WO1997003220A1 - Permanent magnet array apparatus and method - Google Patents

Permanent magnet array apparatus and method Download PDF

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Publication number
WO1997003220A1
WO1997003220A1 PCT/US1996/011564 US9611564W WO9703220A1 WO 1997003220 A1 WO1997003220 A1 WO 1997003220A1 US 9611564 W US9611564 W US 9611564W WO 9703220 A1 WO9703220 A1 WO 9703220A1
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WO
WIPO (PCT)
Prior art keywords
magnet
target
magnetized portion
pole plate
proximate
Prior art date
Application number
PCT/US1996/011564
Other languages
French (fr)
Inventor
Dorian Heimanson
Mehrdad M. Moslehi
Paul E. Spronz
Thomas R. Omstead
Original Assignee
Cvc Products, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cvc Products, Inc. filed Critical Cvc Products, Inc.
Priority to GB9800382A priority Critical patent/GB2319262B/en
Priority to JP9505986A priority patent/JPH11509273A/en
Publication of WO1997003220A1 publication Critical patent/WO1997003220A1/en

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3414Targets
    • H01J37/3426Material
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/35Sputtering by application of a magnetic field, e.g. magnetron sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405Magnetron sputtering
    • H01J37/3408Planar magnetron sputtering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/345Magnet arrangements in particular for cathodic sputtering apparatus
    • H01J37/3455Movable magnets

Definitions

  • This invention relates in general to the field of magnetron sputtering systems, and more particularly to a high magnetic flux permanent magnet array apparatus and method for high productivity physical vapor deposition.
  • the deposition of soft magnetic, high moment, magnetic materials at high rates is important to manufacturers of data storage devices. Materials must be deposited at high rates in order for cluster tools to be cost-effective and competitive in terms of throughput. Deposited films should be very smooth and uniform. An additional requirement is that materials should be deposited at relatively low temperatures (less than 150°C) in order to avoid high tensile stress and to avoid degradation of the photoresist which is often present in the thin film head structure. High substrate temperature may also result in a transition from an amorphous to a crystalline film which may cause undesired magnetic anisotropy.
  • a magnetron sputtering system has the advantages of higher deposition rates and lower substrate temperature when compared to diode to deposition systems.
  • the target can prevent the magnetic field from penetrating especially where the target is a magnetic material.
  • Some conventional systems attempt to alleviate this problem by breaking the target to allow penetration of the magnetic field.
  • the gaps provide a challenge to deposition uniformity and cause difficulty in dealing with multiple target pieces.
  • Another method of dealing with the magnetic field penetration problem is to make the target very thin. This, however, can produce a problem with poor utilization of the target.
  • Another method is to use a diode deposition system with no magnetron. However, such systems have slow deposition rates because there is no enhancement.
  • a conventional ferromagnetic high speed sputter apparatus such as suggested in U.S. Patent No.
  • 4,412,907 has used a target of ferromagnetic substance comprised at least of two separate segments of ferromagnetic substance which are spaced apart, one from another, by a small gap. As mentioned above, this is done so that a magnetic field from a magnetic field generating means positioned behind the target is leaked out to the surface of the target.
  • This type of conventional apparatus having a multiple pieced target is expensive to make and requires development with questionable results.
  • the segment pattern for a round target is unknown.
  • U.S. Patent No. 4,299,678 suggests a magnetron sputtering apparatus with a magnetic target material in which the saturation magnetization of the target material is substantially reduced temporarily. This is done such as by heating the target material to its Curie point, and sputtering the magnetic material while in such a state of reduced magnetization.
  • This type of conventional apparatus is unreliable and thickness uniformity of the deposition is unpredictable.
  • U.S. Patent No. 5,248,402 describes a sputtering system magnetron formed of an array of permanent magnets rotatable in proximity to a plane of a target disposed in a vacuum chamber where the magnet array has an apple shaped cross section.
  • the magnetic path established between oppositely polled pairs of magnets is interned in a stem region proximate the axis of rotation for the array and has a pair of opposed lobes extending outward from the stem region in a generally semi-circular form.
  • the shape of the gap produces a depth of sputter profile in the target that results in uniform coating, step coverage and step coverage uniformity. This is especially true when such a magnetron sputtering system is used for the sputtering of non-magnetic materials to produce non-magnetic films. The same cannot be said of its use in formation of magnetic films.
  • the target acts as a shunt to the magnetic field lines emanating from the magnetron magnet array.
  • the field lines which penetrate a non-magnetic target and serve to deunify the plasma near the target surface are, in effect, short circuited through a magnetic target material and are thereby prevented from entering the region of the plasma.
  • a high magnetic flux permanent magnet array apparatus and method for high productivity physical vapor deposition is provided that substantially eliminates or reduces disadvantages and problems associated with previously developed magnetron sputtering systems.
  • a magnetron sputtering system includes a high magnetic flux magnetron assembly moveably coupled to rotate about an axis.
  • the assembly comprises an array of permanent magnet assemblies.
  • Each permanent magnet assembly comprises a first portion magnetized perpendicularly to the target, a second portion magnetized perpendicularly to the target and opposite the first portion, and a third portion positioned intermediate the first and the second portion, the third portion magnetized parallel to the target.
  • a technical advantage of the present invention is the provision of a ferromagnetic high speed sputtering apparatus that operates with a ferromagnetic target.
  • Another technical advantage of the present invention is the provision of an apparatus that uses an enhanced magnetic field of intensity more than the magnetic saturation value of a ferromagnetic target.
  • a further technical advantage of the present invention is the use of a magnetron formed of an array of permanent magnets arranged in dipole mode where the design uses a third magnet portion acting as a pole piece bridge between magnetic polar pairs.
  • a further technical advantage is that the present invention has an increased magnetic field source capable of penetrating magnetic materials to allow the deposition onto a high permeability magnetic target in a magnetron sputtering system without the requirements of using either a thin target or a gapped target.
  • FIGURE 1 is a schematic view of a magnetron sputtering system constructed according to the teachings of the present invention
  • FIGURE 2 is a top view of a permanent magnet array configuration constructed according to the teachings of the present invention
  • FIGURE 3 is a cross-section view of the permanent magnet array of FIGURE 2;
  • FIGURES 4A and 4B are a front view and a cross- section view of a magnet assembly of the permanent magnet array of FIGURE 2;
  • FIGURES 5A and 5B illustrate magnetic field lines for a conventional magnet assembly for a non-magnetic and a magnetic target, respectively;
  • FIGURE 6 illustrates magnetic field lines with respect to a magnetic target for a magnet assembly constructed according to the teachings of the present invention
  • FIGURE 7 illustrates a simulation of flux penetration through a magnetic target for a magnet assembly constructed according to the teachings of the present invention.
  • FIGURE 1 is a schematic view of a magnetron sputtering system, indicated generally at 10, constructed according to the teachings of the present invention.
  • the sputtering process occurs in a vacuum chamber containing a target of material to be sputtered onto a substrate which receives a coating of film of material deposited from the target.
  • the substrate is often a wafer in which microelectronic components are fabricated, but the substrate can also be an optical element or other structure with a surface to be coated.
  • One magnetron sputtering system having a similar magnet array shape is disclosed and described in U.S. Patent No. 5,248,402, the disclosure of which is incorporated herein by reference.
  • magnetron sputtering system 10 comprises a magnet array 12 of permanent magnets rotatable about a rotational axis 14. Magnet array 12 is located proximate to and parallel with a target 16. A substrate 18 is positioned inside a vacuum chamber 20 along with target 16.
  • FIGURES 2, 3, 4A, and 4B One embodiment of the structure of magnet array 12 is shown and described in more detail with respect to FIGURES 2, 3, 4A, and 4B.
  • magnetron sputtering system 10 sputters material from target 16 onto substrate 18 to form a film of the target material on substrate 18.
  • the rotation of magnet array 12 provides a magnetron enhancement of the sputtering process.
  • FIGURE 2 is a top view of a configuration of permanent magnet array 12 of FIGURE 1 constructed according to the teachings of the present invention.
  • the generally apple-shaped configuration of magnet array 12 is disclosed and described in U.S. Patent No. 5,248,402.
  • the configuration of FIGURE 2 includes a magnet, which can be trapeze-shaped, positioned between each pair of magnets shown in U.S. Patent No. 5,248,402.
  • the present invention includes magnet arrays 12 with configurations other than those generally apple-shaped, such as a heart- shaped magnet array.
  • Magnet array 12 comprises a plurality of permanent magnet assemblies 22 oriented as shown.
  • Magnet array 12 includes a pole plate 24 on which an outer magnet retainer 26 and inner magnet retainer 28 are mounted. Pole plate 24, outer magnet retainer 26, and inner magnet retainer 28 cooperate to hold each magnet assembly 22 in place.
  • Fastening devices 30 are used to couple inner magnet plate 28 and outer magnet plate 26 to pole plate 24 as shown. Each fastening devices 30 can comprise a screw or other suitable fastening means.
  • Each magnet assembly 22 is coupled to pole plate 24 using a fastening device 32.
  • Each fastening device 32 also can comprise a screw or other suitable fastening means.
  • Magnet array 12 is operable in magnetron sputtering system 10 to provide an apple-shaped magnetic path extending between polar pairs of permanent magnets with perpendicularly oriented magnets placed between each pair of polar magnets. By so positioning the perpendicularly magnetized magnets, the magnetic flux is forced to penetrate through target 16 even when target 16 is a magnetic material. Magnet array 12 using magnet assemblies 22 provides improved magnetron enhancement of sputtering from target 16.
  • FIGURE 3 is a cross-section view of magnet array 12 of FIGURE 2. As shown in FIGURE 3, outer magnet retainer 26 and inner magnet retainer 28 are coupled to pole plate 24.
  • Outer magnet retainer 26 is coupled to pole plate 24 using fastening device 30.
  • fastening device 30 comprises a screw.
  • Magnet assemblies 22 are also coupled to pole plate 24, as shown.
  • a fastening device 32 is used to couple magnet assemblies to pole plate 24. This structure allows the precision placement of magnet assemblies 22.
  • FIGURES 4A and 4B are front and cross-section views of a magnet assembly 22 constructed according to the teachings of the present invention.
  • magnet assembly 22 comprises a first portion 36, a second portion 38, and a third portion 40.
  • Magnet assembly 22 is held together as a unit by housing 42, as shown.
  • the length 42 of magnet assembly 22 is approximately 2.4 inches
  • the width 44 of housing 42 is approximately .063 inches.
  • Each of first portion 36, second portion 38, and third portion 40 can comprise a separate structure, with all three structures contained within housing 42.
  • first portion 36 comprises a magnet oriented such that the magnetic poles are perpendicular to pole plate 24 and thus target 16.
  • Second portion 38 is also oriented such that the magnetic poles are perpendicular to pole plate 24 and target 16.
  • the north pole of first portion 36 is distal pole plate 24, and the south pole of first portion 36 is proximate pole plate 24 as shown in FIGURE 4B.
  • the south pole of second portion 38 is distal pole plate 24, and the north pole of second portion 38 is proximate pole plate 24. This arrangement results in the second portion 38 having magnetic poles parallel to, but opposite in polarity to, first portion 36.
  • Third portion 40 is oriented such that the magnetic poles are parallel to pole plate 24 and target 16. This results in third portion 40 having magnetization fields substantially orthogonal to the directions of magnetization first portion 36 and second portion 38. As shown, third portion 40 is located between the first portion 36 and second portion 38. Third portion 40 is oriented such that the north pole of third portion 40 is proximate first portion 36, and the south pole of third portion is proximate second portion 38. As shown in FIGURES 4A and 4B, third portion 40 has a generally trapezoidal shape with the shorter length of the trapezoid proximate the first portion 36. It should be understood that the third portion 40 could have a rectangular or square shape.
  • third portion 40 could be arranged such that the shorter length of the trapezoid was proximate to second portion 38.
  • Third portion 40 operates to strengthen and enhance the magnetic field generated by first portion 36 and second portion 38 according to the teachings of the present invention. As shown in FIGURE 4B, first portion 36 and second portion 38 are oriented perpendicular to pole plate 24 and target 16. Third portion 40 is oriented parallel to pole plate 24 and target 16. In this embodiment, a width 46 of housing 42 is approximately .9 inches, and a width 48 of each magnet portion is approximately 1 inch.
  • Each of the plurality of magnet assemblies 22 is positioned in the apple core arrangement of magnet array 12. As shown in FIGURE 2, the first portion 36 of each magnet assembly 22 is located along the outer edge of magnet array 12. Magnet assemblies 22 at the stem region are constructed differently than that shown in FIGURES 4A and 4B, however, the magnetic pole orientation of the magnet portions are the same. It should be understood that the teachings of the present invention benefit other magnet array configurations as well as the embodiments shown and described herein. The present invention can be incorporated into present PVD systems without modifying the plasma side of the PVD systems.
  • a technical advantage of the magnet assembly for use in a magnet array according to the teachings of the present invention is an increased productivity and throughput rate for the magnetron sputtering system.
  • the present invention provides a magnet assembly with a stronger magnetic field to allow the use of thicker targets and to increase the deposition rate.
  • the magnet assembly improves the sputtering of magnetic target materials which comprise materials having high permeability.
  • the magnet assembly of the present invention provides a strong magnetic field to penetrate the magnetic target.
  • a further technical advantage of the present invention is the provision of magnetic flux at the target which allows magnetron sputtering of magnetic targets with increased deposition rate.
  • the benefits of the present invention are applicable to any magnetron array used in a sputtering system with a magnetic target.
  • FIGURES 5A and 5B illustrate magnetic field lines from a magnet assembly that does not include an intermediate portion oriented parallel to the target and pole plate.
  • a non-magnetic target 50 is oriented parallel to a pole plate 52 holding a magnet assembly, indicated generally at 54.
  • Magnet assembly 54 does not include a parallel oriented magnetic portion according to the teachings of the present invention.
  • Magnetic field lines 56 illustrate the magnetic field produced by magnet assembly 54. As shown, a point just beyond the surface of target 50 experiences a magnetic field strength of greater than 500 gauss.
  • FIGURE 5B illustrates magnetic field lines 58 generated by magnet assembly 54 with respect to a magnetic target 60.
  • magnetic target 60 acts to shunt magnetic field lines 58 such that the field produced by magnet assembly 54 is substantially attenuated past magnetic target 60.
  • a point near the surface of a magnetic target 60 experiences a magnetic field of only approximately 26 gauss.
  • the magnet assembly 54 of FIGURES 5A and 5B is similar to the magnet pairs disclosed and described in U.S. Patent No. 5,248,402.
  • FIGURE 6 illustrates magnetic field lines for a magnetic field generated by a magnet assembly 22 constructed according to the teachings of the present invention.
  • FIGURE 6 shows simulated field lines 68 produced by magnet assembly 62 coupled to pole plate 64.
  • Magnet assembly 62 is constructed according to the teachings of the present invention with two perpendicularly oriented magnet portions and one parallel oriented magnet portion, as shown.
  • a magnetic target 66 is oriented parallel to pole plate 64 and experiences magnetic fields as shown by the 100 gauss gradient isolines from 0 to 1200 gauss.
  • Field lines 68 show that the magnetic field strength is 100 gauss and 200 gauss at the locations shown. Comparison of FIGURE 6 with FIGURE 5B shows that magnet assembly 62 constructed according to the teachings of the present invention provides enhanced magnet field penetration through target 66.
  • FIGURE 6 The simulation of FIGURE 6 is generated for magnet flux penetration through a 0.25 inch thick ferromagnetic target with a 0.75 inch trapeze shaped magnet portion inserted between the two perpendicular oriented magnets . As shown, the magnetic flux is at least greater than 200 gauss at the target surface.
  • FIGURE 7 illustrates a computer simulation of flux penetration through a 0.25 inch thick ferromagnetic target with a 0.75 inch trapeze shaped magnet inserted as described in FIGURE 6. The magnetic flux 0.06 inches from the face of the target is 560 gauss, as shown. The data illustrated in FIGURE 7 is based on magnetic flux measurements taken from magnets installed on a magnet array backing plate or flux return plate.
  • the magnetic field is graphed on the Y axis and the distance is graphed on the X axis.

Abstract

A magnetron sputtering system (10) is disclosed that includes a high magnetic flux magnetron assembly (12) moveably coupled to rotate about an axis (14). The assembly comprises an array of permanent magnet assemblies (12). Each permanent magnet assembly (12) comprises a first portion magnetized substantially perpendicular to the target (16), a second portion magnetized substantially perpendicular to the target (16) and opposite the first portion, and a third portion inverted between the first and the second portions, the third portion magnetized substantially parallel to the target (16).

Description

PERMANENT MAGNET ARRAY APPARATUS AND METHOD
TECHNICAL FIELD OF THE INVENTION
This invention relates in general to the field of magnetron sputtering systems, and more particularly to a high magnetic flux permanent magnet array apparatus and method for high productivity physical vapor deposition.
BACKGROUND OF THE INVENTION
The deposition of soft magnetic, high moment, magnetic materials at high rates is important to manufacturers of data storage devices. Materials must be deposited at high rates in order for cluster tools to be cost-effective and competitive in terms of throughput. Deposited films should be very smooth and uniform. An additional requirement is that materials should be deposited at relatively low temperatures (less than 150°C) in order to avoid high tensile stress and to avoid degradation of the photoresist which is often present in the thin film head structure. High substrate temperature may also result in a transition from an amorphous to a crystalline film which may cause undesired magnetic anisotropy. A magnetron sputtering system has the advantages of higher deposition rates and lower substrate temperature when compared to diode to deposition systems. In some cases it can be difficult to use a magnetron sputtering system. The target can prevent the magnetic field from penetrating especially where the target is a magnetic material. Some conventional systems attempt to alleviate this problem by breaking the target to allow penetration of the magnetic field. However, the gaps provide a challenge to deposition uniformity and cause difficulty in dealing with multiple target pieces. Another method of dealing with the magnetic field penetration problem is to make the target very thin. This, however, can produce a problem with poor utilization of the target. Another method is to use a diode deposition system with no magnetron. However, such systems have slow deposition rates because there is no enhancement. A conventional ferromagnetic high speed sputter apparatus, such as suggested in U.S. Patent No. 4,412,907, has used a target of ferromagnetic substance comprised at least of two separate segments of ferromagnetic substance which are spaced apart, one from another, by a small gap. As mentioned above, this is done so that a magnetic field from a magnetic field generating means positioned behind the target is leaked out to the surface of the target. This type of conventional apparatus having a multiple pieced target is expensive to make and requires development with questionable results. In addition, the segment pattern for a round target is unknown.
U.S. Patent No. 4,299,678 suggests a magnetron sputtering apparatus with a magnetic target material in which the saturation magnetization of the target material is substantially reduced temporarily. This is done such as by heating the target material to its Curie point, and sputtering the magnetic material while in such a state of reduced magnetization. This type of conventional apparatus is unreliable and thickness uniformity of the deposition is unpredictable.
U.S. Patent No. 5,248,402 describes a sputtering system magnetron formed of an array of permanent magnets rotatable in proximity to a plane of a target disposed in a vacuum chamber where the magnet array has an apple shaped cross section. In this system, the magnetic path established between oppositely polled pairs of magnets is interned in a stem region proximate the axis of rotation for the array and has a pair of opposed lobes extending outward from the stem region in a generally semi-circular form. The shape of the gap produces a depth of sputter profile in the target that results in uniform coating, step coverage and step coverage uniformity. This is especially true when such a magnetron sputtering system is used for the sputtering of non-magnetic materials to produce non-magnetic films. The same cannot be said of its use in formation of magnetic films.
In magnetron sputtering of material from a magnetic target, the target acts as a shunt to the magnetic field lines emanating from the magnetron magnet array. Thus, the field lines which penetrate a non-magnetic target and serve to deunify the plasma near the target surface are, in effect, short circuited through a magnetic target material and are thereby prevented from entering the region of the plasma.
SUMMARY OF THE INVENTION
In accordance with the present invention, a high magnetic flux permanent magnet array apparatus and method for high productivity physical vapor deposition is provided that substantially eliminates or reduces disadvantages and problems associated with previously developed magnetron sputtering systems.
According to one embodiment of the present invention, a magnetron sputtering system is provided. The magnetron sputtering system includes a high magnetic flux magnetron assembly moveably coupled to rotate about an axis. The assembly comprises an array of permanent magnet assemblies. Each permanent magnet assembly comprises a first portion magnetized perpendicularly to the target, a second portion magnetized perpendicularly to the target and opposite the first portion, and a third portion positioned intermediate the first and the second portion, the third portion magnetized parallel to the target. A technical advantage of the present invention is the provision of a ferromagnetic high speed sputtering apparatus that operates with a ferromagnetic target.
Another technical advantage of the present invention is the provision of an apparatus that uses an enhanced magnetic field of intensity more than the magnetic saturation value of a ferromagnetic target.
A further technical advantage of the present invention is the use of a magnetron formed of an array of permanent magnets arranged in dipole mode where the design uses a third magnet portion acting as a pole piece bridge between magnetic polar pairs.
A further technical advantage is that the present invention has an increased magnetic field source capable of penetrating magnetic materials to allow the deposition onto a high permeability magnetic target in a magnetron sputtering system without the requirements of using either a thin target or a gapped target.
BRIEF DESCRIPTION OF THE DRAWINGS
A more complete understanding of the present invention and advantages thereof may be acquired by reference to the following description taken in conjunction with the accompanying drawings in which like reference numbers indicate like features and wherein:
FIGURE 1 is a schematic view of a magnetron sputtering system constructed according to the teachings of the present invention; FIGURE 2 is a top view of a permanent magnet array configuration constructed according to the teachings of the present invention;
FIGURE 3 is a cross-section view of the permanent magnet array of FIGURE 2; FIGURES 4A and 4B are a front view and a cross- section view of a magnet assembly of the permanent magnet array of FIGURE 2;
FIGURES 5A and 5B illustrate magnetic field lines for a conventional magnet assembly for a non-magnetic and a magnetic target, respectively;
FIGURE 6 illustrates magnetic field lines with respect to a magnetic target for a magnet assembly constructed according to the teachings of the present invention; and FIGURE 7 illustrates a simulation of flux penetration through a magnetic target for a magnet assembly constructed according to the teachings of the present invention. DETAILED DESCRIPTION OF THE INVENTION
FIGURE 1 is a schematic view of a magnetron sputtering system, indicated generally at 10, constructed according to the teachings of the present invention. In general, the sputtering process occurs in a vacuum chamber containing a target of material to be sputtered onto a substrate which receives a coating of film of material deposited from the target. The substrate is often a wafer in which microelectronic components are fabricated, but the substrate can also be an optical element or other structure with a surface to be coated. One magnetron sputtering system having a similar magnet array shape is disclosed and described in U.S. Patent No. 5,248,402, the disclosure of which is incorporated herein by reference.
As shown in FIGURE 1, magnetron sputtering system 10 comprises a magnet array 12 of permanent magnets rotatable about a rotational axis 14. Magnet array 12 is located proximate to and parallel with a target 16. A substrate 18 is positioned inside a vacuum chamber 20 along with target 16. One embodiment of the structure of magnet array 12 is shown and described in more detail with respect to FIGURES 2, 3, 4A, and 4B.
In operation, magnetron sputtering system 10 sputters material from target 16 onto substrate 18 to form a film of the target material on substrate 18. The rotation of magnet array 12 provides a magnetron enhancement of the sputtering process.
FIGURE 2 is a top view of a configuration of permanent magnet array 12 of FIGURE 1 constructed according to the teachings of the present invention. The generally apple-shaped configuration of magnet array 12 is disclosed and described in U.S. Patent No. 5,248,402. However, according to the teachings of the present invention, the configuration of FIGURE 2, includes a magnet, which can be trapeze-shaped, positioned between each pair of magnets shown in U.S. Patent No. 5,248,402. It should be further understood that the present invention includes magnet arrays 12 with configurations other than those generally apple-shaped, such as a heart- shaped magnet array.
Magnet array 12 comprises a plurality of permanent magnet assemblies 22 oriented as shown. Magnet array 12 includes a pole plate 24 on which an outer magnet retainer 26 and inner magnet retainer 28 are mounted. Pole plate 24, outer magnet retainer 26, and inner magnet retainer 28 cooperate to hold each magnet assembly 22 in place. Fastening devices 30 are used to couple inner magnet plate 28 and outer magnet plate 26 to pole plate 24 as shown. Each fastening devices 30 can comprise a screw or other suitable fastening means. Each magnet assembly 22 is coupled to pole plate 24 using a fastening device 32. Each fastening device 32 also can comprise a screw or other suitable fastening means.
Magnet array 12 is operable in magnetron sputtering system 10 to provide an apple-shaped magnetic path extending between polar pairs of permanent magnets with perpendicularly oriented magnets placed between each pair of polar magnets. By so positioning the perpendicularly magnetized magnets, the magnetic flux is forced to penetrate through target 16 even when target 16 is a magnetic material. Magnet array 12 using magnet assemblies 22 provides improved magnetron enhancement of sputtering from target 16. One embodiment of the structure of magnet assembly 22 is shown and described in more detail with respect to FIGURES 4A and 4B. FIGURE 3 is a cross-section view of magnet array 12 of FIGURE 2. As shown in FIGURE 3, outer magnet retainer 26 and inner magnet retainer 28 are coupled to pole plate 24. Outer magnet retainer 26 is coupled to pole plate 24 using fastening device 30. In the illustrated embodiment, fastening device 30 comprises a screw. Magnet assemblies 22 are also coupled to pole plate 24, as shown. A fastening device 32 is used to couple magnet assemblies to pole plate 24. This structure allows the precision placement of magnet assemblies 22.
FIGURES 4A and 4B are front and cross-section views of a magnet assembly 22 constructed according to the teachings of the present invention. As shown in FIGURE 4A, magnet assembly 22 comprises a first portion 36, a second portion 38, and a third portion 40. Magnet assembly 22 is held together as a unit by housing 42, as shown. In one embodiment of the present invention, the length 42 of magnet assembly 22 is approximately 2.4 inches, and the width 44 of housing 42 is approximately .063 inches. Each of first portion 36, second portion 38, and third portion 40 can comprise a separate structure, with all three structures contained within housing 42.
As shown in FIGURES 4A and 4B, first portion 36 comprises a magnet oriented such that the magnetic poles are perpendicular to pole plate 24 and thus target 16. Second portion 38 is also oriented such that the magnetic poles are perpendicular to pole plate 24 and target 16. The north pole of first portion 36 is distal pole plate 24, and the south pole of first portion 36 is proximate pole plate 24 as shown in FIGURE 4B. Oppositely, the south pole of second portion 38 is distal pole plate 24, and the north pole of second portion 38 is proximate pole plate 24. This arrangement results in the second portion 38 having magnetic poles parallel to, but opposite in polarity to, first portion 36.
Third portion 40 is oriented such that the magnetic poles are parallel to pole plate 24 and target 16. This results in third portion 40 having magnetization fields substantially orthogonal to the directions of magnetization first portion 36 and second portion 38. As shown, third portion 40 is located between the first portion 36 and second portion 38. Third portion 40 is oriented such that the north pole of third portion 40 is proximate first portion 36, and the south pole of third portion is proximate second portion 38. As shown in FIGURES 4A and 4B, third portion 40 has a generally trapezoidal shape with the shorter length of the trapezoid proximate the first portion 36. It should be understood that the third portion 40 could have a rectangular or square shape. It should be further understood that the third portion 40 could be arranged such that the shorter length of the trapezoid was proximate to second portion 38. Third portion 40 operates to strengthen and enhance the magnetic field generated by first portion 36 and second portion 38 according to the teachings of the present invention. As shown in FIGURE 4B, first portion 36 and second portion 38 are oriented perpendicular to pole plate 24 and target 16. Third portion 40 is oriented parallel to pole plate 24 and target 16. In this embodiment, a width 46 of housing 42 is approximately .9 inches, and a width 48 of each magnet portion is approximately 1 inch.
Each of the plurality of magnet assemblies 22 is positioned in the apple core arrangement of magnet array 12. As shown in FIGURE 2, the first portion 36 of each magnet assembly 22 is located along the outer edge of magnet array 12. Magnet assemblies 22 at the stem region are constructed differently than that shown in FIGURES 4A and 4B, however, the magnetic pole orientation of the magnet portions are the same. It should be understood that the teachings of the present invention benefit other magnet array configurations as well as the embodiments shown and described herein. The present invention can be incorporated into present PVD systems without modifying the plasma side of the PVD systems.
A technical advantage of the magnet assembly for use in a magnet array according to the teachings of the present invention is an increased productivity and throughput rate for the magnetron sputtering system. The present invention provides a magnet assembly with a stronger magnetic field to allow the use of thicker targets and to increase the deposition rate. The magnet assembly improves the sputtering of magnetic target materials which comprise materials having high permeability. The magnet assembly of the present invention provides a strong magnetic field to penetrate the magnetic target.
A further technical advantage of the present invention is the provision of magnetic flux at the target which allows magnetron sputtering of magnetic targets with increased deposition rate. The benefits of the present invention are applicable to any magnetron array used in a sputtering system with a magnetic target.
FIGURES 5A and 5B illustrate magnetic field lines from a magnet assembly that does not include an intermediate portion oriented parallel to the target and pole plate. As shown in FIGURE 5A, a non-magnetic target 50 is oriented parallel to a pole plate 52 holding a magnet assembly, indicated generally at 54. Magnet assembly 54 does not include a parallel oriented magnetic portion according to the teachings of the present invention. Magnetic field lines 56 illustrate the magnetic field produced by magnet assembly 54. As shown, a point just beyond the surface of target 50 experiences a magnetic field strength of greater than 500 gauss.
FIGURE 5B illustrates magnetic field lines 58 generated by magnet assembly 54 with respect to a magnetic target 60. As shown, magnetic target 60 acts to shunt magnetic field lines 58 such that the field produced by magnet assembly 54 is substantially attenuated past magnetic target 60. As shown, a point near the surface of a magnetic target 60 experiences a magnetic field of only approximately 26 gauss. The magnet assembly 54 of FIGURES 5A and 5B is similar to the magnet pairs disclosed and described in U.S. Patent No. 5,248,402.
FIGURE 6 illustrates magnetic field lines for a magnetic field generated by a magnet assembly 22 constructed according to the teachings of the present invention. FIGURE 6 shows simulated field lines 68 produced by magnet assembly 62 coupled to pole plate 64. Magnet assembly 62 is constructed according to the teachings of the present invention with two perpendicularly oriented magnet portions and one parallel oriented magnet portion, as shown. A magnetic target 66 is oriented parallel to pole plate 64 and experiences magnetic fields as shown by the 100 gauss gradient isolines from 0 to 1200 gauss.
Field lines 68 show that the magnetic field strength is 100 gauss and 200 gauss at the locations shown. Comparison of FIGURE 6 with FIGURE 5B shows that magnet assembly 62 constructed according to the teachings of the present invention provides enhanced magnet field penetration through target 66.
The simulation of FIGURE 6 is generated for magnet flux penetration through a 0.25 inch thick ferromagnetic target with a 0.75 inch trapeze shaped magnet portion inserted between the two perpendicular oriented magnets . As shown, the magnetic flux is at least greater than 200 gauss at the target surface. FIGURE 7 illustrates a computer simulation of flux penetration through a 0.25 inch thick ferromagnetic target with a 0.75 inch trapeze shaped magnet inserted as described in FIGURE 6. The magnetic flux 0.06 inches from the face of the target is 560 gauss, as shown. The data illustrated in FIGURE 7 is based on magnetic flux measurements taken from magnets installed on a magnet array backing plate or flux return plate. As shown, the magnetic field is graphed on the Y axis and the distance is graphed on the X axis. Although the present invention has been described in detail, it should be understood that various changes, substitutions and alterations can be made hereto without departing from the spirit and scope of the invention as defined by the appended claims.

Claims

WHAT IS CLAIMED IS:
1. A high magnetic flux rotatable permanent magnet array for use in a magnetron sputtering system to sputter a substance from a target, the magnet array comprising, a plurality of magnet assemblies, each magnet assembly comprising; a first magnetized portion having a magnetization substantially perpendicular to the target, a second magnetized portion having a magnetization substantially perpendicular to the target, the magnetization of the second portion being opposite to the first portion; and a third magnetized portion located between the first portion and the second portion, the third portion having a magnetization substantially parallel to the target.
2. The system of Claim 1 further comprising a pole plate with the plurality of magnet assemblies coupled to the pole plate and arranged to form a generally apple- shaped configuration, and wherein; the first portion comprises a first magnet oriented such that the magnetic poles are substantially perpendicular to the pole plate with the south magnetic pole proximate the pole plate, the first magnet further located along the outer edge of generally apple-shaped configuration; the second portion comprises a second magnet oriented such that the magnetic poles are substantially perpendicular to the pole plate and the north magnetic pole is proximate the pole plate; and the third portion comprising a third magnet located between the first magnet and the second magnet, the third magnet oriented such that the magnetic poles of the third magnet are substantially parallel to the pole plate with the north magnetic pole proximate the first magnet and the south magnetic pole proximate the second magnet.
3. The system of Claim 1 further comprising a pole plate with the plurality of magnet assemblies coupled to the pole plate and arranged to form a generally apple- shaped configuration, and wherein; the first portion comprises a first magnet oriented such that the magnetic poles are substantially perpendicular to the pole plate with the north magnetic pole proximate the pole plate, the first magnet further located along the outer edge of generally apple-shaped configuration; the second portion comprises a second magnet oriented such that the magnetic poles are substantially perpendicular to the pole plate and the south magnetic pole is proximate the pole plate; and the third portion comprising a third magnet located between the first magnet and the second magnet, the third magnet oriented such that the magnetic poles of the third magnet are substantially parallel to the pole plate with the south magnetic pole proximate the first magnet and the north magnetic pole proximate the second magnet.
4. The system of Claim 2 further comprising; an inner magnet retainer; and an outer magnet retainer cooperating with the inner magnet retainer and the pole plate to hold and provide precision placement of each of the plurality of magnet assemblies.
5. The system of Claim 1 wherein the first portion, the second portion, and the third portion each comprise a separate structure, and wherein the first, second and third portions are contained within a housing.
6. The system of Claim 2 wherein the shape of third magnet is trapezoidal with the smaller length of the trapezoid proximate the first magnet and longer length of the trapezoid proximate the second magnet.
7. The system of Claim 2 wherein the third magnet is located between the first and second magnets at fewer than every pair of first and second magnets.
8. The system of Claim 1 wherein the plurality magnet assemblies form a generally heart-shaped configuration.
9. The system of Claim 1 wherein the plurality of magnet assemblies are arranged to form a generally apple- shaped configuration, and further wherein; the first portion comprises a first magnet oriented with magnetic poles substantially perpendicular to the target, the first magnet further located along the outer edge generally apple-shaped configuration; the second portion comprises a second magnet oriented with magnetic poles parallel to, and polarity opposite of, the first magnet; and the third portion comprises a third magnet located between the first magnet and the second magnet, the third magnet oriented with a direction of magnetization substantially orthogonal to the directions of magnetization of the first magnet and the second magnet.
10. The system of Claim 2 wherein the third magnet is oriented such that the south magnetic pole of the third magnet is proximate the second magnet.
11. The system of Claim 1 wherein the magnet array is capable of providing magnetic flux penetration through a 0.25 inch thick ferromagnetic target producing greater than 200 gauss magnetic flux density at the target surface within the sputtering process chamber.
12. The system of Claim 1 wherein the target comprises a single piece target made from a magnetic material.
13. The system of Claim 1 wherein the target comprises a disk-shaped single piece target with a thickness between Vβ" and 1".
14. A method of forming a high magnetic flux rotatable permanent magnet array for use in a magnetron sputtering system to sputter a substance from a target, comprising, positioning a plurality of magnet assemblies above the target on a plane approximately parallel to the target; forming the plurality of magnet assemblies by; positioning a first magnetized portion such that the direction of magnetization is substantially perpendicular to the target; positioning a second magnetized portion such that the direction of magnetization is substantially perpendicular to the target with magnetization being opposite the first magnetized portion, further positioning the second magnetized portion on the same plane as the first magnetized portion; and positioning a third magnetized portion between the first magnetized portion and the second magnetized portion such that the direction of magnetization of the third magnetized portion is substantially parallel to the target.
15. The method of Claim 14 further comprising, coupling the plurality of magnet assemblies to a pole plate; arranging the plurality of magnet assemblies to form a generally apple-shaped configuration; locating the first magnetized portion along the outer edge of the generally apple-shaped configuration; orienting the first magnetized portion such that the magnetic poles are perpendicular to the pole plate with the south magnetic pole proximate the pole plate; orienting the second magnetized portion such that the magnetic poles are perpendicular to the pole plate and the north magnetic pole is proximate the pole plate; and orienting the third magnetized portion such that the magnetic poles of the third magnetized portion are parallel to the pole plate with the north magnetic pole proximate the first magnetized portion and the south magnetic pole proximate the second magnetized portion.
16. The method of Claim 14 further comprising, coupling the plurality of magnet assemblies to a pole plate; arranging the plurality of magnet assemblies to form a generally apple-shaped configuration; locating the first magnetized portion along the outer edge of the generally apple-shaped configuration; orienting the first magnetized portion such that the magnetic poles are perpendicular to the pole plate with the north magnetic pole proximate the pole plate; orienting the second magnetized portion such that the magnetic poles are perpendicular to the pole plate and the south magnetic pole is proximate the pole plate; and orienting the third magnetized portion such that the magnetic poles of the third magnetized portion are parallel to the pole plate with the south magnetic pole proximate the first magnetized portion and the north magnetic pole proximate the second magnetized portion.
17. The method of Claim 14 further comprising, forming the first magnetized portion from a first magnet, forming the second magnetized portion from a second magnet, and forming the third magnetized portion from a third magnet.
18. The method of Claim 17 wherein forming the third magnetized portion further comprises forming the third magnet in the shape of a trapezoid and positioning the third magnet between the first and second magnets such that the smaller length of the trapezoid is proximate the first magnet and longer length of the trapezoid is proximate the second magnet.
19. The method of Claim 14 further comprising; orienting the first magnetized portion with magnetic poles perpendicular to the target, the first magnetized portion further located along the outer edge of the generally apple-shaped configuration; orienting the second magnetized portion with magnetic poles parallel to the first magnetized portion, and having polarity opposite that of the first magnetized portion; and orienting the third magnetized portion inserted between the first magnetized portion and the second magnetized portion with a direction of magnetization substantially orthogonal to the directions of magnetization of the first magnetized portion and the second magnetized portion.
20. A sputtering system having a magnetron formed in an array of permanent magnets rotated in proximity to a target disposed in a vacuum chamber, the improvement comprising: the array comprising a plurality of magnet assemblies, each magnet assembly comprising; a first magnet having a magnetization substantially perpendicular to the target, a second magnet having a magnetization substantially perpendicular to the target, the magnetization of the second magnet opposite the magnetization of the first magnet; and a third magnet located between the first portion and the second portion, the third magnet having a magnetization substantially parallel to the target.
21. The improvement of Claim 17 wherein said array is arranged in a generally apple-shaped configuration.
22. A sputtering system having a magnetron formed in an array of permanent magnets rotated in proximity to a plane target disposed in a vacuum chamber, the improvement comprising: the array comprising a plurality of magnet assemblies, each magnet assembly comprising; a first magnet oriented with magnetic poles perpendicular to the target; a second magnet oriented with magnetic poles parallel to and polarity opposite of the first magnet; and a third magnet located between the first magnet and the second magnet, the third magnet oriented with a direction of magnetization substantially orthogonal to the directions of magnetization of the first magnet and the second magnet.
23. The improvement of Claim 19 wherein said array is arranged in a generally apple-shaped configuration.
24. A high-magnetic flux rotatable permanent magnet array for use in a magnetron sputtering system to sputter a substance from a target, the magnet array comprising: a plurality of magnet assemblies, each magnet assembly comprising at least two neighboring portions with magnetizations substantially perpendicular and parallel to said target for enhanced magnetic field penetration through said target.
PCT/US1996/011564 1995-07-10 1996-07-10 Permanent magnet array apparatus and method WO1997003220A1 (en)

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JP9505986A JPH11509273A (en) 1995-07-10 1996-07-10 Permanent magnet arrangement apparatus and method

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999013491A1 (en) * 1997-09-05 1999-03-18 Nordiko Limited Vacuum sputtering apparatus
EP1336985A1 (en) * 2002-02-19 2003-08-20 Singulus Technologies AG Sputtering cathode, and device and method for coating a substrate with a plurality of layers
KR100451531B1 (en) * 2002-08-13 2004-10-08 윤현선 Order system using ventilating opening
EP1744347A1 (en) * 2005-07-11 2007-01-17 Heraeus, Inc. Enhanced magnetron sputtering target
EP1873809A1 (en) * 2006-06-26 2008-01-02 M2 Engineering AB (publ) Sputtering device

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6328858B1 (en) 1998-10-01 2001-12-11 Nexx Systems Packaging, Llc Multi-layer sputter deposition apparatus
US6217272B1 (en) 1998-10-01 2001-04-17 Applied Science And Technology, Inc. In-line sputter deposition system
US6497802B2 (en) 1999-02-12 2002-12-24 Applied Materials, Inc. Self ionized plasma sputtering
US6290825B1 (en) 1999-02-12 2001-09-18 Applied Materials, Inc. High-density plasma source for ionized metal deposition
US6183614B1 (en) 1999-02-12 2001-02-06 Applied Materials, Inc. Rotating sputter magnetron assembly
US6306265B1 (en) 1999-02-12 2001-10-23 Applied Materials, Inc. High-density plasma for ionized metal deposition capable of exciting a plasma wave
US6440282B1 (en) 1999-07-06 2002-08-27 Applied Materials, Inc. Sputtering reactor and method of using an unbalanced magnetron
US6402903B1 (en) 2000-02-04 2002-06-11 Steag Hamatech Ag Magnetic array for sputtering system
DE10004824B4 (en) * 2000-02-04 2009-06-25 Oc Oerlikon Balzers Ag Method for producing substrates, magnetron source, sputter coating chamber and use of the method
US6530733B2 (en) 2000-07-27 2003-03-11 Nexx Systems Packaging, Llc Substrate processing pallet and related substrate processing method and machine
US6821912B2 (en) 2000-07-27 2004-11-23 Nexx Systems Packaging, Llc Substrate processing pallet and related substrate processing method and machine
US6682288B2 (en) 2000-07-27 2004-01-27 Nexx Systems Packaging, Llc Substrate processing pallet and related substrate processing method and machine
US6471830B1 (en) 2000-10-03 2002-10-29 Veeco/Cvc, Inc. Inductively-coupled-plasma ionized physical-vapor deposition apparatus, method and system
US6663754B2 (en) 2001-04-13 2003-12-16 Applied Materials, Inc. Tubular magnet as center pole in unbalanced sputtering magnetron
KR100439474B1 (en) * 2001-09-12 2004-07-09 삼성전자주식회사 Sputtering apparatus for depositing a film
JP3611324B2 (en) * 2002-06-03 2005-01-19 信越化学工業株式会社 Magnetron plasma magnetic field generator
DE10247051A1 (en) * 2002-10-09 2004-04-22 Polymer Latex Gmbh & Co Kg Latex and process for its manufacture
US7100954B2 (en) * 2003-07-11 2006-09-05 Nexx Systems, Inc. Ultra-thin wafer handling system
US7182843B2 (en) * 2003-11-05 2007-02-27 Dexter Magnetic Technologies, Inc. Rotating sputtering magnetron
JP2013082993A (en) * 2011-09-30 2013-05-09 Tokyo Electron Ltd Magnetron sputtering apparatus and method
US10130807B2 (en) 2015-06-12 2018-11-20 Cochlear Limited Magnet management MRI compatibility
US20160381473A1 (en) 2015-06-26 2016-12-29 Johan Gustafsson Magnetic retention device
US9872115B2 (en) 2015-09-14 2018-01-16 Cochlear Limited Retention magnet system for medical device
US10917730B2 (en) 2015-09-14 2021-02-09 Cochlear Limited Retention magnet system for medical device
US11595768B2 (en) 2016-12-02 2023-02-28 Cochlear Limited Retention force increasing components

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4299678A (en) * 1979-07-23 1981-11-10 Spin Physics, Inc. Magnetic target plate for use in magnetron sputtering of magnetic films
US4461688A (en) * 1980-06-23 1984-07-24 Vac-Tec Systems, Inc. Magnetically enhanced sputtering device having a plurality of magnetic field sources including improved plasma trapping device and method
US4631106A (en) * 1984-09-19 1986-12-23 Hitachi, Ltd. Plasma processor
US4872964A (en) * 1985-08-02 1989-10-10 Fujitsu Limited Planar magnetron sputtering apparatus and its magnetic source
US5248402A (en) * 1992-07-29 1993-09-28 Cvc Products, Inc. Apple-shaped magnetron for sputtering system
US5252194A (en) * 1990-01-26 1993-10-12 Varian Associates, Inc. Rotating sputtering apparatus for selected erosion

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3945911A (en) * 1974-08-28 1976-03-23 Shatterproof Glass Corporation Cathodes for sputter-coating glass sheets or other substrates
CH649578A5 (en) * 1981-03-27 1985-05-31 Ulvac Corp HIGH-SPEED CATHODE SPRAYING DEVICE.
GB2125440A (en) * 1982-07-13 1984-03-07 Christopher Elphick Tunnel magnetron for cathode sputtering
DE3223245C2 (en) * 1982-07-23 1986-05-22 Nihon Shinku Gijutsu K.K., Chigasaki, Kanagawa High speed ferromagnetic sputtering device
JPS6274073A (en) * 1985-09-26 1987-04-04 Hitachi Ltd Sputtering device
JPH01177368A (en) * 1988-01-06 1989-07-13 Tokuda Seisakusho Ltd Sputtering device
US4865708A (en) * 1988-11-14 1989-09-12 Vac-Tec Systems, Inc. Magnetron sputtering cathode
US4995958A (en) * 1989-05-22 1991-02-26 Varian Associates, Inc. Sputtering apparatus with a rotating magnet array having a geometry for specified target erosion profile
DE69129081T2 (en) * 1990-01-29 1998-07-02 Varian Associates Device and method for precipitation by a collimator
US5320728A (en) * 1990-03-30 1994-06-14 Applied Materials, Inc. Planar magnetron sputtering source producing improved coating thickness uniformity, step coverage and step coverage uniformity
US5242566A (en) * 1990-04-23 1993-09-07 Applied Materials, Inc. Planar magnetron sputtering source enabling a controlled sputtering profile out to the target perimeter
US5079481A (en) * 1990-08-02 1992-01-07 Texas Instruments Incorporated Plasma-assisted processing magneton with magnetic field adjustment
US5082542A (en) * 1990-08-02 1992-01-21 Texas Instruments Incorporated Distributed-array magnetron-plasma processing module and method
US5188717A (en) * 1991-09-12 1993-02-23 Novellus Systems, Inc. Sweeping method and magnet track apparatus for magnetron sputtering
US5314597A (en) * 1992-03-20 1994-05-24 Varian Associates, Inc. Sputtering apparatus with a magnet array having a geometry for a specified target erosion profile
US5262028A (en) * 1992-06-01 1993-11-16 Sierra Applied Sciences, Inc. Planar magnetron sputtering magnet assembly
JPH06192830A (en) * 1992-07-31 1994-07-12 Texas Instr Inc <Ti> Method and device for physical vapor deposition of material layer
US5282947A (en) * 1992-08-13 1994-02-01 Vlsi Technology, Inc. Magnet assembly for enhanced sputter target erosion
US5415754A (en) * 1993-10-22 1995-05-16 Sierra Applied Sciences, Inc. Method and apparatus for sputtering magnetic target materials
US5487822A (en) * 1993-11-24 1996-01-30 Applied Materials, Inc. Integrated sputtering target assembly
DE4426200A1 (en) * 1994-07-23 1996-01-25 Leybold Ag Cathode sputtering appts.

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4299678A (en) * 1979-07-23 1981-11-10 Spin Physics, Inc. Magnetic target plate for use in magnetron sputtering of magnetic films
US4461688A (en) * 1980-06-23 1984-07-24 Vac-Tec Systems, Inc. Magnetically enhanced sputtering device having a plurality of magnetic field sources including improved plasma trapping device and method
US4631106A (en) * 1984-09-19 1986-12-23 Hitachi, Ltd. Plasma processor
US4872964A (en) * 1985-08-02 1989-10-10 Fujitsu Limited Planar magnetron sputtering apparatus and its magnetic source
US5252194A (en) * 1990-01-26 1993-10-12 Varian Associates, Inc. Rotating sputtering apparatus for selected erosion
US5248402A (en) * 1992-07-29 1993-09-28 Cvc Products, Inc. Apple-shaped magnetron for sputtering system

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999013491A1 (en) * 1997-09-05 1999-03-18 Nordiko Limited Vacuum sputtering apparatus
US6132576A (en) * 1997-09-05 2000-10-17 Nordiko Limited Vacuum sputtering apparatus
EP1336985A1 (en) * 2002-02-19 2003-08-20 Singulus Technologies AG Sputtering cathode, and device and method for coating a substrate with a plurality of layers
WO2003071579A1 (en) * 2002-02-19 2003-08-28 Singulus Technologies Ag Sputtering cathode and device and method for coating a substrate with several layers
KR100451531B1 (en) * 2002-08-13 2004-10-08 윤현선 Order system using ventilating opening
EP1744347A1 (en) * 2005-07-11 2007-01-17 Heraeus, Inc. Enhanced magnetron sputtering target
EP1873809A1 (en) * 2006-06-26 2008-01-02 M2 Engineering AB (publ) Sputtering device
WO2008000434A1 (en) * 2006-06-26 2008-01-03 M2 Engineering Ab Sputtering device

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JPH11509273A (en) 1999-08-17
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US5746897A (en) 1998-05-05
GB9800382D0 (en) 1998-03-04

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