WO2002086578A3 - Objective-type dark field scattering microscope - Google Patents

Objective-type dark field scattering microscope Download PDF

Info

Publication number
WO2002086578A3
WO2002086578A3 PCT/IL2002/000323 IL0200323W WO02086578A3 WO 2002086578 A3 WO2002086578 A3 WO 2002086578A3 IL 0200323 W IL0200323 W IL 0200323W WO 02086578 A3 WO02086578 A3 WO 02086578A3
Authority
WO
WIPO (PCT)
Prior art keywords
objective
focal plane
beam stop
dark field
back focal
Prior art date
Application number
PCT/IL2002/000323
Other languages
French (fr)
Other versions
WO2002086578A2 (en
Inventor
Ido Braslavsky
Joel Stavans
Roee Amit
Original Assignee
Yeda Res & Dev
Ido Braslavsky
Joel Stavans
Roee Amit
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yeda Res & Dev, Ido Braslavsky, Joel Stavans, Roee Amit filed Critical Yeda Res & Dev
Priority to AU2002307784A priority Critical patent/AU2002307784A1/en
Publication of WO2002086578A2 publication Critical patent/WO2002086578A2/en
Publication of WO2002086578A3 publication Critical patent/WO2002086578A3/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/10—Condensers affording dark-field illumination

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

A dark field microscope comprising an objective (18) lens which both illuminates and images a sample carried by a substrate (21), by means of a beam stop (22) located such that it blocks light back-reflected from the substrate, leaving only the scattered light to be detected. The microscope, in its most convenient embodiment, has an additional optical element (23) for forming a conjugate image of the back focal plane (BFP)) of the objective at an equivalent back focal plane located outside of the objective. A beam stop located in the region of this equivalent back focal plane, being outside of the objective lens, can be conveniently shaped and installed. This use of a spatial beam stop obviates the need for fluorescence techniques thus providing means of tracking particles of only tens of nanometers in size for long periods without the bleaching effects typical of fluorescence microscopy.
PCT/IL2002/000323 2001-04-24 2002-04-24 Objective-type dark field scattering microscope WO2002086578A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU2002307784A AU2002307784A1 (en) 2001-04-24 2002-04-24 Objective-type dark field scattering microscope

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IL142782 2001-04-24
IL14278201A IL142782A0 (en) 2001-04-24 2001-04-24 Objective-type dark field scattering microscope

Publications (2)

Publication Number Publication Date
WO2002086578A2 WO2002086578A2 (en) 2002-10-31
WO2002086578A3 true WO2002086578A3 (en) 2004-03-18

Family

ID=11075348

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IL2002/000323 WO2002086578A2 (en) 2001-04-24 2002-04-24 Objective-type dark field scattering microscope

Country Status (3)

Country Link
AU (1) AU2002307784A1 (en)
IL (1) IL142782A0 (en)
WO (1) WO2002086578A2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5726490B2 (en) * 2010-11-26 2015-06-03 オリンパス株式会社 Light intensity measurement unit and microscope equipped with the same
WO2014184793A1 (en) * 2013-05-16 2014-11-20 Yeda Research And Development Co. Ltd. Method and system for use in inspection of samples by detection of optically excited emission from the sample
DE102013222562B4 (en) 2013-11-06 2023-01-26 Leica Microsystems Cms Gmbh Microscope and method and use of a microscope for evanescent illumination and point grid illumination
JP6357317B2 (en) * 2014-01-30 2018-07-11 オリンパス株式会社 Microscope illumination device, microscope illumination method, and microscope
GB201819029D0 (en) * 2018-11-22 2019-01-09 Cambridge Entpr Ltd Optical microscopy
CN113406842A (en) * 2021-06-23 2021-09-17 湘潭大学 Ultramicro stacked dark field photography system and method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4062623A (en) * 1975-04-07 1977-12-13 Canon Kabushiki Kaisha Device for observing an object
US4871257A (en) * 1982-12-01 1989-10-03 Canon Kabushiki Kaisha Optical apparatus for observing patterned article
US5220403A (en) * 1991-03-11 1993-06-15 International Business Machines Corporation Apparatus and a method for high numerical aperture microscopic examination of materials
EP1054282A2 (en) * 1999-05-21 2000-11-22 Leica Microsystems Wetzlar GmbH Transducer for producing optical contrasts

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4062623A (en) * 1975-04-07 1977-12-13 Canon Kabushiki Kaisha Device for observing an object
US4871257A (en) * 1982-12-01 1989-10-03 Canon Kabushiki Kaisha Optical apparatus for observing patterned article
US5220403A (en) * 1991-03-11 1993-06-15 International Business Machines Corporation Apparatus and a method for high numerical aperture microscopic examination of materials
EP1054282A2 (en) * 1999-05-21 2000-11-22 Leica Microsystems Wetzlar GmbH Transducer for producing optical contrasts

Also Published As

Publication number Publication date
WO2002086578A2 (en) 2002-10-31
IL142782A0 (en) 2002-03-10
AU2002307784A1 (en) 2002-11-05

Similar Documents

Publication Publication Date Title
CN109477955A (en) Interference scattering microscope
NL1030102C2 (en) Fluorescence microscope.
ATE481658T1 (en) AUTOFOCUS DEVICE FOR MICROSCOPY
US20160070092A1 (en) Method and device for fluorescent imaging of single nano-particles and viruses
EP1783816A3 (en) Apparatus for combined laser focusing and spot imaging
CN106461927A (en) Imaging device for a microscope
Weigel et al. Resolution in the ApoTome and the confocal laser scanning microscope: comparison
WO2004090604A3 (en) Microscope arrangement
WO2002086578A3 (en) Objective-type dark field scattering microscope
CN108027479B (en) Optical element alignment and retention for optical instruments
CN103268009B (en) Vertical illumination dark-field microscope
WO2014199713A1 (en) Confocal laser scanning microscope
EP3227740B1 (en) Image cytometer
US9268121B2 (en) Sensor device with double telecentric optical system
EP3084501B1 (en) Light source adaptor for a microscope
US20090116024A1 (en) Method for obtaining a high resolution image
EP1139140A3 (en) Optical microscope apparatus using convergent beam as illumination light
JP2005140956A (en) Focal point detection device and fluorescent microscope
JP4686015B2 (en) Lighting device
Carlsson Light microscopy
US10884230B2 (en) Phase object visualization apparatus and phase object visualization method
JP2009086392A (en) Phase-contrast microscope
JP2000066109A5 (en)
FR2848682A1 (en) LIGHTING OPTICAL MICROSCOPE MODIFIABLE STRUCTURE
JP6239479B2 (en) Dark field microscope and illumination method

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NO NZ OM PH PL PT RO RU SD SE SG SI SK SL TJ TM TN TR TT TZ UA UG US UZ VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GH GM KE LS MW MZ SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

121 Ep: the epo has been informed by wipo that ep was designated in this application
DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
REG Reference to national code

Ref country code: DE

Ref legal event code: 8642

122 Ep: pct application non-entry in european phase
NENP Non-entry into the national phase

Ref country code: JP

WWW Wipo information: withdrawn in national office

Country of ref document: JP