WO1999039368A3 - Time-of-flight mass spectrometer - Google Patents

Time-of-flight mass spectrometer Download PDF

Info

Publication number
WO1999039368A3
WO1999039368A3 PCT/GB1999/000084 GB9900084W WO9939368A3 WO 1999039368 A3 WO1999039368 A3 WO 1999039368A3 GB 9900084 W GB9900084 W GB 9900084W WO 9939368 A3 WO9939368 A3 WO 9939368A3
Authority
WO
WIPO (PCT)
Prior art keywords
extraction
electrode
ion
voltage supplied
cap
Prior art date
Application number
PCT/GB1999/000084
Other languages
French (fr)
Other versions
WO1999039368A2 (en
Inventor
Eizo Kawato
Original Assignee
Shimadzu Res Lab Europe Ltd
Eizo Kawato
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Res Lab Europe Ltd, Eizo Kawato filed Critical Shimadzu Res Lab Europe Ltd
Priority to US09/530,091 priority Critical patent/US6380666B1/en
Priority to EP99901017A priority patent/EP1051730B1/en
Priority to JP2000529737A priority patent/JP4132667B2/en
Priority to AU20651/99A priority patent/AU2065199A/en
Priority to DE69906699T priority patent/DE69906699T2/en
Publication of WO1999039368A2 publication Critical patent/WO1999039368A2/en
Publication of WO1999039368A3 publication Critical patent/WO1999039368A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods

Abstract

A time-of-flight spectrometer comprises a quadrupole ion trap (10) as an ion source, a drift tube (11) defining a field-free drift space, an ion reflector (12) and an ion detector (13). The quadrupole ion trap (10) has two end-cap electrodes (22, 23) and a ring electrode (21). End-cap electrode (22) has a central hole (24) through which ions to be extracted can pass. High voltage power supplies (34, 35) and associated switching devices (32, 33) are provided to supply extraction voltages to the end-cap electrodes (22, 23). The extraction voltage supplied to end-cap electrode (22) has the opposite polarity to the extraction voltage supplied to the other end-cap electrode (23) being respectively negative and positive voltages for positive ion extraction and respectively positive and negative voltages for negative ion extraction. The magnitude of the extraction voltage supplied to electrode (23) is in the range from 0.5 to 0.8 that of the extraction voltage supplied to electrode (22).
PCT/GB1999/000084 1998-01-30 1999-01-12 Time-of-flight mass spectrometer WO1999039368A2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
US09/530,091 US6380666B1 (en) 1998-01-30 1999-01-12 Time-of-flight mass spectrometer
EP99901017A EP1051730B1 (en) 1998-01-30 1999-01-12 Quadrupele ion trap and time-of fligt spectrometer with such an ion trap
JP2000529737A JP4132667B2 (en) 1998-01-30 1999-01-12 Time-of-flight mass spectrometer
AU20651/99A AU2065199A (en) 1998-01-30 1999-01-12 Time-of-flight mass spectrometer
DE69906699T DE69906699T2 (en) 1998-01-30 1999-01-12 QUADRUPL ION TRAP AND FLIGHT TIME MASS SPECTROMETER WITH SUCH AN ION TRAP

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9802111.6 1998-01-30
GBGB9802111.6A GB9802111D0 (en) 1998-01-30 1998-01-30 Time-of-flight mass spectrometer

Publications (2)

Publication Number Publication Date
WO1999039368A2 WO1999039368A2 (en) 1999-08-05
WO1999039368A3 true WO1999039368A3 (en) 1999-09-23

Family

ID=10826236

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/GB1999/000084 WO1999039368A2 (en) 1998-01-30 1999-01-12 Time-of-flight mass spectrometer

Country Status (7)

Country Link
US (1) US6380666B1 (en)
EP (1) EP1051730B1 (en)
JP (1) JP4132667B2 (en)
AU (1) AU2065199A (en)
DE (1) DE69906699T2 (en)
GB (1) GB9802111D0 (en)
WO (1) WO1999039368A2 (en)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3785042B2 (en) 1998-12-21 2006-06-14 シマヅ リサーチ ラボラトリー（ヨーロッパ）リミティド Method for fast start-up and / or fast exit of radio frequency resonator
US6545268B1 (en) 2000-04-10 2003-04-08 Perseptive Biosystems Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis
CA2381070C (en) * 2000-06-14 2005-04-05 Mitsubishi Heavy Industries, Ltd. Detector of chemical substances and concentration-measuring method of chemical substances
JP3990889B2 (en) * 2001-10-10 2007-10-17 株式会社日立ハイテクノロジーズ Mass spectrometer and measurement system using the same
US6770871B1 (en) 2002-05-31 2004-08-03 Michrom Bioresources, Inc. Two-dimensional tandem mass spectrometry
GB2390935A (en) 2002-07-16 2004-01-21 Anatoli Nicolai Verentchikov Time-nested mass analysis using a TOF-TOF tandem mass spectrometer
US7196324B2 (en) 2002-07-16 2007-03-27 Leco Corporation Tandem time of flight mass spectrometer and method of use
US7102126B2 (en) 2002-08-08 2006-09-05 Micromass Uk Limited Mass spectrometer
GB0218454D0 (en) * 2002-08-08 2002-09-18 Micromass Ltd Mass spectrometer
US6875980B2 (en) 2002-08-08 2005-04-05 Micromass Uk Limited Mass spectrometer
US6794642B2 (en) 2002-08-08 2004-09-21 Micromass Uk Limited Mass spectrometer
JP3800178B2 (en) 2003-01-07 2006-07-26 株式会社島津製作所 Mass spectrometer and mass spectrometry method
CA2517700C (en) 2003-03-19 2009-11-17 Thermo Finnigan Llc Obtaining tandem mass spectrometry data for multiple parent ions in an ion population
US7041968B2 (en) * 2003-03-20 2006-05-09 Science & Technology Corporation @ Unm Distance of flight spectrometer for MS and simultaneous scanless MS/MS
US7947950B2 (en) 2003-03-20 2011-05-24 Stc.Unm Energy focus for distance of flight mass spectometry with constant momentum acceleration and an ion mirror
JP3960306B2 (en) * 2003-12-22 2007-08-15 株式会社島津製作所 Ion trap device
JP4033133B2 (en) 2004-01-13 2008-01-16 株式会社島津製作所 Mass spectrometer
GB0404285D0 (en) * 2004-02-26 2004-03-31 Shimadzu Res Lab Europe Ltd A tandem ion-trap time-of flight mass spectrometer
WO2005106921A1 (en) * 2004-05-05 2005-11-10 Mds Inc. Doing Business Through Its Mds Sciex Division Ion guide for mass spectrometer
CN1326191C (en) * 2004-06-04 2007-07-11 复旦大学 Ion trap quality analyzer constructed with printed circuit board
GB0511386D0 (en) * 2005-06-03 2005-07-13 Shimadzu Res Lab Europe Ltd Method for introducing ions into an ion trap and an ion storage apparatus
JP5107263B2 (en) * 2006-01-11 2012-12-26 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド Ion fragmentation in a mass spectrometer.
CN100424039C (en) * 2006-03-10 2008-10-08 中国科学院金属研究所 Original position reaction hot pressing synthesis TiB2-NbC-SiC refractory ceramics composite material and preparing method thereof
GB0620398D0 (en) * 2006-10-13 2006-11-22 Shimadzu Corp Multi-reflecting time-of-flight mass analyser and a time-of-flight mass spectrometer including the time-of-flight mass analyser
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
RU2447539C2 (en) * 2009-05-25 2012-04-10 Закрытое акционерное общество "Геркон-авто" Time-of-flight quadrupole mass-spectrometre analyser (mass filter, monopole and tripole type)
WO2011066551A1 (en) * 2009-11-30 2011-06-03 Ionwerks, Inc. Time-of-flight spectrometry and spectroscopy of surfaces
DE102012013038B4 (en) * 2012-06-29 2014-06-26 Bruker Daltonik Gmbh Eject an ion cloud from 3D RF ion traps
DE102013208959A1 (en) 2013-05-15 2014-11-20 Carl Zeiss Microscopy Gmbh Apparatus for the mass-selective determination of an ion
CN104377109B (en) * 2013-08-16 2017-10-03 中国人民解放军63975部队 A kind of linear ion trap mass analyzer
CN105849515B (en) * 2013-12-24 2019-04-23 Dh科技发展私人贸易有限公司 High speed polarity switching time of-flight mass spectrometer
GB201409074D0 (en) 2014-05-21 2014-07-02 Thermo Fisher Scient Bremen Ion ejection from a quadrupole ion trap

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5569917A (en) * 1995-05-19 1996-10-29 Varian Associates, Inc. Apparatus for and method of forming a parallel ion beam

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5569917A (en) * 1995-05-19 1996-10-29 Varian Associates, Inc. Apparatus for and method of forming a parallel ion beam

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
ALHEIT R ET AL: "Higher order non-linear resonances in a Paul trap", INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, vol. 154, no. 3, 31 July 1996 (1996-07-31), pages 155-169, XP004036530 *

Also Published As

Publication number Publication date
DE69906699D1 (en) 2003-05-15
JP4132667B2 (en) 2008-08-13
EP1051730B1 (en) 2003-04-09
JP2002502095A (en) 2002-01-22
AU2065199A (en) 1999-08-16
GB9802111D0 (en) 1998-04-01
DE69906699T2 (en) 2003-10-23
WO1999039368A2 (en) 1999-08-05
US6380666B1 (en) 2002-04-30
EP1051730A2 (en) 2000-11-15

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