WO2009109981A2 - Ultra-portable wireless atomic optical emission spectrometers for use in elemental analysis of various conducting metals and their alloys - Google Patents
Ultra-portable wireless atomic optical emission spectrometers for use in elemental analysis of various conducting metals and their alloys Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0264—Electrical interface; User interface
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/027—Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
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- G—PHYSICS
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0272—Handheld
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/443—Emission spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0118—Apparatus with remote processing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
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Abstract
An ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of a broad range of conducting metals and their alloys comprises a Main Control Unit (MCU) connected remotely to a portable Probe for analysing metallic objects / samples Digital spectral information is wirelessly transmitted to the said MCU, where it is further processed and converted to elemental analysis results The said MCU comprises a computer integrated to the said MCU, and a digital display unit for displaying the results of the said elemental analysis The said Probe comprises an information gathering electrode and the spectrometer's Optical Chamber rigidly coupled to a Charge Coupled Device (CCD) and CCD Camera Both the MCU and the probe further comprise a plurality of solid-state electronic control elements as well as transmitter and receiver means for mutually transmitting and receiving signals during the elemental analysis.
Description
Title of Invention:
ULTRA-PORTABLE WIRELESS ATOMIC OPTICAL
EMISSION SPECTROMETERS FOR USE IN ELEMENTAL ANALYSIS OF VARIOUS CONDUCTING METALS AND THEIR ALLOYS.
1. FIELD OF THE INVENTION
The field of present invention relates broadly to ultra-portable Atomic Emission Spectrometers (AES), also known as Optical Emission Spectrometers (OES), for use in elemental analysis (in weight percentages) of various conducting metals and their alloys, and particularly to wireless Atomic Emission Spectrometers (AES).
2. BACKGROUND OF INVENTION
There are several companies manufacturing portable Atomic Emission Spectrometers. These spectrometers normally consist of a Main Control Unit (MCU) which houses a personal computer and other control electronics devices / elements, inter-connected by a cable to a Probe. The Probe, being light and small, is carried around by the operator to analyse metallic objects / samples.
The said Probe has an electrode with Arc / Spark type excitation. The spectrometer's Optical Chamber could either be housed in the said MCU or in the said Probe. In case the said Optical Chamber is housed in the MCU (refer to Fig. 1), spectral information gathered at the said electrode is transmitted to the said MCU using a fibre optic cable, where it is processed and converted to elemental analysis results. If the Optics are housed in the said Probe (refer to Fig. 2), spectral information is first digitized and sent using a multi-wire shielded cable to the said MCU for processing and thereafter converting to elemental analysis results.
Often, users have to identify and analyse metallic objects spread over a large territory, e.g., in large chemical, petrochemical, cement etc. plants and other places like shipyards, steelyards, scrap yards, etc. In such places portability as well as accuracy of results is of great importance. Hence a wireless Atomic Emission Spectrometer (AES) capable of serving in remotely connected high network connectivity as well as accuracy encompassing a very broad range of elements and their alloys, is best suited for the said purposes. Some existing wireless controlled
AES are discussed hereinafter in order to compare with that of the devised ultra- portable wireless Atomic Emission Spectrometers (AES), according to the present invention.
Thermo Electron Corporation devised a technique to improve elemental analysis of steel. Their optical emission spectrometer, known as ARL 4460, is capable in performing analysis of various elements at very low levels. The said ARL 4460 is capable of analysing the elements Carbon (C), Nitrogen (N), Oxygen (O), Phosphorus (P) and Sulphur (S) at very low levels. As per their (Thermo Electron Corporation) claim, the increased sensitivity of the ARL 4460 metals analyser allows the cost-effective manufacture of cleaner steels. The ARL 4460 can detect extremely low levels of gaseous elements in steel. (Source URL: http://www.processingtalk.com/news/ter/ter120.html).
Known prior art relevant to the field of method and apparatus to fabricate optical emission spectroscopy includes U.S Patent No. 05285251 of Pilloud, Francis and Vogel, Wilfried dated 02/08/1994; GB Patent No. 2217836 of Bodenseewerk Perkin Elmer Co. (DE) dated 1989-11-01; WO Patent Application No. 1993001486 of Schlager, Kenneth J. and Bergrstrom, Carl J. dated 07/09/1992; and US Patent No. 05278629 of Schlager, Kenneth J. and Bergrstrom, Carl J. dated 01/11/1994.
U.S Patent No. 05285251 teaches an apparatus and methods for Optical Emission Spectroscopy. In the said U.S Patent No. 05285251 a spark generator suitable for use in an Optical Emission Spectroscopy, and capable of generating a spark in a spark gap formed between an electrode and a sample to be analyzed, comprises a generator for generating a current of programmable amplitude in the spark gap in each of a series of discrete time intervals. The spark generator enables the amplitudes of various portions of the spark to be independently varied, thus permitting the shape of the spark to be tailored to the particular analysis being performed. U.S Patent No. 05285251 also describes methods of optical emission spectroscopy which make use of the advantageous properties of the spark generator.
The GB Patent No. 2217836 describes an Atomic Emission Spectrometer for multielement measurement of elements in a sample. The said atomic emission spectrometer comprises an apparatus to atomize the sample and to excite the atoms for emitting characteristic spectral lines, a dispersion device which generates a
spectrum of the light emitted by the atoms in a focal plane, and a plurality of semiconductor photo-detectors, each of which is exposed to one of said characteristic spectral lines.
A method and apparatus of Atomic Emission Spectrometry is reported in WO Patent Application No. 1993001486 and US Patent No. 05278629. The system described in these two inventions can be used for individual element analysis or a multiple element analysis by use of an array spectrometer, with a simultaneous display of the complete atomic spectrum of multiple elements in a liquid solution, all in less than a period of one second.
There are also instances where a wireless spectrometer has been devised. For an example, the Inspector Raman™ is a handheld portable spectrometer having wireless communication. The manufacturer DeltaNu claims that the Inspector Raman™ is one of the world's first handheld, wireless spectrometers. The Inspector Raman™'s applicational areas are in reaction monitoring, material identification, forensics, earth sciences and nanotechnology.
The website http://staff.aist.αo.ip/f.tappero/research/diamond cdv/diamond cdv.html teaches an optical spectroscopic device having a wireless optical emission spectrometer. The core of the remote device of this wireless control is a Pentium III main board (Advantech PCM-9577), with all the classic features of a typical desktop computer. The embedded system is directly connected to an optical spectrometer (Ocean Optics HR2000) through an USB connection. The optical peripheral is a high resolution miniature optical spectrometer that can perform an optical absorption analysis of the DC-plasma emission. It has 0.2nm resolution and 430nm wavelength capability. Additionally, the system has been equipped of a digital video camera which monitors the CVD plasma during the whole experiment.
It is observed from the foregoing discussions that the performance and reliability of the prior spectrometers as well as wireless devices are lower than that of the devised ultra-portable atomic emission spectrometer. These facts are established when one reads the following description with reference to the accompanying figures.
3. SUMMARY AND OBJECTS OF THE INVENTION
Accordingly, there is a need to design an ultra-portable wireless Atomic (Optical) Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys.
It is, therefore, an object of the present invention to provide an ultra-portable wireless Atomic (Optical) Emission Spectrometer for use in elemental analysis in weight percentages of a broad range of conducting metals and their alloys.
It is another object of the present invention to provide an ultra-portable wireless Atomic (Optical) Emission Spectrometer for use in elemental analysis in weight percentages of various conducting metals and their alloys, to transmit and relay wirelessly the analytical results at any place where needed.
It is a further object of the present invention to design an ultra-portable wireless Atomic Emission Spectrometer for use in elemental analysis in weight percentages of various conducting metals and their alloys in such a fashion that the digitized spectral information is transmitted, and subsequently received by the Main Control Unit (MCU) for further processing.
It is another further object of the present invention to design an ultra-portable wireless Atomic Emission Spectrometer for use in elemental analysis in weight percentages of various conducting metals and their alloys, such that the said Probe and MCU are powered independently.
It is yet another object of the present invention to devise an ultra-portable wireless Atomic Emission Spectrometer for use in elemental analysis in weight percentages of various conducting metals and their alloys, so that the said wireless spectrometer would give the user much greater freedom to move around with the Probe over much larger distances.
It is still another object of the present invention to devise an ultra-portable wireless Atomic Emission Spectrometer for use in elemental analysis in weight percentages of various conducting metals and their alloys, which aims at lower manufacturing as well as experimental costs.
It is yet still another object of the present invention to provide an ultra-portable wireless Atomic Emission Spectrometer for use in elemental analysis in weight percentages of various conducting metals and their alloys, which is a portable one. The other objects, preferred embodiments and advantages of the present invention will become more apparent from the following description when read in conjunction with accompanying drawings which are not intended to limit the scope of the present invention.
To achieve these and other advantages and in accordance with the purpose of the present invention, as embodied and broadly described, the ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys comprising a Main Control Unit (MCU) housing a personal computer (PC) and other solid-state electronic controls, connected at least within a network remotely to a Probe for carrying around by an operator to analyse metallic objects/samples, the spectrometer's optical chamber being housed in the said Probe, and spectral information gathered at the electrode, which is housed in the said Probe, is transmitted to the said MCU with means for transmission and reception of digital spectral information, wherein spectral information is further processed and converted to elemental analysis results characterized in that the said Main Control Unit (MCU) and the said Probe communicate wirelessly during the transmission and reception of the said elemental analysis information, wherein the said Main Control Unit (MCU) is having a plurality of solid-state electronic control elements, a computer integrated to the said MCU, a digital display unit for displaying the results of the said elemental analysis, and transmitter and receiver means for transmitting and receiving signals during the elemental analysis; and the said Probe is having its Optical Chamber rigidly coupled to a Charge Coupled Device (CCD) and CCD Camera, a plurality of solid-state electronic control elements responsible for atomic emission of light, which is diffracted in the Optical Chamber, analysed and digitised. Also, transmitter and receiver as means for transmitting and receiving signals during the elemental analysis to the said MCU.
The ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys, according to the present invention, wherein, the said Atomic Emission Spectrometer
having Charge Coupled Device (CCD) Detectors transmits the said spectral information of the elemental analysis wirelessly to transmit and relay the said analytical results at any place within the said network where needed.
The ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys, according to the present invention, wherein, the said digitized spectral information is transmitted by the said Probe, and subsequently received by the said Main Control Unit (MCU) for further processing.
The ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys, according to the present invention, wherein, the said Probe and MCU are powered separately, either using batteries or directly connecting with source power supply.
The ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys, according to the present invention, wherein, the said wireless spectrometer would give its user much greater freedom to carry around the said Probe over any distance covered by the said network.
Another embodiment of the said ultra-portable wireless Atomic Emission Spectrometer (AES) featuring a range of wavelength of the transmitted and received elemental analysis result information and resolution of the digital image is illustrated hereinafter.
An ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys comprising a Main Control Unit (MCU) housing a personal computer (PC) and other solid-state electronic controls, connected remotely to a Probe for carrying around by an operator to analyse metallic objects / samples, the spectrometer's Optical Chamber being housed in the said MCU, and spectral information generated at the electrode, which is housed in the said Probe, is transmitted to the said MCU with means for transmission and reception of digital spectral information, wherein spectral information is further processed and converted to elemental analysis results whereby
the said Main Control Unit (MCU) and the said Probe communicate wirelessly during the transmission and reception of the said elemental analysis information, wherein the said Main Control Unit (MCU) is having a plurality of solid-state electronic control elements, a computer integrated to the said MCU, a digital display unit for displaying the results of the said elemental analysis, and transmitter and receiver means for transmitting and receiving signals during the elemental analysis; the said Probe is having its Optical Chamber rigidly coupled to a Charge Coupled Device (CCD), CCD Camera, a plurality of solid-state electronic control elements responsible for discharge of light and its optical analysis, and a transmitter and receiver as means for transmitting and receiving signals during the elemental analysis to the said Main Control Unit (MCU); the said transmission and reception of the wireless communication occurs at least at wavelengths ranging 160 - 410nm having a resolution typically around 0.068nm per pixel of the digital image for the analysis result; and analysis results are typically available within maximum time of 60 seconds just after a two runs.
The ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys, according to the present invention, wherein, increase of range of the said wavelength is possible.
The ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys, according to the present invention, wherein, improvement relating to the said resolution of the said wireless AES can be achieved in order to obtain much better results in terms of its accuracy and precision.
The ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys, according to the present invention, wherein, the said wireless spectrometer is portable or is of portable-cum-desktop/tabletop type having capability to analyse a broad range of elements.
The ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys,
according to the present invention, wherein the manufacturing as well as operating costs of the said wireless spectrometer are reduced due to elimination of expensive cabling.
The ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys, according to the present invention, wherein, the said wireless AES is capable of analysing at least the elements C, Mg, Al, Si, P, S, Ca. Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Sr, Zr, Nb, Mo, Ag, Cd, In, Sn, Sb, W, Pb.
Additional features and advantages of the wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys, according to the present invention, will be set forth in the description which follows, and in part will be apparent from the description, or may be learned by practice of the present invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in description and claims hereof as well as appended drawings.
4. BRIEF DESCRIPTION OF THE ACCOMPANYING DRAWINGS
A more complete understanding of the present embodiments and advantages thereof may be acquired by referring to the following description taken in conjunction with the accompanying drawings, in which like reference numbers indicate like features, and wherein:
Figure 1 is a schematic representation of a conventional portable spectrometer using fibre optic cable and the optical chamber is located at the MCU; Figure 2 is a schematic representation of a conventional portable spectrometer using shielded cable and the optical chamber is located at the probe; Figure 3 is a schematic representation illustrating the ultra-portable spectrometer, according to the present invention, having wireless transmission of spectral information.
5. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS WITH REFERENCE TO THE ACCOMPANYING DRAWINGS
In accordance with the present invention, the ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of a broad range of conducting metals and their alloys comprises a Main Control Unit (MCU) (2) and a Probe (1). The said MCU (2) houses a personal computer (PC) (3) and other
solid-state electronic controls (4). The said MCU (1) is connected remotely at least within a network to the said Probe (1). Wireless control of the said Probe (1) enables the operator to carry the said Probe (1) to a distant region of interest to analyse metallic objects/samples. The said spectrometer's Optical Chamber is housed in the said Probe (1). The spectral information gathered at the Arc/Spark type electrode of the said Probe (2) [not shown in the figures] suitably housed in the said Probe (1), is transmitted to the said MCU (2). Transmission and reception is carried out with means (5) for transmission and reception of digital spectral information. Spectral information is further processed and converted to elemental analysis results.
The said Main Control Unit (MCU) (2) and the said Probe (1) communicate wirelessly during the transmission and reception of the said elemental analysis information. The said Main Control Unit (MCU) (2) houses plurality of solid-state electronic control elements (4), a computer (3) integrated to the said MCU (2), a digital display unit (6) for displaying the results of the said elemental analysis, and transmitter and receiver means (5) for transmitting and receiving signals during the elemental analysis. The said Probe's (1) Optical Chamber [not shown in figures] is rigidly coupled to a Charge Coupled Device (CCD) & CCD Camera, a plurality of solid-state electronic control elements (4) responsible for discharge of electrons, and a transmitter and receiver means (5) for transmitting and receiving signals during the elemental analysis to the said Main Control Unit (MCU) (2). The said Optical Emission Spectrometer having Charge Coupled Device (CCD) detectors, transmits the said spectral information of the elemental analysis wirelessly to transmit and relay the said analytical results at any place within the said network where needed. The said digitized spectral information is transmitted by the said Probe (1), and subsequently received by the said Main Control Unit (MCU) (2) for further processing of the digital information. Further processing may comprise enhancing the captured digital images by smart freezing technique, and/or achieving the said digital images for future reference. The said Probe (1) & the said MCU (2) are powered separately, either using batteries, or directly connecting with source power supply. The wireless network of the Atomic Emission Spectrometer (AES) allows its user to enjoy much greater freedom while carrying the said Probe over any distance covered by the said network
Another embodiment of the said ultra-portable wireless Atomic Emission Spectrometer (AES) featuring a range of wavelength of the transmitted and received elemental analysis result information and resolution of the digital image is also
illustrated. The second embodiment fixes the said transmission and reception phenomena of the wireless communication. This transmission and reception phenomena occurs typically at wavelengths ranging 160 - 410nm. The resolution of the digital image captured during elemental analysis is typically of the order of 0.068 nm per pixel. All of the analysis results are typically available within a maximum time of 60 seconds, just after two runs of the said ultra-portable wireless Atomic Emission Spectrometer (AES).
Both of the embodiments of the said wireless spectrometer could be portable. A variation of this would have the MCU as a desktop or tabletop type with only the Probe as portable. Thus, the said ultra-portable wireless Atomic Emission Spectrometer (AES) is of portable or desktop-cum-portable type, having capability to analyse a broad range of elements. Due to elimination of expensive cabling the manufacturing as well as operating costs of the said wireless spectrometer are reduced. The said wireless Atomic Emission Spectrometer (AES) is capable of analysing at least the elements C, Mg, Al, Si, P1 S, Ca. Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Sr, Zr, Nb, Mo, Ag, Cd, In, Sn, Sb, W, Pb, and their alloys.
Many modifications and other embodiments of the inventions set forth herein will come to mind to one skilled-in-the-art to which these inventions pertain having, the benefit of teachings presented in the foregoing descriptions and the associated drawings. Therefore, it is to be understood that the inventions are not to be limited to the specific embodiments disclosed and that modifications and other embodiments are intended to be included within the scope of the appended claims. Although specific terms are employed herein, they are used in a generic and descriptive sense only and not for purpose of limitation.
While the principles of this invention have been described in connection with specific embodiment, it should be understood clearly that these descriptions are made only by way of example and are not intended to limit the scope of the invention.
Claims
1. An ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys comprising a Main Control Unit (MCU) (2) housing a personal computer (PC) (3) and other solid-state electronic controls (4), connected at least within a network remotely to a Probe (1) for carrying around by an operator to analyse metallic objects / samples, the spectrometer's Optical Chamber being housed in the said MCU (2), and spectral information gathered at the electrode, which is housed in the said Probe (1), is transmitted to the said MCU (2) with means (5) for transmission and reception of digital spectral information, wherein spectral information is further processed and converted to elemental analysis results characterized in that the said Main Control Unit (MCU) (2) and the said Probe (1) is communicated wirelessly during the transmission and reception of the said elemental analysis information, wherein the said Main Control Unit (MCU) (2) is having a plurality of solid-state electronic control elements (4), a computer (3) integrated to the said MCU (2), a digital display unit (6) for displaying the results of the said elemental analysis, and transmitter and receiver means (5) for transmitting and receiving signals during the elemental analysis; and the said Probe (1) is having Optical Chamber rigidly coupled to a Charge Coupled Device (CCD) and CCD Camera, a plurality of solid-state electronic control elements (4) responsible for atomic emission of light and its analysis, and transmitter and receiver means (5) for transmitting and receiving signals during the elemental analysis to the said MCU (2).
2. The ultra-portable wireless Atomic Emission Spectrometer (AES) of claim 1, wherein, the said Atomic Emission Spectrometer having Charge Coupled Device (CCD) detectors transmits the said spectral information of the elemental analysis wirelessly to transmit and relay the said analytical results at any place within the said network where needed.
3. The ultra-portable wireless Atomic Emission Spectrometer (AES) of any claims 1 through 2, wherein, the said digitized spectral information is transmitted by the said probe (1), and subsequently received by the said Main Control Unit (MCU) (2) for further processing.
4. The ultra-portable wireless Atomic Emission Spectrometer (AES) of any claims 1 through 3, wherein, the said Probe (1) and the said MCU (2) are powered separately, either using batteries or directly connecting with source power supply.
5. The ultra-portable wireless Atomic Emission Spectrometer (AES) of any claims 1 through 5, wherein, the said wireless spectrometer would give its user much greater freedom to carry around the said Probe (1) over any distance covered by the formed network during wireless control.
6. An ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys comprising a Main Control Unit (MCU) (2) housing a personal computer (PC) (3) and other solid-state electronic controls (4), connected remotely to a Probe (1) for carrying around by an operator to analyse metallic objects / samples, the spectrometer's Optical Chamber being housed in the said Probe (2), and spectral information gathered at the electrode, which is housed in the said Probe (1), is transmitted to the said MCU (2) with means (5) for transmission and reception of digital spectral information, wherein spectral information is further processed and converted to elemental analysis results whereby the said Main Control Unit (MCU) (2) and the said Probe (1) communicate wirelessly during the transmission and reception of the said elemental analysis information, wherein the said Main Control Unit (MCU) (2) is having a plurality of solid-state electronic control elements (4), a computer (3) integrated to the said MCU (2), a digital display unit (6) for displaying the results of the said elemental analysis, and transmitter and receiver means (5) for transmitting and receiving signals during the elemental analysis; the said Probe (1) is having its Optical Chamber rigidly coupled to a Charge Coupled Device (CCD) and CCD Camera, a plurality of solid-state electronic control elements (4) responsible for atomic emission of light and its analysis, and a transmitter and receiver means (5) for transmitting and receiving signals during the elemental analysis to the said Main Control Unit (MCU) (2); the said transmission and reception of the wireless communication occurs typically at wavelengths ranging 160 - 410nm having a resolution typically around 0.068 nm per pixel of the digital image for the analysis result; and analysis results are typically available within maximum time of 60 seconds after two runs.
7. The ultra-portable wireless Atomic Emission Spectrometer (AES) of any of the claims 1 or 6, wherein, increase of range of the said wavelength is possible on both of the said transmission and reception sides, independently.
8. The ultra-portable wireless Atomic Emission Spectrometer (AES) of any of the claims 1 or 6, wherein, improvement relating to the said resolution of the said wireless AES can be achieved in order to obtain much better results.
9. The ultra-portable wireless Atomic Emission Spectrometer (AES) of any of the claims 1 or 6, wherein, the said wireless spectrometer is either portable and/or portable-cum-desktop type having capability to analyse a broad range of conducting metals.
10. The ultra-portable wireless Atomic Emission Spectrometer (AES) of any of the claims 1 or 6, wherein, the manufacturing as well as operating costs of the said wireless spectrometer are reduced due to elimination of expensive cabling.
11. The ultra-portable wireless Atomic Emission Spectrometer (AES) of any of the claims 1 or 6, wherein, the said wireless AES is capable of analysing at least the elements C, Mg, Al1 Si, P, S, Ca. Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Sr, Zr, Nb, Mo, Ag, Cd, In, Sn, Sb, W, Pb, and/or their alloys.
12. An ultra-portable wireless Atomic Emission Spectrometer (AES) for use in elemental analysis in weight percentages of various conducting metals and their alloys, as hereinbefore described, with reference to the accompanying drawings.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/IN2008/000124 WO2009109981A2 (en) | 2008-03-04 | 2008-03-04 | Ultra-portable wireless atomic optical emission spectrometers for use in elemental analysis of various conducting metals and their alloys |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/IN2008/000124 WO2009109981A2 (en) | 2008-03-04 | 2008-03-04 | Ultra-portable wireless atomic optical emission spectrometers for use in elemental analysis of various conducting metals and their alloys |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2009109981A2 true WO2009109981A2 (en) | 2009-09-11 |
| WO2009109981A3 WO2009109981A3 (en) | 2009-12-23 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/IN2008/000124 WO2009109981A2 (en) | 2008-03-04 | 2008-03-04 | Ultra-portable wireless atomic optical emission spectrometers for use in elemental analysis of various conducting metals and their alloys |
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| Country | Link |
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| WO (1) | WO2009109981A2 (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103257136A (en) * | 2013-04-12 | 2013-08-21 | 中国航空工业集团公司北京航空材料研究院 | Determination method for calcium, cobalt, chromium and iron in tungsten carbide |
| CN105758844A (en) * | 2016-02-26 | 2016-07-13 | 兰州金川新材料科技股份有限公司 | Determining method for trace silicon in cobaltosic oxide |
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| US5751424A (en) * | 1996-11-05 | 1998-05-12 | Kb Science | Scalable non-contact optical backscatter insertion probe |
| US6707043B2 (en) * | 1998-08-14 | 2004-03-16 | On-Site Analysis, Inc. | On-site analyzer |
| US20070068242A1 (en) * | 2005-09-26 | 2007-03-29 | Baker Hughes Incorporated | Method and apparatus for elemental analysis of a fluid downhole |
| US20070171407A1 (en) * | 2005-01-14 | 2007-07-26 | Montana State University | Method and apparatus for detecting optical spectral properties using optical probe beams with multiple sidebands |
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| US5751424A (en) * | 1996-11-05 | 1998-05-12 | Kb Science | Scalable non-contact optical backscatter insertion probe |
| US6707043B2 (en) * | 1998-08-14 | 2004-03-16 | On-Site Analysis, Inc. | On-site analyzer |
| US20070171407A1 (en) * | 2005-01-14 | 2007-07-26 | Montana State University | Method and apparatus for detecting optical spectral properties using optical probe beams with multiple sidebands |
| US20070068242A1 (en) * | 2005-09-26 | 2007-03-29 | Baker Hughes Incorporated | Method and apparatus for elemental analysis of a fluid downhole |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103257136A (en) * | 2013-04-12 | 2013-08-21 | 中国航空工业集团公司北京航空材料研究院 | Determination method for calcium, cobalt, chromium and iron in tungsten carbide |
| CN105758844A (en) * | 2016-02-26 | 2016-07-13 | 兰州金川新材料科技股份有限公司 | Determining method for trace silicon in cobaltosic oxide |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2009109981A3 (en) | 2009-12-23 |
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