EP1410701A1 - Method of manufacturing an integrated circuit carrier - Google Patents
Method of manufacturing an integrated circuit carrierInfo
- Publication number
- EP1410701A1 EP1410701A1 EP01981936A EP01981936A EP1410701A1 EP 1410701 A1 EP1410701 A1 EP 1410701A1 EP 01981936 A EP01981936 A EP 01981936A EP 01981936 A EP01981936 A EP 01981936A EP 1410701 A1 EP1410701 A1 EP 1410701A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- substrate
- integrated circuit
- carrier
- receiving zone
- island
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
- H01L23/147—Semiconductor insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4803—Insulating or insulated parts, e.g. mountings, containers, diamond heatsinks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4803—Insulating or insulated parts, e.g. mountings, containers, diamond heatsinks
- H01L21/4807—Ceramic parts
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/13—Mountings, e.g. non-detachable insulating substrates characterised by the shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
- H01L23/49816—Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5387—Flexible insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/562—Protection against mechanical damage
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/85399—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0271—Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49128—Assembling formed circuit to base
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
- Y10T29/49144—Assembling to base an electrical component, e.g., capacitor, etc. by metal fusion
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49147—Assembling terminal to base
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49147—Assembling terminal to base
- Y10T29/49149—Assembling terminal to base by metal fusion bonding
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49204—Contact or terminal manufacturing
- Y10T29/49208—Contact or terminal manufacturing by assembling plural parts
- Y10T29/49222—Contact or terminal manufacturing by assembling plural parts forming array of contacts or terminals
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49789—Obtaining plural product pieces from unitary workpiece
- Y10T29/4979—Breaking through weakened portion
Abstract
Description
Claims
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US693484 | 1985-01-22 | ||
US09/693,484 US6775906B1 (en) | 2000-10-20 | 2000-10-20 | Method of manufacturing an integrated circuit carrier |
PCT/AU2001/001334 WO2002034019A1 (en) | 2000-10-20 | 2001-10-19 | Method of manufacturing an integrated circuit carrier |
Publications (3)
Publication Number | Publication Date |
---|---|
EP1410701A1 true EP1410701A1 (en) | 2004-04-21 |
EP1410701A4 EP1410701A4 (en) | 2006-03-22 |
EP1410701B1 EP1410701B1 (en) | 2008-10-01 |
Family
ID=24784853
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP01981936A Expired - Lifetime EP1410701B1 (en) | 2000-10-20 | 2001-10-19 | Method of manufacturing an integrated circuit carrier |
Country Status (11)
Country | Link |
---|---|
US (10) | US6775906B1 (en) |
EP (1) | EP1410701B1 (en) |
JP (2) | JP2004511920A (en) |
KR (1) | KR100619583B1 (en) |
CN (1) | CN1235452C (en) |
AT (1) | ATE410042T1 (en) |
AU (2) | AU2002213637B2 (en) |
DE (1) | DE60136014D1 (en) |
IL (2) | IL155460A0 (en) |
WO (1) | WO2002034019A1 (en) |
ZA (1) | ZA200303174B (en) |
Families Citing this family (48)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6775906B1 (en) * | 2000-10-20 | 2004-08-17 | Silverbrook Research Pty Ltd | Method of manufacturing an integrated circuit carrier |
US7221043B1 (en) * | 2000-10-20 | 2007-05-22 | Silverbrook Research Pty Ltd | Integrated circuit carrier with recesses |
US6890185B1 (en) * | 2003-11-03 | 2005-05-10 | Kulicke & Soffa Interconnect, Inc. | Multipath interconnect with meandering contact cantilevers |
JP2007053248A (en) * | 2005-08-18 | 2007-03-01 | Tdk Corp | Flexible substrate, mounting structure, display unit and portable electronic device |
US8389862B2 (en) | 2008-10-07 | 2013-03-05 | Mc10, Inc. | Extremely stretchable electronics |
US9123614B2 (en) | 2008-10-07 | 2015-09-01 | Mc10, Inc. | Methods and applications of non-planar imaging arrays |
US8097926B2 (en) | 2008-10-07 | 2012-01-17 | Mc10, Inc. | Systems, methods, and devices having stretchable integrated circuitry for sensing and delivering therapy |
JP5646492B2 (en) | 2008-10-07 | 2014-12-24 | エムシー10 インコーポレイテッドMc10,Inc. | Stretchable integrated circuit and device with sensor array |
WO2010056857A2 (en) * | 2008-11-12 | 2010-05-20 | Mc10, Inc. | Extremely stretchable electronics |
EP2902294B1 (en) * | 2008-11-12 | 2020-03-04 | Mc10, Inc. | Extremely stretchable electronics |
CN101909413A (en) * | 2009-06-03 | 2010-12-08 | 鸿富锦精密工业(深圳)有限公司 | Preparation method of metal meshed board and cover plate and electronic device |
US8837159B1 (en) * | 2009-10-28 | 2014-09-16 | Amazon Technologies, Inc. | Low-profile circuit board assembly |
WO2011143300A1 (en) * | 2010-05-12 | 2011-11-17 | Monolithe Semiconductor Inc. | Extendable network structure |
US8531014B2 (en) * | 2010-09-27 | 2013-09-10 | Infineon Technologies Ag | Method and system for minimizing carrier stress of a semiconductor device |
US8649820B2 (en) | 2011-11-07 | 2014-02-11 | Blackberry Limited | Universal integrated circuit card apparatus and related methods |
US8936199B2 (en) | 2012-04-13 | 2015-01-20 | Blackberry Limited | UICC apparatus and related methods |
USD703208S1 (en) | 2012-04-13 | 2014-04-22 | Blackberry Limited | UICC apparatus |
USD701864S1 (en) * | 2012-04-23 | 2014-04-01 | Blackberry Limited | UICC apparatus |
US9226402B2 (en) | 2012-06-11 | 2015-12-29 | Mc10, Inc. | Strain isolation structures for stretchable electronics |
JP2015521894A (en) | 2012-07-05 | 2015-08-03 | エムシー10 インコーポレイテッドMc10,Inc. | Catheter device including flow sensing |
US9295842B2 (en) | 2012-07-05 | 2016-03-29 | Mc10, Inc. | Catheter or guidewire device including flow sensing and use thereof |
JP2016500869A (en) | 2012-10-09 | 2016-01-14 | エムシー10 インコーポレイテッドMc10,Inc. | Conformal electronic circuit integrated with clothing |
US9171794B2 (en) | 2012-10-09 | 2015-10-27 | Mc10, Inc. | Embedding thin chips in polymer |
US9706647B2 (en) | 2013-05-14 | 2017-07-11 | Mc10, Inc. | Conformal electronics including nested serpentine interconnects |
US9372123B2 (en) | 2013-08-05 | 2016-06-21 | Mc10, Inc. | Flexible temperature sensor including conformable electronics |
JP2016532468A (en) | 2013-10-07 | 2016-10-20 | エムシー10 インコーポレイテッドMc10,Inc. | Conformal sensor system for detection and analysis |
US9949691B2 (en) | 2013-11-22 | 2018-04-24 | Mc10, Inc. | Conformal sensor systems for sensing and analysis of cardiac activity |
CN105874606B (en) | 2014-01-06 | 2021-01-12 | Mc10股份有限公司 | Encapsulated conformal electronic systems and devices and methods of making and using the same |
EP3114911B1 (en) | 2014-03-04 | 2023-05-03 | Medidata Solutions, Inc. | Multi-part flexible encapsulation housing for electronic devices |
US9402312B2 (en) | 2014-05-12 | 2016-07-26 | Invensas Corporation | Circuit assemblies with multiple interposer substrates, and methods of fabrication |
US9899330B2 (en) | 2014-10-03 | 2018-02-20 | Mc10, Inc. | Flexible electronic circuits with embedded integrated circuit die |
US10297572B2 (en) | 2014-10-06 | 2019-05-21 | Mc10, Inc. | Discrete flexible interconnects for modules of integrated circuits |
USD781270S1 (en) | 2014-10-15 | 2017-03-14 | Mc10, Inc. | Electronic device having antenna |
EP3258837A4 (en) | 2015-02-20 | 2018-10-10 | Mc10, Inc. | Automated detection and configuration of wearable devices based on on-body status, location, and/or orientation |
US10398343B2 (en) | 2015-03-02 | 2019-09-03 | Mc10, Inc. | Perspiration sensor |
US9741620B2 (en) | 2015-06-24 | 2017-08-22 | Invensas Corporation | Structures and methods for reliable packages |
WO2017015000A1 (en) | 2015-07-17 | 2017-01-26 | Mc10, Inc. | Conductive stiffener, method of making a conductive stiffener, and conductive adhesive and encapsulation layers |
WO2017031129A1 (en) | 2015-08-19 | 2017-02-23 | Mc10, Inc. | Wearable heat flux devices and methods of use |
US10910315B2 (en) | 2015-08-20 | 2021-02-02 | Apple Inc. | Fabric with embedded electrical components |
WO2017031153A1 (en) * | 2015-08-20 | 2017-02-23 | Oletquin Management Llc | Fabric-based items with electrical component arrays |
WO2017059215A1 (en) | 2015-10-01 | 2017-04-06 | Mc10, Inc. | Method and system for interacting with a virtual environment |
WO2017062508A1 (en) | 2015-10-05 | 2017-04-13 | Mc10, Inc. | Method and System for Neuromodulation and Stimulation |
WO2017147053A1 (en) | 2016-02-22 | 2017-08-31 | Mc10, Inc. | System, device, and method for coupled hub and sensor node on-body acquisition of sensor information |
US10277386B2 (en) | 2016-02-22 | 2019-04-30 | Mc10, Inc. | System, devices, and method for on-body data and power transmission |
WO2017184705A1 (en) | 2016-04-19 | 2017-10-26 | Mc10, Inc. | Method and system for measuring perspiration |
US10447347B2 (en) | 2016-08-12 | 2019-10-15 | Mc10, Inc. | Wireless charger and high speed data off-loader |
US10799403B2 (en) | 2017-12-28 | 2020-10-13 | Stryker Corporation | Patient transport apparatus with controlled auxiliary wheel deployment |
US10779403B2 (en) | 2018-09-20 | 2020-09-15 | Apple Inc. | Shorting pattern between pads of a camera module |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4989063A (en) * | 1988-12-09 | 1991-01-29 | The United States Of America As Represented By The Secretary Of The Air Force | Hybrid wafer scale microcircuit integration |
EP0658927A1 (en) * | 1993-12-15 | 1995-06-21 | Robert Bosch Gmbh | Process for forming a parallel pipe-shaped cavity for receiving a component in a support plate |
EP0852397A1 (en) * | 1997-01-02 | 1998-07-08 | Texas Instruments Incorporated | Cantilevered ball connection for integrated circuit chip package |
US6028358A (en) * | 1996-05-30 | 2000-02-22 | Nec Corporation | Package for a semiconductor device and a semiconductor device |
US6285086B1 (en) * | 1999-06-29 | 2001-09-04 | Sharp Kabushiki Kaisha | Semiconductor device and substrate for semiconductor device |
Family Cites Families (52)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3723176A (en) * | 1969-06-19 | 1973-03-27 | American Lava Corp | Alumina palladium composite |
US3670409A (en) * | 1970-11-19 | 1972-06-20 | Gte Automatic Electric Lab Inc | Planar receptacle |
US4426773A (en) * | 1981-05-15 | 1984-01-24 | General Electric Ceramics, Inc. | Array of electronic packaging substrates |
JPH0654798B2 (en) | 1985-03-11 | 1994-07-20 | 沖電気工業株式会社 | Method for manufacturing semiconductor integrated circuit device |
US4802277A (en) * | 1985-04-12 | 1989-02-07 | Hughes Aircraft Company | Method of making a chip carrier slotted array |
JPS6169150A (en) | 1985-09-06 | 1986-04-09 | Nec Corp | Semiconductor integrated circuit device |
US5086337A (en) * | 1987-01-19 | 1992-02-04 | Hitachi, Ltd. | Connecting structure of electronic part and electronic device using the structure |
JP2533511B2 (en) * | 1987-01-19 | 1996-09-11 | 株式会社日立製作所 | Electronic component connection structure and manufacturing method thereof |
JPH01144652A (en) | 1987-11-30 | 1989-06-06 | Nec Corp | Integrated circuit |
JPH01258458A (en) * | 1988-04-08 | 1989-10-16 | Nec Corp | Wafer integration type integrated circuit |
US4967260A (en) * | 1988-05-04 | 1990-10-30 | International Electronic Research Corp. | Hermetic microminiature packages |
US5045921A (en) * | 1989-12-26 | 1991-09-03 | Motorola, Inc. | Pad array carrier IC device using flexible tape |
US5148265A (en) * | 1990-09-24 | 1992-09-15 | Ist Associates, Inc. | Semiconductor chip assemblies with fan-in leads |
EP0482247A1 (en) | 1990-10-26 | 1992-04-29 | International Business Machines Corporation | Method for producing an integrated circuit structure with a dense multilayer metallization pattern |
US5379191A (en) * | 1991-02-26 | 1995-01-03 | Microelectronics And Computer Technology Corporation | Compact adapter package providing peripheral to area translation for an integrated circuit chip |
US5173055A (en) * | 1991-08-08 | 1992-12-22 | Amp Incorporated | Area array connector |
US6568073B1 (en) * | 1991-11-29 | 2003-05-27 | Hitachi Chemical Company, Ltd. | Process for the fabrication of wiring board for electrical tests |
JPH0685010A (en) * | 1992-09-02 | 1994-03-25 | Toshiba Corp | Multi-chip module |
US5632631A (en) * | 1994-06-07 | 1997-05-27 | Tessera, Inc. | Microelectronic contacts with asperities and methods of making same |
US5802699A (en) * | 1994-06-07 | 1998-09-08 | Tessera, Inc. | Methods of assembling microelectronic assembly with socket for engaging bump leads |
US6361959B1 (en) * | 1994-07-07 | 2002-03-26 | Tessera, Inc. | Microelectronic unit forming methods and materials |
US5983492A (en) * | 1996-11-27 | 1999-11-16 | Tessera, Inc. | Low profile socket for microelectronic components and method for making the same |
JP3294740B2 (en) | 1995-07-31 | 2002-06-24 | 富士通株式会社 | Semiconductor device |
US5810609A (en) * | 1995-08-28 | 1998-09-22 | Tessera, Inc. | Socket for engaging bump leads on a microelectronic device and methods therefor |
DE19534590A1 (en) | 1995-09-11 | 1997-03-13 | Laser & Med Tech Gmbh | Scanning ablation of ceramic materials, plastics and biological hydroxyapatite materials, especially hard tooth substance |
DE69630107D1 (en) | 1996-04-15 | 2003-10-30 | St Microelectronics Srl | FLASH-EPROM integrated with an EEPROM |
US6086386A (en) * | 1996-05-24 | 2000-07-11 | Tessera, Inc. | Flexible connectors for microelectronic elements |
US5938452A (en) * | 1996-12-23 | 1999-08-17 | General Electric Company | Flexible interface structures for electronic devices |
US5796050A (en) | 1997-02-05 | 1998-08-18 | International Business Machines Corporation | Flexible board having adhesive in surface channels |
US6114763A (en) * | 1997-05-30 | 2000-09-05 | Tessera, Inc. | Semiconductor package with translator for connection to an external substrate |
US6313402B1 (en) * | 1997-10-29 | 2001-11-06 | Packard Hughes Interconnect Company | Stress relief bend useful in an integrated circuit redistribution patch |
JPH11135675A (en) * | 1997-10-30 | 1999-05-21 | Kawasaki Steel Corp | Semiconductor device and manufacture thereof |
DE19754874A1 (en) * | 1997-12-10 | 1999-06-24 | Siemens Ag | Converting substrate with edge contacts into ball grid array |
JP3398319B2 (en) * | 1997-12-16 | 2003-04-21 | 新光電気工業株式会社 | Semiconductor device and manufacturing method thereof |
US5973394A (en) * | 1998-01-23 | 1999-10-26 | Kinetrix, Inc. | Small contactor for test probes, chip packaging and the like |
JPH11284029A (en) | 1998-03-27 | 1999-10-15 | Denso Corp | Mounting structure of electronic component |
JP3575324B2 (en) | 1998-03-31 | 2004-10-13 | セイコーエプソン株式会社 | Semiconductor device, method of manufacturing semiconductor device, and method of mounting semiconductor device |
WO1999059206A2 (en) | 1998-05-13 | 1999-11-18 | Koninklijke Philips Electronics N.V. | Semiconductor device and method for making the device |
CN100419978C (en) * | 1998-06-12 | 2008-09-17 | 株式会社瑞萨科技 | Semiconductor device and method for manufacturing the same |
JP2000012732A (en) | 1998-06-24 | 2000-01-14 | Rohm Co Ltd | Structure of bga-type semiconductor device |
US6160715A (en) * | 1998-09-08 | 2000-12-12 | Lucent Technologies Inc. | Translator for recessed flip-chip package |
US6341071B1 (en) | 1999-03-19 | 2002-01-22 | International Business Machines Corporation | Stress relieved ball grid array package |
US6396143B1 (en) * | 1999-04-30 | 2002-05-28 | Mitsubishi Gas Chemical Company, Inc. | Ball grid array type printed wiring board having exellent heat diffusibility and printed wiring board |
US6078505A (en) | 1999-05-14 | 2000-06-20 | Triquint Semiconductor, Inc. | Circuit board assembly method |
US6365967B1 (en) * | 1999-05-25 | 2002-04-02 | Micron Technology, Inc. | Interconnect structure |
US6524115B1 (en) * | 1999-08-20 | 2003-02-25 | 3M Innovative Properties Company | Compliant interconnect assembly |
JP2001094228A (en) | 1999-09-22 | 2001-04-06 | Seiko Epson Corp | Mounting structure of semiconductor device |
US6393143B1 (en) * | 1999-12-08 | 2002-05-21 | The United States Of America As Represented By The Secretary Of The Navy | Technique for estimating the pose of surface shapes using tripod operators |
JP3772078B2 (en) * | 2000-09-29 | 2006-05-10 | 株式会社東芝 | Semiconductor device and wiring board for mounting semiconductor device |
US6775906B1 (en) * | 2000-10-20 | 2004-08-17 | Silverbrook Research Pty Ltd | Method of manufacturing an integrated circuit carrier |
US6507099B1 (en) * | 2000-10-20 | 2003-01-14 | Silverbrook Research Pty Ltd | Multi-chip integrated circuit carrier |
US6710457B1 (en) * | 2000-10-20 | 2004-03-23 | Silverbrook Research Pty Ltd | Integrated circuit carrier |
-
2000
- 2000-10-20 US US09/693,484 patent/US6775906B1/en not_active Expired - Fee Related
-
2001
- 2001-10-19 AT AT01981936T patent/ATE410042T1/en not_active IP Right Cessation
- 2001-10-19 EP EP01981936A patent/EP1410701B1/en not_active Expired - Lifetime
- 2001-10-19 WO PCT/AU2001/001334 patent/WO2002034019A1/en active IP Right Grant
- 2001-10-19 AU AU2002213637A patent/AU2002213637B2/en not_active Ceased
- 2001-10-19 AU AU1363702A patent/AU1363702A/en active Pending
- 2001-10-19 IL IL15546001A patent/IL155460A0/en active IP Right Grant
- 2001-10-19 DE DE60136014T patent/DE60136014D1/en not_active Expired - Lifetime
- 2001-10-19 KR KR1020037005531A patent/KR100619583B1/en not_active IP Right Cessation
- 2001-10-19 CN CNB018177603A patent/CN1235452C/en not_active Expired - Fee Related
- 2001-10-19 JP JP2002537089A patent/JP2004511920A/en active Pending
-
2003
- 2003-04-15 IL IL155460A patent/IL155460A/en not_active IP Right Cessation
- 2003-04-24 ZA ZA200303174A patent/ZA200303174B/en unknown
-
2004
- 2004-07-19 US US10/893,379 patent/US7107674B2/en not_active Expired - Fee Related
- 2004-08-02 US US10/902,852 patent/US7154172B2/en not_active Expired - Fee Related
-
2005
- 2005-10-24 JP JP2005308766A patent/JP4658772B2/en not_active Expired - Fee Related
-
2006
- 2006-05-30 US US11/442,400 patent/US7402894B2/en not_active Expired - Fee Related
- 2006-11-03 US US11/592,209 patent/US7247941B2/en not_active Expired - Fee Related
-
2007
- 2007-06-05 US US11/758,644 patent/US7307354B2/en not_active Expired - Fee Related
- 2007-11-14 US US11/940,304 patent/US7479697B2/en not_active Expired - Fee Related
-
2008
- 2008-06-17 US US12/141,037 patent/US7767912B2/en not_active Expired - Fee Related
- 2008-11-23 US US12/276,390 patent/US7705452B2/en not_active Expired - Fee Related
-
2010
- 2010-04-22 US US12/765,690 patent/US7936063B2/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4989063A (en) * | 1988-12-09 | 1991-01-29 | The United States Of America As Represented By The Secretary Of The Air Force | Hybrid wafer scale microcircuit integration |
EP0658927A1 (en) * | 1993-12-15 | 1995-06-21 | Robert Bosch Gmbh | Process for forming a parallel pipe-shaped cavity for receiving a component in a support plate |
US6028358A (en) * | 1996-05-30 | 2000-02-22 | Nec Corporation | Package for a semiconductor device and a semiconductor device |
EP0852397A1 (en) * | 1997-01-02 | 1998-07-08 | Texas Instruments Incorporated | Cantilevered ball connection for integrated circuit chip package |
US6285086B1 (en) * | 1999-06-29 | 2001-09-04 | Sharp Kabushiki Kaisha | Semiconductor device and substrate for semiconductor device |
Non-Patent Citations (1)
Title |
---|
See also references of WO0234019A1 * |
Also Published As
Similar Documents
Publication | Publication Date | Title |
---|---|---|
AU2002213637B2 (en) | Method of manufacturing an integrated circuit carrier | |
AU2002213637A1 (en) | Method of manufacturing an integrated circuit carrier | |
US7187086B2 (en) | Integrated circuit arrangement | |
US6507099B1 (en) | Multi-chip integrated circuit carrier | |
AU2002210256A1 (en) | An integrated circuit carrier | |
AU2002210253A1 (en) | A multi-chip integrated circuit carrier | |
AU2002210252B2 (en) | Integrated circuit carrier with recesses | |
AU2002210252A1 (en) | Integrated circuit carrier with recesses | |
AU2004203187B2 (en) | Method of reducing rigidity of a substrate | |
AU2004202249B2 (en) | Method of mounting an integrated circuit | |
AU2005200943A1 (en) | Integrated Circuit and Carrier Assembly | |
AU2004203181A1 (en) | An integrated circuit assembly |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20030702 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20060207 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: H05K 1/18 20060101ALI20060201BHEP Ipc: H05K 1/14 20060101AFI20020502BHEP Ipc: H05K 3/34 20060101ALI20060201BHEP |
|
17Q | First examination report despatched |
Effective date: 20060731 |
|
GRAP | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOSNIGR1 |
|
GRAS | Grant fee paid |
Free format text: ORIGINAL CODE: EPIDOSNIGR3 |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
AK | Designated contracting states |
Kind code of ref document: B1 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR |
|
REG | Reference to a national code |
Ref country code: GB Ref legal event code: FG4D |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: EP |
|
REG | Reference to a national code |
Ref country code: IE Ref legal event code: FG4D |
|
REF | Corresponds to: |
Ref document number: 60136014 Country of ref document: DE Date of ref document: 20081113 Kind code of ref document: P |
|
NLV1 | Nl: lapsed or annulled due to failure to fulfill the requirements of art. 29p and 29m of the patents act | ||
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: AT Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20081001 Ref country code: ES Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20090112 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: FI Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20081001 Ref country code: PT Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20090302 Ref country code: NL Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20081001 Ref country code: MC Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20081031 |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: PL |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: BE Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20081001 Ref country code: DK Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20081001 |
|
PLBE | No opposition filed within time limit |
Free format text: ORIGINAL CODE: 0009261 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: SE Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20090101 Ref country code: IT Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20081001 |
|
26N | No opposition filed |
Effective date: 20090702 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: LI Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20081031 Ref country code: CH Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20081031 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: CY Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20081001 Ref country code: LU Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20081019 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: TR Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20081001 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GR Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT Effective date: 20090102 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: IE Payment date: 20120430 Year of fee payment: 11 Ref country code: DE Payment date: 20120430 Year of fee payment: 11 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: GB Payment date: 20120430 Year of fee payment: 11 Ref country code: FR Payment date: 20120601 Year of fee payment: 11 |
|
GBPC | Gb: european patent ceased through non-payment of renewal fee |
Effective date: 20121019 |
|
REG | Reference to a national code |
Ref country code: IE Ref legal event code: MM4A |
|
REG | Reference to a national code |
Ref country code: FR Ref legal event code: ST Effective date: 20130628 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: DE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20130501 Ref country code: IE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20121019 Ref country code: GB Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20121019 |
|
REG | Reference to a national code |
Ref country code: DE Ref legal event code: R119 Ref document number: 60136014 Country of ref document: DE Effective date: 20130501 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: FR Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20121031 |