WO2002029862A3 - Integrated semiconductor substrate bevel cleaning apparatus and method - Google Patents
Integrated semiconductor substrate bevel cleaning apparatus and method Download PDFInfo
- Publication number
- WO2002029862A3 WO2002029862A3 PCT/US2001/042412 US0142412W WO0229862A3 WO 2002029862 A3 WO2002029862 A3 WO 2002029862A3 US 0142412 W US0142412 W US 0142412W WO 0229862 A3 WO0229862 A3 WO 0229862A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- semiconductor substrate
- cleaning apparatus
- integrated semiconductor
- bevel cleaning
- substrate bevel
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/6708—Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H01L21/67219—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one polishing chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H01L21/6723—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one plating chamber
Abstract
An integrated semiconductor substrate bevel cleaning system that enables transfer of substrates through the bevel cleaner either with or without substrate processing within the bevel cleaner. The invention provides an integrated bevel cleaning apparatus comprising a transfer position, a rinsing position and an etching position.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US23790800P | 2000-10-04 | 2000-10-04 | |
US60/237,908 | 2000-10-04 | ||
US09/785,815 US20030213772A9 (en) | 1999-07-09 | 2001-02-16 | Integrated semiconductor substrate bevel cleaning apparatus and method |
US09/785,815 | 2001-02-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2002029862A2 WO2002029862A2 (en) | 2002-04-11 |
WO2002029862A3 true WO2002029862A3 (en) | 2003-01-23 |
Family
ID=26931153
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2001/042412 WO2002029862A2 (en) | 2000-10-04 | 2001-10-01 | Integrated semiconductor substrate bevel cleaning apparatus and method |
Country Status (3)
Country | Link |
---|---|
US (1) | US20030213772A9 (en) |
TW (1) | TW516086B (en) |
WO (1) | WO2002029862A2 (en) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6640151B1 (en) | 1999-12-22 | 2003-10-28 | Applied Materials, Inc. | Multi-tool control system, method and medium |
US6708074B1 (en) | 2000-08-11 | 2004-03-16 | Applied Materials, Inc. | Generic interface builder |
US7188142B2 (en) | 2000-11-30 | 2007-03-06 | Applied Materials, Inc. | Dynamic subject information generation in message services of distributed object systems in a semiconductor assembly line facility |
US7160739B2 (en) | 2001-06-19 | 2007-01-09 | Applied Materials, Inc. | Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles |
US7101799B2 (en) * | 2001-06-19 | 2006-09-05 | Applied Materials, Inc. | Feedforward and feedback control for conditioning of chemical mechanical polishing pad |
US7698012B2 (en) | 2001-06-19 | 2010-04-13 | Applied Materials, Inc. | Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing |
US6722943B2 (en) * | 2001-08-24 | 2004-04-20 | Micron Technology, Inc. | Planarizing machines and methods for dispensing planarizing solutions in the processing of microelectronic workpieces |
US20030199112A1 (en) | 2002-03-22 | 2003-10-23 | Applied Materials, Inc. | Copper wiring module control |
US6672716B2 (en) * | 2002-04-29 | 2004-01-06 | Xerox Corporation | Multiple portion solid ink stick |
AU2003290932A1 (en) | 2002-11-15 | 2004-06-15 | Applied Materials, Inc. | Method, system and medium for controlling manufacture process having multivariate input parameters |
DE10302611B4 (en) * | 2003-01-23 | 2011-07-07 | Siltronic AG, 81737 | Polished semiconductor wafer and method for its production and arrangement consisting of a semiconductor wafer and a shield |
US6884152B2 (en) | 2003-02-11 | 2005-04-26 | Micron Technology, Inc. | Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces |
WO2004114375A1 (en) * | 2003-06-13 | 2004-12-29 | Sophia Wen | Method and apparatus for thin-layer chemical processing of semiconductor wafers |
KR100618868B1 (en) * | 2004-10-19 | 2006-08-31 | 삼성전자주식회사 | Spinning apparatus |
US20080319879A1 (en) * | 2007-06-15 | 2008-12-25 | Jim Carroll | Optimized Communication Billing Management System |
US9285168B2 (en) * | 2010-10-05 | 2016-03-15 | Applied Materials, Inc. | Module for ozone cure and post-cure moisture treatment |
JP5651744B1 (en) | 2013-07-04 | 2015-01-14 | 株式会社カイジョー | Ultrasonic cleaning apparatus and ultrasonic cleaning method |
US20150107619A1 (en) * | 2013-10-22 | 2015-04-23 | Taiwan Semiconductor Manufacturing Company Limited | Wafer particle removal |
KR101575129B1 (en) * | 2014-01-13 | 2015-12-08 | 피에스케이 주식회사 | Apparatus and method for transporting substrate, and apparatus for treating substrate |
BE1025599B9 (en) * | 2017-09-28 | 2019-05-28 | Unilin B V B A | METHOD FOR MANUFACTURING STRUCTURED PERSONAL ELEMENTS |
CN112086382B (en) * | 2020-08-03 | 2022-08-19 | 北京烁科精微电子装备有限公司 | Wafer cleaning equipment |
WO2022031268A1 (en) * | 2020-08-04 | 2022-02-10 | Applied Materials, Inc. | Apparatus for removing photoresist off of photomask |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000032835A2 (en) * | 1998-11-30 | 2000-06-08 | Applied Materials, Inc. | Electro-chemical deposition system |
US6114254A (en) * | 1996-10-15 | 2000-09-05 | Micron Technology, Inc. | Method for removing contaminants from a semiconductor wafer |
EP1136592A2 (en) * | 2000-03-22 | 2001-09-26 | Applied Materials, Inc. | Method and apparatus for removal of unwanted electroplating deposits |
US20010037858A1 (en) * | 2000-05-08 | 2001-11-08 | Hiroki Taniyama | Processing apparatus, processing system and processing method |
Family Cites Families (63)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL170871B (en) * | 1952-07-05 | Nippon Electric Co | PROCEDURE FOR THE REMOVAL OF HEAVY AND / OR TOXIC METALS FROM WASTE GAS. | |
US2882209A (en) * | 1957-05-20 | 1959-04-14 | Udylite Res Corp | Electrodeposition of copper from an acid bath |
US3649509A (en) * | 1969-07-08 | 1972-03-14 | Buckbee Mears Co | Electrodeposition systems |
US3727620A (en) * | 1970-03-18 | 1973-04-17 | Fluoroware Of California Inc | Rinsing and drying device |
US3770598A (en) * | 1972-01-21 | 1973-11-06 | Oxy Metal Finishing Corp | Electrodeposition of copper from acid baths |
US4027686A (en) * | 1973-01-02 | 1977-06-07 | Texas Instruments Incorporated | Method and apparatus for cleaning the surface of a semiconductor slice with a liquid spray of de-ionized water |
BE833384A (en) * | 1975-03-11 | 1976-03-12 | COPPER ELECTRODEPOSITION | |
JPS5271871A (en) * | 1975-12-11 | 1977-06-15 | Nec Corp | Washing apparatus |
JPS5819350B2 (en) * | 1976-04-08 | 1983-04-18 | 富士写真フイルム株式会社 | Spin coating method |
US4326940A (en) * | 1979-05-21 | 1982-04-27 | Rohco Incorporated | Automatic analyzer and control system for electroplating baths |
US4405416A (en) * | 1980-07-18 | 1983-09-20 | Raistrick Ian D | Molten salt lithium cells |
US4315059A (en) * | 1980-07-18 | 1982-02-09 | The United States Of America As Represented By The United States Department Of Energy | Molten salt lithium cells |
US4336114A (en) * | 1981-03-26 | 1982-06-22 | Hooker Chemicals & Plastics Corp. | Electrodeposition of bright copper |
US4376685A (en) * | 1981-06-24 | 1983-03-15 | M&T Chemicals Inc. | Acid copper electroplating baths containing brightening and leveling additives |
EP0076569B1 (en) * | 1981-10-01 | 1986-08-27 | EMI Limited | Electroplating arrangements |
US4489740A (en) * | 1982-12-27 | 1984-12-25 | General Signal Corporation | Disc cleaning machine |
US4428815A (en) * | 1983-04-28 | 1984-01-31 | Western Electric Co., Inc. | Vacuum-type article holder and methods of supportively retaining articles |
US4789445A (en) * | 1983-05-16 | 1988-12-06 | Asarco Incorporated | Method for the electrodeposition of metals |
US4510176A (en) * | 1983-09-26 | 1985-04-09 | At&T Bell Laboratories | Removal of coating from periphery of a semiconductor wafer |
US4518678A (en) * | 1983-12-16 | 1985-05-21 | Advanced Micro Devices, Inc. | Selective removal of coating material on a coated substrate |
US4466864A (en) * | 1983-12-16 | 1984-08-21 | At&T Technologies, Inc. | Methods of and apparatus for electroplating preselected surface regions of electrical articles |
US4519846A (en) * | 1984-03-08 | 1985-05-28 | Seiichiro Aigo | Process for washing and drying a semiconductor element |
US4693805A (en) * | 1986-02-14 | 1987-09-15 | Boe Limited | Method and apparatus for sputtering a dielectric target or for reactive sputtering |
US4732785A (en) * | 1986-09-26 | 1988-03-22 | Motorola, Inc. | Edge bead removal process for spin on films |
US5235995A (en) * | 1989-03-27 | 1993-08-17 | Semitool, Inc. | Semiconductor processor apparatus with dynamic wafer vapor treatment and particulate volatilization |
US5224504A (en) * | 1988-05-25 | 1993-07-06 | Semitool, Inc. | Single wafer processor |
US5230743A (en) * | 1988-05-25 | 1993-07-27 | Semitool, Inc. | Method for single wafer processing in which a semiconductor wafer is contacted with a fluid |
US5092975A (en) * | 1988-06-14 | 1992-03-03 | Yamaha Corporation | Metal plating apparatus |
US5316974A (en) * | 1988-12-19 | 1994-05-31 | Texas Instruments Incorporated | Integrated circuit copper metallization process using a lift-off seed layer and a thick-plated conductor layer |
US5039381A (en) * | 1989-05-25 | 1991-08-13 | Mullarkey Edward J | Method of electroplating a precious metal on a semiconductor device, integrated circuit or the like |
US5055425A (en) * | 1989-06-01 | 1991-10-08 | Hewlett-Packard Company | Stacked solid via formation in integrated circuit systems |
US5162260A (en) * | 1989-06-01 | 1992-11-10 | Hewlett-Packard Company | Stacked solid via formation in integrated circuit systems |
US5155336A (en) * | 1990-01-19 | 1992-10-13 | Applied Materials, Inc. | Rapid thermal heating apparatus and method |
US5222310A (en) * | 1990-05-18 | 1993-06-29 | Semitool, Inc. | Single wafer processor with a frame |
US5259407A (en) * | 1990-06-15 | 1993-11-09 | Matrix Inc. | Surface treatment method and apparatus for a semiconductor wafer |
US5252807A (en) * | 1990-07-02 | 1993-10-12 | George Chizinsky | Heated plate rapid thermal processor |
US5368711A (en) * | 1990-08-01 | 1994-11-29 | Poris; Jaime | Selective metal electrodeposition process and apparatus |
US5256274A (en) * | 1990-08-01 | 1993-10-26 | Jaime Poris | Selective metal electrodeposition process |
JP2524436B2 (en) * | 1990-09-18 | 1996-08-14 | インターナショナル・ビジネス・マシーンズ・コーポレイション | Surface treatment method |
DE69231971T2 (en) * | 1991-01-24 | 2002-04-04 | Wako Pure Chem Ind Ltd | Solutions for surface treatment of semiconductors |
JPH0544075A (en) * | 1991-08-15 | 1993-02-23 | Nippon Riironaale Kk | Copper striking method substituted for electroless copper plating |
JP3200468B2 (en) * | 1992-05-21 | 2001-08-20 | 日本エレクトロプレイテイング・エンジニヤース株式会社 | Wafer plating equipment |
JP2654314B2 (en) * | 1992-06-04 | 1997-09-17 | 東京応化工業株式会社 | Backside cleaning device |
US5328589A (en) * | 1992-12-23 | 1994-07-12 | Enthone-Omi, Inc. | Functional fluid additives for acid copper electroplating baths |
US5718813A (en) * | 1992-12-30 | 1998-02-17 | Advanced Energy Industries, Inc. | Enhanced reactive DC sputtering system |
US5608943A (en) * | 1993-08-23 | 1997-03-11 | Tokyo Electron Limited | Apparatus for removing process liquid |
US5415890A (en) * | 1994-01-03 | 1995-05-16 | Eaton Corporation | Modular apparatus and method for surface treatment of parts with liquid baths |
US5625170A (en) * | 1994-01-18 | 1997-04-29 | Nanometrics Incorporated | Precision weighing to monitor the thickness and uniformity of deposited or etched thin film |
JP3377849B2 (en) * | 1994-02-02 | 2003-02-17 | 日本エレクトロプレイテイング・エンジニヤース株式会社 | Wafer plating equipment |
US5528118A (en) * | 1994-04-01 | 1996-06-18 | Nikon Precision, Inc. | Guideless stage with isolated reaction stage |
US5651865A (en) * | 1994-06-17 | 1997-07-29 | Eni | Preferential sputtering of insulators from conductive targets |
US5705223A (en) * | 1994-07-26 | 1998-01-06 | International Business Machine Corp. | Method and apparatus for coating a semiconductor wafer |
US5516412A (en) * | 1995-05-16 | 1996-05-14 | International Business Machines Corporation | Vertical paddle plating cell |
US5952050A (en) * | 1996-02-27 | 1999-09-14 | Micron Technology, Inc. | Chemical dispensing system for semiconductor wafer processing |
US5838121A (en) * | 1996-11-18 | 1998-11-17 | Applied Materials, Inc. | Dual blade robot |
JPH1180989A (en) * | 1997-09-02 | 1999-03-26 | Oki Electric Ind Co Ltd | Plating apparatus |
US6024856A (en) * | 1997-10-10 | 2000-02-15 | Enthone-Omi, Inc. | Copper metallization of silicon wafers using insoluble anodes |
US6113771A (en) * | 1998-04-21 | 2000-09-05 | Applied Materials, Inc. | Electro deposition chemistry |
US6071388A (en) * | 1998-05-29 | 2000-06-06 | International Business Machines Corporation | Electroplating workpiece fixture having liquid gap spacer |
US6251251B1 (en) * | 1998-11-16 | 2001-06-26 | International Business Machines Corporation | Anode design for semiconductor deposition |
US6113759A (en) * | 1998-12-18 | 2000-09-05 | International Business Machines Corporation | Anode design for semiconductor deposition having novel electrical contact assembly |
US6551488B1 (en) * | 1999-04-08 | 2003-04-22 | Applied Materials, Inc. | Segmenting of processing system into wet and dry areas |
US6691719B2 (en) * | 2001-01-12 | 2004-02-17 | Applied Materials Inc. | Adjustable nozzle for wafer bevel cleaning |
-
2001
- 2001-02-16 US US09/785,815 patent/US20030213772A9/en not_active Abandoned
- 2001-10-01 WO PCT/US2001/042412 patent/WO2002029862A2/en active Application Filing
- 2001-10-04 TW TW090124585A patent/TW516086B/en not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6114254A (en) * | 1996-10-15 | 2000-09-05 | Micron Technology, Inc. | Method for removing contaminants from a semiconductor wafer |
WO2000032835A2 (en) * | 1998-11-30 | 2000-06-08 | Applied Materials, Inc. | Electro-chemical deposition system |
EP1136592A2 (en) * | 2000-03-22 | 2001-09-26 | Applied Materials, Inc. | Method and apparatus for removal of unwanted electroplating deposits |
US20010037858A1 (en) * | 2000-05-08 | 2001-11-08 | Hiroki Taniyama | Processing apparatus, processing system and processing method |
Also Published As
Publication number | Publication date |
---|---|
TW516086B (en) | 2003-01-01 |
US20020113039A1 (en) | 2002-08-22 |
US20030213772A9 (en) | 2003-11-20 |
WO2002029862A2 (en) | 2002-04-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2002029862A3 (en) | Integrated semiconductor substrate bevel cleaning apparatus and method | |
AU2001241190A1 (en) | Semiconductor wafer cleaning agent and cleaning method | |
SG125056A1 (en) | Single wafer type substrate cleaning method and apparatus | |
AU7454501A (en) | Nitride semiconductor substrate and method for manufacturing the same, and nitride semiconductor device using nitride semiconductor substrate | |
WO2002062527A8 (en) | Abrasive article suitable for modifying a semiconductor wafer | |
AU2002211485A1 (en) | Wafer cleaning module and method for cleaning the surface of a substrate | |
AU2001295060A1 (en) | Methods and systems for semiconductor fabrication processes | |
EP1420438A3 (en) | Method and apparatus for etching a deep trench | |
WO2002058116A3 (en) | Integrated system for processing semiconductor wafers | |
WO2001032323A8 (en) | Cleaning processes using hydrofluorocarbon and/or hydrochlorofluorocarbon compounds | |
KR20010012977A (en) | Semiconductor device and method for manufacturing the same, circuit substrate, and electronic device | |
WO1999034939A8 (en) | Wafer container washing apparatus | |
SG116418A1 (en) | Semiconductor wafer grinding method. | |
EP1429375A4 (en) | System and method for performing semiconductor processing on substrate being processed | |
WO2003003428A3 (en) | Apparatus, process and method for mounting and treating a substrate | |
AU2001253650A1 (en) | Supercritical fluid delivery and recovery system for semiconductor wafer processing | |
WO2002003432A3 (en) | Process for etching silicon wafers | |
EP0999584A3 (en) | Method for manufacturing semiconductor device | |
AU2913901A (en) | Multi wafer introduction/single wafer conveyor mode processing system and methodof processing wafers using the same | |
AU1781499A (en) | Semiconductor etching process and apparatus | |
IL158094A0 (en) | Deposition method, deposition apparatus, insulating film and semiconductor integrated circuit | |
EP1235258A4 (en) | Method for cleaning substrate and method for manufacturing semiconductor device | |
SG120887A1 (en) | Method of processing a semiconductor wafer and substrate for semiconductor wafers used in the same | |
AU2002212587A1 (en) | Wafer processing equipment and method for processing wafers | |
EP1404463A4 (en) | Method and apparatus for cleaning semiconductor wafers and other flat media |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AK | Designated states |
Kind code of ref document: A2 Designated state(s): CN JP KR SG |
|
AL | Designated countries for regional patents |
Kind code of ref document: A2 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
122 | Ep: pct application non-entry in european phase | ||
NENP | Non-entry into the national phase |
Ref country code: JP |