WO2007106657A3 - Spatial frequency wavefront sensor system and method - Google Patents

Spatial frequency wavefront sensor system and method Download PDF

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Publication number
WO2007106657A3
WO2007106657A3 PCT/US2007/062809 US2007062809W WO2007106657A3 WO 2007106657 A3 WO2007106657 A3 WO 2007106657A3 US 2007062809 W US2007062809 W US 2007062809W WO 2007106657 A3 WO2007106657 A3 WO 2007106657A3
Authority
WO
WIPO (PCT)
Prior art keywords
spatial frequency
detector
signals
space
characteristic
Prior art date
Application number
PCT/US2007/062809
Other languages
French (fr)
Other versions
WO2007106657A2 (en
WO2007106657A9 (en
Inventor
Erik Gross
Charles Campbell
Original Assignee
Amo Mfg Usa Llc
Erik Gross
Charles Campbell
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Amo Mfg Usa Llc, Erik Gross, Charles Campbell filed Critical Amo Mfg Usa Llc
Priority to AU2007226795A priority Critical patent/AU2007226795B2/en
Priority to EP07757485.3A priority patent/EP1999443B1/en
Priority to CA2645670A priority patent/CA2645670C/en
Publication of WO2007106657A2 publication Critical patent/WO2007106657A2/en
Publication of WO2007106657A3 publication Critical patent/WO2007106657A3/en
Publication of WO2007106657A9 publication Critical patent/WO2007106657A9/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/1015—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for wavefront analysis

Abstract

Devices systems, and methods can characterize an optical surface of an object. A wavefront sensor system focuses light energy propagating from the object to form a pattern on a detector. The system maps the pattern to an array with a transform function such as a Fourier transform. The values of array correspond to characteristic locations and signals in a transform space, for example an intensity of spatial frequency signals in frequency space. The characteristic location and intensity of these signals in transform space are used to measure the optical surface. For example, a characteristic frequency of a spatial frequency intensity peak in Fourier transform space can be used to estimate the location of spots on the detector. Alternatively, the characteristics can be used to the measure sphere, cylinder and axis of a wavefront, wavefront elevation maps and point spread functions, often without locating positions of individual spots on the detector.
PCT/US2007/062809 2006-03-14 2007-02-26 Spatial frequency wavefront sensor system and method WO2007106657A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
AU2007226795A AU2007226795B2 (en) 2006-03-14 2007-02-26 Spatial frequency wavefront sensor system and method
EP07757485.3A EP1999443B1 (en) 2006-03-14 2007-02-26 Spatial frequency wavefront sensor system and method
CA2645670A CA2645670C (en) 2006-03-14 2007-02-26 Spatial frequency wavefront sensor system and method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US78267906P 2006-03-14 2006-03-14
US60/782,679 2006-03-14

Publications (3)

Publication Number Publication Date
WO2007106657A2 WO2007106657A2 (en) 2007-09-20
WO2007106657A3 true WO2007106657A3 (en) 2008-10-23
WO2007106657A9 WO2007106657A9 (en) 2009-02-19

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/062809 WO2007106657A2 (en) 2006-03-14 2007-02-26 Spatial frequency wavefront sensor system and method

Country Status (5)

Country Link
US (3) US7652235B2 (en)
EP (1) EP1999443B1 (en)
AU (1) AU2007226795B2 (en)
CA (1) CA2645670C (en)
WO (1) WO2007106657A2 (en)

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Also Published As

Publication number Publication date
US8445825B2 (en) 2013-05-21
US7652235B2 (en) 2010-01-26
CA2645670A1 (en) 2007-09-20
US20120267510A1 (en) 2012-10-25
US20080073525A1 (en) 2008-03-27
CA2645670C (en) 2016-12-06
WO2007106657A2 (en) 2007-09-20
AU2007226795B2 (en) 2012-02-23
EP1999443B1 (en) 2017-12-27
AU2007226795A1 (en) 2007-09-20
US8129666B2 (en) 2012-03-06
US20100090090A1 (en) 2010-04-15
WO2007106657A9 (en) 2009-02-19
EP1999443A2 (en) 2008-12-10

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