WO2005111757A1 - Four phase charge pump operable without phase overlap with improved efficiency - Google Patents

Four phase charge pump operable without phase overlap with improved efficiency Download PDF

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Publication number
WO2005111757A1
WO2005111757A1 PCT/US2005/015762 US2005015762W WO2005111757A1 WO 2005111757 A1 WO2005111757 A1 WO 2005111757A1 US 2005015762 W US2005015762 W US 2005015762W WO 2005111757 A1 WO2005111757 A1 WO 2005111757A1
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Prior art keywords
charge
diode
charge transfer
transfer transistor
node
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PCT/US2005/015762
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French (fr)
Inventor
Feng Pan
Trung Pham
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Sandisk Corporation
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    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00—Conversion of dc power input into dc power output
    • H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
    • H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
    • H02M3/06—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
    • H02M3/07—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
    • H02M3/073—Charge pumps of the Schenkel-type
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00—Conversion of dc power input into dc power output
    • H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
    • H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
    • H02M3/06—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
    • H02M3/07—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
    • H02M3/073—Charge pumps of the Schenkel-type
    • H02M3/075—Charge pumps of the Schenkel-type including a plurality of stages and two sets of clock signals, one set for the odd and one set for the even numbered stages
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00—Conversion of dc power input into dc power output
    • H02M3/02—Conversion of dc power input into dc power output without intermediate conversion into ac
    • H02M3/04—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
    • H02M3/06—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
    • H02M3/07—Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
    • H02M3/073—Charge pumps of the Schenkel-type
    • H02M3/078—Charge pumps of the Schenkel-type with means for reducing the back bias effect, i.e. the effect which causes the threshold voltage of transistors to increase as more stages are added to the converters

Definitions

  • This invention relates generally to electric circuits that generate a voltage larger than a supply voltage from which they operate by the switching of charge along serial capacitive cells, known as charge pumps.
  • a well known charge pump is the Dickson charge pump, which is shown in Fig.l. As described by Louie Pylarinos of the University of Toronto in “Charge Pumps: An Overview", the circuit has two pumping clocks which are anti-phased and have a voltage amplitude of ⁇ or F ⁇ .
  • Serial diodes or diode connected NMOSFETS, Dl - D4 operate as self-timed switches characterized by a forward biased voltage, Vt, which is the threshold voltage of each diode.
  • Vt forward biased voltage of each diode.
  • Each diode has a stray capacitance, Cs, associated therewith.
  • the charge pump operates by pumping charge along the diode chain as capacitors Cl - C4 are successively charged and discharged during each clock cycle.
  • Vou, Vm + N - (V* - Vd) - V ll (1)
  • the stray capacitance, Cs can be taken into account by noticing that it reduces the C transferred clock voltage, Vn, , by a factor .
  • the actual output voltage C + Cs becomes
  • Equation (3) leads to an equivalent circuit of the charge pump as shown in Fig. 2.
  • Limitations of the Dickson charge pump when implemented with NMOS transistors or diode connected transistors lies in the trapped charge associated with each node due to the threshold voltage, V t , of each NMOS diode. While increasing capacitor charge reduces effective series resistance, R s , there is a practical limitation of capacitor size in an integrated circuit. While clock frequency, f osc , reduces series resistance, the charge must be able to be transferred from node to node within a cycle, otherwise increasing frequency will not improve pump performance.
  • a more efficient charge pump is provided by altering the Dickson charge pump in accordance with the present invention.
  • a parallel transistor is provided with each transfer diode whereby residual trapped charge of each node is transferred by the transistor. This requires a transistor clock within each cycle of the diode clock.
  • Clock frequency can be increased by providing with each parallel transistor a pre-charge diode to pre-charge the gate of the parallel transistor after the input node is charge is raised but before the charge transfer. This facilitates the conductance of the transistor with each transistor cycle.
  • the pre-charge diode guarantees pre-charge of gate Tl, the parallel transistor, without the need for clock phase overlap.
  • a recovery transistor couples the gate of the parallel transistor to the input node to return transistor bias voltage to source voltage in the recovery period where the input node again goes low and the output node is high.
  • the charge pump in accordance with the invention can operate with 50/50 clock pulses having no overlap.
  • Fig. 1 illustrates a prior art Dickson charge pump.
  • Fig. 2 illustrates an equivalent circuit of the Dickson charge pump.
  • Fig. 3 is a schematic of a charge pump in accordance with one embodiment of the invention.
  • Fig. 4 illustrates clocks for operating the charge pump of Fig. 3.
  • DETAILED DESCRIPTION OF ILLUSTRATED EMBODIMENT [0009] Fig.
  • FIG. 3 is a schematic of a charge pump in accordance with one embodiment of the invention in which the cells of the conventional Dickson charge pump are modified to facilitate charge transfer and to accommodate a higher clock frequency or fosc- Fig. 3 shows two adjacent cells, such as diodes Dl and D2 of the Dickson charge pump of Fig.1, for transferring charge from node VI to node V2.
  • Each cell is modified by providing a MOS transistor Tl or T2 in parallel with diode Dl or diode D2 which facilitate the transfer of residual trapped charge at each node.
  • a recovery transistor TR is connected between the gate of transistor Tl and node VI with the gate of transistor TR controlled by the voltage on node V2.
  • Fig. 4 illustrates the four phase clock operation of the charge pump of Fig. 3.
  • Charge transfer from node VI to node V2 must occur during clock cycle ⁇ l when charge coupled through capacitor CO raises the charge of node VI and forward biases diode Dl which partially transfers the charge to node V2.
  • Transistor Tl is in parallel with diode Dl and conducts in response to clock ⁇ 3 which is shorter than clock ⁇ l and lies within clock cycle ⁇ l.
  • clock ⁇ 3 When ⁇ l goes high, diode Dl conducts but the current is limited because of the high V t of the diode.
  • clock ⁇ 3 pumps node VC high and transistor Tl conducts fully and transfers the remaining trapped charge at node VI to node V2, with node VI and node V2 equalized. This operation is repeated for diode D2 and transistor T2 when clock ⁇ 2 is high for stage 2.
  • Tl Since the voltages of Tl gate and source are the same, Tl is completely shut off to prevent any backward leakage.
  • a pre- charge diode DPC is connected between node VI and the gate of transistor Tl to apply VI minus V t on the gate of transistor Tl before charge transfer. Then, any rise of clock ⁇ 3 will cause the immediate conduction of transistor Tl and accelerate the transfer of residual charge through transistor Tl.
  • the pre-charge diode guarantees pre-charge of gate Tl, the parallel transistor, without the need for clock phase overlap.
  • gate of Tl is returned to pre-charge level, which could be slightly higher (initial ramp up phase) or lower (after initial ramp up phase) than after VI node fully transfers charge to V2, and Tl could be slightly on or off.
  • V2 is coupled high and VI is coupled low, and if it is 50/50 transition, the gate of Tl is a very low capacitive node compared with that of VI, V2 nodes.
  • the gate of TR is at V2 voltage, which is much higher than gate of Tl, and the charge on gate of Tl can be quickly discharged. Even if Tl could be slightly turned on during the recovery phase, since its gate is discharged to source quickly, it is in weak conduction state, the amount of charge that could potentially leak backward from V2 to VI is a very small percentage of charge transferred. If the recovery phase and clock phases are overlapped, it is more like normal four phase charge pump recovery. By using 50/50 clock phases in recovery, no overlap of clocks is required, the clock can run at faster frequencies and the gain of high frequency is much more significant when compared with any potential loss of charge by leakage during recovery transition.
  • turn on and turn off of transistor Tl is facilitated by the guaranteed pre-charge of the gate of transistor Tl to the voltage on node VI minus V t prior to turn on, and the equalizing of voltage at the gate of transistor Tl and the voltage at VI in recovery.
  • This guaranteed pre-charging and recovery permits maximum charge transfer forward and minimum charge leakage backward.
  • the charge pump can operate with 50% cross over of clocks, or overlap of overlap clocks ⁇ l and ⁇ 2, which is unlike prior art four phase charge pumps which require ⁇ l and ⁇ 2 overlap to do both pre-charge and discharge of gate equivalent Tl transistor.
  • the charge pump in accordance with the invention permits greater efficiency in charge transfer with the same size capacitors as in the prior art Dickson charge pump.

Abstract

In a Dickson type charge pump in which a plurality of serially connected diodes sequentially respond to anti-phase 50/50 clock cross over or overlapped (f1, f2), efficiency of the charge pump is increased by providing with each diode a charge transfer transistor in parallel therewith between two adjacent nodes, and driving the charge transfer transistor to conduction during a time when the parallel diode is conducting thereby transferring any residual trapped charge at one node through the charge transfer transistor to the next node. Operating frequency can be increased by providing a pre-charge diode coupling an input node to the gate of the charge transfer transistor to facilitate conductance of the charge transfer transistor, and by coupling the control terminal of the charge transfer transistor to an input node in response to charge on an output node to thereby equalize charge on the control terminal and on the input node during a recovery period.

Description

FOUR PHASE CHARGE PUMP OPERABLE WITHOUT PHASE OVERLAP WITH IMPROVED EFFICIENCY BACKGROUND OF THE INVENTION
[0001] This invention relates generally to electric circuits that generate a voltage larger than a supply voltage from which they operate by the switching of charge along serial capacitive cells, known as charge pumps.
[0002] A well known charge pump is the Dickson charge pump, which is shown in Fig.l. As described by Louie Pylarinos of the University of Toronto in "Charge Pumps: An Overview", the circuit has two pumping clocks which are anti-phased and have a voltage amplitude of φ or Fφ . Serial diodes or diode connected NMOSFETS, Dl - D4, operate as self-timed switches characterized by a forward biased voltage, Vt, which is the threshold voltage of each diode. Each diode has a stray capacitance, Cs, associated therewith. The charge pump operates by pumping charge along the diode chain as capacitors Cl - C4 are successively charged and discharged during each clock cycle. For example, when φ goes high, diode Dl conducts and the voltage at its anode, VI, is boosted by voltage φ and transferred to node V2 less a voltage drop, Vt, associated with diode Dl. Then when Fφ goes low, and φ goes high, the charge at node V2 is transferred to node V3 less a voltage drop, Vt, associated with diode V2. After N stages, it is seen that the output voltage is
Vou, = Vm + N - (V* - Vd) - Vll (1)
The stray capacitance, Cs, can be taken into account by noticing that it reduces the C transferred clock voltage, Vn, , by a factor . Thus, the actual output voltage C + Cs becomes
Figure imgf000002_0001
[0003] Until now is has been assumed that no load was connected to the output of the charge pump. In the presence of such a load which draws a current, lout, the output
Figure imgf000002_0002
voltage is reduced by an amount ' ^ + ^ ' Josc , where fosc is the operating frequency of the charge pump. The output voltage now becomes
Figure imgf000003_0001
From this equation it becomes apparent that the voltage multiplication will occur only if
Figure imgf000003_0002
Following Dickson, eq (3) can be written as
Figure imgf000003_0003
where
Figure imgf000003_0004
and
Figure imgf000003_0005
Equation (3) leads to an equivalent circuit of the charge pump as shown in Fig. 2. [0004] Limitations of the Dickson charge pump when implemented with NMOS transistors or diode connected transistors lies in the trapped charge associated with each node due to the threshold voltage, Vt, of each NMOS diode. While increasing capacitor charge reduces effective series resistance, Rs, there is a practical limitation of capacitor size in an integrated circuit. While clock frequency, fosc, reduces series resistance, the charge must be able to be transferred from node to node within a cycle, otherwise increasing frequency will not improve pump performance.
SUMMARY OF THE INVENTION
[0005] A more efficient charge pump is provided by altering the Dickson charge pump in accordance with the present invention.
[0006] To facilitate charge transfer from one node to the next node, a parallel transistor is provided with each transfer diode whereby residual trapped charge of each node is transferred by the transistor. This requires a transistor clock within each cycle of the diode clock.
[0007] Clock frequency can be increased by providing with each parallel transistor a pre-charge diode to pre-charge the gate of the parallel transistor after the input node is charge is raised but before the charge transfer. This facilitates the conductance of the transistor with each transistor cycle.
[0008] During pre-charge, the pre-charge diode guarantees pre-charge of gate Tl, the parallel transistor, without the need for clock phase overlap. A recovery transistor couples the gate of the parallel transistor to the input node to return transistor bias voltage to source voltage in the recovery period where the input node again goes low and the output node is high. Unlike known four phase charge pumps which require overlap of the pumping clocks, the charge pump in accordance with the invention can operate with 50/50 clock pulses having no overlap.
[0009] The invention and objects and features thereof will be more readily apparent from the following detailed description and appended claims when taken with the drawings. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 illustrates a prior art Dickson charge pump. Fig. 2 illustrates an equivalent circuit of the Dickson charge pump. Fig. 3 is a schematic of a charge pump in accordance with one embodiment of the invention. Fig. 4 illustrates clocks for operating the charge pump of Fig. 3. DETAILED DESCRIPTION OF ILLUSTRATED EMBODIMENT [0009] Fig. 3 is a schematic of a charge pump in accordance with one embodiment of the invention in which the cells of the conventional Dickson charge pump are modified to facilitate charge transfer and to accommodate a higher clock frequency or fosc- Fig. 3 shows two adjacent cells, such as diodes Dl and D2 of the Dickson charge pump of Fig.1, for transferring charge from node VI to node V2. Each cell is modified by providing a MOS transistor Tl or T2 in parallel with diode Dl or diode D2 which facilitate the transfer of residual trapped charge at each node. A recovery transistor TR is connected between the gate of transistor Tl and node VI with the gate of transistor TR controlled by the voltage on node V2. When charge is transferred from node VI to node V2, the increased voltage at node V2 causes transistor TR to conduct and bring the voltage on the gate of transistor Tl to the voltage level of node VI. After clock φ3 is removed, the conductance of transistor Tl is terminated.
[0010] Fig. 4 illustrates the four phase clock operation of the charge pump of Fig. 3. Charge transfer from node VI to node V2 must occur during clock cycle φl when charge coupled through capacitor CO raises the charge of node VI and forward biases diode Dl which partially transfers the charge to node V2.
[0011] Transistor Tl is in parallel with diode Dl and conducts in response to clock φ3 which is shorter than clock φl and lies within clock cycle φl. Thus, when φl goes high, diode Dl conducts but the current is limited because of the high Vt of the diode. After a short delay, to allow pre-charge from VI to the gate of Tl, clock φ3 pumps node VC high and transistor Tl conducts fully and transfers the remaining trapped charge at node VI to node V2, with node VI and node V2 equalized. This operation is repeated for diode D2 and transistor T2 when clock φ2 is high for stage 2. [0012] After charge is transferred from node VI to node V2 in the first half cycle (Phil=l , Phi2=0, Phi3=l, Phi4=0), Phi3 goes from 1 to 0 bring down the gate of Tl back to the pre-charge level before charge is transferred. Tl is weakly on at this point or Tl could be completely off depending upon pump operations. In the second half cycle (Phil 1=0, Phil2=l), V2 is coupled up by Phi2, VI is coupled down by Phill, transistor TR is turned on (V2-Vl-Vt>0) and brings the voltage on the gate of transistor Tl to the voltage level of node VI . Since the voltages of Tl gate and source are the same, Tl is completely shut off to prevent any backward leakage. [0013] To facilitate the conductance of transistor Tl in response to clock φ3, a pre- charge diode DPC is connected between node VI and the gate of transistor Tl to apply VI minus Vt on the gate of transistor Tl before charge transfer. Then, any rise of clock φ3 will cause the immediate conduction of transistor Tl and accelerate the transfer of residual charge through transistor Tl.
[0014] During pre-charge, the pre-charge diode guarantees pre-charge of gate Tl, the parallel transistor, without the need for clock phase overlap. Before recovery, since Phi3 goes low before Phil/Phi2 clocks switch, gate of Tl is returned to pre-charge level, which could be slightly higher (initial ramp up phase) or lower (after initial ramp up phase) than after VI node fully transfers charge to V2, and Tl could be slightly on or off. In recovery phase, V2 is coupled high and VI is coupled low, and if it is 50/50 transition, the gate of Tl is a very low capacitive node compared with that of VI, V2 nodes. The gate of TR is at V2 voltage, which is much higher than gate of Tl, and the charge on gate of Tl can be quickly discharged. Even if Tl could be slightly turned on during the recovery phase, since its gate is discharged to source quickly, it is in weak conduction state, the amount of charge that could potentially leak backward from V2 to VI is a very small percentage of charge transferred. If the recovery phase and clock phases are overlapped, it is more like normal four phase charge pump recovery. By using 50/50 clock phases in recovery, no overlap of clocks is required, the clock can run at faster frequencies and the gain of high frequency is much more significant when compared with any potential loss of charge by leakage during recovery transition.
[0015] As noted above, turn on and turn off of transistor Tl is facilitated by the guaranteed pre-charge of the gate of transistor Tl to the voltage on node VI minus Vt prior to turn on, and the equalizing of voltage at the gate of transistor Tl and the voltage at VI in recovery. This guaranteed pre-charging and recovery permits maximum charge transfer forward and minimum charge leakage backward. Moreover, the charge pump can operate with 50% cross over of clocks, or overlap of overlap clocks φl and φ2, which is unlike prior art four phase charge pumps which require φl and φ2 overlap to do both pre-charge and discharge of gate equivalent Tl transistor. Because charge can be fully transferred by boosted Tl transistor, without V, drop, capacitance can be reduced per stage to have the same efficiency since no Vt drops. The equivalent resistance of Tl is much smaller due to boosted gate voltage, and the RC delay per stage to fully transfer charge is much smaller compared with the normal Dickson charge pump. Clock frequency can be in creased due to the smaller RC delay, and faster clock frequency can allow even smaller capacitance per stage to be used to meet the same performance. Accordingly, the charge pump in accordance with the invention permits greater efficiency in charge transfer with the same size capacitors as in the prior art Dickson charge pump. [0016] While the invention has been described with reference to a specific embodiment, the description is illustrative of the invention, and is not to be construed limiting the invention. Various modifications and applications may occur to those skilled in the art without departing from the true spirit and scope of the invention as defined by the appended claims.

Claims

CLAIMS What is claimed is:
1. A charge pump comprising a plurality of serially connected cells for pumping and transferring charge along a series of nodes between the cells, each cell including: a) a charge transfer diode connected between adjacent nodes and responsive to an increasing charge at one node in response to a first clock, φl, or a second antiphase second clock, φ2, and b) a charge transfer transistor connected between the adjacent nodes in parallel with the charge transfer diode and responsive to a third clock, φ3, within the period of clock φl or to a fourth clock φ4 within the period of clock φ2, whereby each charge transfer diode transfers charge from one node to a next node in response to a clock (φl or φ2) and each charge transfer transistor transfers residual trapped charge at the one node to the next node while the charge transfer diode is conducting charge.
2. The charge pump as defined by claim 1 wherein each cell further includes a pre charge diode coupling an input node to a control terminal of the charge transfer transistor to facilitate the conductance of the charge transfer transistor in response to the third clock (φ3) or the fourth clock (φ4) .
3. The charge pump as defined by claim 2 wherein each cell further includes a recovery transistor for equalizing charge on the control terminal of the charge transfer transistor to charge on the input node during a recovery period.
4. The charge pump as defined by claim 3 wherein each diode comprises a diode NMOSFET and each charge transfer transistor comprises a NMOSFET.
5. The charge pump as defined by claim 1 wherein each cell further includes a recovery transistor for equalizing charge on the control terminal of the charge transfer transistor to charge on the input node during a recovery period.
6. The charge pump as defined by claim 5 wherein each diode comprises a diode comiected NMOSFET and each charge transfer transistor comprises a NMOSFET.
7. The charge pump as defined by claim 1 wherein each diode comprises a diode connect NMOSFET and each charge transfer transistor comprises a NMOSFET.
8. A method of increasing efficiency in charge transfer in a charge pump having a plurality of serially connected diodes which sequentially respond to anti-phase pumping clocks (φl, φ2) comprising the steps of: a) providing for each diode a charge transfer transistor in parallel therewith between two adjacent nodes, and b) driving the charge transfer transistor to conduction during a time when the parallel diode is conducting, thereby transferring any residual trapped charge at one node through the charge transfer transistor to the next node.
9. The method as defined by claim 8 and further including the step of: c) precharging a control terminal of the charge transfer transistor to facilitate the conductance of the charge transfer transistor.
10. The method as defined by claim 9 and further including the step of: d) coupling the control terminal of the charge transfer transistor to an input node in response to charge on an output node to thereby equalize charge on the control terminal and on the input node during a recovery period.
11. The method as defined by claim 10 wherein each diode comprises a diode connected NMOSFET and each charge transfer transistor comprises a NMOSFET.
12. The method as defined by claim 8 and further including the step of: c) coupling the control terminal of the charge transfer transistor to an input node in response to charge on an output node to thereby equalize charge on the control terminal and on the input node during a recovery period.
13. The method as defined by claim 8 wherein each diode comprises a diode connected NMOSFET and each charge transfer transistor comprises a NMOSFET.
PCT/US2005/015762 2004-05-10 2005-05-05 Four phase charge pump operable without phase overlap with improved efficiency WO2005111757A1 (en)

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US7030683B2 (en) 2006-04-18

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