WO2008129424A2 - Ultra-thin stacked chios packaging - Google Patents
Ultra-thin stacked chios packaging Download PDFInfo
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- WO2008129424A2 WO2008129424A2 PCT/IB2008/001626 IB2008001626W WO2008129424A2 WO 2008129424 A2 WO2008129424 A2 WO 2008129424A2 IB 2008001626 W IB2008001626 W IB 2008001626W WO 2008129424 A2 WO2008129424 A2 WO 2008129424A2
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Definitions
- the present invention relates to electronic packaging and, more particularly, to chip packaging.
- FIG. 1 One such integration method, shown in FIG. 1, involves directly attaching one die 102 onto a second die 104. This allows the top die 102 and bottom die 104 to communicate directly with each other. In addition, the two chips 102, 104 are externally connected using wirebonds 106 connected to the chip(s) via a routing trace 108. While this approach results in a smaller package, it also results in a problem if the two chips are the same size or of nearly the same size, because, in some cases, there might not be enough room for wirebond pads 1 10 to exist on one of the dies.
- FIG. 2 Another integration option, shown in FIG. 2, is to use solder ball 202, flip-chip attachment methods to allow the two die stack to be externally connected. This approach is cheaper than the wirebond approach and, thus, can allow some of the multi-chip on multi- chip arrangements (FIG. 3) to be more easily or cheaply achieved.
- this integration option suffers from the same problem as noted above if the two chips are the same or nearly the same size, because there might not be enough room for solder ball pads to exist on one of the dies.
- interposer 402 that can act as a routing element to connect the two dies together and externally.
- This approach has the advantage that it eliminates the issue of whether the two dies 404, 406 are identical or close in size because it can always be made big enough to accommodate a wirebond or solder bump connection.
- interposers typically also have has significant drawbacks. For example, they usually require fabrication of an entirely new part (the interposer with its attendant routing 408) which could be complicated and expensive.
- the typical interposer option does not eliminate the issue of handling very thin wafers or doing dual-side processing of those very thin wafers, so the above- mentioned decreased yield and increased damage risks remain.
- interposers are typically very thick, so, even if the interposer has through-connections 408, the length of the connections between the two dies are now larger, so the electrical performance of the chip to chip connection can be degraded. [0007]
- the interposer option also does not dispense with the problems noted above with creating a multi-chip to multi-chip stack (FIG. 5).
- the die contains devices
- One example variant involves a packaging method.
- the method involves attaching a first chip to a stable base, forming contact pads at locations on the stable base, applying a medium onto the stable base such that it electrically insulates sides of the first chip, forming electrical paths on the medium, attaching a second chip to the first chip to form an assembly, and removing the stable base.
- Another example variant involves a package having at least two chips electrically connected to each other, at least one contact pad, an electrically conductive path extending from the contact pad to a contact point on at least one of the chips, a planarizing medium, and a coating material on top of the planarizing medium.
- FIG. 1 illustrates, in overly simplified form, a chip stack having a wirebond external connection
- FIG. 2 illustrates, in overly simplified form, a chip stack having a solder ball external connection
- FIG. 3 illustrates, in overly simplified form a chip on chip stack
- FIG. 4 illustrates, in overly simplified form an interposer-based approach to chip stacking
- FIG. 5 illustrates, in overly simplified form an interposer-based multi-chip to multi-chip stack
- FIG. 6 illustrates, in overly simplified form, an example stable base suitable for use as the starting point
- FIG. 7 illustrates, in overly simplified form, the example stable base after the support coating has been applied
- FIG. 8 illustrates, in overly simplified form, an enlarged portion of the example stable base after the openings have been formed in the support coating
- FIG. 9 illustrates, in overly simplified form, an enlarged portion of the example stable base after pads have been formed within what was the openings in the support coating;
- FIG. 10 illustrates, in overly simplified form, the enlarged portion of the example stable base after all of the first chips for the enlarged portion have been attached to the stable base;
- FIG. 1 1 illustrates, in overly simplified form, the enlarged portion of the example stable base after planarization down to the surface of the first chip
- FIG. 12 illustrates, in overly simplified form, the enlarged portion of the example stable base after removal of the planarizing medium in some areas to expose at least the pad body;
- FIG. 13 illustrates, in overly simplified form, the enlarged portion of the example stable base after formation of the contacts;
- FIG. 14 illustrates, in overly simplified form, the enlarged portion of the assembly after the second chips have been attached to it;
- FIG. 15 illustrates, in overly simplified form, the complex assembly of FIG. 14 after addition of the coating material
- FIG. 16 illustrates, in overly simplified form, the complex assembly of FIG. 15 after removal of the stable base
- FIG. 17 illustrates, in overly simplified form, the complex assembly of FIG. 16 after addition of the conductive bonding material
- FIG. 18 illustrates, in overly simplified form, two individual packaged units following dicing from the complex assembly of FIG. 15;
- FIG. 19 illustrates, in overly simplified form, an enlarged portion of the example stable base after formation of the contacts;
- FIG. 20 illustrates, in overly simplified form, the enlarged portion of the assembly after the second chips have been attached to it to form a more complex assembly
- FIG. 21 illustrates, in overly simplified form, the complex assembly of FIG. 20 after addition of the coating material as described above;
- FIG. 22 illustrates, in overly simplified form, the complex assembly of FIG. 21 after removal of the stable base as described above;
- FIG. 23 illustrates, in overly simplified form, the complex assembly of FIG. 22 after addition of the conductive bonding material as described above;
- FIG. 24 illustrates, in overly simplified form, two individual packaged units following dicing from the complex assembly of FIG. 22 as described above;
- FIG. 25 illustrates, in overly simplified form, a variant in which an individual packaged unit from the first family approach is externally connected to a pad of an interposer via a solder ball bump;
- FIG. 26 illustrates, in overly simplified form, a variant in which an individual packaged unit from the first family approach is externally connected to some other element by wirebond connections;
- FIG. 27 illustrates, in overly simplified form, a variant in which an individual packaged unit from the second family approach is externally connected to a pad of an interposer via a solder ball bump; and
- FIG. 28 illustrates, in overly simplified form, a variant in which an individual packaged unit from the second family approach is externally connected to some other element by wirebond connections.
- the approach will now be described with reference to two simplified example major implementation variants.
- the first simplified example implementation family shown in FIGS. 6 through 18, involves creation of a chip package that contains a stack of two chips of differing size in which the initial chip in the stack is smaller in extent than the chip that will be stacked on top of it.
- the second simplified example implementation family involves creation of a chip package that contains a stack of two chips of differing size in which the initial chip in the stack is larger in extent than the chip that will be stacked on top of it.
- a step may involve depositing a metal in a particular area.
- any suitable known intermediate process can be used.
- one variant may involve, applying a photoresist, patterning, metal deposition, stripping of the photoresist and, if appropriate, removal of overburden.
- Another variant might involve electroless or electroplating and thus patterning, seed deposition, etc.
- the process begins with a piece of material that will act as a stable base for most of the process, but will later be removed.
- this base can be any of a number of different things, for example, a silicon wafer that can later be removed through an etching process, or a material such as glass, sapphire, quartz, a polymer, etc.
- the relevant aspects being i) that the material that will be used as the base has sufficient rigidity and stability to withstand the processing steps described below, and ii) that the material can be removed when necessary in the process using a technique that will not damage the package created up to that point, irrespective of whether the process involves removal by chemical, physical or heat action (or some combination thereof) or some other process.
- the purpose of the material is to primarily provide mechanical support during the processing steps and thereby avoids the thin wafer handling problems noted above because, to the extent "thin" components are involved, they are handled at the chip level, while still allowing the major steps to be performed at the wafer level.
- the contact formation and use techniques as described in U.S. Patent Applications, Serial Nos.
- FIG. 6 illustrates, in overly simplified form, an example stable base 600 suitable for use as the starting point.
- the stable base 600 of this example is a wafer of silicon that is about 300mm in diameter and 800 ⁇ m thick.
- a thin layer of support coating 702 is applied to a surface 704 of the stable base 600.
- the support coating 702 can be selected to be a material that can act as an etch stop for later processing, a release layer to ultimately allow the clean removal of the stable base 600 material without damaging the chips and connections that will be added in later steps, or both.
- the support coating 702 can be an oxide or other dielectric, a polymer, a metal, a deposited semiconductor material, or some combination thereof.
- the support coating 702 is simply used as an etch stop that will be left in place when processing is finished. [0054] In another example variant, the support coating 702 is used as an etch stop that will be removed in a later processing step.
- the support coating 702 is used as a release layer that, by etching, causes separation of the stable base 600 from the subsequently deposited parts (which will be discussed in greater detail below).
- the support coating 702 is a combination.
- a metal could be added as an etch stop and then, subsequently, a dielectric could be deposited to prevent the connection pads that, will be created in a later step described below, from being shorted after the final work was done. In this specific example case, the dielectric would therefore remain while the metal that would be used as an etch stop will ultimately be removed.
- FIG. 7 illustrates, in overly simplified form, the example stable base 600 after the support coating 702 has been applied.
- the support coating 702 is a dielectric.
- openings 802 are formed in the support coating 702 in the areas where the ultimate connection pads will be.
- the openings 802 extend down to the support material so that the final contacts that will be created in those openings 802 will be accessible after the stable base 600 is removed.
- FIG. 8 illustrates, in overly simplified form, an enlarged portion 800 of the example stable base 600 after the openings 802 have been formed in the support coating
- the openings have been formed by patterning and etching.
- the pads 902 for the ultimate contacts are formed.
- the pads 902 can be sized and of materials that are suitable for conventional solder connections or wirebond connection pad or can be made up of materials suitable for other types of connection contacts, for example, those suitable for use with a post and penetration connection or the other types of connections described in the above-incorporated applications, as well as gold stud bumps, copper pillars, or combinations of suitable metals like solder tipped copper pillars, gold covered copper, etc. or alloys.
- the layers could incorporate, as described below in connection with
- FIG. 17 conductive bonding material so that they do not have to be separately placed later in the process.
- FIG. 9 illustrates, in overly simplified form, the enlarged portion of the example stable base 600 after pads 902 have been formed within what had been the openings 802 in the support coating 702.
- the pad 902 is made up of a layer 904 of deposited gold underlying a pad body 906 of copper.
- the pad 902 could be or contain a conventional under-bump-metal (UBM) set of materials, for example, nickel/gold.
- UBM under-bump-metal
- it could be a conventional aluminum or coper pad with nickel or gold as a barrier or oxidation barrier.
- the layer 904 could additionally have something underneath it, for example, a solid material, or one of a "malleable” or “rigid” material as described in the above-incorporated applications, to allow for different types of stacking options. In some variants, these materials could be attached to or partially embedded in the stable base 600 at appropriate locations prior to starting the process. Finally, although the specific materials described are all electrically conducting, in some variants, some of the locations for the pad 902 can be filled by materials that are nonconducting (for example, if they are to be used for alignment or spacing purposes).
- the first chip 1002 is placed and attached to the stable base 600, in this case so that it is "face-up" (i.e. the circuitry on the chip faces away from the stable base 600).
- the chip is attached in any way suitable for forming a physical connection between the first chip 1002 and the stable base 600.
- the attachment can involve using, for example, epoxy, solder, covalent bonding, a tack and/or fuse connection, thermo compression, wafer fusion, copper fusion, adhesive or thermal release bonding tapes or films, etc.
- the pad 902 can even be configured to later serve as a wirebond or flip chip pad, as the flip chip bump itself or as a combination of a pad and bump.
- the first chip 1002 has conventional through-chip vias, or through- chip connections or vias such as described in the above-incorporated applications, the first chip 1002 can be attached "face-down" so it makes contact from the bottom.
- the first chip 1002 may have undergone additional processing pre- or post-dicing from its original wafer.
- FIG. 10 illustrates, in overly simplified form, the enlarged portion 800 of the example stable base 600 after all of the first chips 1002 for the enlarged portion have been attached to the stable base 600.
- the surface of the stable base 600 is planarized using a planarizing medium 1 102.
- the planarizing medium 1 102 can be a spin-on glass, polymer, epoxy, dielectric, oxide, nitride or other appropriate material, the important aspects being that the planarizing medium 1 102 be non-electrically conducting and will form or can be treated to form a substantially planar surface.
- the planarizing medium 1 102 is applied so that it is coincident or nearly coincident with the top of the first chip 1002.
- the planarizing medium 1 102 is applied so that it covers the first chip 1002 and mayor may not naturally form a flat surface.
- the planarizing medium 1102 can be planarized by further processing, for example, polishing, lapping, etching, liftoff, developing out material, etc.
- only the surface 1004 of the first chip 1002 (or some portion thereof) can be re-exposed by, for example, one or more of the foregoing processes.
- FIG. 1 1 illustrates, in overly simplified form, the enlarged portion 800 of the example stable base 600 after planarization down to the surface 1004 of the first chip 1002.
- the planarizing medium 1102 is removed in specific areas 1202 to expose the pad body 906 and any other areas which may need to be exposed for purposes of forming connections.
- planarizing medium 1 102 is a photo-sensitive material, such as a photo-sensitive polyimide
- a simple pattern and expose can be used to make the planarizing medium 1 102 ready for this step.
- etching can be performed wherever it is needed or desired, for example, on top of the first chip 1002, on top of the pad body 906 (such as shown in FIG. 12), on top of some other area, etc., as long as the sides of the first chip 1002 are protected so that undesirable shorting cannot occur to those areas in subsequent steps.
- FIG. 12 illustrates, in overly simplified form, the enlarged portion 800 of the example stable base 600 after removal of the planarizing medium 1 102 in some areas to expose at least the pad bodies 902.
- additional etching has been performed on the first chip 1002 to allow for creation of contact posts.
- metal connections 1302, 1304 are formed so that, for example, the pad bodies 902 are connected to the first chip 1002, the pad bodies 902, other connection points are rerouted to positions which can ultimately align with corresponding connections of another chip or some other element, or (optionally, if needed) elevated contacts 1306 are formed.
- some combination of both of these will occur and, in some cases, a pad body 902, can be intentionally connected to another pad body (not shown).
- FIG. 13 illustrates, in overly simplified form, the enlarged portion 800 of the example stable base 600 after formation of the contacts 1302, 1304, 1306.
- a package assembly 1308 has been created that is suitable for addition of a second chip 1402 onto the first chip 1002.
- the second chip 1402 is attached to the assembly 1308.
- this process is more robust than with processes where two chips are joined by hybridizing to a very thin substrate.
- the second chip 1402 can be thin at this point, all the contacts 1404 of the second chip 1402 will ideally have been put on the second chip 1402 while it is still in wafer form and thick; then the wafer containing the second chip 1402 can be thinned, diced and the second chip 1402 chip can be attached to the assembly 1308.
- FIG. 14 illustrates, in overly simplified form, the enlarged portion of the assembly 1308 after the second chips 1402 have been attached to it to form a more complex assembly 1406.
- the process can be continued, for example, by adding an additional coating material 1502 to, for example, protect the chips, act as a thermal conductor, or allow the complex assembly 1406 to be planar, etc.
- the coating material 1502 can optionally be a material that is resistant to the etchants that might be used in some cases in the next step.
- the coating material 1502 will be a non-electrically-conductive type of material and, more particularly, one of the materials that were suitable for use as the planarizing medium 1 102.
- the coating material 1502 can also, or alternatively, provide structural support so that the wafer-like assembly created by the process described herein, can be handled in a wafer-like way after the stable base 600 has been removed.
- FIG. 15 illustrates, in overly simplified form, the complex assembly of FIG. 14 after addition of the coating material 1502.
- the stable base 600 IS removed from the complex assembly 1406.
- removal can occur through any of a number of processes, the only constraint being that the process be suitable to achieve the desired removal and expose the stable base 600 side of the pads 902.
- the removal can be effected by grinding, lapping and/or etching down to the coating 702 if it is an etch stop layer. If the coating 702 is a sacrificial layer, that layer can be sacrificed by the appropriate process (e.g.
- the stable base 600 can become reusable, further reducing costs.
- FIG. 16 illustrates, in overly simplified form, the complex assembly 1406 of FIG. 15 after removal of the stable base 600.
- the pad 902 for the contact was formed such that the bonding material, for example, gold or a solder, was added at the time of pad 902 formation, the complex assembly 1406 will be fully formed and the only thing that need be done after this point to complete the package formation process is to dice the entire wafer into individual packaged units.
- the bonding material for example, gold or a solder
- the conductive bonding material 1702 can be added at this point.
- the conductive bonding material 1702 is not attached to one of the fragile pieces of silicon there is no stress created on the chips or as would be on an interposer if one were used.
- FIG. 17 illustrates, in overly simplified form, the complex assembly 1406 of FIG. 15 after addition of the conductive bonding material 1702. [0094] Finally, the complex assembly 1406 is diced into individual packaged units 1802. Here too, it should be noted that, even if the individual chips within the complex assembly 1406 were very thin, the risk of damaging them is minimal.
- FIG. 18 illustrates, in overly simplified form, two individual packaged units 1802 following dicing from the complex assembly 1406 of FIG. 15.
- the second simplified example implementation family will now be described. Due to the fact that the initial steps are the same as described in connection with FIG. 6 through FIG. 12, those steps will not be reiterated here. Moreover, since this example varies from the first simplified example implementation family only with respect to the relative sizes of the chips in the stack, only those aspects particularly different for such a difference will be discussed. [0097] Picking up following completion of the steps resulting in FIG.
- metal connections 1902, 1904 are formed so that, for example, the pad bodies 902 are connected to the first chip 1002, the pad bodies 902, other connection points are rerouted to positions which can ultimately align with corresponding connections of another chip or some other element, or (optionally, if needed) elevated contacts 1906 are formed.
- the pad bodies 902 can be intentionally connected to another pad body (not shown).
- FIG. 19 illustrates, in overly simplified form, an enlarged portion 1900 of the example stable base 600 after formation of the contacts 1902, 1904, 1906.
- a package assembly 1908 has been created that is suitable for addition of a second chip 2002 onto the first chip 1002.
- the second chip 2002 is attached to the assembly 1908.
- the second chip 2002 can be thin at this point, all the contacts 2004 of the second chip 2002 will ideally have been put on the second chip 2002 while it is still in wafer form and thick; then the wafer containing the second chip 2002 can be thinned, diced and the second chip 2002 chip can be attached to the assembly 1908.
- FIG. 20 illustrates, in overly simplified form, the enlarged portion of the assembly 1908 after the second chips 2002 have been attached to it to form a more complex assembly 2006.
- FIG. 21 illustrates, in overly simplified form, the complex assembly
- FIG. 22 illustrates, in overly simplified form, the complex assembly 2006 of FIG.
- FIG. 23 illustrates, in overly simplified form, the complex assembly 2006 of FIG.
- FIG. 24 illustrates, in overly simplified form, two individual packaged units 2402 following dicing from the complex assembly 2006 of FIG. 22 as described above. [0107] From the above it should now be apparent that some of the above steps can be iteratively employed in the same approach to add a third or additional chips.
- FIG. 25 illustrates, in overly simplified form, a variant in which an individual packaged unit 1802 from the first family approach is externally connected to a pad 2502 of an interposer 2504 via a solder ball bump 1702.
- FIG. 26 illustrates, in overly simplified form, a variant in which an individual packaged unit 1802 from the first family approach is externally connected to some other element (not shown) by wirebond connections 2602.
- FIG. 27 illustrates, in overly simplified form, a variant in which an individual packaged unit 2402 from the second family approach is externally connected to a pad 2502 of an interposer 2504 via a solder ball bump 1702.
- FIG. 28 illustrates, in overly simplified form, a variant in which an individual packaged unit 2402 from the second family approach is externally connected to some other element (not shown) by wirebond connections 2602.
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
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CN2008800129833A CN101663747B (en) | 2007-04-23 | 2008-06-20 | Ultra-thin chip packaging |
KR1020127002724A KR101245928B1 (en) | 2007-04-23 | 2008-06-20 | Ultra-thin stacked chips packaging |
JP2010504906A JP4970593B2 (en) | 2007-04-23 | 2008-06-20 | Ultra-thin chip packaging |
EP08762937A EP2361439A2 (en) | 2007-04-23 | 2008-06-20 | Ultra-thin chip packaging |
KR1020097023473A KR101157726B1 (en) | 2007-04-23 | 2008-06-20 | Ultra-thin stacked chips packaging |
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US11/738,817 US7960210B2 (en) | 2007-04-23 | 2007-04-23 | Ultra-thin chip packaging |
US11/738,817 | 2007-04-23 |
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WO2008129424A2 true WO2008129424A2 (en) | 2008-10-30 |
WO2008129424A3 WO2008129424A3 (en) | 2008-12-18 |
Family
ID=39789478
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PCT/IB2008/001626 WO2008129424A2 (en) | 2007-04-23 | 2008-06-20 | Ultra-thin stacked chios packaging |
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US (2) | US7960210B2 (en) |
EP (1) | EP2361439A2 (en) |
JP (1) | JP4970593B2 (en) |
KR (2) | KR101157726B1 (en) |
CN (1) | CN101663747B (en) |
WO (1) | WO2008129424A2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102013104111B4 (en) | 2012-08-24 | 2018-03-15 | Taiwan Semiconductor Manufacturing Co., Ltd. | A method of forming a package-on-package (PoP) device having a carrier discard control for three-dimensionally integrated circuit (3DIC) stacking |
US10153179B2 (en) | 2012-08-24 | 2018-12-11 | Taiwan Semiconductor Manufacturing Company | Carrier warpage control for three dimensional integrated circuit (3DIC) stacking |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100099012A1 (en) * | 2008-10-17 | 2010-04-22 | Brookhaven Science Associates, Llc | Electrocatalyst Synthesized by Depositing a Contiguous Metal Adlayer on Transition Metal Nanostructures |
US7838337B2 (en) * | 2008-12-01 | 2010-11-23 | Stats Chippac, Ltd. | Semiconductor device and method of forming an interposer package with through silicon vias |
US20170117214A1 (en) | 2009-01-05 | 2017-04-27 | Amkor Technology, Inc. | Semiconductor device with through-mold via |
US8895440B2 (en) | 2010-08-06 | 2014-11-25 | Stats Chippac, Ltd. | Semiconductor die and method of forming Fo-WLCSP vertical interconnect using TSV and TMV |
JP2012169440A (en) * | 2011-02-14 | 2012-09-06 | Fujitsu Semiconductor Ltd | Semiconductor device and manufacturing method of the same |
JP2013110264A (en) * | 2011-11-21 | 2013-06-06 | Fujitsu Semiconductor Ltd | Semiconductor device and semiconductor device manufacturing method |
US9287204B2 (en) * | 2012-12-20 | 2016-03-15 | Stats Chippac, Ltd. | Semiconductor device and method of bonding semiconductor die to substrate in reconstituted wafer form |
KR101523274B1 (en) * | 2013-06-28 | 2015-05-28 | 앰코 테크놀로지 코리아 주식회사 | Semiconductor package manufacturing method |
TWI576870B (en) * | 2013-08-26 | 2017-04-01 | 精材科技股份有限公司 | Inductor structure and manufacturing method thereof |
US9299614B2 (en) * | 2013-12-10 | 2016-03-29 | Applied Materials, Inc. | Method and carrier for dicing a wafer |
US20150255366A1 (en) * | 2014-03-06 | 2015-09-10 | Apple Inc. | Embedded system in package |
KR101587740B1 (en) | 2014-11-10 | 2016-01-22 | 한국가스공사 | Contact type magnetostrictive guided-wave transducer module |
US11362027B2 (en) | 2020-02-28 | 2022-06-14 | Amkor Technology Singapore Holding Pte. Ltd. | Semiconductor devices and methods of manufacturing semiconductor devices |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1418617A2 (en) * | 2002-11-05 | 2004-05-12 | Shinko Electric Co. Ltd. | Semiconductor device and method of manufacturing the same |
US20050157477A1 (en) * | 2003-11-12 | 2005-07-21 | Dai Nippon Printing Co., Ltd. | Electronic device and production method thereof |
US20060046350A1 (en) * | 2004-08-31 | 2006-03-02 | Tongbi Jiang | Methods for fabrication of thin semiconductor assemblies including redistribution layers and packages and assemblies formed thereby |
US20060278972A1 (en) * | 2005-06-01 | 2006-12-14 | Michael Bauer | Panel and semiconductor component having a composite board with semiconductor chips and plastic package molding compound and method for the production thereof |
EP1758438A2 (en) * | 2005-08-26 | 2007-02-28 | Shinko Electric Industries Co., Ltd. | Method of manufacturing a wiring board |
US20070054439A1 (en) * | 2005-07-14 | 2007-03-08 | Siliconware Precision Industries Co., Ltd. | Multi-chip stack structure |
US7190080B1 (en) * | 2000-10-13 | 2007-03-13 | Bridge Semiconductor Corporation | Semiconductor chip assembly with embedded metal pillar |
Family Cites Families (72)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3312878A (en) | 1965-06-01 | 1967-04-04 | Ibm | High speed packaging of miniaturized circuit modules |
US5399898A (en) | 1992-07-17 | 1995-03-21 | Lsi Logic Corporation | Multi-chip semiconductor arrangements using flip chip dies |
JPH0831617B2 (en) | 1990-04-18 | 1996-03-27 | 三菱電機株式会社 | Solar cell and manufacturing method thereof |
JP2918307B2 (en) | 1990-08-07 | 1999-07-12 | 沖電気工業株式会社 | Semiconductor storage element |
KR940006696B1 (en) | 1991-01-16 | 1994-07-25 | 금성일렉트론 주식회사 | Manufacturing method of isolation layer of semiconductor device |
EP0516866A1 (en) | 1991-05-03 | 1992-12-09 | International Business Machines Corporation | Modular multilayer interwiring structure |
US6094058A (en) * | 1991-06-04 | 2000-07-25 | Micron Technology, Inc. | Temporary semiconductor package having dense array external contacts |
JP2608513B2 (en) | 1991-10-02 | 1997-05-07 | 三星電子株式会社 | Method for manufacturing semiconductor device |
US5603847A (en) | 1993-04-07 | 1997-02-18 | Zycon Corporation | Annular circuit components coupled with printed circuit board through-hole |
US5587119A (en) | 1994-09-14 | 1996-12-24 | E-Systems, Inc. | Method for manufacturing a coaxial interconnect |
DE4433845A1 (en) | 1994-09-22 | 1996-03-28 | Fraunhofer Ges Forschung | Method of manufacturing a three-dimensional integrated circuit |
US5608264A (en) | 1995-06-05 | 1997-03-04 | Harris Corporation | Surface mountable integrated circuit with conductive vias |
US5814889A (en) | 1995-06-05 | 1998-09-29 | Harris Corporation | Intergrated circuit with coaxial isolation and method |
US5872051A (en) | 1995-08-02 | 1999-02-16 | International Business Machines Corporation | Process for transferring material to semiconductor chip conductive pads using a transfer substrate |
JP2739855B2 (en) | 1995-12-14 | 1998-04-15 | 日本電気株式会社 | Semiconductor device and manufacturing method thereof |
TW303502B (en) | 1996-01-11 | 1997-04-21 | Micron Technology Inc | Temporary semiconductor package having dense array external contacts |
US5973396A (en) | 1996-02-16 | 1999-10-26 | Micron Technology, Inc. | Surface mount IC using silicon vias in an area array format or same size as die array |
US6310484B1 (en) | 1996-04-01 | 2001-10-30 | Micron Technology, Inc. | Semiconductor test interconnect with variable flexure contacts |
US5872338A (en) | 1996-04-10 | 1999-02-16 | Prolinx Labs Corporation | Multilayer board having insulating isolation rings |
JP2790122B2 (en) | 1996-05-31 | 1998-08-27 | 日本電気株式会社 | Laminated circuit board |
US7052941B2 (en) | 2003-06-24 | 2006-05-30 | Sang-Yun Lee | Method for making a three-dimensional integrated circuit structure |
JP3176307B2 (en) | 1997-03-03 | 2001-06-18 | 日本電気株式会社 | Mounting structure of integrated circuit device and method of manufacturing the same |
JPH10335383A (en) | 1997-05-28 | 1998-12-18 | Matsushita Electric Ind Co Ltd | Producing method for semiconductor device |
JPH11166935A (en) | 1997-09-25 | 1999-06-22 | Canon Inc | Light probe for light detection or irradiation, near-field optical microscope provided with the probe, manufacture of the light probe and substrate used for its manufacture |
US6620731B1 (en) | 1997-12-18 | 2003-09-16 | Micron Technology, Inc. | Method for fabricating semiconductor components and interconnects with contacts on opposing sides |
US6075710A (en) | 1998-02-11 | 2000-06-13 | Express Packaging Systems, Inc. | Low-cost surface-mount compatible land-grid array (LGA) chip scale package (CSP) for packaging solder-bumped flip chips |
US5962922A (en) | 1998-03-18 | 1999-10-05 | Wang; Bily | Cavity grid array integrated circuit package |
US6222276B1 (en) | 1998-04-07 | 2001-04-24 | International Business Machines Corporation | Through-chip conductors for low inductance chip-to-chip integration and off-chip connections |
US6380023B2 (en) | 1998-09-02 | 2002-04-30 | Micron Technology, Inc. | Methods of forming contacts, methods of contacting lines, methods of operating integrated circuitry, and integrated circuits |
US6122187A (en) | 1998-11-23 | 2000-09-19 | Micron Technology, Inc. | Stacked integrated circuits |
US6316737B1 (en) | 1999-09-09 | 2001-11-13 | Vlt Corporation | Making a connection between a component and a circuit board |
JP3386029B2 (en) | 2000-02-09 | 2003-03-10 | 日本電気株式会社 | Flip chip type semiconductor device and manufacturing method thereof |
US6446317B1 (en) | 2000-03-31 | 2002-09-10 | Intel Corporation | Hybrid capacitor and method of fabrication therefor |
JP2001338947A (en) | 2000-05-26 | 2001-12-07 | Nec Corp | Flip chip type semiconductor device and its manufacturing method |
US6393789B1 (en) * | 2000-07-12 | 2002-05-28 | Christopher P. Lanclos | Refractory anchor |
TW525417B (en) | 2000-08-11 | 2003-03-21 | Ind Tech Res Inst | Composite through hole structure |
US6577013B1 (en) | 2000-09-05 | 2003-06-10 | Amkor Technology, Inc. | Chip size semiconductor packages with stacked dies |
US6720245B2 (en) | 2000-09-07 | 2004-04-13 | Interuniversitair Microelektronica Centrum (Imec) | Method of fabrication and device for electromagnetic-shielding structures in a damascene-based interconnect scheme |
US6740576B1 (en) | 2000-10-13 | 2004-05-25 | Bridge Semiconductor Corporation | Method of making a contact terminal with a plated metal peripheral sidewall portion for a semiconductor chip assembly |
JP2002134545A (en) | 2000-10-26 | 2002-05-10 | Oki Electric Ind Co Ltd | Semiconductor integrated circuit chip, board and their manufacturing method |
JP4608763B2 (en) | 2000-11-09 | 2011-01-12 | 日本電気株式会社 | Semiconductor device |
EP1217656A1 (en) | 2000-12-20 | 2002-06-26 | STMicroelectronics S.r.l. | Process for manufacturing components in a semiconductor material with reduction in the starting wafer thickness |
US6512300B2 (en) | 2001-01-10 | 2003-01-28 | Raytheon Company | Water level interconnection |
JP4118029B2 (en) | 2001-03-09 | 2008-07-16 | 富士通株式会社 | Semiconductor integrated circuit device and manufacturing method thereof |
US7218349B2 (en) | 2001-08-09 | 2007-05-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US6747347B2 (en) | 2001-08-30 | 2004-06-08 | Micron Technology, Inc. | Multi-chip electronic package and cooling system |
KR20030018642A (en) * | 2001-08-30 | 2003-03-06 | 주식회사 하이닉스반도체 | Stack chip module |
JP3495727B2 (en) | 2001-11-07 | 2004-02-09 | 新光電気工業株式会社 | Semiconductor package and manufacturing method thereof |
US6599778B2 (en) | 2001-12-19 | 2003-07-29 | International Business Machines Corporation | Chip and wafer integration process using vertical connections |
US6590278B1 (en) | 2002-01-08 | 2003-07-08 | International Business Machines Corporation | Electronic package |
TW200302685A (en) * | 2002-01-23 | 2003-08-01 | Matsushita Electric Ind Co Ltd | Circuit component built-in module and method of manufacturing the same |
US6770822B2 (en) | 2002-02-22 | 2004-08-03 | Bridgewave Communications, Inc. | High frequency device packages and methods |
US7135777B2 (en) | 2002-05-03 | 2006-11-14 | Georgia Tech Research Corporation | Devices having compliant wafer-level input/output interconnections and packages using pillars and methods of fabrication thereof |
US6939789B2 (en) | 2002-05-13 | 2005-09-06 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of wafer level chip scale packaging |
SG111069A1 (en) | 2002-06-18 | 2005-05-30 | Micron Technology Inc | Semiconductor devices including peripherally located bond pads, assemblies, packages, and methods |
JP3679786B2 (en) | 2002-06-25 | 2005-08-03 | 松下電器産業株式会社 | Manufacturing method of semiconductor device |
SG111972A1 (en) | 2002-10-17 | 2005-06-29 | Agency Science Tech & Res | Wafer-level package for micro-electro-mechanical systems |
TWI233172B (en) * | 2003-04-02 | 2005-05-21 | Siliconware Precision Industries Co Ltd | Non-leaded semiconductor package and method of fabricating the same |
ITTO20030269A1 (en) | 2003-04-08 | 2004-10-09 | St Microelectronics Srl | PROCEDURE FOR THE MANUFACTURE OF A DEVICE |
US20050046034A1 (en) | 2003-09-03 | 2005-03-03 | Micron Technology, Inc. | Apparatus and method for high density multi-chip structures |
TWI251313B (en) | 2003-09-26 | 2006-03-11 | Seiko Epson Corp | Intermediate chip module, semiconductor device, circuit board, and electronic device |
US20050104027A1 (en) | 2003-10-17 | 2005-05-19 | Lazarev Pavel I. | Three-dimensional integrated circuit with integrated heat sinks |
US7276787B2 (en) | 2003-12-05 | 2007-10-02 | International Business Machines Corporation | Silicon chip carrier with conductive through-vias and method for fabricating same |
US7230318B2 (en) | 2003-12-24 | 2007-06-12 | Agency For Science, Technology And Research | RF and MMIC stackable micro-modules |
JP4298559B2 (en) * | 2004-03-29 | 2009-07-22 | 新光電気工業株式会社 | Electronic component mounting structure and manufacturing method thereof |
JP4131256B2 (en) * | 2004-08-16 | 2008-08-13 | 沖電気工業株式会社 | Semiconductor device and manufacturing method thereof |
US7157310B2 (en) | 2004-09-01 | 2007-01-02 | Micron Technology, Inc. | Methods for packaging microfeature devices and microfeature devices formed by such methods |
JP4759981B2 (en) * | 2004-11-02 | 2011-08-31 | 大日本印刷株式会社 | Manufacturing method of electronic component built-in module |
IL171378A (en) | 2005-10-11 | 2010-11-30 | Dror Hurwitz | Integrated circuit support structures and the fabrication thereof |
JP2007180529A (en) * | 2005-12-02 | 2007-07-12 | Nec Electronics Corp | Semiconductor device and method of manufacturing the same |
JP4972968B2 (en) * | 2006-03-16 | 2012-07-11 | 富士通株式会社 | Semiconductor device and manufacturing method thereof |
US20080197474A1 (en) * | 2007-02-16 | 2008-08-21 | Advanced Chip Engineering Technology Inc. | Semiconductor device package with multi-chips and method of the same |
-
2007
- 2007-04-23 US US11/738,817 patent/US7960210B2/en active Active
-
2008
- 2008-06-20 EP EP08762937A patent/EP2361439A2/en not_active Withdrawn
- 2008-06-20 WO PCT/IB2008/001626 patent/WO2008129424A2/en active Application Filing
- 2008-06-20 CN CN2008800129833A patent/CN101663747B/en active Active
- 2008-06-20 KR KR1020097023473A patent/KR101157726B1/en active IP Right Grant
- 2008-06-20 KR KR1020127002724A patent/KR101245928B1/en active IP Right Grant
- 2008-06-20 JP JP2010504906A patent/JP4970593B2/en active Active
-
2009
- 2009-07-08 US US12/499,554 patent/US20090267219A1/en not_active Abandoned
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7190080B1 (en) * | 2000-10-13 | 2007-03-13 | Bridge Semiconductor Corporation | Semiconductor chip assembly with embedded metal pillar |
EP1418617A2 (en) * | 2002-11-05 | 2004-05-12 | Shinko Electric Co. Ltd. | Semiconductor device and method of manufacturing the same |
US20050157477A1 (en) * | 2003-11-12 | 2005-07-21 | Dai Nippon Printing Co., Ltd. | Electronic device and production method thereof |
US20060046350A1 (en) * | 2004-08-31 | 2006-03-02 | Tongbi Jiang | Methods for fabrication of thin semiconductor assemblies including redistribution layers and packages and assemblies formed thereby |
US20060278972A1 (en) * | 2005-06-01 | 2006-12-14 | Michael Bauer | Panel and semiconductor component having a composite board with semiconductor chips and plastic package molding compound and method for the production thereof |
US20070054439A1 (en) * | 2005-07-14 | 2007-03-08 | Siliconware Precision Industries Co., Ltd. | Multi-chip stack structure |
EP1758438A2 (en) * | 2005-08-26 | 2007-02-28 | Shinko Electric Industries Co., Ltd. | Method of manufacturing a wiring board |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102013104111B4 (en) | 2012-08-24 | 2018-03-15 | Taiwan Semiconductor Manufacturing Co., Ltd. | A method of forming a package-on-package (PoP) device having a carrier discard control for three-dimensionally integrated circuit (3DIC) stacking |
US10153179B2 (en) | 2012-08-24 | 2018-12-11 | Taiwan Semiconductor Manufacturing Company | Carrier warpage control for three dimensional integrated circuit (3DIC) stacking |
US10290513B2 (en) | 2012-08-24 | 2019-05-14 | Taiwan Semiconductor Manufacturing Company | Carrier warpage control for three dimensional integrated circuit (3DIC) stacking |
US10825693B2 (en) | 2012-08-24 | 2020-11-03 | Taiwan Semiconductor Manufacturing Company | Carrier warpage control for three dimensional integrated circuit (3DIC) stacking |
Also Published As
Publication number | Publication date |
---|---|
WO2008129424A3 (en) | 2008-12-18 |
KR101157726B1 (en) | 2012-06-21 |
KR20100020939A (en) | 2010-02-23 |
JP4970593B2 (en) | 2012-07-11 |
US20080258284A1 (en) | 2008-10-23 |
US7960210B2 (en) | 2011-06-14 |
EP2361439A2 (en) | 2011-08-31 |
CN101663747B (en) | 2013-05-22 |
JP2011501397A (en) | 2011-01-06 |
US20090267219A1 (en) | 2009-10-29 |
CN101663747A (en) | 2010-03-03 |
KR101245928B1 (en) | 2013-03-20 |
KR20120055547A (en) | 2012-05-31 |
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