US20110006411A1 - Simplified multichip packaging and package design - Google Patents
Simplified multichip packaging and package design Download PDFInfo
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- US20110006411A1 US20110006411A1 US12/807,763 US80776310A US2011006411A1 US 20110006411 A1 US20110006411 A1 US 20110006411A1 US 80776310 A US80776310 A US 80776310A US 2011006411 A1 US2011006411 A1 US 2011006411A1
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Definitions
- This invention relates generally to integrated circuit packaging and, more particularly, to multichip packaging.
- a continuing goal of the semiconductor industry is to maximize circuit density.
- One conventional approach is to provide more than one semiconductor die (or chip) in a single integrated circuit package.
- first and second integrated circuit die are mounted on opposite sides of a leadframe die paddle.
- the leadframe must be flipped in order to make all necessary wire bonding connections, and wires are bonded to both the upper and lower surfaces of the leads. Bonding to both lead surfaces requires plating both lead surfaces (e.g. with silver).
- the die paddle must be specially designed to provide adequate heat transfer during wire bonding.
- Some designs require a special interconnect circuit which wraps around from one side of the die paddle to the other side of the die paddle. Bond pads of the integrated circuit die on one side of the die paddle are connected to the interconnect circuit in order to render that integrated circuit die electrically accessible from the other side of the die paddle.
- FIG. 1 illustrates another conventional technique of providing more than one integrated circuit die in a single integrated circuit package.
- a spacer/interposer such as a semiconductor substrate
- first and second integrated circuit die one of which is mounted on the die paddle 11 .
- the upper, active circuit areas of both integrated circuit die are wire bonded to the sets of leads 12 and 13 .
- the existence of the spacer/interposer causes the arrangement of FIG. 1 to occupy more space than do the aforementioned arrangements wherein the integrated circuit die are mounted on opposite sides of the die paddle.
- the arrangement of FIG. 1 introduces a mismatch in the coefficient of thermal expansion (CTE). Accordingly, the downset of the die paddle 11 with respect to the lead sets 12 and 13 is typically provided to compensate for this CTE mismatch.
- CTE coefficient of thermal expansion
- Exemplary embodiments of the invention provide an integrated circuit apparatus having first and second integrated circuit die mounted on opposite sides of a leadframe die paddle, with at least one of the integrated circuit die extending further toward the leads than does the die paddle. This arrangement permits the active circuit areas of both integrated circuit die to face in the same direction, and to be wire bonded to the same surfaces of the leads. This simplifies the wire bonding process.
- FIG. 1 illustrates a conventional multichip package design
- FIG. 2 illustrates a multichip package design according to exemplary embodiments of the invention
- FIG. 3 is a top view of FIG. 2 ;
- FIG. 4 illustrates a specific embodiment of the multichip package design of FIG. 2 ;
- FIG. 5 illustrates a multichip packaging design according to exemplary embodiments of the invention, and including a spacer/interposer;
- FIG. 6 is similar to FIG. 5 , but utilizes a split die paddle according to exemplary embodiments of the invention.
- FIG. 7 is a top view of FIG. 6 ;
- FIG. 8 illustrates an exemplary process for use in producing the embodiments of FIGS. 2-7 .
- Exemplary embodiments of the invention provide for mounting first and second integrated circuit die on opposite sides of a leadframe die paddle. At least one of the integrated circuit die extends further toward both sets of leadframe leads than does the die paddle, thereby permitting the active circuit areas of both integrated circuit die to face in the same direction and to be wire bonded to the same surfaces of the leadframe leads.
- the wire bonding process does not require flipping the leadframe, and no special die paddle design is needed for heat transfer during wire bonding.
- FIG. 2 illustrates a multichip package design according to exemplary embodiments of the invention.
- integrated circuit die 21 and 22 are mounted on opposite sides of a leadframe die paddle using any suitable die adhesive, for example a non-conductive glue.
- the active circuit area of the integrated circuit die 22 faces the die paddle, and the active circuit area of the integrated circuit die 21 faces oppositely from the die paddle, so both active circuit areas are facing in the same direction.
- the integrated circuit die 22 extends further toward both sets of leads 23 and 24 than does the die paddle, thereby permitting the integrated circuit die 22 to be wire bonded to the same surfaces of the leads 23 and 24 as is the integrated circuit die 21 .
- both integrated circuit die can be wire bonded to the leads without requiring any flipping of the lead frame during the wire bonding process.
- FIG. 3 provides a top view of the multichip package design of FIG. 2 .
- FIG. 4 illustrates a specific example of the multichip package design of FIG. 2 , with exemplary physical dimensions labeled therein. As shown more clearly in the example of FIG. 4 , because no interposer/spacer is utilized, the embodiments of FIGS. 2-4 do not introduce a CTE mismatch problem, so a downset such as illustrated in prior art FIG. 1 is not necessary.
- FIG. 5 illustrates a further multichip package design according to exemplary embodiments of the invention.
- FIG. 5 is generally similar to the embodiments of FIGS. 2-4 , with two integrated circuit die 21 and 22 mounted on opposite sides of a leadframe die paddle 41 and facing in a common direction.
- An interposer is mounted on the active surface area of the integrated circuit die 21
- a third integrated circuit die 51 is mounted on the interposer, with its active circuit area facing away from the interposer.
- the arrangement of FIG. 5 thus implements a stack of three integrated circuit die whose respective active circuit areas face in a common direction.
- the stacking of the interposer and third integrated circuit die 51 on the integrated circuit die 21 can be accomplished in generally the same conventional fashion as the interposer and second integrated circuit die are stacked onto the first integrated circuit die in prior art FIG. 1 .
- the leads at 52 and 53 in FIG. 5 are shaped differently than the leads in the embodiments of FIGS. 2-4 , in order to better accommodate wire bonding to the three integrated circuit die 21 , 22 and 51 .
- the outer portions of the leads at 52 and 53 extend generally inwardly toward the middle integrated circuit die 21 and are approximately coplanar therewith.
- the inner portions of the leads at 52 and 53 are angled in a direction toward the integrated circuit die 22 , thereby facilitating wire bonding to the integrated circuit die 22 .
- the active circuit die areas of all three integrated circuit die are wire bonded to the same side of the leads at 52 and 53 .
- the dimensions illustrated in FIG. 5 are provided by way of example only, in order to describe one specific embodiment represented by FIG. 5 .
- FIG. 6 illustrates a multichip package design according to further exemplary embodiments of the invention.
- the example of FIG. 6 is similar to FIG. 5 , but utilizes a two-piece or split die paddle 61 , rather than a one-piece die paddle 41 as shown in FIG. 5 .
- the space between the two pieces of the die paddle 61 is filled in with the glue that is used to mount the integrated circuit die 21 and 22 on the die paddle 61 .
- the integrated circuit die 21 and 22 mounted on the split die paddle 61 extend further toward both sets of leads 52 and 53 than does the split die paddle 61 , thereby providing space for wire bonding the integrated circuit die 22 onto the same surface of the leads 52 and 53 as are the other two integrated circuit die 21 and 51 . This also permits the entire wire bonding process to be completed without flipping the leadframe.
- the specific dimensions shown in FIG. 6 are provided by way of example only, in order to describe one particular embodiment represented by FIG. 6 .
- FIG. 7 is a top view of the multichip package design of FIG. 6 .
- the back of the integrated circuit die 22 can be used for heat transfer purposes during the wire bonding process, so there is no need for the aforementioned special die paddle design that some prior art approaches use to effectuate heat transfer during the wire bonding process.
- FIG. 8 illustrates exemplary operations which can be performed to produce the exemplary multichip package design described above with respect to FIGS. 2-4 .
- the wafer is mounted (and backside taped) for sawing at 82 , and is then sawed at 83 .
- the sawed wafer is taped again, this time on the active surface side of the wafer, and the backside of the wafer is de-taped. With the tape now on the active circuit side of the wafer, the wafer has been effectively flipped for purposes of the packaging process.
- the flipped die can be die-attached (D/A)to the flipped leadframe at 85 , which results in the active circuit area of the die mounted on and facing what will ultimately be the bottom of the die paddle (see also die 22 of FIGS. 2-4 ).
- the leadframe is flipped back over and a plasma cleaning process can be performed.
- the integrated circuit die for example 22 in FIGS. 2-4
- the leadframe die paddle is die attached to the leadframe die paddle (which was flipped back over at 86 ). This die corresponds to die 21 of FIGS.
- the integrated circuit die that was mounted at 88 (e.g. die 21 of FIGS. 2-4 ) is wired bonded to the appropriate leads at 90 . Thereafter, the leadframe and integrated circuit die are encapsulated within a molding compound at 91 .
- the arrangement of FIG. 5 can be produced by using the operations up through operation 90 of FIG. 8 , and thereafter mounting the interposer and third integrated circuit die 51 onto the integrated circuit die 21 using generally the same conventional techniques utilized to mount the interposer and second integrated circuit die of prior art FIG. 1 . Thereafter, the third integrated circuit die 51 of FIG. 5 is wire bonded to the leads 52 and 53 , after which the entire arrangement is encapsulated in a molding compound.
- FIG. 6 differs from the structure of FIG. 5 in its use of a split die paddle 61 , and it will therefore be apparent to workers in the art that the arrangement of FIG. 6 can be readily produced in generally the same fashion as described above with respect to FIG. 5 .
Abstract
A multichip integrated circuit apparatus includes first and second integrated circuit die mounted on opposite sides of a leadframe die paddle, with at least one of the integrated circuit die extending further toward the leads than does the die paddle. With this arrangement, the active circuit areas of both integrated circuit die can face in the same direction, and can be wire bonded to the same surfaces of the leads. This avoids wire bonding complications that are often encountered in multichip integrated circuit package designs.
Description
- This invention relates generally to integrated circuit packaging and, more particularly, to multichip packaging.
- A continuing goal of the semiconductor industry is to maximize circuit density. One conventional approach is to provide more than one semiconductor die (or chip) in a single integrated circuit package. To this end, in various conventional designs, first and second integrated circuit die are mounted on opposite sides of a leadframe die paddle. In some of these designs, the leadframe must be flipped in order to make all necessary wire bonding connections, and wires are bonded to both the upper and lower surfaces of the leads. Bonding to both lead surfaces requires plating both lead surfaces (e.g. with silver). In some designs, the die paddle must be specially designed to provide adequate heat transfer during wire bonding. Some designs require a special interconnect circuit which wraps around from one side of the die paddle to the other side of the die paddle. Bond pads of the integrated circuit die on one side of the die paddle are connected to the interconnect circuit in order to render that integrated circuit die electrically accessible from the other side of the die paddle.
- It can be seen from the foregoing discussion that the conventional technique of mounting integrated circuit die on opposite sides of a leadframe die paddle adds complications to the design and production process.
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FIG. 1 illustrates another conventional technique of providing more than one integrated circuit die in a single integrated circuit package. InFIG. 1 , a spacer/interposer (such as a semiconductor substrate) is interposed between first and second integrated circuit die, one of which is mounted on thedie paddle 11. The upper, active circuit areas of both integrated circuit die are wire bonded to the sets ofleads FIG. 1 to occupy more space than do the aforementioned arrangements wherein the integrated circuit die are mounted on opposite sides of the die paddle. Also, the arrangement ofFIG. 1 introduces a mismatch in the coefficient of thermal expansion (CTE). Accordingly, the downset of thedie paddle 11 with respect to thelead sets - It is desirable in view of the foregoing to provide for multichip packaging designs which can overcome the aforementioned disadvantages associated with various conventional approaches.
- Exemplary embodiments of the invention provide an integrated circuit apparatus having first and second integrated circuit die mounted on opposite sides of a leadframe die paddle, with at least one of the integrated circuit die extending further toward the leads than does the die paddle. This arrangement permits the active circuit areas of both integrated circuit die to face in the same direction, and to be wire bonded to the same surfaces of the leads. This simplifies the wire bonding process.
- The foregoing has outlined rather broadly the features and technical advantages of the present invention so that those skilled in the art may better understand the detailed description of the invention that follows. Additional features and advantages of the invention will be described hereinafter that form the subject of the claims of the invention. Those skilled in the art will appreciate that they may readily use the conception and the specific embodiment disclosed as a basis for modifying or designing other structures for carrying out the same purposes of the present invention. Those skilled in the art will also realize that such equivalent constructions do not depart from the spirit and scope of the invention in its broadest form. (STMI)
- Before undertaking the Detailed Description of the Invention below, it may be advantageous to set forth definitions of certain words or phrases used throughout this patent document: the terms “include” and “comprise,” as well as derivatives thereof, mean inclusion without limitation; the term “or” is inclusive, meaning and/or; the phrases “associated with” and “associated therewith,” as well as derivatives thereof, may mean to include, be included within, interconnect with, contain, be contained within, connect to or with, couple to or with, be communicable with, cooperate with, interleave, juxtapose, be proximate to, be bound to or with, have, have a property of, or the like; and the term “controller” means any device, system or part thereof that controls at least one operation, whether such a device is implemented in hardware, firmware, software or some combination of at least two of the same. It should be noted that the functionality associated with any particular controller may be centralized or distributed, whether locally or remotely. Definitions for certain words and phrases are provided throughout this patent document, and those of ordinary skill in the art will understand that such definitions apply in many, if not most, instances to prior uses, as well as to future uses, of such defined words and phrases.
- For a more complete understanding of the present invention, and the advantages thereof, reference is now made to the following descriptions taken in conjunction with the accompanying drawings, wherein like numbers designate like objects, and in which:
-
FIG. 1 illustrates a conventional multichip package design; -
FIG. 2 illustrates a multichip package design according to exemplary embodiments of the invention; -
FIG. 3 is a top view ofFIG. 2 ; -
FIG. 4 illustrates a specific embodiment of the multichip package design ofFIG. 2 ; -
FIG. 5 illustrates a multichip packaging design according to exemplary embodiments of the invention, and including a spacer/interposer; -
FIG. 6 is similar toFIG. 5 , but utilizes a split die paddle according to exemplary embodiments of the invention; -
FIG. 7 is a top view ofFIG. 6 ; -
FIG. 8 illustrates an exemplary process for use in producing the embodiments ofFIGS. 2-7 . - The figures and the various embodiments used to describe the principles of the present invention in this patent document are by way of illustration only and should not be construed in any way to limit the scope of the invention.
- Exemplary embodiments of the invention provide for mounting first and second integrated circuit die on opposite sides of a leadframe die paddle. At least one of the integrated circuit die extends further toward both sets of leadframe leads than does the die paddle, thereby permitting the active circuit areas of both integrated circuit die to face in the same direction and to be wire bonded to the same surfaces of the leadframe leads. The wire bonding process does not require flipping the leadframe, and no special die paddle design is needed for heat transfer during wire bonding.
-
FIG. 2 illustrates a multichip package design according to exemplary embodiments of the invention. In the example ofFIG. 2 ,integrated circuit die integrated circuit die 22 faces the die paddle, and the active circuit area of the integrated circuit die 21 faces oppositely from the die paddle, so both active circuit areas are facing in the same direction. The integrated circuit die 22 extends further toward both sets ofleads leads integrated circuit die 21. By wire bonding to the same side of theleads -
FIG. 3 provides a top view of the multichip package design ofFIG. 2 . -
FIG. 4 illustrates a specific example of the multichip package design ofFIG. 2 , with exemplary physical dimensions labeled therein. As shown more clearly in the example ofFIG. 4 , because no interposer/spacer is utilized, the embodiments ofFIGS. 2-4 do not introduce a CTE mismatch problem, so a downset such as illustrated in prior artFIG. 1 is not necessary. -
FIG. 5 illustrates a further multichip package design according to exemplary embodiments of the invention.FIG. 5 is generally similar to the embodiments ofFIGS. 2-4 , with two integrated circuit die 21 and 22 mounted on opposite sides of aleadframe die paddle 41 and facing in a common direction. An interposer is mounted on the active surface area of theintegrated circuit die 21, and a thirdintegrated circuit die 51 is mounted on the interposer, with its active circuit area facing away from the interposer. The arrangement ofFIG. 5 thus implements a stack of three integrated circuit die whose respective active circuit areas face in a common direction. The stacking of the interposer and thirdintegrated circuit die 51 on theintegrated circuit die 21 can be accomplished in generally the same conventional fashion as the interposer and second integrated circuit die are stacked onto the first integrated circuit die in prior artFIG. 1 . - The leads at 52 and 53 in
FIG. 5 are shaped differently than the leads in the embodiments ofFIGS. 2-4 , in order to better accommodate wire bonding to the three integrated circuit die 21, 22 and 51. In particular, the outer portions of the leads at 52 and 53 extend generally inwardly toward the middle integratedcircuit die 21 and are approximately coplanar therewith. However, the inner portions of the leads at 52 and 53 are angled in a direction toward the integrated circuit die 22, thereby facilitating wire bonding to the integrated circuit die 22. In the example ofFIG. 5 , the active circuit die areas of all three integrated circuit die are wire bonded to the same side of the leads at 52 and 53. The dimensions illustrated inFIG. 5 are provided by way of example only, in order to describe one specific embodiment represented byFIG. 5 . -
FIG. 6 illustrates a multichip package design according to further exemplary embodiments of the invention. The example ofFIG. 6 is similar toFIG. 5 , but utilizes a two-piece or splitdie paddle 61, rather than a one-piece diepaddle 41 as shown inFIG. 5 . The space between the two pieces of thedie paddle 61 is filled in with the glue that is used to mount the integrated circuit die 21 and 22 on thedie paddle 61. As in the examples ofFIGS. 2-5 , the integrated circuit die 21 and 22 mounted on the split diepaddle 61 extend further toward both sets ofleads paddle 61, thereby providing space for wire bonding the integrated circuit die 22 onto the same surface of theleads FIG. 6 are provided by way of example only, in order to describe one particular embodiment represented byFIG. 6 . -
FIG. 7 is a top view of the multichip package design ofFIG. 6 . - In all of the embodiments illustrated in
FIGS. 2-7 , the back of the integrated circuit die 22 can be used for heat transfer purposes during the wire bonding process, so there is no need for the aforementioned special die paddle design that some prior art approaches use to effectuate heat transfer during the wire bonding process. -
FIG. 8 illustrates exemplary operations which can be performed to produce the exemplary multichip package design described above with respect toFIGS. 2-4 . After backgrinding the wafer at 81, the wafer is mounted (and backside taped) for sawing at 82, and is then sawed at 83. At 84, the sawed wafer is taped again, this time on the active surface side of the wafer, and the backside of the wafer is de-taped. With the tape now on the active circuit side of the wafer, the wafer has been effectively flipped for purposes of the packaging process. Therefore, with the leadframe flipped also, the flipped die can be die-attached (D/A)to the flipped leadframe at 85, which results in the active circuit area of the die mounted on and facing what will ultimately be the bottom of the die paddle (see also die 22 ofFIGS. 2-4 ). At 86, the leadframe is flipped back over and a plasma cleaning process can be performed. Thereafter, at 87, the integrated circuit die (for example 22 inFIGS. 2-4 ) is wire bonded to the appropriate leads. Then, at 88, a die from a further, normally sawed wafer, with tape on its backside, is die attached to the leadframe die paddle (which was flipped back over at 86). This die corresponds to die 21 ofFIGS. 2-4 . After another plasma cleaning operation at 89, the integrated circuit die that was mounted at 88 (e.g. die 21 ofFIGS. 2-4 ) is wired bonded to the appropriate leads at 90. Thereafter, the leadframe and integrated circuit die are encapsulated within a molding compound at 91. - Referring now to
FIG. 8 andFIG. 5 , the arrangement ofFIG. 5 can be produced by using the operations up throughoperation 90 ofFIG. 8 , and thereafter mounting the interposer and third integrated circuit die 51 onto the integrated circuit die 21 using generally the same conventional techniques utilized to mount the interposer and second integrated circuit die of prior artFIG. 1 . Thereafter, the third integrated circuit die 51 ofFIG. 5 is wire bonded to theleads - The structure of
FIG. 6 differs from the structure ofFIG. 5 in its use of a split diepaddle 61, and it will therefore be apparent to workers in the art that the arrangement ofFIG. 6 can be readily produced in generally the same fashion as described above with respect toFIG. 5 . - Although the present invention has been described in detail, those skilled in the art will understand that various changes, substitutions, and alterations herein may be made without departing from the spirit and scope of the invention it its broadest form.
Claims (20)
1. An integrated circuit apparatus, comprising:
a leadframe including a first set of leads, a second set of leads and a die paddle disposed between said first and second sets of leads;
a first integrated circuit die mounted on a first side of said die paddle;
a second integrated circuit die mounted on a second side of said die paddle which faces generally oppositely of said first side of said die paddle; and
one of said first and second integrated circuit die extending further toward both of said first and second sets of leads than does said die paddle.
2. The apparatus of claim 1 , wherein the other of said first and second integrated circuit die extends further toward both of said first and second sets of leads than does said die paddle.
3. The apparatus of claim 1 , wherein each of said leads has first and second generally oppositely facing surfaces, all of said first surfaces facing generally in a first direction and all of said second surfaces facing generally in a second direction that is generally opposite said first direction, and including a first plurality of electrically conductive wires, each said wire of said first plurality having one end bonded to said first surface of one of said leads and having another end bonded to said first integrated circuit die, and a second plurality of electrically conductive wires, each said wire of said second plurality having one end bonded to said first surface of one of said leads and having another end bonded to said second integrated circuit die.
4. The apparatus of claim 3 , wherein said first integrated circuit die has an active circuit area which faces said first side of said die paddle.
5. The apparatus of claim 1 , wherein said first integrated circuit die has an active circuit area which faces said first side of said die paddle, and including a plurality of electrically conductive wires, each said wire having one end bonded to one of said leads and having another end bonded to said first integrated circuit die.
6. The apparatus of claim 1 , wherein said leads are approximately coplanar with said die paddle.
7. The apparatus of claim 1 , wherein said die paddle is a split die paddle.
8. The apparatus of claim 1 , including a third integrated circuit die mounted on a spacer that is mounted on said first integrated circuit die and is interposed between said first integrated circuit die and said third integrated circuit die.
9. The apparatus of claim 8 , wherein each of said leads has a first portion that is approximately coplanar with said first integrated circuit die, and a second portion that extends from said first portion at an angle directed toward one of said second and third integrated circuit die.
10. An integrated circuit apparatus, comprising:
a leadframe including a first set of leads, a second set of leads and a die paddle disposed between said first and second sets of leads;
a first integrated circuit die mounted on a first side of said die paddle;
a second integrated circuit die mounted on a second side of said die paddle which faces generally oppositely of said first side of said die paddle;
each of said leads having first and second generally oppositely facing surfaces, all of said first surfaces facing generally in a first direction and all of said second surfaces facing generally in a second direction that is generally opposite said first direction;
a first plurality of electrically conductive wires, each said wire of said first plurality having one end bonded to said first surface of one of said leads and having another end bonded to said first die; and
a second plurality of electrically conductive wires, each said wire of said second plurality having one end bonded to said first surface of one of said leads and having another end bonded to said second die.
11. The apparatus of claim 10 , wherein said leads are approximately coplanar with said die paddle.
12. The apparatus of claim 10 , wherein said die paddle is a split die paddle.
13. The apparatus of claim 10 , including a third integrated circuit die mounted on a spacer that is mounted on said first integrated circuit die and is interposed between said first integrated circuit die and said third integrated circuit die.
14. The apparatus of claim 13 , wherein each of said leads has a first portion that is approximately coplanar with said first integrated circuit die, and a second portion that extends from said first portion at an angle directed toward one of said second and third integrated circuit die.
15. An integrated circuit apparatus, comprising:
a leadframe including a first set of leads, a second set of leads and a die paddle disposed between said first and second sets of leads;
a first integrated circuit die mounted on a first side of said die paddle;
a second integrated circuit die mounted on a second side of said die paddle which faces generally oppositely of said first side of said die paddle;
said first integrated circuit die having an active circuit area which faces said first side of said die paddle; and
a plurality of electrically conductive wires, each said wire having one end bonded to one of said leads and having another end bonded to said first integrated circuit die.
16. The apparatus of claim 15 , wherein said leads are approximately coplanar with said die paddle.
17. The apparatus of claim 15 , wherein said die paddle is a split die paddle.
18. The apparatus of claim 15 , including a third integrated circuit die mounted on a spacer that is mounted on said first integrated circuit die and is interposed between said first integrated circuit die and said third integrated circuit die.
19. The apparatus of claim 18 , wherein each of said leads has a first portion that is approximately coplanar with said first integrated circuit die, and a second portion that extends from said first portion at an angle directed toward one of said second and third integrated circuit die.
20.-22. (canceled)
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US12/807,763 US20110006411A1 (en) | 2004-11-30 | 2010-09-14 | Simplified multichip packaging and package design |
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US11/000,355 US7816182B2 (en) | 2004-11-30 | 2004-11-30 | Simplified multichip packaging and package design |
US12/807,763 US20110006411A1 (en) | 2004-11-30 | 2010-09-14 | Simplified multichip packaging and package design |
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US11/000,355 Division US7816182B2 (en) | 2004-11-30 | 2004-11-30 | Simplified multichip packaging and package design |
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US12/807,763 Abandoned US20110006411A1 (en) | 2004-11-30 | 2010-09-14 | Simplified multichip packaging and package design |
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US20100025834A1 (en) * | 2008-08-01 | 2010-02-04 | Zigmund Ramirez Camacho | Fan-in interposer on lead frame for an integrated circuit package on package system |
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US20070290332A1 (en) * | 2006-06-15 | 2007-12-20 | Powertech Technology Inc. | Stacking structure of chip package |
JP2008041999A (en) * | 2006-08-08 | 2008-02-21 | Nec Electronics Corp | Semiconductor device and its manufacturing method |
US20080054429A1 (en) * | 2006-08-25 | 2008-03-06 | Bolken Todd O | Spacers for separating components of semiconductor device assemblies, semiconductor device assemblies and systems including spacers and methods of making spacers |
KR100809701B1 (en) * | 2006-09-05 | 2008-03-06 | 삼성전자주식회사 | Multi chip package having spacer for blocking inter-chip heat transfer |
KR100826982B1 (en) * | 2006-12-29 | 2008-05-02 | 주식회사 하이닉스반도체 | Memory module |
TWI378547B (en) * | 2007-09-14 | 2012-12-01 | Chipmos Technologies Inc | Multi-chip stacked package structure |
TWM341306U (en) * | 2008-03-18 | 2008-09-21 | Lingsen Precision Ind Ltd | Structure with reduced thickness of IC packaging |
US8664038B2 (en) * | 2008-12-04 | 2014-03-04 | Stats Chippac Ltd. | Integrated circuit packaging system with stacked paddle and method of manufacture thereof |
US8686569B2 (en) | 2010-12-14 | 2014-04-01 | Infineon Technologies Ag | Die arrangement and method of forming a die arrangement |
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Also Published As
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EP1662567A3 (en) | 2009-09-16 |
US7816182B2 (en) | 2010-10-19 |
US20060113643A1 (en) | 2006-06-01 |
EP1662567A2 (en) | 2006-05-31 |
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