WO1999000844A2 - Sockets for semiconductor devices with spring contact elements - Google Patents
Sockets for semiconductor devices with spring contact elements Download PDFInfo
- Publication number
- WO1999000844A2 WO1999000844A2 PCT/US1998/013692 US9813692W WO9900844A2 WO 1999000844 A2 WO1999000844 A2 WO 1999000844A2 US 9813692 W US9813692 W US 9813692W WO 9900844 A2 WO9900844 A2 WO 9900844A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- spring contact
- interconnection substrate
- terminals
- contact elements
- selected ones
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K3/00—Tools, devices, or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
- B23K3/08—Auxiliary devices therefor
- B23K3/087—Soldering or brazing jigs, fixtures or clamping means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/13—Mountings, e.g. non-detachable insulating substrates characterised by the shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/32—Holders for supporting the complete device in operation, i.e. detachable fixtures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/538—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
- H01L23/5385—Assembly of a plurality of insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/71—Means for bonding not being attached to, or not being formed on, the surface to be connected
- H01L24/72—Detachable connecting means consisting of mechanical auxiliary parts connecting the device, e.g. pressure contacts using springs or clips
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/306—Lead-in-hole components, e.g. affixing or retention before soldering, spacing means
- H05K3/308—Adaptations of leads
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/325—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/113—Manufacturing methods by local deposition of the material of the bump connector
- H01L2224/1133—Manufacturing methods by local deposition of the material of the bump connector in solid form
- H01L2224/1134—Stud bumping, i.e. using a wire-bonding apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/16237—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bonding area disposed in a recess of the surface of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/8112—Aligning
- H01L2224/81136—Aligning involving guiding structures, e.g. spacers or supporting members
- H01L2224/81138—Aligning involving guiding structures, e.g. spacers or supporting members the guiding structures being at least partially left in the finished device
- H01L2224/8114—Guiding structures outside the body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/819—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector with the bump connector not providing any mechanical bonding
- H01L2224/81901—Pressing the bump connector against the bonding areas by means of another connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00013—Fully indexed content
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01023—Vanadium [V]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01039—Yttrium [Y]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/119—Details of rigid insulating substrates therefor, e.g. three-dimensional details
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0302—Properties and characteristics in general
- H05K2201/0311—Metallic part with specific elastic properties, e.g. bent piece of metal as electrical contact
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/09372—Pads and lands
- H05K2201/09472—Recessed pad for surface mounting; Recessed electrode of component
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09818—Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
- H05K2201/09827—Tapered, e.g. tapered hole, via or groove
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49128—Assembling formed circuit to base
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
- Y10T29/49139—Assembling to base an electrical component, e.g., capacitor, etc. by inserting component lead or terminal into base aperture
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
- Y10T29/49139—Assembling to base an electrical component, e.g., capacitor, etc. by inserting component lead or terminal into base aperture
- Y10T29/4914—Assembling to base an electrical component, e.g., capacitor, etc. by inserting component lead or terminal into base aperture with deforming of lead or terminal
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49147—Assembling terminal to base
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49147—Assembling terminal to base
- Y10T29/49151—Assembling terminal to base by deforming or shaping
- Y10T29/49153—Assembling terminal to base by deforming or shaping with shaping or forcing terminal into base aperture
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49204—Contact or terminal manufacturing
- Y10T29/49208—Contact or terminal manufacturing by assembling plural parts
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/53174—Means to fasten electrical component to wiring board, base, or substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/53174—Means to fasten electrical component to wiring board, base, or substrate
- Y10T29/53178—Chip component
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/53—Means to assemble or disassemble
- Y10T29/5313—Means to assemble electrical device
- Y10T29/53174—Means to fasten electrical component to wiring board, base, or substrate
- Y10T29/53183—Multilead component
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU82803/98A AU8280398A (en) | 1997-06-30 | 1998-06-30 | Sockets for semiconductor devices with spring contact elements |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US5136597P | 1997-06-30 | 1997-06-30 | |
US60/051,365 | 1997-06-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO1999000844A2 true WO1999000844A2 (en) | 1999-01-07 |
WO1999000844A3 WO1999000844A3 (en) | 1999-04-29 |
Family
ID=21970864
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1998/013692 WO1999000844A2 (en) | 1997-06-30 | 1998-06-30 | Sockets for semiconductor devices with spring contact elements |
Country Status (3)
Country | Link |
---|---|
US (6) | US6033935A (en) |
AU (1) | AU8280398A (en) |
WO (1) | WO1999000844A2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1523229A2 (en) * | 1998-06-30 | 2005-04-13 | Formfactor, Inc. | Assembly of an electronic component with spring packaging |
CN110133409A (en) * | 2019-05-31 | 2019-08-16 | 江苏金智科技股份有限公司 | A kind of double clamping devices of distribution transformer terminals detection |
Families Citing this family (82)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030048108A1 (en) * | 1993-04-30 | 2003-03-13 | Beaman Brian Samuel | Structural design and processes to control probe position accuracy in a wafer test probe assembly |
US5772451A (en) * | 1993-11-16 | 1998-06-30 | Form Factor, Inc. | Sockets for electronic components and methods of connecting to electronic components |
US6033935A (en) * | 1997-06-30 | 2000-03-07 | Formfactor, Inc. | Sockets for "springed" semiconductor devices |
US20020004320A1 (en) * | 1995-05-26 | 2002-01-10 | David V. Pedersen | Attaratus for socketably receiving interconnection elements of an electronic component |
US5729150A (en) * | 1995-12-01 | 1998-03-17 | Cascade Microtech, Inc. | Low-current probe card with reduced triboelectric current generating cables |
US5914613A (en) | 1996-08-08 | 1999-06-22 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
US6034533A (en) * | 1997-06-10 | 2000-03-07 | Tervo; Paul A. | Low-current pogo probe card |
US6256882B1 (en) * | 1998-07-14 | 2001-07-10 | Cascade Microtech, Inc. | Membrane probing system |
JP2000077477A (en) * | 1998-09-02 | 2000-03-14 | Shinko Electric Ind Co Ltd | Semiconductor device, its manufacture, and metallic substrate used therefor |
US6710609B2 (en) * | 2002-07-15 | 2004-03-23 | Nanonexus, Inc. | Mosaic decal probe |
US6799976B1 (en) * | 1999-07-28 | 2004-10-05 | Nanonexus, Inc. | Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
US6812718B1 (en) * | 1999-05-27 | 2004-11-02 | Nanonexus, Inc. | Massively parallel interface for electronic circuits |
US20070245553A1 (en) * | 1999-05-27 | 2007-10-25 | Chong Fu C | Fine pitch microfabricated spring contact structure & method |
US7382142B2 (en) | 2000-05-23 | 2008-06-03 | Nanonexus, Inc. | High density interconnect system having rapid fabrication cycle |
US7247035B2 (en) * | 2000-06-20 | 2007-07-24 | Nanonexus, Inc. | Enhanced stress metal spring contactor |
US6578264B1 (en) * | 1999-06-04 | 2003-06-17 | Cascade Microtech, Inc. | Method for constructing a membrane probe using a depression |
US6313523B1 (en) * | 1999-10-28 | 2001-11-06 | Hewlett-Packard Company | IC die power connection using canted coil spring |
US6838890B2 (en) * | 2000-02-25 | 2005-01-04 | Cascade Microtech, Inc. | Membrane probing system |
US7579848B2 (en) * | 2000-05-23 | 2009-08-25 | Nanonexus, Inc. | High density interconnect system for IC packages and interconnect assemblies |
US7952373B2 (en) | 2000-05-23 | 2011-05-31 | Verigy (Singapore) Pte. Ltd. | Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
US20050068054A1 (en) * | 2000-05-23 | 2005-03-31 | Sammy Mok | Standardized layout patterns and routing structures for integrated circuit wafer probe card assemblies |
US6367763B1 (en) * | 2000-06-02 | 2002-04-09 | Wayne K. Pfaff | Test mounting for grid array packages |
KR20020026585A (en) | 2000-06-20 | 2002-04-10 | 나노넥서스, 인코포레이티드 | Systems for testing and packaging integraged circuits |
DE20114544U1 (en) | 2000-12-04 | 2002-02-21 | Cascade Microtech Inc | wafer probe |
US6627980B2 (en) | 2001-04-12 | 2003-09-30 | Formfactor, Inc. | Stacked semiconductor device assembly with microelectronic spring contacts |
JP2002353371A (en) | 2001-05-25 | 2002-12-06 | Shinko Electric Ind Co Ltd | Semiconductor device and its manufacturing method |
US6585527B2 (en) | 2001-05-31 | 2003-07-01 | Samtec, Inc. | Compliant connector for land grid array |
US7182672B2 (en) * | 2001-08-02 | 2007-02-27 | Sv Probe Pte. Ltd. | Method of probe tip shaping and cleaning |
AU2002327490A1 (en) | 2001-08-21 | 2003-06-30 | Cascade Microtech, Inc. | Membrane probing system |
JP3794586B2 (en) * | 2001-08-24 | 2006-07-05 | ナノネクサス インク | Method and apparatus for generating uniform isotropic stress in sputtered films |
US6764869B2 (en) * | 2001-09-12 | 2004-07-20 | Formfactor, Inc. | Method of assembling and testing an electronics module |
US6882546B2 (en) * | 2001-10-03 | 2005-04-19 | Formfactor, Inc. | Multiple die interconnect system |
US6727115B2 (en) * | 2001-10-31 | 2004-04-27 | Hewlett-Packard Development Company, L.P. | Back-side through-hole interconnection of a die to a substrate |
US6891385B2 (en) * | 2001-12-27 | 2005-05-10 | Formfactor, Inc. | Probe card cooling assembly with direct cooling of active electronic components |
US7064953B2 (en) * | 2001-12-27 | 2006-06-20 | Formfactor, Inc. | Electronic package with direct cooling of active electronic components |
US7694246B2 (en) * | 2002-06-19 | 2010-04-06 | Formfactor, Inc. | Test method for yielding a known good die |
US6724205B1 (en) * | 2002-11-13 | 2004-04-20 | Cascade Microtech, Inc. | Probe for combined signals |
KR100443999B1 (en) * | 2003-02-28 | 2004-08-21 | 주식회사 파이컴 | Interconnector for Printed Circuit Board, method thereby and interconnector assembly having it |
US6965245B2 (en) * | 2003-05-01 | 2005-11-15 | K&S Interconnect, Inc. | Prefabricated and attached interconnect structure |
US7057404B2 (en) * | 2003-05-23 | 2006-06-06 | Sharp Laboratories Of America, Inc. | Shielded probe for testing a device under test |
US6848936B2 (en) * | 2003-05-27 | 2005-02-01 | Intel Corporation | Electronic assembly having a socket with features that ensure alignment in X- and Y-directions of a component held thereby |
US7024763B2 (en) | 2003-11-26 | 2006-04-11 | Formfactor, Inc. | Methods for making plated through holes usable as interconnection wire or probe attachments |
US20050108875A1 (en) * | 2003-11-26 | 2005-05-26 | Mathieu Gaetan L. | Methods for making vertical electric feed through structures usable to form removable substrate tiles in a wafer test system |
DE202004021093U1 (en) | 2003-12-24 | 2006-09-28 | Cascade Microtech, Inc., Beaverton | Differential probe for e.g. integrated circuit, has elongate probing units interconnected to respective active circuits that are interconnected to substrate by respective pair of flexible interconnects |
US7282932B2 (en) * | 2004-03-02 | 2007-10-16 | Micron Technology, Inc. | Compliant contact pin assembly, card system and methods thereof |
DE102004032358B4 (en) * | 2004-07-03 | 2006-09-28 | Infineon Technologies Ag | connecting device |
JP4980903B2 (en) * | 2004-07-07 | 2012-07-18 | カスケード マイクロテック インコーポレイテッド | Probe head with membrane suspension probe |
JP4196901B2 (en) * | 2004-08-11 | 2008-12-17 | ソニー株式会社 | Electronic circuit equipment |
US20060074836A1 (en) * | 2004-09-03 | 2006-04-06 | Biowisdom Limited | System and method for graphically displaying ontology data |
KR20070058522A (en) | 2004-09-13 | 2007-06-08 | 캐스케이드 마이크로테크 인코포레이티드 | Double sided probing structures |
US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
US7656172B2 (en) | 2005-01-31 | 2010-02-02 | Cascade Microtech, Inc. | System for testing semiconductors |
DE102005008514B4 (en) * | 2005-02-24 | 2019-05-16 | Tdk Corporation | Microphone membrane and microphone with the microphone membrane |
DE102005008512B4 (en) | 2005-02-24 | 2016-06-23 | Epcos Ag | Electrical module with a MEMS microphone |
DE102005008511B4 (en) * | 2005-02-24 | 2019-09-12 | Tdk Corporation | MEMS microphone |
US7471094B2 (en) * | 2005-06-24 | 2008-12-30 | Formfactor, Inc. | Method and apparatus for adjusting a multi-substrate probe structure |
DE102005050398A1 (en) * | 2005-10-20 | 2007-04-26 | Epcos Ag | Cavity housing for a mechanically sensitive electronic device and method of manufacture |
DE102005053765B4 (en) * | 2005-11-10 | 2016-04-14 | Epcos Ag | MEMS package and method of manufacture |
DE102005053767B4 (en) * | 2005-11-10 | 2014-10-30 | Epcos Ag | MEMS microphone, method of manufacture and method of installation |
US7426117B2 (en) * | 2005-12-21 | 2008-09-16 | Xerox Corporation | Chip on a board |
US7444253B2 (en) * | 2006-05-09 | 2008-10-28 | Formfactor, Inc. | Air bridge structures and methods of making and using air bridge structures |
US7764072B2 (en) | 2006-06-12 | 2010-07-27 | Cascade Microtech, Inc. | Differential signal probing system |
US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
US7723999B2 (en) | 2006-06-12 | 2010-05-25 | Cascade Microtech, Inc. | Calibration structures for differential signal probing |
KR20090057328A (en) * | 2006-09-26 | 2009-06-04 | 알프스 덴키 가부시키가이샤 | Elastic contact and method for bonding between metal terminals using the same |
KR100757345B1 (en) * | 2006-12-29 | 2007-09-10 | 삼성전자주식회사 | Flip chip package and method of manufacturing the same |
US7876114B2 (en) | 2007-08-08 | 2011-01-25 | Cascade Microtech, Inc. | Differential waveguide probe |
CN101316014B (en) * | 2007-10-17 | 2012-02-01 | 番禺得意精密电子工业有限公司 | Electric connection device and assembly method thereof |
US20090127667A1 (en) * | 2007-11-21 | 2009-05-21 | Powertech Technology Inc. | Semiconductor chip device having through-silicon-via (TSV) and its fabrication method |
US7888957B2 (en) | 2008-10-06 | 2011-02-15 | Cascade Microtech, Inc. | Probing apparatus with impedance optimized interface |
WO2010059247A2 (en) | 2008-11-21 | 2010-05-27 | Cascade Microtech, Inc. | Replaceable coupon for a probing apparatus |
DE102009022659B4 (en) * | 2009-05-26 | 2012-01-19 | Semikron Elektronik Gmbh & Co. Kg | Contact device for a power semiconductor module |
US8315065B2 (en) * | 2009-09-28 | 2012-11-20 | Oracle America, Inc. | Self-locking features in a multi-chip module |
DE102010001711A1 (en) * | 2010-02-09 | 2011-08-11 | Robert Bosch GmbH, 70469 | Semiconductor device and corresponding manufacturing method |
KR101149759B1 (en) * | 2011-03-14 | 2012-06-01 | 리노공업주식회사 | A testing apparatus of the semiconductor device |
JP5718203B2 (en) * | 2011-10-05 | 2015-05-13 | 富士通コンポーネント株式会社 | Socket module and socket |
JP6341634B2 (en) * | 2013-05-28 | 2018-06-13 | 新光電気工業株式会社 | Probe guide plate, manufacturing method thereof, and semiconductor inspection apparatus |
DE102013106353B4 (en) * | 2013-06-18 | 2018-06-28 | Tdk Corporation | Method for applying a structured coating to a component |
JP2018535418A (en) | 2015-11-25 | 2018-11-29 | フォームファクター, インコーポレイテッド | Floating nesting for test socket |
JP6654061B2 (en) * | 2016-02-23 | 2020-02-26 | 日本電子材料株式会社 | Probe guide, probe card and method of manufacturing probe guide |
US20180263136A1 (en) * | 2017-03-11 | 2018-09-13 | Microsoft Technology Licensing, Llc | Flexible or rotatable connectors in electronic devices |
US10057989B1 (en) * | 2017-04-10 | 2018-08-21 | Tactotek Oy | Multilayer structure and related method of manufacture for electronics |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3676832A (en) * | 1970-12-28 | 1972-07-11 | Ibm | Connector |
US4950980A (en) * | 1988-07-29 | 1990-08-21 | Pfaff Wayne | Test socket for electronic device packages |
EP0422584A2 (en) * | 1989-10-10 | 1991-04-17 | The Whitaker Corporation | Tool for use with a ZIF PGA socket |
WO1992020203A1 (en) * | 1991-05-08 | 1992-11-12 | General Datacomm, Inc. | Integrated circuit packages using tapered spring contact leads for direct mounting to circuit boards |
WO1994023475A1 (en) * | 1993-03-29 | 1994-10-13 | General Datacomm, Inc. | Spring biased tapered contact element |
WO1996017378A1 (en) * | 1994-11-15 | 1996-06-06 | Formfactor, Inc. | Electrical contact structures from flexible wire |
Family Cites Families (70)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US422584A (en) * | 1890-03-04 | Flooring | ||
US2740097A (en) * | 1951-04-19 | 1956-03-27 | Hughes Aircraft Co | Electrical hinge connector for circuit boards |
NL292051A (en) | 1962-04-27 | |||
US3142847A (en) * | 1962-08-16 | 1964-08-04 | Adrian F Kurrels | Portable knock-down commode having separable parts for nesting |
US3290636A (en) | 1963-09-30 | 1966-12-06 | Northern Electric Co | Thin-film circuit connector |
US3982159A (en) | 1974-11-11 | 1976-09-21 | E. I. Du Pont De Nemours And Company | Leadless package retaining frame |
US4074342A (en) | 1974-12-20 | 1978-02-14 | International Business Machines Corporation | Electrical package for lsi devices and assembly process therefor |
US4528500A (en) * | 1980-11-25 | 1985-07-09 | Lightbody James D | Apparatus and method for testing circuit boards |
US4417777A (en) | 1981-10-13 | 1983-11-29 | Molex Incorporated | Integrated circuit carrier assembly |
US4480888A (en) | 1982-06-23 | 1984-11-06 | Amp Incorporated | Multi terminal low insertion force connector |
US4533199A (en) * | 1983-11-14 | 1985-08-06 | Burndy Corporation | IDC termination for coaxial cable |
US4627161A (en) * | 1983-12-19 | 1986-12-09 | At&T Technologies, Inc. | Method for inserting multilead components into printed wiring boards |
US4667219A (en) | 1984-04-27 | 1987-05-19 | Trilogy Computer Development Partners, Ltd. | Semiconductor chip interface |
JPS61170054A (en) | 1985-01-23 | 1986-07-31 | Mitsubishi Electric Corp | Clip lead |
GB2170593B (en) * | 1985-02-01 | 1988-09-14 | Central Electr Generat Board | Temperature measurement |
US4616414A (en) * | 1985-03-13 | 1986-10-14 | At&T Technologies, Inc. | Method and apparatus for gripping multilead articles |
US5917707A (en) * | 1993-11-16 | 1999-06-29 | Formfactor, Inc. | Flexible contact structure with an electrically conductive shell |
US5131535A (en) | 1986-06-27 | 1992-07-21 | Symtek Systems, Inc. | Electrical device transport medium |
US5189507A (en) | 1986-12-17 | 1993-02-23 | Raychem Corporation | Interconnection of electronic components |
JP2533511B2 (en) | 1987-01-19 | 1996-09-11 | 株式会社日立製作所 | Electronic component connection structure and manufacturing method thereof |
US4761140A (en) | 1987-02-20 | 1988-08-02 | Augat Inc. | Minimum insertion force self-cleaning anti-overstress PLCC receiving socket |
US5045975A (en) | 1987-05-21 | 1991-09-03 | Cray Computer Corporation | Three dimensionally interconnected module assembly |
US4833776A (en) * | 1988-01-29 | 1989-05-30 | Westinghouse Electric Corp. | Tactile retrieval and insertion and method for electronic components in through-hole printed circuit boards |
JPH01313969A (en) | 1988-06-13 | 1989-12-19 | Hitachi Ltd | Semiconductor device |
US5073118A (en) * | 1988-12-08 | 1991-12-17 | Amp Incorporated | Surface mounting an electronic component |
US4935284A (en) * | 1988-12-21 | 1990-06-19 | Amp Incorporated | Molded circuit board with buried circuit layer |
US4906194A (en) | 1989-04-13 | 1990-03-06 | Amp Incorporated | High density connector for an IC chip carrier |
US5425649A (en) * | 1989-06-13 | 1995-06-20 | General Datacomm, Inc. | Connector system having switching and testing functions using tapered spring contact elements and actuators therefor |
JPH03142847A (en) | 1989-10-30 | 1991-06-18 | Hitachi Ltd | Semiconductor integrated circuit device |
US5038467A (en) * | 1989-11-09 | 1991-08-13 | Advanced Interconnections Corporation | Apparatus and method for installation of multi-pin components on circuit boards |
JPH03185847A (en) * | 1989-12-15 | 1991-08-13 | Toshiba Corp | Universal probe card |
JPH0711422Y2 (en) | 1989-12-25 | 1995-03-15 | 山一電機工業株式会社 | IC socket |
US5015946A (en) * | 1990-02-26 | 1991-05-14 | Tektronix, Inc. | High density probe |
US5123850A (en) | 1990-04-06 | 1992-06-23 | Texas Instruments Incorporated | Non-destructive burn-in test socket for integrated circuit die |
US5302891A (en) | 1991-06-04 | 1994-04-12 | Micron Technology, Inc. | Discrete die burn-in for non-packaged die |
US5541525A (en) | 1991-06-04 | 1996-07-30 | Micron Technology, Inc. | Carrier for testing an unpackaged semiconductor die |
US5230632A (en) | 1991-12-19 | 1993-07-27 | International Business Machines Corporation | Dual element electrical contact and connector assembly utilizing same |
US5371654A (en) | 1992-10-19 | 1994-12-06 | International Business Machines Corporation | Three dimensional high performance interconnection package |
JP3339921B2 (en) * | 1992-11-30 | 2002-10-28 | 株式会社リコー | Communication control device for image forming device management system |
FR2703839B1 (en) | 1993-04-09 | 1995-07-07 | Framatome Connectors France | Intermediate connector between printed circuit board and electronic circuit substrate. |
US5500605A (en) | 1993-09-17 | 1996-03-19 | At&T Corp. | Electrical test apparatus and method |
US5772451A (en) * | 1993-11-16 | 1998-06-30 | Form Factor, Inc. | Sockets for electronic components and methods of connecting to electronic components |
US6029344A (en) | 1993-11-16 | 2000-02-29 | Formfactor, Inc. | Composite interconnection element for microelectronic components, and method of making same |
US6064213A (en) | 1993-11-16 | 2000-05-16 | Formfactor, Inc. | Wafer-level burn-in and test |
US5897326A (en) | 1993-11-16 | 1999-04-27 | Eldridge; Benjamin N. | Method of exercising semiconductor devices |
JPH07161426A (en) * | 1993-12-03 | 1995-06-23 | Furukawa Electric Co Ltd:The | Socket for bare chip burn-in test and its manufacture |
GB9400384D0 (en) | 1994-01-11 | 1994-03-09 | Inmos Ltd | Circuit connection in an electrical assembly |
US5455390A (en) | 1994-02-01 | 1995-10-03 | Tessera, Inc. | Microelectronics unit mounting with multiple lead bonding |
US5635832A (en) | 1994-06-15 | 1997-06-03 | Advantest Corporation | IC carrier for use with an IC handler |
EP0780028B1 (en) | 1994-09-06 | 1998-04-15 | The Whitaker Corporation | Ball grid array socket |
JP2876106B2 (en) | 1995-01-31 | 1999-03-31 | タバイエスペック株式会社 | Composite for burn-in and burn-in device using the composite |
JPH08213128A (en) | 1995-02-08 | 1996-08-20 | Texas Instr Japan Ltd | Socket |
US20020004320A1 (en) * | 1995-05-26 | 2002-01-10 | David V. Pedersen | Attaratus for socketably receiving interconnection elements of an electronic component |
US5998864A (en) * | 1995-05-26 | 1999-12-07 | Formfactor, Inc. | Stacking semiconductor devices, particularly memory chips |
US6033935A (en) | 1997-06-30 | 2000-03-07 | Formfactor, Inc. | Sockets for "springed" semiconductor devices |
US5874780A (en) * | 1995-07-27 | 1999-02-23 | Nec Corporation | Method of mounting a semiconductor device to a substrate and a mounted structure |
US5714803A (en) | 1995-07-28 | 1998-02-03 | Sgs-Thomson Microelectronics, Inc. | Low-profile removable ball-grid-array integrated circuit package |
US5686842A (en) | 1995-08-31 | 1997-11-11 | Nat Semiconductor Corp | Known good die test apparatus and method |
US5573435A (en) | 1995-08-31 | 1996-11-12 | The Whitaker Corporation | Tandem loop contact for an electrical connector |
US6046597A (en) | 1995-10-04 | 2000-04-04 | Oz Technologies, Inc. | Test socket for an IC device |
US5994152A (en) | 1996-02-21 | 1999-11-30 | Formfactor, Inc. | Fabricating interconnects and tips using sacrificial substrates |
JP3414593B2 (en) * | 1996-06-28 | 2003-06-09 | 日本発条株式会社 | Conductive contact |
WO1998001906A1 (en) | 1996-07-05 | 1998-01-15 | Formfactor, Inc. | Floating lateral support for ends of elongate interconnection elements |
US6051982A (en) * | 1996-08-02 | 2000-04-18 | International Business Machines Corporation | Electronic component test apparatus with rotational probe and conductive spaced apart means |
JPH1172534A (en) | 1997-08-28 | 1999-03-16 | Mitsubishi Electric Corp | Semiconductor device with test terminal, and ic socket |
KR100549731B1 (en) * | 1998-01-16 | 2006-02-07 | 소니 가부시끼 가이샤 | Ic socket and method for manufacturing ic |
US6078500A (en) | 1998-05-12 | 2000-06-20 | International Business Machines Inc. | Pluggable chip scale package |
US6887723B1 (en) * | 1998-12-04 | 2005-05-03 | Formfactor, Inc. | Method for processing an integrated circuit including placing dice into a carrier and testing |
US7694246B2 (en) * | 2002-06-19 | 2010-04-06 | Formfactor, Inc. | Test method for yielding a known good die |
JP2006278531A (en) * | 2005-03-28 | 2006-10-12 | Toshiba Corp | Process management system, process management method, and method of manufacturing semiconductor device |
-
1998
- 1998-06-30 US US09/108,163 patent/US6033935A/en not_active Expired - Fee Related
- 1998-06-30 AU AU82803/98A patent/AU8280398A/en not_active Abandoned
- 1998-06-30 WO PCT/US1998/013692 patent/WO1999000844A2/en active Application Filing
-
2000
- 2000-03-07 US US09/519,279 patent/US6232149B1/en not_active Expired - Fee Related
-
2001
- 2001-03-27 US US09/819,143 patent/US6534856B1/en not_active Expired - Fee Related
-
2002
- 2002-11-19 US US10/299,131 patent/US6642625B2/en not_active Expired - Fee Related
-
2003
- 2003-09-29 US US10/673,691 patent/US7059047B2/en not_active Expired - Fee Related
-
2006
- 2006-06-13 US US11/423,767 patent/US20060223345A1/en not_active Abandoned
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3676832A (en) * | 1970-12-28 | 1972-07-11 | Ibm | Connector |
US4950980A (en) * | 1988-07-29 | 1990-08-21 | Pfaff Wayne | Test socket for electronic device packages |
EP0422584A2 (en) * | 1989-10-10 | 1991-04-17 | The Whitaker Corporation | Tool for use with a ZIF PGA socket |
WO1992020203A1 (en) * | 1991-05-08 | 1992-11-12 | General Datacomm, Inc. | Integrated circuit packages using tapered spring contact leads for direct mounting to circuit boards |
WO1994023475A1 (en) * | 1993-03-29 | 1994-10-13 | General Datacomm, Inc. | Spring biased tapered contact element |
WO1996017378A1 (en) * | 1994-11-15 | 1996-06-06 | Formfactor, Inc. | Electrical contact structures from flexible wire |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1523229A2 (en) * | 1998-06-30 | 2005-04-13 | Formfactor, Inc. | Assembly of an electronic component with spring packaging |
EP1523229A3 (en) * | 1998-06-30 | 2005-07-27 | Formfactor, Inc. | Assembly of an electronic component with spring packaging |
CN110133409A (en) * | 2019-05-31 | 2019-08-16 | 江苏金智科技股份有限公司 | A kind of double clamping devices of distribution transformer terminals detection |
CN110133409B (en) * | 2019-05-31 | 2020-06-09 | 江苏金智科技股份有限公司 | Join in marriage two clamping mechanism that becomes terminal detection usefulness |
Also Published As
Publication number | Publication date |
---|---|
US6033935A (en) | 2000-03-07 |
US20030067080A1 (en) | 2003-04-10 |
US20060223345A1 (en) | 2006-10-05 |
US6232149B1 (en) | 2001-05-15 |
US6534856B1 (en) | 2003-03-18 |
US20040064941A1 (en) | 2004-04-08 |
US7059047B2 (en) | 2006-06-13 |
US6642625B2 (en) | 2003-11-04 |
WO1999000844A3 (en) | 1999-04-29 |
AU8280398A (en) | 1999-01-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6033935A (en) | Sockets for "springed" semiconductor devices | |
US5810609A (en) | Socket for engaging bump leads on a microelectronic device and methods therefor | |
US6957963B2 (en) | Compliant interconnect assembly | |
EP0764352B1 (en) | Microelectronic contacts and assemblies | |
EP1092338B1 (en) | Assembly of an electronic component with spring packaging | |
US5632631A (en) | Microelectronic contacts with asperities and methods of making same | |
US6329827B1 (en) | High density cantilevered probe for electronic devices | |
US5811982A (en) | High density cantilevered probe for electronic devices | |
US5802699A (en) | Methods of assembling microelectronic assembly with socket for engaging bump leads | |
US6722032B2 (en) | Method of forming a structure for electronic devices contact locations | |
US7332922B2 (en) | Method for fabricating a structure for making contact with a device | |
US20070123082A1 (en) | Interconnect Assemblies And Methods | |
EP1249057A2 (en) | Flexible compliant interconnect assembly | |
EP0792519B1 (en) | Interconnection elements for microelectronic components |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A2 Designated state(s): AL AM AT AU AZ BA BB BG BR BY CA CH CN CU CZ DE DK EE ES FI GB GE GH GM GW HU ID IL IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT UA UG US UZ VN YU ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A2 Designated state(s): GH GM KE LS MW SD SZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN ML MR NE SN TD TG |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
AK | Designated states |
Kind code of ref document: A3 Designated state(s): AL AM AT AU AZ BA BB BG BR BY CA CH CN CU CZ DE DK EE ES FI GB GE GH GM GW HU ID IL IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT UA UG US UZ VN YU ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A3 Designated state(s): GH GM KE LS MW SD SZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN ML MR NE SN TD TG |
|
REG | Reference to national code |
Ref country code: DE Ref legal event code: 8642 |
|
NENP | Non-entry into the national phase |
Ref country code: CA |
|
NENP | Non-entry into the national phase |
Ref country code: JP Ref document number: 1999505907 Format of ref document f/p: F |
|
122 | Ep: pct application non-entry in european phase |