EP1819423A4 - Ion source for a mass spectrometer - Google Patents

Ion source for a mass spectrometer

Info

Publication number
EP1819423A4
EP1819423A4 EP05851479A EP05851479A EP1819423A4 EP 1819423 A4 EP1819423 A4 EP 1819423A4 EP 05851479 A EP05851479 A EP 05851479A EP 05851479 A EP05851479 A EP 05851479A EP 1819423 A4 EP1819423 A4 EP 1819423A4
Authority
EP
European Patent Office
Prior art keywords
mass spectrometer
ion source
spectrometer
ion
mass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP05851479A
Other languages
German (de)
French (fr)
Other versions
EP1819423A2 (en
Inventor
Charles Nehemiah Mcewen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EIDP Inc
Original Assignee
EI Du Pont de Nemours and Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EI Du Pont de Nemours and Co filed Critical EI Du Pont de Nemours and Co
Publication of EP1819423A2 publication Critical patent/EP1819423A2/en
Publication of EP1819423A4 publication Critical patent/EP1819423A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/107—Arrangements for using several ion sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph
EP05851479A 2004-11-09 2005-11-09 Ion source for a mass spectrometer Withdrawn EP1819423A4 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US62616104P 2004-11-09 2004-11-09
US68749705P 2005-06-03 2005-06-03
PCT/US2005/040632 WO2006060130A2 (en) 2004-11-09 2005-11-09 Ion source for a mass spectrometer

Publications (2)

Publication Number Publication Date
EP1819423A2 EP1819423A2 (en) 2007-08-22
EP1819423A4 true EP1819423A4 (en) 2010-11-03

Family

ID=36565499

Family Applications (1)

Application Number Title Priority Date Filing Date
EP05851479A Withdrawn EP1819423A4 (en) 2004-11-09 2005-11-09 Ion source for a mass spectrometer

Country Status (3)

Country Link
EP (1) EP1819423A4 (en)
JP (1) JP4782796B2 (en)
WO (1) WO2006060130A2 (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006050136B4 (en) * 2006-10-25 2016-12-15 Leibniz-Institut für Analytische Wissenschaften-ISAS-e.V. Method and device for generating positive and / or negative ionized gas analytes for gas analysis
FR2918753B1 (en) * 2007-07-09 2010-06-18 Renault Sas METHOD FOR DETERMINING THE FUEL CONTENT IN A COMBUSTION ENGINE LUBRICATING OIL.
US8642952B2 (en) 2009-11-10 2014-02-04 Waters Technologies Corporation Apparatus and methods for gas chromatography-mass spectrometry
US8378293B1 (en) * 2011-09-09 2013-02-19 Agilent Technologies, Inc. In-situ conditioning in mass spectrometer systems
US9305759B2 (en) 2012-01-26 2016-04-05 University Of The Sciences In Philadelphia Ionization at intermediate pressure for atmospheric pressure ionization mass spectrometers
WO2013122745A1 (en) * 2012-02-13 2013-08-22 Waters Technologies Corporation Ionization of analyte molecules comprised in a flow of gas
US9153427B2 (en) 2012-12-18 2015-10-06 Agilent Technologies, Inc. Vacuum ultraviolet photon source, ionization apparatus, and related methods
US11841372B1 (en) 2018-07-31 2023-12-12 Inspectir Systems, Llc Techniques for rapid detection and quantitation of volatile organic compounds (VOCs) using breath samples
US11721533B1 (en) 2018-07-31 2023-08-08 Inspectir Systems, Llc Techniques for rapid detection and quantitation of volatile organic compounds (VOCS) using breath samples
US11841359B1 (en) 2018-07-31 2023-12-12 Inspectir Systems, Llc Techniques for portable rapid detection and quantitation of volatile organic compounds (VOCS) using breath samples
US11662340B1 (en) * 2018-07-31 2023-05-30 InspectIR Systems, Inc. Techniques for rapid detection and quantitation of volatile organic compounds (VOCS) using breath samples
US11874270B1 (en) 2018-07-31 2024-01-16 Inspectir Systems, Llc Techniques for rapid detection and quantitation of volatile organic compounds (VOCs) using breath samples
US11879890B1 (en) 2018-07-31 2024-01-23 Inspectir Systems, Llc Techniques for rapid detection and quantitation of volatile organic compounds (VOCS) using breath samples
JP7138247B2 (en) * 2019-07-10 2022-09-15 株式会社日立ハイテク Mass spectrometer
CN115116819A (en) * 2022-07-04 2022-09-27 广东智普生命科技有限公司 Electrospray extraction ionization source

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4175234A (en) * 1977-08-05 1979-11-20 University Of Virginia Apparatus for producing ions of thermally labile or nonvolatile solids
US4667100A (en) * 1985-04-17 1987-05-19 Lagna William M Methods and apparatus for mass spectrometric analysis of fluids
US4842701A (en) * 1987-04-06 1989-06-27 Battelle Memorial Institute Combined electrophoretic-separation and electrospray method and system
EP0966022A2 (en) * 1998-06-18 1999-12-22 Micromass Limited Multi-inlet mass spectrometer
US6407382B1 (en) * 1999-06-04 2002-06-18 Technispan Llc Discharge ionization source
US20020096631A1 (en) * 1997-09-12 2002-07-25 Andrien Bruce A. Multiple sample introduction mass spectometry
US6534765B1 (en) * 1999-10-29 2003-03-18 Mds Inc. Atmospheric pressure photoionization (APPI): a new ionization method for liquid chromatography-mass spectrometry
US6646257B1 (en) * 2002-09-18 2003-11-11 Agilent Technologies, Inc. Multimode ionization source
WO2003104763A2 (en) * 2002-06-05 2003-12-18 Advanced Research And Technology Institute, Inc. Apparatus and method for relative or quantitative comparison of multiple samples
US20040119009A1 (en) * 1999-02-09 2004-06-24 Hanold Karl A. Multiple ion sources involving atmospheric pressure photoionization
US20040217277A1 (en) * 2003-04-30 2004-11-04 Goodley Paul C. Apparatus and method for surface activation and selective ion generation for MALDI mass spectrometry

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0550648U (en) * 1991-11-27 1993-07-02 株式会社日立製作所 Mass spectrometer
JP3622332B2 (en) * 1996-04-25 2005-02-23 株式会社日立製作所 Mass spectrometer
JPH10300722A (en) * 1997-04-22 1998-11-13 Hitachi Ltd Mass spectrograph
JPH11326302A (en) * 1998-05-13 1999-11-26 Shimadzu Corp Liquid chromatograph mass spectroscope
JP3982094B2 (en) * 1999-02-10 2007-09-26 株式会社日立製作所 Multicapillary ionization mass spectrometer
US6458597B1 (en) * 1999-03-22 2002-10-01 Analytica Of Branford, Inc. Direct flow injection analysis nebulization electrospray and apci mass spectrometry

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4175234A (en) * 1977-08-05 1979-11-20 University Of Virginia Apparatus for producing ions of thermally labile or nonvolatile solids
US4667100A (en) * 1985-04-17 1987-05-19 Lagna William M Methods and apparatus for mass spectrometric analysis of fluids
US4842701A (en) * 1987-04-06 1989-06-27 Battelle Memorial Institute Combined electrophoretic-separation and electrospray method and system
US20020096631A1 (en) * 1997-09-12 2002-07-25 Andrien Bruce A. Multiple sample introduction mass spectometry
EP0966022A2 (en) * 1998-06-18 1999-12-22 Micromass Limited Multi-inlet mass spectrometer
US20040119009A1 (en) * 1999-02-09 2004-06-24 Hanold Karl A. Multiple ion sources involving atmospheric pressure photoionization
US6407382B1 (en) * 1999-06-04 2002-06-18 Technispan Llc Discharge ionization source
US6534765B1 (en) * 1999-10-29 2003-03-18 Mds Inc. Atmospheric pressure photoionization (APPI): a new ionization method for liquid chromatography-mass spectrometry
WO2003104763A2 (en) * 2002-06-05 2003-12-18 Advanced Research And Technology Institute, Inc. Apparatus and method for relative or quantitative comparison of multiple samples
US6646257B1 (en) * 2002-09-18 2003-11-11 Agilent Technologies, Inc. Multimode ionization source
US20040217277A1 (en) * 2003-04-30 2004-11-04 Goodley Paul C. Apparatus and method for surface activation and selective ion generation for MALDI mass spectrometry

Also Published As

Publication number Publication date
WO2006060130A2 (en) 2006-06-08
WO2006060130A3 (en) 2007-04-26
JP2008519985A (en) 2008-06-12
JP4782796B2 (en) 2011-09-28
EP1819423A2 (en) 2007-08-22

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Legal Events

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PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

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17P Request for examination filed

Effective date: 20070518

AK Designated contracting states

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Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

AX Request for extension of the european patent

Extension state: AL BA HR MK YU

DAX Request for extension of the european patent (deleted)
RBV Designated contracting states (corrected)

Designated state(s): DE FR GB

A4 Supplementary search report drawn up and despatched

Effective date: 20101004

RIC1 Information provided on ipc code assigned before grant

Ipc: B01D 59/44 20060101ALI20100928BHEP

Ipc: H01J 49/10 20060101ALI20100928BHEP

Ipc: H01J 49/04 20060101AFI20100928BHEP

17Q First examination report despatched

Effective date: 20120924

STAA Information on the status of an ep patent application or granted ep patent

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18W Application withdrawn

Effective date: 20151028