WO2001001849A1 - Closed loop optical coherence topography - Google Patents
Closed loop optical coherence topography Download PDFInfo
- Publication number
- WO2001001849A1 WO2001001849A1 PCT/AU2000/000802 AU0000802W WO0101849A1 WO 2001001849 A1 WO2001001849 A1 WO 2001001849A1 AU 0000802 W AU0000802 W AU 0000802W WO 0101849 A1 WO0101849 A1 WO 0101849A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sample
- path length
- light
- topology
- path
- Prior art date
Links
Classifications
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
- A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
- A61B3/107—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for determining the shape or measuring the curvature of the cornea
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/20—Dispersive element for generating dispersion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/35—Mechanical variable delay line
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/65—Spatial scanning object beam
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Ophthalmology & Optometry (AREA)
- Medical Informatics (AREA)
- Biophysics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Biomedical Technology (AREA)
- Heart & Thoracic Surgery (AREA)
- Radiology & Medical Imaging (AREA)
- Molecular Biology (AREA)
- Surgery (AREA)
- Animal Behavior & Ethology (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU55143/00A AU5514300A (en) | 1999-07-02 | 2000-06-30 | Closed loop optical coherence topography |
EP00940060A EP1204366A1 (en) | 1999-07-02 | 2000-06-30 | Closed loop optical coherence topography |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AUPQ1398 | 1999-07-02 | ||
AUPQ1398A AUPQ139899A0 (en) | 1999-07-02 | 1999-07-02 | Closed loop optical coherence topography |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2001001849A1 true WO2001001849A1 (en) | 2001-01-11 |
Family
ID=3815587
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/AU2000/000802 WO2001001849A1 (en) | 1999-07-02 | 2000-06-30 | Closed loop optical coherence topography |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1204366A1 (en) |
AU (1) | AUPQ139899A0 (en) |
WO (1) | WO2001001849A1 (en) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003052345A1 (en) * | 2001-12-18 | 2003-06-26 | Massachusetts Institute Of Technology | System and method for measuring optical distance |
WO2003098312A1 (en) * | 2002-05-22 | 2003-11-27 | Carl Zeiss Meditec Ag | Optical coherence tomography scanner with negative field curvature |
GB2435322A (en) * | 2006-02-15 | 2007-08-22 | Oti Ophthalmic Technologies | Measuring curvature or axial position using OCT |
US7365858B2 (en) | 2001-12-18 | 2008-04-29 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
EP1975550A1 (en) * | 2007-03-28 | 2008-10-01 | Kabushiki Kaisha Topcon | Optical image measurement device |
US7557929B2 (en) | 2001-12-18 | 2009-07-07 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
CN107752985A (en) * | 2017-11-17 | 2018-03-06 | 苏州阿格斯医疗技术有限公司 | OCT image method, OCT image conduit and OCT systems |
WO2019227170A1 (en) * | 2018-06-01 | 2019-12-05 | OncoRes Medical Pty Ltd | A method and device for evaluating a mechanical property of a material |
WO2020054280A1 (en) * | 2018-09-12 | 2020-03-19 | 株式会社トプコン | Ophthalmological imaging device, control method thereof, program, and storage medium |
WO2021131020A1 (en) * | 2019-12-27 | 2021-07-01 | 株式会社ニコン | Scanning method, scanning device, and scanning program |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1994018521A1 (en) * | 1993-02-08 | 1994-08-18 | Zygo Corporation | Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms |
WO1994018523A1 (en) * | 1993-02-01 | 1994-08-18 | Zygo Corporation | Method and apparatus for the rapid acquisition of data in coherence scanning interferometry |
WO1999001716A1 (en) * | 1997-07-01 | 1999-01-14 | David Macpherson | Ablation profiler |
-
1999
- 1999-07-02 AU AUPQ1398A patent/AUPQ139899A0/en not_active Abandoned
-
2000
- 2000-06-30 EP EP00940060A patent/EP1204366A1/en not_active Withdrawn
- 2000-06-30 WO PCT/AU2000/000802 patent/WO2001001849A1/en not_active Application Discontinuation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1994018523A1 (en) * | 1993-02-01 | 1994-08-18 | Zygo Corporation | Method and apparatus for the rapid acquisition of data in coherence scanning interferometry |
WO1994018521A1 (en) * | 1993-02-08 | 1994-08-18 | Zygo Corporation | Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms |
WO1999001716A1 (en) * | 1997-07-01 | 1999-01-14 | David Macpherson | Ablation profiler |
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8334982B2 (en) | 2001-12-18 | 2012-12-18 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
US7557929B2 (en) | 2001-12-18 | 2009-07-07 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
US6934035B2 (en) | 2001-12-18 | 2005-08-23 | Massachusetts Institute Of Technology | System and method for measuring optical distance |
US9528817B2 (en) | 2001-12-18 | 2016-12-27 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
WO2003052345A1 (en) * | 2001-12-18 | 2003-06-26 | Massachusetts Institute Of Technology | System and method for measuring optical distance |
US7365858B2 (en) | 2001-12-18 | 2008-04-29 | Massachusetts Institute Of Technology | Systems and methods for phase measurements |
WO2003098312A1 (en) * | 2002-05-22 | 2003-11-27 | Carl Zeiss Meditec Ag | Optical coherence tomography scanner with negative field curvature |
US7841719B2 (en) | 2006-02-15 | 2010-11-30 | Oti Ophthalmic Technologies Inc | Method and apparatus for determining the shape, distance and orientation of an object |
GB2435322A (en) * | 2006-02-15 | 2007-08-22 | Oti Ophthalmic Technologies | Measuring curvature or axial position using OCT |
EP1975550A1 (en) * | 2007-03-28 | 2008-10-01 | Kabushiki Kaisha Topcon | Optical image measurement device |
CN107752985A (en) * | 2017-11-17 | 2018-03-06 | 苏州阿格斯医疗技术有限公司 | OCT image method, OCT image conduit and OCT systems |
WO2019227170A1 (en) * | 2018-06-01 | 2019-12-05 | OncoRes Medical Pty Ltd | A method and device for evaluating a mechanical property of a material |
US11293746B2 (en) | 2018-06-01 | 2022-04-05 | OncoRes Medical Pty Ltd | Method and device for evaluating a mechanical property of a material |
WO2020054280A1 (en) * | 2018-09-12 | 2020-03-19 | 株式会社トプコン | Ophthalmological imaging device, control method thereof, program, and storage medium |
JP2020039667A (en) * | 2018-09-12 | 2020-03-19 | 株式会社トプコン | Ophthalmic imaging apparatus, control method thereof, program, and recording medium |
WO2021131020A1 (en) * | 2019-12-27 | 2021-07-01 | 株式会社ニコン | Scanning method, scanning device, and scanning program |
Also Published As
Publication number | Publication date |
---|---|
AUPQ139899A0 (en) | 1999-07-29 |
EP1204366A1 (en) | 2002-05-15 |
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