WO2003041124A2 - Method of fabricating a gate stack at low temperature - Google Patents
Method of fabricating a gate stack at low temperature Download PDFInfo
- Publication number
- WO2003041124A2 WO2003041124A2 PCT/US2002/027230 US0227230W WO03041124A2 WO 2003041124 A2 WO2003041124 A2 WO 2003041124A2 US 0227230 W US0227230 W US 0227230W WO 03041124 A2 WO03041124 A2 WO 03041124A2
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Classifications
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
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- H01L21/28158—Making the insulator
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- H01L21/28185—Making the insulator on single crystalline silicon, e.g. using a liquid, i.e. chemical oxidation with a treatment, e.g. annealing, after the formation of the gate insulator and before the formation of the definitive gate conductor
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- H01L21/02172—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides
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- H01L21/02178—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides characterised by the metal the material containing aluminium, e.g. Al2O3
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- H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H01L21/0228—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition deposition by cyclic CVD, e.g. ALD, ALE, pulsed CVD
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
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- H01L21/28194—Making the insulator on single crystalline silicon, e.g. using a liquid, i.e. chemical oxidation by deposition, e.g. evaporation, ALD, CVD, sputtering, laser deposition
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
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- H01L21/28202—Making the insulator on single crystalline silicon, e.g. using a liquid, i.e. chemical oxidation in a nitrogen-containing ambient, e.g. nitride deposition, growth, oxynitridation, NH3 nitridation, N2O oxidation, thermal nitridation, RTN, plasma nitridation, RPN
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
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- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
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- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
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- H01L29/518—Insulating materials associated therewith the insulating material containing nitrogen, e.g. nitride, oxynitride, nitrogen-doped material
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/28008—Making conductor-insulator-semiconductor electrodes
- H01L21/28017—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon
- H01L21/28158—Making the insulator
- H01L21/28167—Making the insulator on single crystalline silicon, e.g. using a liquid, i.e. chemical oxidation
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- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Ceramic Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Formation Of Insulating Films (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003543069A JP4746269B2 (en) | 2001-08-31 | 2002-08-26 | Gate stack manufacturing method at low temperature |
AU2002363358A AU2002363358A1 (en) | 2001-08-31 | 2002-08-26 | Method of fabricating a gate stack at low temperature |
KR1020047002823A KR100920402B1 (en) | 2001-08-31 | 2002-08-26 | Low Temperature Gate Stack |
EP20020798410 EP1425785A2 (en) | 2001-08-31 | 2002-08-26 | Method of fabricating a gate stack at low temperature |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US31656201P | 2001-08-31 | 2001-08-31 | |
US60/316,562 | 2001-08-31 | ||
US10/227,475 US6806145B2 (en) | 2001-08-31 | 2002-08-22 | Low temperature method of forming a gate stack with a high k layer deposited over an interfacial oxide layer |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003041124A2 true WO2003041124A2 (en) | 2003-05-15 |
WO2003041124A3 WO2003041124A3 (en) | 2003-11-20 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2002/027230 WO2003041124A2 (en) | 2001-08-31 | 2002-08-26 | Method of fabricating a gate stack at low temperature |
Country Status (4)
Country | Link |
---|---|
US (1) | US6806145B2 (en) |
JP (1) | JP4746269B2 (en) |
AU (1) | AU2002363358A1 (en) |
WO (1) | WO2003041124A2 (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
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WO2006012338A2 (en) * | 2004-06-30 | 2006-02-02 | Intel Corporation | Forming high-k dielectric layers on smooth substrates |
JP2006108439A (en) * | 2004-10-06 | 2006-04-20 | Samsung Electronics Co Ltd | Semiconductor device |
WO2006090645A1 (en) * | 2005-02-24 | 2006-08-31 | Hitachi Kokusai Electric Inc. | Semiconductor device manufacturing method and substrate processing apparatus |
EP2058844A1 (en) * | 2007-10-30 | 2009-05-13 | Interuniversitair Microelektronica Centrum (IMEC) | Method of forming a semiconductor device |
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Families Citing this family (197)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6974766B1 (en) * | 1998-10-01 | 2005-12-13 | Applied Materials, Inc. | In situ deposition of a low κ dielectric layer, barrier layer, etch stop, and anti-reflective coating for damascene application |
CA2358528C (en) | 1998-12-23 | 2015-04-14 | The Chase Manhattan Bank | System and method for integrating trading operations including the generation, processing and tracking of trade documents |
US6319766B1 (en) | 2000-02-22 | 2001-11-20 | Applied Materials, Inc. | Method of tantalum nitride deposition by tantalum oxide densification |
US6620723B1 (en) * | 2000-06-27 | 2003-09-16 | Applied Materials, Inc. | Formation of boride barrier layers using chemisorption techniques |
US6551929B1 (en) * | 2000-06-28 | 2003-04-22 | Applied Materials, Inc. | Bifurcated deposition process for depositing refractory metal layers employing atomic layer deposition and chemical vapor deposition techniques |
US7101795B1 (en) * | 2000-06-28 | 2006-09-05 | Applied Materials, Inc. | Method and apparatus for depositing refractory metal layers employing sequential deposition techniques to form a nucleation layer |
US7732327B2 (en) | 2000-06-28 | 2010-06-08 | Applied Materials, Inc. | Vapor deposition of tungsten materials |
US7964505B2 (en) | 2005-01-19 | 2011-06-21 | Applied Materials, Inc. | Atomic layer deposition of tungsten materials |
US6936538B2 (en) | 2001-07-16 | 2005-08-30 | Applied Materials, Inc. | Method and apparatus for depositing tungsten after surface treatment to improve film characteristics |
US7405158B2 (en) | 2000-06-28 | 2008-07-29 | Applied Materials, Inc. | Methods for depositing tungsten layers employing atomic layer deposition techniques |
US20020036780A1 (en) * | 2000-09-27 | 2002-03-28 | Hiroaki Nakamura | Image processing apparatus |
US6852167B2 (en) * | 2001-03-01 | 2005-02-08 | Micron Technology, Inc. | Methods, systems, and apparatus for uniform chemical-vapor depositions |
US9139906B2 (en) * | 2001-03-06 | 2015-09-22 | Asm America, Inc. | Doping with ALD technology |
US6596643B2 (en) * | 2001-05-07 | 2003-07-22 | Applied Materials, Inc. | CVD TiSiN barrier for copper integration |
US6849545B2 (en) * | 2001-06-20 | 2005-02-01 | Applied Materials, Inc. | System and method to form a composite film stack utilizing sequential deposition techniques |
US20030003665A1 (en) * | 2001-06-27 | 2003-01-02 | Nakagawa Osamu Samuel | Process for high-dielectric constant metal-insulator metal capacitor in VLSI multi-level metallization systems |
US7211144B2 (en) | 2001-07-13 | 2007-05-01 | Applied Materials, Inc. | Pulsed nucleation deposition of tungsten layers |
US20070009658A1 (en) * | 2001-07-13 | 2007-01-11 | Yoo Jong H | Pulse nucleation enhanced nucleation technique for improved step coverage and better gap fill for WCVD process |
US20030198754A1 (en) * | 2001-07-16 | 2003-10-23 | Ming Xi | Aluminum oxide chamber and process |
WO2003029515A2 (en) * | 2001-07-16 | 2003-04-10 | Applied Materials, Inc. | Formation of composite tungsten films |
US20080268635A1 (en) * | 2001-07-25 | 2008-10-30 | Sang-Ho Yu | Process for forming cobalt and cobalt silicide materials in copper contact applications |
US20090004850A1 (en) | 2001-07-25 | 2009-01-01 | Seshadri Ganguli | Process for forming cobalt and cobalt silicide materials in tungsten contact applications |
US9051641B2 (en) * | 2001-07-25 | 2015-06-09 | Applied Materials, Inc. | Cobalt deposition on barrier surfaces |
US8110489B2 (en) | 2001-07-25 | 2012-02-07 | Applied Materials, Inc. | Process for forming cobalt-containing materials |
US8026161B2 (en) | 2001-08-30 | 2011-09-27 | Micron Technology, Inc. | Highly reliable amorphous high-K gate oxide ZrO2 |
US6718126B2 (en) * | 2001-09-14 | 2004-04-06 | Applied Materials, Inc. | Apparatus and method for vaporizing solid precursor for CVD or atomic layer deposition |
US6936906B2 (en) * | 2001-09-26 | 2005-08-30 | Applied Materials, Inc. | Integration of barrier layer and seed layer |
US20030059538A1 (en) * | 2001-09-26 | 2003-03-27 | Applied Materials, Inc. | Integration of barrier layer and seed layer |
TW589684B (en) * | 2001-10-10 | 2004-06-01 | Applied Materials Inc | Method for depositing refractory metal layers employing sequential deposition techniques |
US7780785B2 (en) | 2001-10-26 | 2010-08-24 | Applied Materials, Inc. | Gas delivery apparatus for atomic layer deposition |
US6916398B2 (en) | 2001-10-26 | 2005-07-12 | Applied Materials, Inc. | Gas delivery apparatus and method for atomic layer deposition |
US6773507B2 (en) * | 2001-12-06 | 2004-08-10 | Applied Materials, Inc. | Apparatus and method for fast-cycle atomic layer deposition |
US7081271B2 (en) | 2001-12-07 | 2006-07-25 | Applied Materials, Inc. | Cyclical deposition of refractory metal silicon nitride |
US6900122B2 (en) * | 2001-12-20 | 2005-05-31 | Micron Technology, Inc. | Low-temperature grown high-quality ultra-thin praseodymium gate dielectrics |
US6809026B2 (en) | 2001-12-21 | 2004-10-26 | Applied Materials, Inc. | Selective deposition of a barrier layer on a metal film |
US6939801B2 (en) * | 2001-12-21 | 2005-09-06 | Applied Materials, Inc. | Selective deposition of a barrier layer on a dielectric material |
EP1324393B1 (en) * | 2001-12-28 | 2008-04-09 | STMicroelectronics S.r.l. | Manufacturing process of a semiconductor non-volatile memory cell and corresponding memory-cell |
AU2003238853A1 (en) * | 2002-01-25 | 2003-09-02 | Applied Materials, Inc. | Apparatus for cyclical deposition of thin films |
US6911391B2 (en) | 2002-01-26 | 2005-06-28 | Applied Materials, Inc. | Integration of titanium and titanium nitride layers |
US6998014B2 (en) | 2002-01-26 | 2006-02-14 | Applied Materials, Inc. | Apparatus and method for plasma assisted deposition |
US6827978B2 (en) * | 2002-02-11 | 2004-12-07 | Applied Materials, Inc. | Deposition of tungsten films |
US6833161B2 (en) * | 2002-02-26 | 2004-12-21 | Applied Materials, Inc. | Cyclical deposition of tungsten nitride for metal oxide gate electrode |
US6972267B2 (en) * | 2002-03-04 | 2005-12-06 | Applied Materials, Inc. | Sequential deposition of tantalum nitride using a tantalum-containing precursor and a nitrogen-containing precursor |
US6825134B2 (en) * | 2002-03-26 | 2004-11-30 | Applied Materials, Inc. | Deposition of film layers by alternately pulsing a precursor and high frequency power in a continuous gas flow |
US7439191B2 (en) * | 2002-04-05 | 2008-10-21 | Applied Materials, Inc. | Deposition of silicon layers for active matrix liquid crystal display (AMLCD) applications |
US6846516B2 (en) * | 2002-04-08 | 2005-01-25 | Applied Materials, Inc. | Multiple precursor cyclical deposition system |
US6720027B2 (en) * | 2002-04-08 | 2004-04-13 | Applied Materials, Inc. | Cyclical deposition of a variable content titanium silicon nitride layer |
US7279432B2 (en) * | 2002-04-16 | 2007-10-09 | Applied Materials, Inc. | System and method for forming an integrated barrier layer |
US7160577B2 (en) | 2002-05-02 | 2007-01-09 | Micron Technology, Inc. | Methods for atomic-layer deposition of aluminum oxides in integrated circuits |
US6784101B1 (en) * | 2002-05-16 | 2004-08-31 | Advanced Micro Devices Inc | Formation of high-k gate dielectric layers for MOS devices fabricated on strained lattice semiconductor substrates with minimized stress relaxation |
US7041335B2 (en) * | 2002-06-04 | 2006-05-09 | Applied Materials, Inc. | Titanium tantalum nitride silicide layer |
US7205218B2 (en) | 2002-06-05 | 2007-04-17 | Micron Technology, Inc. | Method including forming gate dielectrics having multiple lanthanide oxide layers |
US7135421B2 (en) * | 2002-06-05 | 2006-11-14 | Micron Technology, Inc. | Atomic layer-deposited hafnium aluminum oxide |
US6858547B2 (en) * | 2002-06-14 | 2005-02-22 | Applied Materials, Inc. | System and method for forming a gate dielectric |
US20030232501A1 (en) * | 2002-06-14 | 2003-12-18 | Kher Shreyas S. | Surface pre-treatment for enhancement of nucleation of high dielectric constant materials |
US7067439B2 (en) * | 2002-06-14 | 2006-06-27 | Applied Materials, Inc. | ALD metal oxide deposition process using direct oxidation |
US7221586B2 (en) | 2002-07-08 | 2007-05-22 | Micron Technology, Inc. | Memory utilizing oxide nanolaminates |
US6838125B2 (en) * | 2002-07-10 | 2005-01-04 | Applied Materials, Inc. | Method of film deposition using activated precursor gases |
US7186385B2 (en) | 2002-07-17 | 2007-03-06 | Applied Materials, Inc. | Apparatus for providing gas to a processing chamber |
US7066194B2 (en) * | 2002-07-19 | 2006-06-27 | Applied Materials, Inc. | Valve design and configuration for fast delivery system |
US6772072B2 (en) | 2002-07-22 | 2004-08-03 | Applied Materials, Inc. | Method and apparatus for monitoring solid precursor delivery |
US6915592B2 (en) * | 2002-07-29 | 2005-07-12 | Applied Materials, Inc. | Method and apparatus for generating gas to a processing chamber |
US6921702B2 (en) * | 2002-07-30 | 2005-07-26 | Micron Technology Inc. | Atomic layer deposited nanolaminates of HfO2/ZrO2 films as gate dielectrics |
US6790791B2 (en) * | 2002-08-15 | 2004-09-14 | Micron Technology, Inc. | Lanthanide doped TiOx dielectric films |
US7199023B2 (en) * | 2002-08-28 | 2007-04-03 | Micron Technology, Inc. | Atomic layer deposited HfSiON dielectric films wherein each precursor is independendently pulsed |
US7084078B2 (en) * | 2002-08-29 | 2006-08-01 | Micron Technology, Inc. | Atomic layer deposited lanthanide doped TiOx dielectric films |
US7122415B2 (en) * | 2002-09-12 | 2006-10-17 | Promos Technologies, Inc. | Atomic layer deposition of interpoly oxides in a non-volatile memory device |
US6821563B2 (en) | 2002-10-02 | 2004-11-23 | Applied Materials, Inc. | Gas distribution system for cyclical layer deposition |
US20040065255A1 (en) * | 2002-10-02 | 2004-04-08 | Applied Materials, Inc. | Cyclical layer deposition system |
US6905737B2 (en) * | 2002-10-11 | 2005-06-14 | Applied Materials, Inc. | Method of delivering activated species for rapid cyclical deposition |
US7540920B2 (en) | 2002-10-18 | 2009-06-02 | Applied Materials, Inc. | Silicon-containing layer deposition with silicon compounds |
US6723581B1 (en) * | 2002-10-21 | 2004-04-20 | Agere Systems Inc. | Semiconductor device having a high-K gate dielectric and method of manufacture thereof |
US6686212B1 (en) * | 2002-10-31 | 2004-02-03 | Sharp Laboratories Of America, Inc. | Method to deposit a stacked high-κ gate dielectric for CMOS applications |
EP1420080A3 (en) * | 2002-11-14 | 2005-11-09 | Applied Materials, Inc. | Apparatus and method for hybrid chemical deposition processes |
US7045406B2 (en) * | 2002-12-03 | 2006-05-16 | Asm International, N.V. | Method of forming an electrode with adjusted work function |
US7101813B2 (en) * | 2002-12-04 | 2006-09-05 | Micron Technology Inc. | Atomic layer deposited Zr-Sn-Ti-O films |
US6958302B2 (en) * | 2002-12-04 | 2005-10-25 | Micron Technology, Inc. | Atomic layer deposited Zr-Sn-Ti-O films using TiI4 |
KR100522427B1 (en) * | 2002-12-30 | 2005-10-20 | 주식회사 하이닉스반도체 | Method of manufacturing capacitor for semiconductor device |
US7262133B2 (en) * | 2003-01-07 | 2007-08-28 | Applied Materials, Inc. | Enhancement of copper line reliability using thin ALD tan film to cap the copper line |
US7244683B2 (en) * | 2003-01-07 | 2007-07-17 | Applied Materials, Inc. | Integration of ALD/CVD barriers with porous low k materials |
US6753248B1 (en) | 2003-01-27 | 2004-06-22 | Applied Materials, Inc. | Post metal barrier/adhesion film |
US6852645B2 (en) * | 2003-02-13 | 2005-02-08 | Texas Instruments Incorporated | High temperature interface layer growth for high-k gate dielectric |
US7192892B2 (en) * | 2003-03-04 | 2007-03-20 | Micron Technology, Inc. | Atomic layer deposited dielectric layers |
JP4005602B2 (en) * | 2003-03-17 | 2007-11-07 | 富士通株式会社 | Manufacturing method of semiconductor device |
US7135369B2 (en) * | 2003-03-31 | 2006-11-14 | Micron Technology, Inc. | Atomic layer deposited ZrAlxOy dielectric layers including Zr4AlO9 |
US20040198069A1 (en) * | 2003-04-04 | 2004-10-07 | Applied Materials, Inc. | Method for hafnium nitride deposition |
US7183186B2 (en) * | 2003-04-22 | 2007-02-27 | Micro Technology, Inc. | Atomic layer deposited ZrTiO4 films |
WO2004113585A2 (en) * | 2003-06-18 | 2004-12-29 | Applied Materials, Inc. | Atomic layer deposition of barrier materials |
US7192824B2 (en) * | 2003-06-24 | 2007-03-20 | Micron Technology, Inc. | Lanthanide oxide / hafnium oxide dielectric layers |
US7049192B2 (en) * | 2003-06-24 | 2006-05-23 | Micron Technology, Inc. | Lanthanide oxide / hafnium oxide dielectrics |
US7235495B2 (en) * | 2003-07-31 | 2007-06-26 | Fsi International, Inc. | Controlled growth of highly uniform, oxide layers, especially ultrathin layers |
KR20060121871A (en) * | 2003-09-11 | 2006-11-29 | 에프에스아이 인터내쇼날 인크. | Acoustic diffusers for acoustic field uniformity |
TW200517192A (en) * | 2003-09-11 | 2005-06-01 | Fsi Int Inc | Semiconductor wafer immersion systems and treatments using modulated acoustic energy |
US20050067103A1 (en) * | 2003-09-26 | 2005-03-31 | Applied Materials, Inc. | Interferometer endpoint monitoring device |
US7166528B2 (en) * | 2003-10-10 | 2007-01-23 | Applied Materials, Inc. | Methods of selective deposition of heavily doped epitaxial SiGe |
TWI228789B (en) * | 2004-01-20 | 2005-03-01 | Ind Tech Res Inst | Method for producing dielectric layer of high-k gate in MOST |
US7098150B2 (en) * | 2004-03-05 | 2006-08-29 | Air Liquide America L.P. | Method for novel deposition of high-k MSiON dielectric films |
US7256450B2 (en) * | 2004-03-24 | 2007-08-14 | Micron Technology, Inc. | NROM memory device with a high-permittivity gate dielectric formed by the low temperature oxidation of metals |
US20050252449A1 (en) * | 2004-05-12 | 2005-11-17 | Nguyen Son T | Control of gas flow and delivery to suppress the formation of particles in an MOCVD/ALD system |
US8119210B2 (en) | 2004-05-21 | 2012-02-21 | Applied Materials, Inc. | Formation of a silicon oxynitride layer on a high-k dielectric material |
US8323754B2 (en) * | 2004-05-21 | 2012-12-04 | Applied Materials, Inc. | Stabilization of high-k dielectric materials |
US20060153995A1 (en) * | 2004-05-21 | 2006-07-13 | Applied Materials, Inc. | Method for fabricating a dielectric stack |
US20060019033A1 (en) * | 2004-05-21 | 2006-01-26 | Applied Materials, Inc. | Plasma treatment of hafnium-containing materials |
US20060062917A1 (en) * | 2004-05-21 | 2006-03-23 | Shankar Muthukrishnan | Vapor deposition of hafnium silicate materials with tris(dimethylamino)silane |
US7135370B2 (en) * | 2004-07-01 | 2006-11-14 | Freescale Semiconductor, Inc. | Dielectric storage memory cell having high permittivity top dielectric and method therefor |
KR100539213B1 (en) * | 2004-07-10 | 2005-12-27 | 삼성전자주식회사 | Method of forming a composite dielectric layer and method of manufacturing a semiconductor device using the same |
US7241686B2 (en) * | 2004-07-20 | 2007-07-10 | Applied Materials, Inc. | Atomic layer deposition of tantalum-containing materials using the tantalum precursor TAIMATA |
US7081421B2 (en) | 2004-08-26 | 2006-07-25 | Micron Technology, Inc. | Lanthanide oxide dielectric layer |
US7588988B2 (en) | 2004-08-31 | 2009-09-15 | Micron Technology, Inc. | Method of forming apparatus having oxide films formed using atomic layer deposition |
US7494939B2 (en) | 2004-08-31 | 2009-02-24 | Micron Technology, Inc. | Methods for forming a lanthanum-metal oxide dielectric layer |
TWI237867B (en) * | 2004-10-29 | 2005-08-11 | Taiwan Semiconductor Mfg | Method of improving to deposit dielectric |
US7682940B2 (en) * | 2004-12-01 | 2010-03-23 | Applied Materials, Inc. | Use of Cl2 and/or HCl during silicon epitaxial film formation |
US7312128B2 (en) * | 2004-12-01 | 2007-12-25 | Applied Materials, Inc. | Selective epitaxy process with alternating gas supply |
US7560352B2 (en) * | 2004-12-01 | 2009-07-14 | Applied Materials, Inc. | Selective deposition |
US7429402B2 (en) * | 2004-12-10 | 2008-09-30 | Applied Materials, Inc. | Ruthenium as an underlayer for tungsten film deposition |
US20060125030A1 (en) * | 2004-12-13 | 2006-06-15 | Micron Technology, Inc. | Hybrid ALD-CVD of PrxOy/ZrO2 films as gate dielectrics |
US7235501B2 (en) * | 2004-12-13 | 2007-06-26 | Micron Technology, Inc. | Lanthanum hafnium oxide dielectrics |
KR20060072498A (en) * | 2004-12-23 | 2006-06-28 | 동부일렉트로닉스 주식회사 | Semiconductor device and fabrication method thereof |
US7560395B2 (en) | 2005-01-05 | 2009-07-14 | Micron Technology, Inc. | Atomic layer deposited hafnium tantalum oxide dielectrics |
US7235492B2 (en) * | 2005-01-31 | 2007-06-26 | Applied Materials, Inc. | Low temperature etchant for treatment of silicon-containing surfaces |
US7508648B2 (en) * | 2005-02-08 | 2009-03-24 | Micron Technology, Inc. | Atomic layer deposition of Dy doped HfO2 films as gate dielectrics |
US7498247B2 (en) | 2005-02-23 | 2009-03-03 | Micron Technology, Inc. | Atomic layer deposition of Hf3N4/HfO2 films as gate dielectrics |
JP4914573B2 (en) * | 2005-02-25 | 2012-04-11 | キヤノンアネルバ株式会社 | Method of manufacturing field effect transistor having high dielectric gate insulating film and metal gate electrode |
US7687409B2 (en) | 2005-03-29 | 2010-03-30 | Micron Technology, Inc. | Atomic layer deposited titanium silicon oxide films |
GB0506896D0 (en) * | 2005-04-05 | 2005-05-11 | Plastic Logic Ltd | Stack ablation |
US7662729B2 (en) | 2005-04-28 | 2010-02-16 | Micron Technology, Inc. | Atomic layer deposition of a ruthenium layer to a lanthanide oxide dielectric layer |
US7390756B2 (en) * | 2005-04-28 | 2008-06-24 | Micron Technology, Inc. | Atomic layer deposited zirconium silicon oxide films |
US7651955B2 (en) * | 2005-06-21 | 2010-01-26 | Applied Materials, Inc. | Method for forming silicon-containing materials during a photoexcitation deposition process |
US7648927B2 (en) * | 2005-06-21 | 2010-01-19 | Applied Materials, Inc. | Method for forming silicon-containing materials during a photoexcitation deposition process |
US20060286774A1 (en) * | 2005-06-21 | 2006-12-21 | Applied Materials. Inc. | Method for forming silicon-containing materials during a photoexcitation deposition process |
US7927948B2 (en) | 2005-07-20 | 2011-04-19 | Micron Technology, Inc. | Devices with nanocrystals and methods of formation |
US7829147B2 (en) | 2005-08-18 | 2010-11-09 | Corning Incorporated | Hermetically sealing a device without a heat treating step and the resulting hermetically sealed device |
US7722929B2 (en) * | 2005-08-18 | 2010-05-25 | Corning Incorporated | Sealing technique for decreasing the time it takes to hermetically seal a device and the resulting hermetically sealed device |
US20080206589A1 (en) * | 2007-02-28 | 2008-08-28 | Bruce Gardiner Aitken | Low tempertature sintering using Sn2+ containing inorganic materials to hermetically seal a device |
US20070040501A1 (en) * | 2005-08-18 | 2007-02-22 | Aitken Bruce G | Method for inhibiting oxygen and moisture degradation of a device and the resulting device |
US20070049043A1 (en) * | 2005-08-23 | 2007-03-01 | Applied Materials, Inc. | Nitrogen profile engineering in HI-K nitridation for device performance enhancement and reliability improvement |
US7402534B2 (en) * | 2005-08-26 | 2008-07-22 | Applied Materials, Inc. | Pretreatment processes within a batch ALD reactor |
US8110469B2 (en) | 2005-08-30 | 2012-02-07 | Micron Technology, Inc. | Graded dielectric layers |
US7544596B2 (en) * | 2005-08-30 | 2009-06-09 | Micron Technology, Inc. | Atomic layer deposition of GdScO3 films as gate dielectrics |
CN100461343C (en) * | 2005-09-28 | 2009-02-11 | 中芯国际集成电路制造(上海)有限公司 | Method for depositing atomic-layer to semiconductor device by pretreatment materials |
US20070099422A1 (en) * | 2005-10-28 | 2007-05-03 | Kapila Wijekoon | Process for electroless copper deposition |
TWI332532B (en) * | 2005-11-04 | 2010-11-01 | Applied Materials Inc | Apparatus and process for plasma-enhanced atomic layer deposition |
US7972974B2 (en) * | 2006-01-10 | 2011-07-05 | Micron Technology, Inc. | Gallium lanthanide oxide films |
JP4983025B2 (en) * | 2006-01-17 | 2012-07-25 | 富士通セミコンダクター株式会社 | Manufacturing method of semiconductor device |
US7709402B2 (en) | 2006-02-16 | 2010-05-04 | Micron Technology, Inc. | Conductive layers for hafnium silicon oxynitride films |
US7964514B2 (en) * | 2006-03-02 | 2011-06-21 | Applied Materials, Inc. | Multiple nitrogen plasma treatments for thin SiON dielectrics |
US7674337B2 (en) * | 2006-04-07 | 2010-03-09 | Applied Materials, Inc. | Gas manifolds for use during epitaxial film formation |
US7798096B2 (en) | 2006-05-05 | 2010-09-21 | Applied Materials, Inc. | Plasma, UV and ion/neutral assisted ALD or CVD in a batch tool |
TWI395335B (en) * | 2006-06-30 | 2013-05-01 | Applied Materials Inc | Nanocrystal formation |
DE112007001813T5 (en) * | 2006-07-31 | 2009-07-09 | Applied Materials, Inc., Santa Clara | Method for controlling the morphology during the formation of an epitaxial layer |
JP5090451B2 (en) * | 2006-07-31 | 2012-12-05 | アプライド マテリアルズ インコーポレイテッド | Method for forming carbon-containing silicon epitaxial layer |
US20080048178A1 (en) * | 2006-08-24 | 2008-02-28 | Bruce Gardiner Aitken | Tin phosphate barrier film, method, and apparatus |
US7582549B2 (en) * | 2006-08-25 | 2009-09-01 | Micron Technology, Inc. | Atomic layer deposited barium strontium titanium oxide films |
US7605030B2 (en) | 2006-08-31 | 2009-10-20 | Micron Technology, Inc. | Hafnium tantalum oxynitride high-k dielectric and metal gates |
KR101427142B1 (en) * | 2006-10-05 | 2014-08-07 | 에이에스엠 아메리카, 인코포레이티드 | ALD of metal silicate films |
US7521379B2 (en) * | 2006-10-09 | 2009-04-21 | Applied Materials, Inc. | Deposition and densification process for titanium nitride barrier layers |
JP2008103442A (en) * | 2006-10-18 | 2008-05-01 | Seiko Epson Corp | Process for fabricating semiconductor device |
US8092695B2 (en) * | 2006-10-30 | 2012-01-10 | Applied Materials, Inc. | Endpoint detection for photomask etching |
US20080099436A1 (en) * | 2006-10-30 | 2008-05-01 | Michael Grimbergen | Endpoint detection for photomask etching |
JP5519901B2 (en) * | 2007-07-04 | 2014-06-11 | 三菱電機株式会社 | Silicon carbide field effect transistor and method of manufacturing the same |
US7585762B2 (en) * | 2007-09-25 | 2009-09-08 | Applied Materials, Inc. | Vapor deposition processes for tantalum carbide nitride materials |
US7678298B2 (en) * | 2007-09-25 | 2010-03-16 | Applied Materials, Inc. | Tantalum carbide nitride materials by vapor deposition processes |
US7824743B2 (en) * | 2007-09-28 | 2010-11-02 | Applied Materials, Inc. | Deposition processes for titanium nitride barrier and aluminum |
US8622308B1 (en) | 2007-12-31 | 2014-01-07 | Jpmorgan Chase Bank, N.A. | System and method for processing transactions using a multi-account transactions device |
US7659158B2 (en) | 2008-03-31 | 2010-02-09 | Applied Materials, Inc. | Atomic layer deposition processes for non-volatile memory devices |
US8945675B2 (en) | 2008-05-29 | 2015-02-03 | Asm International N.V. | Methods for forming conductive titanium oxide thin films |
US20100062149A1 (en) | 2008-09-08 | 2010-03-11 | Applied Materials, Inc. | Method for tuning a deposition rate during an atomic layer deposition process |
US8491967B2 (en) * | 2008-09-08 | 2013-07-23 | Applied Materials, Inc. | In-situ chamber treatment and deposition process |
DE102008050941A1 (en) * | 2008-10-10 | 2010-04-22 | Behr Gmbh & Co. Kg | CVD coating method, coating device and component of a fluid guide |
US8146896B2 (en) * | 2008-10-31 | 2012-04-03 | Applied Materials, Inc. | Chemical precursor ampoule for vapor deposition processes |
US8557702B2 (en) | 2009-02-02 | 2013-10-15 | Asm America, Inc. | Plasma-enhanced atomic layers deposition of conductive material over dielectric layers |
US8313994B2 (en) * | 2009-03-26 | 2012-11-20 | Tokyo Electron Limited | Method for forming a high-K gate stack with reduced effective oxide thickness |
FI20095947A0 (en) * | 2009-09-14 | 2009-09-14 | Beneq Oy | Multilayer Coating, Process for Manufacturing a Multilayer Coating, and Uses for the Same |
US8399344B2 (en) * | 2009-10-07 | 2013-03-19 | Asm International N.V. | Method for adjusting the threshold voltage of a gate stack of a PMOS device |
US8445974B2 (en) * | 2010-01-07 | 2013-05-21 | International Business Machines Corporation | Asymmetric FET including sloped threshold voltage adjusting material layer and method of fabricating same |
US8420208B2 (en) | 2010-08-11 | 2013-04-16 | Micron Technology, Inc. | High-k dielectric material and methods of forming the high-k dielectric material |
US8778204B2 (en) | 2010-10-29 | 2014-07-15 | Applied Materials, Inc. | Methods for reducing photoresist interference when monitoring a target layer in a plasma process |
KR101895398B1 (en) * | 2011-04-28 | 2018-10-25 | 삼성전자 주식회사 | Method of forming an oxide layer and a method of fabricating a semiconductor device comprising the same |
US8961804B2 (en) | 2011-10-25 | 2015-02-24 | Applied Materials, Inc. | Etch rate detection for photomask etching |
US8808559B2 (en) | 2011-11-22 | 2014-08-19 | Applied Materials, Inc. | Etch rate detection for reflective multi-material layers etching |
US8900469B2 (en) | 2011-12-19 | 2014-12-02 | Applied Materials, Inc. | Etch rate detection for anti-reflective coating layer and absorber layer etching |
US9805939B2 (en) | 2012-10-12 | 2017-10-31 | Applied Materials, Inc. | Dual endpoint detection for advanced phase shift and binary photomasks |
US8778574B2 (en) | 2012-11-30 | 2014-07-15 | Applied Materials, Inc. | Method for etching EUV material layers utilized to form a photomask |
US9018108B2 (en) | 2013-01-25 | 2015-04-28 | Applied Materials, Inc. | Low shrinkage dielectric films |
US9087716B2 (en) * | 2013-07-15 | 2015-07-21 | Globalfoundries Inc. | Channel semiconductor alloy layer growth adjusted by impurity ion implantation |
US9058626B1 (en) | 2013-11-13 | 2015-06-16 | Jpmorgan Chase Bank, N.A. | System and method for financial services device usage |
US9607829B2 (en) * | 2014-02-11 | 2017-03-28 | Tokyo Electron Limited | Method of surface functionalization for high-K deposition |
TW201700761A (en) * | 2015-05-13 | 2017-01-01 | 應用材料股份有限公司 | Improved tungsten films by organometallic or silane pre-treatment of substrate |
KR102428659B1 (en) | 2015-08-24 | 2022-08-04 | 삼성전자주식회사 | Method for manufacturing semiconductor device |
US9523148B1 (en) | 2015-08-25 | 2016-12-20 | Asm Ip Holdings B.V. | Process for deposition of titanium oxynitride for use in integrated circuit fabrication |
US9540729B1 (en) | 2015-08-25 | 2017-01-10 | Asm Ip Holding B.V. | Deposition of titanium nanolaminates for use in integrated circuit fabrication |
US10388515B2 (en) | 2015-11-16 | 2019-08-20 | Taiwan Semiconductor Manufacturing Company, Ltd. | Treatment to control deposition rate |
CN106847893B (en) * | 2015-12-07 | 2020-05-08 | 中芯国际集成电路制造(上海)有限公司 | Method for forming fin field effect transistor |
KR102172190B1 (en) * | 2017-12-21 | 2020-10-30 | 인천대학교 산학협력단 | A color electronic textile and preparation method thereof |
US10872763B2 (en) | 2019-05-03 | 2020-12-22 | Applied Materials, Inc. | Treatments to enhance material structures |
US11417517B2 (en) | 2019-05-03 | 2022-08-16 | Applied Materials, Inc. | Treatments to enhance material structures |
JP7397186B2 (en) | 2019-11-01 | 2023-12-12 | アプライド マテリアルズ インコーポレイテッド | Cap oxidation for FinFET formation |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6013553A (en) * | 1997-07-24 | 2000-01-11 | Texas Instruments Incorporated | Zirconium and/or hafnium oxynitride gate dielectric |
US6015739A (en) * | 1997-10-29 | 2000-01-18 | Advanced Micro Devices | Method of making gate dielectric for sub-half micron MOS transistors including a graded dielectric constant |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE393967B (en) | 1974-11-29 | 1977-05-31 | Sateko Oy | PROCEDURE AND PERFORMANCE OF LAYING BETWEEN THE STORAGE IN A LABOR PACKAGE |
KR100269306B1 (en) | 1997-07-31 | 2000-10-16 | 윤종용 | Integrate circuit device having buffer layer containing metal oxide stabilized by low temperature treatment and fabricating method thereof |
US5834353A (en) * | 1997-10-20 | 1998-11-10 | Texas Instruments-Acer Incorporated | Method of making deep sub-micron meter MOSFET with a high permitivity gate dielectric |
US6133106A (en) | 1998-02-23 | 2000-10-17 | Sharp Laboratories Of America, Inc. | Fabrication of a planar MOSFET with raised source/drain by chemical mechanical polishing and nitride replacement |
TW419732B (en) * | 1998-07-15 | 2001-01-21 | Texas Instruments Inc | A method for gate-stack formation including a high-k dielectric |
US6251761B1 (en) * | 1998-11-24 | 2001-06-26 | Texas Instruments Incorporated | Process for polycrystalline silicon gates and high-K dielectric compatibility |
US6200893B1 (en) | 1999-03-11 | 2001-03-13 | Genus, Inc | Radical-assisted sequential CVD |
US6417041B1 (en) * | 1999-03-26 | 2002-07-09 | Advanced Micro Devices, Inc. | Method for fabricating high permitivity dielectric stacks having low buffer oxide |
US6124158A (en) | 1999-06-08 | 2000-09-26 | Lucent Technologies Inc. | Method of reducing carbon contamination of a thin dielectric film by using gaseous organic precursors, inert gas, and ozone to react with carbon contaminants |
US6060755A (en) * | 1999-07-19 | 2000-05-09 | Sharp Laboratories Of America, Inc. | Aluminum-doped zirconium dielectric film transistor structure and deposition method for same |
DE10049257B4 (en) * | 1999-10-06 | 2015-05-13 | Samsung Electronics Co., Ltd. | Process for thin film production by means of atomic layer deposition |
US6780704B1 (en) * | 1999-12-03 | 2004-08-24 | Asm International Nv | Conformal thin films over textured capacitor electrodes |
US6348420B1 (en) | 1999-12-23 | 2002-02-19 | Asm America, Inc. | Situ dielectric stacks |
EP1265279B1 (en) * | 2000-03-13 | 2009-10-14 | OHMI, Tadahiro | Method of fabricating a flash memory device |
KR20020001376A (en) * | 2000-06-28 | 2002-01-09 | 박종섭 | Method of forming a Al2O3 layer in a semiconductor device |
US6380104B1 (en) * | 2000-08-10 | 2002-04-30 | Taiwan Semiconductor Manufacturing Company | Method for forming composite gate dielectric layer equivalent to silicon oxide gate dielectric layer |
US20040053472A1 (en) * | 2000-09-18 | 2004-03-18 | Hideki Kiryu | Method for film formation of gate insulator, apparatus for film formation of gate insulator, and cluster tool |
US6613695B2 (en) | 2000-11-24 | 2003-09-02 | Asm America, Inc. | Surface preparation prior to deposition |
US6448192B1 (en) * | 2001-04-16 | 2002-09-10 | Motorola, Inc. | Method for forming a high dielectric constant material |
JP2002314072A (en) * | 2001-04-19 | 2002-10-25 | Nec Corp | Semiconductor device with high dielectric thin film and manufacturing method therefor, and film-forming method for dielectric film |
JP2002343790A (en) * | 2001-05-21 | 2002-11-29 | Nec Corp | Vapor-phase deposition method of metallic compound thin film and method for manufacturing semiconductor device |
JP2003069011A (en) * | 2001-08-27 | 2003-03-07 | Hitachi Ltd | Semiconductor device and method of manufacturing the same |
-
2002
- 2002-08-22 US US10/227,475 patent/US6806145B2/en not_active Expired - Lifetime
- 2002-08-26 WO PCT/US2002/027230 patent/WO2003041124A2/en active Application Filing
- 2002-08-26 JP JP2003543069A patent/JP4746269B2/en not_active Expired - Lifetime
- 2002-08-26 AU AU2002363358A patent/AU2002363358A1/en not_active Abandoned
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6013553A (en) * | 1997-07-24 | 2000-01-11 | Texas Instruments Incorporated | Zirconium and/or hafnium oxynitride gate dielectric |
US6015739A (en) * | 1997-10-29 | 2000-01-18 | Advanced Micro Devices | Method of making gate dielectric for sub-half micron MOS transistors including a graded dielectric constant |
Non-Patent Citations (4)
Title |
---|
HOUSSA M ET AL: "EFFECT OF O2 POST-DEPOSITION ANNEALS ON THE PROPERTIES OF ULTRA-THIN SIO /ZRO2 GATE DIELECTRIC STACKS" SEMICONDUCTOR SCIENCE AND TECHNOLOGY, INSTITUTE OF PHYSICS, LONDON, GB, vol. 16, no. 1, January 2001 (2001-01), pages 31-38, XP000977045 ISSN: 0268-1242 * |
LUAN H F ET AL: "Ultra thin high quality Ta2O5 gate dielectric prepared by in-situ rapid thermal processing" INTERNATIONAL ELECTRON DEVICES MEETING, 1998, IEDM '98, TECHNICAL DIGEST, SAN FRANCISCO, CA, USA 6-9 DEC. 1998, PISCATAWAY, NJ, USA, IEEE, US, 6 December 1998 (1998-12-06), pages 609-612, XP010321531 ISBN: 0-7803-4774-9 * |
RITALA M ET AL: "Atomic layer deposition of of oxide thin films with metal alkoxides as oxygen sources" SCIENCE, 14 APRIL 2000, AMERICAN ASSOC. ADV. SCI, USA, vol. 288, no. 5464, pages 319-321, XP001147249 ISSN: 0036-8075 cited in the application * |
WILK G D ET AL: "HIGH-KAPPA GATE DIELECTRICS: CURRENT STATUS AND MATERIALS PROPERTIES CONSIDERATIONS" JOURNAL OF APPLIED PHYSICS, AMERICAN INSTITUTE OF PHYSICS, NEW YORK, US, vol. 89, no. 10, 15 May 2001 (2001-05-15), pages 5243-5275, XP001049066 ISSN: 0021-8979 * |
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006005124A (en) * | 2004-06-17 | 2006-01-05 | Rohm Co Ltd | Method for manufacturing semiconductor apparatus |
DE112005001487B4 (en) * | 2004-06-30 | 2014-10-09 | Intel Corporation | A method of forming high K dielectric layers on smooth substrates and a semiconductor structure comprising the same |
WO2006012338A2 (en) * | 2004-06-30 | 2006-02-02 | Intel Corporation | Forming high-k dielectric layers on smooth substrates |
WO2006012338A3 (en) * | 2004-06-30 | 2006-10-19 | Intel Corp | Forming high-k dielectric layers on smooth substrates |
US7323423B2 (en) | 2004-06-30 | 2008-01-29 | Intel Corporation | Forming high-k dielectric layers on smooth substrates |
JP2006108439A (en) * | 2004-10-06 | 2006-04-20 | Samsung Electronics Co Ltd | Semiconductor device |
WO2006090645A1 (en) * | 2005-02-24 | 2006-08-31 | Hitachi Kokusai Electric Inc. | Semiconductor device manufacturing method and substrate processing apparatus |
EP2058844A1 (en) * | 2007-10-30 | 2009-05-13 | Interuniversitair Microelektronica Centrum (IMEC) | Method of forming a semiconductor device |
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US9159582B2 (en) | 2007-10-30 | 2015-10-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Methods of forming a semiconductor device |
US9799523B2 (en) | 2007-10-30 | 2017-10-24 | Taiwan Semiconductor Manufacturing Company, Ltd. | Methods of forming a semiconductor device by thermally treating a cleaned surface of a semiconductor substrate in a non-oxidizing ambient |
WO2009156954A1 (en) * | 2008-06-25 | 2009-12-30 | Nxp B.V. | Interfacial layer regrowth control in high-k gate structure for field effect transistor |
US8716812B2 (en) | 2008-06-25 | 2014-05-06 | Nxp B.V. | Interfacial layer regrowth control in high-K gate structure for field effect transistor |
Also Published As
Publication number | Publication date |
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WO2003041124A3 (en) | 2003-11-20 |
US6806145B2 (en) | 2004-10-19 |
JP4746269B2 (en) | 2011-08-10 |
AU2002363358A1 (en) | 2003-05-19 |
US20030049942A1 (en) | 2003-03-13 |
JP2005509287A (en) | 2005-04-07 |
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