WO2004055493A3 - Icp-oes and icp-ms induction current - Google Patents

Icp-oes and icp-ms induction current Download PDF

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Publication number
WO2004055493A3
WO2004055493A3 PCT/US2003/039440 US0339440W WO2004055493A3 WO 2004055493 A3 WO2004055493 A3 WO 2004055493A3 US 0339440 W US0339440 W US 0339440W WO 2004055493 A3 WO2004055493 A3 WO 2004055493A3
Authority
WO
WIPO (PCT)
Prior art keywords
icp
plasma
sample
atoms
magnetic field
Prior art date
Application number
PCT/US2003/039440
Other languages
French (fr)
Other versions
WO2004055493A2 (en
Inventor
Peter J Morrisroe
Thomas Myles
Original Assignee
Perkinelmer Las Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Perkinelmer Las Inc filed Critical Perkinelmer Las Inc
Priority to CA2509525A priority Critical patent/CA2509525C/en
Priority to JP2005508319A priority patent/JP4290161B2/en
Priority to AU2003293514A priority patent/AU2003293514B2/en
Priority to EP03790465.3A priority patent/EP1570254B1/en
Publication of WO2004055493A2 publication Critical patent/WO2004055493A2/en
Publication of WO2004055493A3 publication Critical patent/WO2004055493A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00—Generating plasma; Handling plasma
    • H05H1/24—Generating plasma
    • H05H1/26—Plasma torches
    • H05H1/30—Plasma torches using applied electromagnetic fields, e.g. high frequency or microwave energy

Abstract

In a method of spectroscopically analyzing a sample (104), a plasma (116) is generated. A magnetic field is generated by a magnetic dipole wherein the plasma is confined within the magnetic field. Sample atoms are introduced into the plasma wherein energized atoms of the sample are confined. The spectral composition or mass-to-charge ratio of the energized sample atoms is analyzed. In a spectroscopic system a magnetic dipole has an associated magnetic field. A plasma is confined within the magnetic field and a sample of energized atoms introduced into the plasma. A spectrometer (120) analyzes the energized atoms for the mass-to-charge ratio or for their spectral composition.
PCT/US2003/039440 2002-12-12 2003-12-11 Icp-oes and icp-ms induction current WO2004055493A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CA2509525A CA2509525C (en) 2002-12-12 2003-12-11 Icp-oes and icp-ms induction current
JP2005508319A JP4290161B2 (en) 2002-12-12 2003-12-11 ICP-OES and ICP-MS induced current
AU2003293514A AU2003293514B2 (en) 2002-12-12 2003-12-11 A spectroscopic system and method of spectroscopically analysing a material sample
EP03790465.3A EP1570254B1 (en) 2002-12-12 2003-12-11 Icp-oes and icp-ms induction current

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US43296302P 2002-12-12 2002-12-12
US60/432,963 2002-12-12
US10/730,779 US7106438B2 (en) 2002-12-12 2003-12-09 ICP-OES and ICP-MS induction current

Publications (2)

Publication Number Publication Date
WO2004055493A2 WO2004055493A2 (en) 2004-07-01
WO2004055493A3 true WO2004055493A3 (en) 2004-12-09

Family

ID=32912132

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/039440 WO2004055493A2 (en) 2002-12-12 2003-12-11 Icp-oes and icp-ms induction current

Country Status (7)

Country Link
US (1) US7106438B2 (en)
EP (1) EP1570254B1 (en)
JP (1) JP4290161B2 (en)
CN (1) CN100529741C (en)
AU (1) AU2003293514B2 (en)
CA (1) CA2509525C (en)
WO (1) WO2004055493A2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8263897B2 (en) 2002-12-12 2012-09-11 Perkinelmer Health Sciences, Inc. Induction device
US8289512B2 (en) 2005-06-17 2012-10-16 Perkinelmer Health Sciences, Inc. Devices and systems including a boost device
US9259798B2 (en) 2012-07-13 2016-02-16 Perkinelmer Health Sciences, Inc. Torches and methods of using them

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004022200B4 (en) * 2004-05-05 2006-07-20 Actinium Pharmaceuticals, Inc. Radium target and process for its preparation
US8633416B2 (en) * 2005-03-11 2014-01-21 Perkinelmer Health Sciences, Inc. Plasmas and methods of using them
US8622735B2 (en) * 2005-06-17 2014-01-07 Perkinelmer Health Sciences, Inc. Boost devices and methods of using them
US20070046934A1 (en) * 2005-08-26 2007-03-01 New Wave Research, Inc. Multi-function laser induced breakdown spectroscopy and laser ablation material analysis system and method
DE102006008023B4 (en) * 2006-02-21 2008-05-29 Actinium Pharmaceuticals, Inc. Method of cleaning 225Ac from irradiated 226Ra targets
ES2784662T3 (en) * 2006-09-08 2020-09-29 Actinium Pharmaceuticals Inc Method for purification of radium from different sources
US20110108058A1 (en) * 2009-11-11 2011-05-12 Axcelis Technologies, Inc. Method and apparatus for cleaning residue from an ion source component
AU2011248185B2 (en) 2010-05-05 2014-10-16 Perkinelmer U.S. Llc Oxidation resistant induction devices
JP5934185B2 (en) * 2010-05-05 2016-06-15 ペルキネルマー ヘルス サイエンシーズ， インコーポレイテッド Plasma torch
US8563924B2 (en) * 2011-06-28 2013-10-22 Agilent Technologies, Inc. Windowless ionization device
EP3099443B1 (en) * 2014-01-28 2022-06-08 PerkinElmer Health Sciences, Inc. System for sustaining an inductively coupled ionization source in a torch
US9165751B1 (en) 2014-06-06 2015-10-20 Agilent Technologies, Inc. Sample atomization with reduced clogging for analytical instruments
US9673032B1 (en) 2016-03-31 2017-06-06 Agilent Technologies Inc. Sample sprayer with adjustable conduit and related methods
US10195683B2 (en) * 2016-11-14 2019-02-05 Matthew Fagan Metal analyzing plasma CNC cutting machine and associated methods
US10300551B2 (en) * 2016-11-14 2019-05-28 Matthew Fagan Metal analyzing plasma CNC cutting machine and associated methods

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5526110A (en) * 1994-07-08 1996-06-11 Iowa State University Research Foundation, Inc. In situ calibration of inductively coupled plasma-atomic emission and mass spectroscopy
US5534998A (en) * 1992-02-19 1996-07-09 Fisons Plc Sample nebulizer and evaporation chamber for ICP and MIP emission or mass spectrometry and spectrometers comprising the same
US5648701A (en) * 1992-09-01 1997-07-15 The University Of North Carolina At Chapel Hill Electrode designs for high pressure magnetically assisted inductively coupled plasmas
US5818581A (en) * 1995-12-27 1998-10-06 Nippon Telegraph And Telephone Corporation Elemental analysis method and apparatus

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4540884A (en) * 1982-12-29 1985-09-10 Finnigan Corporation Method of mass analyzing a sample by use of a quadrupole ion trap
US4629940A (en) * 1984-03-02 1986-12-16 The Perkin-Elmer Corporation Plasma emission source
US4818916A (en) * 1987-03-06 1989-04-04 The Perkin-Elmer Corporation Power system for inductively coupled plasma torch
US4766287A (en) * 1987-03-06 1988-08-23 The Perkin-Elmer Corporation Inductively coupled plasma torch with adjustable sample injector
JP2929275B2 (en) * 1996-10-16 1999-08-03 株式会社アドテック Inductively coupled planar plasma generator with permeable core
US6329757B1 (en) * 1996-12-31 2001-12-11 The Perkin-Elmer Corporation High frequency transistor oscillator system

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5534998A (en) * 1992-02-19 1996-07-09 Fisons Plc Sample nebulizer and evaporation chamber for ICP and MIP emission or mass spectrometry and spectrometers comprising the same
US5648701A (en) * 1992-09-01 1997-07-15 The University Of North Carolina At Chapel Hill Electrode designs for high pressure magnetically assisted inductively coupled plasmas
US5526110A (en) * 1994-07-08 1996-06-11 Iowa State University Research Foundation, Inc. In situ calibration of inductively coupled plasma-atomic emission and mass spectroscopy
US5818581A (en) * 1995-12-27 1998-10-06 Nippon Telegraph And Telephone Corporation Elemental analysis method and apparatus

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8263897B2 (en) 2002-12-12 2012-09-11 Perkinelmer Health Sciences, Inc. Induction device
US8742283B2 (en) 2002-12-12 2014-06-03 Perkinelmer Health Sciences, Inc. Induction device
US9360430B2 (en) 2002-12-12 2016-06-07 Perkinelmer Health Services, Inc. Induction device
US8289512B2 (en) 2005-06-17 2012-10-16 Perkinelmer Health Sciences, Inc. Devices and systems including a boost device
US8896830B2 (en) 2005-06-17 2014-11-25 Perkinelmer Health Sciences, Inc. Devices and systems including a boost device
US9259798B2 (en) 2012-07-13 2016-02-16 Perkinelmer Health Sciences, Inc. Torches and methods of using them

Also Published As

Publication number Publication date
AU2003293514B2 (en) 2007-07-19
CA2509525A1 (en) 2004-07-01
EP1570254A4 (en) 2007-01-03
CN100529741C (en) 2009-08-19
CA2509525C (en) 2011-03-22
AU2003293514B8 (en) 2004-07-09
US7106438B2 (en) 2006-09-12
CN1745295A (en) 2006-03-08
EP1570254A2 (en) 2005-09-07
WO2004055493A2 (en) 2004-07-01
AU2003293514A1 (en) 2004-07-09
JP4290161B2 (en) 2009-07-01
US20040169855A1 (en) 2004-09-02
JP2006516325A (en) 2006-06-29
EP1570254B1 (en) 2020-11-18

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