US20020153104A1 - Plasma etching chamber and method for manufacturing photomask using the same - Google Patents
Plasma etching chamber and method for manufacturing photomask using the same Download PDFInfo
- Publication number
- US20020153104A1 US20020153104A1 US10/124,578 US12457802A US2002153104A1 US 20020153104 A1 US20020153104 A1 US 20020153104A1 US 12457802 A US12457802 A US 12457802A US 2002153104 A1 US2002153104 A1 US 2002153104A1
- Authority
- US
- United States
- Prior art keywords
- heat transfer
- plasma etching
- transparent substrate
- etching chamber
- transfer element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
- H01J37/32724—Temperature
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/80—Etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/2001—Maintaining constant desired temperature
Definitions
- the present invention relates to a plasma etching chamber and a method for manufacturing a photomask using the same, and more particularly, to a plasma etching chamber of a plasma etching device used in an etching process for manufacturing a photomask and a method for manufacturing a photomask using the same.
- a photomask is typically used in a photolithographic process for manufacturing a semiconductor device, and the photomask may have various exposure patterns to achieve the desired result.
- a shading layer is first formed on a photomask substrate, and a photoresist pattern is formed on the shading layer to expose a portion of the shading layer to create a shading layer pattern.
- photomask substrates are square-shaped.
- a portion of the photoresist layer at the corners of the photomask substrate is thicker than a portion of the photoresist layer near the center of the photomask substrate.
- the electron beam photoresist layer at the corners of the photomask substrate is about 200 ⁇ thicker than the electron beam photoresist layer at the center of the photomask substrate.
- the critical dimension (CD) of a portion close to the edge of the photomask substrate becomes smaller than that of a portion close to the center of the photomask substrate.
- ADI after development inspection
- the difference in the CD among portions of the photomask substrate is even more pronounced. More specifically, the shading layer is etched to form a shading layer pattern, and then stripping and cleaning processes are performed on the resultant substrate. After that, an after cleaning inspection (ACI) is carried out. With reference to the ACI, the difference in the CD among portions of the shading layer pattern is more pronounced, because an etching rate for the shading layer at the center of the photomask substrate is relatively high, whereas an etching rate for the shading layer at the edge of the photomask substrate is relatively low.
- ACI after cleaning inspection
- the present invention provides a plasma etching chamber including an electrode having a supporting surface for supporting a photomask substrate, and a top surface surrounding the supporting surface.
- a heat transfer element is installed along the peripheral edge of the supporting surface, and a heater is provided to supply heat to the heat transfer element.
- the heat transfer element is built into the electrode itself.
- the heat transfer element may be partially exposed along the peripheral edge of the supporting surface and the top surface on the electrode.
- the electrode may further include a side wall extending between the top surface and the supporting surface, and the heat transfer element may be partially exposed along the peripheral edge of the supporting surface, the side wall, and the top surface.
- the heat transfer element may be built into the electrode so that it is not exposed on the top surface of the electrode.
- the present invention provides a plasma etching chamber including an electrode, including a supporting surface for supporting a photomask substrate and a top surface surrounding the supporting surface.
- a chucking pad has a contact surface in contact with the corners of the photomask substrate and fixes the photomask substrate which is supported by the supporting surface.
- a heat transfer element is installed at the chucking pad to heat the corners of the photomask substrate, and a heater supplies heat to the heat transfer element.
- the heat transfer element is built into the chucking pad.
- the present invention provides a method for manufacturing a photomask, in which a shading layer is first formed on a transparent substrate. A photoresist layer pattern is formed on the shading layer so as to partially expose the shading layer. The shading layer is etched using plasma and using the photoresist layer pattern as an etching mask under a state in which at least one portion of the peripheral edge of the transparent substrate is maintained at a temperature higher than the temperature of the center of the transparent substrate.
- the peripheral edge of the transparent substrate may be uniformly heated in order to maintain the temperature of the edge of the transparent substrate higher than the temperature of the center of the transparent substrate.
- the heat may be applied to the bottom edge of the transparent substrate in order to heat the edge of the transparent substrate.
- heat may be applied to the bottom edge and side walls of the transparent substrate in order to the heat the edge of the transparent substrate.
- a heat transfer element installed along the edge of the transparent substrate, and a heater for supplying heat to the heat transfer element, may be used for uniformly heating the edge of the transparent substrate.
- the corners of the transparent substrate may be heated in order to maintain the temperature of the corners of the transparent substrate higher than the temperature of the center of the transparent substrate.
- a heat transfer element installed along the corners of the transparent substrate, and a heater for supplying heat to the heat transfer element, may be used for heating the corners of the transparent substrate.
- the plasma etching chamber according to the present invention includes the heat transfer element for maintaining the temperature of the corners of the transparent substrate higher than the temperature of the center of the transparent substrate.
- the heat transfer element for maintaining the temperature of the corners of the transparent substrate higher than the temperature of the center of the transparent substrate.
- the temperature of at least one portion of the edge of the transparent substrate is maintained higher than the temperature of the center of the transparent substrate by heating the at least one portion of the edge of the transparent substrate. Therefore, it is possible to form a shading layer pattern having a uniform CD distribution over the transparent substrate by increasing an etching rate for the shading layer at the edge of the transparent substrate.
- FIG. 1 is a schematic view of a plasma etching chamber according to a first embodiment of the present invention
- FIG. 2 is a top view of an electrode and a heat transfer element included in the plasma etching chamber according to the first embodiment of the present invention
- FIGS. 3 through 5 are views illustrating the detailed structure of different embodiments of a heat transfer element included in the plasma etching chamber according to the first embodiment of the present invention
- FIG. 6 is a top view illustrating the structure of a plasma etching chamber according to a second embodiment of the present invention.
- FIG. 7 is a cross-sectional view of an electrode of the plasma etching chamber according to the second embodiment of the present invention, taken along line 7 - 7 ′ of FIG. 6;
- FIG. 8 is a cross-sectional view of the electrode of the plasma etching chamber according to a second embodiment of the present invention, taken along line 8 - 8 ′ of FIG. 6;
- FIGS. 9A and 9B are cross-sectional views illustrating a method for manufacturing a photomask according to a preferred embodiment of the present invention.
- FIGS. 10 and 11 are views illustrating the bottom surface of a transparent substrate shown in FIGS. 9A and 9B.
- the present invention may be embodied in many different forms and should not be construed as being limited to the present embodiment set forth herein. Rather, the embodiment is provided so that this disclosure will be thorough and complete, and will fully convey the concept of the invention to those skilled in the art.
- the thickness of layers and regions are exaggerated for clarity. It will also be understood that when a layer is referred to as being “on” another layer or substrate, it can be directly on the other layer or substrate, or intervening layers may also be present.
- FIG. 1 is a schematic view illustrating the structure of a plasma etching chamber according to a first embodiment of the present invention.
- the plasma etching chamber may be installed in a transformer coupled plasma (TCP) etching apparatus, for example, or other suitable plasma etching chamber.
- TCP transformer coupled plasma
- a plasma etching chamber 10 includes a chamber wall 12 , a TCP coil 14 installed on the chamber wall 12 , and a first power source 16 for applying radio-frequency (RF) power to the TCP coil 14 .
- RF radio-frequency
- An electrode 30 for supporting a photomask substrate 20 is installed inside the plasma etching chamber 10 .
- the electrode 30 includes a supporting surface 32 for supporting the photomask substrate 20 and a top surface 34 positioned outwardly of the supporting surface 32 and surrounding the supporting surface 32 .
- the supporting surface 32 is recessed (or has a step difference) from the top surface 34 , although in other embodiments it need not be.
- a horizontal plane comprising the supporting surface 32 is recessed from a horizontal plane comprising the top surface 34 .
- a side wall 36 extends between the top surface 34 and the supporting surface 32 in the electrode 30 , thereby forming a shoulder S on which the photomask substrate 20 rests.
- a second power source 18 for applying radio-frequency (RF) power to the electrode 30 is connected to the bottom of the plasma etching chamber 10 .
- the electrode 30 is installed so that the supporting surface 32 and top surface 34 face upward.
- a heat transfer element 40 is installed near the edge of the supporting surface 32 of the electrode 30 .
- the heat transfer element 40 is connected to a heater 50 for supplying heat to the heat transfer element 40 .
- the heat transfer element 40 is preferably built into the electrode 30 , in the shoulder area S of the electrode 30 , thereby forming an L-shaped heat transfer element.
- the heat transfer element 40 is illustrated as being partially exposed at the peripheral edge of the supporting surface 32 on the electrode 30 , the side wall 36 , and the top surface 34 to effectively heat the edge of the photomask substrate 20 . Since the exposed portion of the supporting surface 32 is very close to the bottom edge of the photomask substrate 20 and the side wall 36 , the edge of the photomask substrate 20 can be effectively heated.
- the heat transfer element 40 may be formed within the electrode 30 such that the heat transfer element 40 is not exposed on the top surface 34 of the electrode 30 .
- FIG. 2 is a top view illustrating the electrode 30 and the heat transfer element 40 built into the electrode 30 of FIG. 1. As viewed from above the electrode 30 , the L-shaped heat transfer element 40 is installed to completely enclose the peripheral edge of the supporting surface 32 , and extends from the edge of the supporting surface 32 to a certain width along the top surface 34 .
- FIGS. 3 through 5 are views illustrating the detailed structure of alternate embodiments of the heat transfer element 40 .
- the heat transfer element 40 may be comprised of a metal line 62 having a high heat conductivity.
- the metal line 62 includes a connection unit 62 a which is connected to the heater 50 to receive heat supplied from the heater 50 .
- the heat transfer element 40 may include a pipe line 72 and heat transfer fluid flowing through the pipe line 72 for heating the pipe line 72 .
- the heat transfer fluid may be oil or gas, and the fluid functions to transmit heat supplied from the heater 50 to the pipe line 72 .
- the heat transfer element 40 may be comprised of a heating coil 82 in various configurations based on the desired heating profile, for example, edge heating, edge and side wall heating, or edge, side wall and top surface heating.
- the plasma etching chamber 10 includes the heat transfer element 40 for heating the edge of the photomask substrate 20 , the edge of the photomask substrate 20 can be heated to a temperature higher than the temperature at the center of the photomask substrate 20 , and thus an etching rate for a shading layer in an etching process for forming a shading layer pattern can be uniformly controlled on the entire photomask substrate 20 .
- the etching rate increases as the temperature of a typical photoresist layer increases.
- FIG. 6 is a partial schematic top view illustrating the structure of a plasma etching chamber according to a second embodiment of the present invention.
- FIG. 7 is a cross-sectional view of the electrode 130 of the plasma etching chamber according to the second embodiment of the present invention, taken along line 7 - 7 ′ of FIG. 6.
- FIG. 8 is an enlarged cross-sectional view of the electrode of the plasma etching chamber according to a second embodiment of the present invention, taken along line 8 - 8 ′ of FIG. 6.
- the plasma etching chamber according to the second embodiment of the present invention may be included in an inductively coupled plasma (ICP) etching apparatus.
- ICP inductively coupled plasma
- the electrode 130 shown in FIG. 6 is installed in a face-down type plasma etching chamber in which a top surface 134 of the electrode 130 faces downward.
- the plasma etching chamber includes a supporting surface 132 for supporting a photomask substrate 120 .
- the electrode 130 including the top surface 134 surrounds the recessed (or stepped down) supporting surface 132 .
- a side wall 136 extends between the top surface 134 and the supporting surface 132 .
- a plurality of chucking pads 140 are installed below the electrode 130 as shown best in FIG. 8.
- the chucking pads 140 fix the photomask substrate 120 that is supported by the supporting surface.
- Each of the chucking pads 140 includes a contact surface 142 extending inwardly of the side walls 136 such that the chucking pads 140 and the corners of the photomask substrate 120 contact each other so that the photomask substrate 120 is fixed in place.
- a heat transfer element 160 for heating the corners of the photomask substrate 120 is built into each of the chucking pads 140 .
- the heat transfer element 160 receives heat supplied from a heater 150 .
- the heat transfer element 160 may be comprised of metal, a heating coil, or other heating device embodiments as set forth in FIGS. 3 - 5 .
- the plasma etching chamber according to the second embodiment of the present invention includes the chucking pads 140 in which the heat transfer element 160 is installed, it is possible to effectively heat only the corners of the photomask substrate 120 showing a relatively large thickness of photoresist and a relatively small CD value along portions of the edge of the photomask substrate 120 . Accordingly, the corners of the photomask substrate 120 can be heated to a temperature higher than the temperature at the center of the photomask substrate 120 . Therefore, an etching rate for a shading layer in an etching process for forming a shading layer pattern can be uniformly controlled along the entire photomask substrate 120 . As a result, it is possible to form the shading layer pattern having a uniform CD distribution over the entire photomask substrate 120 .
- FIGS. 9A and 9B are cross-sectional views illustrating a method for manufacturing a photomask according to a preferred embodiment of the present invention.
- a shading layer 210 such as a chrome layer, is formed on a transparent substrate 200 , such as a quartz substrate.
- a photoresist layer pattern 220 is formed on the shading layer 210 to partially expose the shading layer 210 .
- the photoresist layer pattern 220 may be an electron beam photoresist.
- the shading layer 210 is etched by performing an etching process using plasma while using the photoresist layer pattern 220 as an etching mask under a state in which the temperature of at least a portion of the edge of the transparent substrate 200 is maintained higher than the temperature of the center of the transparent substrate 200 , thus forming a uniform shading layer pattern 210 a.
- a typical plasma etching apparatus such as a TCP etching apparatus or an ICP etching apparatus, may be used.
- FIGS. 10 and 11 are views illustrating the bottom surface of the transparent substrate 200 .
- the corners 202 b of the transparent substrate 200 which are denoted by the slanted lines in FIG. 11, can be heated.
- a plasma etching chamber including chucking pads which has been described above with reference to FIG. 8, may be used.
- an etching rate for the shading layer 210 at a peripheral edge portion or corners of the transparent substrate 200 can be enhanced by maintaining the temperature of at least a portion of the edge of the transparent substrate 200 higher than the temperature of the center of the transparent substrate 200 while etching the shading layer 210 .
- the plasma etching chamber according to the present invention includes a heat transfer element for maintaining the temperature of the edge of the photomask substrate higher than the temperature of the center of the photomask substrate by heating the edge or corners of the photomask substrate.
- the etching rate for a shading layer can be controlled to ensure layer uniformity over the entire photomask substrate. As a result, it is possible to form a shading layer pattern having a uniform CD distribution over the entire photomask substrate.
- a shading layer before etching a shading layer, at least one portion of the edge of a transparent substrate is heated to a temperature higher than the temperature of the center of the transparent substrate.
- an etching rate for the shading layer at the edge or corners of the transparent substrate can be enhanced.
Abstract
A plasma etching chamber of a plasma etching apparatus used in an etching process for manufacturing a photomask and a method for manufacturing a photomask using the same. The plasma etching chamber includes an electrode having a supporting surface for supporting a photomask substrate and a top surface surrounding the supporting surface, a heat transfer element installed along a peripheral edge of the supporting surface, and a heater for supplying heat to the heat transfer element. In the method for manufacturing a photomask, a shading layer is formed on a transparent substrate. A photoresist layer pattern is formed on the shading layer to partially expose the shading layer. The shading layer is etched to form a shading layer pattern, using plasma with the photoresist layer pattern as an etching mask, under a state in which the temperature of at least one portion of the peripheral edge of the transparent substrate is maintained higher than a temperature at a center of the transparent substrate.
Description
- 1. Field of the Invention
- The present invention relates to a plasma etching chamber and a method for manufacturing a photomask using the same, and more particularly, to a plasma etching chamber of a plasma etching device used in an etching process for manufacturing a photomask and a method for manufacturing a photomask using the same.
- 2. Description of the Related Art
- A photomask is typically used in a photolithographic process for manufacturing a semiconductor device, and the photomask may have various exposure patterns to achieve the desired result. To form a photomask having a desired exposure pattern, a shading layer is first formed on a photomask substrate, and a photoresist pattern is formed on the shading layer to expose a portion of the shading layer to create a shading layer pattern.
- In general, photomask substrates are square-shaped. When the photoresist layer is formed on a square-shaped photomask substrate, a portion of the photoresist layer at the corners of the photomask substrate is thicker than a portion of the photoresist layer near the center of the photomask substrate. For example, in the case of forming an electron beam photoresist layer to a thickness of 3000 Å, the electron beam photoresist layer at the corners of the photomask substrate is about 200 Å thicker than the electron beam photoresist layer at the center of the photomask substrate.
- Given this non-uniformity, after electron beam exposure and development are performed on the resultant substrate, the critical dimension (CD) of a portion close to the edge of the photomask substrate becomes smaller than that of a portion close to the center of the photomask substrate. Indeed, based on an after development inspection (ADI) performed after the photoresist layer pattern is formed to partially expose the shading layer on the photomask substrate, it has been noted that portions closer to the edge of the photomask substrate exhibit a smaller CD value.
- Moreover, after the shading layer is etched by dry etching using the photoresist layer pattern as an etching mask, the difference in the CD among portions of the photomask substrate is even more pronounced. More specifically, the shading layer is etched to form a shading layer pattern, and then stripping and cleaning processes are performed on the resultant substrate. After that, an after cleaning inspection (ACI) is carried out. With reference to the ACI, the difference in the CD among portions of the shading layer pattern is more pronounced, because an etching rate for the shading layer at the center of the photomask substrate is relatively high, whereas an etching rate for the shading layer at the edge of the photomask substrate is relatively low.
- As described above, if a photomask having a predetermined exposure pattern and exhibiting non-uniform CD distribution over an entire photomask substrate is used in the manufacture of semiconductor devices, various problems may occur, including performance degradation or inoperative devices.
- To solve the above problems, it is a first object of the present invention to provide a plasma etching chamber used to perform an etching process for forming a shading layer pattern with a uniform CD distribution over an entire photomask substrate.
- It is a second object of the present invention to provide a method for manufacturing a photomask including a shading layer pattern which has a uniform CD distribution over an entire photomask substrate.
- Accordingly, to achieve the first object, the present invention provides a plasma etching chamber including an electrode having a supporting surface for supporting a photomask substrate, and a top surface surrounding the supporting surface. A heat transfer element is installed along the peripheral edge of the supporting surface, and a heater is provided to supply heat to the heat transfer element.
- Preferably, the heat transfer element is built into the electrode itself. The heat transfer element may be partially exposed along the peripheral edge of the supporting surface and the top surface on the electrode.
- When the supporting surface is stepped down from the top surface, the electrode may further include a side wall extending between the top surface and the supporting surface, and the heat transfer element may be partially exposed along the peripheral edge of the supporting surface, the side wall, and the top surface.
- Alternatively, the heat transfer element may be built into the electrode so that it is not exposed on the top surface of the electrode.
- In another aspect, the present invention provides a plasma etching chamber including an electrode, including a supporting surface for supporting a photomask substrate and a top surface surrounding the supporting surface. A chucking pad has a contact surface in contact with the corners of the photomask substrate and fixes the photomask substrate which is supported by the supporting surface. A heat transfer element is installed at the chucking pad to heat the corners of the photomask substrate, and a heater supplies heat to the heat transfer element. Preferably, the heat transfer element is built into the chucking pad.
- To achieve the second object, the present invention provides a method for manufacturing a photomask, in which a shading layer is first formed on a transparent substrate. A photoresist layer pattern is formed on the shading layer so as to partially expose the shading layer. The shading layer is etched using plasma and using the photoresist layer pattern as an etching mask under a state in which at least one portion of the peripheral edge of the transparent substrate is maintained at a temperature higher than the temperature of the center of the transparent substrate.
- During the step of etching the shading layer, the peripheral edge of the transparent substrate may be uniformly heated in order to maintain the temperature of the edge of the transparent substrate higher than the temperature of the center of the transparent substrate. Alternatively, the heat may be applied to the bottom edge of the transparent substrate in order to heat the edge of the transparent substrate. In another alternative, heat may be applied to the bottom edge and side walls of the transparent substrate in order to the heat the edge of the transparent substrate. A heat transfer element installed along the edge of the transparent substrate, and a heater for supplying heat to the heat transfer element, may be used for uniformly heating the edge of the transparent substrate.
- Also, during the step of etching the shading layer, the corners of the transparent substrate may be heated in order to maintain the temperature of the corners of the transparent substrate higher than the temperature of the center of the transparent substrate. A heat transfer element installed along the corners of the transparent substrate, and a heater for supplying heat to the heat transfer element, may be used for heating the corners of the transparent substrate.
- The plasma etching chamber according to the present invention includes the heat transfer element for maintaining the temperature of the corners of the transparent substrate higher than the temperature of the center of the transparent substrate. Thus, it is possible to form a shading layer having a uniform CD distribution over the entire photomask substrate. In addition, in the method for manufacturing a photomask according to the present invention, when etching the shading layer, the temperature of at least one portion of the edge of the transparent substrate is maintained higher than the temperature of the center of the transparent substrate by heating the at least one portion of the edge of the transparent substrate. Therefore, it is possible to form a shading layer pattern having a uniform CD distribution over the transparent substrate by increasing an etching rate for the shading layer at the edge of the transparent substrate.
- The above objects and advantages of the present invention will become more apparent by describing in detail a preferred embodiment thereof with reference to the attached drawings in which:
- FIG. 1 is a schematic view of a plasma etching chamber according to a first embodiment of the present invention;
- FIG. 2 is a top view of an electrode and a heat transfer element included in the plasma etching chamber according to the first embodiment of the present invention;
- FIGS. 3 through 5 are views illustrating the detailed structure of different embodiments of a heat transfer element included in the plasma etching chamber according to the first embodiment of the present invention;
- FIG. 6 is a top view illustrating the structure of a plasma etching chamber according to a second embodiment of the present invention;
- FIG. 7 is a cross-sectional view of an electrode of the plasma etching chamber according to the second embodiment of the present invention, taken along line7-7′ of FIG. 6;
- FIG. 8 is a cross-sectional view of the electrode of the plasma etching chamber according to a second embodiment of the present invention, taken along line8-8′ of FIG. 6;
- FIGS. 9A and 9B are cross-sectional views illustrating a method for manufacturing a photomask according to a preferred embodiment of the present invention; and
- FIGS. 10 and 11 are views illustrating the bottom surface of a transparent substrate shown in FIGS. 9A and 9B.
- The present invention may be embodied in many different forms and should not be construed as being limited to the present embodiment set forth herein. Rather, the embodiment is provided so that this disclosure will be thorough and complete, and will fully convey the concept of the invention to those skilled in the art. In the drawings, the thickness of layers and regions are exaggerated for clarity. It will also be understood that when a layer is referred to as being “on” another layer or substrate, it can be directly on the other layer or substrate, or intervening layers may also be present.
- In general, as the temperature of a typical photoresist layer or a chrome layer increases, the etching rate increases. The present invention will overcome a problem with non-uniform distribution of critical dimension (CD) values throughout a photomask substrate using the above property.
- FIG. 1 is a schematic view illustrating the structure of a plasma etching chamber according to a first embodiment of the present invention. The plasma etching chamber may be installed in a transformer coupled plasma (TCP) etching apparatus, for example, or other suitable plasma etching chamber.
- Referring to FIG. 1, a
plasma etching chamber 10 includes achamber wall 12, aTCP coil 14 installed on thechamber wall 12, and afirst power source 16 for applying radio-frequency (RF) power to theTCP coil 14. - An
electrode 30 for supporting aphotomask substrate 20 is installed inside theplasma etching chamber 10. Theelectrode 30 includes a supportingsurface 32 for supporting thephotomask substrate 20 and atop surface 34 positioned outwardly of the supportingsurface 32 and surrounding the supportingsurface 32. Note, that in this embodiment of theelectrode 30, the supportingsurface 32 is recessed (or has a step difference) from thetop surface 34, although in other embodiments it need not be. In other words, a horizontal plane comprising the supportingsurface 32 is recessed from a horizontal plane comprising thetop surface 34. In this recessed embodiment, aside wall 36 extends between thetop surface 34 and the supportingsurface 32 in theelectrode 30, thereby forming a shoulder S on which thephotomask substrate 20 rests. - A
second power source 18 for applying radio-frequency (RF) power to theelectrode 30 is connected to the bottom of theplasma etching chamber 10. Theelectrode 30 is installed so that the supportingsurface 32 andtop surface 34 face upward. - If an RF power is applied from the
first power source 16 to theTCP coil 14, a magnetic field is formed around theTCP coil 14. As a result, magnetic field lines extend vertically downward into the inside of theplasma etching chamber 10. Then, an etching gas in theplasma etching chamber 10 is ionized by the magnetic field inside theplasma etching chamber 10, and plasma is generated due to the ionization of the etching gas. If an RF power is then applied from thesecond power source 18 connected to theelectrode 30, plasma is attracted towards thephotomask substrate 20 supported on theelectrode 30. As a result, a layer deposited on thephotomask substrate 20 is etched. - To obtain a uniform CD distribution of the
photomask substrate 20 while etching the layer deposited on thephotomask substrate 20, aheat transfer element 40 is installed near the edge of the supportingsurface 32 of theelectrode 30. Theheat transfer element 40 is connected to aheater 50 for supplying heat to theheat transfer element 40. - As illustrated in FIG. 1, the
heat transfer element 40 is preferably built into theelectrode 30, in the shoulder area S of theelectrode 30, thereby forming an L-shaped heat transfer element. In FIG. 1, theheat transfer element 40 is illustrated as being partially exposed at the peripheral edge of the supportingsurface 32 on theelectrode 30, theside wall 36, and thetop surface 34 to effectively heat the edge of thephotomask substrate 20. Since the exposed portion of the supportingsurface 32 is very close to the bottom edge of thephotomask substrate 20 and theside wall 36, the edge of thephotomask substrate 20 can be effectively heated. However, if theheat transfer element 40 is installed only around the edge of thephotomask substrate 20 in contact with the supportingsurface 32, theheat transfer element 40 may be formed within theelectrode 30 such that theheat transfer element 40 is not exposed on thetop surface 34 of theelectrode 30. - FIG. 2 is a top view illustrating the
electrode 30 and theheat transfer element 40 built into theelectrode 30 of FIG. 1. As viewed from above theelectrode 30, the L-shapedheat transfer element 40 is installed to completely enclose the peripheral edge of the supportingsurface 32, and extends from the edge of the supportingsurface 32 to a certain width along thetop surface 34. - FIGS. 3 through 5 are views illustrating the detailed structure of alternate embodiments of the
heat transfer element 40. Referring to FIG. 3, theheat transfer element 40 may be comprised of ametal line 62 having a high heat conductivity. Themetal line 62 includes aconnection unit 62a which is connected to theheater 50 to receive heat supplied from theheater 50. - Referring to FIG. 4, the
heat transfer element 40 may include apipe line 72 and heat transfer fluid flowing through thepipe line 72 for heating thepipe line 72. The heat transfer fluid may be oil or gas, and the fluid functions to transmit heat supplied from theheater 50 to thepipe line 72. - Referring to FIG. 5, the
heat transfer element 40 may be comprised of aheating coil 82 in various configurations based on the desired heating profile, for example, edge heating, edge and side wall heating, or edge, side wall and top surface heating. - Since the
plasma etching chamber 10 according to the first embodiment of the present invention includes theheat transfer element 40 for heating the edge of thephotomask substrate 20, the edge of thephotomask substrate 20 can be heated to a temperature higher than the temperature at the center of thephotomask substrate 20, and thus an etching rate for a shading layer in an etching process for forming a shading layer pattern can be uniformly controlled on theentire photomask substrate 20. This is because as the temperature of a typical photoresist layer increases, the etching rate increases. As a result, it is possible to form the shading layer pattern to exhibit a uniform CD distribution over theentire photomask substrate 20. - FIG. 6 is a partial schematic top view illustrating the structure of a plasma etching chamber according to a second embodiment of the present invention. FIG. 7 is a cross-sectional view of the
electrode 130 of the plasma etching chamber according to the second embodiment of the present invention, taken along line 7-7′ of FIG. 6. FIG. 8 is an enlarged cross-sectional view of the electrode of the plasma etching chamber according to a second embodiment of the present invention, taken along line 8-8′ of FIG. 6. The plasma etching chamber according to the second embodiment of the present invention may be included in an inductively coupled plasma (ICP) etching apparatus. - Referring to FIGS. 6 through 8, the
electrode 130 shown in FIG. 6 is installed in a face-down type plasma etching chamber in which atop surface 134 of theelectrode 130 faces downward. The plasma etching chamber includes a supportingsurface 132 for supporting aphotomask substrate 120. Theelectrode 130 including thetop surface 134 surrounds the recessed (or stepped down) supportingsurface 132. In this stepped down electrode configuration, aside wall 136 extends between thetop surface 134 and the supportingsurface 132. - A plurality of chucking
pads 140 are installed below theelectrode 130 as shown best in FIG. 8. Thechucking pads 140 fix thephotomask substrate 120 that is supported by the supporting surface. Each of thechucking pads 140 includes acontact surface 142 extending inwardly of theside walls 136 such that thechucking pads 140 and the corners of thephotomask substrate 120 contact each other so that thephotomask substrate 120 is fixed in place. - A
heat transfer element 160 for heating the corners of thephotomask substrate 120 is built into each of thechucking pads 140. Theheat transfer element 160 receives heat supplied from aheater 150. Theheat transfer element 160 may be comprised of metal, a heating coil, or other heating device embodiments as set forth in FIGS. 3-5. - Since the plasma etching chamber according to the second embodiment of the present invention includes the
chucking pads 140 in which theheat transfer element 160 is installed, it is possible to effectively heat only the corners of thephotomask substrate 120 showing a relatively large thickness of photoresist and a relatively small CD value along portions of the edge of thephotomask substrate 120. Accordingly, the corners of thephotomask substrate 120 can be heated to a temperature higher than the temperature at the center of thephotomask substrate 120. Therefore, an etching rate for a shading layer in an etching process for forming a shading layer pattern can be uniformly controlled along theentire photomask substrate 120. As a result, it is possible to form the shading layer pattern having a uniform CD distribution over theentire photomask substrate 120. - FIGS. 9A and 9B are cross-sectional views illustrating a method for manufacturing a photomask according to a preferred embodiment of the present invention.
- Referring to FIG. 9A, a
shading layer 210, such as a chrome layer, is formed on atransparent substrate 200, such as a quartz substrate. Aphotoresist layer pattern 220 is formed on theshading layer 210 to partially expose theshading layer 210. Thephotoresist layer pattern 220 may be an electron beam photoresist. - Referring to FIG. 9B, the
shading layer 210 is etched by performing an etching process using plasma while using thephotoresist layer pattern 220 as an etching mask under a state in which the temperature of at least a portion of the edge of thetransparent substrate 200 is maintained higher than the temperature of the center of thetransparent substrate 200, thus forming a uniformshading layer pattern 210 a. Here, a typical plasma etching apparatus, such as a TCP etching apparatus or an ICP etching apparatus, may be used. - FIGS. 10 and 11 are views illustrating the bottom surface of the
transparent substrate 200. - To maintain the temperature of a
peripheral edge portion 202 a of thetransparent substrate 200 higher than the temperature of thecenter 202 c of thetransparent substrate 200 while etching theshading layer 210, only theedge portion 202 a of thetransparent substrate 200, which is denoted by the slanted lines in FIG. 10, is heated. The side walls of thetransparent substrate 200 and theperipheral edge portion 202 a can be heated at the same time. An etching apparatus including theplasma etching chamber 10, which has been described with reference to FIG. 1, may be used. - In addition, to maintain the temperature of
corners 202 b of thetransparent substrate 200, at which CD values decrease considerably, among theperipheral edge portion 202 a of thetransparent substrate 200, higher than the temperature of thecenter 202 c of thetransparent substrate 200 while etching theshading layer 210, thecorners 202 b of the transparent substrate, which are denoted by the slanted lines in FIG. 11, can be heated. At this time, a plasma etching chamber including chucking pads, which has been described above with reference to FIG. 8, may be used. - As described above, an etching rate for the
shading layer 210 at a peripheral edge portion or corners of thetransparent substrate 200 can be enhanced by maintaining the temperature of at least a portion of the edge of thetransparent substrate 200 higher than the temperature of the center of thetransparent substrate 200 while etching theshading layer 210. As a result, it is possible to obtain a shading layer pattern having a uniform CD distribution over the entiretransparent substrate 200. - As described above, the plasma etching chamber according to the present invention includes a heat transfer element for maintaining the temperature of the edge of the photomask substrate higher than the temperature of the center of the photomask substrate by heating the edge or corners of the photomask substrate. Again, since the edge or corners of the photomask substrate can be heated to a higher temperature than the center of the photomask substrate, the etching rate for a shading layer can be controlled to ensure layer uniformity over the entire photomask substrate. As a result, it is possible to form a shading layer pattern having a uniform CD distribution over the entire photomask substrate.
- In the method for manufacturing a photomask according to the present invention, before etching a shading layer, at least one portion of the edge of a transparent substrate is heated to a temperature higher than the temperature of the center of the transparent substrate. Thus, while etching the shading layer, an etching rate for the shading layer at the edge or corners of the transparent substrate can be enhanced. As a result, it is possible to form a shading layer pattern having a uniform CD distribution over the entire photomask substrate.
- While this invention has been particularly shown and described with reference to preferred embodiments thereof, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (23)
1. A plasma etching chamber comprising:
an electrode including
a supporting surface for supporting a photomask substrate, and
a top surface surrounding the supporting surface;
a heat transfer element installed along a peripheral edge of the supporting surface; and
a heater for supplying heat to the heat transfer element.
2. The plasma etching chamber of claim 1 , wherein the heat transfer element is integrally formed within the electrode.
3. The plasma etching chamber of claim 2 , wherein the heat transfer element is partially exposed along the peripheral edge of the supporting surface and the top surface of the electrode.
4. The plasma etching chamber of claim 2 , wherein a horizontal plane of the supporting surface is stepped down from a horizontal plane of the top surface, and the electrode further comprises a side wall extending between the top surface and the supporting surface, and wherein the heat transfer element is partially exposed along the peripheral edge of the supporting surface, the side wall, and the top surface of the electrode.
5. The plasma etching chamber of claim 2 , wherein the heat transfer element is partially exposed only along the peripheral edge of the supporting surface.
6. The plasma etching chamber of claim 1 , wherein the heat transfer element is formed of metal.
7. The plasma etching chamber of claim 1 , wherein the heat transfer element comprises a pipe line, and a heat transfer fluid flowing through the pipe line for heating the pipe line.
8. The plasma etching chamber of claim 7 , wherein the heat transfer fluid is one selected from oil and gas.
9. The plasma etching chamber of claim 1 , wherein the heat transfer element is a heating coil.
10. The plasma etching chamber of claim 1 , wherein the electrode and supporting surface face upwardly toward an upper portion of the plasma etching chamber.
11. A plasma etching chamber comprising:
an electrode including
a supporting surface for supporting a photomask substrate, and
a top surface surrounding the supporting surface;
a chucking pad arranged below the electrode, the chucking pad having a contact surface in contact with corner portions of the photomask substrate for fixing the photomask substrate supported by the supporting surface;
a heat transfer element installed within the chucking pad to heat the corner portions of the photomask substrate; and
a heater for supplying heat to the heat transfer element.
12. The plasma etching chamber of claim 11 , wherein the heat transfer element is installed within the contact surface of the chucking pad.
13. The plasma etching chamber of claim 12 , wherein the heat transfer element is comprised of metal.
14. The plasma etching chamber of claim 12 , wherein the heat transfer element is comprised of a heating coil.
15. The plasma etching chamber of claim 12 , wherein the electrode and the supporting surface face downwardly toward a lower portion of the plasma etching chamber.
16. A method for manufacturing a photomask comprising:
forming a shading layer on a transparent substrate;
forming a photoresist layer pattern on the shading layer so as to partially expose the shading layer;
etching the shading layer using plasma to form a shading layer pattern, and using the photoresist layer pattern as an etching mask; and
heating the transparent substrate, while etching, such that a temperature of at least one portion of a peripheral edge of the transparent substrate is maintained higher than a temperature of a center portion of the transparent substrate.
17. The method of claim 16 , further comprising providing a transparent substrate formed of quartz.
18. The method of claim 16 , further comprising providing a shading layer formed of chrome.
19. The method of claim 16 , further comprising providing a photoresist layer pattern formed of an electron-beam photoresist.
20. The method of claim 16 , wherein during the etching of the shading layer, the heating comprises heating a peripheral edge of the transparent substrate in order to maintain the temperature of the peripheral edge of the transparent substrate higher than the temperature of the center of the transparent substrate.
21. The method of claim 16 , wherein during the etching of the shading layer, the heating comprises heating only a bottom edge of the transparent substrate in order to heat the peripheral edge of the transparent substrate.
22. The method of claim 16 , wherein during the etching of the shading layer, the heating comprises heating a bottom edge and side walls of the transparent substrate in order to the heat the peripheral edge of the transparent substrate.
23. The method of claim 16 , wherein during the etching the shading layer, corner portions of the peripheral edge of the transparent substrate are heated in order to maintain the corners of the transparent substrate at a temperature higher than the temperature of the center of the transparent substrate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/758,258 US7601469B2 (en) | 2001-04-24 | 2007-06-05 | Plasma etching chamber and method for manufacturing photomask using the same |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0022068A KR100425445B1 (en) | 2001-04-24 | 2001-04-24 | Plasma etching chamber and method for manufacturing photomask using the same |
KR2001-22068 | 2001-04-24 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/758,258 Division US7601469B2 (en) | 2001-04-24 | 2007-06-05 | Plasma etching chamber and method for manufacturing photomask using the same |
Publications (1)
Publication Number | Publication Date |
---|---|
US20020153104A1 true US20020153104A1 (en) | 2002-10-24 |
Family
ID=19708633
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/124,578 Abandoned US20020153104A1 (en) | 2001-04-24 | 2002-04-18 | Plasma etching chamber and method for manufacturing photomask using the same |
US11/758,258 Expired - Fee Related US7601469B2 (en) | 2001-04-24 | 2007-06-05 | Plasma etching chamber and method for manufacturing photomask using the same |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/758,258 Expired - Fee Related US7601469B2 (en) | 2001-04-24 | 2007-06-05 | Plasma etching chamber and method for manufacturing photomask using the same |
Country Status (4)
Country | Link |
---|---|
US (2) | US20020153104A1 (en) |
JP (1) | JP4155757B2 (en) |
KR (1) | KR100425445B1 (en) |
TW (1) | TW543100B (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130267097A1 (en) * | 2012-04-05 | 2013-10-10 | Lam Research Corporation | Method and apparatus for forming features with plasma pre-etch treatment on photoresist |
CN103377868A (en) * | 2012-04-14 | 2013-10-30 | 靖江先锋半导体科技有限公司 | Lower electrode apparatus in etching electrode machine |
CN116535108A (en) * | 2023-07-05 | 2023-08-04 | 上海传芯半导体有限公司 | Substrate recovery method, regenerated photomask base plate and manufacturing method of photomask plate |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100909623B1 (en) * | 2003-06-26 | 2009-07-27 | 주식회사 하이닉스반도체 | Photomask Etching Method of Photomask |
US7879510B2 (en) * | 2005-01-08 | 2011-02-01 | Applied Materials, Inc. | Method for quartz photomask plasma etching |
JP4586626B2 (en) * | 2005-05-17 | 2010-11-24 | ソニー株式会社 | Etching method and semiconductor device manufacturing method |
US8791392B2 (en) * | 2010-10-22 | 2014-07-29 | Lam Research Corporation | Methods of fault detection for multiplexed heater array |
KR102031393B1 (en) * | 2011-11-23 | 2019-10-11 | 램 리써치 코포레이션 | Dual zone temperature control of upper electrodes |
JP6412466B2 (en) * | 2015-06-02 | 2018-10-24 | 東京エレクトロン株式会社 | Substrate processing apparatus and substrate processing method |
CN106328567A (en) * | 2016-10-20 | 2017-01-11 | 武汉新芯集成电路制造有限公司 | Etching device |
DE102017223592B4 (en) * | 2017-12-21 | 2023-11-09 | Meyer Burger (Germany) Gmbh | System for electrically decoupled, homogeneous temperature control of an electrode using heat pipes and processing system with such a system |
CN112189254A (en) * | 2018-05-30 | 2021-01-05 | 应用材料公司 | Apparatus for thermal processing, substrate processing system and method for processing substrate |
KR102406319B1 (en) * | 2020-07-09 | 2022-06-10 | 주식회사 한화 | A substrate processing apparatus including a heating portion |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5310453A (en) * | 1992-02-13 | 1994-05-10 | Tokyo Electron Yamanashi Limited | Plasma process method using an electrostatic chuck |
US5534072A (en) * | 1992-06-24 | 1996-07-09 | Anelva Corporation | Integrated module multi-chamber CVD processing system and its method for processing subtrates |
US6432833B1 (en) * | 1999-12-20 | 2002-08-13 | Micron Technology, Inc. | Method of forming a self aligned contact opening |
US6676804B1 (en) * | 1998-07-16 | 2004-01-13 | Tokyo Electron At Limited | Method and apparatus for plasma processing |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5998518A (en) | 1982-11-26 | 1984-06-06 | Seiko Epson Corp | Lamp annealing apparatus |
US4535228A (en) * | 1982-12-28 | 1985-08-13 | Ushio Denki Kabushiki Kaisha | Heater assembly and a heat-treatment method of semiconductor wafer using the same |
JPS6365631A (en) | 1986-09-05 | 1988-03-24 | Nec Corp | Specimen heating holder |
JP2705012B2 (en) | 1988-10-14 | 1998-01-26 | ウシオ電機株式会社 | Manufacturing method of heater lamp |
JPH0574919A (en) | 1991-09-12 | 1993-03-26 | Nec Corp | Plasma processor |
JPH0963966A (en) | 1995-08-24 | 1997-03-07 | Toshiba Microelectron Corp | Vapor growth device |
KR0125244Y1 (en) | 1995-09-15 | 1999-02-18 | 문정환 | Plasma etching apparatus |
KR19990079892A (en) * | 1998-04-10 | 1999-11-05 | 윤종용 | Dry Etcher or Asher Electrode |
JPH11330214A (en) * | 1998-05-19 | 1999-11-30 | Shinko Electric Ind Co Ltd | Heating device and guide ring used the device |
KR20000000680A (en) | 1998-06-02 | 2000-01-15 | 김영환 | Removing method of a photoresist |
-
2001
- 2001-04-24 KR KR10-2001-0022068A patent/KR100425445B1/en not_active IP Right Cessation
-
2002
- 2002-04-11 TW TW091107287A patent/TW543100B/en not_active IP Right Cessation
- 2002-04-18 US US10/124,578 patent/US20020153104A1/en not_active Abandoned
- 2002-04-23 JP JP2002120988A patent/JP4155757B2/en not_active Expired - Fee Related
-
2007
- 2007-06-05 US US11/758,258 patent/US7601469B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5310453A (en) * | 1992-02-13 | 1994-05-10 | Tokyo Electron Yamanashi Limited | Plasma process method using an electrostatic chuck |
US5534072A (en) * | 1992-06-24 | 1996-07-09 | Anelva Corporation | Integrated module multi-chamber CVD processing system and its method for processing subtrates |
US6676804B1 (en) * | 1998-07-16 | 2004-01-13 | Tokyo Electron At Limited | Method and apparatus for plasma processing |
US6432833B1 (en) * | 1999-12-20 | 2002-08-13 | Micron Technology, Inc. | Method of forming a self aligned contact opening |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130267097A1 (en) * | 2012-04-05 | 2013-10-10 | Lam Research Corporation | Method and apparatus for forming features with plasma pre-etch treatment on photoresist |
CN103377868A (en) * | 2012-04-14 | 2013-10-30 | 靖江先锋半导体科技有限公司 | Lower electrode apparatus in etching electrode machine |
CN116535108A (en) * | 2023-07-05 | 2023-08-04 | 上海传芯半导体有限公司 | Substrate recovery method, regenerated photomask base plate and manufacturing method of photomask plate |
Also Published As
Publication number | Publication date |
---|---|
US7601469B2 (en) | 2009-10-13 |
KR100425445B1 (en) | 2004-03-30 |
KR20020082580A (en) | 2002-10-31 |
US20070231716A1 (en) | 2007-10-04 |
JP2003045859A (en) | 2003-02-14 |
TW543100B (en) | 2003-07-21 |
JP4155757B2 (en) | 2008-09-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7601469B2 (en) | Plasma etching chamber and method for manufacturing photomask using the same | |
KR101445153B1 (en) | Methods and apparatus for in-situ chamber dry clean during photomask plasma etching | |
US7909961B2 (en) | Method and apparatus for photomask plasma etching | |
US8012305B2 (en) | Exhaust assembly for a plasma processing system | |
CN102160166B (en) | Substrate processing apparatus and substrate placing table | |
US20140190632A1 (en) | Method and apparatus for photomask plasma etching | |
KR101565174B1 (en) | Substrate processing method | |
US20130065399A1 (en) | Plasma processing method | |
JP2005033062A (en) | Plasma processor, focus ring, and plasma processing method | |
JP2011061169A (en) | Semiconductor manufacturing process, and apparatus therefor | |
TW202247280A (en) | Chamber and methods of treating a substrate after exposure to radiation | |
KR100951475B1 (en) | Plasma etching apparatus and plasma etching method thereof | |
US6914010B2 (en) | Plasma etching method | |
JPH08186100A (en) | Plasma treatment device and plasma treatment method | |
KR102344256B1 (en) | Apparatus for treating substrate | |
TW201324577A (en) | Plasma processing device and edge ring applicable to the plasma processing device | |
KR100823949B1 (en) | Method and apparatus for photomask plasma etching | |
JPH0758087A (en) | Plasma processing apparatus | |
KR100685732B1 (en) | Apparatus for removing a photoresist residue | |
TW202228187A (en) | plasma reactor | |
JP2022122437A (en) | Substrate support device, plasma treatment system, and plasma etching method | |
JP2022152526A (en) | Substrate mounting table, substrate processing equipment, and substrate processing control method | |
KR20020073816A (en) | Etching apparatus and method for manufacturing semiconductor device | |
KR20100127116A (en) | Method of fabricating photomask having improved cd uniformity | |
KR20040048540A (en) | Apparatus for processing a substrate |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: SAMSUNG ELECTRONICS CO., LTD., KOREA, REPUBLIC OF Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:LEE, JEONG-YUN;KIM, JIN-MIN;JEONG, HAE-YOUNG;AND OTHERS;REEL/FRAME:013174/0828 Effective date: 20020404 |
|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |