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Patentes

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Patente citante Fecha de presentación Fecha de emisión Cesionario original Título
US455679430 Ene 19853 Dic 1985Hughes Aircraft CompanySecondary ion collection and transport system for ion microprobe
US476631326 Feb 198723 Ago 1988Nippon Telegraph & Telephone Public CorporationApparatus for quantitative secondary ion mass spectrometry
US48535398 Jun 19871 Ago 1989VG Instruments Group LimitedGlow discharge mass spectrometer
US725937310 Jul 200621 Ago 2007NexGenSemi Holdings CorporationApparatus and method for controlled particle beam manufacturing
US748896020 Ago 200710 Feb 2009NexGen Semi Holding, Inc.Apparatus and method for controlled particle beam manufacturing
US749524220 Ago 200724 Feb 2009NexGen Semi Holding, Inc.Apparatus and method for controlled particle beam manufacturing
US749524420 Ago 200724 Feb 2009NexGen Semi Holding, Inc.Apparatus and method for controlled particle beam manufacturing
US749524520 Ago 200724 Feb 2009NexGen Semi Holding, Inc.Apparatus and method for controlled particle beam manufacturing
US750164420 Ago 200710 Mar 2009NexGen Semi Holding, Inc.Apparatus and method for controlled particle beam manufacturing
US765952620 Ago 20079 Feb 2010NexGen Semi Holding, Inc.Apparatus and method for controlled particle beam manufacturing
US799381321 Nov 20079 Ago 2011NexGen Semi Holding, Inc.Apparatus and method for conformal mask manufacturing

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