> ZER2

POP R14 ; R14 > ZER1

POP R13 ; R13 —> VE2

POP R12 ; R12 —> VO2

POP R11 ; R11 —> VE1

POP R10 ; R10 --> VO1

SETR R1=%HQF

SET R14=R14-1

SET R15=R15-1

STREG R1.R14.HI

STREG R1 ,R15,HI

SETR R1=0

STREGI R1 ,R14,LO

STREGI R1 ,R15.LO

START: LDREGI R3 ,R10 ;GET FIRST VO1 VALUE

LDREGI R4 ,R12 ;GET FIRST VO2 VALUE

SETR R8=0 ;FLAG FOR EVEN/ODD

TEST: SETR R9=0 ;FLAG FOR SIGN SKIPGE R3=R3

JMP NEG

SKIPGE R4=R4

JMP ZERO

CHK: SKIPLT R8 =R8 ; CHECK IF EVEN OR ODD

JMP CHKE ; IF ODD, CHK EVEN

FINISH: SET R14=R14+1 ;ELSE UPDATE POINTERS

SET R15=R15+1

NEXT: DBNZ R2 , START ;AND CHECK NEXT VALUE

JMP NRMCND ; CO TO NORMALIZE THE RESULT DATA, IF FCB CONTROL ; BIT INDICATES SUCH REQUIREMENT. ; A DIRECT BRANCH IS THE EQUIVALENT OF A "JSR" ; FOLLOWED BY AN "RTN" .

RTN

CHKE: LDREGI R3 ,R11 ; FETCH VE1

LDREGI R4 ,R13 ; FETCH VE2

SETR R8=-1 FLAG EVEN DATA

JMP TEST ;

NEG SKIPGE R4=R4

JMF CHK ;NO SIGN CHANCE

SKIPLT R8 =R8 ; CHECK FO NEG ODD

JMP CHKE

SETR R9 = -1 ;MARK FOR NEGATIVE #

ZERO : SKIPLT R9=R9 ;CHK SIGN

JMP NEGNO

SKIPLT R3 =R3 +R4 ;R3 IS -VE ;R4 IS +VE

JMP EVEP

A20: SKIPGE R8=R8

JMP EVEN

SETR R9=0

CODE: LDREG R5 ,R13 ;GET CORRES EVEN STRENGTHS

LDREC R6 ,R11

SKIPGE R5=R5

SETR R5=0

SKIPGE R6=R6

SETR R6= 0

SET R7=R6

SKIPGE R6=R6-R5 ; R7 IS MAX [R5,R6]

SET R7 =R5

SKIPNE R7=R7 'OR 'R7

JMP CHKE ;-VE VALUE NOT VALID FOR ODD

SETP. R6=%D600 ; NOISE THRESHOLD

SKIPLT R6=R6-R7

JMP CHKE ;NOISE

SETR R6=%H37 ;VERT ODD PIXEL

SKIPLT R9=R9

JMP OUT

STREGI R6 ,R14

SET R15=R15+1

JMP DONE OUT STREGI R6 ,R15

SET R14 =R14+1

DONE SET R11=R11+1

SET R13=R13 + 1

JMP NEXT

A10: SKIPGE R8=R8

JMP EVEP

SETR R9=-1

JMP CODE

EVEN: SET R6=R12-1

LDREG R5 , R6

SKIPGE R5=R5

SET RS='COMP' R5

SETR R6=%D1000

SKIPLT R6=R6-R5

JMP FINISH

SETR R6=%H36

STREGI R6 ,R15

SET R14=R14+1

JMP NEXT

EVEF : SET R6 =R10-1

LDREG R5.R6,

SKIPGE R5=R5

SET R5='COMP' R5

SETR R6=%D1000

SKIPLT R6=R6-R5

JMF FINISH

SETR R6=%H36

LDREG R7 ,R14

SKIPNE R7=R7 'XOR'%H37

JMP FINISH

STREGI R6 ,R14

SET R15=R15+1

JMP NEXT

NEGNO : SKIPGE R3=R3+R4

JMP A10

JMP A20

END

.NLIST TTM ;PRODUCE LISTING IN WIDE STYLE. .ENABL LC ;RETAIN LOWER-CASE CHARACTERS AS SUCH.

PROGRAM: HSTFNC: BYTE- UNPACKIG PART NUMBER: VERSION DATE: SEPTEMBER 7, 1982 AUTHOR : CHETANA SUCH HISTORY: DESCRIPTION: THIS FORTRAN-CALLABLE HOST FUNCTION CALLS UP AN AP-BASED AP FUNCTION IN ORDER TO PERFORM "UNPACKING"

.TITLE KUPAK HSTFNC: UNPACK DATA FROM BYTE TO WORD FORMAT .IDENT /VO1/ ; IDENTIFIER FOR THE OBJECT MODULE.

.PAGE ESTABLISH ASSEMBLY AND LISTING CONVENTIONS:

. NLIST TTM ; PRODUCE LISTING IN WIDE STYLE.

.DSAEL GSL ; FLAG NON-EXISTENT-SYMBOL REFERENCES AS ERRORS.

. ENABL LC ; RETAIN LOWER-CASE CHARACTERS AS SUCH.

.CSECT KUPAK ; ESTABLISH A NAMED CSECT.

; INTERNALLY DEFINED GLOBALIZED SYMBOLS:

GLOBL KUPAK ;EXTERNALLY DEFINED GLOBALIZED SYMBOLS:

.GLOBL KEXFCB ;AP MANAGER'S "FCB EXECUTION" SUBROUTINE.

.GLOBL .KWAIT ;AP MANAGER'S WAIT ROUTINE

.GLOBL MGRM67 ;AP MANAGER'S "FATAL ERROR #-67" EXIT ROUTINE.

.GLOBL COMCTL ;AP MANAGER'S "FCB CONTROL WORD".

;AP FUNCTION ID'S REFERENCED:

UPAK= ΛD814. ;ID FOR "UNPACKING".

; SYMBOL DEFINITIONS: ;NONE ;TERMINOLOGY:

; FCB - FUNCTION CONTROL BLOCK, READ BY THE AP EXECUTIVE FROM HOST

; MEMORY .

.PAGE ; >, +HOST FUNCTION "KUPAK"

.-THIS HOST FUNCTION CALLS UP A CORRESPONDING AP FUNCTION IN THE AP400.

;THIS HOST FUNCTION VERSION ASSUMES THAT SOURCE DATA ALREADY RESIDES IN ONE AP ;DATA MEMORY DATA BUFFERS, AND THAT THE RESULT DATA WILL BE PLACED IN RESULT ;AP DATA MEMORY DATA BUFFER WHICH WILL HAVE TWICE THE SIZE OF THE SOURCE.

;THE CORRESPONDING "UNPACKING" AP FUNCTION SHOULD BE REFERENCED FOR FURTHER : INFORMATION.

;CALL FROM FORTRAN VIA: ; SUBROUTINE CALL: CALL KUPAK ( DBIa, DBIb ) ; OR INTEGER FUNCTION CALL, AS: IERR = KUPAK ( DBIa, DBIb )

;WHERE: ; DBla = ID OF AP DATA BUFFER TO HOLD RESULT DATA ; "DBIa" MUST BE A SINGLE-WORD INTEGER VARIABLE OR CONSTANT. ; THIS BUFFER WILL BE TWICE THE SIZE OF THE SOURCE BUFFER. ; DBF SHOULD HAVE BEEN PREVIOUSLY ALLOCATED. ; DBIb = ID OF AP DATA BUFFER HOLDING SOURCE DATA SET. ; "DBIb" MUST BE A SINGLE-WORD INTEGER VARIABLE OR CONSTANT.

; RETURNS TO FORTRAN WITH:

; ALL ARGUMENTS RETURNED AS RECEIVED.

: FUNCTION EXECUTION "IN PROGRESS" OR "COMPLETE", DEPENDING UPON CURRENT

; AP MANAGER "RETURN" STATUS.

; IF CALLED AS A FORTRAN FUNCTION, THE VALUE RETURNED WILL BE AS SPECIFIED

; FOR REGISTER "R0", RETURNED FROM AN ASSEMBLY-LANGUAGE CALL.

; UPON ERROR, A STANDARD AP MANAGER ERROR EXIT WILL BE TAKEN.

;CALL FROM PDP-11 ASSEMBLY LANGUAGE VIA:

; A FORTRAN-COMPATIBLE CALL SEQUENCE.

;RETURNS TO CALL+1: (ALWAYS)

; ALL CONDITIONS AS DESCRIBED FOR THE FORTRAN FUNCTION CALL FORM, ABOVE. ; R0 = STATUS VALUE. (DEFINED BY AP MANAGER.) ; "KUPAK" DEFINFS NO UNIQUE VALUES. ; R1 = UNDEFINED. ; R2 = UNDEFINED. ; R5 = UNDEFINED.

; UPON ERROR, WHEN CALLED FROM FORTRAN OR ASSEMBLY LANGUAGE: ; IF A FATAL ERROR OCCURS DURING EXECUTION OF THIS HOST FUNCTION OR DURING ; EXECUTION OF A ROUTINE WHICH IT (IN TURN) CALLS (SUCH AS THE AP MANAGER ; OR AP DRIVER), THE AP MANAGER'S FATAL ERROR EXIT ROUTINE WILL BE CALLED , > -

.PAGE

KUPAK

CMPE (RS ) , #2 ; CHECK FOR PROPER NUMBER OF ARGUMENTS. BNE ERRORX ;IF NOT CORRECT NUMBER, HANDLE AS A FATAL ERROR .

TST (R5) + ;STEP POINTER AHEAD TO FIRST ARGUMENT ADDRESS.

TST FCBDON ; TEST FOR COMPLETION OF A PREVIOUS OPERATION. BNE 1 S ;A ZERO "DONE" FLAG INDICATES PREVIOUS OPERATION ; STILL IN PROGRESS

JSR PC ,KWAIT ;WAIT FOR THE AP TO FINISH PROCESSING

1S CLR FCBDON ;REINITIALIZE THE "DONE" FLAG

MOV COMCTL , FCBCTL ; RETRIEVE AP MANAGER'S COMMON CONTROL WORD IN ; ORDER TO UTILIZE CURRENTLY-SELECTED OPTIONS. ; PLACE IT IN FCB'S CONTROL WORD.

MOV @(RS)+, FCBARL ; MOVE RESULT DATA BUFFER ID "A" INTO FCB ; ARGUMENT LIST. ; STEP HOST MEMORY ADDRESS POINTER AHEAD.

MOV @(R5) + , FCBARL+4 ;MOVE SOURCE DATA BUFFER ID "B" INTO FCB ; ARGUMENT LIST. ; STEP HOST MEMORY ADDRESS POINTER AHEAD. ; (INCREMENTING R5 , ALTHOUGH UNNECESSARY, SAVES ; EXECUTION TIME AND ONE MEMORY WORD.)

MOV #MGRARG, R5 ;SET UP ADDRESS OF ARGUMENT LIST FOR CALL TO AP ; MANAGER .

JMP KEXFCB ; CALL UP THE AP MANAGER TO PROCESS THE FCB. ; A DIRECT BRANCH IS THE EQUIVALENT OF A "JSR", ; FOLLOWFD BY AN "RTS PC". ; "KEXFCB" WILL RETURN ITS STATUS VALUE IN ; PDP-11 REGISTER RO AS WELL AS IN LOCATION ; "STATUS" .

MGRARG. BR 2S ;BRANCH AROUND ARGUMENT LIST. (THIS INSTRUCTION ; PROVIDES "NUMBER OF ARGUMENTS" COUNT FOR AP ; MANAGER; THE BRANCH IS NEVER ACTUALLY TAKEN.)

.WORD FCBBLK ;ADDRESS OF FCB. .WORD STATUS ; ADDRESS FOR RETURNED STATUS.

2S : ;THIS LABEL MARKS THE END OF THE ARGUMENT LIST. ERRORX : JMP MGRM67 ;TAKE AN AP MANAGER STANDARD FATAL ERROR EXIT ; RETURN STATUS CODE -67 TO INDICATE "IMPROPER ; NUMBER OF ARGUMENTS IN PARAMETER LIST".

STATUS : . WORD ;TEMPORARY STORAGE LOCATION FOR RETURNED AP ; MANAGER STATUS .

.PAGE

; FUNCTI ON CONTROL BLOCK

FCBBLK

FCEID: .WORD UPAK ; ID OF THE AP FUNCTION. FCBCTL .WORD 0 ;CONTROL WORD FCBDON: .WORD 1 ; DONE FLAG. INITIALIZED TO "DONE" STATE FCBLNK: .WORD 0 ; (HIGH-ORDER.) HOST MEMORY ADDRESS LINK TO NEXT .WORD 0 ;(LOW-ORDER.) FCB IN HOST MEMORY. (NONE.)

FCBPLT: .WORD 1 ;FCB PARAMETER LIST TYPE. (DATA BUFFER ID'S.) FCBNRG. .WORD 2 ;NUMBER OF ENTRIES IN ARGUMENT LIST. FCBLEN .WORD 4 ; LENGTH OF ARGUMENT LIST IN HOST MEMORY WORDS

FCBARL: .WORD 0 ;RESULT DATA BUFFER ID "A" ARGUMENT. .WORD 0 , FIRST WORD » DBF ID, SECOND WORD = 0.

WORD 0 ; SOURCE DATA BUFFER ID ' E" ARGUMENT. .WORD 0 ; FIRST WORD = DBF ID; SECOND WORD = 0.

.END

; ;

; PROGRAM: APFNC: UNPACKING OF DATA ;

; PART NUMBER: ; ; VERSION DATE: SEPTEMBER 7, 1982

; AUTHORS : CHETANA BUCH

; HISTORY:

; DESCRIPTION: THIS AP-BASED AP FUNCTION PERFORMS UNPACKING OF DATA IN ; THE AP FROM BYTE FORMAT TO WORD FORMAT.

; THIS AP FUNCTION IS NORMALLY CALLED UP BY THE AP EXECUTIVE, WHICH

; RETRIEVES THIS AP FUNCTION'S ID NUMBER FROM A FUNCTION CONTROL BLOCK ; READ FROM HOST MEMORY . ; ;

TITLE APFNC: UNPACK DATA

NAME QUPAK, 001 ;NAME AND VERSION FOR THE OBJECT MODULE.

PAGE RADIX H ;DEFAULT TO HFXADECIMAL RADIX.

; INTERNALLY DEFINED GLOBALIZED SYMBOLS: (IGLOBL) ; ENTRY POINTS:

;NONE ; SUBROUTINBS:

;NONE ; GENERAL SYMBOLS

;NONE ; DATA MEMORY LABELS:

;NONE

; EXTERNALLY DEFINED GLOBALIZBD SYMBOLS: (EGLOBL) ; ENTRY POINTS: ; NONE ; SUBROUTINES:

EGLOBL PLCHK1, FTLABT, PLDBF, NRMCND ; GENERAL SYMBOLS : ;NONE ; DATA MEMORY LABELS:

;NONE

;SYMBOL DEFINITIONS: ;NONE

;TERMINOLOGY: ;NONE

PAGE

PMORG ; START OF RELOCATABLE CODE IN PROGRAM MEMORY.

,->+AP FUNCTION "QUPAK"

; This AP Function performs unpacking of data from a source buffer.The resulting; buffer will be twice the size of the the source buffer. ; Call with: parameter list type = 1, number of arguments 2,; parameter list length = 4. ; word 9 argument #1 = ID of result Data Buffer "A". ; word 10 argument #1 = Ignored . ; word 11 argument #2 = ID of source Data Buffer "B" ; word 12 argument #2 = Ignored. ; Exits to AP Executive's "Fatal Abort" Service: ; If an error is found by AP Service Subroutine 'PLDBF' of 'PLCHK1'. ,>-

PAGE ; DEFINITION OF THE FUNCTION ID FOR THE AP EXECUTIVE FUNCTION TABLE:

FUNC %D814 , QUPAK ; FUNCTION ID AND ENTRY POINT NAME. QUPAK: ; SBT UP FOR CALL TO PLCHK1

SETR R1=1 ; PARAMETER DESCRIPTOR TYPE

SETR R2=2 ; # OF ARGUMENTS

SETR R3=4 ; # OF WORDS IN ARG LIST

JSR PLCHK1 ; GO CHECK CORRECTNESS OF VALUES IN FCB.

JMP FTLABT ; ; RETURNS HERE IF ERROR ;IF OK, RETURNS HERE

JSR PLDBF

JMP FTLABT

SET R15=R1 ; POINTS TO RESULT BUFFER

JSR PLDBF

JMP FTLABT ; R1 POINTS TO SECOND SOURCE BUFFER

LDREGI R10 , R1 ; FETCH BEX/NSN

STREGI R10 , R15

NEXT. LDREGI R3 ,R1 ; FETCH NEXT WORD

SET R4=R3

SETR R6=%HFF ;SET MASK

SET R3=R3 'AND'R6 ;R3 — >LS BYTE WORD

SETR R5=8

SHIFT : SET R4=R4/2 ; SHIFT RIGHT

DBNZ R5 ,SHIFT

SET R4=R4 'AND'R6 ;R4 —>MS BYTE WORD

STREGI R3 ,R15

STRBGI R4 ,R15

DBNZ R2 ,NEXT

JMP NRMCND ; GO TO NORMALIZE THE RESULT DATA, IF FCB CONTROL ; BIT INDICATES SUCH REQUIREMENT. ; A DIRECT BRANCH IS THE EQUIVALENT OF A "JSR" ; FOLLOWED BY AN "RTN" .

RTN END

.NLIST TTM ;PRODUCE LISTING IN WIDE STYLE. . ENABL LC ;RETAIN LOWER-CASE CHARACTERS AS SUCH. ; ; ; PROGRAM: HSTFNC: OR- ING OF TWO DATA BUFFERS ; ; PART NUMBER: ; ; VERSION DATE: SEPTEMBER 7, 1982 ; ; AUTHOR : CHETANA BUCH ; ; HISTORY: ; ; DESCRIPTION: THIS FORTRAN-CALLABLE HOST FUNCTION CALLS UP AN AP-BASED ; AP FUNCTION IN ORDER TO PERFORM "OR- ING" ; OPERATION BETWEEN THE RESPECTIVE ELEMENTS OF TWO AP DATA MEMORY DATA BUF FERS ; ;

.TITLE KORDB - HSTFNC: OR TWO DATA BUFFERS

.IDENT /VO1/ IDENTIFIER FOR THE OBJECT MODULE.

.PAGE

; ESTABLISH ASSEMBLY AND LISTING CONVENTIONS:

. NLIST TTM ; PRODUCE LISTING IN WIDE STYLE.

.DSABL GBL ;FLAG NON-EXISTENT-SYMBOL REFERENCES AS ERRORS.

.ENABL LC ;RETAIN LOWER-CASE CHARACTERS AS SUCH.

.CSECT KORDB ; ESTABLISH A NAMED CSECT.

; INTERNALLY DEFINED GLOBALIZED SYMBOLS: .GLOBL KORDB

.EXTERNALLY DEFINED GLOBALIZED SYMBOLS:

.GLOBL KEXFCB ; AP MANAGER'S "FCB EXECUTION" SUBROUTINE.

. GLOBL KWA IT ; AP MANAGER'S WAIT ROUTINE

.GLOBL MGRM67 ; AP MANAGER'S "FATAL ERROR #-67" EXIT ROUTINE.

.GLOBL COMCTL ; AP MANAGER'S "FCB CONTROL WORD".

;AP FUNCTION ID'S REFERENCED:

ORDB= ΛD812. ; ID FOR "OR- ING' ; SYMBOL DEFINITIONS: ;NONE

,TERMINOLOGY:

; FCB - FUNCTION CONTROL BLOCK, READ BY THE AP EXECUTIVE FROM HOST

; MEMORY .

.PAGE ;>+HOST FUNCTION "KORDB"

;THIS HOST FUNCTION CALLS UF A CORRESPONDING AP FUNCTION IN THE AP 400.

;THIS HOST FUNCTION VERSION ASSUMES THAT SOURCE DATA ALREADY RESIDES IN TWO AP

;DATA MEMORY DATA BUFFERS, AND THAT THE RESULT DATA WILL BE PLACED IN ONE OF THE

SE

;AP DATA MEMORY DATA BUFFER.

;THE CORRESPONDING "OR-ING" AP FUNCTION SHOULD BE REFERENCED FOR FURTHER ; INFORMATION.

,CALL FROM FORTRAN VIA:

, SUBROUTINE CALL: CALL KORDB ( DBIa , DBIb ) ; OR INTEGER FUNCTION CALL, AS: IERR at KORDB ( DBIa, DBIb ) ;WHERE : ; DBIa = ID OF AP DATA BUFFER TO HOLD RESULT DATA AND CONTAINS SOURCE DAT, "DBIa" MUST BE A SINGLE-WORD INTEGER VARIABLE OR CONSTANT. ; DBF NEED NOT HAVE BEEN PREVIOUSLY ALLOCATED . ; IF NOT ALREADY ALLOCATED, DBF WILL BE ALLOCATED; SIZE WILL EQUAL; THAT OF SOURCE DATA BUFFERS. ; IF RESULT DBF WAS PREVIOUSLY ALLOCATED, IT MUST BE OF SIZE EQUAL ; OR GREATER THAN SOURCE DATA BUFFERS. ; DBIb = ID OF AP DATA BUFFER HOLDING SOURCE DATA SET. ; "DBIb" MUST BE A SINGLE-WORD INTEGER VARIABLE OR CONSTANT. ; DBF MUST HAVE BEEN PREVIOUSLY ALLOCATED IN AP DATA MEMORY. ; DATA BUFFERS DBlb , DBIc ,DBId ,DBIe MUST BE OF EQUAL LENGTH. ;RETURNS TO FORTRAN WITH: ; ALL ARGUMENTS RETURNED AS RECEIVED. ; FUNCTION EXECUTION "IN PROGRESS" OR "COMPLETE", DEPENDING UPON CURRENT; AP MANAGER "RETURN" STATUS . ; IF CALLED AS A FORTRAN FUNCTION, THE VALUE RETURNED WILL BE AS SP EC I F I ED; FOR REGISTER "R0", RETURNED FROM AN ASSEMBLY-LANGUAGE CALL. ; UPON ERROR, A STANDARD AP MANAGER ERROR EXIT WILL BE TAKEN.

;CALL FROM PDP-11 ASSEMBLY LANGUAGE VIA:

; A FORTRAN-COMPATIBLE CALL SEQUENCE.

.RETURNS TO CALL+1: (ALWAYS)

; ALL CONDITIONS AS DESCRIBED FOR THE FORTRAN FUNCTION CALL FORM, ABOVE.

R0 = STATUS VALUE. (DEFINED BY AP MANAGER.) : "KORDB" DEFINES NO UNIQUE VALUES.

; R1 = UNDEFINED. ; R2 = UNDEFINED. ; R5 = UNDEFINED. ;UPON ERROR, WHEN CALLED FROM FORTRAN OR ASSEMBLY LANGUAGE: , IF A FATAL ERROR OCCURS DURING EXECUTION OF THIS HOST FUNCTION OR DURING ; EXECUTION OF A ROUTINE WHICH IT (IN TURN) CALLS (SUCH AS THE AP MANAGER

; OR AF DRIVER), THE AP MANAGER'S FATAL ERROR EXIT ROUTINE WILL BE CALLED.;>-

.PAGE

KORDE :

CMPB (R5), #2 ; CHECK FOR PROPER NUMBER OF ARGUMENTS.

BNE ERRORX ; IF NOT CORRECT NUMBER , HANDLE AS A FATAL ERROR

TST (R5) + ;STEP POINTER AHEAD TO FIRST ARGUMENT ADDRESS.

TST FCBDON ; TEST FOR COMPLETION OF A PREVIOUS OPERATION.

BNE 11 ; A ZERO "DONE" FLAG INDICATES TREVIOUS OPERATION ; STILL IN PROGRESS.

JSR PC, KWAIT ;WAIT FOR THE AP TO FINISH PROCESSING

1S : CLR FCBDON ; REINITIALIZE THE "DONE" FLAG.

MOV COMCTL, FCBCTL ; RETRIEVE AP MANAGER'S COMMON CONTROL WORD IN ; ORDER TO UTILIZE CURRENTLY-SELECTED OPTIONS. ; PLACE IT IN FCB'S CONTROL WORD.

MOV @(R5) +, FCBARL ; MOVE RESULT DATA BUFFER ID "A" INTO FCB ; ARGUMENT LIST. ; STEP HOST MEMORY ADDRESS POINTER AHEAD.

MOV @(R5) +, FCBARL+4 ;MOVE SOURCE DATA BUFFER ID "B" INTO FCB ; ARGUMENT LIST. ; STEP HOST MEMORY ADDRESS POINTER AHEAD. ; (INCREMENTING R5 , ALTHOUGH UNNECESSARY, SAVES ; EXECUTION TIME AND ONE MEMORY WORD.)

MOV #MGRARG, R5 ;SET UP ADDRESS OF ARGUMENT LIST FOR CALL TO AP ; MANAGER . JMP KEXFCB ;CALL UP THE AP MANAGER TO PROCESS THE FCB . ; A DIRBCT BRANCH IS THE EQUIVALENT OF A "JSR", ; FOLLOWED BY AN "RTS PC". ; "KEXFCB" WILL RETURN ITS STATUS VALUE IN ; PDP-11 REGISTER RO AS WELL AS IN LOCATION ; "STATUS" .

MGRARG: BR 2S ; BRANCH AROUND ARGUMENT LIST. (THIS INSTRUCTION ; PROVIDES "NUMBER OF ARGUMENTS" COUNT TOR AP ; MANAGER; THE BRANCH IS NEVER ACTUALLY TAKEN.)

.WORD FCBBLK ; ADDRESS OF FCB.

.WORD STATUS ; ADDRESS FOR RETURNED STATUS.

2S : :THIS LABEL MARKS THE END OF THE ARGUMENT LIST.

ERRORX. JMP MGRM67 ; TAKE AN AP MANAGER STANDARD FATAL ERROR EXIT. ; RETURN STATUS CODE -67 TO INDICATE "IMPROPER ; NUMBER OF ARGUMENTS IN PARAMETER LIST".

STATUS . . WORD 0 ;TEMPORARY STORAGE LOCATION FOR RETURNED AP ; MANAGER STATUS.

.PAGE .FUNCTION CONTROL BLOCK:

FCBBLK:

FCBID .WORD ORDB ; ID OF THE AP FUNCTION.

FCBCTL. .WORD 0 ; CONTROL WORD.

FCEDON: .WORD . 1 ; DONE FLAG. INITIALIZED TO "DONE" STATE.

FCBLNK: .WORD 0 ; (HIGH-ORDER.) HOST MEMORY ADDRESS LINK TO NEXT

. WORD 0 ; (LOW-ORDER.) FCB IN HOST MEMORY. (NONE.)

FCBPLT: .WORD 1 ;FCB PARAMETER LIST TYPE. (DATA BUFFER ID'S.) FCBNRG. .WORD 2 ;NUMBER OF ENTRIES IN ARGUMENT LIST. FCBLEN: .WORD 4 ;LENGTH OF ARGUMENT LIST IN HOST MEMORY WORDS.

FCBARL: .WORD 0 ;RESULT DATA BUFFER ID "A" ARGUMENT. .WORD 0 ; FIRST WORD = DBF ID; SECOND WORD

.WORD 0 ;SOURCE DATA BUFFER ID "B" ARGUMENT .WORD 0 ; FIRST WORD = DBF ID; SECOND WORD = 0.

.END

; ; ; PROGRAM: APFNC: OR-ING TWO DATA BUFFERS ; ; PART NUMBER: ; ; VERSION DATE: SEPTEMEER 7. 1982 ; ; AUTHORS : CHETANA BUCH ; ; HISTORY: ; ; DESCRIPTION: THIS AP-BASED AP FUNCTION PERFORMS A LOGICAL 'OR' BETWEEN ; EACH ELEMENT OF TWO DATA BUFFERS. ; ; THIS AP FUNCTION IS NORMALLY CALLED UP BY THE AP EXECUTIVE, WHICH ; RETRIEVES THIS AP FUNCTION'S ID NUMBER FROM A FUNCTION CONTROL BLOCK; READ FROM HOST MEMORY. ; ;

TITLE APFNC: LOGICL-OR

NAME QORDB, 001 ;NAME AND VERSION FOR THE OBJECT MODULE.

PAGE

RADIX H ; DEFAULT TO HEXADECIMAL RADIX. ; INTERNALLY DEFINED GLOBALIZED SYMBOLS: (IGLOBL) ; ENTRY POINTS: ;NONE ; SUBROUTINES: ;NONE ; GENERAL SYMBOLS ;NONE ; DATA MEMORY LABELS: ;NONE ; EXTERNALLY DEFINED GLOBALIZED SYMBOLS: (EGLOBL) ; ENTRY POINTS: ;NONE ; SUBROUTINES:

EGLOBL PLCHK1, FTLABT, PLDBF, NRMCND ; GENERAL SYMBOLS:

;NONE ; DATA MEMORY LABELS:

;NONE

;SYMBOL DEFINITIONS ; NONE

; TERMINOLOGY: ;NONE

PAGE PMORG ; START OF RELOCATABLE CODE IN PROGRAM MEMORY.

; >+AP FUNCTION "QORDB" ; This AF Function performs a logical or between two data buffers. ; Call with: parameter list type = 1, number of arguments = 2,; parameter list length = 4. ; word 9 argument #1 = ID of source and result Data Buffer "A "; word 10 Argument #1 = Ignored . ; word 11 Argument #2 = ID of source Data Buffer "B". ; word 12 argument #2 = Ignored . ; Exits to AF Executive's "Fatal Abort" Service: ; If an error is found by AP Service Subroutine 'PLDBF' or 'PLCHK1'. ;>-

PAGE ;DEFINITION OF THE FUNCTION ID FOR THE AP EXECUTIVF FUNCTION TABLE: FUNC %D812, QORDB ; FUNCTION ID AND ENTRY POINT NAME.

QORDB: ; SET UP FOR CALL TO PLCHK1

SETR R1=1 ; PARAMETER DESCRIPTOR TYPE

SETR R2=2 ; # OF ARGUMENTS

SETR R3=4 ; # OF WORDS IN ARG LIST

JSR PLCHK1 ; GO CHECK CORRECTNESS OF VALUES IN FCB.

JMF FTLABT ;RETURNS HERE IF ERROR ;IF OK, RETURNS HERE

JSR PLDBF

JMP FTLABT

SET R11=R1 ; POINTS TO SOURCE/RESULT BUFFER

JSR PLDBF

JMP FTLABT ;R1 POINTS TO SECOND SOURCE BUFFER

SET R2=R2+1 ;;LENGTH ( + FOR BEX/NSN OF BUFFER )

OR: LDREG R14.R11 ;FETCH DATA FROM FIRST SOURCE BUFFER

LDRECI R15,R1 ;ALSO FROM SECOND

SET R14=R14 'OR' R15 ;LOGICAL-OR

STREGI R14 ,R11 ; STORE RESULT BACK IN SOURCE 1 BUFFER

DBNZ R2 , OR

JMP NRMCND ;GO TO NORMALIZE THE RESULT DATA, IF FCE CONTROL ; BIT INDICATES SUCH REQUIREMENT.

A DIRECT BRANCH IS THE EQUIVALENT OF A "JSR" FOLLOWED BY AN "RTN"

RTN END

STAGE MOVEMENT AND IMAGE ACQUISITION

<* ******************************************** *********************************

STAGET.MG - THIS MODULE LOADS ALL OF THE MODULES USED IN "STAGET"

***************************************************************************************** * > ext PDPID ext mixlib ext DMISC ext VADD ext STGREG ext 22BADDR ext STGGRB ext STGCOM ext CMOTOR ext [5, 1] INSPLAN ext SQROOT save STAGE

<* INTEGER VECTOR ROUTINES *>

IF ( LOOKUP ( 'VADD ) )

PRINT "VADD ALREADY LOADED"

ENDFILE ENDIF

.MAC

; VADD — ADD TWO VECTORS OF ANY LENGTH

; CALL: VADD ( IVEC1 . IVEC2 . LENGTH )

; CALCULATES: IVEC2 ( I ) : = IVEC1 ( I ) + IVEC2 ( I )

ENTRY VADD

MOV (MSP)+ , R0 GET THE LENGTH

MOV (MSP)+ , R1 GET THE ADDRESS OF IVEC2

MOV (MSP)+ , R2 GET THE ADDRESS OF IVEC1

0S : ADD (R2)+ ( R1) + ADD THE COMPONENTS AND INCREMENT THE POINTERS DEC R0 DECREMENT COUNTER AND CHECK DONE BNE 0S

NEXT

VSUB — SUBTRACT TWO VECTORS CALL: VSUB ( IVEC1 , IVEC2 , LENGTH )

CALCULATES: IVEC2 ( I ) := IVEC2 ( I ) - IVECl ( I ) ENTRY VSUB

MOV (MSF)+ , R0 ; LENGTH

MOV (HSP)+ , R1 ; ADDRESS OF IVEC2

MOV (MSP)+ . R2 ; ADDRESS OF IVEC1

1 S : SUB ( R 2 ) + (R1 ) + ; SUBTRACT COMPONENTS AND INCREMENT POINTERS DE C R0 ; DECREMENT COUNTER AND CHECK DONE BNE 1 S

NEXT ; VMASK — MASK ALL THE ELEMENTS IN A VECTOR ; CALL VMASK ( IVEC , MASK , LENGTH ) ; CALCULATES: IVEC ( I ) := IVEC ( I ) and MASK

ENTRY VMASK

MOV (MSP)+ , R0 ; LENGTH

MOV (MSF)+ , R1 ; MASK

KOV (MSF)+ , R2 ; ADDRESS OF IVEC

COM Rl ; COMPLEMENT THE MASK. BIC DOES- -SRC and DST

2S : BIC R1 , (R2) + ; AND THE COMPONENT WITH MASK AND INCR POINTER DEC R0 ; DECREMENT COUNTER AND CHECK DONE BNE 2S

NEXT

; VMAX -- FIND THE INDEX OF THE MAXIMUM VALUE IN A VECTOR ; CALL: INDEX := VMAX ( IVEC , LENGTH )

ENTRY VMAX

MOV (MSP)+ , R0 ; LENGTH

MOV' (MSP) , R1 ; ADDRESS OF IVEC. KEEP ON STACK

MOV R1 , R2 ; ASSUME 1ST ELEMENT SAVE ADDRESS OF 1ST ELT

MOV (R1) , R3 ; SAVE VALUE OF 1ST ELEMENT

3S : CMP R3 , (R1) ; COMPARE CURRENT MAX TO COMPONENT

BGE 4S ; IF MAX > COMPONENT LEAVE IT

MOV (R1) , R3 ; NEW MAX VALUE

MOV R1 , R2 ; NEW ADDR OF MAX VALUE

4S : ADD # 2 , R1 ; INCREMENT ARRAY INDEX

DEC R0 ; DECREMENT COUNTER AND CHECK DONE

BNE 3S

8S : SUB (MSP) , R2 ; ENTRY FOR VMIN ALSO. SUBTRACT ADDR OF MAX VAL

MOV R2 , (MSP) ; FROM ADDR OF IVEC AND STORE DIFFERENCE ON STAC

K

ASR (MSP) ; DIVIDE RESULT BY 2 TO GET NUMBER OF WORDS

NEXT ; VMIN — FIND INDEX OF MINIMUM VALUE IN A VECTOR ; CALL: INDEX : =. VMIN ( IVEC , LENGTH ) ENTRY VMIN

MOV (MSP)+ , R0 ; LENGTH MOV (MSP) , R1 ; ADDR OF IVEC KEEP ON STACK MOV R1 , R2 ; ASSUME 1ST ELT STOKE ADDR OF 1ST ELT KOV (R1) , R3 ; STORE VALUE OF 1ST ELT CURRENT MAX

SS CMP R3 , (R1 ) ; COMPARE CURRENT MAX TO COMPONENT

BLE 6 aS ; I'F MAX ) COMPONENT, LEAVE IT

MOV (R1 ) , R3 ; NEW MAX VALUE

MOV R1 , R2 ; NEW MAX VALUE ADDR

65 ADD # 2 R1 ; INCREMENT ARRAY POINTER

DEC R0 ; DECREMENT COUNTER AND CHECK DONE

BNE 5S

JMP 8S ; CALCULATE INDEX AND RETURN ; VSDIV — DIVIDE A VECTOR BY A SCALAR ; CALL: VSDIV ( IVEC , SCALAR , LENGTH ) ; CALCULATES: IVEC ( I ) : = IVEC ( I ) / SCALAR

ENTRY VSDIV

MOV (MSP)+ , R3 ; LENGTH

MOV (MSP)+ , R2 ; SCALAR

MOV @ 0 (MSP) , R1 ; ADDR O F IVEC STILL ON STACK GET ELEMENT

SXT R0 ; IF (0 SET HIGH 16 BITS TO -1 ELSE CLEAR THEM

DIV R2 , R0 ; 32 BIT DIVIDE. QUOTIENT IN RO , REMAINDER IN R1

MOV R0 , @ 0 (MSP) ; STORE QUOTIENT BACK IN ELEMENT

ADD # 2 (MSP) ; UPDATE THE ARRAY POINTER DEC R3 ; DECREMENT COUNTER AND CHECK DONE BNE 7S

CLR (MSP)+ ; POP THE ADDRESS OF IVEC OFF STACK NEXT ; VSMUL —- MULTIPLY A VECTOR BY A SCALAR ; CALL: VSMUL ( IVEC , SCALAR , LENGTH ) ; CALCULATES: IVEC ( I ) : = IVEC ( I ) * SCALAR E NTR Y VSMUL

MOV (MSP)+ , R3 ; LENGTH

MOV (MSP)+ , R2 ; SCALAR 9 S : MOV 9 0 (MSP) , R1 ; ADDR OF IVEC STILL ON STACK. GET ELEMENT

MUL R2 , R1 ; MULTIPLY. ONLY 16 BITS SINCE SRC IS R1

MOV R1 , @ 0 (MSP) ; PUT RESULT IN ELEMENT

ADD # 2 , (MSP) ; UPDATE ARRAY POINTER

DEC R3 ; DONE?

BNE 9 S

CLR (MSP)+ ; POP ADDRESS OF IVEC OFF STACK NEXT

.LOCAL ; RESET LOCAL SYMBOLS

; VPOS -- CONVERT ALL NEGATIVE ELEMENTS IN A VECTOR TO POSITIVE ; SET ALL POSITIVE ELEMENTS TO IVAL . . . IF IVAL=0 LEAVE ALONE ; CALL: VPOS ( IVEC , IVAL , LENGTH ) ; CALCULATES: IF ( IVEC ( I ) ( O ) IVEC ( I ) := 0 ; ; END IF ; IF ( IVAL () O ) IVEC ( I ) := IVAL ENDIF

ENTRY VPOS

MOV (MSP) + , R0 ; LENGTH

MOV (MSP) + , R1 ; IVAL

MOV (MSP) + , R2 ; ADDRESS OF IVEC

0S TST (R2) ; TEST THE COMPONENT OF IVEC

BPL 1S ; IF >= 0 GO TO 1S

CLR (R2) ; SET ELEMENT TO 0

BR 2S ; LOOP

1S TST R1 ; TEST IVAL

BEQ 2S ; IF 0 IGNORE

MOV R1 , (R2) ; SET ELEMENT TO IVAL

2S: ADD # 2 , R2 ; UPDATE ARRAY POINTER

DEC R0 ; DONE?

BNE 0S

NEXT ; VDOT — TAKE SCALAR PRODUCT OF TWO VECTORS ; CALL: PRODUCT := VDOT ( IVEC1 , IVEC2 , LENGTH ) ; CALCULATES: PRODUCT := SUM-OVER-I ( IVEC1 ( I ) * IVEC2 ( I ) )

ENTRY VDOT INTEGER

MOV (MSP)+ , R3 ; LENGTH

MOV (MSP)+ , R2 ; ADDRESS OF IVEC2

CLR R0 ; CLEAR SUM

3S : MOV (R2) + , R1 ; GET ELT OF IVEC2 AND UPDATE ARRAY POINTER

MUL @ 0 (MSP) , R1 ; ADDR OF IVEC1 IS STILL ON STACK. GET ELT OF IV

EC1

ADD R1 , R0 ; ADD COMPONENT PRODUCT TO SUM

ADD # 2 , (MSP) ; UPDATE IVEC1 ARRAY POINTER

DEC R3 ; DONE

BNE 3S

MOV R0 , (MSP) ; STORE SUM ON STACK

NEXT

.END

parameter WCR : = 1724101c ; DMA word count register. parameter BAR : = 1724121c ; Bus address register for DMA. parameter CSR : = 172414k ; Control status register parameter DBR : = 172416k ; Data buffer register. long PHYADR ; Physical (22-bit) address of the buffer

Integer OUTLN ( 256. )

define ATIOFAGE with M_IOPACE ATTRG ( "IOPAGE' 160000K ) end

<* Wait until DMA operation is complete. (Moni tors BUSY bit.) *> define WBUS?Y while ( peek ( CSR ) AND 200k ) repeat end define RDLN integer BUFF ( 1 ) x0 x1 y0 y1 PHYADR := 22ADDR ( BUFF ) poke ( 130000k + X0 - 1 , DBR ) poke ( 114000k + Y0 . DBR )

poke ( -- XL / 2 , WCR )

; poke ( — ( XL * YL ) , WCR ) poke ( lsword ( PHYADR ) , BAR ) poke ( 0 , DBR ) poke ( msword ( PHYADR ) CSR ) end

integer MOTCH char buf ( 30 ) TERM ( 5 ) integer bufptr integer tempro .mac label CMOTAST mo v r0 , @ # ptr ( t emp r 0 ) mov @ # ptr ( bufptr ) , r0 movb (rp) + , (r0) cmpb # 15k , (r0) + bne 0$ clrb (r0) mov # 21. , -(rp) mov # bytewd ( 2 33. ) , -(rp) emt 377k

OS : mov @ # ptr ( tempr0 ) , r0 ine @ # ptr ( bufptr ) mov # bytewd ( 1 115 ) -(rp) ; return from ast emt 377k end

make 'SGRBMOT Sattach 1410k CMOTAST 0 base NO_OP ; detterm

define GRBMOT apush cich cich : = MOTCH

SGRBMOT apop end make 'wtse rsxcall bytewd ( 2 41. ) make 'CLEFS rsxcall bytewd ( 2 31. ) define bfwrl integer buff but ptr : = buf

CLEFS ( 21. ) wrl ( MOTCH buff ) wtse ( 21. ) end

parameter CRCHR : = 15k record DEV_REC integer DEVNUM long LOLIMIT long UFLIMIT endrecord DEV_REC XAXIS YAXIS ZAXIS with XAXIS

DEVNUM := ascii 1 with YAXIS

DEVNUM := ascii 2 with ZAXIS

DEVNUM := ascii 3 char BUFF ( 20 ) integer STEPSIZE

define INITMOT

MOTCH := open ( TERM , ' rwa ) poke ( 2 , fdb ( MOTCH ) ) GRBMOT end

define MOTCOM command integer CHAR

#tyo ( DEVNUM ) iter cmdont #tyo ( CHAR )

nx t ar g loop

#tyo ( CRCHR ) encode ( BUFF ) bfwrl ( BUFF ) end

; Switches the box on define BXON

MOTCOM ascii E end ; Switches the box off define BXOFF

MOTCOM ascii F end define JON

MOTCOM ascii J ascii 1 end define JOFF

MOTCOM ascii J ascii 0 end ; Stop the move define STP

MOTCOM ascii S end define WBUSYM

MOTCOM ascii R end ; Normal mode is single move mode. The motor accelerates ; to the programmed velocity , runs at constant velocity ; for a predetermined period and decelerates and stops when ; total number of counts programmed by position have been sent define NORMALMODE

MOTCOM ascii M , ascii N end ; ; Continuous mode accelerates the motor to the programmed velocity ; and holds that velocity until stopped. ; define CONTMODE ; MOTCOM ascii M , ascii C ; end ;

; Alternates the defined move in opposite directions ; until stop is pressed. ; define ALTMODE ; MOTCOM ascii M , ascii A ; end ; ; This routine reports relative position at the end of the move; ; define RELPOS

#tyo ( DEVNUM )

#tyo ( ascii P )

#tyo ( 40k ) encode ( BUFF )

BFWRL ( BUFF ) end ; ; Position report back of the motor shaft during move. ; New position at every 4 msec, define CURPOS

MOTCOM ascii W , ascii 2 end ; ; Absolute position relative to the last time the position ; counter was cleared. define ABSPOS #tyo ( DEVNUM )

#tyo ( ascii X )

#tyo ( ascii 1 )

#tyo ( 40k ) encode ( BUFF )

EFWRL ( BUFF ) ; MOTCOM ascii X , ascii 1 end ;

; Clear the absolute position counter define CLEARIND

MOTCOM ascii X , ascii 0 end ;

; Changes the report back ASCII strings into long integers. define CONVERT long bpoke ( 0 , bp ( bufptr - 1 ) ) inp := buf eol off word drop word drop eol on if ( Iliteral ( tbuf ) ) endif

CONVERT := IIval end

; define CONVERT long ; mvzer ( BUFF , 10 ) ; rdl ( MOTCH , BUFF ) drop ; if ( lliteral ( BUFF ) ) CONVERT : = Ilval endif ; end ; ; Set up the lower limit for position ; define SETLO ; ABSPOS ; LOLIMIT := CONVERT ; end ; ; Set up the upper limit for position, ; define SETUP ; ABSPOS ; UPLIMIT := CONVERT ; end ; ; Set the acceleration of the motor shaft in rps/s

define ACCEL command real N if ( cmdcnt ==0 ) N := 0.2 endif

#tyo ( DEVNUM )

#tyo ( ascii A ) mvzer ( BUFF , 10 ) print #p ascii 0 , #f 6 3 , N , #n

#tyo ( CRCHR ) encode ( BUFF ) ; wrl ( MOTCH , BUFF ) bfwrl ( BUFF ) ; rdl ( MOTCH , BUFF ) drop end ;

; Set the delay desired between two commands in seconds.

<* define TIMEDELAY command real N if ( cmdcnt ==0 ) N : = 1.0 endif

#tyo ( DEVNUM )

#tyo ( ascii T ) mvzer ( BUFF , 10 ) print #p ascii 0 , #f 6 3 , N , #n

#tyo ( CRCHR ) encode ( BUFF ) ; wrl ( MOTCH , BUFF ) bfwrl ( BUFF ) rdl ( MOTCH , BUFF ) drop end *> ; ; Set the velocity of motor in real values

define VELOCITY command real N if ( cmdcnt ==0 ) N := 0.1 endif

#tyo ( DEVNUM ) tt ys ( ascii V ) mvzer ( BUFF , 10 ) print #p ascii 0 , #f 6 3 , N , #n

#tyc ( CRCHR ) encode ( BUFF ) ;; wrl ( MOTCH , BUFF ) bfwrl ( BUFF ) ;; rdl ( MOTCH , BUFF ) drop end ; ; Set the motor position in (+) ve or (-) ve direction ; with respect to the current position in terms of motor; pulses. 25000 pulses /rev and 10 pulses = 1 micron.; define POSITION command long N #tyo ( DEVNUM ) #tyo ( ascii D ) mvzer ( BUFF , 10 ) print #i 0 , N , #n #tyo ( CRCHR ) encode ( BUFF ) ; wrl ( MOTCH , BUFF ) bfwrl ( BUFF ) ; rdl ( MOTCH , BUFF ) drop end ; Set scale for number motor pulses per least significant digit ; of position data. The value of scale factor is integer and ; varies from 1 to 255 inclusive. ; ; define SCALEFACTOR command ; integer NUM ; #tyo ( DEVNUM ) ; #tyo ( ascii U ) , #tyo ( ascii S ) ; print #i 0 , NUM , #n ; #tyo ( CRCHR ) ; encode ( BUFF ) ; wrl ( MOTCH , BUFF ) ; rdl ( MOTCH , BUFF ) drop ; end ; ; Read the set scale factor. ; ; define READSCALE ; MOTCOM ascii U , ascii R , end

;

; Start the move define STT command ; TOTAL += xtnd ( STEPSIZE ) ; if ( ( TOTAL ) UPLIMIT ) or ( TOTAL ( LOLIMIT ) ) ; BEEP print "LIMITS EXCEEDED" ; else MOTCOM ascii G ; endif end ; ; Executes normal mode ; define SETMOTOR command ; integer STEPSIZE ; if ( cmdcnt ==0 ) ; STEPSIZE := ASTEPSIZE ; endif ; BXON ; mvzer ( BUFF , 10 ) , NORMALMODE ; ACCEL 1.0 ; VELOCITY 1 .0 , POSITION xtnd ( STEPSIZE ) ; end ; ; Sets to the absolute position desired. ; ; define SETABS ; integer STEPSIZE ; local ; long RELSTEP ; BXON ; ABSPOS ; CONVERT ; RELSTEP := LLVAL - XTND ( STEPSIZE ) ; mvzer ( BUFF , 10 ) ; NORMALMODE ; ACCEL 1.0 ; VELOCITY 1.0 ; POSITION RELSTEP

<*

This program is an attempt to use an iterative method to determine square roots of real numbers. *>

<* Calling sequence:

SQUAREROOT := SORT ( ARG1 ) *> real POSRAD real OLD NEW define SQRT real real RAD local real ACCUR POSRAD := FABS ( RAD ) ACCUR := 0.000001 * POSRAD OLD := 0.00 NEW : = 1.00 while ( FABS ( NEW * NEW - POSRAD ) >- ACCUR ) OLD := NEW

NEW : = ( OLD + ( POSRAD / OLD ) ) / 2.0 repeat SQRT := NEW end ext FZVMOV ext VIDAUTO ext ERGPOS ext FVIDFOCUS ext FOCUS mvstr ( "staget" , promstr ) integer STGCBF ( 15. ) integer STPFLAG define CONNECT_2_MASTER

STPFLAG off

INITREC begin

RECEIVE ( STGCBF ) until ( STPFLAG ) end

define RECONNECT SET ( SYNC2 ) begin

RECEIVE ( STGCBF ) until ( STPFLAG ) end

i n t eg e r TMP I CH TMPOCH define STOPCO integer TERM

TMPICH := cich

TMPOCH := coch cich : = open ( TERM , 'rwa ) coch : = cich poke ( 2 , fdb ( coch ) ) at term

STPFLAG on end

define STRTCO detterm close ( cich ) cich := TMPICH coch := TMPOCH

STPFLAG off

RECONNECT end define STGINI mvstr ( "TT2 : " , TERM )

IN ITBOXX mvstr ( TT3:" , TERM ) INITMOT with ZAXIS BXON BXON end define INITSTG ; STGINI

OFFX := OL

OFFY := OL

ALPHA := 0.999835

BETA := 0.018175

CALFLG OFF

CONNECT_2_MASTER end

$RESTART BASE INITSTG , RESTART FOR DEMO PACKAGE

SAVE WFSTAGET

; ; NAME Z_MOVE . MG ;

THIS PROGRAM MOVES THE MOTOR IN ANY DIRECTION THRO' THE STEPSIZE SPECIFIED IN THE PROGRAM INITZ *) ; define Z_MOVE

STT end ; ; NAME : INITZ. MG ;

<* THIS PROGRAM INITI LIZES MOTOR PARAMETERS. THE STEP SIZE HAS TO BE SPECIFIED. ( INITZ ( STEPSIZE ) ) *> ; define INITZ WITH ZAXIS BXON mvzer ( BUFF , 10 ) NORMALMODE ACCEL 1.0 VELOCITY 1.0 end ; ; NAME : INITZ 1.MG ;

<* THIS PROGRAM INITILIZES MOTOR PARAMETERS. THE STEP S1ZE HAS TO BE SPECIFIED. INITZ ( STEPSIZE ) ) *> ; define INT1 with ZAXIS

BXON mvzer ( BUFF , 10 ) NORMALMODE ACCEL 2.0 VELOCITY 5.0 end ; ; NAME : INITZ2 -MG ;

<* THIS PROGRAM INITILIZES MOTOR PARAMETERS. THE STEP

SIZE HAS TO BE SPECIFIED. ( INITZ ( STEPSIZE ) ) *> ; define INT2 with ZAXIS BXON mvzer ( BUFF , 10 ) NORMALMODE ACCEL 2.0 VELOCITY 7.5 end ; define UPFAST long STEP 10

INT1

STEP 10 := ( LABS ( STEP 10 ) ) POSITION STEP10 Z_MOVE end ; define DNFAST long STEPS INT2

POSITION — ( LABS ( STEF8 ) ) if ( STEP8 ) 739900L ) print " ERROR1 " else

Z_MOVE end if end ; define UPTST

INTEGER STEP1 STNUM INITZ

STEP1 :-- < ABS ( STEP1 > ) POSITION ztnd ( STEP1 ) iter STNUM

Z_MOVE loop end ; define DNTST integer STEP2 STNM INITZ

POSITION xtnd ( — ( ABS ( STEP2 ) ) ) iter STNM

Z_MOVE loop end

<* Set the bias, gain, and integration time. B SETPARM ( BIAS CAIN IT ) define SETPARM integer B1 G1 I1

SET. BIAS ( B1 )

SET. GAIN ( G1 ) B SET. IT ( I1 )

SET. SENS end define DARKPARM

SET. IT ( 255 )

SET. BIAS ( 0 )

SET. GAIN ( 10 )

SET. SENS ; GAINADJUST ; SET. SENS

end define BRIGHTPARM SET. IT ( 24 ) SET. BIAS ( 0 ) SET. GAIN ( 1C ) SET. SENS ; GAINADJUST ; SET. SENS end *>

integer MRXTs ( 0 )

.word bytewd ( 5 , 23. )

.word 23.

.blkw 1

.word 1

. word 0 integer WTSES ( 0 ) .word bytewd ( 2 , 41. ) word 23. define DELAY integer DTIM MRKTS ( 2 ) := DTIM * 6 RSXDIR ( MRKT$ ) ioerr ' RSXDIR ( WTSE$ ) ioerr end ;

<* integer FLAG1 STEP5 PR MAXVAL NSTEP PR2 FCFUN PCENT PR1 integer OFF1 LOG1 RFLAG long Z0 ; PROFUNC := AVERPTR ; ; ; NAME . AUTOFC

; define COARSE local integer TEST FLAG6 CURX CURY FLAG8

INITZ

STEPS := 10

STEP5 := ( ABS ( STEP5 ) )

POSITION xtnd ( STEPS )

POKE ( 1000k , DBR )

FLAG1 OFF

MAXVAL OFF

CURX OFF

CURY OFF

FLAG8 OFF begin

FLAG6 OFF

STT

RDLN ( OUTLN1 , 128. , 383. , 256. , 256. )

WBUS?Y

POKE ( 1000k , DBR )

CURY : = exec ( FCFUN ) print SLOPE ; with ZAXIS ; BXON ; ABSPOS ; PRINT CONVERT ; if ( CURY ) MAXVAL ) ; MAXVAL := CURY ; endif ; increment CURX ; PCENT : = iscal ( CURY , 100 , MAXVAL ); if ( ( PCENT < PR1 ) and ( FLAG8 ==0 ) ); BEEP ; DNFAST ( 10L ) ; DNFAST ( 100L ) ; DELAY ( 1 ) ; UPFAST ( 20L ) ; INITZ ; STEPS := 10 ; STEPS := ( AES ( STEPS ) ) ; POSITION xtnd ( STEPS ) ; DELAY ( 1 ) ; PR2 := iscal ( MAXVAL 90 100 ); MAXVAL OFF ; FLAG6 ON ; FLAG8 on ; endif until ( CURY >= PR2 ) end

define VERYFINE

local integer PERCENT STOP CURX CURY

STEPS : = 3

INITZ

POSITION xtnd ( STEP5 )

POKE i 1000k , DBR )

MAXVAL OFF

STOP OFF

NSTEP OFF

CURX OFF

CURY OFF begin

STT

RDLN ( OUTLN1 , 128. , 383. , 256. , 256. )

WBUS?Y

POKE ( 1000k , DBR )

CURY := exec ( FCFUN ) if ( CURY > MAXVAL )

MAXVAL := CURY endif

PERCENT := iscal ( CURY , 100 MAXVAL ) if ( CURY <> MAXVAL ) increment NSTEP if ( PERCENT < PR )

STOP ON endif endif increment CURX until ( STOP ) ; DNTST ( NSTEP 1 ) end

define AUTOFC LOCAL long ZPOS

COARSE VERYFINE ;; WITH ZAXIS ; ABSPOS ; ZPOS := CONVERT ; PRINT Z0 ; if ( RFLAG == 1 )

; if ( LABS ( Z0 - ZPOS ) ) 20L ) ; SET ; POSITION ( Z0 - ZPOS ) ; STT ; DELAY ( 2 ) ; else

; Z0 := ZPOS , endif ; else

; Z0 := ZPOS ; endif ; PRINT Z0 end

STEP5 := 20

MAXVAL OFF

NSTEP OFF

FCPUN := base SLOPE

PR := 180.

PR2 := 1000

PR1 := 75.

OFF1 := 50

* >

integer BXCH DIROW COL long OFFX OFFY STX STY STXP STYP BOFFX BOFFY CORRX long XCOR YCOR VAFXCOR VAFYCOR STXCOR STYCOR CORRY real ALPHA BETA XPITCH YPITCH integer FXSIZE FYSIZE OVLX OVLY FXIND FYIND integer FVX integer FWY integer FRX integer FRY

BOFFX = 0L

BOFFY := 0L mac label $ ttys mov r0 , @ # ptr ( tempr 0 ) mov @ # ptr ( bufptr ) , r0 movb (rp)+ , (r0) cmpb # 15k , (r0) + bne 0S clrb -(r0) mov # 21. , - (rp) mov # bytewd ( 2 33. ) , -(rp) emt 377k

0S

mov @ # ptr ( tempr 0 ) , r0 inc @ # ptr ( bufptr ) mov # bytewd ( 1 115. ) , -(rp) return from ast emt 377k

. end

make '$grabs $attach 1410k $ttys 0 base NO_OP detterm define grabs apush cich cich = bxch $grabs apcp end

define bwrl integer buff bufptr : = buf

CLEFS ( 21. ) wrl ( bxch buff ) wtse ( 21. ) end

<* initializes and opens a channel for ergolux communication *> define INITBOXX

BXCH : = open ( TERM , ' rwa ) poke ( 2 , fdb ( BXCH ) ) grabs end

<* routine to send an ASCII character at a time * > define BXCOM command integer CHAR iter cmdcnt

#tyo ( CHAR ) nxtarg loop

#tyo ( CRCHR ) encode ( BUFF ) bwrl ( BUFF ) end

<* routine to move the stage to the home coordinates * > define HOME

BXCOM ASCII H end < * routine to move the stage to the desired absolute coordinates

MOVE ( x-coordinate , y-coordinate : both are long integers ) *) define MOVE long XMOV YMOV

#tyo ( ASCII M )

#tyo ( ASCII X ) mvzer ( BUFF , 10 ) print #I O , XMOV , " , " , #N #tyo ( ASCII Y ) print # I 0 , YMOV , #N

#tyo ( 15K ) encode ( BUFF ) bwrl ( BXCH , BUFF ) end

<* routine to request the current location of the stage wrt the home coordinate * > define POSREQ

BXCOM ASCII P print STR ( BUF ) end

< * splits the transmitted position string into x-coordinate *> define SPLX long local integer ALX ( 10 )

#FIELD ( BP ( BUF ) + 2 , 7 , 7 )

ENCODE ( ALX ) if ( LLITERAL ( ALX ) )

SFLX := LLVAL endif end

<* splits the transmitted position string into y-coordinate *> define SPLY long local integer ALX ( 10 ) #FIELD ( BP ( BUF ) + 12 , 7 , 7 )

ENCODE ( ALX ) if ( LLITERAL ( ALX ) )

SPLY :- LLVAL end if end

<* Attachement to the inspection plan and status data base * > define ATIPSDB WITH M_IPSDB

ATTRG ( "IPSDER" , 160000K ) ptr ( IPSDB_REC ) : = WNDADR with INSP_PLN

with INSP_DATA_BASE end

<* transforms the stage coordinates into the wafer coordinate system * >

define STWAFTR real POSX POSY WAFXCOR := LFIX ( ALPHA * POSX + BETA * POSY ) WAFYCOR := LFIX ( — BETA * POSX + ALPHA * POSY ) end

<* transforms the wafer coordinates into the stage coordinates * > define WAFSTTR real POSX POSY STXCOR := LFIX ( ALPHA * POSX + ( — BETA * POSY ) ) STYCOR := LFIX ( BETA * POSX + ALPHA * POSY ) end

<* computes the x-coordinate of the desired die *> define DIEX REAL

DIEX := ( FLOAT ( DIROV ) * XPITCH ) end

<* computes the y-coordinate of the desired die *> define DIEY REAL

DIEY := ( FLOAT ( COL ) * YPITCH ) end (* computes the x-coordinate of the desired feature *) define FWAX integer

FWAX := FWX end

<* computes the y—coordinate of the desired feature *> define FWAY integer

FWAY : = FWY end < * computes the x-coordinate of the desired frame *> define FRAX integer local integer C C := FRX FRAX := C + FXIND * ( ( FXSIZE * ( 100 - OVLX ) ) / 100 ) end

<* computes the y-coordinate of the desired frame *>

define FRAY integer local integer C C := FRY FRAY := C + FYIND * ( ( FYSIZE * ( 100 - OVLY ) ) / 100 ) end

<* computes the x-coordinate of the desired frame in a given feature in a given die * > define FRAMX local real ALX integer AFX AXX

ALX : = DIEX APX := FWAX AXX : = FRAX

XCOR : = xtnd ( APX + AXX ) + LFIX ( ALX ) end

<* computes the y-coordinate of the desired frame in a given feature in a given die *> define FRAMY local real ALX integer APX APY

ALX := DIEY

APX := FVAY

APY .= FRAY YCOR : = xtnd ( APX + APY ) + LFIX ( ALX ) end

<* defines a backlash correction cn the coordinates depending on the direction of move * >

STXP := OFFX

STYP := OFFY define BLCORR local integer LDIR LDIR1 LDIR2 LDIR3

LDIR1 ON

LDIR2 GN if ( STX )= STXP )

LDIR off else

LDIR on end if if ( LDIR <> LDIR1 )

LDIR1 := LDIR if ( STX < 0L >

STX := STX - BOFFX

else

STX := STX + BOFFX endif endif if ( STY ) = STYP )

LDIR3 off else

LDIR3 on endif if ( LDIR2 <> LDIR3 )

LDIR2 := LDIR3 if ( STY < OL ) STY ;= STY - BOFFY else

STY := STY + BOFFY endif endif

STXP := STX STYP := STY end

<* moves the stage to the desired frame *> define STFRAM local long POSX POSY real XMOV YMOV with INSF_DATA_BASE STAGE_ERR := TRUE FRAMX

XMOV := LFLOAT ( XCOR ) FRAMY

YMOV := LFLOAT ( YCOR ) WAFSTTR ( XMOV , YMOV ) STX : = — STXCOR + OFFX + CORRX STY := — STYCOR + OFFY + CORRY print STX , STY , STXCOR , STYCOR

BLCORR MOVE ( STX , STY ) ; POSREO ; POSX -.' SPLX ; POSY :•= SPLY ; if ( ( POSX <> STX ) AND ( FOSY (> STY > ; STAGE, ERR FALSE ; endif end

<* The stage moving function to be called from the Master * > define STAGEM local integer SITE FRAM

ATIFSDB

STAGE_BUSY := TRUE

SITE := DES_SITE FRAM : = DES_FRAME with DES_RET

DIROW := ROW COL := CLMN print DIROW , COL with INSP_PLN with HEADER

XPITCH := DIE_X

YPITCH := DIE_Y with LAYERS ( DES_LAYER ) with DTL_LAYER_REV ( #_REVS - 1 ) with L_RETICLE with RETICLE_DIE with D_PATTERNS ( DES_PATTERN ) with S ORG ( SITE )

FWX := X

FWY : = Y with F_ORG

FRX := X

FRY := Y with F_DESCR with F_SZ

FXSIZE : = X

FYSIZE := Y with F_OLAP

OVLX : = X OVLY := Y with INSP_FR ( SITE ) with FRAMES ( FRAM ) FXIND := ROW FYIND := CLMN

STFRAM STAGE_BUSY := FALSE with CUR_RET

ROW := DIROW CLMN := COL CUR_SITE := DES_SITE CUR_FRAME : = DES_FRAME DREGION end <* defines a correction to the eocrdinatcs due to the error in positioning *> define ERRCORR local long POSX1 POSY1 POSX2 POSY2

CORRX := 0L

CORRY := 0L

STAGEM

POSREQ

POSX1 := SPLX

POSY1 := SPLY print "Manually align the feature" pause

POSREQ

POSX2 := SPLX

POSY2 := SPLY

CORRX := POSX2 - POSX1

CORRY := POSY2 - POSY1 end

<* STAGE CALIBRATION procedure *> integer CALFLG

CALFLG on define INITOFF

ATIPSDB print "Manually define home, press 'DEFINE HOME' button" print "Manually position origin of die (0,0)" print "Press COMP ON at the stage control panel" pause

POSREQ

OFFX := SPLX

OFFY := SPLY end

define CALSTG local long POSX1 POSY1 long D D1 if ( CALFLG ) INITOFF print "Move to last die in X direction" print "Press COMP ON at stage control panel" pause

POSREQ

POSX1 := SPLX POSY1 := SPLY D := POSX1 - OFFX D1 := POSYl - OFFY ALPHA := LFLOAT ( — D ) / SQRT ( LFLOAT ( D ) * LFLOAT ( D ) + Λ

LFLOAT ( D1 ) * LFLOAT ( D1 ) )

BETA :» LFLOAT ( — D1 ) / SQRT ( LFLOAT ( D ) * LFLOAT < D ) + Λ

LFLOAT ( D1 ) * LFLOAT ( D1 ) ) print #F 12 6 , "alpha: " , ALPHA , "beta: " , BETA print OFFX , OFFY endif end

<* Switch the illumination according to the cuirent and desired set in IPSDB *> define ILLSW ATIFSDB if ( CUR_ILLUM <> DES_ILLUM )

CUR_ILLUM := DES_ILLUM DREGION ATIOPAGE

POKE ( 200K , CSR ) ; switch the illumination DELAY ( 3 ) POKE ( 0 , CSR ) ; make it stable.

; Note: no handshaking with the hardware

DELAY ( 40 ) ; Wait to make sure switch happens before we return endif DREGION end

<* Switch the magnification according to the current and desired set in IPSDB *> define LENSW ATIPSDB if ( CUR_MAGNF <> DES_MAGNF )

CUR_MAGNF := DES_MAGNF

DREGION

ATIOPAGE

POKE ( 400K , CSR ) ; switch the magnification

DELAY ( 1 )

POKE ( 0 , CSR ) ; make it stable.

; Note: no handshaking with the hardware endif DREG I ON end

integer SLPOFF SLPSCL .MAC entry SLOPE integer mov # 128. , r0 ; 256 points, index mov @ # ptr ( SLPOFF ) , r1 asl r1 sub r1 , r0 mov # ptr ( OUTLN -(msp ) ; store pointer to the array add r0 , (msp) ; point to last elt in array clr r3 ; clear maximum

0S : add @ # ptr ( SLPOFF (msp ) movb @ 0 (msp) . r2 ; get OUTLN1 ( r0 + 1) bic # 177400k , r2 ; clear high byte from movb dec (msp ) sub @ # ptr ( SLPOFF (msp ) ; decrement pointer movb @ 0 (msp) , rl ; get OUTLN1 ( r0 - 1 ) bic # 177400k , rl ; clear high byte sub r1 r2 , get slope tst r2 bpl 1S ; see if negative neg r2 ; yes , make positive1S: emp r3 , r2 ; see if > than current max bge 2t mov r2 , r3 ; yes, store new max

2S: dec r0 bne 0S mov r3 , (msp ) ; return maximum slope next end

<*

DEFINE PEAK INTEGER LOCAL

INTEGER TEMP1 PEAK OFF ITER 256.

MVBYWD ( OUTLN1 , I , OUTLN , 64 ) TEMP1 := OUTLN ( VMAX ( OUTLN , 64 ) ) OUTLN ( VMIN ( OUTLN , 64 ) ) PEAK := PEAK + TEMP1 LOOP ( 64. )

PEAK := URSHIFT ( PEAK , 1 ) END *>

SLPSCL := 1. SLPOFF := 1.

COMPARISON BETWEEN REFERENCE AND EDGES

< * *************************************************************************************

MATCHT. MG THIS MODULE LOADS ALL OF THE MODULES USED IN "MATCHT"

*************************************************************************************** * > ext PDPID ; Assembly language mneumonics. ext DM ISC ; Miscellaneous utility routines. ext MCHREG ; Region mapping utilities for MATCHT. ext MCHCOM ; Intertask communication utilities for MATCHT ext [5, 1]INSPLAN ; Inspection Data Base record structure ext 22BADOR ; 22 bit address supppcrt. ext GRABIM ; Frame grabber support. ext MODELT ; Model record structure. ext OPLINE ; Routine to 'open' a line between two points ext MDLMTCH ; Matching and Image Registration routines. mvstr ( "matcht" , promstr ) integer MCHCBF ( 15. ) ; Intertask communication buffer. integer STPFLAG ; Flag to indicate no communication. integer TMPICH TMPOCH ; Temporaries for input and output channels

<* Start communication with the master task *> define CONNECT_2_MASTER

INITREC

begin

RECEIVE ( MCHCBF ) until ( STPFLAG ) end

<* Restart communication with the master task. *> define RECONNECT

SET ( SYNC2 ) begin

RECEIVE ( MCHCEF ) until ( STPFLAG ) end

< * Stop communication with master task and allow input from a terminal

STOPCO ( 'TTn ) *> define STOPCO integer TERM

TMPICH :» cich

TMPOCH := coch cich := open ( TERM , ' rwa ) coch := cich poke ( 2 , fdb ( cich ) ) atterm

STPFLAG on end <* Restart communication after a STOPCO has been executed. define STRTCO detterm close ( cich ) cich := TMPICH coch := TMPOCH

STPFLAG off

RECONNECT end

<* Initialization routine for MATCHT. *> define MATCHINIT ; with M_MODEL ; ATTRG ( "MODELR" , 160000k ) ; with M_EDGE ; ATTRG ( "EDGIMG" , 140000k ) CONNECT_2_MASTER end $restart : = base MATCHINIT save WFMATCHT

parameter WCR := 172410k ; DMA word count register. parameter BAR := 172412k ; Bus address register for DMA. parameter CSR := 172414k ; Control status register. parameter DBR := 172416k ; Data buffer register. long PHYADR ; Physical (22-bit) address of the buffer, make 'MRKTs rsxcall bytewd ( 5 23. )

<* Delay function using Mark Time directive. DELAY_TIME is the number of seconds times 10. e.g. DELAY_TIME = 10. is a delay of 1 second. DELAY ( DELAY_TIME ) *> define DELAY integer DEL MRKTS ( 23. , DEL * 6 , 1 , 0 ) WAIT ( 23. ) end <* Wait until DMA operation is complete. (Monitors BUSY bit.) * > define WBUS?Y while ( peek ( CSR ) AND 200k ) r e p ea t en d <* Read a line from the frame grabber.

RDFCLN ( BUFFER , X0 , XL , Y0 , YL ) *> define RDFGLN integer BUFF ( 1 ) X0 XL Y0 YL PHYADR := 22ADDR ( BUFF ) poke ( 130000k + X0 - 1 , DBR ) poke ( 114000k + Y0 , DBR ) poke ( — XL / 2 , WCR ) ; poke < — ( XL * YL ) , WCR ) poke ( lsword ( PHYADR ) , BAR poke ( 0 , DBR ) poke ( msword ( PHYADR ) + 1 , CSR ) end

<* Get an image from the frame grabber into a memory region. *> define GETIM local integer BUFPTR with M_MODEL ATTRG ( "IOPAGE" , 160000k ) poke ( 1000k , DBR ) DELAY ( 1 ) poke ( 0 , DBR ) with M_EDGE ATTRG ( "EDGIMG" , 140000k )

WNDOFF off MAPW ( WNDB ) ioerr iter 256. REMAP ( i ) drop BUFPTR := WNDADR do 128. 159. WBUS?Y RDFGLN ( BUFPTR , 128. , 256. , i + j , 1 ) BUFPTR += 256. loop loop ( 32. ) WBUS?Y DREGION with M_MODEL DREGION end

define COPYIM local integer EDGADR with M_MODEL ATTRG ( "MTCHIM" , 160000k ) WNDOFF off MAPW ( WNDB ) ioerr with M_EDGE ATTRG ( "EDGIMG" , 140000k ) EDGADR := WNDADR WNDOFF off MAPW ( WNDB ) ioerr iter 256. with M_EDGE

REMAP ( i ) drop with M_M0DEL

REMAP ( i ) drop mvwds ( EDGADR , WNDADR 4096. ) loop ( 32. ) DREGION with M_EDGE DREGION end

MODEL RECORD

Type of point Code

Right Angle Corner 4!X!Y Endpoint 0!X where X is the orientation of the point and Y i s the direction as follows :

* > parameter MAX_#_ENT := 20 ; Maximum # of permissible entities, parameter #POINTS : = 25 ; Maximum # of points permitted within ; an entity .

record POINT_RΕC integer XI Yl ; Coordinates of first corner point. integer CURTYPE ; Type of the line between 1st and 2nd point. integer XJ YJ ; Coordinates of second point. integer NXTTYPE ; Type of the next line (between 2nd and 3rd) . dummy -3 end record record ENTITY integer #PTS ; # of points. POINTJSEC 21 ( #POINTS ) ; See record POINTS. endrecord

record FRAME_REC integer FRM# ; Frame # . integer #ENT # of entities .

ENTITY El ( MAX_#_ENT ) integer HX1 HX2 HY1 HY2 ; Horizontal landmark points.

integer VX1 VX2 VY1 VY2 ; Vertical landmark points. integer HX3 HX4 HY3 HY4 ; Horizontal landmark points. integer VX3 VX4 VY3 VY4 ; Vertical landmark points. endrecord

<* Store the current model under a given filename.

STORE_MODEL ( 'FILENAME ) define STORE_MODEL integer NAME local integer OUTCH

OUTCH := open ( NAME , 'wt ) wrs ( OUTCH , FRAME , size FRAME_REC ) close ( OUTCH ) end

*>

< * Load the current model from a previously stored file.

GET_MODEL ( 'FILENAME ) *> define GET_MODEL integer NAME local integer INCH char PNAME ( 30. ) with M_MODEL ATTRG ( "MODELR" , 160000k ) ptr ( FRAME_REC ) := WNDADR mvstr ( ' dm4:[ 5,3] , PNAME ) concat ( PNAME , NAME ) INCH := open ( PNAME , 'r ) rds ( INCH , WNDADR , size FRAME_REC ) drop close ( INCH )

DREGION end

long CURPNT ; ; Coordinates of the current point .mac integer LNTMP ( 0 )

. bIkw 8.

.WORD ptr ( LNTMP ( 3 ) )

; Line Temporaries: ; LNTMP ( 0 ) : = NPTS ; Major Direction Length (Count) ; LNTMP ( 1 ) : = DMN ; Change in minor direction. ; LNTMP ( 2 ) := DMJ ; Change in major direction. ; LNTMP ( 3 ) := YINC ; Y increment if major, else 0.; LNTMP ( 4 ) := XINC ; X increment if major, else 0. ; LNTMP ( 5 ) : = YINC ; Y increment . ; LNTMP ( 4 ) : = XINC ; X increment . ; LNTMP ( 7 ) := FRAC ; accumulated fraction ; LNTMP ( 8 ) : = ptr ( XINC ) ; Pointer to current increments. ;

<* Set up the endpoints of the line and initialize the current point (CURPNT). Initialize the LNTMP array. FIRSTPT ( X1 Y1 X2 Y2 ) * > entry FIRSTPT mov # LNTMP , r0 ; Get pointer to LNTMP array. mov (msp)+ , r3 ; Get Y1. mov (msp)+ , r2 ; Get X1. sub (msp) , r3 ; Form Y1 - Y0. bge 0S ; If negative : neg r3 ; make it positive and mov # -1 , r1 ; form -1 as increment. br 1S ; Else :

0 S : mov # 1 ., r1 ; form +1 as increment .

1S mov r1 , 6 (r0) ; Store increment in LNTMP ( 3 ) mov r1 , 10. (r0) ; and LNTMP ( 5 ) . mov (msp)+ , @ # ptr ( CURPNT ) Store in CURY sub (msp ) , r2 ; Form X1 - X0. bge 21 ; If negative: neg r2 ; make it positive and mov # -1 , r1 ; form -1 as increment. br 3S ; Else:

2S: mov # 1 , r1 ; form +1 as increment. 3S: mov r1 , 8. (r0) ; Store increment in LNTMP ( 4 ) mov r1 , 12. (r0) ; and LNTMP ( 6 ) . mov (msp)+ , @ # ptr ( CURPNT ) + 2 ; Store in CURX. emp r2 , r3 ; Compare DX to DY. bit 4S ; If DX > DY: mov r3 , 2 (r0) ; Place DY in LNTMP ( 1 ). mov r2 , r3 ; Copy DX int o r3.

clr 4 (r0) ; Don't change Y on major scale br 5S ; Else:

4S: mov r2 , 2 ( r0) ; Place DX In LNTMP ( 1 ). clr 8. (r0) ; Don't change X on major scale.

5S mov r3 , 4 (r0) ; Place major in LNTMP ( 2 ) mov r3 , (r0) ; Initialize counter — LNTMP ( 0 ). ine (r0) ; Include the endpoints. neg r3 ; Form — ( MAJOR / 2 ) asr r3 mov r3 , 14. (r0) ; Place in LNTMP ( 7 ) (fraction). next

. local

<* Update the contents of CURPNT to point to the next point in the line.

If there is a next point, TRUE is returned , else FALSE is returned . LOGICAL := NXTPNT *> entry NXTPNT integer mov = LNTMP , r0 ; Get pointer to LNTMP array dec (r0) ; Decrement counter. bne 0S ; If no more points clr - (msp ) ; push a zero (false) br 2S ; and return.

0S: # ptr ( CURPNT ) , r2 ; Get pointer to CURPNT mov 16. (r0) , r1 ; Get pointer to XINC. add 2 (r0) , 14. (r0) ; Add minor change to fraction. blt 1S ; If overflow. sub 4 (r0) , 14. (r0) ; Subtract major change from fraction. add # 4 , r1 ; Point to major and minor increments

1S: add (r1 ) + , ( r2 ) + ; Add proper X increment to CURX. add (r1 ) , (r2 ) ; Add proper Y increment to CURY. mov # - 1 , - (msp ) ; Push a -1 (true)

2S: next ; and return .

. end

<* Update the contents of CURPNT after moving a given number of points. -1 is returned if successful. If not successful, the number of successful increments before ending is returned.

IVAL := NXTPNTS < #_POINTS > *> define NXTPNTS integer integer #PNTS NXTPNTS on iter #PNTS if ( not NXTPNT ) NXTPNTS := i exit endif loop

end

integer CORLEN CORVID ; Length and width of corner masking. long PNTINC ; Point increment to add to CURPNT. integer DX1 DY1 DX2 DY2 Deltas for best fit of line to image. integer MDLEV ;' Grey level to write for model pcints. integer TOTAL BEST ; Totals for finding best fits. integer REGX REGY ; Registration error in X and Y. integer XWIND YWIND ; Registration window size in X and Y.

XWIND : = 4

YWIND := 4 long VMASK ( 0 ) ; Masking values for vertical lines.

.blkw 8

. long wdlong ( 0 , 1 )

. long wdlong ( 0 , -1 )

. long wdlong ( 0 , -1 )

. long wdlong ( 0 , 1 ) long KMASK ( 0 ) ; Masking values for horizontal lines.

.blkw 8

. long wdIong ( 1 , 0 )

. long wdIong ( 1 , 0 )

. long wdlong ( -1 , 0 )

. long wdl ong ( -1 , 0 )

MDLEV := 252. ; Make these points look like evens. CORLEN := 5 CORWID := 3

.mac

<* Add two longs as if they were two sets of two integers.

LVAL := LI+ ( LVAL1 , LVAL2 ) *> entry LI + long add (msp)+ ,. 2 (msp) add (msp)+ , 2 (msp) next

<* Subtract two longs as if they were two sets of two integers.

LVAL := LI- ( LVAL1 , LVAL2 ) *> entry LI - long sub (msp)+ , 2 (msp) sub (msp)+ , 2 (msp) next

. end

<* Set the size of the registration window.

WINDOW ( XSIZE , YSIZE ) *> define WINDOW integer XW YW XWIND := XW YWIND := YW end

<* Test the current line to be vertical

LOGICAL := VERTICAL *> define VERTICAL ifunc

( abs ( YJ - Yl ) ) abs ( XJ - XI ) ) end

<* Fix the model by adding in the registration error .

FIXMDL ( REG_X , REG_Y ) *> define FIXMDL integer REGX REGY iter #ENT with El ( i ) iter #PTS with ZI ( i )

XI += REGX Yl += REGY Ioop loop end

<* Test a model line for matches against the image. Place total number of matches in TOTAL. TESTLN ( X1 Y1 X2 Y2 #_SKIPS ) *> define TESTLN integer X1 Y1 #PTS long REGINC if ( #PTS )

CURPNT := wdlong ( Y1 , X1 ) iter #PTS + 1 if ( MRDPIX ( CURPNT ) ) increment TOTAL endif

CURPNT : = LI+ ( CURPNT , REGINC ) loop endif end

<* Return the number of points to skip for a model line.

IVAL := GETPTS ( POINT_1 , POINT_2 ) *> define GETPTS integer integer PT1 PT2 if ( PT2 > PT1 )

GETPTS := limit ( ( PT2 - PT1 ) / 10 , 1 , 10 ) else GETPTS l imi t ( ( PT2 - PT1 ) / 1 0 , - 10 , -1 ) endif end

<* Register the image with the model. Fix the model when registration is compIete *> define REGISTER local integer H1#PTS V1#PTS integer H2#PTS V2#PTS long H1PTINC V1PTINC long H2PTINC V2PTINC with M_MODEL

ATTRG t "MODELR" , 160000k ) with M_EDGE

ATTRG ( "MTCHIM" , 140000k )

BEST off

REGX off

REGY off

H1#FTS : = GETPTS ( HX1 , HX2 )

H2#PTS := GETPTS ( HX3 , HX4 )

V1#PTS : = GETPTS ( VY1 , VY2 )

V2#PTS := GETPTS ( VY3 , VY4 )

H1PTINC := wdlong ( 0 , H1#PTS )

H2PTINC : = wdlong ( 0 , H2#PTS )

V1PTINC := wdlong ( V1#PTS , 0 )

V2FTINC := wdlong ( V2#PTS , 0 )

H1#PTS := ( HX2 - HX 1 ) / H1#PTS

H2#PTS .= ( HX4 - HX3 ) / H2#PTS

Vl#PTS := ( VY2 - VY1 ) / V1#PTS

V2#PTS : = ( VY4 - VY3 ) / V2#PTS do — XWIND , XWIND do — YWIND , YWIND TOTAL off

TESTLN ( HX1 + j . HY1 + i , Hl#PTS , H1PTINC )

TESTLN ( HX3 + j , HY3 + 1 , H2#PTS , H2PTINC )

TESTLN ( VX1 + j , VY1 + i , V1#PTS , V1PTINC )

TESTLN ( VX3 + j , VY3 + i , V2#FTS , V2PTINC ) if ( TOTAL ) BEST 3

BEST := TOTAL

REGX := j

REGY := i endif loop loop

FIXMDL ( REGX , REGY ) print REGX , REGY

DREGION with M_M0DEL

DREGION

ATTRG ( "IPSDBR" , WNDADR ) ptr ( IPSDB_REC ) : = WNDADR with INSP_DATA_BASE

REG_X := REGX REG_Y : = REGY DR EG I ON en d

<* Get the best match of a model line to an image line. Place results in the variables DX1, DY1, DX2 , and DY2. GETBEST ( X1 , Y1 , X2 , Y2 ) *> define GETEEST integer X1 Y1 X2 Y2 local integer #SKIPS #SKIPS := limit ( max ( abs ( X2 - X1 ) , abs ( Y2 - Y1 ) ) / 10 , 1 , 10 ) BEST off do -1 1

TOTAL off if ( VERTICAL )

FIRSTPT ( X1 + i , Y1 X2 + i , Y2 ) else

FIRSTPT ( X1 , Y1 + i X2 , Y2 + i ) endif begin if ( MRDPIX ( CURPNT ) ) increment TOTAL endif until ( NXTPNTS < #SKIPS > <> -1 ) if ( TOTAL > BEST )

BEST : = TOTAL if ( VERTICAL )

DX1 := i

DX2 : = i

DY1 off

DY2 off else

DX1 off

DX2 off

DY1 : = i

DY2 := i endif endif loop end

<* Look for pixels adjacent to the line to match to. If there are adjacent pixels, delete them from the image. NOADJ returns TRUE if no adjacent pixels were found; otherwise, it returns FALSE. LOGICAL := NOADJ *> define NOADJ integer

NOADJ on if ( MRDPIX ( LI + ( CURPNT , PNTINC ) ) ) ; > = TESTVAL ) MWRPIX ( LI + ( CURPNT . PNTINC ) , 0 ) NOADJ off endif if ( MRDPIX ( LI- ( CURPNT , PNTINC ) ) ) ; >= TESTVAL ) MWRPIX ( LI - ( CURPNT , PNTINC ) , 0 ) NOADJ off endif end

<* Mask the outside of a corner. The area masked is CORWID x CORWID. * > define OUTERMASK local long FIRSTPT TMPPNT FIRSTPT := LI- ( CURPNT , VMASK ( CURTYPE ) ) iter CORWID

FIRSTPT := LI- ( FIRSTPT , HMASK < CURTYPE ) ) TMPPNT := FIRSTPT iter CORWID

MWRPIX ( TMPPNT , 0 )

TMPPNT := LI- ( TMPPNT , VMASK ( CURTYPE ) ) loop loop end

<* Mask a corner using the increment supplied.

CORMASK ( PNTINC ) *> define CORMASK long CURINC local

long TMPPNT TMPPNT := CURPNT iter CORWID + 1

MWRPIX ( TMPPNT , 0 )

TMPPNT := LI + ( TMPPNT , CURINC ) loop

TMPPNT := CURPNT iter CORWID

TMPPNT := LI- ( TMPPNT , CURINC )

MWRPIX ( TMPPNT , 0 ) loop end

<* Match a model line to the image. Also perform corner masking.

MATCHLN ( X1 , Y1 , X2 , Y2 ) *> define MATCHLN integer X1 Y1 X2 Y2 local long TMPPNT long NXTINC FIRSTPT ( X1 Y1 X2 Y2 ) if ( VERTICAL )

PNTINC := VMASK ( CURTYPE ) NXTINC := VMASK ( NXTTYPE ) else

PNTINC := HMASK ( CURTYPE ) NXTINC := HMASK ( NXTTYPE ) endif OUTERMASK iter CORLEN

CORMASK ( PNTINC ) if ( not NXTPNT ) return endif loop if ( LNTMP ( 0 ) > CORLEN ) begin if ( MRDPIX ( CURPNT ) ) ; > = TESTVAL )

MWRPIX ( CURPNT , 0 ) else if ( NOADJ > MWRPIX ( CURPNT , MDLEV ) endif endif

NXTPNT drop until ( LNTMP ( 0 ) == CORLEN ) endif begin

CORMASK ( NXTINC ) until ( not NXTPNT ) end

<* Execute the matching process for every line in the model. *> define MATCH with M_MODEL

ATTRG ( "MODELR" , 160000k ) with M_EDGE

ATTRG ( "MTCHIM" , 140000k ) iter #ENT with El ( i ) iter #PTS - 1 with ZI ( i )

GETBEST ( XI Yl XJ YJ )

MATCHLN ( XI + DX1 , Yl + DY1 XJ + DX2 YJ + DY2 ) loop loop

DREGION with M_MODEL

DREGION end

DEFECT ANALYSIS < * *************************************************************************************

DEFECT. MG - THIS MODULE LOADS ALL OF THE MODULES USED IN "DEFECT"

************************************************************************************* * > ext PDPID ; Assembly language mneuemonics. ext MIXLIB ; Mixed-mode arithmetic support. ext DMISC ; Miscellaneous utilities. ext DEFREC ; Region mapping utilities. ext DEFCOM ; Intertask communication utilities. ext POINTS ; Analysis of disagreement pixels ext [5 , 1] INSPLAN ; Inspection Data Base record structure. eεt CONFIRM ; Store defects or confirm repeating defects. integer DEFCBF ( 15. ) ; DEFECT intertask communication buffer integer STPFLAG ; Flag to indicate stopped communication. integer TMPICH TMPOCH ; Temporaries for input and output channels.

< * Start communication with the master task. * > define CONNECT_2_MASTER

INITREC begin

RECEIVE ( DEFCBF ) until ( STPFLAG ) end

<* Restart communication with the master task. *> define RECONNECT

SET ( SYNC2 ) begin

RECEIVE ( DEFCBF ) until ( STPFLAG ) end

<* Stop communication, and allow input f r om a t ermi na l

STOPCO ( 'TTn ) * > define STOPCO integer TERM

TMPICH := cich

TMPOCH := coch cich := open ( TERM , ' rwa ) coch := cich poke ( 2 , fdb ( cich ) ) atterm

STPFLAG on end <* Restart communication after a STOPCO. * > define STRTCO

DETTERM close ( cich ) cich : = TMPICH coch := TMPOCH

STPFLAG off

RECONNECT end

<* Perform both disagreement analysis and defect storage / confirmation . *> define DETECT

BLOB

STORE end

<* Initialization for DEFECT. *> define DEFECTINIT

CONNECT_2_MASTER end mvstr ( 'defect , promstr ) $ restart : = base DEFECTINIT

save WFDEFECT

integer BANDSIZE ; Size of "don't care" band around image. integer #BLOB ; Allowable number of blobs. #BLOB := 150. BANDSIZE := 25. integer X0 XL Y0 YL ; Image limits. XL := 256. YL := 256. record RASPT_REC integer PTCNT ; Number of points found. integer POINTS ( 256. ) ; Point positions. end record

RASPT_REC RASPTS with RASPTS record BLOB_REC integer BLBID ; ID cf this blob. integer BLBTOT ; Total points. long XBCOM ; X center of mass totals. long YBCOM ; Y center of mass totals. integer MINX0 MAXX1 ; Minimum and Maximum X values. integer MINY0 MAXY1 ; Minimum and Maximum Y values. end record

record FINAL_REC integer CURLINE ; Y line number . integer CURBLOB ; ID of blob that new point is added to. integer CURPT ; X position of current point. integer NXTBLB ; Pointer to the free blob stack ID. integer FREEBLOBS ( #BLOB ) integer BLOBMAP ( ( #BLOB + 15 ) / 16 )

BLOB_REC BLOBS ( #BLOB ) endrecord

FINAL_REC FINAL with FINAL

<* Record for accessing the image lines with the mapped region. *> record LINES_REC char TOP ( 256. ) char CEN ( 256. ) char BOT ( 256. ) end record

<* Convert a raster line into point encoded data.

RAS2PT ( INPUT_BUFFER , OUTPUT_BUFFER , LENGTH ) *> entry RAS2PT mov (msp)+ , r0 ; Count -> r0. mov (msp )+ , r 1 ; Output buffer pointer -> r1. mov (msp) , r2 ; Input buffer pointer -> r2. clr (msp ) ; Clear temporary point counter. mov r1 , -(rp) ; Store output pointer on rp stack. clr r3 ; Clear pixel counter. tst (r1) + ; Bump pointer to output buffer.

0S tstb (r2) + ; Test the point. beq 1S ; If it is not zero:

; bitb # 1 , -(r2) ; Low order bit is 0 if even, 1 if odd.

, bne 2S ; If even : mov r3 , ( r1 )+ ; Copy pixel number into POINTS array. inc (msp ) ; Increment point counter.

; 2 S : clrb (r2) + ; Zero the image point.

1S : inc r3 ; Increment pixel counter. dec r0 ; Decrement count. bne 0S ; Loop back . mov (rp)+ , r1 ; Restore output buffer pointer. mov (msp ) + , (r1 ) ; Store point count in PTCNT . next

< * Set all points that art at VAL2 to VAL1 in the vector.

VECSET ( BUFFER . VAL1 , VAL2 , LENGTH ) *> entry VECSET mov (msp ) + , r0 ; Count in r0. mov (msp)+ , r1 ; Test value in r1.

mov (msp ) + , r2 ; Value to set in r2. mov (msp ) + , r3 ; Buffer pointer in r3. add r0 , r3 ; Point r3 to end of buffer. 9S : cmpb -(r3) , r1 ; Compare point to VAL2. bne 8S ; If equal : movb r2 , (r3) ; set to VAL1.

8S: dec r0 ; Decrement count. bne 9S ; Loop back. next

<* Returns the first value of three that is non-zero , or zero if all zero. IVAL := 3MAX ( VAL1 , VAL2 , VAL3 ) *> entry 3MAX integer mov (msp) + r1 ; VAL3 in r1. mov (msp ) + r0 ; VAL 2 in r0. tst (msp ) ; Test VAL1 bne 5$ ; If non-zero, return VAL1. tst r0 ; Else test VAL2. bne 4$ ; If zero : mov r1 (msp ) ; return VAL3. br 5$ ; Else :

4S: mov r0 (msp ) ; r e t u rn VAL 2 . 5S: next

< * Ad d a po i n t t o a b l o b . * > entry ADDBLOB mov @ # ptr ( BLOB_REC ) , r0 mov @ # ptr ( FINAL_REC ) , r1 ; CURBLOB := BLBID mov So BLBID (r0) , So CURBLOB (r1) ; BOT ( CURPT ) := CURBLOB mov So CURPT (r1) , r2 mov @ # ptr ( LINES_REC ) , r3 add r2 , r3 aovb So CURBLOB (r1) , So BOT (r3) ; increment BLBTOT ine So BLBTOT (r0) ; MAXY1 := CURLINE mov So CURLINE (r1) , So MAXYl (r0) ; XBCOM := liadd ( XBCOM , CURPT ) add r2 , ( So XBCOM + 2 > (r0) adc So XBCOM (r0) ; YBCOM := liadd ( YBCOM , CURLINE ) add So CURLINE (r1) , ( So YBCOM + 2 ) (r0) adc So YBCOM (r0) next end

Blob records are assigned out of a pool of available space FREEBLOBS i s a stack, with pointer NXTBLOB, and, for redundancy,

BLOBMAP i s a bitmap of used blob records, define GETBLOB integer if ( NXTBLB ==0 ) print "OUT OF BLOBS" endif

GETBLOB := FREEBLOBS ( NXTBLB ) setbit ( GETBLOB BLOBMAP ) mvzer ( BLOBS ( GETBLOB ) , sizew BLOB_REC ) decrement NXTBLB end

<* Return a blob to the stack of free blobs.

RETBLOB ( BLOB_ID ) *> define RETBLOB integer ARG1 increment NXTBLB FREEBLOBS ( NXTBLB ) : = ARG1 clrbit ( ARG1 BLOBMAP ) end

< * Start a new blob. *> define NEVBLOB local integer TEMP1 TEMP1 := GETBLOB Get a new blob recorb with BLOBS ( TEMP1 ) BLBID : = TEMP1 Setup THIS ID MINX0 := CURPT MAXX1 := CURPT

MINY0 := CURLINE ADDBLOB end

<* Merge two blobs into one blob. *> define MERCEBLOB local integer TMPTOT long TMPXCOM TMPYCOM integer TMPX0 TMPX1 integer TMPY0 TMPY1 if ( BLBID == CURBLOB ) Ring situation return endif

TMPTOT := max ( CURBLOB BLBID )

CURBLOB := min ( CURELOB BLBID ) ; Merge into lower blob ID prini #a ascii . , # z

VECSET ( TOP , CURBLOB , TMPTOT , 256. )

VECSET ( CEN , CURBLOE , TMPTOT 256. )

VECSET ( BOT , CURBLOE , TMPTOT , CURPT + 1 ) with BLOBS ( TMPTOT ) ; Save dying blob info in TEMP mvwds ( ptr ( BLBTOT ptr ( TMPTOT ) , 9 )

RETBLOB ( BLBID ) with BLOBS ( CURBLOB )

BLBTOT + = TMPTOT

XBCOM += TMPXCOM

YBCOM += TMPYCOM

MINX0 := min ( MINX0 , TMPX0 )

MAXX1 := max ( MAXX1 , TMFX1 )

MINY0 : = min ( MINY0 , TMPY0 )

MAXY1 := max ( MAXY1 , TMPY1 ) end

<* Test the two points above the current point for a value.

Returns TRUE if either has a value. *> define UPTEST integer

UPTEST : = max ( CEN ( CURPT ) , TOP ( CURPT ) ) if ( UPTEST ) with BLOBS ( UPTEST ) ADDBLOB endif end

<* Test 2 points to the left in each of three rows for a value. *> define LEFTTEST local integer BLID do 1 2

BLID := 3MAX ( BOT ( CURPT - i > CEN ( CURPT - i ) TOP < CURPT - i ) ) if ( BLID ) exit endif loop if ( BLID ) with BLOBS ( BLID )

MAXX1 : = max ( MAXX1 . CURPT ) ADDBLOB endif end

<* Test 2 points to the right in each of two rows for a value. *> define RIGHTEST local integer BLID do 1 2

BLID := max ( CEN ( CURPT + i ) , TOP ( CURPT + i ) ) if ( BLID ) exit endif loop if ( BLID ) with BLOBS ( BLID ) if ( CURBLOB >0 )

MERGEBLOB else

MINX0 := min ( MINX0 , CURPT ) ADDBLOB endif endif

end

<* Convert from point encoded format to blob format. *> define PT2BLOB local integer TEMP1 increment CURLINE ; Get next raster line iter PTCNT ; Do for each point found in this raster line

CURPT := POINTS ( i ) ; Set up current point. CURBLOB on ; No current blob at start. if ( not UPTEST ) LEFTTEST RIGHTEST endif if ( CURBLOE <0 ) NEVELOB endif ; New blob found loop end

<* Set up the disagreement analysis, *> define INITBLOB mvzer ( FINAL , sizew FINAL-REC )

NXTBLB off

CURLINE := BANDSIZE - 1 do 1 , #BLOB - 1 RETBLOB ( i ' ) ; Put all the blob-recs on the stack loop

WNDOFF off MAPW ( WNDB ) ptr ( LINES_REC ) := WNDADR mvzer ( TOP , BANDSIZE * 128. ) ptr ( LINES_REC ) += BANDSIZE * 256. - 768. end

<* Execute the analysis for a given number of lines.

DOLINES ( #_LINES ) *> define DOLINES integer #LINES local integer WBNDSZ LASTPT WBNDSZ := 2/ ( BANDSIZE ) LASTPT := 256. - BANDSIZE iter ILINES ptr ( LINES_REC ) += 256. mvzer ( BOT , WBNDSZ ) mvzer ( BOT + LASTPT , WBNDSZ ) RAS2FT ( BOT RASPTS LASTPT ) PT2BLOB if ( NXTBLE < 10 ) BEEP print "TOO MANY BLOBS" ;; exit endif loop end

<* Perform the entire disagreement analysis, *> define BLOB wi th M_EDGE ATTRG ( "MTCHIM" , 160000k ) INITBLOB

DOLINES ( 24. - BANDSIZE ) do 64. , 832.

WNDOFF : = i MAPW ( WNDE ) ptr ( LINES_REC ) : = WNDADR + 1280. DOLINES ( 16 ) loop .( 64. ) WNDOFF : = 896. MAPW ( WNDB ) ptr ( LINES_REC ) := WNDADR + 1280. DOLINES ( 24. - BANDSIZE ) mvzer ( BOT , BANDSIZE * 128. ) DREGION end endfile

<* CALCULATE THE CENTER OF MASS OF A BLOB.

THE UN-NORMALIZED TOTALS ARE IN XBCOM AND YBCOM X,Y := BLBCOM ( BLOB-ID ) *> define BLBCOM long integer ARG1 with BLOBS ( ARG1 ) BLBCOM := wdlong ( lidiv ( XBCOM BLETOT ) lidiv ( YBCOM , BLETOT ) ) end

integer TOOMANY ; Flag to indicate too many defects integer COMTHRESH DELTHRESH ; Repeating defect threshholds. integer TOTTHRESH FLTTHRESH ; Valid defect threshholds COMTHRESH := 3 ; COM's may be within COMTHRESH pixels DELTHRESH := 5 , DEL's may be within DELTHRESH pixels. TOTTHRESH := 7 ; Must have at least TOTTHRESH pixels. FLTTHRESH := 2 ; DELX and DELY at least FLTTHRESH + 1 pixels.

<* Store the defects in the defect buffer (Primary mode) * > define STOREDEFS #_DFCTS off iter #BLOB if ( getbit ( i , BLOBMAP ) ) with BLOBS ( i ) if ( BLBTOT >= TOTTHRESH ) if ( MAXX1 - MINX0 >= FLTTHRESH ) if ( MAXY1 - MINY0 >= FLTTHRESH ) with DEFECTS ( #_DFCTS )

XCOM := lidiv ( XBCOM , BLBTOT ) - REG_X

YCOM := lidiv ( YBCOM , BLBTOT ) - REG_Y

DELX := 2/ ( MAXX1 - MINX0 + 1 )

DELY := 2/ ( MAXY1 - MINY0 + 1 ) increment #_DFCTS if ( #_DFCTS == MAX_DEFECT )

BEEP print "TOO MANY DEFECTS" ex i t endi f endif endif endif endif loop end

<* Add a defect to the defect buffer, given a pointer to the DEFECT record to be added.

ADD_DEFECT ( DEFECT_POINTER ) * > define ADD_DEFECT address DEFPTR with F_DEFCTS ( CUR_FRAME ) mvwds ( DEFPTR , DEFECTS ( #_DFCTS ) , size DEFECT ) increment #_DFCTS if ( #_DFCTS == MAX_DEFECT ) TOOMANY on endif end

Check every defect found against the previous defects to locate repeating defects. (Confirm mode) *> define CHECKREPT local

DEFECT_BUFFER PRIM_DEFS

integer TXCOM TYCOM integer TDELX TDELY mvwds ( F_DEFCTS ( CUR_FRAME ) , PRIM_DEFS , sizew DEFECT BUFFER ) TOOMANY off #_DFCTS off with PRIM_DEFS iter #BLOB if ( getbit ( i , BLOBMAP ) ) with SLOBS ( i ) if ( BLBTOT )= TOTTHRESH ) if ( MAXX1 - MINX0 >= FLTTHRESH ) if ( MAXY1 - MINY0 > = FLTTHRESH ) TXCOM := lidiv ( XBCOM , BLBTOT ) - REC_X TYCOM : = lidiv ( YECOM , BLBTOT ) - REG_Y TDELX : = 2/ ( MAXX1 - MINX0 + 1 ) TDELY : = 2 1 ' MAXY1 - MINY0 + 1 ) iter #_DFCTS with PRIM_DEFS with DEFECTS ( i ) if ( abs ( XCOM - TXCOM ) <= COMTHRESH ) if ( abs ( YCOM - TYCOM ) (= COMTHRESH ) if ( abs ( DELX - TDELX ) < = DELTHRESH ) if ( abs ( DELY - TDELY ) <= DELTHRESH ) ADD_DEFECT ( DEFECTS ( i ) ) exit endif endif endif endif loop if ( TOOMANY )

BEEP print "TOO MANY DEFECTS" exit endif endif endif endif endif loop end

<* Store the defects found, whether primary of confirm mode. *> define STORE with M_EDGE

ATTRG ( "IPSDBR" , 160000k ) ptr ( IPSDE_REC ) := WNDADR with INSP_DATA_BASE with INSP_PLN with LAYERS ( MOD_LAYER ) with DTL_LAYER_REV ( #_REVS - 1 ) with L_RETICLE with RETICLE_DIE with D_PATTERNS ( MOD_PATTERN )

with !NSP_FR ( MOD_SITE ) with F_DEFCTS ( MOD_FRAME ) if ( I -MODE == PRIMARY )

STOREDEFS else

CHECKREPT endif DREGION end

Claims

What is claimed is:

1. Apparatus for the automatic inspection of a semiconductor wafer surface comprising means for illuminating the wafer surface, scanning means for forming in a storage array a representation of the spatial distribution of illumination energy intensity reflected from the surface, edge analysis means for automatically analyzing the reflected energy spatial distribution represented in said array for determining edge boundaries occurring on said wafer surface, reference means for providing a reference pattern description of said wafer surface, comparison means for comparing the edge boundaries determined by said analysis means with said reference pattern description for determining the location of boundary disagreements between the analysis means edge boundaries and the reference pattern description, and means for generating an information output describing said boundary disagreements.

2. The apparatus of claim 1 wherein said illumination means comprises dark field illumination means for illuminating said wafer surface with dark field illumination.

3. The apparatus of claim 2 wherein said scanning means comprises a sensor array having a plurality of photoresponsive elements arranged in a linear pattern, each said element being responsive to illumination incident thereon. means for mounting said linear sensor array for receiving energy reflected from said wafer surface, means for focusing said reflected illuminated surface onto said sensor array elements, means for reading from said sensor array and for storing data in said storage array corresponding to said spatial distribution representation.

4. The apparatus of claim 1 wherein said edge analysis means comprises means responsive to said scanning means for generating a second spatial distribution representing local differences of the reflected illumination intensity across said wafer surface, means responsive to said second spatial distribution for locating potential edge boundaries in said second spatial distribution, means for storing said located potential edge boundaries when said potential boundaries have a strength which exceeds an edge threshold level, and means for spatially filtering said located and stored edge boundaries for forming more continuous edge boundary patterns.

5. The apparatus of claim 4 wherein said storing means and said storage array are the same memory element.

6. The apparatus of claim 4 wherein said illumination means comprises a dark field illumination means for illuminating said wafer surface with an oblique illumination from all directions, and said generating means further comprises means for spatially smoothing said first spatial distribution, means for convolving said first spatial distribution along a first axis separately with a peak detecting spatial function and a step detecting spatial function, means for convolving said first spatial distribution along a second axis orthogonal to said first axis separately with said peak detecting and said step detecting functions, and means for generating from said orthogonal covolvutions said second spatial distribution.

7. The apparatus of claim 1 wherein said reference means comprises a data reference source describing a wafer surface pattern, and means for generating from said data source a data list of reference edge boundaries on said wafer surface.

8. The apparatus of claim 7 wherein said data source further comprises an activity data source for identifying the spatial extent of active areas on said semiconductor wafer.

9. The apparatus of claim 7 wherein said reference means further comprises means for identifying activity volumes on said semiconductor wherein a defect will adversely affect operation of a circuit associated at least in part with said volume.

10. The apparatus of claim 1 wherein said comparison means comprises means for locating corresponding edge boundaries of said reference pattern description and said analysis means edge boundaries for effecting alignment of the reference and the analysis edge boundaries, means for identifying non-corresponding edge boundaries of said reference pattern and said analysis means edge boundaries, and disagreement means responsive to said identifying means for analyzing said identified non-corresponding edge boundaries for determining boundary disagreements on said wafer surface.

11. The apparatus of claim 10 wherein said disagreement means further comprises means for classifying said boundary disagreements into a plurality of boundary disagreement classes.

12. The apparatus of claim 11 wherein one of said classes is a class of killer defects.

13. The apparatus of claim 10 wherein said identifying means further comprises means for locating corner edge intersections in said reference pattern, and means for providing a disagreement tolerance at said corner edge intersections for maintaining a correspondence between a squared reference corner and a rounded wafer corner.

14. The apparatus of claim 1 wherein said generating means comprises means for selecting a boundary disagreement, and means for repositioning said wafer surface for visual inspection of said wafer surface at said selected boundary disagreement.

15. The apparatus of claim 1 further wherein said wafer surface has a repeating reticle pattern thereon and said apparatus further comprises means for automatically comparing boundary disagreements for at least two of said patterns to determine the presence of a repeating boundary disagreement, and means responsive to a said repeating disagreement for classifying said repeating disagreement boundary as a reticle defect.

16. A method for the automatic inspection of a semiconductor wafer surface comprising the steps of illuminating the wafer surface, forming in a storage array a representation of the spatial distribution of illumination energy reflected from the surface, automatically analyzing the reflected energy spatial distribution represented in the array for determining edge boundaries occurring on the wafer surface, providing a reference pattern description of the wafer surface, comparing the edge boundaries determined during said analyzing step with the reference pattern description and determining the location of boundary disagreements between the reference pattern description and the edge boundaries detected during the analyzing step, and generating an information output describing the boundary disagreements.

17. The method of claim 16 wherein said illuminating step comprises the step of illuminating said wafer surface with a dark field illumination for highlighting edge boundaries on said surface.

18. The method of claim 17 wherein said forming step comprises the steps of mounting a linear sensor array element for receiving a said reflected energy from the wafer surface, providing the array element with a plurality of photosensitive elements arranged in a linear pattern, each element being responsive to the illumination incident thereon, focusing the reflected illuminated surface onto the array element, and reading and storing signal values from said array element in said storage array, said signal values corresponding to said reflected energy spatial distribution.

19. The method of claim 16 wherein said analyzing step comprises the steps of generating a second spatial distribution representing local differences of the reflected illumination across the illuminated wafer surface, locating potential edge boundaries in said second spatial distribution depending upon said local differences, storing the located potential edge boundaries when a said boundary has a strength value which exceeds an edge threshold level, and spatially filtering the located and stored edge boundaries for forming a more continuous edge boundary pattern.

20. The method of claim 19 further comprising the steps of illuminating said wafer surface with a dark field illumination for highlighting edge boundaries on said surface, and said generating step further comprises the steps of spatially smoothing said first spatial distribution, convolving said first spatial distribution along a first axis separately with a peak detecting spatial function and a step detecting spatial function, convolving said first spatial distribution along a second axis orthogonal to said first axis separately with said peak detecting and step detecting functions, and generating from said orthogonal convolutions said second spatial distribution.

21. The method of claim 16 further comprising the steps of providing a data source for describing an expected wafer surface pattern, and generating from the data source a list of reference edge boundaries properly expected to exist on said wafer surface.

22. The method of claim 21 wherein the providing step further comprises the step of identifying the extent of active semiconductor areas on the semiconductor wafer.

23. The method of claim 21 wherein said providing step further comprises the step of identifying activity volumes of said semiconductor wherein a defect will adversely affect operation of a circuit associated at least in part with a said volume.

24. The method of claim 16 wherein the comparing step further comprises the steps of locating corresponding edge boundaries of the reference pattern descirption and the analyzed edge boundaries on the wafer for providing effective alignment between the reference and analysis edge boundaries, identifying non-corresponding edge boundaries of the reference pattern and the analysis edge boundaries and fying step, the identified non-corresponding edge boundaries for determining boundary disagreements on the wafer surface.

25. The method of claim 24 wherein the comparison step further comprises classifying the boundary disagreements into a plurality of boundary disagreement classes.

26. The method of claim 25 wherein one of the classes is a class of killer defects.

27. The apparatus of claim 22 wherein the identifying step comprises the steps of locating corner edge intersections in the reference pattern, and providing a greater disagreement tolerance at the corner edge intersection before identifying a corner edge as a non-corresponding edge.

28. The method of claim 16 wherein said generating step comprises the steps of selecting a boundary disagreemnt, and repositioning the wafer surface for visual inspection of the wafer surface at the selected boundary disagreement.

29. The method of claim 16 wherein the wafer surface has a repeating reticle pattern thereon and the method further comprising the steps of automatically comparing boundary disagreements for at least two repeating patterns to determine the presence of a repeating boundary disagreement, and classifying any repeating boundary disagreement a reticle defect.