WO2003092256A3 - Projection method and projection system comprising an optical filtering process - Google Patents
Projection method and projection system comprising an optical filtering process Download PDFInfo
- Publication number
- WO2003092256A3 WO2003092256A3 PCT/EP2003/004012 EP0304012W WO03092256A3 WO 2003092256 A3 WO2003092256 A3 WO 2003092256A3 EP 0304012 W EP0304012 W EP 0304012W WO 03092256 A3 WO03092256 A3 WO 03092256A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- imaging system
- filtering process
- optical
- projection
- pupil
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70308—Optical correction elements, filters or phase plates for manipulating imaging light, e.g. intensity, wavelength, polarisation, phase or image shift
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2003224088A AU2003224088A1 (en) | 2002-04-24 | 2003-04-17 | Projection method and projection system comprising an optical filtering process |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10218989A DE10218989A1 (en) | 2002-04-24 | 2002-04-24 | Projection method and projection system with optical filtering |
DE10218989.7 | 2002-04-24 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003092256A2 WO2003092256A2 (en) | 2003-11-06 |
WO2003092256A3 true WO2003092256A3 (en) | 2004-09-16 |
Family
ID=28798877
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2003/004012 WO2003092256A2 (en) | 2002-04-24 | 2003-04-17 | Projection method and projection system comprising an optical filtering process |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU2003224088A1 (en) |
DE (1) | DE10218989A1 (en) |
WO (1) | WO2003092256A2 (en) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1700168A2 (en) * | 2003-12-22 | 2006-09-13 | Koninklijke Philips Electronics N.V. | Lithographic projection device, method and substrate for manufacturing electronic devices, and obtained electronic device |
WO2005069078A1 (en) | 2004-01-19 | 2005-07-28 | Carl Zeiss Smt Ag | Microlithographic projection exposure apparatus with immersion projection lens |
EP1759248A1 (en) * | 2004-06-04 | 2007-03-07 | Carl Zeiss SMT AG | Projection system with compensation of intensity variatons and compensation element therefor |
JP4599936B2 (en) | 2004-08-17 | 2010-12-15 | 株式会社ニコン | Illumination optical apparatus, adjustment method of illumination optical apparatus, exposure apparatus, and exposure method |
DE102005015627A1 (en) | 2005-04-06 | 2006-10-12 | Carl Zeiss Smt Ag | Optical imaging device |
EP1904894A1 (en) * | 2005-07-18 | 2008-04-02 | Carl Zeiss SMT AG | Pellicle for use in a microlithographic exposure apparatus |
DE102005042496A1 (en) | 2005-09-05 | 2007-03-08 | Carl Zeiss Sms Gmbh | Method of correcting apodization in microscopic imaging systems |
JP5097119B2 (en) | 2005-11-03 | 2012-12-12 | カール・ツァイス・エスエムティー・ゲーエムベーハー | Microlithography projection exposure apparatus |
KR101164460B1 (en) * | 2006-04-07 | 2012-07-18 | 신에쓰 가가꾸 고교 가부시끼가이샤 | Pellicle for lithography |
JP5299937B2 (en) | 2006-05-18 | 2013-09-25 | カール・ツァイス・エスエムティー・ゲーエムベーハー | How to correct the optical proximity effect |
EP1906251A1 (en) | 2006-09-26 | 2008-04-02 | Carl Zeiss SMT AG | Projection exposure method and projection exposure system |
EP2188673A1 (en) | 2007-08-03 | 2010-05-26 | Carl Zeiss SMT AG | Projection objective for microlithography, projection exposure apparatus, projection exposure method and optical correction plate |
WO2012041341A1 (en) | 2010-09-30 | 2012-04-05 | Carl Zeiss Smt Gmbh | Projection exposure system and projection exposure method |
DE102017208340A1 (en) | 2017-05-17 | 2018-11-22 | Carl Zeiss Smt Gmbh | Projection exposure method and projection objective with adjustment of the pupil transmission |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5595857A (en) * | 1990-10-24 | 1997-01-21 | Hitachi, Ltd. | Method of forming a pattern and projection exposure apparatus |
JPH0968790A (en) * | 1995-08-30 | 1997-03-11 | Nec Corp | Photomask |
WO2001002907A1 (en) * | 1999-07-01 | 2001-01-11 | Smith Bruce W | Apparatus and method of image enhancement through spatial filtering |
JP2001085315A (en) * | 1999-09-16 | 2001-03-30 | Nikon Corp | Illumination optical apparatus and aligner having illumination optical apparatus |
US6233041B1 (en) * | 1990-08-21 | 2001-05-15 | Nikon Corporation | Exposure method utilizing diffracted light having different orders of diffraction |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08316124A (en) * | 1995-05-19 | 1996-11-29 | Hitachi Ltd | Method and apparatus for projection exposing |
DE19929403A1 (en) * | 1999-06-26 | 2000-12-28 | Zeiss Carl Fa | Objective, in particular objective for a semiconductor lithography projection exposure system and manufacturing method |
-
2002
- 2002-04-24 DE DE10218989A patent/DE10218989A1/en not_active Withdrawn
-
2003
- 2003-04-17 WO PCT/EP2003/004012 patent/WO2003092256A2/en not_active Application Discontinuation
- 2003-04-17 AU AU2003224088A patent/AU2003224088A1/en not_active Abandoned
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6233041B1 (en) * | 1990-08-21 | 2001-05-15 | Nikon Corporation | Exposure method utilizing diffracted light having different orders of diffraction |
US5595857A (en) * | 1990-10-24 | 1997-01-21 | Hitachi, Ltd. | Method of forming a pattern and projection exposure apparatus |
JPH0968790A (en) * | 1995-08-30 | 1997-03-11 | Nec Corp | Photomask |
WO2001002907A1 (en) * | 1999-07-01 | 2001-01-11 | Smith Bruce W | Apparatus and method of image enhancement through spatial filtering |
JP2001085315A (en) * | 1999-09-16 | 2001-03-30 | Nikon Corp | Illumination optical apparatus and aligner having illumination optical apparatus |
Non-Patent Citations (2)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 1997, no. 07 31 July 1997 (1997-07-31) * |
PATENT ABSTRACTS OF JAPAN vol. 2000, no. 20 10 July 2001 (2001-07-10) * |
Also Published As
Publication number | Publication date |
---|---|
DE10218989A1 (en) | 2003-11-06 |
AU2003224088A8 (en) | 2003-11-10 |
WO2003092256A2 (en) | 2003-11-06 |
AU2003224088A1 (en) | 2003-11-10 |
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