US20070218771A1 - Testing tools for i/o ports - Google Patents
Testing tools for i/o ports Download PDFInfo
- Publication number
- US20070218771A1 US20070218771A1 US11/309,050 US30905006A US2007218771A1 US 20070218771 A1 US20070218771 A1 US 20070218771A1 US 30905006 A US30905006 A US 30905006A US 2007218771 A1 US2007218771 A1 US 2007218771A1
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- United States
- Prior art keywords
- connector
- testing
- port
- pins
- pads
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/2733—Test interface between tester and unit under test
Definitions
- the present invention relates to testing tools for computer systems, more particularly to a testing tool including a testing card having different testing circuits.
- testing is an important step to ensure reliability of a manufactured computer system.
- the testing includes both hardware and software testing for the computer system and its components.
- a plurality of different testing tools including different testing circuits is required to test the I/O port. It is time-consuming to link the I/O port to different testing tools. In addition, the I/O port may be damaged during the linking to different testing tools.
- a testing tool for testing an I/O port includes a cable and a testing card.
- the cable includes a port formed at one end thereof configured for being connected to the I/O port, and a first connector formed at an opposite end thereof.
- the testing card includes two testing circuits and a second connector connected to the first connector.
- the second connector includes a slider shiftable between a first position where the second connector and a testing circuit are interconnected, and a second position where the second connector and the other testing circuit are interconnected.
- FIG. 1 is an exploded view of a testing tool in accordance with a preferred embodiment of the present invention, including a cable with a first connector, and a testing card shown a front and a rear aspects thereof;
- FIG. 2 is a sketch view of a first structure of the first connector of FIG. 1 ;
- FIG. 3 is a sketch view of a second structure of the first connector of FIG. 1 ;
- FIG. 4 is a sketch view of a third structure of the first connector of FIG. 1 ;
- FIG. 5 is a sketch view of the testing card of FIG. 1 , showing a front, a back, and a top aspects of the testing card;
- FIG. 6 is a sketch view of another testing card of another embodiment of the present invention, showing a front, a back, and a top aspects of the another testing card;
- FIG. 7 is a sketch view of a second connector of FIG. 6 connected to more than one port.
- a testing tool for testing ports of a computer system in accordance with a preferred embodiment of the present invention, includes a cable 10 and a testing card 30 .
- the cable 10 includes a port 11 integrated at one end of the cable 10 .
- the port 11 is adapted to connect to an input/output (I/O) port (not shown) for testing.
- the port 11 is a serial port or a parallel port in accordance with the I/O port.
- a first connector 13 is integrated at the other end of the cable 10 .
- the first connector 13 is linked to the port 11 via the cable 10 .
- a type of the first connector 13 is in accordance with a type of the port 11 . If the port 11 is a serial port, the first connector 13 is a serial connector, and if the port 11 is a parallel port, the first connector 13 is a parallel connector.
- the first connector 13 may have different structures. Referring to FIGS. 2-4 , three variations in the structure of the first connector 13 are shown as an example. Referring to FIG. 2 , in the first structure of the first connector 13 , the first connector 13 is a 9 pin serial connector complying with the mechanical standard of a 9 pin serial port. Pins 1 , 2 , 3 , 4 , and 5 are aligned in one line, and pins 6 , 7 , 8 , and 9 are aligned in another line. The pins 1 to 9 are electrically connected to the corresponding pins of the port 11 . Because the structure complies with the mechanical standard of the 9 pin serial port, it is convenient to test.
- the pin 5 is omitted, and the pins 2 , 3 , 4 , and 6 are arranged in a row parallel to pins 7 , 8 , 9 , and 1 which are also arranged in a row. Because the pin 5 is used to connect to ground, it is omitted.
- the pins are aligned according to frequency of use of the pins in the test process. The pins aligned in this order can simplify a corresponding circuit on the testing card 30 .
- the pins 1 to 4 and 6 to 9 are aligned in a row, and the pin 5 is omitted.
- the pins are aligned according to pin's sequence number, so it is easy to ascertain each pin and convenient to test.
- pins of the parallel connector can be aligned in different orders, such as complying with standard structure of the parallel connector, or according to the pin's sequence number, or according to frequency of use of the pins in the test process.
- the testing card 30 includes two testing circuits 35 set thereon. These testing circuits 35 are used to test different aspects of the I/O port.
- the testing card 30 also includes a second connector 31 adapted to connect to the first connector 13 .
- the second connector 31 has a slider 33 , and a plurality of pads 315 .
- Each of the plurality of pads 315 is connected to a corresponding pin of the plurality of pins of the first connector 13 .
- the plurality of pads 315 are aligned in a same order as the pins 1 to 9 of the first connector 13 .
- the slider 33 is slidable between a first position and a second position.
- the slider 33 includes eighteen contact pieces 31 7 with one aspect of the slider 33 having ten contact pieces 317 and another aspect having eight contact pieces 317 .
- the eighteen contact pieces 317 are divided into two groups with each group having nine contact pieces 317 .
- Each group of contact pieces 317 is connected to one of the two testing circuits for testing different aspects of the I/O port.
- One group of contact pieces 317 is aligned alternately with the other group of contact pieces 317 .
- one group of contact pieces 317 contacts to the nine pads 315 for testing the I/O port by one testing circuit.
- the other group of the contact pieces 317 contacts to the nine pads 315 for testing the I/O port by the other testing circuit.
- the slider 33 may also be configured to slide between three or more positions, to accommodate the addition of corresponding groups of contact pieces and testing circuits.
- the testing card 30 ′ includes a second connector 31 ′ connected to the first connector 13 .
- the second connector 31 ′ includes nine pads 315 ′ corresponding to pins 1 to 9 of the first connector 13 respectively.
- the pads 315 ′ are aligned in a same order as the pins 1 to 9 of the first connector 13 .
- the second connector 31 ′ further includes nine terminals 37 ′. Each of the terminals 37 ′ is connected to the corresponding pad 315 ′ respectively.
- the nine terminals 37 ′ are connected in a variety of combinations to form a desired testing circuit to test a aspect of the I/O port.
- the second and third terminals 37 ′ are connected together
- the fourth and sixth terminals 37 ′ are connected together
- the seventh and eighth terminals 37 ′ are connected together
- other terminals 37 ′ are not connected to other terminal 37 .
- three connectors 51 , 52 , and 53 are the same type connector as the second connector 31 ′.
- Each of the terminals 37 ′ of second connector 31 ′ is connected to corresponding terminal of the connectors 51 , 52 , and 53 at the same time.
- the second connector 31 ′ is connected to a control I/O port (not shown), and each of the connectors 51 , 52 , and 53 is connected to a testing I/O port (not shown). Pins of the testing I/O ports connected to the connectors 51 , 52 , and 53 are controlled by changing signals on pins of the control I/O port connected to the second connector 31 ′. It is convenient to testing a plurality of testing I/O port at the same time.
Abstract
Description
- The present invention relates to testing tools for computer systems, more particularly to a testing tool including a testing card having different testing circuits.
- Normally, in a computer manufacturing process, testing is an important step to ensure reliability of a manufactured computer system. The testing includes both hardware and software testing for the computer system and its components.
- For example, for testing an I/O port, a plurality of different testing tools including different testing circuits is required to test the I/O port. It is time-consuming to link the I/O port to different testing tools. In addition, the I/O port may be damaged during the linking to different testing tools.
- It is therefore desirable to find a new testing tool which can overcome the above mentioned problems.
- A testing tool for testing an I/O port includes a cable and a testing card. The cable includes a port formed at one end thereof configured for being connected to the I/O port, and a first connector formed at an opposite end thereof. The testing card includes two testing circuits and a second connector connected to the first connector. The second connector includes a slider shiftable between a first position where the second connector and a testing circuit are interconnected, and a second position where the second connector and the other testing circuit are interconnected.
- Other advantages and novel features will be drawn from the following detailed description of preferred embodiments with attached drawings, in which:
-
FIG. 1 is an exploded view of a testing tool in accordance with a preferred embodiment of the present invention, including a cable with a first connector, and a testing card shown a front and a rear aspects thereof; -
FIG. 2 is a sketch view of a first structure of the first connector ofFIG. 1 ; -
FIG. 3 is a sketch view of a second structure of the first connector ofFIG. 1 ; -
FIG. 4 is a sketch view of a third structure of the first connector ofFIG. 1 ; -
FIG. 5 is a sketch view of the testing card ofFIG. 1 , showing a front, a back, and a top aspects of the testing card; -
FIG. 6 is a sketch view of another testing card of another embodiment of the present invention, showing a front, a back, and a top aspects of the another testing card; and -
FIG. 7 is a sketch view of a second connector ofFIG. 6 connected to more than one port. - Referring to
FIG. 1 , a testing tool for testing ports of a computer system in accordance with a preferred embodiment of the present invention, includes acable 10 and atesting card 30. - The
cable 10 includes aport 11 integrated at one end of thecable 10. Theport 11 is adapted to connect to an input/output (I/O) port (not shown) for testing. Theport 11 is a serial port or a parallel port in accordance with the I/O port. Afirst connector 13 is integrated at the other end of thecable 10. Thefirst connector 13 is linked to theport 11 via thecable 10. A type of thefirst connector 13 is in accordance with a type of theport 11. If theport 11 is a serial port, thefirst connector 13 is a serial connector, and if theport 11 is a parallel port, thefirst connector 13 is a parallel connector. - The
first connector 13 may have different structures. Referring toFIGS. 2-4 , three variations in the structure of thefirst connector 13 are shown as an example. Referring toFIG. 2 , in the first structure of thefirst connector 13, thefirst connector 13 is a 9 pin serial connector complying with the mechanical standard of a 9 pin serial port.Pins pins pins 1 to 9 are electrically connected to the corresponding pins of theport 11. Because the structure complies with the mechanical standard of the 9 pin serial port, it is convenient to test. - Referring to
FIG. 3 , in the second structure of thefirst connector 13′, thepin 5 is omitted, and thepins pins pin 5 is used to connect to ground, it is omitted. The pins are aligned according to frequency of use of the pins in the test process. The pins aligned in this order can simplify a corresponding circuit on thetesting card 30. - Referring to
FIG. 4 , in the third structure of thefirst connector 13″, thepins 1 to 4 and 6 to 9 are aligned in a row, and thepin 5 is omitted. The pins are aligned according to pin's sequence number, so it is easy to ascertain each pin and convenient to test. - If the
first connector 13 is a parallel connector, pins of the parallel connector can be aligned in different orders, such as complying with standard structure of the parallel connector, or according to the pin's sequence number, or according to frequency of use of the pins in the test process. - Referring to
FIG. 5 , thetesting card 30 includes twotesting circuits 35 set thereon. Thesetesting circuits 35 are used to test different aspects of the I/O port. Thetesting card 30 also includes asecond connector 31 adapted to connect to thefirst connector 13. - The
second connector 31 has aslider 33, and a plurality ofpads 315. Each of the plurality ofpads 315 is connected to a corresponding pin of the plurality of pins of thefirst connector 13. The plurality ofpads 315 are aligned in a same order as thepins 1 to 9 of thefirst connector 13. - The
slider 33 is slidable between a first position and a second position. Theslider 33 includes eighteencontact pieces 31 7 with one aspect of theslider 33 having tencontact pieces 317 and another aspect having eightcontact pieces 317. The eighteencontact pieces 317 are divided into two groups with each group having ninecontact pieces 317. Each group ofcontact pieces 317 is connected to one of the two testing circuits for testing different aspects of the I/O port. One group ofcontact pieces 317 is aligned alternately with the other group ofcontact pieces 317. - When the
slider 33 slides to the first position, one group ofcontact pieces 317 contacts to the ninepads 315 for testing the I/O port by one testing circuit. When theslider 33 slides to the second position, the other group of thecontact pieces 317 contacts to the ninepads 315 for testing the I/O port by the other testing circuit. By easily sliding theslider 33, the I/O port is tested by different testing circuits. It is convenient to test the component without changing with another testing card and connecting the testing card to the component. - In the above-mentioned embodiment, the
slider 33 may also be configured to slide between three or more positions, to accommodate the addition of corresponding groups of contact pieces and testing circuits. - Referring to
FIG. 6 , another embodiment of atesting card 30′ is shown. Thetesting card 30′ includes asecond connector 31′ connected to thefirst connector 13. - The
second connector 31′ includes ninepads 315′ corresponding topins 1 to 9 of thefirst connector 13 respectively. Thepads 315′ are aligned in a same order as thepins 1 to 9 of thefirst connector 13. - The
second connector 31′ further includes nineterminals 37′. Each of theterminals 37′ is connected to thecorresponding pad 315′ respectively. - When the I/O port needs to be tested, the nine
terminals 37′ are connected in a variety of combinations to form a desired testing circuit to test a aspect of the I/O port. For example inFIG. 6 , the second andthird terminals 37′ are connected together, the fourth andsixth terminals 37′ are connected together, the seventh andeighth terminals 37′ are connected together, andother terminals 37′ are not connected toother terminal 37. By changing the combination of the nineterminals 37′, different aspects of the I/O port can be tested. - Referring to
FIG. 7 , threeconnectors second connector 31′. Each of theterminals 37′ ofsecond connector 31′ is connected to corresponding terminal of theconnectors second connector 31′ is connected to a control I/O port (not shown), and each of theconnectors connectors second connector 31′. It is convenient to testing a plurality of testing I/O port at the same time. - It is to be understood, however, that even though numerous characteristics and advantages have been set forth in the foregoing description of preferred embodiments, together with details of the structures and functions of the preferred embodiments, the disclosure is illustrative only, and changes may be made in detail, especially in matters of shape, size, and arrangement of parts within the principles of the invention to the full extent indicated by the broad general meaning of the terms in which the appended claims are expressed.
Claims (17)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN200620056548.9 | 2006-03-14 | ||
CNU2006200565489U CN2891082Y (en) | 2006-03-14 | 2006-03-14 | Expandable tester |
Publications (2)
Publication Number | Publication Date |
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US20070218771A1 true US20070218771A1 (en) | 2007-09-20 |
US7275965B1 US7275965B1 (en) | 2007-10-02 |
Family
ID=38021747
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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US11/309,050 Expired - Fee Related US7275965B1 (en) | 2006-03-14 | 2006-06-14 | Testing tools for I/O ports |
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US (1) | US7275965B1 (en) |
CN (1) | CN2891082Y (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101206601B (en) * | 2006-12-19 | 2010-11-10 | 鸿富锦精密工业(深圳)有限公司 | I/o port testing device |
CN101650396B (en) * | 2008-08-13 | 2012-05-16 | 鸿富锦精密工业(深圳)有限公司 | Test fixture |
TWI407104B (en) * | 2008-08-22 | 2013-09-01 | Hon Hai Prec Ind Co Ltd | Testing clamp |
CN102148431B (en) * | 2010-02-04 | 2013-11-06 | 鸿富锦精密工业(深圳)有限公司 | Connector |
CN105975368A (en) * | 2016-05-23 | 2016-09-28 | 浪潮电子信息产业股份有限公司 | DB9 serial port automatic testing loop jig and testing method thereof |
CN108732438A (en) * | 2017-04-27 | 2018-11-02 | 研祥智能科技股份有限公司 | One kind being used for the measurement jig and method of general purpose I/O port |
CN108254652B (en) * | 2017-12-25 | 2021-07-13 | 中科曙光信息产业成都有限公司 | Testing device of backplane connector |
Citations (11)
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US3016489A (en) * | 1959-07-17 | 1962-01-09 | Drexel Dynamics Corp | Test jig for contacting circuit card positions |
US4489414A (en) * | 1981-10-28 | 1984-12-18 | Hal Computers Limited | Computer peripheral testing equipment |
US4998067A (en) * | 1989-10-10 | 1991-03-05 | Puckett James D | Portable test apparatus for low current circuit breakers |
US5557741A (en) * | 1994-04-28 | 1996-09-17 | Dell Usa, L.P. | Test apparatus and method for a computer parallel port |
US20030229746A1 (en) * | 2002-06-07 | 2003-12-11 | Wen-Tsung Liu | Common connector for memory cards and switching arbitration method for shared pins of a connector |
US20040009702A1 (en) * | 1999-08-23 | 2004-01-15 | Patrick Potega | Interface apparatus for selectively connecting electrical devices |
US20040227637A1 (en) * | 2003-05-16 | 2004-11-18 | Barr Andrew Harvey | Built-in circuitry and method to test connector loading |
US20060080488A1 (en) * | 2004-10-12 | 2006-04-13 | Apacer Technology Inc. | Composite compact flash card |
US20060159233A1 (en) * | 2005-01-19 | 2006-07-20 | Cotton John M | Re-arrangeable analog electrical cross connect |
US20060232950A1 (en) * | 2003-07-07 | 2006-10-19 | Chikanori Miyawaki | Pc card |
US20060264085A1 (en) * | 2005-05-23 | 2006-11-23 | Dell Products L.P. | Method and apparatus for coupling a plurality of cards to an information handling system |
-
2006
- 2006-03-14 CN CNU2006200565489U patent/CN2891082Y/en not_active Expired - Fee Related
- 2006-06-14 US US11/309,050 patent/US7275965B1/en not_active Expired - Fee Related
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3016489A (en) * | 1959-07-17 | 1962-01-09 | Drexel Dynamics Corp | Test jig for contacting circuit card positions |
US4489414A (en) * | 1981-10-28 | 1984-12-18 | Hal Computers Limited | Computer peripheral testing equipment |
US4998067A (en) * | 1989-10-10 | 1991-03-05 | Puckett James D | Portable test apparatus for low current circuit breakers |
US5557741A (en) * | 1994-04-28 | 1996-09-17 | Dell Usa, L.P. | Test apparatus and method for a computer parallel port |
US20040009702A1 (en) * | 1999-08-23 | 2004-01-15 | Patrick Potega | Interface apparatus for selectively connecting electrical devices |
US20030229746A1 (en) * | 2002-06-07 | 2003-12-11 | Wen-Tsung Liu | Common connector for memory cards and switching arbitration method for shared pins of a connector |
US20040227637A1 (en) * | 2003-05-16 | 2004-11-18 | Barr Andrew Harvey | Built-in circuitry and method to test connector loading |
US20060232950A1 (en) * | 2003-07-07 | 2006-10-19 | Chikanori Miyawaki | Pc card |
US20060080488A1 (en) * | 2004-10-12 | 2006-04-13 | Apacer Technology Inc. | Composite compact flash card |
US20060159233A1 (en) * | 2005-01-19 | 2006-07-20 | Cotton John M | Re-arrangeable analog electrical cross connect |
US20060264085A1 (en) * | 2005-05-23 | 2006-11-23 | Dell Products L.P. | Method and apparatus for coupling a plurality of cards to an information handling system |
Also Published As
Publication number | Publication date |
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US7275965B1 (en) | 2007-10-02 |
CN2891082Y (en) | 2007-04-18 |
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Owner name: HON HAI PRECISION INDUSTRY CO., LTD., TAIWAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:LIU, PING;CHEN, LI-PING;REEL/FRAME:017777/0178;SIGNING DATES FROM 20060519 TO 20060524 |
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Owner name: HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:HON HAI PRECISION INDUSTRY CO., LTD.;REEL/FRAME:019634/0168 Effective date: 20070724 Owner name: HON HAI PRECISION INDUSTRY CO., LTD., TAIWAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:HON HAI PRECISION INDUSTRY CO., LTD.;REEL/FRAME:019634/0168 Effective date: 20070724 |
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Effective date: 20111002 |