WO2001058558A3 - Process for removing volatile organic compounds from an air stream and apparatus therefor - Google Patents
Process for removing volatile organic compounds from an air stream and apparatus therefor Download PDFInfo
- Publication number
- WO2001058558A3 WO2001058558A3 PCT/CA2001/000176 CA0100176W WO0158558A3 WO 2001058558 A3 WO2001058558 A3 WO 2001058558A3 CA 0100176 W CA0100176 W CA 0100176W WO 0158558 A3 WO0158558 A3 WO 0158558A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- organic compounds
- volatile organic
- droplets
- removing volatile
- air stream
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D53/00—Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols
- B01D53/14—Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols by absorption
- B01D53/18—Absorbing units; Liquid distributors therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D53/00—Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols
- B01D53/14—Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases, aerosols by absorption
- B01D53/1487—Removing organic compounds
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02A—TECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE
- Y02A50/00—TECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE in human health protection, e.g. against extreme weather
- Y02A50/20—Air quality improvement or preservation, e.g. vehicle emission control or emission reduction by using catalytic converters
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Analytical Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Treating Waste Gases (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU33544/01A AU3354401A (en) | 2000-02-14 | 2001-02-14 | Process for removing volatile organic compounds from an air stream and apparatustherefor |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US50312000A | 2000-02-14 | 2000-02-14 | |
US09/503,120 | 2000-02-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2001058558A2 WO2001058558A2 (en) | 2001-08-16 |
WO2001058558A3 true WO2001058558A3 (en) | 2001-12-27 |
Family
ID=24000800
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/CA2001/000176 WO2001058558A2 (en) | 2000-02-14 | 2001-02-14 | Process for removing volatile organic compounds from an air stream and apparatus therefor |
Country Status (3)
Country | Link |
---|---|
US (1) | US6621274B2 (en) |
AU (1) | AU3354401A (en) |
WO (1) | WO2001058558A2 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2385011A (en) * | 2002-02-07 | 2003-08-13 | Accentus Plc | Treatment of contaminated gas |
EP1489641B1 (en) * | 2003-06-18 | 2019-08-14 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Charged particle deflecting system |
US7160741B2 (en) * | 2003-11-06 | 2007-01-09 | Chartered Semiconductor Manufacturing Ltd. | Planar voltage contrast test structure and method |
US20060103378A1 (en) * | 2004-11-12 | 2006-05-18 | Nader Pakdaman | Apparatus and method for dynamic diagnostic testing of integrated circuits |
JP5110240B2 (en) * | 2005-05-27 | 2012-12-26 | 日油株式会社 | Lubricating oil composition for refrigerator |
BRPI0705256B1 (en) * | 2007-11-26 | 2018-03-06 | Georg Kraus Hans | Gas wash and closed circuit biological treatment system for washing water, gas scrubbing equipment and equipment for biological washing water treatment |
CN112090239A (en) * | 2020-09-21 | 2020-12-18 | 郑夏媛 | Toxic gas collecting equipment for asphalt paving in high-temperature environment |
Citations (6)
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GB1454846A (en) * | 1973-05-02 | 1976-11-03 | Lerner B J | Gas-liquid contacting apparatus and method |
US4171961A (en) * | 1976-08-27 | 1979-10-23 | Babcock-BSH Aktiengesellschaft Buttner-Schilde-Haas AG | Arrangement for intercepting entrained contaminants from a gaseous medium in a scrubbing liquid |
US4371382A (en) * | 1980-08-06 | 1983-02-01 | Caribbean Properties Limited | Process and apparatus for the contact and separation of immiscible fluids |
DE3403705A1 (en) * | 1984-02-03 | 1985-08-08 | Saarbergwerke AG, 6600 Saarbrücken | Plant for wet purification of power station flue gases |
EP0200695A1 (en) * | 1985-04-23 | 1986-11-05 | Abb Fläkt Ab | Contact reactor |
EP0380817A1 (en) * | 1989-02-03 | 1990-08-08 | Gerardus Louis Beusen | A method and a device for treating or mixing components in gas or liquid streams |
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US3549999A (en) | 1968-06-05 | 1970-12-22 | Gen Electric | Method and apparatus for testing circuits by measuring secondary emission electrons generated by electron beam bombardment of the pulsed circuit |
GB1286454A (en) | 1968-08-24 | 1972-08-23 | Cambridge Scientific Instr Ltd | Surface potential analysis by electron beams |
GB1246744A (en) | 1969-01-02 | 1971-09-15 | Graham Stuart Plows | Electron beam apparatus |
US3628012A (en) | 1969-04-03 | 1971-12-14 | Graham Stuart Plows | Scanning stereoscopic electron microscope |
DE2207546A1 (en) | 1972-02-18 | 1973-08-23 | Ibm Deutschland | PROCEDURE FOR CHECKING ELECTRICAL CONTINUITY |
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DE2813947C2 (en) | 1978-03-31 | 1986-09-04 | Siemens AG, 1000 Berlin und 8000 München | Method for contactless measurement of the potential profile in an electronic component and arrangement for carrying out the method |
DE2814049A1 (en) | 1978-03-31 | 1979-10-18 | Siemens Ag | METHOD FOR CONTACTLESS MEASUREMENT OF THE POTENTIAL DEVELOPMENT IN AN ELECTRONIC COMPONENT AND ARRANGEMENT FOR PERFORMING THE METHOD |
DE2903077C2 (en) | 1979-01-26 | 1986-07-17 | Siemens AG, 1000 Berlin und 8000 München | Method for contactless potential measurement on an electronic component and arrangement for carrying out the method |
US4300147A (en) | 1979-03-26 | 1981-11-10 | Image Graphics, Inc. | System for accurately tracing with a charged particle beam on film |
DE3036734A1 (en) | 1980-09-29 | 1982-05-06 | Siemens AG, 1000 Berlin und 8000 München | METHOD FOR MEASURING RESISTORS AND CAPACITIES OF ELECTRONIC COMPONENTS |
US4415851A (en) | 1981-05-26 | 1983-11-15 | International Business Machines Corporation | System for contactless testing of multi-layer ceramics |
US4578279A (en) | 1981-05-26 | 1986-03-25 | International Business Machines Corporation | Inspection of multilayer ceramic circuit modules by electrical inspection of unfired green sheets |
DE3138929A1 (en) | 1981-09-30 | 1983-04-14 | Siemens AG, 1000 Berlin und 8000 München | IMPROVED SECONDARY ELECTRON SPECTROMETER FOR POTENTIAL MEASUREMENT ON A SAMPLE WITH AN ELECTRON PROBE |
JPS5932145A (en) | 1982-08-16 | 1984-02-21 | Hitachi Ltd | Potential detector |
DE3235461A1 (en) | 1982-09-24 | 1984-03-29 | Siemens AG, 1000 Berlin und 8000 München | METHOD FOR THE CONTACT-LESS TESTING OF AN OBJECT, IN PARTICULAR OF MICROWIRD WIRES, WITH A CARPULAR RAY PROBE |
WO1984004819A1 (en) | 1983-05-25 | 1984-12-06 | Battelle Memorial Institute | Method for inspecting and testing an electric device of the printed or integrated circuit type |
US4575630A (en) | 1984-01-30 | 1986-03-11 | Ibm Corporation | Electron-beam testing of semiconductor wafers |
US4985681A (en) | 1985-01-18 | 1991-01-15 | Siemens Aktiengesellschaft | Particle beam measuring method for non-contact testing of interconnect networks |
EP0196804B1 (en) | 1985-03-11 | 1991-01-23 | Nippon Telegraph And Telephone Corporation | Method and apparatus for testing integrated electronic device |
GB8515250D0 (en) | 1985-06-17 | 1985-07-17 | Texas Instruments Ltd | Testing of integrated circuits |
DE3685331D1 (en) | 1986-10-23 | 1992-06-17 | Ibm | METHOD FOR TESTING BOARDS FOR INTEGRATED CIRCUITS BY MEANS OF A LASER IN A VACUUM. |
US4843330A (en) | 1986-10-30 | 1989-06-27 | International Business Machines Corporation | Electron beam contactless testing system with grid bias switching |
US4829243A (en) | 1988-02-19 | 1989-05-09 | Microelectronics And Computer Technology Corporation | Electron beam testing of electronic components |
US4816755A (en) | 1988-03-02 | 1989-03-28 | Wright State University | Method and apparatus for measuring photoresistivity and photo hall-effect of semiconductor wafers |
US4857839A (en) | 1988-03-02 | 1989-08-15 | Wright State University | Method and apparatus for measuring average resistivity and hall-effect of semiconductor wafers |
US4943769A (en) | 1989-03-21 | 1990-07-24 | International Business Machines Corporation | Apparatus and method for opens/shorts testing of capacitively coupled networks in substrates using electron beams |
US5057773A (en) | 1989-03-21 | 1991-10-15 | International Business Machines Corporation | Method for opens/shorts testing of capacitively coupled networks in substrates using electron beams |
JPH03101041A (en) | 1989-09-14 | 1991-04-25 | Hitachi Ltd | Voltage measuring device by use of electron beam |
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US5258706A (en) | 1991-10-16 | 1993-11-02 | Siemens Aktiengesellschaft | Method for the recognition of testing errors in the test of microwirings |
JP3377101B2 (en) | 1991-12-04 | 2003-02-17 | セイコーインスツルメンツ株式会社 | Operation analysis method and device of integrated circuit using focused ion beam |
JP3730263B2 (en) | 1992-05-27 | 2005-12-21 | ケーエルエー・インストルメンツ・コーポレーション | Apparatus and method for automatic substrate inspection using charged particle beam |
US5717204A (en) | 1992-05-27 | 1998-02-10 | Kla Instruments Corporation | Inspecting optical masks with electron beam microscopy |
US5404110A (en) | 1993-03-25 | 1995-04-04 | International Business Machines Corporation | System using induced current for contactless testing of wiring networks |
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JP3472971B2 (en) | 1994-07-15 | 2003-12-02 | 株式会社アドバンテスト | IC failure analysis method and failure analysis device |
JP2861849B2 (en) | 1994-08-31 | 1999-02-24 | 日本電気株式会社 | Wiring test method and device on semiconductor integrated circuit chip |
US5614833A (en) | 1994-10-25 | 1997-03-25 | International Business Machines Corporation | Objective lens with large field deflection system and homogeneous large area secondary electron extraction field |
US5602489A (en) | 1994-12-02 | 1997-02-11 | Alcedo | Switch potential electron beam substrate tester |
US5638005A (en) | 1995-06-08 | 1997-06-10 | Schlumberger Technologies Inc. | Predictive waveform acquisition |
US5781017A (en) | 1996-04-26 | 1998-07-14 | Sandia Corporation | Capacitive charge generation apparatus and method for testing circuits |
US6359451B1 (en) * | 2000-02-11 | 2002-03-19 | Image Graphics Incorporated | System for contactless testing of printed circuit boards |
-
2001
- 2001-02-14 WO PCT/CA2001/000176 patent/WO2001058558A2/en active Application Filing
- 2001-02-14 AU AU33544/01A patent/AU3354401A/en not_active Abandoned
- 2001-11-08 US US10/008,760 patent/US6621274B2/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1454846A (en) * | 1973-05-02 | 1976-11-03 | Lerner B J | Gas-liquid contacting apparatus and method |
US4171961A (en) * | 1976-08-27 | 1979-10-23 | Babcock-BSH Aktiengesellschaft Buttner-Schilde-Haas AG | Arrangement for intercepting entrained contaminants from a gaseous medium in a scrubbing liquid |
US4371382A (en) * | 1980-08-06 | 1983-02-01 | Caribbean Properties Limited | Process and apparatus for the contact and separation of immiscible fluids |
DE3403705A1 (en) * | 1984-02-03 | 1985-08-08 | Saarbergwerke AG, 6600 Saarbrücken | Plant for wet purification of power station flue gases |
EP0200695A1 (en) * | 1985-04-23 | 1986-11-05 | Abb Fläkt Ab | Contact reactor |
EP0380817A1 (en) * | 1989-02-03 | 1990-08-08 | Gerardus Louis Beusen | A method and a device for treating or mixing components in gas or liquid streams |
Also Published As
Publication number | Publication date |
---|---|
US20020089333A1 (en) | 2002-07-11 |
WO2001058558A2 (en) | 2001-08-16 |
US6621274B2 (en) | 2003-09-16 |
AU3354401A (en) | 2001-08-20 |
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