WO1999039368A2 - Time-of-flight mass spectrometer - Google Patents

Time-of-flight mass spectrometer Download PDF

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Publication number
WO1999039368A2
WO1999039368A2 PCT/GB1999/000084 GB9900084W WO9939368A2 WO 1999039368 A2 WO1999039368 A2 WO 1999039368A2 GB 9900084 W GB9900084 W GB 9900084W WO 9939368 A2 WO9939368 A2 WO 9939368A2
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WO
WIPO (PCT)
Prior art keywords
extraction
voltage
voltages
extraction voltage
ions
Prior art date
Application number
PCT/GB1999/000084
Other languages
French (fr)
Other versions
WO1999039368A3 (en
Inventor
Eizo Kawato
Original Assignee
Shimadzu Research Laboratory (Europe) Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Research Laboratory (Europe) Ltd. filed Critical Shimadzu Research Laboratory (Europe) Ltd.
Priority to US09/530,091 priority Critical patent/US6380666B1/en
Priority to EP99901017A priority patent/EP1051730B1/en
Priority to JP2000529737A priority patent/JP4132667B2/en
Priority to AU20651/99A priority patent/AU2065199A/en
Priority to DE69906699T priority patent/DE69906699T2/en
Publication of WO1999039368A2 publication Critical patent/WO1999039368A2/en
Publication of WO1999039368A3 publication Critical patent/WO1999039368A3/en

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426Methods for controlling ions
    • H01J49/427Ejection and selection methods

Definitions

  • the present invention relates to a time-of-flight mass
  • the invention relates to a
  • time-of-flight mass spectrometer comprising an ion source
  • an ion reflector between the ion source and the ion
  • a quadrupole ion trap comprises a pair of end-cap electrodes
  • One of the end-cap electrodes has a
  • the invention is a first aspect of the invention.
  • a quadrupole ion trap device is widely used in mass analysis
  • radio-frequency selecting specific ions in dependence on
  • time-of-flight mass spectrometer compensates for a spread of
  • This patent discloses a quadrupole ion trap (shown
  • time-of-flight mass spectrometer comprising a quadrupole ion
  • the quadrupole ion trap having a ring electrode and two end- cap electrodes, at least one of the end-cap electrodes having
  • said at least one end-cap electrode a first extraction voltage
  • the ring electrode having the opposite polarity to said first
  • one of the end-cap electrodes having at least one hole at its
  • the second extraction voltage having a magnitude
  • a quadrupole ion trap having a ring electrode and two
  • end-cap electrodes at least one of the end cap electrodes
  • extraction voltages being respectively negative and positive
  • the second extraction voltage having a magnitude in the range
  • time-of-flight mass spectrometer incorporating a quadrupole
  • an ion reflector has the capability
  • the other end-cap electrode have applied positive voltages
  • the ion reflector can be so designed
  • extraction end-cap electrode had a surface provided with a cone-shaped hump around the central hole.
  • the quadrupole ion trap has a stretched geometry in which both
  • end-cap electrodes are each moved apart by 0.76mm from their
  • Figure 1 shows a cross-sectional view through a known
  • Figure 2 is a schematic representation of a time-of-flight
  • Figure 3 is an enlarged cross-sectional view through the
  • a quadrupole ion trap 10 comprises a quadrupole ion trap 10, a drift tube 11 defining a field-free drift space, an ion reflector 12 and an ion
  • the quadrupole ion trap 10 itself comprises a
  • End-cap electrode 22 has a hole 24 through which ions are
  • End-cap electrode 23 also
  • injector 14 can pass for injection into the trap volume 26 of
  • the ions to be analysed are formed inside the quadrupole ion
  • the external ion injector 14 is
  • the transformer could be replaced by low impedance amplifiers
  • the switches 31, 32 and 33 have another connection which is
  • switch 31 connects the ring electrode 21 to ground whereby to
  • high-voltage power supply 34 is also connected to drift tube
  • Figure shows equi-potential lines 49, in steps of IkV produced
  • the applied voltages has the aforementioned optimum value of
  • spectrometer of this embodiment are prepared by an external ion injector such as by matrix-assisted laser desorption/
  • MALDI atomic layer desorption ionization
  • appearing at the end-cap electrodes may have delays and/or may
  • time-of-flight suffers a time shift equal to half of the rise time of the switching devices measured from appearance of the
  • the negative voltage need not necessarily be switched at the

Abstract

A time-of-flight spectrometer comprises a quadrupole ion trap (10) as an ion source, a drift tube (11) defining a field-free drift space, an ion reflector (12) and an ion detector (13). The quadrupole ion trap (10) has two end-cap electrodes (22, 23) and a ring electrode (21). End-cap electrode (22) has a central hole (24) through which ions to be extracted can pass. High voltage power supplies (34, 35) and associated switching devices (32, 33) are provided to supply extraction voltages to the end-cap electrodes (22, 23). The extraction voltage supplied to end-cap electrode (22) has the opposite polarity to the extraction voltage supplied to the other end-cap electrode (23) being respectively negative and positive voltages for positive ion extraction and respectively positive and negative voltages for negative ion extraction. The magnitude of the extraction voltage supplied to electrode (23) is in the range from 0.5 to 0.8 that of the extraction voltage supplied to electrode (22).

Description

TIME-OF-FLIGHT MASS SPECTROMETER
FIELD OF THE INVENTION
The present invention relates to a time-of-flight mass
spectrometer. More specifically, the invention relates to a
time-of-flight mass spectrometer comprising an ion source in
the form of a quadrupole ion trap, an ion detector and a
field- free drift space between the ion source and the ion
detector. Usually, though not necessarily, there will also be
provided an ion reflector between the ion source and the ion
detector .
BACKGROUND OF THE INVENTION
A quadrupole ion trap comprises a pair of end-cap electrodes
and a ring electrode. One of the end-cap electrodes has a
central hole through which ions can be extracted for
transmission along a field-free drift space. The invention is
particularly concerned with the optimal extraction of ions
from the quadrupole ion trap .
A quadrupole ion trap device is widely used in mass analysis
of ions and/or molecular structure analysis of a chemical
composite by trapping ions using a high voltage
radio-frequency (RF) , selecting specific ions in dependence on
their mass-to-charge ratio, cooling ions by collisions with buffer gas, and many other associated techniques. This area of
application of quadrupole ion trap devices has been discussed
in various articles, for example, in "Practical Aspects of Ion
Trap Mass Spectrometry volume 1 (1995, CRC Press)".
Recently attempts have been made to use a quadrupole ion trap
as an ion source for a time-of-flight mass spectrometer due to
the superior ability of the quadrupole ion trap to cool the
ion energy to a level which is sufficiently low to be suitable
for high resolution analysis of the time-of-flight . While a
time-of-flight mass spectrometer compensates for a spread of
flight times for a certain range of initial ion energies
emitted from the ion source, a reduced spread of flight times
using the smaller range of initial energies in the quadrupole
ion trap gives higher resolution. The disclosure in U.S.
patent 5,569,917 suggests that it is important to optimize the
operational parameters of the quadrupole ion trap to obtain a
high-resolution mass spectrum and a high sensitivity for trace
analysis. This patent discloses a quadrupole ion trap (shown
in Figure 1) utilizing a bipolar extraction field whereby
extraction voltages of the same magnitude (between 200V and
550V) , or almost the same magnitude, but of opposite polarity
are applied to the end-cap electrodes. In a particular example, voltages of +500V and -420V were used, the positive
voltage having a slightly larger value so as to produce a
parallel ion beam after the ions have been emitted into the
field-free drift space of the time-of-flight mass
spectrometer. Post acceleration is also used whereby ions
initially accelerated to an energy of about 500eV in the
quadrupole ion trap continue to be accelerated by an electric
field outside the quadrupole ion trap to obtain an energy
required for time-of-flight mass analysis, usually in the
range from 5keV to 30keV. Ion beam focusing is also affected
by this post-acceleration and this effect is allowed for by
adjustment of the magnitudes of the voltages applied to the
two end-cap electrodes.
It is an object of the present invention to provide a time-of-
flight mass spectrometer incorporating a quadrupole ion trap
having an improved performance .
SUMMARY OF THE INVENTION
According to one aspect of the invention there is provided a
time-of-flight mass spectrometer comprising a quadrupole ion
trap as an ion source, an ion detector and a field-free drift
space between the quadrupole ion trap and the ion detector,
the quadrupole ion trap having a ring electrode and two end- cap electrodes, at least one of the end-cap electrodes having
at least one hole at its centre through which ions can be
extracted in use, and voltage supply means for supplying to
said at least one end-cap electrode a first extraction voltage
relative to the ring electrode and for supplying to another
said end-cap electrode a second extraction voltage relative to
the ring electrode having the opposite polarity to said first
extraction voltage, said first and second extraction voltages
being respectively negative and positive voltages for positive
ion extraction and being respectively positive and negative
voltages for negative ion extraction, the second extraction
voltage having a magnitude in the range from 0.5 to 0.8 of
that of said first extraction voltage.
According to another aspect of the invention there is provided
a method for forming an ion beam using a quadrupole ion trap
having a ring electrode and two end-cap electrodes, at least
one of the end-cap electrodes having at least one hole at its
centre through which ions can be extracted, in use, the method
comprising supplying to said at least one end-cap electrode a
first extraction voltage relative to the ring electrode and
supplying to another said end-cap electrode a second
extraction voltage relative to the ring electrode having the opposite polarity to said first extraction voltage, said first
and second extraction voltages being respectively negative and
positive voltages for positive ion extraction and being
respectively positive and negative voltages for negative ion
extraction, the second extraction voltage having a magnitude
in the range from 0.5 to 0.8 of that of said first extraction
voltage .
According to a yet further aspect of the invention there is
provided a quadrupole ion trap having a ring electrode and two
end-cap electrodes, at least one of the end cap electrodes
having at least one hole at its centre through which ions can
be extracted, in use, and voltage supply means for supplying
to said at least one end-cap electrode a first extraction
voltage relative to the ring electrode and for supplying to
another said end-cap electrode a second extraction voltage
relative to the ring electrode having the opposite polarity to
said first extraction voltage, said first and second
extraction voltages being respectively negative and positive
voltages for positive ion extraction and being respectively
positive and negative voltages for negative ion extraction,
the second extraction voltage having a magnitude in the range
from 0.5 to 0.8 of that of said first extraction voltage. Recent investigations by the inventor into the operation of a
time-of-flight mass spectrometer incorporating a quadrupole
ion trap as the ion source and into the systematic design of
an ion reflector in order to achieve high resolution gave
unexpected results.
Initially, a relatively high extraction field was used inside
the quadrupole ion trap with a view to obtaining the highest
possible electric field for ion extraction whereby to reduce
turn-around time. This was done because turn-around time
tends to dominate time spread in the spectrometer which should
be reduced to achieve higher resolution. The turn-around time
is the time taken by an ion having a small initial velocity
directed away from the extraction end-cap electrode to return
to the initial position with the same velocity but in the
opposite direction. A high extraction field was used inside
the quadrupole ion trap to enable ions to acquire enough
energy for time-of-flight analysis without the need for any
post acceleration following their extraction.
Quite unexpectedly, and contrary to the teaching of US Patent
No. 5,569,917, it was found as a result of these
investigations that the optimum electric field configuration inside the quadrupole ion trap was established when the
magnitude of the second extraction voltage (a positive voltage for positive ions) was only 0.6 that of the first extraction
voltage (a negative voltage for positive ions) and it was also
found that relative magnitudes having a ratio in the range
from 0.5 to 0.8 also gave desirable results. It was found
that when the magnitude of the second extraction voltage was
0.6 that of the first extraction voltage ions inside the ion
trap experienced an acceleration voltage as high as 90% that
of the first extraction voltage.
Slightly curved equi-potential lines concentric to the surface
of the extraction end-cap electrode smoothly accelerate ions
into the hole in the end-cap electrode with slightly
convergent trajectories. However, termination of the electric
field at and around the hole causes a slight divergence which
compensates for the convergent trajectories giving a parallel
ion beam outside the quadrupole ion trap. The curvature of
the equi-potential lines causes a slight shift in the energies
of ions initially occupying a plane perpendicular to the
extraction axis. However, an ion reflector has the capability
to cancel out the effect of this energy shift from the total
flight time measured at the surface of the ion detector. In an example, a first extraction voltage of -lOkV was applied
to the extraction end-cap electrode and a second extraction voltage of +6kV was applied to the other end-cap electrode,
where both extraction voltages are expressed relative to the
voltage on the ring electrode. Ions originating from the
centre of the quadrupole ion trap were found to have an energy
of 9keV after being emitted into a field-free drift space. In
the field- free drift space the ions had almost parallel
trajectories without the need for post-acceleration or an
electrostatic lens to focus the beam, and so the ions were
reflected in the ion reflector towards the ion detector
without any significant loss of intensity thereby achieving
high sensitivity. The inventor considered another possibility
of accelerating the ions using a much higher extraction field
followed by post-deceleration so as to reduce the ion energy
in front of the field-free drift space. The beam divergence
caused by post -deceleration can be compensated by further
reducing the ratio of the extraction voltages. However, this
seems less effective because of the requirement to apply much
higher voltages to the end-cap electrodes than those in
previous examples .
There is another type of voltage configuration in which the field-free drift space and the extraction end-cap electrode
are maintained at ground voltage and the ring electrode and
the other end-cap electrode have applied positive voltages,
namely +10kV and +16kV, respectively. This configuration
doesn't change the relative voltage differences between the
electrodes, but only shifts all the voltages by lOkV. This
has the advantage that the field-free drift space can be at
ground voltage thereby eliminating the need to apply a
floating voltage to the flight tube. Otherwise the voltage
+16kV must be switched at ion extraction, which increases the
practical difficulty of handling higher voltage.
It was found that an approximate time focussing occurs in the
field- free drift space, about 37.4mm from the centre of the
quadrupole ion trap. However, this is not regarded as
important or necessary. The ion reflector can be so designed
as to take into account the time spent in the quadrupole ion
trap so as to produce a much smaller time spread at the ion
detector surface than at the aforementioned approximate time
focussing plane.
In the investigations carried out by the inventor, the
extraction end-cap electrode had a surface provided with a cone-shaped hump around the central hole. The end-cap
electrodes were nominally positioned such that the asymptotes
of the ring and end-cap electrodes were coincident at the
centre of the quadrupole ion trap. Another well known form of
the quadrupole ion trap has a stretched geometry in which both
end-cap electrodes are each moved apart by 0.76mm from their
nominal positions. In this case the optimum electric field
configuration was achieved by applying a first extraction
voltage of -lOkV to the extraction end-cap electrode and a
second extraction voltage of +7kV to the other end-cap
electrode, a ratio of 0.7. It was found that the optimum
ratio of the second voltage to the first voltage increases as
the geometry of the quadrupole ion trap becomes more
stretched. The diameter of the hole in the end-cap electrodes
also affects the optimum ratio of the voltages, but this has
a lesser effect than does the extent of stretching.
BRIEF DESCRIPTION OF THE DRAWINGS
Embodiments of the invention are now described, by way of
example only, with reference to the accompanying drawings of which:
Figure 1 shows a cross-sectional view through a known
quadrupole ion trap and associated drift tube, Figure 2 is a schematic representation of a time-of-flight
mass spectrometer according to the invention, and
Figure 3 is an enlarged cross-sectional view through the
central parts of a quadrupole ion trap used in the time-of-
flight mass spectrometer of Figure 2.
DETAILED DESCRIPTION OF PREFERRED EMBODIMENT
Referring to Figure 2, the time-of-flight mass spectrometer
comprises a quadrupole ion trap 10, a drift tube 11 defining a field-free drift space, an ion reflector 12 and an ion
detector 13. The quadrupole ion trap 10 itself comprises a
ring electrode 21 and two end-cap electrodes 22 and 23.
End-cap electrode 22 has a hole 24 through which ions are
extracted to form an ion beam 28. End-cap electrode 23 also
has a hole 25 through which ions produced by an external ion
injector 14 can pass for injection into the trap volume 26 of
the quadrupole ion trap 10. In an alternative arrangement,
the ions to be analysed are formed inside the quadrupole ion
trap 10. In this case, the external ion injector 14 is
replaced by an electron injector and ions are produced inside
the trap volume 26 of the quadrupole ion trap 10 by electron impact ionization of sample atoms and/or molecules. Three switching devices 31, 32 and 33 normally connect the
ring electrode 21 to an RF generator 15 and end-cap electrodes
22 and 23 to ground through a transformer 17 which produces a dipole electric field inside the quadrupole ion trap 10. The
form of the dipole electric field is determined by the output
of a waveform generator 16 also connected to the transformer
17. This arrangement facilitates a range of different methods
for handling ions, such as selecting or eliminating specific
ions and/or causing fragmentation to perform MS/MS analysis.
The transformer could be replaced by low impedance amplifiers
with opposite polarities.
The switches 31, 32 and 33 have another connection which is
used in an extraction mode when ions are to be extracted from
the trap volume 26 of the quadrupole ion trap 10 and ejected
into the field-free drift space. In the extraction mode,
switch 31 connects the ring electrode 21 to ground whereby to
terminate the RF voltage during the extraction period. Switch
32 connects end-cap electrode 22 to a negative high-voltage
power supply 34 and switch 33 connects end-cap electrode 23 to
a positive high-voltage power supply 35. The negative
high-voltage power supply 34 is also connected to drift tube
11. The described polarities apply when the ions to be analysed are positive. The polarities would be reversed in the case of negative ions.
Referring now to Figure 3 parts of the ring electrode 41, the
end-cap electrodes 42 and 43 having holes 44 and 45,
respectively, part of the drift tube 46 and a part of the
external ion injector 47 are shown on an enlarged scale. This
Figure shows equi-potential lines 49, in steps of IkV produced
when a voltage of -lOkV is applied to the extraction end-cap
electrode 42 and to the drift tube 46 and when a voltage of
+6kV is applied to the other end-cap electrode 43, these
voltages being expressed with respect to the grounded ring
electrode 41. Accordingly, in this embodiment, the ratio of
the applied voltages has the aforementioned optimum value of
0.6. The ions around the centre of the quadrupole ion trap
where the electric potential is about -IkV relative to ground
form an ion beam 48 which initially converges in the direction
of the end-cap electrode 42 and is subsequently caused to
diverge around the hole 44 to form a parallel ion beam in the
field- free drift space.
The ions to be mass analysed in time-of-flight mass
spectrometer of this embodiment are prepared by an external ion injector such as by matrix-assisted laser desorption/
ionization (MALDI) and are selected depending on their
mass-to-charge ratio and concentrated into a small region at
the centre of the quadrupole ion trap 10 using standard
techniques usually adopted in this field. At this moment ions
are trapped by RF electric field produced by the RF generator
15. Before ion extraction, the trapping field is switched off
by the switching device 31 and the extraction voltages are
applied to the end-cap electrodes 22 and 23 using switching
devices 32,33. Provided the switching of the switching device
31 is fast enough the trapping field can be switched off and
the extraction voltages applied at exactly the same time.
However, because of the high voltages involved, the voltages
appearing at the end-cap electrodes may have delays and/or may
exhibit a finite rise time to reach the required values.
Variations in delay times and rise times of the extraction
voltages were investigated and it was found that mass
resolution does not show a significant change, whereas the
time-of-flight suffers a time shift equal to half of the rise time of the switching devices measured from appearance of the
voltages . It will be understood that the positive voltage and
the negative voltage need not necessarily be switched at the
same time nor do they need to have a linear slope to reach their final voltage values nor need they exhibit the same
voltage variation as they approach those values. There may
also be a delay between activation of the two switching
devices 32,33. Ideally, switching of the voltages should have
been completed, and the voltages should have settled to their
final values, within about 200 nanoseconds, and preferably
within about 100 nanoseconds. However, it is necessary that
the switching delay and the pulse shape resulting from the
variation in voltage as a function of time be highly
reproducible so that the same compensating shift in flight
time can be applied each time ions are extracted from the ion
trap.

Claims

1. A time-of-flight mass spectrometer comprising a
quadrupole ion trap as an ion source, an ion detector and a
field-free drift space between the quadrupole ion trap and the
ion source, the quadrupole ion trap having a ring electrode
and two end-cap electrodes, at least one of the end-cap
electrodes having at least one hole at its centre through
which ions can be extracted in use, and voltage supply means
for supplying to said at least one end-cap electrode a first
extraction voltage relative to said ring electrode and for
supplying to another said end-cap electrode a second
extraction voltage relative to said ring electrode having the
opposite polarity to said first extraction voltage, said first
and second extraction voltages being respectively negative and
positive voltages for positive ion extraction and being
respectively positive and negative voltages for negative ion
extraction, the second extraction voltage having a magnitude
in the range from 0.5 to 0.8 of that of said first extraction
voltage .
2. A time-of-flight mass spectrometer as claimed in claim 1,
wherein the ions to be extracted are positive ions, said first extraction voltage is a negative voltage and said second
extraction voltage is a positive voltage.
3. A time-of-flight mass spectrometer as claimed in claim 1,
wherein the ions to be extracted are negative ions, said first
extraction voltage is a positive voltage and said second
extraction voltage is a negative voltage.
4. A time-of-flight mass spectrometer as claimed in any one
of claims 1 to 3 , wherein said second extraction voltage has
a magnitude which is 0.6 that of said first extraction
voltage .
5. A time-of-flight mass spectrometer as claimed in any one
claims 1 to 4 , wherein said first extraction voltage is also
applied to the field-free drift space.
6. A time-of-flight mass spectrometer according to claims 1
to 5, wherein said end-cap electrodes and said ring electrode
enclose a trap volume, the voltage supply means is arranged to
supply to the end cap electrodes further voltages to confine
and/or control ions within said trap volume, and includes
switching means for switching between said further voltages and said first and second extraction voltages.
7. A time-of-flight mass spectrometer as claimed in claim 6
wherein said switching means effects switching from said
further voltages to said first and second extraction voltages
within a time interval of less than 200 nanoseconds.
8. A time-of-flight mass spectrometer as claimed in any one
of claims 1 to 7 wherein the field-free drift space includes
an ion reflector.
9. A method for forming an ion beam using a quadrupole ion
trap having a ring electrode and two end-cap electrodes, at
least one of the end-cap electrodes having at least one hole
at its centre through which ions can be extracted in use, the
method comprising supplying to said at least one end-cap
electrode a first extraction voltage relative to said ring
electrode and supplying to another said end-cap electrode a
second extraction voltage relative to said ring electrode,
having the opposite polarity to said first extraction voltage,
said first and second extraction voltages being respectively
negative and positive voltages for positive ion extraction and
being respectively positive and negative voltages for negative ion extraction; the second extraction voltage having a
magnitude in the range from 0.5 to 0.8 of that of said first
extraction voltage.
10. A method as claimed in claim 9, wherein the ions to be
extracted are positive ions, said first extraction voltage is
a negative voltage and said second extraction voltage is a
positive voltage.
11. A method as claimed in claim 9, wherein the ions to be
extracted are negative ions, said first extraction voltage is
a positive voltage and said second extraction voltage is a
negative voltage.
12. A method as claimed in any one of claims 9 to 11, wherein
said second extraction voltage has a magnitude which is 0.6
that of said first extraction voltage.
13. A method as claimed in any one of claims 9 to 12
including applying said first extraction voltage to a field-
free drift region of a time-of-flight mass spectrometer
incorporating the quadrupole ion trap.
14. A method according to any one of claims 9 to 13 including
applying to the end cap electrodes further voltages suitable
for confining and/or controlling ions within a trap volume
enclosed by the end-cap electrodes and said ring electrode and
including switching between said further voltages and said
first and second extraction voltages.
15. A method as claimed in claim 14 including switching from
said further voltages to said first and second extraction
voltages within a time interval of less than 200 nanoseconds.
16. A quadrupole ion trap having a ring electrode and two
end-cap electrodes, at least one of said end cap electrodes
having at least one hole at its centre through which ions can
be extracted in use, and voltage supply means for supplying to
said at least one end-cap electrode a first extraction voltage
relative to said ring electrode and for supplying to another
said end-cap electrode a second extraction voltage relative to
said ring electrode having the opposite polarity to said first
extraction voltage, said first and second extraction voltages
being respectively negative and positive voltages for positive
ion extraction and being respectively positive and negative
voltages for negative ion extraction, the second extraction voltage having a magnitude in the range from 0.5 to 0.8 of
that of said first extraction voltage.
17. A quadrupole ion trap as claimed in in claim 16, wherein
said second extraction voltage is 0.6 that of said first
extraction voltage.
18. A time-of-flight mass spectrometer substantially as
herein described with reference to Figures 2 and 3 of the
accompanying drawings .
19. A method for forming an ion beam using a quadrupole ion
trap substantially as herein described with reference to
Figures 2 and 3 of the accompanying drawings.
20. A quadrupole ion trap substantially as herein described
with reference to Figures 2 and 3 of the accompanying
drawings .
PCT/GB1999/000084 1998-01-30 1999-01-12 Time-of-flight mass spectrometer WO1999039368A2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
US09/530,091 US6380666B1 (en) 1998-01-30 1999-01-12 Time-of-flight mass spectrometer
EP99901017A EP1051730B1 (en) 1998-01-30 1999-01-12 Quadrupele ion trap and time-of fligt spectrometer with such an ion trap
JP2000529737A JP4132667B2 (en) 1998-01-30 1999-01-12 Time-of-flight mass spectrometer
AU20651/99A AU2065199A (en) 1998-01-30 1999-01-12 Time-of-flight mass spectrometer
DE69906699T DE69906699T2 (en) 1998-01-30 1999-01-12 QUADRUPL ION TRAP AND FLIGHT TIME MASS SPECTROMETER WITH SUCH AN ION TRAP

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9802111.6 1998-01-30
GBGB9802111.6A GB9802111D0 (en) 1998-01-30 1998-01-30 Time-of-flight mass spectrometer

Publications (2)

Publication Number Publication Date
WO1999039368A2 true WO1999039368A2 (en) 1999-08-05
WO1999039368A3 WO1999039368A3 (en) 1999-09-23

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Country Status (7)

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US (1) US6380666B1 (en)
EP (1) EP1051730B1 (en)
JP (1) JP4132667B2 (en)
AU (1) AU2065199A (en)
DE (1) DE69906699T2 (en)
GB (1) GB9802111D0 (en)
WO (1) WO1999039368A2 (en)

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US6483244B1 (en) 1998-12-21 2002-11-19 Shimadzu Research Laboratory (Europe) Ltd. Method of fast start and/or fast termination of a radio frequency resonator
EP1291651A1 (en) * 2000-06-14 2003-03-12 Mitsubishi Heavy Industries, Ltd. Device for detecting chemical substance and method for measuring concentration of chemical substance
US6545268B1 (en) 2000-04-10 2003-04-08 Perseptive Biosystems Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis
EP1302973A2 (en) * 2001-10-10 2003-04-16 Hitachi, Ltd. Mass spectrometer and measurement system and method for TOF mass spectrometry
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AU2065199A (en) 1999-08-16
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US6380666B1 (en) 2002-04-30
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