US20130200916A1

US20130200916A1 - Testing System with Mobile Storage Carts and Computer-Controlled Loading Equipment

Info

Publication number: US20130200916A1
Application number: US13/474,262
Authority: US
Inventors: Peter G. Panagas
Original assignee: Apple Inc
Current assignee: Apple Inc
Priority date: 2012-02-06
Filing date: 2012-05-17
Publication date: 2013-08-08
Also published as: US9423420B2; CN104205784B; WO2013119335A3; WO2013119394A2; CN104245248B; CN104105576B; US20130200913A1; WO2013119393A2; TW201337544A; TWI471568B; WO2013119335A2; TW201337290A; TW201337288A; TWI461716B; WO2013119393A3; CN104204826A; CN104245248A; CN104205786A; TW201337289A; TWI489120B

Abstract

A test system may be provided in which devices under test undergo various types of testing. A first test location may have test equipment for testing input/output devices in the devices under test. A second test location may have test equipment for testing wireless communications circuitry in the devices under test. A mobile storage cart having shelves may be used to store the devices under test and to convey the devices under test between test locations. The storage cart may be configured to engage with a stationary frame structure at a test location. Actuators underneath the storage cart may be used to position the storage cart in a desired location. Distance sensors may be used to obtain status information about each shelf in the storage cart. A computer-controlled loading structure may be used to load the devices under test from the storage cart into test enclosures.

Description

This application claims the benefit of provisional patent application No. 61/595,572, filed Feb. 6, 2012, which is hereby incorporated by reference herein in its entirety.

BACKGROUND

This relates generally to testing systems, and more particularly, to testing systems with computer-controlled loading equipment and mobile storage carts.
Electronic devices are often tested following assembly to ensure that device performance meets design specifications. An electronic device may undergo a first type of testing at a first test location and may undergo a second type of testing at a second test location. At each test location, a test system operator may load devices under test into a series of test stations. Following testing at a first test location, the operator may bring the devices under test to a second location.
The process of manually loading each device under test into each test station can be cumbersome and burdensome to test system operators. If care is not taken, tests may be less accurate and more time consuming than desired.
It would therefore be desirable to be able to provide improved ways of performing manufacturing operations such as testing operations on electronic devices.

SUMMARY

A test system may be provided in which devices under test undergo different types of testing. A first test location may be used to test input/output devices in a device under test. A second test location may be used to test wireless communications circuitry in a device under test.
Devices under test may be output at a first test location. An operator may retrieve the devices under test from the output at the first test location and may load the devices under test into a device under test storage cart. Each device under test may be loaded onto a respective shelf in the storage cart. The device under test storage cart may be configured to hold tens, hundreds, thousands or more of devices under test. The device under test storage cart may be provided with wheels so that an operator may easily transport the devices under test from the first test location to a second test location.
A second test location may have test equipment for testing wireless communications circuitry. The test equipment at the second test location may include one or more electromagnetically shielded test enclosures. The test equipment at the second test location may include one or more computer-controlled loading structures. The loading structures may include one or more computer-controlled loading arms that move with respect to a stationary frame structure.
A stationary frame structure may be provided with registration structures. The storage carts may be provided with corresponding alignment structures that are configured to align and mate with the registration structures at the second test station. One or more computer-controlled actuators underneath and coupled to the storage cart may be used to position the storage cart in a desired location. By engaging the storage cart with the stationary frame structure at the second test station, the computer-controlled loading structure may be able to locate each device under test in the storage cart with predictable accuracy.
One or more sensors may be used to obtain status information from the storage cart. The sensors may be distance sensors that are configured to scan and obtain information about each shelf. The sensors may be configured to determine whether or not a device is present on a shelf and/or whether or not a device is oriented properly on a shelf. Orientation information can be deduced by using the sensors to determine surface characteristics of the device under test being scanned. Computer-controlled loading structures may unload storage carts based on the obtained status information.
One or more computer-controlled loading structures may be used to load devices under test from a storage cart into a test enclosure. A computer-controlled loading structure may have first and second robotic arms that allow the loading structure to carry more than one device under test at the same time. Following testing, the computer-controlled loading structure may unload the devices under test from the test enclosures and may return the devices under test back to the same storage cart or may load the devices under test into a different storage cart.
Further features of the invention, its nature and various advantages will be more apparent from the accompanying drawings and the following detailed description of the preferred embodiments.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a perspective view of an illustrative electronic device such as a handheld device of the type that may be manufactured using automated equipment in accordance with an embodiment of the present invention.

FIG. 2 is a schematic diagram of an illustrative electronic device such as a tablet computer that may be manufactured using automated equipment in accordance with an embodiment of the present invention.

FIG. 3 is a schematic diagram of an illustrative electronic device with input/output devices and wireless communications circuitry in accordance with an embodiment of the present invention.

FIG. 4 is a diagram of an illustrative test system in which a device under test storage cart may be used to convey a plurality of devices under test from one test area to another test area in accordance with an embodiment of the present invention.

FIG. 5 is a diagram of manufacturing equipment of the type that may be used in manufacturing an electronic device in accordance with an embodiment of the present invention.

FIG. 6 is a perspective view of an illustrative device under test storage cart having wheels and registration features in accordance with an embodiment of the present invention.

FIG. 7 is a side view of an illustrative device under test storage cart being registered at a computer-controlled loading structure in accordance with an embodiment of the present invention.

FIG. 8 is a perspective view of a device under test on a slotted shelf in a device under test storage cart in accordance with an embodiment of the present invention.

FIG. 9 is a side view of an illustrative device under test storage cart being scanned by one or more lasers in accordance with an embodiment of the present invention.

FIG. 10 is a graph showing how first and second lasers may be used to detect and obtain the status of a device under test in a storage cart in accordance with an embodiment of the present invention.

FIG. 11 is a diagram showing how devices under test may be moved between storage carts and test stations by computer-controlled loading equipment in accordance with an embodiment of the present invention.

FIG. 12 is a perspective view of an illustrative test system in which a computer-controlled loading structure with two robotic arms may be used to transport devices under test between storage carts and test stations in accordance with an embodiment of the present invention.

FIG. 13 is a perspective view of an illustrative test system in which a plurality of computer-controlled loading structures with robotic arms may be used to transport devices under test between storage carts and test stations in accordance with an embodiment of the present invention.

FIG. 14 is a flow chart of illustrative steps involved in testing devices under test using a test system in accordance with an embodiment of the present invention.

DETAILED DESCRIPTION

Electronic devices such as electronic device 10 of FIG. 1 may be manufactured using automated manufacturing equipment. The automated manufacturing equipment may include equipment for assembling device components together to form an electronic device. The automated manufacturing equipment may also include testing systems for evaluating whether devices have been properly assembled and are functioning properly.
Devices such as device 10 of FIG. 1 may be assembled and tested using an automated manufacturing system. The manufacturing system may include one or more stations such as one or more test stations for performing testing operations.
Devices that are being tested in a test system may sometimes be referred to as devices under test (DUTs). Devices under test may be provided to the test stations using a conveyor belt, using robotic arms, or using other loading equipment.
Test equipment at each test station may be used to perform an associated test on a device. For example, one test station may have equipment for testing a display in the device. Another test station may have equipment for testing an audio component in the device. Yet another test station may have equipment for testing light sensors in the device. Yet another test station may have equipment for testing wireless communications circuitry in the device. Automated equipment in the test system may be used in loading and unloading devices under test, in conveying devices under test between test stations, and in performing tests and maintaining a database of test results.
Any suitable device may be tested using the test equipment. As an example, device 10 of FIG. 1 may be tested. Device 10 may be a computer monitor with an integrated computer, a desktop computer, a television, a notebook computer, other portable electronic equipment such as a cellular telephone, a tablet computer, a media player, a wrist-watch device, a pendant device, an earpiece device, other compact portable devices, or other electronic equipment. In the configuration shown in FIG. 1, device 10 is a handheld electronic device such as a cellular telephone, media player, navigation system device, or gaming device.
As shown in FIG. 1, device 10 may include a housing such as housing 12. Housing 12, which may sometimes be referred to as a case, may be formed of plastic, glass, ceramics, fiber composites, metal (e.g., stainless steel, aluminum, etc.), other suitable materials, or a combination of these materials. In some situations, parts of housing 12 may be formed from dielectric or other low-conductivity material. In other situations, housing 12 or at least some of the structures that make up housing 12 may be formed from metal elements.
Device 10 may, if desired, have a display such as display 14. Display 14 may be a touch screen that incorporates capacitive touch electrodes or may be insensitive to touch. Display 14 may include image pixels formed from light-emitting diodes (LEDs), organic LEDs (OLEDs), plasma cells, electrophoretic display elements, electrowetting display elements, liquid crystal display (LCD) components, or other suitable image pixel structures. A cover glass layer may cover the surface of display 14. Openings for buttons such as button 20, openings for speaker ports such as speaker port 22, and other openings may be formed in the cover layer of display 14, if desired.
The central portion of display 14 (i.e., active region 16) may include active image pixel structures. The surrounding rectangular ring-shaped inactive region (region 18) may be devoid of active image pixel structures. If desired, the width of inactive region 18 may be minimized (e.g., to produce a borderless display).
Device 10 may include components such as front-facing camera 24. Camera 24 may be oriented to acquire images of a user during operation of device 10. Device 10 may include sensors in portion 26 of inactive region 18. These sensors may include, for example, an infrared-light-based proximity sensor that includes an infrared-light emitter and a corresponding light detector to emit and detect reflected light from nearby objects. The sensors in portion 26 may also include an ambient light sensor for detecting the amount of light that is in the ambient environment for device 10. Other types of sensors may be used in device 10 if desired. The example of FIG. 1 is merely illustrative.
Device 10 may include input-output ports such as port 28 and/or port 25. Ports such as port 28 and port 25 may include audio input-output ports, analog input-output ports, digital data input-output ports, or other ports. Each port may have an associated connector. For example, an audio port such as audio port 25 may have an associated four-contact audio connector, a digital data port may have a connector with two or more pins (contacts), a connector with four or more pins, a connector with thirty pins, or other suitable data port connector.
Sensors such as the sensors associated with region 26 of FIG. 1, cameras such as camera 24, audio ports such as audio port 25 and speaker port 22, buttons such as button 20, and ports such as port 28 may be located on any suitable portion of device housing 12 (e.g., a front housing face such as a display cover glass portion, a rear housing face such as a rear planar housing wall, sidewall structures, etc.). For example, buttons such as button 21 may be located on a sidewall portion of housing 12.
FIG. 2 is a perspective view of device 10 in an illustrative configuration in which device 10 is a tablet computer. As shown in FIG. 2, device 10 may include a housing such as housing 12. Housing 12 may be formed from metal, plastic, fiber-based composite material, glass, ceramic, other materials, or combinations of these materials. Device 10 may have an upper (front) surface that is covered with display 14. Active portion 16 of display 14 may have a rectangular shape (as an example). Inactive portion 18 of display 14 may have an opening to accommodate button 20, a window region for camera 24, and a portion such as portion 26 that is associated with one or more optical sensors such as an infrared-based proximity sensor and/or an ambient light sensor. Buttons such as button 21 and ports such as audio port 25 may be formed in a sidewall portion of housing 12.
A schematic diagram of an electronic device such as electronic device 10 is shown in FIG. 3. As shown in FIG. 3, electronic device 10 may include storage and processing circuitry 27. Storage and processing circuitry 27 may include storage such as hard disk drive storage, nonvolatile memory (e.g., flash memory or other electrically-programmable-read-only memory configured to form a solid state drive), volatile memory (e.g., static or dynamic random-access-memory), etc. Processing circuitry may be based on one or more microprocessors, microcontrollers, digital signal processors, baseband processors, power management units, audio codec chips, application specific integrated circuits, etc.
Storage and processing circuitry 27 may be used to run software on device 10, such as internet browsing applications, voice-over-internet-protocol (VOIP) telephone call applications, email applications, media playback applications, operating system functions, etc. To support interactions with external equipment, storage and processing circuitry 27 may be used in implementing communications protocols. Communications protocols that may be implemented using storage and processing circuitry 27 include internet protocols, wireless local area network (WLAN) protocols (e.g., IEEE 802.11 protocols—sometimes referred to as WiFi®), protocols for other short-range wireless communications links such as the Bluetooth® protocol, cellular telephone protocols, etc.
Circuitry 27 may be configured to implement control algorithms that control the use of antennas in device 10. For example, to support antenna diversity schemes and MIMO schemes or beam forming or other multi-antenna schemes, circuitry 27 may perform signal quality monitoring operations, sensor monitoring operations, and other data gathering operations and may, in response to the gathered data, control which antenna structures within device 10 are being used to receive and process data. As an example, circuitry 27 may control which of two or more antennas is being used to receive incoming radio-frequency signals, may control which of two or more antennas is being used to transmit radio-frequency signals, may control the process of routing incoming data streams over two or more antennas in device 10 in parallel, etc.
Input/output circuitry 29 may be used to allow data to be supplied to device 10 and to allow data to be provided from device 10 to external devices. Input/output circuitry 29 may include input/output devices 31. Input/output devices 31 may include touch screens, displays without touch sensor capabilities, buttons, joysticks, click wheels, scrolling wheels, touch pads, key pads, keyboards, microphones, speakers, tone generators, vibrators, cameras, sensors, light-emitting diodes and other status indicators, light sources, audio jacks and other audio port components, data ports, light sensors, motion sensors (accelerometers), capacitance sensors, proximity sensors, etc. A user can control the operation of device 10 by supplying commands through input/output devices 31 and may receive status information and other output from device 10 using the output resources of input/output devices 31.
Wireless communications circuitry 33 may include radio-frequency (RF) transceiver circuitry formed from one or more integrated circuits, power amplifier circuitry, low-noise input amplifiers, passive RF components, one or more antennas, transmission lines, and other circuitry for handling RF wireless signals. Wireless signals can also be sent using light (e.g., using infrared communications).
Wireless communications circuitry 33 may include satellite navigation system receiver circuitry 35, transceiver circuitry such as transceiver circuitry 37 and 39, and antenna circuitry such as antenna circuitry 41. Satellite navigation system receiver circuitry 35 may be used to support satellite navigation services such as United States' Global Positioning System (GPS) (e.g., for receiving satellite positioning signals at 1575 MHz) and/or other satellite navigation systems.
Transceiver circuitry 37 may handle 2.4 GHz and 5 GHz bands for WiFi® (IEEE 802.11) communications and may handle the 2.4 Bluetooth® communications band. Circuitry 37 may sometimes be referred to as wireless local area network (WLAN) transceiver circuitry (to support WiFi® communications) and Bluetooth® transceiver circuitry. Circuitry 33 may use cellular telephone transceiver circuitry (sometimes referred to as cellular radio) 39 for handling wireless communications in cellular telephone bands such as bands at 850 MHz, 900 MHz, 1800 MHz, 1900 MHz, and 2100 MHz or other cellular telephone bands of interest.
Examples of cellular telephone standards that may be supported by wireless circuitry 33 and device 10 include: the Global System for Mobile Communications (GSM) “2G” cellular telephone standard, the Evolution-Data Optimized (EVDO) cellular telephone standard, the “3G” Universal Mobile Telecommunications System (UMTS) cellular telephone standard, the “3G” Code Division Multiple Access 2000 (CDMA 2000) cellular telephone standard, and the “4G” Long Term Evolution (LTE) cellular telephone standard. Other cellular telephone standards may be used if desired. These cellular telephone standards are merely illustrative.
Wireless communications circuitry 33 may include circuitry for other short-range and long-range wireless links if desired. For example, wireless communications circuitry 33 may include wireless circuitry for receiving radio and television signals, paging circuits, etc. In WiFi® and Bluetooth® links and other short-range wireless links, wireless signals are typically used to convey data over tens of hundreds of feet. In cellular telephone links and other long-range links, wireless signals are typically used to convey data over thousands of feet or miles.
Wireless communications circuitry 33 may include one or more antennas 41. Antennas 41 may be formed using any suitable antenna type. For example, antennas 41 may include antennas with resonating elements that are formed from loop antenna structures, patch antenna structures, inverted-F antenna structures, slot antenna structures, planar inverted-F antenna structures, helical antenna structures, hybrids of these designs, etc. Different types of antennas may be used for different bands and combinations of bands. For example, one type of antenna may be used in forming a local wireless link antenna and another type of antenna may be used in forming a remote wireless link antenna.
FIG. 4 is a diagram of an illustrative system of the type that may be used for manufacturing operations such as device testing. As shown in FIG. 4, system 48 may include one or more test areas such as test area 50 and test area 52. During testing operations, many devices (e.g., tens, hundreds, thousands or more of devices 10) may be tested in a test system such as test system 48. Test system 48 may include test accessories, computers, network equipment, tester control boxes, cabling, test enclosures, and other test equipment for gathering test results.
Test areas 50 and 52 may include different types of test equipment for performing one or more tests on a device under test such as device 10. For example, test area (e.g., test area A) may include test equipment for performing one or more tests on input/output devices 31 (FIG. 3) of device under test 10. Input/output devices that may be tested at test area A include sensors in device 10 (e.g., ambient light sensors, proximity sensors, touch sensors, etc.), cameras in device 10 (e.g., front camera, rear camera, etc.), buttons in device 10, other input/output devices 31 in device 10, etc.
Test area 52 (e.g., test area B) may include test equipment for performing one or more tests on wireless communications circuitry 33 (FIG. 3) in device 10. For example, test area B may include over-the-air test equipment such as test equipment for generating radio-frequency test signals and for performing radio-frequency measurements on signals received from device under test 10.
If desired, a manufacturing facility may include test areas for performing other types of tests. For example, system 48 may include a test area for performing longer-duration testing (e.g., tests that may take one or more hours such as battery testing, extreme temperature testing, etc.). Any number of suitable test areas may be included in system 48. The example of FIG. 4 in which system 48 includes test area A and test area B is merely illustrative.
During manufacturing operations, a device under test may undergo a first type of testing at a first test area (e.g., test area A) and may then be moved to a second test area (e.g., test area B) to undergo a second type of testing. Devices under test may be conveyed between test areas using moveable storage equipment such as device under test storage cart 340. Storage carts 340 may be, for example, mobile shelves that can be moved between different pieces of equipment during manufacturing. Carts 340 may be configured to store tens, hundreds, thousands or more of devices under test.
Carts 340 may serve as input and output storage locations for devices under test. Carts 340 may be loaded and unloaded by an operator, may be loaded and unloaded by computer-controlled loading equipment (e.g., one or more computer-controlled robotic arms), or may be loaded and unloaded by a combination of operators and computer-controlled loading equipment.
For example, consider a scenario in which a plurality of devices under test have completed testing at test area A and are ready to be tested at test area B. An operator may load devices under test from the output of test area A to storage cart 340. The storage cart may then be moved to test area B by the operator so that the devices under test may be tested at test area B.
FIG. 5 is a diagram of an illustrative system of the type that may be used for manufacturing operations such as device testing. System 30 may, for example, be used in test areas such as test area A of FIG. 4. As shown in FIG. 5, system 30 may include one or more stations such as test stations 36. Each test station may include test equipment for performing one or more tests on device under test 10.
Device under test 10 may, if desired, be installed in a test tray such as tray 32. Tray 32 may be configured to receive one or more devices under test. For example, tray 32 may have multiple slots, each of which is configured to receive a corresponding device under test. If desired, tray 32 may be configured to receive only a single device under test.
Device 10 may be installed in test tray 32 manually or using automated equipment. To facilitate manual installation, test tray 32 may include features to facilitate human manipulation. For example, test tray 32 may include features that help an operator open and close clamps or other device holding features in test tray 32.
Each test station 36 may include a portion that is configured to receive a device under test. As shown in FIG. 3, for example, each test station 36 may be provided with test fixture 34. Test fixtures 34 may be configured to receive device under test 10 directly or, as shown in FIG. 3, may each be configured to receive device under test 10 after device under test 10 has been mounted in test tray 32. With this type of arrangement, test tray 32 may serve as an interface between device under test 10 and test fixtures 34. Test tray 32 may, for example, be more robust than device 10, may have engagement features that are configured to mate with test system loading equipment, may have an identification number that facilitates tracking, and may have other features that facilitate testing of device under test 10 by test stations 36.
Device under test 10 and test tray 32 may be conveyed between test stations 36 using a conveyor belt such as conveyor belt 38 (e.g., a belt that moves in direction 44). When using a conveyor system such as one or more conveyor belts 38, each test station 36 may be provided with loading mechanisms and/or positioners such as test tray loaders 72. Test tray loaders 72 may be located at one or more intermediate positions along a line of test stations 36. Test tray loaders 72 may include one or more computer-controlled positioning arms. Loaders 72 may be used in picking up a test tray and device under test from conveyor 38, may be used to present the tray and device to test equipment at the test station for testing of the device, and may be used to replace the test tray and device under test on conveyor 38 following testing. If desired, loaders 72 may also be configured to pass devices and trays directly between test stations 36.
Test stations 36 may provide test results to computing equipment such as test host 42 (e.g., one or more networked computers) for processing. Test host 42 may maintain a database of test results, may be used in sending test commands to test stations, may track individual trays and devices under test as the trays and devices pass through system 30, and may perform other control operations.
Following testing at test area A, an operator may pick up devices under test at the end of conveyor 38. The devices under test that are retrieved from the end of conveyor 38 may, as an example, be placed in a storage cart such as storage cart 340 of FIG. 6 or may be fed into additional systems. If desired, the operator may remove device under test 10 from tray 32 before loading device under test 10 into cart 340.
If desired, storage cart 340 may be used to convey the devices under test between different portions of a manufacturing facility (e.g., between test area A and test area B of FIG. 4). As shown in FIG. 6, cart 340 may have shelves 342 on which devices under test 10 may be stored. Wheels 344 may be provided to allow cart 340 be moved between test areas. For example, after loading a cart with devices under test from the output of test area A, an operator may roll the cart to test area B.
Storage cart 340 may be provided with registration and alignment features such as balls 346 that allow cart 340 to engage with test equipment at a test area such as test area B of FIG. 4. The registration and alignment features may be used to locate a device under test in the storage cart with predictable accuracy with respect to a three-dimensional positionable frame. The cart may be retained within the frame under computer control. The loading and unloading of the devices under test form the cart may also be computer-controlled (e.g., to ensure that no devices under test are loaded or unloaded unless the cart is in a desired location).
FIG. 7 is a side view of cart 340 showing how cart 340 may engage with test equipment at a test area. As shown in FIG. 7, a test area may be provided with an assembly of computer-controlled loading structures such as computer-controlled loading structure 42. Computer-controlled loading structure 42 may include stationary frame structures such as stationary frame structures 360. Stationary frame structures 360 may be attached to manufacturing facility floor 354 or other support structures. Loading structure 42 may include a computer-controlled positioner such as positioner 356 that may be used to position a loading arm such as loading arm 358 along three axes (X, Y, and Z). Loading arm 358 may move with respect to stationary frame structures 360. Arm 358 may be used to load devices under test 10 onto shelves 342 and may be used to unload test devices under test 10 from shelves 342.
To ensure accurate placement of loading arm 358 as it loads and unloads devices under test 10 from storage cart 340, storage cart 340 may be provided with registration and alignment features that engage with corresponding registration and alignment features associated with loading structure 42. For example, registration features such as balls 346 may be formed on portions of cart 340. In the example of FIG. 7, balls 346 have been mounted on upper surface 345 of cart 340. Balls 346 may be used to register the location of cart 340 relative to loading structure 42 (e.g., relative to frame structures 360). Loading structure 42 may have corresponding registration and alignment features such as registration structures 350. Registration structures 350 may be mounted to frame structures 360. Registration structures 350 may have notches or other features that are configured to receive corresponding registration features on cart 340 such as balls 346.
Cart 340 may be mounted on air-controlled (or motor-controlled) actuators such as actuators 352 and/or 353. Actuators 352 may be mounted on wheels 344. Actuators 353 may be mounted in a fixed location on floor 354. When it is desired to register the position of cart 340 relative to loading structure 42, an operator may roll cart 340 into a position in which balls 346 are aligned with registration structures 350 and in which cart 340 overlaps a floor-mounted actuator such as actuator 353. Actuators 352 may be used to lock wheels 344 in place to prevent cart 340 from moving during testing. Actuators 352 and/or 353 may also be used to drive balls 346 upwards into registration structures 350, thereby aligning cart 340 relative to load structure 42 (e.g., relative to frame structures 360). During alignment operations, the shapes and locations of registration structures 350 and balls 346 cooperate to ensure that cart 340 is placed in its desired location. After cart 340 and therefore shelves 342 of cart 340 have been placed in a known location relative to loading structure 42 in this way, loading structure 42 may use arm 358 to load and/or unload devices under test 10 from storage cart 340.
When registration balls 346 and registration structures 350 are engaged, an electrical connection may be formed between cart 340 and loading structure 42. This may allow storage cart 340 to communicate with a test host such as test host 40. For example, information about storage cart 340 may be conveyed to test host 40 via registration balls 346, registration structure 350, frame structure 360, and path 351. Information that may be conveyed to test host 40 includes the number of devices under test stored in cart 340, which shelves contain a device under test 10, which shelves contain a properly oriented device under test 10, other information about cart 340, etc. This type of information may be used when loading and unloading storage cart 340.
If desired, arm 358 may be provided with vacuum or suction features such as pneumatic structures 370 that may be used to temporarily adhere device 10 to arm 358. Pneumatic features 370 may be computer-controlled and may be selectively enabled and disabled by a test system operator. This may allow arm 358 to move swiftly between storage carts and test stations without device 10 sliding off arm 358.
If desired, device under test 10 may rest upon on one or more raised mounting structures on shelf 342 such as mounting structures 55. Mounting structures 55 may produce a gap 57 between device 10 and shelf 342. Gap 57 may allow for arm 358 to pick up and drop off device 10 at shelf 342. For example, arm 358 may have a spatula-like shape that may be inserted into gap 57 to lift device 10 from mounting structures 55 and to place device 10 on mounting structures 55. As another example, each shelf 342 may have a slot such as slot 362 of FIG. 8. Slots 362 may allow arm 358 to pick up and drop off device 10 at shelf 342.
If desired, status information may be obtained from storage cart 340 by performing a status scan on cart 340. FIG. 9 is a diagram of an illustrative system that may be used to scan and obtain status information from storage cart 340. As shown in FIG. 9, one or more lasers such as lasers 400 may be used to scan each shelf 342 in storage cart 340. Lasers 400 may be, for example, distance sensors which use laser beams to determine the distance to an object. This is, however, merely illustrative. Any suitable type of laser may be used to scan shelves 342 to obtain status information from storage cart 340 (e.g., ultrasound lasers, other types of lasers, etc.).
Lasers 400 may perform a status scan of each shelf 342 in cart 340 to obtain status information about each shelf 342. Obtaining status information about a shelf may include, for example, determining whether or not a device is present on the shelf, determining whether or not a device is oriented properly on the shelf, and/or determining other information about the device on the shelf. Based on the data obtained from lasers 400, a status may be assigned to each scanned shelf. For example, a shelf on which device 10 is not present (e.g., shelf 404) may be assigned a status of “EMPTY.” A shelf on which device 10 is present but is oriented improperly (e.g., shelf 406 and shelf 418) may be assigned a status of “NG” to indicate that the status of that shelf is “Not Good.” A shelf on which device 10 is present and is oriented properly (e.g., shelf 408) may be assigned a status of “OK” to indicate that the status of that shelf is acceptable.
Status information obtained by lasers 400 may be conveyed locally at each shelf (e.g., via a status indicator located at each shelf) and/or may be conveyed to a computer in the manufacturing facility. For example, status information may be conveyed to a computer that controls loading structure 42 (FIG. 7). Loading structure 42 may load and unload storage cart 340 based on the obtained status information. For example, loading structure 42 may only pick up devices 10 from cart 340 that are oriented properly (e.g., devices 10 on shelves 342 that have been assigned a status of “OK”). Scanning cart 340 in this way may ensure that devices 10 are not improperly placed in a test chamber or test cell after being unloaded from storage cart 340 by loading structure 42.
As shown in FIG. 9, lasers 400 may perform a status scan by moving along a column of shelves 342 (e.g., in direction 412). If desired, lasers 400 may move in unison. Lasers 400 may direct laser beams into each shelf 342. As the lasers move along a column of shelves 342, each laser may measure the distance traveled by the laser beam before it is reflected by an object or surface. Thus, when lasers 400 scan a shelf 342 where device 10 is present, the laser beams will be reflected at device 10 and lasers 400 will both register a decrease in distance between the laser and the point of reflection. When lasers 400 scan a shelf 342 where device 10 is not present, the laser beams will instead be reflected at a back wall of shelf 342. In the example of FIG. 9, lasers may be configured to scan column-by-column until the storage cart status scan is complete. This is, however, merely illustrative. If desired, lasers 400 may be configured to scan row-by-row or may be configured to scan cell-by-cell in any desired order.
In order to obtain the orientation status of device 10 in storage cart 340 (e.g., in order to determine whether or not device 10 is properly oriented), each laser may determine surface characteristics of the outward facing surface of device 10 on shelf 342. For example, a button on device 10 such as button 21 may have a slightly raised surface relative to the surface of the housing of device 10. As another example, a port such as audio port 25 and/or data port 28 may be formed as an opening in the housing of device 10. Surface characteristics of this type (e.g., protrusions, recesses, gaps, buttons, holes, etc.) may be distinguishable using lasers 400. Hence, a properly oriented device on shelf 342 may be defined by the surface characteristics of the outward-facing surface of device 10 when it is properly oriented on shelf 342.
For example, a properly oriented device may be defined by having audio port 25 on side 414 of the shelf, facing outward, and by having button 21 on side 416 of the shelf, facing outward. An improperly oriented device may then be defined by either having data port 28 facing outward (as shown in shelf 418, for example) or having button 21 on side 414 and port 25 on side 416 (as shown in shelf 406, for example).
This definition is merely an illustrative example of how one might define “properly oriented.” For a shelf to be assigned a status of “OK,” Laser 1 would need to register the surface characteristics of audio port 25 (e.g., an opening in the housing of device 10) and Laser 2 would need to register the surface characteristics of button 21 in device 10 (e.g., a raised surface on the housing of device 10).
FIG. 10 is a set of graphs showing examples of data that might be recorded by Laser 1 and Laser 2 during a scan of a particular shelf (e.g., shelf 408 of FIG. 9). The upper graph is representative of the distance D measured by Laser 1 as a function of time t and the lower graph is representative of the distance D measured by Laser 2 as a function of time t.
From time t₀to time t₁, the laser beam is being reflected at the back wall of shelf 408. At time t₁, each laser registers a decrease in distance between the laser and the point of reflection, thereby indicating the presence of device 10. Between time t₁and time t₂, each laser registers a unique surface characteristic of device 10 as the lasers move across the surface of device 10. Laser 1 registers a slight increase in measured distance, indicating that the laser beam may have encountered an opening in the housing of device 10 (e.g., indicating the presence of audio port 25). Laser 2 registers a slight decrease in measured distance, indicating that the laser beam may have encountered a raised surface on the housing of device 10 (e.g., indicating the presence of button 21). At time t₂, both lasers register an increase in distance as the lasers move past device 10 and onto the next shelf in the column of shelves 342.
Each unique orientation of device 10 on shelf 342 may be identified with a distinct set of measurements from lasers 400. In this way, each orientation can be characterized as being acceptable or unacceptable (if desired). In the example described in connection with FIG. 9, being “properly oriented” on a shelf is defined as having audio port on side 414 of the shelf and button 21 on side 416 of the shelf, facing outward (e.g., the orientation shown in shelf 408). This is, however, merely illustrative. In general, any orientation of device 10 on shelf 342 may be defined as “properly oriented.” For example, if desired, “properly oriented” may be defined as having data port 28 facing outward (as shown on shelf 418 of FIG. 9) or may be defined as having button 21 on side 414 and audio port 25 on side 416 (as shown on shelf 406 of FIG. 9). Any orientation of device 10 on shelf 342 may be identified using lasers 400.
If desired, storage carts 340 may serve as input and output storage locations for devices under test 10. Consider, as an example, test system 30 of FIG. 11. As shown in FIG. 11, test system 30 may include device under test storage equipment such as carts 340. Carts 340 may serve as input storage locations for devices under test 10 that are “waiting” to be tested at a given test station. Carts 340 may also serve as output storage locations for devices under test 10 that have already been tested at a given test station. For example, the leftmost cart 340 in FIG. 11 may serve as an input storage location for devices under test 10 that are waiting to be tested in test station cell (group) C1; the middle cart 340 may serve as an output storage location for devices under test 10 that have been tested in test station cell (group) C1 and as an input storage location for devices under test 10 that are waiting to be tested in cell C2 of test stations 36; and the rightmost cart 340 may serve as an output storage location for devices under test 10 that have been tested by the test stations in test station cell C2.
Loading structures 42 may have one or more computer-controlled arms that may be positioned along three axes. Loading structures 42 may be configured to span multiple carts 340 and/or multiple test stations 36. For example, the leftmost loading structure 42 of FIG. 11 may be configured to handle devices under test for the leftmost cart 340, the test stations in test station cell C1, and the center cart 340. The rightmost loading structure 42 of FIG. 11 may be configured to handle devices under test for the center cart, the test stations in test station cell C2, and the rightmost cart.
During operation, the leftmost loading structure 42 may retrieve devices under test from the leftmost cart 340, may test these devices under test using one or more test stations 36 in cell C1, and, following testing, may place the devices under test in the middle cart 340. After center cart 340 is loaded with devices under test 10, center cart 340 may, if desired, be moved to a new location for unloading (e.g., by rolling the cart on wheels). In configurations of the type shown in FIG. 11 in which the center cart falls within the reach of the loading structures for adjacent cells, the center cart may serve as an output/input interface and need not be moved before being unloaded. Following testing in cell C2, the rightmost loading structure of FIG. 11 may move the tested devices under test 10 from the test stations of cell C2 to the rightmost cart 340 in the system.
FIG. 12 is a perspective view of an illustrative test system such as test system 500 showing another example of how storage carts, test stations, and computer-controlled loading structures may interact with each other. As shown in FIG. 12, loading structure 42 may be provided with multiple robotic loading arms such as robotic arms 358A and 358B. Loading structure 42 may be used to load and unload storage carts such as storage carts 340A and 340B and to load and unload test stations such as test station 36.
Test station 36 may include one or more test cells such as test cells 502. All of test cells 502 at test station 36 may be used to perform the same type of test or, if desired, different test cells 502 may be used to perform different types of tests. For example, a first column 36A of test cells 502 may be used to perform a first type of test, and a second column 36B of test cells 502 may be used to perform a second type of test. For simplicity, only six test cells are shown in FIG. 12. However, there may be tens, hundreds, thousands or more of test cells 502 at a given test station, if desired.
If desired, storage carts 340A and 340B may be located on both sides of test station 36. In some configurations, the storage carts may each be used as input and output storage locations for devices under test 10. For example, loading structure 42 may load devices under test 10 from storage cart 340A into test station 36 for testing. Following testing, loading structure 42 may unload devices under test 10 from test station 36 and return the devices to storage cart 340A. Following testing of all devices 10 from storage cart 340A, loading structure 42 may then start loading devices 10 from storage cart 340B into test station 36. Following testing, loading structure 42 may unload devices under test 10 from test station 36 and return the devices to storage cart 340B.
In other configurations, a first storage cart may be used as an input storage location for devices under test 10, and a second storage cart may be used as an output storage location for devices under test 10. For example, loading structure 42 may load devices 10 from storage cart 340A into test station 36 for testing. Following testing, loading structure 42 may unload devices 10 from test station 36 and may bring the devices to storage cart 340B.
Loading structure 42 may be configured to carry more than one device under test at the same time. For example, robotic arm 358A may carry a first device under test while robotic arm 358B carries a second device under test. Loading structure 42 may be configured to move back and forth in the x-direction along frame structure 360, and robotic arms 358A and 358B may be configured to move along three different axes (e.g., along orthogonal axes X, Y, and Z).
Providing a single loading structure 42 with multiple arms 358 may increase the efficiency of system 500 by allowing a single loading structure 42 to perform the functions of multiple loading structures 42.
In order to describe how a computer-controlled loading structure of the type shown in FIG. 12 might operate in system 500, consider a simplified scenario in which two devices, DUT 1 and DUT 2, are each waiting to be tested at test station 36A and test station 36B. Loading structure 42 may use arm 358A to pick up DUT 1 from storage cart 340A and to place DUT 1 into test cell 502A (e.g., a test cell at test station 36A). Loading structure 42 may then use arm 358A may to pick up DUT 2 from storage cart 340A. With DUT 2 in arm 358A, loading structure 42 may move towards test cell 502A. Once at test cell 502A, loading structure 42 may use free arm 358B to remove DUT 1 from test cell A. Following removal of DUT 1 from test cell 502A, loading structure 42 may use arm 358A to place DUT 2 into test cell 502A. Loading structure 42 may then move towards test cell 502B and may use arm 358B to place DUT 1 into test cell 502B (e.g., a test cell at test station 36B). Loading structure may then move back to test cell 502A and may use arm 358A to remove DUT 2 from test cell 502A. Loading structure 42 may then move towards test cell 502B. Using arm 358B, loading structure 42 may remove DUT 1 from test cell 502B. Following removal of DUT 1 from test cell 502B, loading structure 42 may use arm 358A to place DUT 2 into test cell 502B. Loading structure 42 may then move towards storage cart 340A and may use arm 358B to place DUT 1 back into storage cart 340A. Loading structure 42 may then move towards test cell 502B and may use either arm to remove DUT 2 from test cell 502B and to return DUT 2 back to storage cart 340A. Assuming (for simplicity) that DUT 2 was the last device to be tested in storage cart 340A, loading structure 42 may move to storage cart 340B to test devices in storage cart 340B at test stations 36A and 36B (e.g., using a similar method as the one just described).
By providing loading structure 42 with multiple arms, loading structure 42 may “switch” devices in a test cell without moving away from that test cell. For example, loading structure 42 may remove a first device from a test cell with a first arm while holding a second device in a second arm. After removing the first device from the test cell, loading structure 42 may use the second arm to place the second device in the test cell. This may eliminate the need to return to a storage cart in order to replace a first device in a test cell with a second device.
FIG. 13 is a perspective view of an illustrative test system such as test system 600 showing yet another example of how storage carts, test stations, and computer-controlled loading structures may interact with each other. As shown in FIG. 13, there may be a plurality of loading structures such as loading structure 42A and loading structure 42B operating in test system 600. Each loading structure may be provided with one or more robotic arms such as robotic arms 358A and robotic arm 358B. Loading structures 42A and 42B may be used to load and unload storage carts 340A and 340B and to load and unload test station 36.
Loading structures 42A and 42B may be configured to move independently of one another. Loading structures 42A and 42B may each move back and forth in the x-direction along frame structures 360, and robotic arms 358A and 358B may each be configured to move in three dimensions (X, Y, and Z). In the illustrative example of FIG. 12, loading structures 42 share common frame structures (e.g., frame structures 360). This is, however, merely illustrative. If desired, loading structures 42 may be provided with separate frame structures.
In some configurations, each storage cart may be used as both an input and an output storage location for devices 10. In this type of configuration, devices under test 10 may unloaded from a storage cart for testing and, following testing, may be returned to the storage cart.
In other configurations, a first storage cart such as storage cart 340A may serve as an input storage location for devices under test 10 and a second storage cart such as storage cart 340B may serve as an output storage location for devices under test 10.
If desired, loading structures 42A and 42B may each perform unique functions and/or may operate independently of one another. For example, loading structure 42A may use arm 358A to load devices from storage cart 340A into test station 36. Meanwhile, loading structure 42B may use arm 358B to load devices from test station 36 to storage cart 340B.
Following testing at a test station, devices under test 10 may provide an audible or visual status indicator to indicate whether or not the test was successful (e.g., whether or not the device “passed” or “failed”). For example, if performance of device 10 is found to be satisfactory during testing, a device may display a green screen to indicate that the device has “passed” that particular test. If performance of device 10 is found to be unsatisfactory, device 10 may display a red screen to indicate that the device has “failed” that particular test and may need to be reworked, retested, or discarded.
The examples described in connection with FIGS. 10-12 are merely illustrative examples that are meant to shed light on how a test system that includes storage carts, test stations, and computer-controlled loading equipment might operate. In general, any suitable combination of loading and unloading methods may be used. The mobility of storage carts 340 and the programmability of loading structures 42 allow for a manufacturing facility to customize its test systems as desired.
FIG. 13 is a flow chart of illustrative steps involved in testing devices at multiple test areas such as test area A and test area B (FIG. 4).
At step 702, an operator may retrieve device under test 10 from the output of test area A. The output of test area A may be, for example, the end of a conveyor belt such as conveyor belt 38 of FIG. 5.
At step 704, an operator may load device under test 10 into a storage cart such as storage cart 340 (FIG. 6). If device under test 10 is to undergo over-the-air testing (e.g., testing of wireless communications circuitry), it may be desirable to remove device under test 10 from test tray 32 (if needed) prior to loading device under test 10 into storage cart 340.
At step 706, an operator may roll storage cart 340 to a different portion of the manufacturing facility such as test area B. Storage cart 340 may be moved from test area A to test area B when it has reached a desired capacity of devices under test 10 from the output of test area A.
At step 708, an operator may align the registration features on cart 340 with corresponding registration features at test area B to register cart 340 at test area B. Once aligned, actuators such as actuators 352 and 353 (FIG. 7) may drive cart 340 upwards to place cart 340 in a desired location. This may allow computer-controlled loading arms to locate individual devices under test in cart 340 with predictable accuracy.
At step 710, one or more lasers may be used to perform a storage cart status scan. The storage cart status scan may assess which shelves are empty, which shelves contain a device under test, which shelves have a properly oriented device, and which shelves have an improperly oriented device. The status of each shelf may be conveyed locally at each shelf and/or may be conveyed to a computer that controls loading structure 42.
At step 712, one or more loading structures 42 may use one or more robotic arms 358 to pick up devices from cart 340 and to place the devices into test cells at test area B. If desired, the loading structure may pick up devices from cart 340 based on the status information obtained in step 712.
At step 714, devices under test 10 are tested in the test cells at test area B. Any suitable type of test may be performed at test area B. For example, test area B may be used to perform over-the-air testing of wireless communications circuitry 33 (FIG. 3) in devices under test 10.
At step 716, one or more loading structures 42 may use one or more robotic arms 358 to remove devices under test 10 from the test cells. The tested devices may be returned to the storage cart that they were unloaded from originally, or the tested devices may be loaded into a different storage cart.
The foregoing is merely illustrative of the principles of this invention and various modifications can be made by those skilled in the art without departing from the scope and spirit of the invention. The foregoing embodiments may be implemented individually or in any combination.

Claims

What is claimed is:

1. A test system for testing a plurality of devices under test, comprising:

a device under test storage cart configured to store the plurality of devices under test;

a test station for testing the plurality of devices under test; and

a computer-controlled loading structure configured to move a device under test in the plurality of devices under test from the device under test storage cart to the test station.

2. The test system defined in claim 1 wherein the device under test storage cart comprises a plurality of shelves and wherein each shelf in the plurality of shelves is configured to store an associated device under test in the plurality of devices under test.

3. The test system defined in claim 1 wherein the computer-controlled loading structure comprises at least one robotic arm configured to move along three different axes.

4. The test system defined in claim 3 wherein the at least one robotic arm comprises pneumatic structures that are configured to temporarily adhere the device under test to the robotic arm.

5. The test system defined in claim 1, further comprising:

at least one sensor configured to scan and to obtain status information from the device under test storage cart, wherein the computer-controlled loading structure is further configured to unload the device under test storage cart based on the obtained status information.

6. The test system defined in claim 5 wherein the at least one sensor comprises at least one distance sensor.

7. The test system defined in claim 5 wherein the status information comprises information about the orientation of each of the devices under test in the device under test storage cart.

8. The test system defined in claim 1 wherein the computer-controlled loading structure is coupled to a stationary frame structure and is configured to move with respect to the stationary frame structure, wherein the stationary frame structure comprises registration structures, and wherein the device under test storage cart comprises alignment features configured to align and mate with the registration structures.

9. A method of using a test system to test a plurality of devices under test, wherein the test system includes a device under test storage cart, a test enclosure, and a computer-controlled loader coupled to a stationary frame structure, the method comprising:

loading the plurality of devices under test into the device under test storage cart;

engaging the device under test storage cart with the stationary frame structure;

with at least one sensor, obtaining status information about the plurality of devices under test in the device under test storage cart; and

in response to obtaining the status information and while the device under test storage cart is engaged with the stationary frame structure, loading at least some of the plurality of devices under test from the device under test storage cart into the test enclosure with the computer-controlled loader.

10. The method defined in claim 9 wherein engaging the device under test storage cart with the stationary frame structure at the test area comprises aligning alignment features on the device under test storage cart with corresponding registration structures on the stationary frame structure.

11. The method defined in claim 9 wherein the at least one sensor comprises at least one laser and wherein obtaining status information about the devices under test comprises using the at least one laser to determine surface characteristics of the devices under test.

12. The method defined in claim 9 wherein the device under test storage cart comprises a plurality of shelves and wherein obtaining status information about the devices under test comprises using the at least one sensor to determine whether or not a device is present on a shelf in the plurality of shelves.

13. The method defined in claim 9 wherein the device under test storage cart comprise a plurality of shelves and wherein obtaining status information about the devices under test comprises using the at least one sensor to determine whether or not a device is oriented properly on a shelf in the plurality of the shelves.

14. The method defined in claim 9 wherein the computer-controlled loader comprises first and second robotic arms and wherein loading at least some of the devices under test from the device under test storage cart into the test enclosure comprises:

with the first robotic arm, picking up a first device under test in the plurality of devices under test from the device under test storage cart;

with the first robotic arm, placing the first device under test into a test enclosure;

with a second robotic arm, picking up a second device under test in the plurality of devices under test from the device under test storage cart;

while holding the second device under test with the second robotic arm, removing the first device under test from the test enclosure with the first robotic arm; and

while holding the first device under test with the first robotic arm, placing the second device under test into the test enclosure.

15. A method of testing a plurality of devices under test, comprising:

testing the plurality of devices under test using a first set of test stations;

following testing of the plurality of devices under test with the first set of test stations, loading the plurality of devices under test into a device under test storage cart;

moving the device under test storage cart to a new location; and

with at least one computer-controlled robotic arm, loading a device under test in the plurality of devices under test from the device under test storage cart into a test enclosure at the new location.

16. The method defined in claim 15, wherein the test enclosure comprises an electromagnetically shielded test enclosure and wherein loading the device under test into the test enclosure comprises loading the device under test into the electromagnetically shielded test enclosure.

17. The method defined in claim 15 wherein the storage cart comprises a plurality of shelves, the method further comprising:

after moving the device under test storage cart to the new location, using at least one sensor to assign a status to each shelf in the plurality of shelves in the device under test storage cart.

18. The method defined in claim 15, further comprising:

using the at least one computer-controlled robotic arm, unloading the device under test from the test enclosure; and

returning the device under test to the device under test storage cart.

19. The method defined in claim 15, further comprising:

loading the device under test into another device under test storage cart.

20. The method defined in claim 15, further comprising:

in response to loading the device under test from the device under test storage cart into the test enclosure, testing wireless communications circuitry in the device under test.