WO2006096644A3 - Circuit board diagnostic operating center - Google Patents

Circuit board diagnostic operating center Download PDF

Info

Publication number
WO2006096644A3
WO2006096644A3 PCT/US2006/007924 US2006007924W WO2006096644A3 WO 2006096644 A3 WO2006096644 A3 WO 2006096644A3 US 2006007924 W US2006007924 W US 2006007924W WO 2006096644 A3 WO2006096644 A3 WO 2006096644A3
Authority
WO
WIPO (PCT)
Prior art keywords
operating center
instrumentation
diagnostic
diagnostic operating
circuit board
Prior art date
Application number
PCT/US2006/007924
Other languages
French (fr)
Other versions
WO2006096644A2 (en
Inventor
Kraig D Mitzner
Original Assignee
Kelbon Richard G
Kraig D Mitzner
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kelbon Richard G, Kraig D Mitzner filed Critical Kelbon Richard G
Publication of WO2006096644A2 publication Critical patent/WO2006096644A2/en
Publication of WO2006096644A3 publication Critical patent/WO2006096644A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/025—General constructional details concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2516—Modular arrangements for computer based systems; using personal computers (PC's), e.g. "virtual instruments"
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms

Abstract

A circuit board diagnostic operating center (10) including a large flat panel display (18) used for displaying the test system assets (instruments 12) and the circuit card assembly (CCA) schematic diagram, a small flat panel display (20) to display ancillary information, a computer (24) that executes the system application program and provides the means to communicate with automated test equipment. The diagnostic operating center may contain industry standard programmable equipment and instrumentation, or may contain independent instrumentation, or a combination. Physical CCA signal to operating center instrumentation interconnections are accomplished via a cross-point matrix (16). A graphical user interface (GUI) in combination with diagnostic operating center software and hardware provides an interactive means to visually create and store test sequences by capturing the technician's diagnostic methodology.
PCT/US2006/007924 2005-03-07 2006-03-06 Circuit board diagnostic operating center WO2006096644A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/073,771 US7552024B2 (en) 2004-03-08 2005-03-07 Circuit board diagnostic operating center
US11/073,771 2005-03-07

Publications (2)

Publication Number Publication Date
WO2006096644A2 WO2006096644A2 (en) 2006-09-14
WO2006096644A3 true WO2006096644A3 (en) 2007-09-13

Family

ID=36953933

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2006/007924 WO2006096644A2 (en) 2005-03-07 2006-03-06 Circuit board diagnostic operating center

Country Status (2)

Country Link
US (1) US7552024B2 (en)
WO (1) WO2006096644A2 (en)

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US8287368B2 (en) * 2005-03-21 2012-10-16 Wms Gaming Inc. Wagering game with diagnostic graphical user interface
US20070005281A1 (en) * 2005-05-31 2007-01-04 David Haggerty Systems and Methods Providing Reusable Test Logic
US7941237B2 (en) * 2006-04-18 2011-05-10 Multibeam Corporation Flat panel display substrate testing system
WO2007133176A2 (en) * 2006-04-18 2007-11-22 Multibeam Systems, Inc. Flat panel display substrate testing system
US7844412B2 (en) * 2006-07-10 2010-11-30 Blancha Barry E System and method for performing processing in a testing system
US20080147371A1 (en) * 2006-12-13 2008-06-19 Gupton Kyle P User Defined Virtual Instruments in a Simulation Environment
US8370101B2 (en) * 2008-05-27 2013-02-05 The United States Of America As Represented By The Secretary Of The Navy Circuit card assembly testing system for a missile and launcher test set
FR2938069A1 (en) * 2009-05-19 2010-05-07 Continental Automotive France Electronic board controlling method, involves carrying out specific correction of control scenario to incorporate modification in board under development, and controlling test phase comprising automated execution of modified scenario
US20110153039A1 (en) * 2009-12-23 2011-06-23 Viktor Gvelesiani System and method for providing diagnostic information and graphical user interface therefor
US20110246331A1 (en) * 2010-04-06 2011-10-06 Luther Erik B Online Custom Circuit Marketplace
TW201416686A (en) * 2012-10-26 2014-05-01 Hon Hai Prec Ind Co Ltd System and method for searching signals on a hardware circuit diagram
US10629094B1 (en) * 2013-07-01 2020-04-21 Northeast Wisconsin Technical College Modular training system, assembly and method of using same
US9704137B2 (en) * 2013-09-13 2017-07-11 Box, Inc. Simultaneous editing/accessing of content by collaborator invitation through a web-based or mobile application to a cloud-based collaboration platform
GB2518298A (en) 2013-09-13 2015-03-18 Box Inc High-availability architecture for a cloud-based concurrent-access collaboration platform
US8892679B1 (en) 2013-09-13 2014-11-18 Box, Inc. Mobile device, methods and user interfaces thereof in a mobile device platform featuring multifunctional access and engagement in a collaborative environment provided by a cloud-based platform
US10866931B2 (en) 2013-10-22 2020-12-15 Box, Inc. Desktop application for accessing a cloud collaboration platform
US10429437B2 (en) 2015-05-28 2019-10-01 Keysight Technologies, Inc. Automatically generated test diagram
USD795901S1 (en) * 2016-01-22 2017-08-29 Google Inc. Display screen or portion thereof with transitional graphical user interface
CN110826293B (en) * 2019-11-08 2023-06-16 中国电子科技集团公司第四十一研究所 Microwave switch matrix visual modeling method and system
CN111465308B (en) * 2020-04-13 2021-04-06 温州职业技术学院 Prefabricated circuit substrate assembly center
CN112083309B (en) * 2020-07-29 2023-11-17 中广核核电运营有限公司 Intelligent test system and method for memory plate
CN112067970B (en) * 2020-07-29 2023-11-17 中广核核电运营有限公司 Plate intelligent test system with verification function
CN112083310A (en) * 2020-07-29 2020-12-15 中广核核电运营有限公司 Intelligent plate testing system

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Also Published As

Publication number Publication date
WO2006096644A2 (en) 2006-09-14
US7552024B2 (en) 2009-06-23
US20050209808A1 (en) 2005-09-22

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