WO2003058770A3 - Vertical cavity surface emitting laser including indium and nitrogen in the active region - Google Patents
Vertical cavity surface emitting laser including indium and nitrogen in the active region Download PDFInfo
- Publication number
- WO2003058770A3 WO2003058770A3 PCT/US2002/039604 US0239604W WO03058770A3 WO 2003058770 A3 WO2003058770 A3 WO 2003058770A3 US 0239604 W US0239604 W US 0239604W WO 03058770 A3 WO03058770 A3 WO 03058770A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- barrier layers
- emitting laser
- surface emitting
- cavity surface
- vertical cavity
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/3211—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/323—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/3235—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength longer than 1000 nm, e.g. InP-based 1300 nm and 1500 nm lasers
- H01S5/32358—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength longer than 1000 nm, e.g. InP-based 1300 nm and 1500 nm lasers containing very small amounts, usually less than 1%, of an additional III or V compound to decrease the bandgap strongly in a non-linear way by the bowing effect
- H01S5/32366—(In)GaAs with small amount of N
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34346—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser characterised by the materials of the barrier layers
Abstract
Quantum wells and associated barrier layers can be grown to include nitrogen (N), aluminum (AI), antimony (Sb), phosphorous (P) and/or indium (In) placed within or about a typical GaAs substrate to achieve long wavelength VCSEL performance, e.g., within the (1260) to (1650) nm range. In accordance with features of the present invention, a vertical cavity surface emitting laser (VCSEL) can include at least one quantum well 11 comprised of InGaAsN; barrier layers (12) sandwiching said at least one quantum well 11; and confinement layers (13) sandwiching said barrier layers (12). Confinement (13) and barrier layers (12) can comprise AIGaAs, GaAsN. Barrier layers (12) can also comprise InGaAsN. Quantum wells 11 can also include Sb. Quantum wells (11) can be developed up to and including 50 Å in thickness. Quantum wells (11) can also be developed with a depth of at least 40 meV.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/026,019 | 2001-12-20 | ||
US10/026,019 US7408964B2 (en) | 2001-12-20 | 2001-12-20 | Vertical cavity surface emitting laser including indium and nitrogen in the active region |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003058770A2 WO2003058770A2 (en) | 2003-07-17 |
WO2003058770A3 true WO2003058770A3 (en) | 2004-02-12 |
Family
ID=21829383
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2002/039604 WO2003058770A2 (en) | 2001-12-20 | 2002-12-11 | Vertical cavity surface emitting laser including indium and nitrogen in the active region |
Country Status (3)
Country | Link |
---|---|
US (1) | US7408964B2 (en) |
TW (1) | TWI246241B (en) |
WO (1) | WO2003058770A2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6822995B2 (en) | 2002-02-21 | 2004-11-23 | Finisar Corporation | GaAs/AI(Ga)As distributed bragg reflector on InP |
US7295586B2 (en) * | 2002-02-21 | 2007-11-13 | Finisar Corporation | Carbon doped GaAsSb suitable for use in tunnel junctions of long-wavelength VCSELs |
CN101432936B (en) | 2004-10-01 | 2011-02-02 | 菲尼萨公司 | Vertical cavity surface emitting laser having multiple top-side contacts |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5719895A (en) * | 1996-09-25 | 1998-02-17 | Picolight Incorporated | Extended wavelength strained layer lasers having short period superlattices |
EP0896406A2 (en) * | 1997-08-08 | 1999-02-10 | Matsushita Electric Industrial Co., Ltd. | Semiconductor laser device, optical communication system using the same, and method for producing compound semiconductor |
WO2001052373A2 (en) * | 2000-01-13 | 2001-07-19 | Infineon Technologies Ag | Semiconductor laser structure |
EP1182756A2 (en) * | 2000-07-31 | 2002-02-27 | The Furukawa Electric Co., Ltd. | Semiconductor laser device having lower threshold current |
Family Cites Families (92)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5726492A (en) | 1980-07-24 | 1982-02-12 | Nec Corp | Semiconductor laser |
US4445218A (en) | 1981-09-28 | 1984-04-24 | Bell Telephone Laboratories, Incorporated | Semiconductor laser with conductive current mask |
US4608697A (en) | 1983-04-11 | 1986-08-26 | At&T Bell Laboratories | Spectral control arrangement for coupled cavity laser |
US4622672A (en) | 1984-01-20 | 1986-11-11 | At&T Bell Laboratories | Self-stabilized semiconductor lasers |
US4829347A (en) | 1987-02-06 | 1989-05-09 | American Telephone And Telegraph Company, At&T Bell Laboratories | Process for making indium gallium arsenide devices |
JPS6461081A (en) | 1987-09-01 | 1989-03-08 | Japan Res Dev Corp | Distributed-feedback type semiconductor laser and manufacture thereof |
US4896325A (en) | 1988-08-23 | 1990-01-23 | The Regents Of The University Of California | Multi-section tunable laser with differing multi-element mirrors |
US4873696A (en) | 1988-10-31 | 1989-10-10 | The Regents Of The University Of California | Surface-emitting lasers with periodic gain and a parallel driven nipi structure |
US5082799A (en) | 1990-09-14 | 1992-01-21 | Gte Laboratories Incorporated | Method for fabricating indium phosphide/indium gallium arsenide phosphide buried heterostructure semiconductor lasers |
US5245622A (en) | 1992-05-07 | 1993-09-14 | Bandgap Technology Corporation | Vertical-cavity surface-emitting lasers with intra-cavity structures |
US5251225A (en) * | 1992-05-08 | 1993-10-05 | Massachusetts Institute Of Technology | Quantum-well diode laser |
US5293392A (en) | 1992-07-31 | 1994-03-08 | Motorola, Inc. | Top emitting VCSEL with etch stop layer |
JP2783086B2 (en) | 1992-09-25 | 1998-08-06 | 日本電気株式会社 | Semiconductor laser device and optical connection device |
US5343487A (en) | 1992-10-01 | 1994-08-30 | Optical Concepts, Inc. | Electrical pumping scheme for vertical-cavity surface-emitting lasers |
US5568504A (en) | 1992-12-03 | 1996-10-22 | Siemens Aktiengesellschaft | Surface-emitting laser diode |
US5416044A (en) | 1993-03-12 | 1995-05-16 | Matsushita Electric Industrial Co., Ltd. | Method for producing a surface-emitting laser |
JP3207590B2 (en) | 1993-03-15 | 2001-09-10 | 富士通株式会社 | Optical semiconductor device |
JP3135185B2 (en) | 1993-03-19 | 2001-02-13 | 三菱電機株式会社 | Semiconductor etching solution, semiconductor etching method, and method for determining GaAs surface |
JP3362356B2 (en) * | 1993-03-23 | 2003-01-07 | 富士通株式会社 | Optical semiconductor device |
US5358880A (en) | 1993-04-12 | 1994-10-25 | Motorola, Inc. | Method of manufacturing closed cavity LED |
US5456205A (en) | 1993-06-01 | 1995-10-10 | Midwest Research Institute | System for monitoring the growth of crystalline films on stationary substrates |
US5383211A (en) * | 1993-11-02 | 1995-01-17 | Xerox Corporation | TM-polarized laser emitter using III-V alloy with nitrogen |
US5422901A (en) | 1993-11-15 | 1995-06-06 | Motorola, Inc. | Semiconductor device with high heat conductivity |
US5491710A (en) | 1994-05-05 | 1996-02-13 | Cornell Research Foundation, Inc. | Strain-compensated multiple quantum well laser structures |
US5480813A (en) | 1994-06-21 | 1996-01-02 | At&T Corp. | Accurate in-situ lattice matching by reflection high energy electron diffraction |
US5513204A (en) | 1995-04-12 | 1996-04-30 | Optical Concepts, Inc. | Long wavelength, vertical cavity surface emitting laser with vertically integrated optical pump |
JPH08293489A (en) | 1995-04-25 | 1996-11-05 | Sharp Corp | Method of dry etching gallium nitride based compound semiconductor |
JP3691544B2 (en) | 1995-04-28 | 2005-09-07 | アジレント・テクノロジーズ・インク | Manufacturing method of surface emitting laser |
FR2739230B1 (en) | 1995-09-22 | 1997-12-19 | Oudar Jean Louis | VERTICAL CAVITY LASER EMISSION COMPONENT WITH SURFACE EMISSION AT A WAVELENGTH BETWEEN 1.3 AND 1.5 MU M AND PROCESS FOR ITS REALIZATION |
EP0852834B1 (en) | 1995-09-29 | 1999-03-31 | BRITISH TELECOMMUNICATIONS public limited company | Optically resonant structure |
US5757833A (en) | 1995-11-06 | 1998-05-26 | The Furukawa Electric Co., Ltd. | Semiconductor laser having a transparent light emitting section, and a process of producing the same |
US5719891A (en) | 1995-12-18 | 1998-02-17 | Picolight Incorporated | Conductive element with lateral oxidation barrier |
DE69610610T2 (en) | 1995-12-26 | 2001-05-03 | Nippon Telegraph & Telephone | Vertical cavity surface emitting laser and method of manufacturing the same |
FR2743196B1 (en) | 1995-12-27 | 1998-02-06 | Alsthom Cge Alcatel | METHOD FOR MANUFACTURING A SURFACE EMITTING SEMICONDUCTOR LASER |
US5912913A (en) | 1995-12-27 | 1999-06-15 | Hitachi, Ltd. | Vertical cavity surface emitting laser, optical transmitter-receiver module using the laser, and parallel processing system using the laser |
FR2743195B1 (en) | 1995-12-27 | 1998-02-06 | Alsthom Cge Alcatel | SURFACE EMITTING SEMICONDUCTOR LASER |
US5754578A (en) | 1996-06-24 | 1998-05-19 | W. L. Gore & Associates, Inc. | 1250-1650 nm vertical cavity surface emitting laser pumped by a 700-1050 nm vertical cavity surface emitting laser |
US5805624A (en) | 1996-07-30 | 1998-09-08 | Hewlett-Packard Company | Long-wavelength infra-red vertical cavity surface-emitting laser on a gallium arsenide substrate |
WO1998007218A1 (en) | 1996-08-09 | 1998-02-19 | W.L. Gore & Associates, Inc. | Vertical cavity surface emitting laser with tunnel junction |
US5724374A (en) | 1996-08-19 | 1998-03-03 | Picolight Incorporated | Aperture comprising an oxidized region and a semiconductor material |
JP3788831B2 (en) | 1996-08-30 | 2006-06-21 | 株式会社リコー | Semiconductor device and manufacturing method thereof |
FR2753577B1 (en) | 1996-09-13 | 1999-01-08 | Alsthom Cge Alcatel | METHOD FOR MANUFACTURING A SEMICONDUCTOR OPTOELECTRONIC COMPONENT AND COMPONENT AND MATRIX OF COMPONENTS MANUFACTURED ACCORDING TO THIS METHOD |
US5825796A (en) * | 1996-09-25 | 1998-10-20 | Picolight Incorporated | Extended wavelength strained layer lasers having strain compensated layers |
US5719894A (en) | 1996-09-25 | 1998-02-17 | Picolight Incorporated | Extended wavelength strained layer lasers having nitrogen disposed therein |
JP3854693B2 (en) * | 1996-09-30 | 2006-12-06 | キヤノン株式会社 | Manufacturing method of semiconductor laser |
JPH10173294A (en) | 1996-10-07 | 1998-06-26 | Canon Inc | Multilayered compound semiconductor film mirror containing nitrogen and surface type light emitting device |
US5877038A (en) | 1996-11-27 | 1999-03-02 | The Regents Of The University Of California | Method of making a vertical cavity laser |
US5732103A (en) | 1996-12-09 | 1998-03-24 | Motorola, Inc. | Long wavelength VCSEL |
US5883912A (en) | 1996-12-09 | 1999-03-16 | Motorola, Inc. | Long wavelength VCSEL |
US5835521A (en) | 1997-02-10 | 1998-11-10 | Motorola, Inc. | Long wavelength light emitting vertical cavity surface emitting laser and method of fabrication |
US5815524A (en) | 1997-02-25 | 1998-09-29 | Motorola, Inc. | VCSEL including GaTlP active region |
US5898722A (en) | 1997-03-10 | 1999-04-27 | Motorola, Inc. | Dual wavelength monolithically integrated vertical cavity surface emitting lasers and method of fabrication |
EP0865124B1 (en) | 1997-03-12 | 2003-01-22 | BRITISH TELECOMMUNICATIONS public limited company | Mirrors for VCSEL |
FR2761822B1 (en) | 1997-04-03 | 1999-05-07 | Alsthom Cge Alcatel | SEMICONDUCTOR LASER WITH SURFACE EMISSION |
US5943359A (en) | 1997-04-23 | 1999-08-24 | Motorola, Inc. | Long wavelength VCSEL |
US5903586A (en) | 1997-07-30 | 1999-05-11 | Motorola, Inc. | Long wavelength vertical cavity surface emitting laser |
US5978398A (en) | 1997-07-31 | 1999-11-02 | Motorola, Inc. | Long wavelength vertical cavity surface emitting laser |
US5956363A (en) | 1997-08-15 | 1999-09-21 | Motorola, Inc. | Long wavelength vertical cavity surface emitting laser with oxidation layers and method of fabrication |
US5943357A (en) | 1997-08-18 | 1999-08-24 | Motorola, Inc. | Long wavelength vertical cavity surface emitting laser with photodetector for automatic power control and method of fabrication |
US6061380A (en) | 1997-09-15 | 2000-05-09 | Motorola, Inc. | Vertical cavity surface emitting laser with doped active region and method of fabrication |
US6021147A (en) | 1997-11-04 | 2000-02-01 | Motorola, Inc. | Vertical cavity surface emitting laser for high power single mode operation and method of fabrication |
US6148016A (en) | 1997-11-06 | 2000-11-14 | The Regents Of The University Of California | Integrated semiconductor lasers and photodetectors |
US6002705A (en) * | 1997-12-03 | 1999-12-14 | Xerox Corporation | Wavelength and polarization multiplexed vertical cavity surface emitting lasers |
US6567448B1 (en) * | 1997-12-12 | 2003-05-20 | Xerox Corporation | Scanning III-V compound light emitters integrated with Si-based actuators |
JPH11251685A (en) * | 1998-03-05 | 1999-09-17 | Toshiba Corp | Semiconductor laser |
US5991326A (en) | 1998-04-14 | 1999-11-23 | Bandwidth9, Inc. | Lattice-relaxed verticle optical cavities |
JP3189791B2 (en) | 1998-06-19 | 2001-07-16 | 日本電気株式会社 | Semiconductor laser |
US6207973B1 (en) | 1998-08-19 | 2001-03-27 | Ricoh Company, Ltd. | Light emitting devices with layered III-V semiconductor structures |
US6195485B1 (en) | 1998-10-26 | 2001-02-27 | The Regents Of The University Of California | Direct-coupled multimode WDM optical data links with monolithically-integrated multiple-channel VCSEL and photodetector |
US6314118B1 (en) | 1998-11-05 | 2001-11-06 | Gore Enterprise Holdings, Inc. | Semiconductor device with aligned oxide apertures and contact to an intervening layer |
KR20010089540A (en) | 1998-12-03 | 2001-10-06 | 추후보정 | Compound semiconductor structures for optoelectronic devices |
US6603784B1 (en) | 1998-12-21 | 2003-08-05 | Honeywell International Inc. | Mechanical stabilization of lattice mismatched quantum wells |
DE60012704T2 (en) | 1999-03-01 | 2005-01-13 | The Regents Of The University Of California, Oakland | TUNABLE LASER WITH AN INTEGRATED WAVELENGTH MONITORING DEVICE AND ASSOCIATED OPERATING METHOD |
US6252896B1 (en) | 1999-03-05 | 2001-06-26 | Agilent Technologies, Inc. | Long-Wavelength VCSEL using buried bragg reflectors |
US6341137B1 (en) | 1999-04-27 | 2002-01-22 | Gore Enterprise Holdings, Inc. | Wavelength division multiplexed array of long-wavelength vertical cavity lasers |
US6621842B1 (en) * | 1999-10-15 | 2003-09-16 | E20 Communications, Inc. | Method and apparatus for long wavelength semiconductor lasers |
US6424669B1 (en) | 1999-10-29 | 2002-07-23 | E20 Communications, Inc. | Integrated optically pumped vertical cavity surface emitting laser |
US6714572B2 (en) | 1999-12-01 | 2004-03-30 | The Regents Of The University Of California | Tapered air apertures for thermally robust vertical cavity laser structures |
WO2002017448A1 (en) | 2000-08-22 | 2002-02-28 | Regents Of The University Of California, The | Distributed bragg reflectors incorporating sb material for long-wavelength vertical cavity surface emitting lasers |
JP4416297B2 (en) * | 2000-09-08 | 2010-02-17 | シャープ株式会社 | Nitride semiconductor light emitting element, and light emitting device and optical pickup device using the same |
AU2001290893A1 (en) | 2000-09-15 | 2002-03-26 | Regents Of The University Of California | Oxide and air apertures and method of manufacture |
US6542530B1 (en) | 2000-10-27 | 2003-04-01 | Chan-Long Shieh | Electrically pumped long-wavelength VCSEL and methods of fabrication |
AU2002231019A1 (en) * | 2000-12-15 | 2002-06-24 | Stanford University | Laser diode with nitrogen incorporating barrier |
US20020075920A1 (en) | 2000-12-15 | 2002-06-20 | Sylvia Spruytte | Laser diode device with nitrogen incorporating barrier |
US6434180B1 (en) | 2000-12-19 | 2002-08-13 | Lucent Technologies Inc. | Vertical cavity surface emitting laser (VCSEL) |
US6362069B1 (en) | 2000-12-28 | 2002-03-26 | The Trustees Of Princeton University | Long-wavelength VCSELs and method of manufacturing same |
US20020131462A1 (en) | 2001-03-15 | 2002-09-19 | Chao-Kun Lin | Intracavity contacted long wavelength VCSELs with buried antimony layers |
US6465961B1 (en) * | 2001-08-24 | 2002-10-15 | Cao Group, Inc. | Semiconductor light source using a heat sink with a plurality of panels |
DE60107679T2 (en) | 2001-09-18 | 2005-12-15 | Avalon Photonics Ag | Indium phosphide-based vertical cavity surface emitting laser |
US6647050B2 (en) | 2001-09-18 | 2003-11-11 | Agilent Technologies, Inc. | Flip-chip assembly for optically-pumped lasers |
US6489175B1 (en) * | 2001-12-18 | 2002-12-03 | Wenbin Jiang | Electrically pumped long-wavelength VCSEL and methods of fabrication |
JP4966982B2 (en) | 2007-02-05 | 2012-07-04 | パナソニック株式会社 | Key sheet, push-type switch, and electronic device equipped with the same |
-
2001
- 2001-12-20 US US10/026,019 patent/US7408964B2/en not_active Expired - Fee Related
-
2002
- 2002-12-11 WO PCT/US2002/039604 patent/WO2003058770A2/en not_active Application Discontinuation
- 2002-12-19 TW TW091136672A patent/TWI246241B/en not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5719895A (en) * | 1996-09-25 | 1998-02-17 | Picolight Incorporated | Extended wavelength strained layer lasers having short period superlattices |
EP0896406A2 (en) * | 1997-08-08 | 1999-02-10 | Matsushita Electric Industrial Co., Ltd. | Semiconductor laser device, optical communication system using the same, and method for producing compound semiconductor |
WO2001052373A2 (en) * | 2000-01-13 | 2001-07-19 | Infineon Technologies Ag | Semiconductor laser structure |
EP1182756A2 (en) * | 2000-07-31 | 2002-02-27 | The Furukawa Electric Co., Ltd. | Semiconductor laser device having lower threshold current |
Non-Patent Citations (2)
Title |
---|
MIYAMOTO T ET AL: "A NOVEL GALNNAS-GAAS QUANTUM-WELL STRUCTURE FOR LONG-WAVELENGTH SEMICONDUCTOR LASERS", IEEE PHOTONICS TECHNOLOGY LETTERS, IEEE INC. NEW YORK, US, vol. 9, no. 11, 1 November 1997 (1997-11-01), pages 1448 - 1450, XP000722969, ISSN: 1041-1135 * |
YANG X ET AL: "HIGH-TEMPERATURE CHARACTERISTICS OF 1.3 MUM INGAASN:SB/GAAS MULTIPLE-QUANTUM-WELL LASERS GROWN BY MOLECULAR-BEAM EPITAXY", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 76, no. 7, 14 February 2000 (2000-02-14), pages 795 - 797, XP000934689, ISSN: 0003-6951 * |
Also Published As
Publication number | Publication date |
---|---|
WO2003058770A2 (en) | 2003-07-17 |
TW200301606A (en) | 2003-07-01 |
US7408964B2 (en) | 2008-08-05 |
TWI246241B (en) | 2005-12-21 |
US20030118068A1 (en) | 2003-06-26 |
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