US6091796A - Scintillator based microscope - Google Patents
Scintillator based microscope Download PDFInfo
- Publication number
- US6091796A US6091796A US08/736,716 US73671696A US6091796A US 6091796 A US6091796 A US 6091796A US 73671696 A US73671696 A US 73671696A US 6091796 A US6091796 A US 6091796A
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- United States
- Prior art keywords
- crystal
- illumination surface
- scintillation
- ray
- optical
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-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K7/00—Gamma- or X-ray microscopes
Definitions
- Most x-ray imaging devices involve directing a beam of x-rays through an object onto a phosphor screen which converts each x-ray photon into a large number of visible photons.
- the visible photons expose a sheet of photographic film placed close to the phosphor thus forming an image of the attenuation of x-rays passing through the object.
- a major limitation is that the film serves the combined purpose of both the image acquisition function and the image display function.
- the range of contrast or latitude of the film is too limited to display the entire range of contrast in many objects of interest. Because of the limited latitude and dual acquisition/display function of film, a film-screen x-ray is often overexposed in one area and underexposed in another area due to the thickness and composition variations of the object across the image.
- the gray-scale level of x-ray film has a sigmoidal response as a function of exposure which results in difficulties in distinguishing contrast differences at the extremes of the exposure range; that is, in the most radiodense and in the most radiolucent areas of the image.
- Digital x-ray techniques have been proposed as a technology which replaces the phosphor/film detector with a digital image detector, with the prospect of overcoming some of the limitations of film-screens in order to provide higher quality images.
- a potential advantage of digital x-ray technology involves the separation of the image acquisition function from the image display function.
- Digital detectors also provide a much greater range of contrast than film and the contrast response function is linear over the entire range. This would allow a digital detector to more easily distinguish subtle differences in attenuation of x-rays as they pass through various paths of the object. Differences in attenuation due to thickness and composition variations across the object can be subtracted out of the digital data in the computer and the residual contrast can then be optimized for the particular viewing mechanism, be it film or computer monitor. The residual contrast differences can then be analyzed to search for things of interest.
- Other advantages of digital x-ray technology include digital image archival and image transmission to remote location for viewing purposes.
- the present invention provides a scintillation based microscope.
- One surface of a single crystal salt crystal scintillator is supported on an optically transparent support plate.
- the opposite surface, an illumination surface, of the crystal is coated with an optically reflecting material which is transparent to high energy photons (i.e., high energy ultraviolet photons, x-rays and gamma rays) in order to provide a scintillation sandwich having an optical mirror at the illumination surface of the crystal.
- high energy photons i.e., high energy ultraviolet photons, x-rays and gamma rays
- a portion or all of the shadow image is viewed with a magnifying optical element such as the optical elements of a conventional optical microscope to provide a very high resolution image of the target or portions of the target.
- a magnifying optical element such as the optical elements of a conventional optical microscope to provide a very high resolution image of the target or portions of the target.
- an adjustable pin hole unit is described which produces a very small x-ray spot source for providing a high resolution geometric magnification of a shadow image of the target.
- FIG. 1 is a drawing of the preferred embodiment of the present invention.
- FIGS. 2A and 2B are drawings of a portion of an adjustable pin-hole aperture device.
- FIGS. 3A, 3B and 3C are drawings of the adjustable pin-hole aperture device.
- FIGS. 4 and 5 are drawings of a second and third preferred embodiment of the present invention.
- FIG. 5 is a sketch of a third embodiment of the present invention.
- FIGS. 6A and 6B shows the optical configuration of a preferred embodiment.
- FIG. 7 shows how to focus the camera in a preferred embodiment.
- FIGS. 6A through 6D display, in detail, our currently preferred method for fabricating the scintillator assembly 55. It is very important to produce scintillators having a very good optical quality reflecting surface. This is a problem because producing a very flat surface on CsI crystals is difficult.
- the preferred scintillator material is a thallium-doped cesium diode CsI (Ti) crystal which is surfaced on both sides to the thickness dimension desired (in this case about 0.25 cm) using a diamond fly cutting procedure or any other procedure which produces an optical quality surface with less than about 100 angstroms of surface roughness and preferably less than about 40 angstroms.
- an optical quality polycarbonate plate 95 which is about 0.40 cm thick, to the CsI crystal.
- an optical grade adhesive 10 which is index-matched as well as possible to the CsI index of refraction.
- a preferred adhesive is Summers Labs UV74 mixed with 9-vinyl carbazole monomer which is cured with UV light. Its index of refraction when cured is 1.6.
- the polycarbonate plate 95 provides structural rigidity over the entire surface area of the crystal.
- the index of refraction of the polycarbonate plate (1.59) closely matches that of the CsI crystal and the adhesive closely matches both materials. Therefore, we minimize light scatter and other boundary interface artifacts in the final light image.
- a separate 0.1 cm thick sheet of polycarbonate 91 is coated with a thin reflective layer 92, such as aluminum, to provide both very high reflectance of visible light within the crystal and stop any outside light from entering the crystal.
- the reflector coated side of the polycarbonate sheet 91 is then bonded, using the same adhesive 10, to the top of the CsI crystal 94.
- Polycarbonate sheet 91 is then machined at the other side to a thickness of about 0.025 cm in order to minimize the attenuation of x-rays passing through the sheet 91.
- CsI Tin
- other related crystals are typically hygroscopic and therefore require a barrier between their outer surfaces and nearly all environments. We accomplished this sealing through the implementation of optical-quality polycarbonate plastic plates.
- Polycarbonate was chosen because its coefficient of thermal expansion (CTE) in addition to its optical indexes is relatively close to that of CsI.
- CTE coefficient of thermal expansion
- other transparent materials with similar thermal expansion and optical characteristics may also be used.
- the substantially polycarbonate plate 5 which is placed on the optical side of the sandwich is also designed to enhance the structural integrity as well as seal out the moisture.
- the plate is relatively thick ( ⁇ 4 mm) and is anti-reflection coated with coating 98 to minimize Fresnel reflections from its outer surface.
- the index of refraction at the peak scintillation wavelength (of 550 nm) is 1.793.
- the index of refraction for our optical adhesive is 1.6. This gives a Fresnel reflection of about 0.4% at the x-ray illumination surface of the crystal. It is important that this reflection be kept low especially at this junction. The reflection here should preferably be kept less than about 0.5%. For some applications we have learned that the reflection problem can become acute if the Fresnel reflection exceeds about 1%.
- the thickness spaces filled with the fluid is exaggerated. Note, also we have emphasized the flatness of the mirror surface at the bottom of reflective layer 128 and the jaggedness of the upper and lower surfaces of CsI crystal 122 in order to indicate the importance of the index matching fluid in improving the optical performance of the sandwich. As indicated in FIG. 8B we focus our camera on the reflective surface which provides a very precise image of all scintillations in Crystal 122 including the light reflected off the mirror. Because of the close match of the fluid and the crystal, there are virtually zero reflections from the rough surface of the CsI crystal.
- Each x-ray photon typically generates one scintillator spot as it is absorbed in the CsI (Ti) crystal.
- the most likely absorption location is at the point of x-ray entrance into the crystal, just down stream of aluminum mirror 92. However, many x-ray photons are absorbed at greater depths into the crystal.
- Spot locations within CsI crystal 95 are depicted at 30 and 31 in FIG. 7 as representing scintillations from x-ray absorptions. Each of these produce real images.
- Mirror 2 produces virtual images of these spots as represented at 32 and 33 in FIG. 7.
- Our optical system focal plane is at the mirror--CsI crystal interface as shown at 12 on FIG.
- FIGS. 2A, 2B, 3A, 3B and 3C describe an adjustable pin hole assembly 30 comprised of two crack plates.
- FIGS. 2A and 2B are two views of one of the crack plates.
- the crack plate consists of a first plate 24 which is a generally rectangular plate 21/2 inches long, 1 inch wide and 1/4 inch thick.
- a crack edge of first plate 24 is partially tapered as shown in FIG. 2B.
- the bottom 1/16 inch of the crack edge defines a plane perpendicular to the front and back faces of plate 30 and the upper part of the edge is cut at an angle of about 20° with the perpendicular plane.
- a second plate 23 is generally the same shape as the first plate except it is provided with a slight taper of about 5° for over the first 3/8 inches of its crack edge as shown at 38 in FIG. 2A.
- the perpendicular portions of the crack edges of both plates are polished to a surface smoothness of about 50 ⁇ .
- Two holes of 5/32" diameter are drilled through the first and second plates as shown in FIGS. 2A and 2B and 1/8 inch bolts are inserted to hold the plates together.
- a shim 40 which is 30 ⁇ m thick is inserted as shown in FIG. 2A and the bolts are tightened to produce a triangular crack which is about zero ⁇ m wide at 42 and 30 ⁇ m wide at 44.
- the objective preferably is achromatized due to the broadband spectrum of the CsI (Ti) scintillation and well-corrected over the entire field-of-view to retain the inherently high resolution of the crystal.
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Measurement Of Radiation (AREA)
Abstract
Description
______________________________________ Polycarbonate Top Layer 0.25 mm Aluminizing Reflector Layer 0.01 mm Optical Adhesive 0.05 mm CsI Crystal 1.50 mm Optical Adhesive 0.05 mm Polycarbonate Bottom Layer 4.00 mm Anti-Reflectant Coating 0.01 mm ______________________________________
Claims (21)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/736,716 US6091796A (en) | 1994-11-23 | 1996-10-28 | Scintillator based microscope |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US34414194A | 1994-11-23 | 1994-11-23 | |
US08/622,035 US5687096A (en) | 1996-03-21 | 1996-03-21 | Method and apparatus for monitoring video signals in a computer |
US08/736,716 US6091796A (en) | 1994-11-23 | 1996-10-28 | Scintillator based microscope |
Related Parent Applications (1)
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US08/622,035 Continuation-In-Part US5687096A (en) | 1994-11-23 | 1996-03-21 | Method and apparatus for monitoring video signals in a computer |
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US6091796A true US6091796A (en) | 2000-07-18 |
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US08/736,716 Expired - Fee Related US6091796A (en) | 1994-11-23 | 1996-10-28 | Scintillator based microscope |
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Cited By (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6403962B1 (en) * | 1997-06-24 | 2002-06-11 | Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. | Fibre optic X-ray camera |
US6614872B2 (en) * | 2001-01-26 | 2003-09-02 | General Electric Company | Method and apparatus for localized digital radiographic inspection |
US20040021082A1 (en) * | 2002-02-01 | 2004-02-05 | Board Of Regents, The University Of Texas System | Asymmetrically placed cross-coupled scintillation crystals |
US20050098737A1 (en) * | 1999-01-07 | 2005-05-12 | Florent Cipriani | Devices and methods for detecting the position of a beam |
US20050220266A1 (en) * | 2004-03-31 | 2005-10-06 | Gregory Hirsch | Methods for achieving high resolution microfluoroscopy |
US20050226376A1 (en) * | 2004-04-09 | 2005-10-13 | Xradia, Inc. | Dual-band detector system for x-ray imaging of biological samples |
US6956214B2 (en) | 2002-02-01 | 2005-10-18 | Board Of Regnets, The University Of Texas System | Production method for making position-sensitive radiation detector arrays |
US20050281372A1 (en) * | 1999-09-14 | 2005-12-22 | Peter Choi | Radiology device comprising improved image enlarging means |
WO2006113933A2 (en) * | 2005-04-20 | 2006-10-26 | Trissel Richard G | Scintillator-based micro-radiographic imaging device |
US20070191701A1 (en) * | 2004-02-09 | 2007-08-16 | Abbott Diabetes Care, Inc. | Analyte Sensor, and Associated System and Method Employing a Catalytic Agent |
US20070246655A1 (en) * | 2006-04-20 | 2007-10-25 | Trissel Richard G | Scintillator-based micro-radiographic imaging device |
US7412024B1 (en) | 2004-04-09 | 2008-08-12 | Xradia, Inc. | X-ray mammography |
US20090072150A1 (en) * | 2006-04-20 | 2009-03-19 | Trissel Richard G | Scintillator-based micro-radiographic imaging device |
US20090178061A1 (en) * | 2008-01-09 | 2009-07-09 | Andrew L Sandoval | Methods and systems for filtering encrypted traffic |
WO2009118130A1 (en) * | 2008-03-27 | 2009-10-01 | Carl Zeiss Sms Gmbh | Microscope and microscopy method for examining a reflecting object |
CN101614868B (en) * | 2008-06-24 | 2012-05-30 | 鸿富锦精密工业(深圳)有限公司 | Adhesive-dispensing assistant microscope |
TWI417569B (en) * | 2008-07-04 | 2013-12-01 | Hon Hai Prec Ind Co Ltd | Microscope assisting depositing glue |
WO2014039644A1 (en) * | 2012-09-05 | 2014-03-13 | Svxr Llc | High speed x-ray inspection microscope |
US10809393B2 (en) * | 2015-04-23 | 2020-10-20 | Fermi Research Alliance, Llc | Monocrystal-based microchannel plate image intensifier |
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Cited By (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6403962B1 (en) * | 1997-06-24 | 2002-06-11 | Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. | Fibre optic X-ray camera |
US20050098737A1 (en) * | 1999-01-07 | 2005-05-12 | Florent Cipriani | Devices and methods for detecting the position of a beam |
US6927399B2 (en) * | 1999-01-07 | 2005-08-09 | Europaisches Laboratorium Fur Molekularbiologie (Embl) | Devices and methods for detecting the position of a beam |
US7508914B2 (en) | 1999-09-14 | 2009-03-24 | Nano Uv | Radiology device |
US20050281372A1 (en) * | 1999-09-14 | 2005-12-22 | Peter Choi | Radiology device comprising improved image enlarging means |
US20060193431A1 (en) * | 1999-09-14 | 2006-08-31 | Eppra | Radiology device |
US6614872B2 (en) * | 2001-01-26 | 2003-09-02 | General Electric Company | Method and apparatus for localized digital radiographic inspection |
US7238943B2 (en) | 2002-02-01 | 2007-07-03 | Board Of Regents, The University Of Texas System | Asymmetrically placed cross-coupled scintillation crystals |
US20040021082A1 (en) * | 2002-02-01 | 2004-02-05 | Board Of Regents, The University Of Texas System | Asymmetrically placed cross-coupled scintillation crystals |
US6956214B2 (en) | 2002-02-01 | 2005-10-18 | Board Of Regnets, The University Of Texas System | Production method for making position-sensitive radiation detector arrays |
US20070191701A1 (en) * | 2004-02-09 | 2007-08-16 | Abbott Diabetes Care, Inc. | Analyte Sensor, and Associated System and Method Employing a Catalytic Agent |
US20050220266A1 (en) * | 2004-03-31 | 2005-10-06 | Gregory Hirsch | Methods for achieving high resolution microfluoroscopy |
US7286640B2 (en) | 2004-04-09 | 2007-10-23 | Xradia, Inc. | Dual-band detector system for x-ray imaging of biological samples |
US7412024B1 (en) | 2004-04-09 | 2008-08-12 | Xradia, Inc. | X-ray mammography |
US20050226376A1 (en) * | 2004-04-09 | 2005-10-13 | Xradia, Inc. | Dual-band detector system for x-ray imaging of biological samples |
WO2006113933A2 (en) * | 2005-04-20 | 2006-10-26 | Trissel Richard G | Scintillator-based micro-radiographic imaging device |
WO2006113933A3 (en) * | 2005-04-20 | 2007-06-21 | Richard G Trissel | Scintillator-based micro-radiographic imaging device |
US20070246655A1 (en) * | 2006-04-20 | 2007-10-25 | Trissel Richard G | Scintillator-based micro-radiographic imaging device |
US7414245B2 (en) * | 2006-04-20 | 2008-08-19 | Trissel Richard G | Scintillator-based micro-radiographic imaging device |
US20090072150A1 (en) * | 2006-04-20 | 2009-03-19 | Trissel Richard G | Scintillator-based micro-radiographic imaging device |
US9304832B2 (en) * | 2008-01-09 | 2016-04-05 | Blue Coat Systems, Inc. | Methods and systems for filtering encrypted traffic |
US20090178061A1 (en) * | 2008-01-09 | 2009-07-09 | Andrew L Sandoval | Methods and systems for filtering encrypted traffic |
WO2009118130A1 (en) * | 2008-03-27 | 2009-10-01 | Carl Zeiss Sms Gmbh | Microscope and microscopy method for examining a reflecting object |
CN101614868B (en) * | 2008-06-24 | 2012-05-30 | 鸿富锦精密工业(深圳)有限公司 | Adhesive-dispensing assistant microscope |
TWI417569B (en) * | 2008-07-04 | 2013-12-01 | Hon Hai Prec Ind Co Ltd | Microscope assisting depositing glue |
WO2010009313A1 (en) * | 2008-07-16 | 2010-01-21 | Trissel Richard G | Scintillator-based micro-radiographic imaging device |
WO2014039644A1 (en) * | 2012-09-05 | 2014-03-13 | Svxr Llc | High speed x-ray inspection microscope |
US9129715B2 (en) | 2012-09-05 | 2015-09-08 | SVXR, Inc. | High speed x-ray inspection microscope |
US9607724B2 (en) | 2012-09-05 | 2017-03-28 | SVXR, Inc. | Devices processed using x-rays |
US9646732B2 (en) | 2012-09-05 | 2017-05-09 | SVXR, Inc. | High speed X-ray microscope |
US10809393B2 (en) * | 2015-04-23 | 2020-10-20 | Fermi Research Alliance, Llc | Monocrystal-based microchannel plate image intensifier |
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