WO2005101038A3 - Wireless test cassette - Google Patents

Wireless test cassette Download PDF

Info

Publication number
WO2005101038A3
WO2005101038A3 PCT/US2005/011849 US2005011849W WO2005101038A3 WO 2005101038 A3 WO2005101038 A3 WO 2005101038A3 US 2005011849 W US2005011849 W US 2005011849W WO 2005101038 A3 WO2005101038 A3 WO 2005101038A3
Authority
WO
WIPO (PCT)
Prior art keywords
test
wireless test
electronic devices
control chips
wireless
Prior art date
Application number
PCT/US2005/011849
Other languages
French (fr)
Other versions
WO2005101038A2 (en
Inventor
Benjamin N Eldridge
Igor Y Khandros
Charles A Miller
Nicholas A Sporck
Original Assignee
Formfactor Inc
Benjamin N Eldridge
Igor Y Khandros
Charles A Miller
Nicholas A Sporck
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Formfactor Inc, Benjamin N Eldridge, Igor Y Khandros, Charles A Miller, Nicholas A Sporck filed Critical Formfactor Inc
Priority to EP05736081A priority Critical patent/EP1735628A2/en
Priority to JP2007507514A priority patent/JP5112051B2/en
Publication of WO2005101038A2 publication Critical patent/WO2005101038A2/en
Publication of WO2005101038A3 publication Critical patent/WO2005101038A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0491—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets for testing integrated circuits on wafers, e.g. wafer-level test cartridge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/3025—Wireless interface with the DUT
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Abstract

A base controller (210) disposed in a test cassette (110) receives test data for testing a plurality of electronic devices (236a,236b). The base controller wirelessly transmits the test data to a plurality of wireless test control chips (214a,214b,214c,214d,214e,214f,214g), which write the test data to each of the electronic devices. The wireless test control chips (214a,214b,214c,214d,214e,214f,214g), then read response data generated by the electronic devices (236a, 236b), and the wireless test control chips wirelessly transmit the response data to the base controller (210).
PCT/US2005/011849 2004-04-08 2005-04-08 Wireless test cassette WO2005101038A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP05736081A EP1735628A2 (en) 2004-04-08 2005-04-08 Wireless test cassette
JP2007507514A JP5112051B2 (en) 2004-04-08 2005-04-08 Wireless test cassette

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/820,319 2004-04-08
US10/820,319 US7202687B2 (en) 2004-04-08 2004-04-08 Systems and methods for wireless semiconductor device testing

Publications (2)

Publication Number Publication Date
WO2005101038A2 WO2005101038A2 (en) 2005-10-27
WO2005101038A3 true WO2005101038A3 (en) 2005-12-15

Family

ID=35059972

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/011849 WO2005101038A2 (en) 2004-04-08 2005-04-08 Wireless test cassette

Country Status (6)

Country Link
US (3) US7202687B2 (en)
EP (1) EP1735628A2 (en)
JP (1) JP5112051B2 (en)
KR (1) KR20070007175A (en)
CN (1) CN100580466C (en)
WO (1) WO2005101038A2 (en)

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CN101968527B (en) * 2009-07-27 2013-06-19 智邦科技股份有限公司 System-level encapsulation device batch test method and device batch test system thereof
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JP2014515095A (en) 2011-03-16 2014-06-26 フォームファクター， インコーポレイテッド Wireless probe card verification system and method
CN102735953A (en) * 2011-04-15 2012-10-17 纬创资通股份有限公司 Automatic testing device
US9075105B2 (en) * 2011-09-29 2015-07-07 Broadcom Corporation Passive probing of various locations in a wireless enabled integrated circuit (IC)
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CN102854455A (en) * 2012-09-21 2013-01-02 成都市中州半导体科技有限公司 Integrated circuit testing system and control method for same
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US9541472B2 (en) 2013-03-15 2017-01-10 Fluke Corporation Unified data collection and reporting interface for equipment
US9766270B2 (en) * 2013-12-30 2017-09-19 Fluke Corporation Wireless test measurement
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CN102062792B (en) * 2009-11-12 2013-07-17 旺矽科技股份有限公司 Probe card

Also Published As

Publication number Publication date
KR20070007175A (en) 2007-01-12
CN1947021A (en) 2007-04-11
EP1735628A2 (en) 2006-12-27
US20070182438A1 (en) 2007-08-09
JP5112051B2 (en) 2013-01-09
US7202687B2 (en) 2007-04-10
JP2007532884A (en) 2007-11-15
CN100580466C (en) 2010-01-13
US20090251162A1 (en) 2009-10-08
WO2005101038A2 (en) 2005-10-27
US20050225347A1 (en) 2005-10-13
US7548055B2 (en) 2009-06-16
US7821255B2 (en) 2010-10-26

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