WO2002071045A3 - Method for determination of structural defects of coatings - Google Patents

Method for determination of structural defects of coatings Download PDF

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Publication number
WO2002071045A3
WO2002071045A3 PCT/US2001/050362 US0150362W WO02071045A3 WO 2002071045 A3 WO2002071045 A3 WO 2002071045A3 US 0150362 W US0150362 W US 0150362W WO 02071045 A3 WO02071045 A3 WO 02071045A3
Authority
WO
WIPO (PCT)
Prior art keywords
coating
substrate
fashion
tests
inducing
Prior art date
Application number
PCT/US2001/050362
Other languages
French (fr)
Other versions
WO2002071045A2 (en
Inventor
Radislav Alexandrovi Potyrailo
Daniel Robert Olson
Michael Jarlath Brennan Jr
James Norman Cawse
Bret Ja Chisholm
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Priority to AU2002248251A priority Critical patent/AU2002248251A1/en
Publication of WO2002071045A2 publication Critical patent/WO2002071045A2/en
Publication of WO2002071045A3 publication Critical patent/WO2002071045A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6452—Individual samples arranged in a regular 2D-array, e.g. multiwell plates
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
    • C09K11/06—Luminescent, e.g. electroluminescent, chemiluminescent materials containing organic luminescent materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N2021/6417—Spectrofluorimetric devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N2021/646—Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects

Abstract

The present invention provides a method for quantifying structural defects of a coating composition on a given substrate (1), where certain structural defect-inducing tests are performed. In this method, a coating formulation is doped with a colorimetric or luminescent material. Concentration of the material depends on the quantum efficiency, excitation and emission wavelengths, and employed detection techniques, and can range from about 1 fM to about 1 mM. Before, during and/or after such tests, the coating is illuminated (4) with a wavelength of radiation at which the reflected (5) or transmitted color or emitted luminescence of the material in the coating is detectable with an optical detector (7) or by visual inspection. In this fashion, the percentage of failure of the coating can be quantified as well as the level of interdiffusion of coating into substrate or substrate into coating. The method of the invention is thus particularly well-suited for the combinatorial analysis of an array of coating samples. Additionally, when the structural defect-inducing material test is being performed, the removed coating material can be analyzed in like fashion.
PCT/US2001/050362 2001-01-22 2001-10-26 Method for determination of structural defects of coatings WO2002071045A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2002248251A AU2002248251A1 (en) 2001-01-22 2001-10-26 Method for determination of structural defects of coatings

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/765,757 2001-01-22
US09/765,757 US6538725B2 (en) 2001-01-22 2001-01-22 Method for determination of structural defects of coatings

Publications (2)

Publication Number Publication Date
WO2002071045A2 WO2002071045A2 (en) 2002-09-12
WO2002071045A3 true WO2002071045A3 (en) 2003-04-17

Family

ID=25074403

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/050362 WO2002071045A2 (en) 2001-01-22 2001-10-26 Method for determination of structural defects of coatings

Country Status (3)

Country Link
US (1) US6538725B2 (en)
AU (1) AU2002248251A1 (en)
WO (1) WO2002071045A2 (en)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6689218B2 (en) * 2001-10-23 2004-02-10 General Electric Company Systems for the deposition and curing of coating compositions
DE10249725A1 (en) * 2002-10-25 2004-05-06 Bayer Ag Device for testing the scratch resistance of surfaces
TW200422603A (en) * 2002-11-05 2004-11-01 Clopay Plastic Prod Co Methods of analyzing microporous polyolefin film pore structure and three-dimensional images thereof
DE10301931A1 (en) 2003-01-19 2004-07-29 Massen, Robert, Prof. Dr.-Ing. Floor and wall coverings defect detection method in which, in addition to a color camera inspection system, an additional short wave camera detection system is used to detect errors in the transparent protective layer
WO2005024404A1 (en) * 2003-09-04 2005-03-17 Kla-Tencor Technologies Methods and systems for inspection of a specimen using different inspection parameters
US20050095715A1 (en) * 2003-10-31 2005-05-05 General Electric Company Tagging Material for Polymers, Methods, and Articles Made Thereby
EP1706742A1 (en) * 2003-12-22 2006-10-04 Koninklijke Philips Electronics N.V. Optical nanowire biosensor based on energy transfer
US6998425B2 (en) * 2003-12-23 2006-02-14 General Electric Company UV curable coating compositions and uses thereof
US7334330B2 (en) * 2004-04-28 2008-02-26 Siemens Power Generation, Inc. Thermally insulating layer incorporating a distinguishing agent and method for inspecting the same
US7105834B2 (en) * 2005-01-21 2006-09-12 Innovative Productivity, Inc. Fluorescent coating void detection system and method
KR20070003366A (en) * 2005-07-01 2007-01-05 주식회사 포스코 Powder desquamation width measurement device and method
US20090286076A1 (en) * 2005-08-03 2009-11-19 Chao-Nan Xu Material to be measured for stress analysis, coating liquid for forming coating film layer on the material to be measured, and stress-induced luminescent structure
US8264137B2 (en) * 2006-01-03 2012-09-11 Samsung Electronics Co., Ltd. Curing binder material for carbon nanotube electron emission cathodes
US7578178B2 (en) * 2007-09-28 2009-08-25 United Technologies Corporation Method of inspecting turbine internal cooling features using non-contact scanners
JP2009133725A (en) * 2007-11-30 2009-06-18 Sumitomo Chemical Co Ltd Method of inspecting coating film defect of resin coated film
US20130020507A1 (en) * 2010-06-17 2013-01-24 Life Technologies Corporation Methods for Detecting Defects in Inorganic-Coated Polymer Surfaces
US8061214B2 (en) * 2008-05-08 2011-11-22 Lockheed Martin Corporation Biaxial stress, sheer, permeability, and peel test method and machine to conduct the same
US8558194B2 (en) 2009-04-10 2013-10-15 The Penn State Research Foundation Interactive coatings, surfaces and materials
US9284487B2 (en) 2010-01-13 2016-03-15 The Penn State Research Foundation Up-conversion luminescent coatings/materials for antimicrobial applications
US8667844B1 (en) * 2011-01-28 2014-03-11 The Boeing Company Ultrasonic scalar adhesion test apparatus and method for paints and finishes
US20130171903A1 (en) 2012-01-03 2013-07-04 Andrew Zsinko Electroluminescent devices and their manufacture
US9696139B2 (en) 2012-06-25 2017-07-04 The Boeing Company System and method for improved visual detection of protective coatings
FI126195B (en) * 2014-01-28 2016-08-15 Upm Kymmene Corp Fiber-based product
US11725088B2 (en) * 2014-09-30 2023-08-15 The Boeing Company Prepreg compositions, their manufacture, and determination of their suitability for use in composite structures
EP3081313A1 (en) * 2015-04-13 2016-10-19 Airbus Defence and Space GmbH Method and device for testing the surface condition of a component, in particular a carbon-fiber-reinforced plastic component
US9642212B1 (en) 2015-06-11 2017-05-02 Darkside Scientific, Llc Electroluminescent system and process
CN106338486A (en) * 2015-09-02 2017-01-18 湖北航天化学技术研究所 Non-destructive detection method of storage ageing performance of propellant/liner bonding interface
US9841369B1 (en) * 2016-02-03 2017-12-12 Myron E. Taylor, Jr. System of analyzing a coating test
AU2017302241B2 (en) 2016-07-28 2022-06-23 Darkside Scientific, Inc. Electroluminescent system and process
RU2644917C1 (en) * 2016-12-02 2018-02-14 Федеральное государственное унитарное предприятие "Центральный аэрогидродинамический институт имени профессора Н.Е. Жуковского" (ФГУП "ЦАГИ") Luminescent polymer coating for design damages detection
JP2022522856A (en) * 2019-03-05 2022-04-20 フィリップ・モーリス・プロダクツ・ソシエテ・アノニム Inspection stations and methods for inspecting sheet materials
DE102019132585B4 (en) * 2019-12-02 2022-06-09 Schaeffler Technologies AG & Co. KG Inspection system for the optical surface inspection of a test object
US11810288B2 (en) 2020-09-04 2023-11-07 General Electric Company Systems and methods for generating a single observation image to analyze coating defects
US11603593B2 (en) 2020-09-04 2023-03-14 General Electric Company Systems and methods for automatic detection of coating defects
CN112162095A (en) * 2020-09-24 2021-01-01 上海印标包装有限公司 Hydrophilic film and manufacturing method thereof
CN113735772B (en) * 2021-09-22 2024-04-09 四川羽玺新材料股份有限公司 Fluorescent functional monomer, pressure-sensitive adhesive capable of finding coating defects in time and preparation method of pressure-sensitive adhesive
CN114062252B (en) * 2021-10-28 2023-08-08 浙江工业大学 Ultrasonic laser deposition coating bonding strength tester
CN114754694B (en) * 2022-06-13 2022-09-02 新乡职业技术学院 Material deformation detection equipment based on it is multispectral

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1390542A1 (en) * 1986-10-01 1988-04-23 Рижский политехнический институт им.А.Я.Пельше Method of determining adhesion of coating to inorganic substrate
EP0336029A1 (en) * 1988-04-06 1989-10-11 Minnesota Mining And Manufacturing Company Process for fluorimetric monitoring of functional coatings and structures used in the process and comprising a substrate and said functional coating
US5027650A (en) * 1990-05-08 1991-07-02 Gte Laboratories Incorporated Method for characterization of adhesion between hard materials
FR2663122A1 (en) * 1990-06-06 1991-12-13 Hutchinson Method and device for showing a shock or shocks received by a substrate

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3995157A (en) * 1975-02-18 1976-11-30 General Electric Company Surface flaw detection
US4004456A (en) 1975-08-18 1977-01-25 Western Electric Company, Inc. Method and apparatus for the real-time, non-destructive evaluation of adhesion bonds using stress-wave emission techniques
US4168249A (en) 1977-07-01 1979-09-18 E. I. Du Pont De Nemours And Company Acrylic lacquer coating composition of polymethyl methacrylate, copolymers of methyl methacrylate, cellulose acetate butyrate and a polyester plasticizer
US4255308A (en) 1979-07-12 1981-03-10 E. I. Du Pont De Nemours And Company Water based acrylic lacquer composition
US4541287A (en) 1983-03-28 1985-09-17 The United States Of America As Represented By The United States Department Of Energy Method of measuring metal coating adhesion
US4612805A (en) 1984-12-24 1986-09-23 International Business Machines Corporation Adhesion characterization test site
US4996076A (en) 1988-03-24 1991-02-26 Nippon Paint Co., Ltd. Film forming method
US5326692B1 (en) 1992-05-13 1996-04-30 Molecular Probes Inc Fluorescent microparticles with controllable enhanced stokes shift
US5098750A (en) 1990-08-06 1992-03-24 The B. F. Goodrich Company Composite molded articles and method therefor
US5513537A (en) 1992-02-25 1996-05-07 The Boeing Company Method and apparatus to determine composite prepreg tack
US5725960A (en) 1992-12-28 1998-03-10 Nippon Zeon Co., Ltd. Molded articles having hard coat layer and method for producing same
US5817732A (en) 1993-02-12 1998-10-06 Asahi Kasei Kogyo Kabushiki Kaisha Blocked polyisocyanate and coating composition
US5454260A (en) 1993-12-20 1995-10-03 General Motors Corporation Non destructive adhesion testing
US5829804A (en) 1995-06-27 1998-11-03 Mitsui Chemicals, Inc. Resin composition for use in the making of automobile bumpers and automobile bumpers made thereof
US6072568A (en) * 1997-03-03 2000-06-06 Howmet Research Corporation Thermal barrier coating stress measurement
US6327030B1 (en) * 1999-08-06 2001-12-04 University Of Florida System, method, and coating for strain analysis

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1390542A1 (en) * 1986-10-01 1988-04-23 Рижский политехнический институт им.А.Я.Пельше Method of determining adhesion of coating to inorganic substrate
EP0336029A1 (en) * 1988-04-06 1989-10-11 Minnesota Mining And Manufacturing Company Process for fluorimetric monitoring of functional coatings and structures used in the process and comprising a substrate and said functional coating
US5027650A (en) * 1990-05-08 1991-07-02 Gte Laboratories Incorporated Method for characterization of adhesion between hard materials
FR2663122A1 (en) * 1990-06-06 1991-12-13 Hutchinson Method and device for showing a shock or shocks received by a substrate

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
DATABASE WPI Week 198843, Derwent World Patents Index; AN 306362, XP002228514, AKMENE R Y Y, BALODIS A Y A, VAINSHTEIN A B: "Determining adhesive capability of coatings to non-organic bases." *

Also Published As

Publication number Publication date
US6538725B2 (en) 2003-03-25
AU2002248251A1 (en) 2002-09-19
US20020135758A1 (en) 2002-09-26
WO2002071045A2 (en) 2002-09-12

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