EP0957420A3 - Clamping circuit - Google Patents
Clamping circuit Download PDFInfo
- Publication number
- EP0957420A3 EP0957420A3 EP99109644A EP99109644A EP0957420A3 EP 0957420 A3 EP0957420 A3 EP 0957420A3 EP 99109644 A EP99109644 A EP 99109644A EP 99109644 A EP99109644 A EP 99109644A EP 0957420 A3 EP0957420 A3 EP 0957420A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- clamping
- circuit
- normal operation
- voltage
- input signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/22—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the bipolar type only
- G05F3/222—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the bipolar type only with compensation for device parameters, e.g. Early effect, gain, manufacturing process, or external variations, e.g. temperature, loading, supply voltage
- G05F3/227—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the bipolar type only with compensation for device parameters, e.g. Early effect, gain, manufacturing process, or external variations, e.g. temperature, loading, supply voltage producing a current or voltage as a predetermined function of the supply voltage
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
- G05F3/242—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
- G05F3/247—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage producing a voltage or current as a predetermined function of the supply voltage
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
- G05F3/262—Current mirrors using field-effect transistors only
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/26—Current mirrors
- G05F3/267—Current mirrors using both bipolar and field-effect technology
Abstract
Es wird eine Klemmschaltung beschrieben, mit der verhindert wird, daß ein an einem Eingangspfad (Vp) anliegendes Eingangssignal negatives Potential annehmen kann. Die Schaltung zeichnet sich durch eine hohe Spannungsfestigkeit bei genauer Einhaltung der Klemmspannung und gleichzeitig eine geringe Stromaufnahme im Normalbetrieb aus. Die Klemmschaltung umfaßt kreuzgekoppelte erste und zweite Transistoren (T1, T2) und ist von einem Normalbetrieb in einen Klemmbetrieb umschaltbar, wenn die Spannung des Eingangssignals unter eine vorbestimmte Klemmspannung, vorzugsweise 0V, abfällt. Hierzu ist ein dritter Transistor (M3) vorgesehen, der so in den Eingangspfad (Vp) geschaltet ist, daß er sich in dem Klemmbetrieb der Schaltung in rückwärts leitendem Zustand und in dem Normalbetrieb in vorwärts gesperrtem Zustand befindet. A clamping circuit is described with which it is prevented that an input signal present on an input path (Vp) can assume negative potential. The circuit is characterized by a high dielectric strength with precise adherence to the clamping voltage and at the same time a low current consumption in normal operation. The clamping circuit comprises cross-coupled first and second transistors (T1, T2) and can be switched from normal operation to clamping operation if the voltage of the input signal drops below a predetermined clamping voltage, preferably 0V. For this purpose, a third transistor (M3) is provided, which is connected to the input path (Vp) in such a way that it is in the reverse conducting state in the clamping operation of the circuit and in the forward blocked state in normal operation.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19821906A DE19821906C1 (en) | 1998-05-15 | 1998-05-15 | Clamping circuit |
DE19821906 | 1998-05-15 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0957420A2 EP0957420A2 (en) | 1999-11-17 |
EP0957420A3 true EP0957420A3 (en) | 2000-03-29 |
EP0957420B1 EP0957420B1 (en) | 2003-04-16 |
Family
ID=7867934
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP99109644A Expired - Lifetime EP0957420B1 (en) | 1998-05-15 | 1999-05-14 | Clamping circuit |
Country Status (3)
Country | Link |
---|---|
US (1) | US6137278A (en) |
EP (1) | EP0957420B1 (en) |
DE (2) | DE19821906C1 (en) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7242240B2 (en) * | 2005-05-05 | 2007-07-10 | Agere Systems, Inc. | Low noise bandgap circuit |
US20090121770A1 (en) | 2007-03-29 | 2009-05-14 | Linear Technology Corporation | Method for clamping a semiconductor region at or near ground |
JP4553395B2 (en) * | 2007-06-15 | 2010-09-29 | シャープ株式会社 | Oscilloscope and semiconductor evaluation apparatus using the same |
WO2011135094A1 (en) * | 2010-04-30 | 2011-11-03 | Katholieke Universiteit Leuven | Voltage clamping circuit and use thereof |
US20130027117A1 (en) * | 2011-07-28 | 2013-01-31 | Anadyne, Inc. | Precision voltage clamp with very low temperature drift |
CN109474246B (en) * | 2018-10-31 | 2022-06-28 | 西安微电子技术研究所 | Voltage clamping protection structure and operational amplifier input stage structure |
CN111208401B (en) * | 2018-11-22 | 2023-01-31 | 宁波飞芯电子科技有限公司 | Test method and device for clamping photodiode |
CN112152189B (en) * | 2020-09-15 | 2023-01-31 | 广东省大湾区集成电路与系统应用研究院 | Clamping circuit and electronic equipment |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4764897A (en) * | 1985-09-30 | 1988-08-16 | Kabushiki Kaisha Toshiba | Semiconductor memory device employing normally-on type GaAs-MESFET transfer gates |
US5436552A (en) * | 1992-09-22 | 1995-07-25 | Mitsubishi Denki Kabushiki Kaisha | Clamping circuit for clamping a reference voltage at a predetermined level |
US5614850A (en) * | 1994-12-09 | 1997-03-25 | Texas Instruments Incorporated | Current sensing circuit and method |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3703711A (en) * | 1971-01-04 | 1972-11-21 | Honeywell Inf Systems | Memory cell with voltage limiting at transistor control terminals |
US3930172A (en) * | 1974-11-06 | 1975-12-30 | Nat Semiconductor Corp | Input supply independent circuit |
GB2189954B (en) * | 1986-04-30 | 1989-12-20 | Plessey Co Plc | Improvements relating to memory cell devices |
US4926073A (en) * | 1989-05-01 | 1990-05-15 | Motorola Inc. | Negative voltage clamp |
KR950005577B1 (en) * | 1992-12-30 | 1995-05-25 | 현대전자산업주식회사 | Bit line load circuit |
FR2718259A1 (en) * | 1994-03-30 | 1995-10-06 | Philips Composants | Regulator circuit providing a voltage independent of the power supply and the temperature. |
US5519341A (en) * | 1994-12-02 | 1996-05-21 | Texas Instruments Incorporated | Cross coupled quad comparator for current sensing independent of temperature |
-
1998
- 1998-05-15 DE DE19821906A patent/DE19821906C1/en not_active Expired - Fee Related
-
1999
- 1999-05-14 DE DE59905031T patent/DE59905031D1/en not_active Expired - Lifetime
- 1999-05-14 EP EP99109644A patent/EP0957420B1/en not_active Expired - Lifetime
- 1999-05-17 US US09/313,423 patent/US6137278A/en not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4764897A (en) * | 1985-09-30 | 1988-08-16 | Kabushiki Kaisha Toshiba | Semiconductor memory device employing normally-on type GaAs-MESFET transfer gates |
US5436552A (en) * | 1992-09-22 | 1995-07-25 | Mitsubishi Denki Kabushiki Kaisha | Clamping circuit for clamping a reference voltage at a predetermined level |
US5614850A (en) * | 1994-12-09 | 1997-03-25 | Texas Instruments Incorporated | Current sensing circuit and method |
Also Published As
Publication number | Publication date |
---|---|
EP0957420B1 (en) | 2003-04-16 |
US6137278A (en) | 2000-10-24 |
EP0957420A2 (en) | 1999-11-17 |
DE19821906C1 (en) | 2000-03-02 |
DE59905031D1 (en) | 2003-05-22 |
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