|Número de publicación||US20070125638 A1|
|Tipo de publicación||Solicitud|
|Número de solicitud||US 11/557,383|
|Fecha de publicación||7 Jun 2007|
|Fecha de presentación||7 Nov 2006|
|Fecha de prioridad||8 Dic 2004|
|También publicado como||US7959769, WO2007067526A2, WO2007067526A3|
|Número de publicación||11557383, 557383, US 2007/0125638 A1, US 2007/125638 A1, US 20070125638 A1, US 20070125638A1, US 2007125638 A1, US 2007125638A1, US-A1-20070125638, US-A1-2007125638, US2007/0125638A1, US2007/125638A1, US20070125638 A1, US20070125638A1, US2007125638 A1, US2007125638A1|
|Inventores||Hongmei Zhang, Richard Demaray, May Shao|
|Cesionario original||Infinite Power Solutions, Inc.|
|Exportar cita||BiBTeX, EndNote, RefMan|
|Citada por (12), Clasificaciones (58), Eventos legales (6)|
|Enlaces externos: USPTO, Cesión de USPTO, Espacenet|
The present application is a continuation and claims the benefit under 35 U.S.C. §120 of U.S. patent application Ser. No. 11/297,057, filed Dec. 7, 2005, which is related to and claims the benefit under 35 U.S.C. §119(e) of U.S. provisional patent application Ser. No. 60/651,363, filed Feb. 8, 2005, and U.S. provisional patent application Ser. No. 60/634,818, filed Dec. 8, 2004, which are expressly incorporated fully herein by reference.
1. Field of the Invention
The present invention is related to thin-film solid-state batteries and, in particular, the deposition of LiCoO2 films and layers for battery manufacture.
2. Discussion of Related Art
Solid-state thin-film batteries are typically formed by stacking thin films on a substrate in such a way that the films cooperate to generate a voltage. The thin films typically include current collectors, a cathode, an anode, and an electrolyte. The thin films can be deposited utilizing a number of deposition processes, including sputtering and electroplating. Substrates suitable for this application have conventionally been high temperature materials capable of withstanding at least one high temperature anneal process to at least 700° C. for up to about 2 hours in air so as to crystallize the LiCoO2 film. Such a substrate can be any suitable material with appropriate structural and material properties, for example a semiconductor wafer, metallic sheet (e.g., titanium or zirconium), ceramic such as alumina, or other material capable of withstanding subsequent high temperature processing in the presence of the LiCoO2, which can experience significant interfacial reactions with most materials utilized in a battery during these temperature cycles.
Other lithium containing mixed metal oxides besides LiCoO2, including Ni, Nb, Mn, V, and sometimes also Co, but including other transition metal oxides, have been evaluated as crystalline energy storage cathode materials. Typically, the cathode material is deposited in amorphous form and then the material is heated in an anneal process to form the crystalline material. In LiCoO2, for example, an anneal at or above 700° C. transforms the deposited amorphous film to a crystalline form. Such a high temperature anneal, however, severely limits the materials that can be utilized as the substrate, induces destructive reaction with the lithium containing cathode material and often requires the use of expensive noble metals such as gold. Such high thermal budget processes (i.e., high temperatures for extended periods of time) are incompatible with semiconductor or MEM device processing and limit the choice of substrate materials, increases the cost, and decrease the yield of such batteries. The inventors are unaware of a process disclosed in the art that allows production of cathodic lithium films for a battery structure where a post-deposition anneal process has a low enough thermal budget to allow production of functional structures on low temperature materials such as stainless steel, aluminum, or copper foil.
It is known that crystallization of amorphous LiCoO2 on precious metals can be achieved. An example of this crystallization is discussed in Kim et al., where an anneal at 700° C. for 20 minutes of an amorphous layer of LiCoO2 provides for crystallization of the LiCoO2 material, as shown by x-ray diffraction data. Kim, Han-Ki and Yoon, Young Soo, “Characteristics of rapid-thermal-annealed LiCoO2, cathode film for an all-solid-state thin film microbattery,” J. Vac. Sci. Techn. A 22(4), July/August 2004. In Kim et al., the LiCoO2 was deposited on a platinum film that was deposited on a high-temperature MgO/Si substrate. Id. In Kim et al, it was shown that such a crystalline film is capable of constituting the Li+ ion containing cathode layer of a functional all solid-state Li+ ion battery. However, it is of continuing interest for the manufacture of solid state Li+ ion batteries to further reduce the thermal budget of the post deposition anneal, both in time and in temperature, so as to enable the manufacture of such batteries without the need for expensive precious metal nucleation, barrier layers, or expensive high-temperature substrates.
There are many references that disclose an ion beam assisted process that can provide a LiCoO2 film that demonstrates some observable crystalline composition by low angle x-ray diffraction (XRD). Some examples of these include U.S. patent applications Ser. No. 09/815,983 (Publication No. US 2002/001747), Ser. No. 09/815,621 (Publication No. US 2001/0032666), and Ser. No. 09/815,919 (Publication No. US 2002/0001746). These references disclose the use of a second front side ion beam or other ion source side-by-side with a deposition source so as to obtain a region of overlap of the flux of ions with the flux of LiCoO2 vapor at the substrate surface. None of these references disclose film temperature data or other temperature data of the film during deposition to support an assertion of low temperature processing.
It is very difficult to form a uniform deposition either by sputtering a material layer or by bombardment with an ion flux. Utilization of two uniform simultaneous distributions from two sources that do not occupy the same position and extent with respect to the substrate enormously increases the difficulties involved in achieving a uniform material deposition. These references do not disclose a uniform materials deposition, which is required for reliable production of thin-film batteries. A well understood specification for material uniformity for useful battery products is that a 5% one-sigma material uniformity is standard in thin film manufacturing. With this uniformity, about 86% of the produced films will be found acceptable for battery production.
It is even more difficult to scale a substrate to manufacturing scale, such as 200 mm or 300 mm. Indeed, in the references discussed above that utilize both a sputtering deposition and an ion beam deposition, only small area targets and small area substrates are disclosed. These references disclose a single feasibility result. No method for achieving a uniform distribution from two separate front side sources has been disclosed in these references.
Further, conventional materials and production processes can limit the energy density capacity of the batteries produced, causing a need for more batteries occupying more volume. It is specifically desirable to produce batteries that have large amounts of stored energy per unit volume in order to provide batteries of low weight and low volume.
Therefore, there is a need for a low temperature process for depositing crystalline material, for example LiCoO2 material, onto a substrate.
In accordance with the present invention, deposition of LiCoO2 layers in a pulsed-dc physical vapor deposition process is presented. Such a deposition can provide a low-temperature, high deposition rate deposition of a crystalline layer of LiCoO2 with a desired (101) orientation. Some embodiments of the deposition address the need for high rate deposition of LiCoO2 films, which can be utilized as the cathode layer in a solid state rechargeable Li battery. Embodiments of the process according to the present invention can eliminate the high temperature (>700° C.) anneal step that is conventionally needed to crystallize the LiCoO2 layer.
A method of depositing a LiCoO2 layer according to some embodiments of the present invention includes placing a substrate in a reactor; flowing a gaseous mixture including argon and oxygen through the reactor; and applying pulsed-DC power to a target formed of LiCoO2 positioned opposite the substrate. A crystalline LiCoO2 layer is formed on the substrate. Further, in some embodiments the LiCoO2 layer is a crystalline layer of orientation (101).
In some embodiments, a stacked battery structure can be formed. The stacked battery structure includes one or more battery stacks deposited on a thin substrate, wherein each battery stack includes: a conducting layer, a crystalline LiCoO2 layer deposited over the conducting layer, a LiPON layer deposited over the LiCoO2 layer; and an anode deposited over the LiPON layer. A top conducting layer can be deposited over the one or more battery stacks.
In some embodiments, a battery structure can be formed in a cluster tool. A method of producing a battery in a cluster tool includes loading a substrate into a cluster tool; depositing a conducting layer over the substrate in a first chamber of the cluster tool; depositing a crystalline LiCoO2 layer over the conducting layer in a second chamber of the cluster tool; depositing a LiPON layer over the LiCoO2 layer in a third chamber of the cluster tool; depositing an anode layer over the LiCoO2 layer in a fourth chamber; and depositing a second conducting layer over the LiPON layer in a fifth chamber of the cluster tool.
A fixture for holding a thin substrate can include a top portion; and a bottom portion, wherein the thin substrate is held when the top portion is attached to the bottom portion.
These and other embodiments of the invention are further discussed below with reference to the following figures. It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention, as claimed. Further, specific explanations or theories regarding the deposition or performance of barrier layers or soft-metal breath treatments according to the present invention are presented for explanation only and are not to be considered limiting with respect to the scope of the present disclosure or the claims.
In the figures, elements having the same designation have the same or similar functions.
In accordance with embodiments of the present invention, LiCoO2 films are deposited on a substrate by a pulsed-dc physical vapor deposition (PVD) process. In contrast to, for example, Kim et al., LiCoO2 films according to some embodiments of the present invention provide a crystalline LiCoO2 film as deposited on a substrate at a substrate temperature as low as about 220° C. during deposition, without the use of a metallic nucleation or barrier underlying film. The as-deposited crystalline LiCoO2 films can be easily ripened to very high crystalline condition by anneal at about 700° C. for as little as 5 minutes without the use of an underlying precious metal film. In addition, the as deposited crystalline films, when positioned on a noble metal film can be annealed at much further reduced temperatures, for example as low as 400 to 500° C., providing for deposition, annealing, and production of solid state batteries on lower temperature substrates.
In the present application, a single, extended source is described which has been scaled to 400 mm×500 mm for production achieving a LiCoO2 uniformity of 3% one-sigma measured at 25 points at a deposition rate of 1.2 microns thickness an hour over an area of 2000 cm, without the need for secondary front side ion source or ion assistance.
In one example process, a LiCoO2 film was deposited utilizing a conductive ceramic LiCoO2 target as described herein, with pulsed-dc power of 4 kW, no bias, with 60 sccm Ar and 20 sccm O2 gas flows. In 2 hours, a 7200 Angstrom layer of crystalline LiCoO2 was deposited on a substrate area of 400×500 mm. As demonstrated in
On other depositions utilizing this process, a temperature measurement of the substrate during deposition showed that the substrate remained at less than 224° C. Temperature measurements were performed utilizing a temperature sticker purchased from Omega Engineering, Stamford, Conn. (Model no. TL-F-390, active from 199-224° C.).
Moreover, in some embodiments, films deposited according to the present invention can have a deposition rate of from about 10 to about 30 times higher than processes in conventional films. Furthermore, films according to the present invention can be deposited on wide area substrates having a surface area from 10 to 50 times the surface area of prior sputtering processes, resulting in much higher productivity and much lower cost of manufacture, thereby providing high-volume, low-cost valuable batteries.
Further, conventional deposition processes are capable of depositing amorphous LiCoO2 layers, but do not deposit crystalline LiCoO2 layers. Surprisingly, depositions according to some embodiment of the present invention, deposit a LiCoO2 layer with substantial crystallinity readily measured by x-ray diffraction techniques. In some embodiments, the crystallinity of the as-deposited LiCoO2 layers is sufficient to be utilized in a battery structure with no further thermal processing. In some embodiments, crystallinity of the as-deposited LiCoO2 layers are improved by thermal processes with low thermal budgets, which can be compatible with films deposited on low-temperature substrates.
Further, as-deposited the stoichiometry of some LiCoO2 layers deposited according to some embodiments of the present invention shows that this layer is sufficient for utilization in a battery. With the demonstrated ability to deposit a LiCoO2 film with crystallinity and with sufficient stoichiometry, a battery utilizing as-deposited LiCoO2 films can be produced. Heat treating the LiCoO2 layers may improve the crystallinity and lower the impedance.
In some embodiments, a crystalline layer of LiCoO2 with a (101) or a (003) crystalline orientation is deposited directly on the substrate. Deposition of crystalline material can eliminate or lessen the need of a subsequent high temperature anneal or precious-metal layers to crystallize and orient the film. Removing the high temperature anneal allows for formation of battery structures on light-weight and low temperature substrates such as stainless steel foil, copper foil, aluminum foil, and plastic sheet, reducing both the weight and the cost of batteries while retaining the energy density storage capabilities of Li-based batteries. In some embodiments, a crystalline LiCoO2 layer can be deposited on a precious metal layer, such as platinum or iridium, resulting in a further significant lowering of the ripening thermal budget required to improve crystallinity.
Deposition of materials by pulsed-DC biased reactive ion deposition is described in U.S. patent application Ser. No. 10/101,863, entitled “Biased Pulse DC Reactive Sputtering of Oxide Films,” to Hongmei Zhang, et al., filed on Mar. 16, 2002. Preparation of targets is described in U.S. patent application Ser. No. 10/101,341, entitled “Rare-Earth Pre-Alloyed PVD Targets for Dielectric Planar Applications,” to Vassiliki Milonopoulou, et al., filed on Mar. 16, 2002. U.S. patent application Ser. No. 10/101,863 and U.S. patent application Ser. No. 10/101,341 are each incorporated herein in their entirety. Deposition of oxide materials has also been described in U.S. Pat. No. 6,506,289, which is also herein incorporated by reference in its entirety. Transparent oxide films can be deposited utilizing processes similar to those specifically described in U.S. Pat. No. 6,506,289 and U.S. application Ser. No. 10/101863.
Apparatus 10 includes target 12 which is electrically coupled through a filter 15 to a pulsed DC power supply 14. In some embodiments, target 12 is a wide area sputter source target, which provides material to be deposited on a substrate 16. Substrate 16 is positioned parallel to and opposite target 12. Target 12 functions as a cathode when power is applied to it from the pulsed DC power supply 14 and is equivalently termed a cathode. Application of power to target 12 creates a plasma 53. Substrate 16 is capacitively coupled to an electrode 17 through an insulator 54. Electrode 17 can be coupled to an RF power supply 18. A magnet 20 is scanned across the top of target 12.
For pulsed reactive dc magnetron sputtering, as performed by apparatus 10, the polarity of the power supplied to target 12 by power supply 14 oscillates between negative and positive potentials. During the positive period, the insulating layer on the surface of target 12 is discharged and arcing is prevented. To obtain arc free deposition, the pulsing frequency exceeds a critical frequency that can depend on target material, cathode current and reverse time. High quality oxide films can be made using reactive pulse DC magnetron sputtering as shown in apparatus 10.
Pulsed DC power supply 14 can be any pulsed DC power supply, for example an AE Pinnacle plus 10K by Advanced Energy, Inc. With this DC power supply, up to 10 kW of pulsed DC power can be supplied at a frequency of between 0 and 350 kHz. The reverse voltage can be 10% of the negative target voltage. Utilization of other power supplies can lead to different power characteristics, frequency characteristics, and reverse voltage percentages. The reverse time on this embodiment of power supply 14 can be adjusted between 0 and 5 μs.
Filter 15 prevents the bias power from power supply 18 from coupling into pulsed DC power supply 14. In some embodiments, power supply 18 can be a 2 MHz RF power supply, for example a Nova-25 power supply made by ENI, Colorado Springs, Colo.
In some embodiments, filter 15 can be a 2 MHz sinusoidal band rejection filter. In some embodiments, the band width of the filter can be approximately 100 kHz. Filter 15, therefore, prevents the 2 MHz power from the bias to substrate 16 from damaging power supply 14 and allow passage of the pulsed-dc power and frequency.
Pulsed DC deposited films are not fully dense and may have columnar structures. Columnar structures can be detrimental to thin film applications such as barrier films and dielectric films, where high density is important, due to the boundaries between the columns. The columns act to lower the dielectric strength of the material, but may provide diffusion paths for transport or diffusion of electrical current, ionic current, gas, or other chemical agents such as water. In the case of a solid state battery, a columnar structure containing crystallinity as derived from processes according to the present invention is beneficial for battery performance because it allows better Li transport through the boundaries of the material.
In the Phoenix system, for example, target 12 can have an active size of about 800.00×920.00 mm by 4 to 8 mm in order to deposit films on substrate 16 that have dimension about 600×720 mm. The temperature of substrate 16 can be adjusted to between −50° C. and 500° C. The distance between target 12 and substrate 16 can be between about 3 and about 9 cm (in some embodiments, between 4.8 and 6 cm are used). Process gas can be inserted into the chamber of apparatus 10 at a rate up to about 200 sccm while the pressure in the chamber of apparatus 10 can be held at between about 0.7 and 6 milliTorr. Magnet 20 provides a magnetic field of strength between about 400 and about 600 Gauss directed in the plane of target 12 and is moved across target 12 at a rate of less than about 20-30 sec/scan. In some embodiments utilizing the Phoenix reactor, magnet 20 can be a race-track shaped magnet with dimensions about 150 mm by 800 mm.
In some embodiments, magnet 20 extends beyond area 52 in one direction, for example the Y direction in
The combination of a uniform target 12 with a target area 52 larger than the area of substrate 16 can provide films of highly uniform thickness. Further, the material properties of the film deposited can be highly uniform. The conditions of sputtering at the target surface, such as the uniformity of erosion, the average temperature of the plasma at the target surface, and the equilibration of the target surface with the gas phase ambient of the process are uniform over a region which is greater than or equal to the region to be coated with a uniform film thickness. In addition, the region of uniform film thickness is greater than or equal to the region of the film which is to have highly uniform electrical, mechanical, or optical properties such as index of refraction, stoichiometry, density, transmission, or absorptivity.
Target 12 can be formed of any materials that provide the correct stoichiometry for LiCoO2 deposition. Typical ceramic target materials include oxides of Li and Co as well as metallic Li and Co additions and dopants such as Ni, Si, Nb, or other suitable metal oxide additions. In the present disclosure, target 12 can be formed from LiCoO2 for deposition of LiCoO2 film.
In some embodiments of the invention, material tiles are formed. These tiles can be mounted on a backing plate to form a target for apparatus 10. A wide area sputter cathode target can be formed from a close packed array of smaller tiles. Target 12, therefore, may include any number of tiles, for example between 2 and 60 individual tiles. Tiles can be finished to a size so as to provide a margin of edge-wise non-contact, tile to tile, less than about 0.010″ to about 0.020″ or less than half a millimeter so as to eliminate plasma processes that may occur between adjacent ones of tiles 30. The distance between tiles of target 12 and the dark space anode or ground shield 19 in
As shown in
In some embodiments, an oxide layer can be deposited on substrate 301. For example, a silicon oxide layer can be deposited on a silicon wafer. Other layers can be formed between conducting layer 302 and substrate 301.
As further shown in
An anode 305 is deposited over LiPON layer 304. Anode 305 can be, for example an evaporated lithium metal. Other materials such as, for example, nickel can also be utilized. A current collector 306, which is a conducting material, is then deposited over at least a portion of anode 305.
A Li based thin film battery operates by transport of Li ions in the direction from current collector 306 to current collector 302 in order to hold the voltage between current collector 306 and current collector 302 at a constant voltage. The ability for battery structure 300 to supply steady current, then, depends on the ability of Li ions to diffuse through LiPON layer 304 and LiCoO2 layer 303. Li transport through bulk cathode LiCoO2 layer 303 in a thin film battery occurs by the way of grains or grain boundaries. Without being restricted in this disclosure to any particular theory of transport, it is believed that the grains with their planes parallel to substrate 302 will block the flow of Li ions while grains oriented with planes perpendicular to substrate 301 (i.e., oriented parallel to the direction of Li ion flow) facilitate the Li diffusion. Therefore, in order to provide a high-current battery structure, LiCoO2 layer 303 should include crystals oriented in the (101) direction or (003) direction.
In accordance with the present invention, LiCoO2 films can be deposited on substrate 302 with a pulsed-DC biased PVD system as was described above. In addition, an AKT 1600 PVD system can be modified to provide an RF bias, which is available in the Pheonix system, and an Advanced Energy Pinnacle plus 10K pulsed DC power supply can be utilized to provide power to a target. The pulsing frequency of the power supply can vary from about 0 to about 350 KHz. The power output of the power supply is between 0 and about 10 kW. A target of densified LiCoO2 tiles having a resistivity in the range of about 3 to about 10 kΩ can be utilized with dc-sputtering.
In some embodiments, LiCoO2 films are deposited on Si wafers. Gas flows containing Oxygen and Argon can be utilized. In some embodiments, the Oxygen to Argon ratio ranges from 0 to about 50% with a total gas flow of about 80 sccm. The pulsing frequency ranges from about 200 kHz to about 300 kHz during deposition. RF bias can also be applied to the substrate. In many trials, the deposition rates vary from about 2 Angstrom/(kW sec) to about 1 Angstrom/(kW sec) depending on the O2/Ar ratio as well as substrate bias.
Table I illustrates some example depositions of LiCoO2 according to the present invention. XRD (x-Ray Diffraction) results taken on the resulting thin films illustrate that films deposited according to the present invention are crystalline films, often with highly textured grain sizes as large as about 150 nm. The dominant crystal orientation appears to be sensitive to the O2/Ar ratio. For certain O2/Ar ratios (˜10%), as-deposited films exhibit a preferred orientation in the (101) direction or the (003) direction with poorly developed (003) planes.
The rate of deposition of the LiCoO2 layer shown in
The LiCoO2 layer shown in
The LiCoO2 film shown in
The LiCoO2 film shown in
In the example deposition illustrated in
In the example deposition illustrated in
The data show clearly that an as-deposited crystalline film of LiCoO2 can be obtained under several of the process conditions, as shown in Table II. In particular, very high rates of deposition with low power are obtained along with the oriented crystalline structure for the process conditions according to embodiments of the present invention.
Depositing materials on a thin substrate involves holding and positioning the substrate during deposition.
As shown in
As shown in
Utilizing fixture 700 as shown in
Processing chambers 804, 805, 806, 807, and 808 as well as load locks 802 and 803 are coupled by transfer chamber 801. Transfer chamber 801 includes substrate transfer robotics to shuttle individual wafers between processing chambers 804, 805, 806, 807, and 808 and load locks 802 and 803.
In production of a conventional thin-film battery, ceramic substrates are loaded into load lock 803. A thin metallic layer can be deposited in chamber 804, followed by a LiCoO2 deposition performed in chamber 805. The substrate is then removed through load lock 803 for an in-air heat treatment external to cluster tool 800. The treated wafer is then reloaded into cluster tool 800 through load lock 802. A LiPON layer can be deposited in chamber 806. The wafer is then again removed from cluster tool 800 for deposition of the lithium anode layer, or sometimes chamber 807 can be adapted to deposition of the lithium anode layer. A second metallic layer is deposited in chamber 808 to form a charge collector and anode collector. The finished battery structure is then off-loaded from cluster tool 800 in load lock 802. Wafers are shuttled from chamber to chamber by robotics in transfer chamber 801.
A battery structure produced according to the present invention could utilize thin film substrates loaded in a fixture such as fixture 700. Fixture 700 is then loaded into load lock 803. Chamber 804 may still include deposition of a conducting layer. Chamber 805 then includes deposition of a LiCoO2 layer according to embodiments of the present invention. A LiPON layer can then be deposited in chamber 806. Chamber 807 may still be adapted to deposition of a lithium rich material such as lithium metal and chamber 808 can be utilized for deposition of the conducting layer of the current collector. In this process, no heat treatment is utilized to crystallize the LiCoO2 layer.
Another advantage of a thin film battery process is the ability to stack battery structures. In other words, substrates loaded into cluster tool 800 may traverse process chambers 804, 805, 806, 807, and 808 multiple times in order to produce multiply stacked battery structures.
As discussed above, any number of individual battery stacks can be formed such that parallel battery formations are formed. Such a parallel arrangement of battery stacking structure can be indicated as Current collector/LiCoO2/LiPON/Anode/current collector/Anode/LiPON/LiCoO2/current collector/LiCoO2 . . . /current collector.
To form the structures shown in
In some embodiments, stoichiometric LiCoO2 can be deposited on iridium.
As shown in
As shown in
As an alternative to a lift-off process as described in
As shown in a comparison of
One skilled in the art will recognize variations and modifications of the examples specifically discussed in this disclosure. These variations and modifications are intended to be within the scope and spirit of this disclosure. As such, the scope is limited only by the following claims.
TABLE I Initial Substrate Temperature Target Bias Reverse (temperature Deposition Film Example Power Power Time Frequency Ar O2 during deposit) Time Thickness # (kW) (W) (μs) (kHz) (sccm) (sccm) (° C.) (sec) (μm) 1 2 0 1.6 250 80 0 30 10000 3.9 2 2 0 250 72 8 30 7200 1.7 3 2 100 250 72 8 30 7200 1.34 4 2 100 250 76 4 30 7200 1.57 5 2 100 250 76 4 200 7200 1.3 6 2 100 250 74 6 200 7200 1.3 7 2 0 300 72 8 30 7200 1.58 8 2 0 300 74 6 30 7200 9 2 100 300 74 6 30 7200 10 2 100 300 72 8 30 7200 11 2 100 300 70 10 30 7200 12 2 0 300 70 10 30 7200 13 2 0 300 72 8 30 7200 1.58 14 2 0 300 74 6 30 7200 15 2 0 300 60 20 30 7200 16 2 0 300 50 30 30 7200 17 2 200 300 60 20 30 7200 18 2 50 300 60 20 30 7200 19 2 0 300 70 10 30 7200 20 2 0 300 65 15 30 7200 21 3 0 300 65 15 30 7200 22 2 0 1.6 250 60 20 30 7200 23 3 0 1.6 250 60 20 30 7200 24 2 0 1.6 250 60 20 30 (NPH) 7200 25 2 0 1.6 250 60 20 10 min heat 7200 30 min coc 26 2 0 1.6 250 60 20 no preheat 9000 27 2 0 300 60 20 no preheat 7200 28 2 0 300 60 20 15 min heat, 7200 10 min 29 2 0 250 60 20 no preheat 30 2 0 250 60 20 10 min, 10 min 31 2 0 1.3 300 60 20 30 (220) 7200 4.81 32 2 0 1.3 300 60 20 30 (220) 7200 4.74 33 2 0 1.3 300 22.5 7.5 30 (220) 7200 3.99 34 2 0 1.3 300 22.5 7.5 30 (220) 7200 3.93 35 2 0 1.3 300 37.5 12.5 30 (220) 7200 3.64 36 2 0 1.3 300 37.5 12.5 30 (220) 7200 3.54 37 2 100 1.3 300 60 20 30 (220) 7200 4.54 38 2 200 1.3 300 60 20 30 (220) 7200 4.84 39 2 100 1.3 300 37.5 12.5 30 (220) 7200 4.30 40 2 100 1.3 300 22.5 7.5 30 (220) 7200 3.77 41 2 200 1.3 300 37.5 12.5 30 (220) 7200 3.92 42 2 200 1.3 300 60 20 400 7200 3.77 43 2 0 1.3 300 22.5 7.5 30 (220) 7200 3.24 44 2 0 1.3 300 60 20 30 (220) 7200 3.88 45 2 0 1.3 300 60 20 30 (220) 3600 1.78 46 2 200 1.3 300 60 20 30 (220) 3600 1.87 47 2 200 1.3 300 22.5 7.5 30 (220) 3600 1.52 48 2 0 1.3 300 60 20 30 (220) 6000 1.12 49 2 0 1.3 300 60 20 30 (220) 10800 1.89 50 2 0 1.3 300 60 20 30 (220) 14400 2.52 51 2 100 1.3 300 60 20 30 (220) 10000 1.57 52 2 100 1.3 300 60 20 30 (220) 10000 2.11 53 2 100 1.3 300 60 20 30 (220) 6000 2.70 54 2 100 1.3 300 60 20 30 (220) 6000 2.70 TABLE II
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|Clasificación de EE.UU.||204/192.15|
|Clasificación internacional||H01M4/485, H01M4/02, H01M4/48, C23C14/34, H01M4/52, H01M10/36, H01M10/0562, H01M4/525, H01M10/052, H01M4/1391, H01M10/0585, H01M4/131, H01M4/04|
|Clasificación cooperativa||H01M4/1391, H01M4/0471, Y02E60/122, H01M4/0426, H01M2004/028, C23C14/35, H01M10/0585, H01M4/66, H01M4/485, H01M10/052, H01M10/0472, H01M4/045, H01M4/661, H01M4/0423, H01M2300/002, H01M4/0402, H01M4/525, H01M10/0562, H01M4/044, C23C14/08, H01M4/0404, H01M4/0438, H01M4/131, H01M4/667, C23C14/345|
|Clasificación europea||H01M4/04E, H01M4/04B18B2, H01M4/66K2, C23C14/34C4, H01M4/04B, H01M4/04E2, H01M4/04E4, H01M4/485, H01M4/04B18B, C23C14/08, H01M4/1391, H01M10/052, H01M4/131, H01M4/525, H01M4/66A, H01M4/66, H01M4/04F, H01M10/0562, C23C14/35|
|9 Abr 2008||AS||Assignment|
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