WO2000011723A1 - Package for an optical sensor - Google Patents
Package for an optical sensor Download PDFInfo
- Publication number
- WO2000011723A1 WO2000011723A1 PCT/US1999/018612 US9918612W WO0011723A1 WO 2000011723 A1 WO2000011723 A1 WO 2000011723A1 US 9918612 W US9918612 W US 9918612W WO 0011723 A1 WO0011723 A1 WO 0011723A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- window
- base substrate
- optical sensor
- encapsulating
- integrated circuit
- Prior art date
Links
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0204—Compact construction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0403—Mechanical elements; Supports for optical elements; Scanning arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/22—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means
- G01J1/24—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means using electric radiation detectors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/50—Constructional details
- H04N23/55—Optical parts specially adapted for electronic image sensors; Mounting thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J2001/0276—Protection
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/15—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on an electrochromic effect
- G02F1/153—Constructional details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
Definitions
- the present invention relates to packaging for integrated circuit optical sensors.
- Integrated circuit optical sensors are increasingly used to provide visual input for control systems as well as in cameras. Many applications place optical sensors in harsh environments, requiring that the sensors be enclosed in a protective package.
- Presently, commercial optical sensor packages are developed from conventional semiconductor packages incorporating clear plastic or add-on windows to conventional molded or ceramic devices. These packaging assemblies are expensive and difficult to manufacture.
- An optical sensor may be used in applications exposing the sensor to a range of light intensities beyond the dynamic range of the sensor.
- a configuration allowing the sensor to operate at low light levels may cause the sensor to wash out at a high light level.
- a scene illuminated by florescent lighting which cycles in intensity with the alternating current supply.
- a pixel array sensor with a high scan rate will have portions of each frame illuminated by varying levels of light.
- an integration period of at least approximately 30 milliseconds must be used. Since the scan time is generally a multiple of the integration time, a camera set to 30 milliseconds scan period for a bright scene may result in an excessively long scan time for a dim scene. Further, particularly if a lens is used to focus light on the sensor, direct exposure to sunlight can generate sufficient heat to damage sensor elements.
- the package should be adaptable to include an electronically controlled variable attenuator.
- Another object of the present invention is to provide a package for an optical sensor that is easy to manufacture.
- Still another object of the present invention is to provide a package for an optical sensor that incorporates an electrically controlled variable attenuator.
- a further object of the present invention is to provide a method for encapsulating an optical sensor.
- a package for encapsulating an integrated circuit optical sensor is described.
- the package is mountable on a support substrate.
- the sensor has a bottom surface and a top surface, the top surface comprising imaging electronics connected to a plurality of sensor bonding pads.
- the sensor bonding pads provide bonding points for connections off the sensor.
- the package includes a base substrate with a top surface and a bottom surface.
- the base substrate is constructed of an insulating material.
- the base substrate top surface has the optical sensor bottom surface bonded thereon. Conductive strips on the base substrate top surface extend from a region near the optical sensor to an edge of the base substrate top surface.
- Wires are bonded on one end to a sensor bonding pad for which connection is desired and on the other end to a corresponding conductive strip.
- a window is bonded to the base substrate top surface in a spaced-apart relationship by a seal material. The window admits light to the optical sensor.
- a means for connecting each conductive strip to a corresponding trace on the support substrate is also provided. The seal material extends around the sensor enclosing each wire but not enclosing any of the connecting means.
- the means for connecting each conductive strip to the corresponding trace on the support substrate includes a plurality of conductive clips, each clip having a connecting section, an opposing section, and at least one joining section joining the connecting section and the opposing section.
- the connecting section and the opposing section are separated by a distance less than the thickness of the base substrate.
- Each clip is placed on the base substrate such that the connecting section is in contact with one conductive strip and the opposing section is in contact with the base substrate bottom surface.
- the support substrate is a through-hole printed circuit board. Clips include a lead allowing the package to be mounted to the through-hole printed circuit board.
- the support substrate is a flexible circuit and each clip can be attached to the flexible circuit.
- clips can be surface mounted to the support substrate.
- the support substrate defines an opening of sufficient size to accept the window without accepting the entire base substrate.
- the means for connecting each conductive strip to a corresponding trace on the support substrate has conductive strips formed to provide clipless bonding points to corresponding traces on the support substrate bottom surface.
- the at least one conductive strip is positioned such that, when the at least one conductive strip is bonded to the corresponding trace, the window is inside the opening.
- a cavity is formed by the base substrate, the window, and the seal material bonding the window and the base substrate.
- the cavity is filled with an optically transparent material.
- This material may be a transparent curable resin.
- the window is a first window.
- the package further includes a first transparent electrode on the top surface of the first window.
- a second window is bonded to the first window in a spaced- apart relationship by a seal material.
- the second window bottom surface has a second transparent electrode thereon.
- the first window, second window, and seal material bonding the second window to the first window form a cavity containing an electrochromic medium of variable transmittance.
- An electrochromic variable attenuator is formed by the first transparent electrode, the second transparent electrode, and the electrochromic medium, the electrochromic variable attenuator able to regulate the intensity of light admitted to the optical sensor.
- the window is coated with a film operative to affect the spectrum of light passing through the window and striking the optical sensor.
- Electro-optic and photochromic filters may be attached to the window.
- One or more lenses may be attached to the window or the window may be formed to function as one or more lenses.
- a method for making the package includes forming a base substrate from a nonconductive material. Conducting strips are deposited on the base substrate top surface, each strip extending from the region onto which the sensor will be attached to an edge of the base substrate top surface. The bottom surface of the sensor is adhered to the base substrate top surface. Wires are bonded between each sensor bonding pad and a corresponding conducting strip. A window is bonded to the base substrate top surface in a spaced-apart relationship using a seal material. The seal material encloses each wire but does not touch an edge of the base substrate top surface.
- the window is one substrate of an electrochromic variable attenuator.
- the method further includes depositing a first transparent electrode on the first window top surface.
- a second window is formed from a nonopaque material, the second window having a bottom surface with a second transparent electrode deposited thereon.
- the second window is bonded to the first window in a spaced-apart relationship using a seal material.
- a cavity is formed by the first window, the second window, and the seal material bonding the second window to the first window.
- At least one opening is formed in the cavity and the cavity is filled with an electrochromic medium. The opening is sealed. Electrical connections are attached to the first transparent electrode and the second transparent electrode.
- the package includes a base substrate constructed of an insulating material. Conductive strips are on the base substrate bottom surface. The optical sensor top surface is flip chip bonded on the base substrate bottom surface such that each sensor bonding pad is connected to a corresponding conductive strip, each conductive strip extending to the edge of the base substrate. A means for connecting each conductive strip to a corresponding trace on the support substrate is also provided.
- the base substrate is transparent, admitting light to the imaging electronics.
- the base substrate is opaque.
- a hole in the base substrate permits the optical sensor imaging electronics to receive light.
- the package further includes a window bonded to the base substrate top surface in a spaced-apart relationship by a seal material. The seal material extends around the hole. The window therefore admitting light to sensor imaging electronics.
- a cover is bonded to the base substrate bottom surface by a seal material in a spaced-apart relationship.
- the optical sensor is coated with a transparent curable resin to provide environmental protection.
- a method for making the package is also provided. The method includes forming a base substrate from a nonconductive material. Conducting strips are deposited on the base substrate bottom surface, each strip extending from the region onto which the sensor will be attached to an edge of the base substrate bottom surface. The sensor top surface is flip chip bonded to the base substrate bottom surface such that each sensor bonding pad is connected to a corresponding conductive strip.
- the sensor includes an optical sensor assembly having an integrated circuit optical sensor disposed within a package, the package including a package window through which light strikes imaging electronics.
- a variable attenuator is bonded to the package surface in a spaced-apart relationship using a seal material extending around the package window.
- FIG. 1 is an overhead view of an embodiment of an optical sensor enclosure according to the present invention
- FIG. 2 is a cross-sectional view of the enclosure shown in FIG. i;
- FIG. 3 is a cross-sectional view of an embodiment of the present invention in which the window is formed as a lens;
- FIG. 4 is a cross-sectional view of an embodiment of the present invention using a clipless technology to directly connect conductive strips to traces on the support substrate;
- FIG. 5 is a cross-sectional view of an embodiment of the present invention that includes an electrochromic variable attenuator
- FIG. 6 is a graph showing the control characteristics of an electrochromic variable attenuator
- FIG. 7 is a flow diagram showing a process for making an embodiment of the present invention.
- FIG. 8 is a cross-sectional view of an embodiment of the present invention using flip chip technology to attach the sensor to the base substrate;
- FIG. 9 is a cross-sectional view of an embodiment of the present invention having a transparent base substrate and including a solid state electrochromic variable attenuator;
- FIG. 10 is a cross-sectional view of an embodiment of the present invention using a transparent curable resin in place of the back cover; and
- FIG. 11 is a flow diagram showing a process for making an embodiment of the present invention with the sensor flip chip bonded to the base substrate.
- FIGS. 1 through 5 and 8 through 10 drawings of embodiments of the present invention are shown. These drawings are not to scale and are provided to show the relationships amongst various elements used to construct the optical sensor package. Further, directional designations such as top and bottom are used for clarity of explanation and are not meant to restrict the present invention to any particular orientation.
- Enclosure assembly 20 is provided to encapsulate optical sensor 22.
- Enclosure assembly 20 is designed to be mounted on support substrate 24 which may be, for example, a printed circuit board, flexible circuit, ceramic substrate, or the like.
- Optical sensor 22 is an integrated circuit chip.
- Optical sensor 22 may be, for example, an image sensor including an array of pixel sensors and support electronics.
- Light sensitive imaging electronics such as pixel sensors, are constructed on the top side of optical sensor 22. Imaging electronics are connected to sensor bonding pads 26 that provide bonding points for connections off the sensor. Bonding pads 26 have been are not shown in cross- sectional views for clarity.
- - l o in the embodiment shown in FIGS 1 and 2 optical sensor 22 is attached to the top side of base substrate 28 by adhering the bottom side of optical sensor 22 to base substrate 28.
- Base substrate 28 may be constructed from a nonconducting material such as glass or ceramic.
- Conductive strips one of which is indicated by 30, conduct signals and supply voltages between optical sensor 22 and the edge of base substrate 28.
- Wire 32 connects pads on optical sensor 22 with conductive strips 30.
- a means for connecting each conductive strip 30 with a corresponding trace 34 on support substrate 24 is provided. Various means are discussed with regards to FIGS. 1 through 4.
- Clip 36 has connecting section 38, opposing section 40, and joining section 42 having at least one curved section joining connecting section 38 and opposing section 40 such that connecting section 38 and opposing section 40 are separated by a distance less than the thickness of base substrate 28.
- Clip 36 is slid onto the edge of base substrate 28 such that connecting section 38 is in contact with conductive strip 26 and opposing section 40 is in contact with base substrate 28 bottom surface.
- clip 36 is formed to allow enclosure assembly 20 to be reflow soldered as a surface mount part, forming solder joint 44.
- a lead is formed as part of clip 36 allowing enclosure assembly 20 to be mounted on a through-hole printed circuit board.
- Clip 36 with a lead is shown in FIG. 3.
- Clip 36 can be modified to support various techniques for mounting enclosure assembly 20 to support substrate 24.
- Seal material 46 surrounds optical sensor 22, enclosing each wire 32. Seal material 46 is placed far enough from the edge of base substrate 28 that seal material 46 does not interfere with the assembly of clip 36 onto base substrate 28.
- Window 48 is bonded to base substrate 28 in a spaced-apart relationship, the spacing distance determined by seal material 46. Window 48 allows light rays 50 to strike imaging electronics on optical sensor 22.
- Base substrate 28, seal material 46, and window 48 form cavity 52 containing optical sensor 22.
- seal material 46 may be accomplished in a variety of manners.
- a single polymer collar surrounding optical sensor 22 may be used.
- a plurality of posts may be distributed around optical sensor 22.
- a sealant may be applied to either the collar or the posts.
- seal material 46 is a combination of a sealant material and a spacing material.
- the sealant material may be epoxy resin, silicones, rubber cement, low melting temperature glass, certain plastics, paraffin wax, or the like.
- the spacing material may be small glass beads, nylon mono filament, MYLAR ® strips, polystyrene beads, or the like.
- a preferred seal material 46 is a mixture of glass beads with epoxy resin sealant.
- Window 48 may be glass or plastic and may be transparent or nearly transparent (nonopaque). Window 48 may be coated with one or more films to transmit or reject portions of the spectrum of light rays 50. Window 48 may also be manufactured with dyes or fillers within window 48 to allow filtering of light rays 50.
- base substrate 28, seal material 46, and window 48 form a hermetically sealed enclosure around optical sensor 22.
- cavity 52 is filled with an optically transparent curable resin such as epoxy.
- the resin may be self curing or may be cured by exposure to heat, ultraviolet light, an electron beam, or the like.
- Mechanisms for reducing the intensity of light reaching optical sensor 22 may be attached to or formed on window 48.
- Window 48 may be coated with a photochromic material.
- Various electro-optic variable attenuators may be placed in front of window 48 such as liquid crystal devices, dipolar suspension devices, electrophoretic devices, suspended particle devices such as those available from Research Frontiers Inc. of Woodbury, New York, electrochromic devices, and the like.
- Electrochromic devices contain an electrochromic medium which darkens in response to an applied voltage.
- the electrochromic medium includes electroactive cathodic and anodic materials that may be independently chosen from at least the categories of solution-phase, surface-confined, and deposition.
- Solution phase media a material is contained in solution in an ionically conducting electrolyte. The material remains in solution when electrochemically reduced or oxidized.
- Solution phase electroactive materials may be contained in the continuous solution phase of a free-standing gel as described in U.S. Patent Application Serial Number 08/616,967 entitled “Improved Electrochromic Layer And Devices Comprising Same” by W. L.
- a material In surface-confined or solid state media, a material is attached directly to an electrically conducting electrode or confined in close proximity thereto. The material remains attached or confined when electrochemically reduced or oxidized.
- electrodeposition a material confined in solution in an ionically conducting electrolyte forms a layer on the electrically conducting electrode when electrochemically reduced or oxidized.
- Window 48 may be constructed to incorporate one or more lenses as shown by window 54.
- a lens may be formed on the top surface, bottom surface, or both surfaces of window 54.
- window 54 may be an assembly, allowing multiple lenses of differing material to be placed over optical sensor 22. Further, one or more lenses may be attached to window 48 to create window 54.
- FIG. 3 also shows clip 36 with attached pin 56, allowing enclosure assembly 20 to be mounted on through-hole printed circuit board support substrate 24.
- Clip 36 with attached pin 56 may be of the type known as SOLLOK from Berg Electronics of Etters, Pennsylvania.
- FIG. 4 a cross-sectional view of an embodiment of the present invention using a clipless technology to directly connect conductive strips to traces on the support substrate is shown.
- base substrate 28 may be mounted to support substrate 24 using a clipless technology.
- Support substrate 24 defines an opening, shown generally by 58, of sufficient size to accept window 48 without allowing base substrate 28 to pass through.
- the means for connecting each conductive strip 30 to the corresponding trace 34 on supporting substrate 24 includes forming conductive strip 30 to provide a clipless bonding point to the corresponding trace 34 on support substrate 24. Any suitable clipless technology may be used.
- solder paste 60 is deposited on a wettable region of conductive strip 30.
- a matching solder wettable terminal footprint is made on trace 34.
- Base substrate 28 is aligned to support substrate 24 and all solder joints are made simultaneously by reflowing solder paste 60.
- FIG. 5 a cross-sectional view of an embodiment of the present invention that includes a solution-phase electrochromic variable attenuator is shown.
- An electrochromic variable attenuator shown generally by 62, is operative to vary transmittance of light in response to an electrical signal.
- the operation and construction of an electrochromic device that may be used as electrochromic variable attenuator 62 is described in "Single-Compartment, Self-Erasing, Solution-Phase Electrochromic Devices, Solutions for Use Therein, and Uses Thereof," U.S. Patent Number 4,902, 108 to H. J. Byker and hereby incorporated by reference.
- Electrochromic variable attenuator 62 comprises two non-opaque conductors, referred to as transparent conductors, separated by a reversible variably transmittant solution.
- First window 48 onto the top surface of which is deposited first transparent electrode 64, forms the first conductor.
- Second window 66 onto the bottom surface of which is deposited second transparent electrode 68, forms the second conductor.
- First window 48 and second window 66 are bonded together in a spaced-apart relationship by seal material 70.
- First window 48, second window 66, and seal material 70 form cavity 72, which contains electrochromic medium 74.
- First window 48 and second window 66 may be constructed of glass or plastic.
- Window 48,66 may be coated with one or more barrier coatings to protect the plastic from the electrochromic materials, reduce abrasion, and reduce the transmission of contaminants such as moisture and oxygen.
- Window 48,66 may also be coated to reduce glare, transmit certain spectra, or reject unwanted spectra.
- the coatings can be transparent, partially transparent, conductive, or partially conductive as required by the function of optical sensor 22.
- Window 48,66 may be also be filled with a dye to provide desired filtering properties.
- a thickness for each substrate of between 0.05 cm and 1 cm may be used with a thickness between 0.16 cm and 0.21 cm preferred.
- First transparent electrode 64 and second transparent electrode 68 may be made of any conductive material that will adhere to the surface of first window 48 and second window 66, that will transmit light, and that will not cause significant degradation of electrochromic medium 74. Possible materials include transparent layers of gold, tin oxide, ruthenium oxide, cadmium starmate, zinc sulfate, and, preferably, indium-doped tin oxide (ITO). First transparent electrode 64 and second transparent electrode 68 will preferably cover the entire surface of first window 48 and second window 66 respectively within cavity 72 and extend outside of cavity 72 into a region on which a connection can be made.
- ITO indium-doped tin oxide
- Electrochromic medium 74 preferably comprises a solvent, at least one cathodic electrochromic compound, and at least one anodic electrochromic compound.
- An inert current-carrying electrolyte may be added if all cathodic and anodic compounds in their zero-potential equilibrium states 5 are not ionic in solution 74.
- solution 74 may be gelled or thickened with a cross-linked polymer matrix such as IEMA/MMA cross-linked with a dial as described in Tonar et al. , serial number 08/616,967.
- a large number of combinations of solvents, cathodic electrochromic compounds and anodic electrochromic compounds may be used, as described in Byker.
- One such 0 combination is a solution of 0.05 M 1 , 1 '-dibenzyl-4,4'-bipyridinium difluorborate and 0.05 M 5, 10-dihydro-5,10-dimethylphenazine in propylene carbonate.
- first transparent electrode 64 extends to an edge of first window 5 48 and second transparent electrode 68 extends to an edge of second window
- Clip 76 is attached to each window 48,66 in contact with the respective electrode 64,68.
- Clip 76 may be of the type described in U.S. Patent Application Serial Number 08/917,643 entitled "An Improved Clip For Use With Transparent Conductive Electrodes In Electrochromic Devices" by W. o Tonar et al which is hereby incorporated by reference.
- Wire 78, attached to clip 76 supplies a control signal to the respective electrode 64,68.
- an exposed strip of each electrode extends beyond cavity 72.
- a conductive strip or wire is attached to the exposed strip and extends beyond the edge of the corresponding window 48,66. This 5 embodiment is further described in Byker.
- connections to clips 36,76 are through flexible printed circuits.
- Clip 36,76 may be bonded to a flexible printed circuit using an existing technology such as, for example, chip-on-flex by HEI Inc., which supports both chip and wire as well as flip chip flexible printed circuit connection technologies.
- FIG. 6 a graph showing the control characteristics of electrochromic variable attenuator 62 is shown.
- the curve shown generally as 90, indicates increasing attenuation along the decreasing vertical axis.
- the attenuation is low.
- curve section 92 when the control voltage applied across electrodes 64,68 increases from 0 to approximately 0.35 volts, electrochromic variable attenuator 62 becomes slightly attenuating.
- curve section 94 As control voltage is increased, the attenuation increasing smoothly with increasing control voltage as shown by curve section 94. A maximum attenuation is achieved when the applied control voltage is a little over one volt, as shown in curve section 96.
- Curve 90 indicates that electrochromic variable attenuator 62 can provide a variable level of attenuation.
- curve 90 is typical of a fairly wide class of solution phase electrochromic devices, is reasonably reproducible from one unit to another, and is reasonably stable with temperature. However, temperature compensation may optionally be included in using the voltage setting to control the attenuation of electrochromic variable attenuator 62.
- the maximum attenuation attainable by electrochromic variable attenuator 62 is adjustable over a wide range. Increasing the concentration of solution 74 or height of cavity 72 in general increases the maximum attenuation.
- a variable attenuator is bonded to the top of a standard optical sensor.
- Enclosure assembly 20 is replaced with a commercially available optical sensor such as, for example, the Photobit PB-159.
- Such sensors have a package window through which imaging electronics can view a scene.
- a variable attenuator such as a liquid crystal window, a solid state electrochromic window or, preferably, electrochromic variable attenuator 62, is attached in front of the package window.
- the variable attenuator is bonded to the standard optical sensor in a spaced-apart relationship by a seal material such as seal material 46.
- FIG. 7 a flow diagram of a manufacturing process according to the present invention is shown. As will be appreciated by one of ordinary skill in the art, the operations illustrated are not necessarily sequential operations.
- Base substrate is formed in block 100. If glass is used, base substrate 28 may be formed from a large sheet of glass having the desired substrate thickness. The glass sheet can be scored or scribed with a set of horizontal and vertical lines using a diamond wheel or the like. The glass sheet is then broken along the scribed lines with spacing between lines determining the surface size of base substrate 28.
- Conductive strips are deposited in block 102.
- a mask is formed on the top surface of base substrate 28 having openings over each area on which conducting strips 26 will be deposited.
- One or more conducting materials or a combination of conducting materials such as gold, platinum, copper, aluminum or chrome rhodium, is sputtered onto the substrate top surface. The mask is then removed leaving conductive strips 30.
- a conducting material is deposited on the top surface of base substrate 28.
- a mask is formed on the conducting material, the mask covering areas on which each conductive strip 30 will be formed. Base substrate 28 is then exposed to an etchant that dissolves the conducting material not covered by the mask without substantially attacking the material protected by the mask.
- conductive strips 30 are removed leaving conductive strips 30.
- a conductor formed of successive layers of chrome, rhodium, and gold is formed on the surface of base substrate 28. Regions of the conductor are selectively removed with a Nd:YAG laser leaving conductive strips 30.
- conductive strips 30 may be screened and fired or cured.
- optical sensor is adhered to the base substrate in block 104.
- the bottom surface of optical sensor 22 is bonded to base substrate 28.
- Wires are bonded in block 106.
- Wire 32 is used to connect sensor bonding pad 26 on optical sensor 22 with a corresponding conductive strip 26. Methods for bonding wires between pads and metal strips are well known in the art of integrated circuit manufacturing.
- the window is bonded in block 108.
- a bead of seal material 46 is made on the top surface of base substrate 28 around the periphery of bonded wires 32. Seal material 46 is placed far enough from the edge of base substrate
- seal material 46 includes an epoxy sealant which can be thermal cured or cured by exposure to ultraviolet light. For thermally cured seals, the package is heated prior to bonding window 48 onto base substrate 28 to prevent pressure build up due to expanding gas within cavity 52.
- the seal formed between base substrate 28 and window 48 is a hermetic seal.
- window 48 can be separated from base substrate 28 by distances ranging between approximately 0.0025 cm and approximately 0.05 cm.
- cavity 52 formed by base substrate 28, seal material 46, and window 48 is partially or completely filled with a transparent curable resin.
- clips are inserted in block 110.
- Base substrate 28 extends beyond window 48, exposing portions of conductive strips 30.
- U- or C-shaped clips 36 are placed on base substrate 28.
- Each clip 36 has a conductive portion in contact with a corresponding conductive strip 30 and an opposing portion in contact with the bottom surface of base substrate 28.
- Clip 36 may be soldered to conductive strip 30 to increase adhesion and improve electrical conduction.
- window 48 is a substrate of an electro-optic attenuator such as electrochromic variable attenuator 62.
- the operation of placing the window in block 108 installs the electro-optic attenuator into enclosure assembly 20. Additional constructions that may be used to implement an electrochromic variable attenuator that may be used as an electro-optic attenuator are described in Byker.
- electrochromic variable attenuator 62 is built onto window 48.
- First window 48 and second window 66 are formed prior to assembly. If constructed of glass, window 48,66 can be made in a manner similar to that used to make base substrate 28.
- First transparent electrode 64 and second transparent electrode 68 are formed on first window 48 and second window 66 respectively.
- an optically transparent layer of metal or a metal alloy are deposited onto the substrate. This deposition may occur prior to cutting the substrate pieces or after forming windows 48,66.
- the sheet resistance of electrodes 64,68 should be less than 100 ohms per square and, preferably, less than 40 ohms per square. The electrodes do not have to cover the entire surface of windows 48,66.
- Second window 66 is bonded to first window 48 in a spaced- apart relationship using seal material 70.
- First window 48 is positioned such that first transparent electrode 64 is on the top surface of first window 48.
- Second window 66 is positioned such that second electrode 68 is on the bottom surface of second window 66. Bonding first window 48 to second window 66 may be accomplished in the same manner that first window 48 is bonded to base substrate 28 as described in block 108.
- seal material 70 may have the same construction as described for seal material 46
- Electrochromic medium 74 is poured into cavity 72 through one hole while air escapes through the other hole. Cavity 72 may be completely filled or may be substantially filled to allow room for expansion. The two holes are plugged, first with a thermoplastic material inert to electrochromic medium 74 then with a sealant such as epoxy.
- FIG. 8 a cross-sectional view of an embodiment of the present invention implemented using a flip chip technology is shown.
- the top of optical sensor 22 is directly flip chip bonded to the bottom of base substrate 28.
- Base substrate 28 is inverted with respect to the views provided in FIGS. 2 through 5 above in order to consistently show the light direction coming from above. Hence, what was referred to as the top of base substrate 28 in FIGS. 1 through 5 and FIG. 7 becomes the bottom of base substrate 28 in FIGS. 8 through 11.
- solder bump 120 joins sensor bonding pad 26, not shown for clarity, with a matching footprint on conductive strip 30.
- base substrate 28 is not transparent.
- Base substrate 28 includes hole 122.
- Optical sensor 22 is mounted on base substrate 28 such that imaging electronics on optical sensor 22 are positioned to accept light rays 50 through hole 122.
- seal material 124 surrounds hole 122.
- Window 126 is bonded to base substrate 28 top surface in a spaced-apart relationship using seal material 124.
- Seal material 124 and window 126 may be constructed in manners described for seal material 46 and window 48 respectively in FIGS. 1 through 7 above. Similarly, window 126 may be used in place of window 48 in all embodiments described with regards to FIGS. 1 through 7 above.
- seal material 128 and cover 130 are included to protect the back side of optical sensor 22.
- cover 130 is preferably opaque.
- Seal material 128 and cover 130 may be constructed as described for seal material 46 and window 48 with regards to FIGS. 1 through 7 above.
- FIG. 9 a cross-sectional view of an embodiment of the present invention having a transparent base substrate is shown.
- Transparent base substrate 140 admits light rays 50 onto imaging electronics on optical sensor 22. This embodiment eliminates the need for hole 122, seal material 124, and window 126.
- Transparent base substrate 140 may be used as window 48 in the various embodiments and options described with regards to FIGS. 1 through 7 above.
- electrochromic variable attenuator 62 may be built using transparent base substrate 140 as first window 48 or an electro-optic attenuator, such as electrochromic variable attenuator 62, may be attached to the top of base substrate 140.
- transparent base substrate 140 may be formed as one or more lens 54, may support one or more lens, may be coated with films, and may incorporate dyes or fillers.
- Transparent base substrate 140 may also be used as the substrate of a solid state electrochromic attenuator. This embodiment is shown in FIG.
- the top surface of transparent base substrate 140 is coated with first transparent electrode 142.
- Cathodic electrochromic layer 144 is built on first transparent electrode 142.
- Cathodic electrochromic layer 144 may be comprised of a solid state cathodic material such as, for example, WO 3 .
- Lithium-containing polymeric electrolyte layer 146 is built on cathodic electrochromic layer 144.
- Anodic electrochromic layer 148 is built on polymeric electrolyte layer 146.
- Anodic electrochromic layer 148 may be comprised of oxides of nickel, titanium, cerium, iridium, or the like.
- Second transparent electrode 150 is built on anodic electrochromic layer 148.
- First transparent electrode 142 and second transparent electrode 150 may be comprised of gold, tin oxide, ruthenium oxide, cadmium stannate, zinc sulfate, indium-doped tin oxide (ITO), or the like. Portions of first transparent electrode 142 may extend from underneath covering layers 144, 146,148, 150 to allow for electrical connection. If clips, such as clip 36, are used to connect conductive strips 30 on transparent base substrate 140 to traces 34 on support substrate 24, additional clips may be used to provide control signals to first transparent electrode 142 and second transparent electrode 150. If clipless bonding is used to join transparent base substrate 140 to support substrate 24, wires may be bonded between transparent electrodes 142,150 and corresponding bonding pads on support substrate 24.
- FIG. 10 a cross-sectional view of an embodiment of the present invention using a transparent curable resin in place of a back cover is shown.
- spacer 128 and cover 130 may be replaced or supplemented by a coating of transparent curable resin 154, such as epoxy, around sensor 22.
- the resin may be self curing or may be cured by exposure to heat, ultraviolet light, an electron beam, or the like.
- any of the embodiments described with regards to FIGS. 8 through 10 may use any of the means for connecting each conductive strip 30 to a corresponding trace 34 on the support substrate described with regards to FIGS. 1 through 4 and 7 above. These include clips for direct solder mount or through hole mount to support substrate 24, clipless attachment to support substrate 24, and connection to flexible circuit support substrate 24.
- FIG. 11 a flow diagram showing a process for making an embodiment of the present invention with the sensor flip chip bonded to the base substrate is shown. As will be appreciated by one of ordinary skill in the art, the operations illustrated are not necessarily sequential operations.
- Base substrate 28, 140 is formed in block 160.
- Base substrate 28,140 may be formed as described with regards to block 100 in FIG. 7 above.
- hole 122 is formed for opaque base substrate 28, hole 122 is formed for opaque base substrate 28, hole 122 is formed.
- Conductive strips are deposited in block 162. Techniques that may be used to form conductive strips 30 on the bottom of base substrate 28 are described with regards to block 102 in FIG. 7 above.
- the sensor integrated circuit is flip chip bonded to the base substrate in block 164.
- the top of optical sensor 22 is bonded to the bottom of base substrate 28 using a flip chip technology such as tape-automated bonding, fluxless solder bumps, isotropic conductive adhesives, anisotropic conductive adhesives, metal bumps, compliant bumps, pressure contacts, and the like.
- solder bump 120 is deposited on wettable metal sensor bonding pad 26.
- a matching solder wettable terminal footprint is made with conductive strip 30 on base substrate 28,140.
- Optical sensor 22 is aligned to base substrate 28, 140 and all solder joints are made simultaneously by reflowing solder bump 120.
- seal material 124 is used to bond window 126 to substrate 28.
- Seal material 124 may be formed as described with regards to forming seal material 46 in block 108 of FIG. 7.
- Window 126 may be bonded to base substrate 28 as described with regards to window 48 in block 108 of FIG. 7.
- seal material 128 and cover 130 may be added as described with regards to seal material 46 and window 48 in block 108 respectively of FIG. 7.
Abstract
Description
Claims
Priority Applications (1)
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AU54884/99A AU5488499A (en) | 1998-08-21 | 1999-08-17 | Package for an optical sensor |
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US09/137,909 | 1998-08-21 | ||
US09/137,909 US6130448A (en) | 1998-08-21 | 1998-08-21 | Optical sensor package and method of making same |
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WO2000011723A1 true WO2000011723A1 (en) | 2000-03-02 |
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PCT/US1999/018612 WO2000011723A1 (en) | 1998-08-21 | 1999-08-17 | Package for an optical sensor |
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US (2) | US6130448A (en) |
AU (1) | AU5488499A (en) |
WO (1) | WO2000011723A1 (en) |
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Also Published As
Publication number | Publication date |
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AU5488499A (en) | 2000-03-14 |
US6130448A (en) | 2000-10-10 |
US6621616B1 (en) | 2003-09-16 |
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