WO2002084786A3 - Ultrafast sampler with coaxial transition - Google Patents

Ultrafast sampler with coaxial transition Download PDF

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Publication number
WO2002084786A3
WO2002084786A3 PCT/US2002/011487 US0211487W WO02084786A3 WO 2002084786 A3 WO2002084786 A3 WO 2002084786A3 US 0211487 W US0211487 W US 0211487W WO 02084786 A3 WO02084786 A3 WO 02084786A3
Authority
WO
WIPO (PCT)
Prior art keywords
signal
intermediate frequency
samples
waveguide
strobe
Prior art date
Application number
PCT/US2002/011487
Other languages
French (fr)
Other versions
WO2002084786A2 (en
Inventor
Agoston Agoston
John Ebner
Steven Pepper
Robert Norton
Original Assignee
Picosecond Pulse Labs
Agoston Agoston
John Ebner
Steven Pepper
Robert Norton
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Picosecond Pulse Labs, Agoston Agoston, John Ebner, Steven Pepper, Robert Norton filed Critical Picosecond Pulse Labs
Priority to EP02728739A priority Critical patent/EP1380068A2/en
Priority to JP2002581620A priority patent/JP2004531130A/en
Priority to AU2002258772A priority patent/AU2002258772A1/en
Publication of WO2002084786A2 publication Critical patent/WO2002084786A2/en
Publication of WO2002084786A3 publication Critical patent/WO2002084786A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/08—Coupling devices of the waveguide type for linking dissimilar lines or devices
    • H01P5/085—Coaxial-line/strip-line transitions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/24—Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • G01R19/2509—Details concerning sampling, digitizing or waveform capturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0053—Noise discrimination; Analog sampling; Measuring transients
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits

Abstract

An ultrafast sampler includes a series of Schottky diodes configured with a coplanar waveguide to form a nonlinear transmission line (NLTL) that compresses a local oscillator input to form a series of strobe pulses. Strobe pulses of opposite polarity are capacitively coupled to sampling diodes to obtain samples of a signal applied to a signal input. The samples are directed along an intermediate frequency waveguide to, for example, a signal processor such as an oscilloscope, for storage and analysis. The intermediate frequency waveguide is configured so that conductors of the intermediate frequency waveguide receive signal samples of a common polarity and strobe samples of opposite polarities so that portions of strobe pulses delivered to a signal processor are distinguished from signal samples. In an embodiment, the intermediate frequency waveguide and the strobe waveguide are positioned between the axis and the conductors of the intermediate frequency waveguide. The sampling circuit is defined on a GaAs substrate and a coaxial-to-airline-to-substrate transition is configured to deliver signals from a coaxial cable to the sampling circuit. A signal output is configured to direct the signal back into a coaxial cable.
PCT/US2002/011487 2001-04-10 2002-04-10 Ultrafast sampler with coaxial transition WO2002084786A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EP02728739A EP1380068A2 (en) 2001-04-10 2002-04-10 Ultrafast sampler with coaxial transition
JP2002581620A JP2004531130A (en) 2001-04-10 2002-04-10 Ultra high-speed sampler with coaxial transition
AU2002258772A AU2002258772A1 (en) 2001-04-10 2002-04-10 Ultrafast sampler with coaxial transition

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/833,015 2001-04-10
US09/833,015 US7084716B2 (en) 2001-04-10 2001-04-10 Ultrafast sampler with coaxial transition

Publications (2)

Publication Number Publication Date
WO2002084786A2 WO2002084786A2 (en) 2002-10-24
WO2002084786A3 true WO2002084786A3 (en) 2003-10-16

Family

ID=25263198

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2002/011487 WO2002084786A2 (en) 2001-04-10 2002-04-10 Ultrafast sampler with coaxial transition

Country Status (5)

Country Link
US (2) US7084716B2 (en)
EP (1) EP1380068A2 (en)
JP (1) JP2004531130A (en)
AU (1) AU2002258772A1 (en)
WO (1) WO2002084786A2 (en)

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US6900710B2 (en) * 2001-04-10 2005-05-31 Picosecond Pulse Labs Ultrafast sampler with non-parallel shockline
US7084716B2 (en) 2001-04-10 2006-08-01 Picosecond Pulse Labs Ultrafast sampler with coaxial transition
US7358834B1 (en) * 2002-08-29 2008-04-15 Picosecond Pulse Labs Transmission line voltage controlled nonlinear signal processors
US20050078735A1 (en) * 2003-07-18 2005-04-14 David Baker Communications systems and methods
US20050031021A1 (en) * 2003-07-18 2005-02-10 David Baker Communications systems and methods
US7457350B2 (en) * 2003-07-18 2008-11-25 Artimi Ltd. Communications systems and methods
US7734271B2 (en) * 2004-07-30 2010-06-08 Picosecond Pulse Labs Waveguide samplers and frequency converters
US20070025738A1 (en) * 2005-07-28 2007-02-01 Artimi Inc. Communications systems and methods
GB2428949B (en) * 2005-07-28 2007-11-14 Artimi Inc Communications systems and methods
JP2007074132A (en) * 2005-09-05 2007-03-22 Advantest Corp Sampling device and testing device
US7612629B2 (en) * 2006-05-26 2009-11-03 Picosecond Pulse Labs Biased nonlinear transmission line comb generators
US7764137B2 (en) * 2006-09-28 2010-07-27 Suvolta, Inc. Circuit and method for generating electrical solutions with junction field effect transistors
US7844241B2 (en) * 2007-04-10 2010-11-30 Northrop Grumman Systems Corporation High linearity frequency conversion system and method
WO2010080196A2 (en) 2009-01-08 2010-07-15 Battelle Memorial Institute Path-dependent cycle counting and multi-axial fatigue evaluation of engineering structures
US8718586B2 (en) * 2009-06-30 2014-05-06 Anritsu Company Apparatus for enhancing the dynamic range of shockline-based sampling receivers
EP3113367A1 (en) 2015-07-03 2017-01-04 Rohde & Schwarz GmbH & Co. KG Delay line system, high frequency sampler, analog-to-digital converter and oscilloscope
JP7359885B2 (en) 2022-03-14 2023-10-11 アンリツ株式会社 Nonlinear transmission line and sampling oscilloscope using it

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Also Published As

Publication number Publication date
JP2004531130A (en) 2004-10-07
AU2002258772A1 (en) 2002-10-28
US20020145484A1 (en) 2002-10-10
US7084716B2 (en) 2006-08-01
US20060038551A1 (en) 2006-02-23
WO2002084786A2 (en) 2002-10-24
US7612628B2 (en) 2009-11-03
EP1380068A2 (en) 2004-01-14

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