WO2008118677A3 - Stiffening connector and probe card assembly incorporating same - Google Patents
Stiffening connector and probe card assembly incorporating same Download PDFInfo
- Publication number
- WO2008118677A3 WO2008118677A3 PCT/US2008/057284 US2008057284W WO2008118677A3 WO 2008118677 A3 WO2008118677 A3 WO 2008118677A3 US 2008057284 W US2008057284 W US 2008057284W WO 2008118677 A3 WO2008118677 A3 WO 2008118677A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- connector
- probe card
- card assembly
- assembly incorporating
- incorporating same
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
Abstract
A stiffening connector assembly and methods of use are provided herein. In some embodiments a stiffening connector assembly includes a connector configured to be coupled to a substrate; and a mechanism coupled to the connector and configured to restrict rotational movement of the connector with respect to the substrate when coupled thereto. The mechanism may further provide a lateral degree of freedom of movement in a direction substantially parallel to the substrate.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/690,139 | 2007-03-23 | ||
US11/690,139 US20080231258A1 (en) | 2007-03-23 | 2007-03-23 | Stiffening connector and probe card assembly incorporating same |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2008118677A2 WO2008118677A2 (en) | 2008-10-02 |
WO2008118677A3 true WO2008118677A3 (en) | 2009-12-30 |
Family
ID=39774032
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2008/057284 WO2008118677A2 (en) | 2007-03-23 | 2008-03-17 | Stiffening connector and probe card assembly incorporating same |
Country Status (3)
Country | Link |
---|---|
US (1) | US20080231258A1 (en) |
TW (1) | TW200846672A (en) |
WO (1) | WO2008118677A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8760187B2 (en) * | 2008-12-03 | 2014-06-24 | L-3 Communications Corp. | Thermocentric alignment of elements on parts of an apparatus |
US7772863B2 (en) * | 2008-12-03 | 2010-08-10 | Formfactor, Inc. | Mechanical decoupling of a probe card assembly to improve thermal response |
US7960989B2 (en) * | 2008-12-03 | 2011-06-14 | Formfactor, Inc. | Mechanical decoupling of a probe card assembly to improve thermal response |
US8736294B2 (en) | 2010-12-14 | 2014-05-27 | Formfactor, Inc. | Probe card stiffener with decoupling |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6535606B2 (en) * | 2000-03-21 | 2003-03-18 | James Cox | Mobile telephone shoulder rest |
US6722905B2 (en) * | 2002-02-04 | 2004-04-20 | Yazaki Corporation | Board connector |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3691506A (en) * | 1971-04-05 | 1972-09-12 | Cts Corp | Resistors and stacked plurality thereof |
US4330163A (en) * | 1979-12-05 | 1982-05-18 | E. I. Du Pont De Nemours And Company | Zero insertion force connector for LSI circuit package |
US4715682A (en) * | 1986-07-11 | 1987-12-29 | Eastman Kodak Company | Mount for imaging lens array on optical print head |
US4779463A (en) * | 1987-01-13 | 1988-10-25 | Systron Donner Corporation | Servo accelerometer |
US5422574A (en) * | 1993-01-14 | 1995-06-06 | Probe Technology Corporation | Large scale protrusion membrane for semiconductor devices under test with very high pin counts |
US5806181A (en) * | 1993-11-16 | 1998-09-15 | Formfactor, Inc. | Contact carriers (tiles) for populating larger substrates with spring contacts |
US5772451A (en) * | 1993-11-16 | 1998-06-30 | Form Factor, Inc. | Sockets for electronic components and methods of connecting to electronic components |
US7064566B2 (en) * | 1993-11-16 | 2006-06-20 | Formfactor, Inc. | Probe card assembly and kit |
US6429029B1 (en) * | 1997-01-15 | 2002-08-06 | Formfactor, Inc. | Concurrent design and subsequent partitioning of product and test die |
US6690185B1 (en) * | 1997-01-15 | 2004-02-10 | Formfactor, Inc. | Large contactor with multiple, aligned contactor units |
US6201629B1 (en) * | 1997-08-27 | 2001-03-13 | Microoptical Corporation | Torsional micro-mechanical mirror system |
US6644982B1 (en) * | 1998-12-04 | 2003-11-11 | Formfactor, Inc. | Method and apparatus for the transport and tracking of an electronic component |
US7215131B1 (en) * | 1999-06-07 | 2007-05-08 | Formfactor, Inc. | Segmented contactor |
JP4152083B2 (en) * | 2001-02-22 | 2008-09-17 | 日本圧着端子製造株式会社 | Electrical connector |
US7071714B2 (en) * | 2001-11-02 | 2006-07-04 | Formfactor, Inc. | Method and system for compensating for thermally induced motion of probe cards |
US6972578B2 (en) * | 2001-11-02 | 2005-12-06 | Formfactor, Inc. | Method and system for compensating thermally induced motion of probe cards |
US7188391B2 (en) * | 2001-12-24 | 2007-03-13 | Lg Electronics, Inc. | Hinge assembly for flat panel display appliance |
US6683787B1 (en) * | 2002-02-14 | 2004-01-27 | Mercury Computer Systems, Inc. | Circuit board assembly with integrated air plenum chamber using self-aligning heat sinks |
US6999317B2 (en) * | 2003-08-12 | 2006-02-14 | Delphi Technologies, Inc. | Thermally enhanced electronic module with self-aligning heat sink |
JP4425005B2 (en) * | 2004-01-19 | 2010-03-03 | 帝国通信工業株式会社 | Electronic component mounting structure on board |
US7230437B2 (en) * | 2004-06-15 | 2007-06-12 | Formfactor, Inc. | Mechanically reconfigurable vertical tester interface for IC probing |
US7285968B2 (en) * | 2005-04-19 | 2007-10-23 | Formfactor, Inc. | Apparatus and method for managing thermally induced motion of a probe card assembly |
US7471094B2 (en) * | 2005-06-24 | 2008-12-30 | Formfactor, Inc. | Method and apparatus for adjusting a multi-substrate probe structure |
US7419313B2 (en) * | 2007-01-16 | 2008-09-02 | Stratos International, Inc. | Optoelectronic device in combination with a push-in cage |
-
2007
- 2007-03-23 US US11/690,139 patent/US20080231258A1/en not_active Abandoned
-
2008
- 2008-03-12 TW TW097108653A patent/TW200846672A/en unknown
- 2008-03-17 WO PCT/US2008/057284 patent/WO2008118677A2/en active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6535606B2 (en) * | 2000-03-21 | 2003-03-18 | James Cox | Mobile telephone shoulder rest |
US6722905B2 (en) * | 2002-02-04 | 2004-04-20 | Yazaki Corporation | Board connector |
Also Published As
Publication number | Publication date |
---|---|
US20080231258A1 (en) | 2008-09-25 |
TW200846672A (en) | 2008-12-01 |
WO2008118677A2 (en) | 2008-10-02 |
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