WO2001071780A3 - Apparatus and method for electrochemically processing a microelectronic workpiece - Google Patents
Apparatus and method for electrochemically processing a microelectronic workpiece Download PDFInfo
- Publication number
- WO2001071780A3 WO2001071780A3 PCT/US2001/009149 US0109149W WO0171780A3 WO 2001071780 A3 WO2001071780 A3 WO 2001071780A3 US 0109149 W US0109149 W US 0109149W WO 0171780 A3 WO0171780 A3 WO 0171780A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- electrode
- fluid flow
- processing
- flow region
- microelectronic workpiece
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/008—Current shielding devices
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/002—Cell separation, e.g. membranes, diaphragms
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/007—Current directing devices
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/08—Electroplating with moving electrolyte e.g. jet electroplating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
Abstract
A method and apparatus for electrochemically processing a microelectronic workpiece. The apparatus can include one or more walls defining a processing space configured to contain a processing fluid. The processing space can include at least a first fluid flow region and a second fluid flow region. A first electrode can be disposed in the processing fluid of the first fluid flow region while a second electrode can be coupled to a portion of the microelectronic workpiece, and can be disposed in the processing fluid of the second fluid flow region. Fluid flow within the first fluid flow region can be directed generally toward the first electrode and away from the second electrode while fluid flow within the second fluid flow region can be directed generally toward the second electrode and away from the first electrode. The first electrode may include either an anode or a cathode. A third electrode can be positioned external to the processing space to clean the second electrode and/or control the electrochemical process.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2001287255A AU2001287255A1 (en) | 2000-03-21 | 2001-03-21 | Apparatus and method for electrochemically processing a microelectronic workpiece |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/531,828 | 2000-03-21 | ||
US09/531,828 US6368475B1 (en) | 2000-03-21 | 2000-03-21 | Apparatus for electrochemically processing a microelectronic workpiece |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2001071780A2 WO2001071780A2 (en) | 2001-09-27 |
WO2001071780A3 true WO2001071780A3 (en) | 2004-12-23 |
Family
ID=24119217
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2001/009149 WO2001071780A2 (en) | 2000-03-21 | 2001-03-21 | Apparatus and method for electrochemically processing a microelectronic workpiece |
Country Status (3)
Country | Link |
---|---|
US (4) | US6368475B1 (en) |
AU (1) | AU2001287255A1 (en) |
WO (1) | WO2001071780A2 (en) |
Families Citing this family (84)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6258220B1 (en) * | 1998-11-30 | 2001-07-10 | Applied Materials, Inc. | Electro-chemical deposition system |
US20060157355A1 (en) * | 2000-03-21 | 2006-07-20 | Semitool, Inc. | Electrolytic process using anion permeable barrier |
US8852417B2 (en) | 1999-04-13 | 2014-10-07 | Applied Materials, Inc. | Electrolytic process using anion permeable barrier |
US8236159B2 (en) | 1999-04-13 | 2012-08-07 | Applied Materials Inc. | Electrolytic process using cation permeable barrier |
US20060189129A1 (en) * | 2000-03-21 | 2006-08-24 | Semitool, Inc. | Method for applying metal features onto barrier layers using ion permeable barriers |
US8475636B2 (en) | 2008-11-07 | 2013-07-02 | Novellus Systems, Inc. | Method and apparatus for electroplating |
US8308931B2 (en) * | 2006-08-16 | 2012-11-13 | Novellus Systems, Inc. | Method and apparatus for electroplating |
US6527920B1 (en) * | 2000-05-10 | 2003-03-04 | Novellus Systems, Inc. | Copper electroplating apparatus |
US6821407B1 (en) | 2000-05-10 | 2004-11-23 | Novellus Systems, Inc. | Anode and anode chamber for copper electroplating |
US7622024B1 (en) * | 2000-05-10 | 2009-11-24 | Novellus Systems, Inc. | High resistance ionic current source |
US20050145499A1 (en) * | 2000-06-05 | 2005-07-07 | Applied Materials, Inc. | Plating of a thin metal seed layer |
US6740221B2 (en) | 2001-03-15 | 2004-05-25 | Applied Materials Inc. | Method of forming copper interconnects |
US6800187B1 (en) * | 2001-05-31 | 2004-10-05 | Novellus Systems, Inc. | Clamshell apparatus for electrochemically treating wafers |
US6551487B1 (en) | 2001-05-31 | 2003-04-22 | Novellus Systems, Inc. | Methods and apparatus for controlled-angle wafer immersion |
US7239747B2 (en) * | 2002-01-24 | 2007-07-03 | Chatterbox Systems, Inc. | Method and system for locating position in printed texts and delivering multimedia information |
US20030188974A1 (en) * | 2002-04-03 | 2003-10-09 | Applied Materials, Inc. | Homogeneous copper-tin alloy plating for enhancement of electro-migration resistance in interconnects |
US6875331B2 (en) * | 2002-07-11 | 2005-04-05 | Applied Materials, Inc. | Anode isolation by diffusion differentials |
US20040217005A1 (en) * | 2002-07-24 | 2004-11-04 | Aron Rosenfeld | Method for electroplating bath chemistry control |
US7128823B2 (en) | 2002-07-24 | 2006-10-31 | Applied Materials, Inc. | Anolyte for copper plating |
US7223323B2 (en) * | 2002-07-24 | 2007-05-29 | Applied Materials, Inc. | Multi-chemistry plating system |
US7247222B2 (en) * | 2002-07-24 | 2007-07-24 | Applied Materials, Inc. | Electrochemical processing cell |
US20040026255A1 (en) * | 2002-08-06 | 2004-02-12 | Applied Materials, Inc | Insoluble anode loop in copper electrodeposition cell for interconnect formation |
US20040118699A1 (en) * | 2002-10-02 | 2004-06-24 | Applied Materials, Inc. | Homogeneous copper-palladium alloy plating for enhancement of electro-migration resistance in interconnects |
US7374646B2 (en) * | 2003-01-31 | 2008-05-20 | Ebara Corporation | Electrolytic processing apparatus and substrate processing method |
US20040253742A1 (en) * | 2003-01-31 | 2004-12-16 | Affleck Rhett L. | Automated imaging system and method |
US20050016857A1 (en) * | 2003-07-24 | 2005-01-27 | Applied Materials, Inc. | Stabilization of additives concentration in electroplating baths for interconnect formation |
US20050092602A1 (en) * | 2003-10-29 | 2005-05-05 | Harald Herchen | Electrochemical plating cell having a membrane stack |
US20050092601A1 (en) * | 2003-10-29 | 2005-05-05 | Harald Herchen | Electrochemical plating cell having a diffusion member |
US8623193B1 (en) | 2004-06-16 | 2014-01-07 | Novellus Systems, Inc. | Method of electroplating using a high resistance ionic current source |
US20060102467A1 (en) * | 2004-11-15 | 2006-05-18 | Harald Herchen | Current collimation for thin seed and direct plating |
KR100651919B1 (en) * | 2005-09-29 | 2006-12-01 | 엘지전자 주식회사 | Mobile telecommunication device having function for adjusting recording rate and method thereby |
US7985325B2 (en) * | 2007-10-30 | 2011-07-26 | Novellus Systems, Inc. | Closed contact electroplating cup assembly |
US7935231B2 (en) * | 2007-10-31 | 2011-05-03 | Novellus Systems, Inc. | Rapidly cleanable electroplating cup assembly |
US8518224B2 (en) * | 2007-11-02 | 2013-08-27 | Acm Research (Shanghai) Inc. | Plating apparatus for metallization on semiconductor workpiece |
US11225727B2 (en) | 2008-11-07 | 2022-01-18 | Lam Research Corporation | Control of current density in an electroplating apparatus |
US10011917B2 (en) | 2008-11-07 | 2018-07-03 | Lam Research Corporation | Control of current density in an electroplating apparatus |
US8172992B2 (en) * | 2008-12-10 | 2012-05-08 | Novellus Systems, Inc. | Wafer electroplating apparatus for reducing edge defects |
US9512538B2 (en) | 2008-12-10 | 2016-12-06 | Novellus Systems, Inc. | Plating cup with contoured cup bottom |
US8475637B2 (en) * | 2008-12-17 | 2013-07-02 | Novellus Systems, Inc. | Electroplating apparatus with vented electrolyte manifold |
US8262871B1 (en) | 2008-12-19 | 2012-09-11 | Novellus Systems, Inc. | Plating method and apparatus with multiple internally irrigated chambers |
US9455139B2 (en) | 2009-06-17 | 2016-09-27 | Novellus Systems, Inc. | Methods and apparatus for wetting pretreatment for through resist metal plating |
US9677188B2 (en) | 2009-06-17 | 2017-06-13 | Novellus Systems, Inc. | Electrofill vacuum plating cell |
US20100320081A1 (en) * | 2009-06-17 | 2010-12-23 | Mayer Steven T | Apparatus for wetting pretreatment for enhanced damascene metal filling |
US7923628B2 (en) * | 2009-09-09 | 2011-04-12 | International Business Machines Corporation | Method of controlling the composition of a photovoltaic thin film |
US9138784B1 (en) | 2009-12-18 | 2015-09-22 | Novellus Systems, Inc. | Deionized water conditioning system and methods |
US20110226613A1 (en) * | 2010-03-19 | 2011-09-22 | Robert Rash | Electrolyte loop with pressure regulation for separated anode chamber of electroplating system |
US9385035B2 (en) | 2010-05-24 | 2016-07-05 | Novellus Systems, Inc. | Current ramping and current pulsing entry of substrates for electroplating |
US8795480B2 (en) | 2010-07-02 | 2014-08-05 | Novellus Systems, Inc. | Control of electrolyte hydrodynamics for efficient mass transfer during electroplating |
US10233556B2 (en) | 2010-07-02 | 2019-03-19 | Lam Research Corporation | Dynamic modulation of cross flow manifold during electroplating |
US9523155B2 (en) | 2012-12-12 | 2016-12-20 | Novellus Systems, Inc. | Enhancement of electrolyte hydrodynamics for efficient mass transfer during electroplating |
US10094034B2 (en) | 2015-08-28 | 2018-10-09 | Lam Research Corporation | Edge flow element for electroplating apparatus |
US9624592B2 (en) | 2010-07-02 | 2017-04-18 | Novellus Systems, Inc. | Cross flow manifold for electroplating apparatus |
US9404194B2 (en) | 2010-12-01 | 2016-08-02 | Novellus Systems, Inc. | Electroplating apparatus and process for wafer level packaging |
US9005409B2 (en) | 2011-04-14 | 2015-04-14 | Tel Nexx, Inc. | Electro chemical deposition and replenishment apparatus |
US9017528B2 (en) | 2011-04-14 | 2015-04-28 | Tel Nexx, Inc. | Electro chemical deposition and replenishment apparatus |
US9028666B2 (en) | 2011-05-17 | 2015-05-12 | Novellus Systems, Inc. | Wetting wave front control for reduced air entrapment during wafer entry into electroplating bath |
US9221081B1 (en) | 2011-08-01 | 2015-12-29 | Novellus Systems, Inc. | Automated cleaning of wafer plating assembly |
US9988734B2 (en) | 2011-08-15 | 2018-06-05 | Lam Research Corporation | Lipseals and contact elements for semiconductor electroplating apparatuses |
US10066311B2 (en) | 2011-08-15 | 2018-09-04 | Lam Research Corporation | Multi-contact lipseals and associated electroplating methods |
US9228270B2 (en) | 2011-08-15 | 2016-01-05 | Novellus Systems, Inc. | Lipseals and contact elements for semiconductor electroplating apparatuses |
WO2013148890A1 (en) | 2012-03-28 | 2013-10-03 | Novellus Systems, Inc. | Methods and apparatuses for cleaning electroplating substrate holders |
TWI609100B (en) | 2012-03-30 | 2017-12-21 | 諾發系統有限公司 | Cleaning electroplating substrate holders using reverse current deplating |
US9068272B2 (en) | 2012-11-30 | 2015-06-30 | Applied Materials, Inc. | Electroplating processor with thin membrane support |
US9746427B2 (en) | 2013-02-15 | 2017-08-29 | Novellus Systems, Inc. | Detection of plating on wafer holding apparatus |
US10416092B2 (en) | 2013-02-15 | 2019-09-17 | Lam Research Corporation | Remote detection of plating on wafer holding apparatus |
US9613833B2 (en) | 2013-02-20 | 2017-04-04 | Novellus Systems, Inc. | Methods and apparatus for wetting pretreatment for through resist metal plating |
US9670588B2 (en) | 2013-05-01 | 2017-06-06 | Lam Research Corporation | Anisotropic high resistance ionic current source (AHRICS) |
US9449808B2 (en) | 2013-05-29 | 2016-09-20 | Novellus Systems, Inc. | Apparatus for advanced packaging applications |
US10190232B2 (en) * | 2013-08-06 | 2019-01-29 | Lam Research Corporation | Apparatuses and methods for maintaining pH in nickel electroplating baths |
US9677190B2 (en) | 2013-11-01 | 2017-06-13 | Lam Research Corporation | Membrane design for reducing defects in electroplating systems |
US9303329B2 (en) | 2013-11-11 | 2016-04-05 | Tel Nexx, Inc. | Electrochemical deposition apparatus with remote catholyte fluid management |
US9435049B2 (en) | 2013-11-20 | 2016-09-06 | Lam Research Corporation | Alkaline pretreatment for electroplating |
US9732434B2 (en) | 2014-04-18 | 2017-08-15 | Lam Research Corporation | Methods and apparatuses for electroplating nickel using sulfur-free nickel anodes |
US9481942B2 (en) | 2015-02-03 | 2016-11-01 | Lam Research Corporation | Geometry and process optimization for ultra-high RPM plating |
US9617648B2 (en) | 2015-03-04 | 2017-04-11 | Lam Research Corporation | Pretreatment of nickel and cobalt liners for electrodeposition of copper into through silicon vias |
US9816194B2 (en) | 2015-03-19 | 2017-11-14 | Lam Research Corporation | Control of electrolyte flow dynamics for uniform electroplating |
US10014170B2 (en) | 2015-05-14 | 2018-07-03 | Lam Research Corporation | Apparatus and method for electrodeposition of metals with the use of an ionically resistive ionically permeable element having spatially tailored resistivity |
US10053793B2 (en) | 2015-07-09 | 2018-08-21 | Lam Research Corporation | Integrated elastomeric lipseal and cup bottom for reducing wafer sticking |
US10364505B2 (en) | 2016-05-24 | 2019-07-30 | Lam Research Corporation | Dynamic modulation of cross flow manifold during elecroplating |
US11001934B2 (en) | 2017-08-21 | 2021-05-11 | Lam Research Corporation | Methods and apparatus for flow isolation and focusing during electroplating |
US10781527B2 (en) | 2017-09-18 | 2020-09-22 | Lam Research Corporation | Methods and apparatus for controlling delivery of cross flowing and impinging electrolyte during electroplating |
US10760178B2 (en) | 2018-07-12 | 2020-09-01 | Lam Research Corporation | Method and apparatus for synchronized pressure regulation of separated anode chamber |
EP3868923A1 (en) * | 2020-02-19 | 2021-08-25 | Semsysco GmbH | Electrochemical deposition system for a chemical and/or electrolytic surface treatment of a substrate |
PL3910095T3 (en) * | 2020-05-11 | 2022-05-23 | Semsysco Gmbh | Distribution system for a process fluid for chemical and/or electrolytic surface treatment of a rotatable substrate |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999016936A1 (en) * | 1997-09-30 | 1999-04-08 | Semitool, Inc. | Electroplating system having auxiliary electrode exterior to main reactor chamber for contact cleaning operations |
WO1999025902A1 (en) * | 1997-11-13 | 1999-05-27 | Novellus Systems, Inc. | Membrane partition system for plating of wafers |
JPH11350185A (en) * | 1998-06-12 | 1999-12-21 | Electroplating Eng Of Japan Co | Cup type plating apparatus and wafer plating method using the same |
Family Cites Families (101)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US1526644A (en) * | 1922-10-25 | 1925-02-17 | Williams Brothers Mfg Company | Process of electroplating and apparatus therefor |
US3309263A (en) * | 1964-12-03 | 1967-03-14 | Kimberly Clark Co | Web pickup and transfer for a papermaking machine |
US3716462A (en) * | 1970-10-05 | 1973-02-13 | D Jensen | Copper plating on zinc and its alloys |
US3798033A (en) * | 1971-05-11 | 1974-03-19 | Spectral Data Corp | Isoluminous additive color multispectral display |
US3930963A (en) * | 1971-07-29 | 1976-01-06 | Photocircuits Division Of Kollmorgen Corporation | Method for the production of radiant energy imaged printed circuit boards |
US3798003A (en) * | 1972-02-14 | 1974-03-19 | E Ensley | Differential microcalorimeter |
DE2244434C3 (en) * | 1972-09-06 | 1982-02-25 | Schering Ag, 1000 Berlin Und 4619 Bergkamen | Aqueous bath for the galvanic deposition of gold and gold alloys |
US4001094A (en) * | 1974-09-19 | 1977-01-04 | Jumer John F | Method for incremental electro-processing of large areas |
US4072557A (en) * | 1974-12-23 | 1978-02-07 | J. M. Voith Gmbh | Method and apparatus for shrinking a travelling web of fibrous material |
US4137867A (en) * | 1977-09-12 | 1979-02-06 | Seiichiro Aigo | Apparatus for bump-plating semiconductor wafers |
US4134802A (en) * | 1977-10-03 | 1979-01-16 | Oxy Metal Industries Corporation | Electrolyte and method for electrodepositing bright metal deposits |
US4246088A (en) * | 1979-01-24 | 1981-01-20 | Metal Box Limited | Method and apparatus for electrolytic treatment of containers |
SU921124A1 (en) * | 1979-06-19 | 1982-04-15 | Институт Физико-Химических Основ Переработки Минерального Сырья Со Ан Ссср | Method of metallization of printed circuit board apertures |
GB2071151B (en) * | 1980-03-10 | 1983-04-07 | Ibm | Trivalent chromium electroplating |
US4259166A (en) * | 1980-03-31 | 1981-03-31 | Rca Corporation | Shield for plating substrate |
US4437943A (en) * | 1980-07-09 | 1984-03-20 | Olin Corporation | Method and apparatus for bonding metal wire to a base metal substrate |
DE3171220D1 (en) * | 1980-09-02 | 1985-08-08 | Heraeus Schott Quarzschmelze | Method of and apparatus for transferring semiconductor wafers between carrier members |
US4323433A (en) * | 1980-09-22 | 1982-04-06 | The Boeing Company | Anodizing process employing adjustable shield for suspended cathode |
US4443117A (en) * | 1980-09-26 | 1984-04-17 | Terumo Corporation | Measuring apparatus, method of manufacture thereof, and method of writing data into same |
SE8101046L (en) | 1981-02-16 | 1982-08-17 | Europafilm | DEVICE FOR PLANTS, Separate for the matrices of gramophone discs and the like |
JPS57198315U (en) * | 1981-06-12 | 1982-12-16 | ||
JPS584382A (en) * | 1981-06-26 | 1983-01-11 | ファナック株式会社 | Control system for industrial robot |
US4378283A (en) * | 1981-07-30 | 1983-03-29 | National Semiconductor Corporation | Consumable-anode selective plating apparatus |
JPS58149189A (en) * | 1982-03-01 | 1983-09-05 | セイコーインスツルメンツ株式会社 | Turning lifting mechanism of industrial robot |
US4440597A (en) * | 1982-03-15 | 1984-04-03 | The Procter & Gamble Company | Wet-microcontracted paper and concomitant process |
US4585539A (en) * | 1982-08-17 | 1986-04-29 | Technic, Inc. | Electrolytic reactor |
US4500394A (en) * | 1984-05-16 | 1985-02-19 | At&T Technologies, Inc. | Contacting a surface for plating thereon |
US4634503A (en) * | 1984-06-27 | 1987-01-06 | Daniel Nogavich | Immersion electroplating system |
US4639028A (en) * | 1984-11-13 | 1987-01-27 | Economic Development Corporation | High temperature and acid resistant wafer pick up device |
DE3500005A1 (en) * | 1985-01-02 | 1986-07-10 | ESB Elektrostatische Sprüh- und Beschichtungsanlagen G.F. Vöhringer GmbH, 7758 Meersburg | COATING CABIN FOR COATING THE SURFACE OF WORKPIECES WITH COATING POWDER |
US4576685A (en) * | 1985-04-23 | 1986-03-18 | Schering Ag | Process and apparatus for plating onto articles |
US4648944A (en) * | 1985-07-18 | 1987-03-10 | Martin Marietta Corporation | Apparatus and method for controlling plating induced stress in electroforming and electroplating processes |
JPH088723B2 (en) * | 1985-11-02 | 1996-01-29 | 日立機電工業株式会社 | Conveyor device using linear motor |
BR8607061A (en) * | 1985-12-24 | 1988-02-23 | Gould Inc | PROCESS AND APPLIANCE FOR ELECTROGALVANIZATION OF COPPER SHEET |
JP2624703B2 (en) * | 1987-09-24 | 1997-06-25 | 株式会社東芝 | Method and apparatus for forming bump |
DE3735449A1 (en) * | 1987-10-20 | 1989-05-03 | Convac Gmbh | MANUFACTURING SYSTEM FOR SEMICONDUCTOR SUBSTRATES |
US4902398A (en) * | 1988-04-27 | 1990-02-20 | American Thim Film Laboratories, Inc. | Computer program for vacuum coating systems |
US5235995A (en) * | 1989-03-27 | 1993-08-17 | Semitool, Inc. | Semiconductor processor apparatus with dynamic wafer vapor treatment and particulate volatilization |
US4988533A (en) * | 1988-05-27 | 1991-01-29 | Texas Instruments Incorporated | Method for deposition of silicon oxide on a wafer |
DE3818757A1 (en) * | 1988-05-31 | 1989-12-07 | Mannesmann Ag | PORTAL OF AN INDUSTRIAL ROBOT |
JPH03125453A (en) * | 1989-10-09 | 1991-05-28 | Toshiba Corp | Semiconductor wafer transfer device |
US5000827A (en) * | 1990-01-02 | 1991-03-19 | Motorola, Inc. | Method and apparatus for adjusting plating solution flow characteristics at substrate cathode periphery to minimize edge effect |
US5186594A (en) * | 1990-04-19 | 1993-02-16 | Applied Materials, Inc. | Dual cassette load lock |
US5370741A (en) * | 1990-05-15 | 1994-12-06 | Semitool, Inc. | Dynamic semiconductor wafer processing using homogeneous chemical vapors |
KR0153250B1 (en) * | 1990-06-28 | 1998-12-01 | 카자마 겐쥬 | Vertical heat-treating apparatus |
US5368711A (en) * | 1990-08-01 | 1994-11-29 | Poris; Jaime | Selective metal electrodeposition process and apparatus |
US5078852A (en) * | 1990-10-12 | 1992-01-07 | Microelectronics And Computer Technology Corporation | Plating rack |
US5096550A (en) * | 1990-10-15 | 1992-03-17 | The United States Of America As Represented By The United States Department Of Energy | Method and apparatus for spatially uniform electropolishing and electrolytic etching |
DE69220519T2 (en) * | 1991-03-04 | 1998-02-19 | Toda Kogyo Corp | Process for plating a bonded magnet and bonded magnet with a metal coating |
EP1120817B8 (en) * | 1991-03-26 | 2007-10-10 | Ngk Insulators, Ltd. | Use of a corrosion-resistant member |
US5178512A (en) * | 1991-04-01 | 1993-01-12 | Equipe Technologies | Precision robot apparatus |
US5399564A (en) * | 1991-09-03 | 1995-03-21 | Dowelanco | N-(4-pyridyl or 4-quinolinyl) arylacetamide and 4-(aralkoxy or aralkylamino) pyridine pesticides |
US5203978A (en) * | 1991-11-14 | 1993-04-20 | The Dow Chemical Company | Membrane-electrode structure for electrochemical cells |
US5301700A (en) * | 1992-03-05 | 1994-04-12 | Tokyo Electron Limited | Washing system |
US5501768A (en) * | 1992-04-17 | 1996-03-26 | Kimberly-Clark Corporation | Method of treating papermaking fibers for making tissue |
ES2078718T3 (en) * | 1992-08-04 | 1995-12-16 | Ibm | MANUFACTURING CHAIN STRUCTURES BASED ON FULLY AUTOMATED AND COMPUTERIZED CONVEYORS ADAPTED TO PRESSURE SEALABLE TRANSPORTABLE CONTAINERS. |
US5489341A (en) * | 1993-08-23 | 1996-02-06 | Semitool, Inc. | Semiconductor processing with non-jetting fluid stream discharge array |
US5391517A (en) * | 1993-09-13 | 1995-02-21 | Motorola Inc. | Process for forming copper interconnect structure |
EP0653512B1 (en) * | 1993-11-16 | 1998-02-25 | Scapa Group Plc | Papermachine clothing |
US5391285A (en) * | 1994-02-25 | 1995-02-21 | Motorola, Inc. | Adjustable plating cell for uniform bump plating of semiconductor wafers |
DE9404771U1 (en) * | 1994-03-21 | 1994-06-30 | Thyssen Aufzuege Gmbh | Locking device |
JPH07283077A (en) * | 1994-04-11 | 1995-10-27 | Ngk Spark Plug Co Ltd | Thin film capacitor |
US5405518A (en) * | 1994-04-26 | 1995-04-11 | Industrial Technology Research Institute | Workpiece holder apparatus |
JP3621151B2 (en) * | 1994-06-02 | 2005-02-16 | 株式会社半導体エネルギー研究所 | Method for manufacturing semiconductor device |
US5512319A (en) * | 1994-08-22 | 1996-04-30 | Basf Corporation | Polyurethane foam composite |
JP3143770B2 (en) * | 1994-10-07 | 2001-03-07 | 東京エレクトロン株式会社 | Substrate transfer device |
US5593545A (en) * | 1995-02-06 | 1997-01-14 | Kimberly-Clark Corporation | Method for making uncreped throughdried tissue products without an open draw |
US5807469A (en) * | 1995-09-27 | 1998-09-15 | Intel Corporation | Flexible continuous cathode contact circuit for electrolytic plating of C4, tab microbumps, and ultra large scale interconnects |
KR0182006B1 (en) * | 1995-11-10 | 1999-04-15 | 김광호 | Semiconductor device |
US5597460A (en) * | 1995-11-13 | 1997-01-28 | Reynolds Tech Fabricators, Inc. | Plating cell having laminar flow sparger |
US5620581A (en) * | 1995-11-29 | 1997-04-15 | Aiwa Research And Development, Inc. | Apparatus for electroplating metal films including a cathode ring, insulator ring and thief ring |
JPH09157846A (en) * | 1995-12-01 | 1997-06-17 | Teisan Kk | Temperature controller |
US6709562B1 (en) * | 1995-12-29 | 2004-03-23 | International Business Machines Corporation | Method of making electroplated interconnection structures on integrated circuit chips |
US5871805A (en) * | 1996-04-08 | 1999-02-16 | Lemelson; Jerome | Computer controlled vapor deposition processes |
US6051284A (en) * | 1996-05-08 | 2000-04-18 | Applied Materials, Inc. | Chamber monitoring and adjustment by plasma RF metrology |
US6672820B1 (en) * | 1996-07-15 | 2004-01-06 | Semitool, Inc. | Semiconductor processing apparatus having linear conveyer system |
US6168695B1 (en) * | 1999-07-12 | 2001-01-02 | Daniel J. Woodruff | Lift and rotate assembly for use in a workpiece processing station and a method of attaching the same |
US5731678A (en) * | 1996-07-15 | 1998-03-24 | Semitool, Inc. | Processing head for semiconductor processing machines |
US5904827A (en) * | 1996-10-15 | 1999-05-18 | Reynolds Tech Fabricators, Inc. | Plating cell with rotary wiper and megasonic transducer |
AUPO473297A0 (en) * | 1997-01-22 | 1997-02-20 | Industrial Automation Services Pty Ltd | Coating thickness control |
US5883762A (en) * | 1997-03-13 | 1999-03-16 | Calhoun; Robert B. | Electroplating apparatus and process for reducing oxidation of oxidizable plating anions and cations |
US6174425B1 (en) * | 1997-05-14 | 2001-01-16 | Motorola, Inc. | Process for depositing a layer of material over a substrate |
DE19821781C2 (en) * | 1997-05-15 | 2002-07-18 | Toyoda Gosei Kk | Coating process and coating device for the production of three-dimensional metal objects |
US6053687A (en) * | 1997-09-05 | 2000-04-25 | Applied Materials, Inc. | Cost effective modular-linear wafer processing |
US5882498A (en) * | 1997-10-16 | 1999-03-16 | Advanced Micro Devices, Inc. | Method for reducing oxidation of electroplating chamber contacts and improving uniform electroplating of a substrate |
US6159354A (en) * | 1997-11-13 | 2000-12-12 | Novellus Systems, Inc. | Electric potential shaping method for electroplating |
US6179983B1 (en) * | 1997-11-13 | 2001-01-30 | Novellus Systems, Inc. | Method and apparatus for treating surface including virtual anode |
US6027631A (en) * | 1997-11-13 | 2000-02-22 | Novellus Systems, Inc. | Electroplating system with shields for varying thickness profile of deposited layer |
JP3501937B2 (en) * | 1998-01-30 | 2004-03-02 | 富士通株式会社 | Method for manufacturing semiconductor device |
CA2320278C (en) * | 1998-02-12 | 2006-01-03 | Acm Research, Inc. | Plating apparatus and method |
US6565729B2 (en) * | 1998-03-20 | 2003-05-20 | Semitool, Inc. | Method for electrochemically depositing metal on a semiconductor workpiece |
US6228232B1 (en) * | 1998-07-09 | 2001-05-08 | Semitool, Inc. | Reactor vessel having improved cup anode and conductor assembly |
US6303010B1 (en) * | 1999-07-12 | 2001-10-16 | Semitool, Inc. | Methods and apparatus for processing the surface of a microelectronic workpiece |
US6017820A (en) * | 1998-07-17 | 2000-01-25 | Cutek Research, Inc. | Integrated vacuum and plating cluster system |
DE19840109A1 (en) * | 1998-09-03 | 2000-03-09 | Agfa Gevaert Ag | Color photographic material, e.g. film or paper, contains anilino pyrazolone magenta coupler and alpha-benzoyl-alpha-tetrazolylthio-acetamide development inhibitor releasing coupler |
TW527444B (en) * | 1999-04-13 | 2003-04-11 | Semitool Inc | System for electrochemically processing a workpiece |
US20030038035A1 (en) * | 2001-05-30 | 2003-02-27 | Wilson Gregory J. | Methods and systems for controlling current in electrochemical processing of microelectronic workpieces |
US7020537B2 (en) * | 1999-04-13 | 2006-03-28 | Semitool, Inc. | Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece |
US6277607B1 (en) * | 1999-05-24 | 2001-08-21 | Sanjay Tyagi | High specificity primers, amplification methods and kits |
US6527920B1 (en) * | 2000-05-10 | 2003-03-04 | Novellus Systems, Inc. | Copper electroplating apparatus |
US6678055B2 (en) * | 2001-11-26 | 2004-01-13 | Tevet Process Control Technologies Ltd. | Method and apparatus for measuring stress in semiconductor wafers |
-
2000
- 2000-03-21 US US09/531,828 patent/US6368475B1/en not_active Expired - Lifetime
-
2001
- 2001-03-21 WO PCT/US2001/009149 patent/WO2001071780A2/en active Search and Examination
- 2001-03-21 AU AU2001287255A patent/AU2001287255A1/en not_active Abandoned
-
2002
- 2002-01-29 US US10/059,907 patent/US20020084183A1/en not_active Abandoned
-
2006
- 2006-04-27 US US11/413,666 patent/US20060191790A1/en not_active Abandoned
- 2006-04-27 US US11/414,641 patent/US20060191795A1/en not_active Abandoned
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999016936A1 (en) * | 1997-09-30 | 1999-04-08 | Semitool, Inc. | Electroplating system having auxiliary electrode exterior to main reactor chamber for contact cleaning operations |
WO1999025902A1 (en) * | 1997-11-13 | 1999-05-27 | Novellus Systems, Inc. | Membrane partition system for plating of wafers |
JPH11350185A (en) * | 1998-06-12 | 1999-12-21 | Electroplating Eng Of Japan Co | Cup type plating apparatus and wafer plating method using the same |
Non-Patent Citations (2)
Title |
---|
DATABASE WPI Section Ch Week 199910, Derwent World Patents Index; Class L03, AN 1999-349896 * |
PATENT ABSTRACTS OF JAPAN vol. 2000, no. 03 30 March 2000 (2000-03-30) * |
Also Published As
Publication number | Publication date |
---|---|
AU2001287255A1 (en) | 2001-10-03 |
US6368475B1 (en) | 2002-04-09 |
US20060191795A1 (en) | 2006-08-31 |
WO2001071780A2 (en) | 2001-09-27 |
US20060191790A1 (en) | 2006-08-31 |
US20020084183A1 (en) | 2002-07-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2001071780A3 (en) | Apparatus and method for electrochemically processing a microelectronic workpiece | |
IL145474A0 (en) | A process for removing nitrate ions from an aqueous solution | |
WO2002045476A3 (en) | Apparatus and method for electrochemically depositing metal on a semiconductor workpiece | |
AU6708296A (en) | An electrolytic process for cleaning electrically conducting surfaces | |
MXPA01009975A (en) | Method for producing cathode active material and method for producing non-aqueous electrolyte cell. | |
AU2001263444A1 (en) | Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece | |
WO2002071438A3 (en) | Capillary discharge plasma apparatus and method for surface treatment using the same | |
WO2000061498A3 (en) | System for electrochemically processing a workpiece | |
EP1074515A3 (en) | Electrochemical treatment of an aqueous solution | |
EP0677027A4 (en) | Process for making cathode components for use in electrochemical cells. | |
EP2770086A3 (en) | Reduction of metal oxides in an electrolytic cell | |
WO2006055296A3 (en) | Ion source with substantially planar design | |
WO2004015172A3 (en) | Electrolysis process and apparatus | |
AP1616A (en) | Reduction of metal oxides in an electrolytic cell. | |
EP1314507A3 (en) | Tandem blisk electrochemical machining | |
AU2001259504A1 (en) | Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece | |
HUP0303617A3 (en) | Compound having a high conductivity for electrons, electrode for an electrochemical cell which comprises this compound, method for preparing an electrode and electrochemical cell | |
WO1997017158A3 (en) | Method of electrochemically machining workpieces | |
AU1290102A (en) | Gas diffusion electrode | |
EP1179616A3 (en) | Method and apparatuses for electrochemically treating an article | |
WO2005013441A3 (en) | Cathodes for fluorine gas discharge lasers | |
GB9810305D0 (en) | Method and apparatus for the treatment of a melt | |
WO2003031691A3 (en) | Method for recycling process gas in electrochemical processes | |
MXPA01012692A (en) | System and method for reversing electrolyte flow during an electropolishing operation. | |
AU2003249263A1 (en) | Electrode for an electrochemical cell and process for making the electrode |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A2 Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT TZ UA UG US UZ VN YU ZA ZW |
|
AL | Designated countries for regional patents |
Kind code of ref document: A2 Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) | ||
122 | Ep: pct application non-entry in european phase | ||
NENP | Non-entry into the national phase |
Ref country code: JP |
|
DPE2 | Request for preliminary examination filed before expiration of 19th month from priority date (pct application filed from 20040101) |