WO2009129403A4 - Temperature control within storage device testing systems - Google Patents

Temperature control within storage device testing systems Download PDF

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Publication number
WO2009129403A4
WO2009129403A4 PCT/US2009/040835 US2009040835W WO2009129403A4 WO 2009129403 A4 WO2009129403 A4 WO 2009129403A4 US 2009040835 W US2009040835 W US 2009040835W WO 2009129403 A4 WO2009129403 A4 WO 2009129403A4
Authority
WO
WIPO (PCT)
Prior art keywords
test
storage device
electronics
control system
thermal control
Prior art date
Application number
PCT/US2009/040835
Other languages
French (fr)
Other versions
WO2009129403A3 (en
WO2009129403A2 (en
Inventor
Brian S. Merrow
Original Assignee
Teradyne, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne, Inc. filed Critical Teradyne, Inc.
Publication of WO2009129403A2 publication Critical patent/WO2009129403A2/en
Publication of WO2009129403A3 publication Critical patent/WO2009129403A3/en
Publication of WO2009129403A4 publication Critical patent/WO2009129403A4/en

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05DSYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00Control of temperature
    • G05D23/19Control of temperature characterised by the use of electric means
    • G05D23/1927Control of temperature characterised by the use of electric means using a plurality of sensors
    • G05D23/1928Control of temperature characterised by the use of electric means using a plurality of sensors sensing the temperature of one space
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10Digital recording or reproducing
    • G11B20/18Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1816Testing
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B27/00Editing; Indexing; Addressing; Timing or synchronising; Monitoring; Measuring tape travel
    • G11B27/36Monitoring, i.e. supervising the progress of recording or reproducing
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B33/00Constructional parts, details or accessories not provided for in the other groups of this subclass
    • G11B33/14Reducing influence of physical parameters, e.g. temperature change, moisture, dust
    • G11B33/1406Reducing the influence of the temperature
    • G11B33/1413Reducing the influence of the temperature by fluid cooling
    • G11B33/142Reducing the influence of the temperature by fluid cooling by air cooling
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B33/00Constructional parts, details or accessories not provided for in the other groups of this subclass
    • G11B33/14Reducing influence of physical parameters, e.g. temperature change, moisture, dust
    • G11B33/1406Reducing the influence of the temperature
    • G11B33/144Reducing the influence of the temperature by detection, control, regulation of the temperature
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B2220/00Record carriers by type
    • G11B2220/20Disc-shaped record carriers
    • G11B2220/25Disc-shaped record carriers characterised in that the disc is based on a specific recording technology
    • G11B2220/2508Magnetic discs
    • G11B2220/2516Hard disks

Abstract

A storage device test slot thermal control system includes a test slot (500, 500a, 500b, 540) including a housing (508, 550) having an outer surface (530, 559), an internal cavity (517, 556) defined by the housing and including a test compartment (526, 560) for receiving and supporting a storage device transporter (400) carrying a storage device (600) for testing, and an inlet aperture (528, 551) extending from the outer surface of the housing to the internal cavity. The storage device test slot thermal control system also includes a cooling conduit (710), and a thermoelectric device (742) mounted to the cooling conduit. The thermoelectric device is configured to cool or heat an air flow entering the internal cavity through the inlet aperture.

Claims

AMENDED CLAIMS received by the International Bureau on 30 December 2009 (30.12.2009)
WHAT ΪS CLAIMED IS:
1 , A storage device test slot thermal control system comprising: a test slot (500, 500a, 500b, 540) comprising: a housing (508, 550) comprising: an outer surface (530, 559), s an internal cavity (517, 556) defined by the housing and comprising a test compartment (526, 560) for receiving a storage device (600) for testing, and an inlet aperture (528, 551) extending from the outer surface of the housing to the internal cavity; 0 a cooling conduit (710); and an thermoelectric device (742) mounted to the cooling conduit and configured to cool or heat an air flow entering the internal cavity through the inlet aperture. 5
2. The storage device test slot thermal control system of claim 1, wherein the cooling conduit is configured to absorb heat dissipated by the thermoelectric device,
3. The storage device test slot thermal control system of claim 1 or claim 2, wherein the cooling conduit is liquid cooled.
4. The storage device test slot thermal control system of claim 1 , wherein the thermoelectric device comprises a thermoelectric cooler.
5. The storage device test slot iheπnal control system of claim 1 , further comprising a heatpump heatsinJc (743) connected to the thermoelectric device.
6. The storage device test slot thermal control system of claim 1, wherein the test slot includes a ducting conduit (532) disposed within the internal cavity and configured to convey an air flow from the inlet aperture towards the test compartment.
59
7. The storage device test slot thermal control system of claim 6, wherein the ducting conduit is configured to direct an air flow underneath a storage device disposed within the test compartment.
8. The storage device test slot thermal control system of claim 6 or claim 7, further comprising an electric heating device (729) disposed within the internal cavity and configured to heat the air flow being conveyed through the ducting conduit.
9. The storage device test slot thermal control system of claim 8, wherein the electric heating device comprises a resistive heater.
10, The storage device test slot thermal control system of claim 8, farther comprising a heater heatsiπk (728) disposed within the ducting conduit and connected to the eleαric heating device, wherein the electric heating device is configured to heat the heater heatsink.
11 , The storage device test slot thermal control system of claim 8, further comprising test electronics (160) in electrical communication with the thermoelectric device and/or the electric heating device and configured to control current flows to the thermoelectric device and/or the electric heating device.
12, The storage device test slot thermal control system of claim 11 , further comprising one or more temperature sensors (526) disposed within the internal cavity, wherein the one or more temperature sensors are electrically connected to the test electronics, and wherein the test electronics are configured to control flows of current to the thermoelectric device and/or the electric heating device "based, at least in part, on signals received from the one or more temperature sensors.
60
13. The storage device test slot thermal control system of claim 1 , further comprising test electronics (160) configured to communicate one or more test routines to a storage device within the test compartment.
14. The storage device test slot thermal control system of claim 13, further comprising a test slot connector (524, 574) disposed within the internal cavity and configured to engage a mating connector on a storage device, wherein the test slot connector is electrically connected to the test electronics.
15, The storage device test slot thermal control system of claim 13 , wherein the test electronics are disposed outside of the internal cavity,
16. The storage device test slot thermal control system of claim 15, further comprising a connection interface circuit (182) disposed within the internal cavity, wherein the connection interface circuit is configured to provide electrical communication between the test slot connector and the iest electronics.
17. A storage device test rack ( 100) comprising: multiple test slots (500, 500a, 500b, 540); a cooling conduit (710) configured to convey a liquid toward the test slots; and multiple thermoelectric devices (742) each mounted to the cooling conduit and each associated with a corresponding one of the test slots, wherein the thermoelectric devices are each configured to cool or heat an air flow entering the associate one of the test slots.
18. The storage device test rack of claim 17, comprising a test slot compartment (700) comprising the test slots, the cooling conduit, and the thermoelectric devices; and a test electronics compartment (800) comprising test electronics (160) configured to communicate with the test slots for executing a test algorithm.
61
19. The storage device test rack of claim 18, further comprising a heat exchanger (810) disposed within the test electronics compartment and in fluid communication with the cooling conduit, wherein the heat exchanger is configured to cool an air flow within the test electronics compartment, thereby to the cool the test electronics.
20. The storage device test rack of claim 19, further comprising an air mover (816) disposed within the test electronics compartment and configured to direct on air flow across the heat exchanger and toward the test electronics for cooling the test electronics.
21. The storage device test rack of claim 20, further comprising an air filter (46) disposed between the air mover and the heat exchanger and configured to filter an air flow within the test electronics compartment.
22. The storage device test rack of claim 20, further comprising an air filter (46) disposed at an inlet of the air mover and configured to filter an air flow directed toward the test electronics compartment.
23. The storage device test rack of any one of claims 18-22, wherein the thermoelectric devices are in electrical communication with the test electronics, wherein the test electronics are configured to control operation of the thermoelectric devices.
24 The storage device test rack of claim 18, wherein each of the test slots includes one or more temperature sensors (526) in electrical communication with the test electronics, and wherein the test electronics are configured to control operation of the thermoelectric devices based, at least in part, on signals received from the one or more temperature sensors.
62
25. The storage device test rack of any one of claim 18, wherein the test electronics compartment is substantially isolated from the test slot compartment such that air flow between the test electronics compartment and the test slot compartment is substantially inhibited.
5
26. The storage device test rack of claim 17j wherein the cooling conduit is configured to absorb heat dissipated by the thermoelectric devices.
27. The storage device test rack of claim 17, wherein the thermoelectric o devices are operable to remove heat energy from the cooling conduit.
28. The storage device test rack of claim 17, wherein the thermoelectric devices are operable to remove heat energy from a liquid flowing in the cooling conduit.
63
PCT/US2009/040835 2008-04-17 2009-04-16 Temperature control within storage device testing systems WO2009129403A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/105,107 2008-04-17
US12/105,107 US8102173B2 (en) 2008-04-17 2008-04-17 Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit

Publications (3)

Publication Number Publication Date
WO2009129403A2 WO2009129403A2 (en) 2009-10-22
WO2009129403A3 WO2009129403A3 (en) 2009-12-23
WO2009129403A4 true WO2009129403A4 (en) 2010-03-04

Family

ID=41199653

Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/US2009/039934 WO2009129104A2 (en) 2008-04-17 2009-04-08 Temperature control within disk drive testing systems
PCT/US2009/040835 WO2009129403A2 (en) 2008-04-17 2009-04-16 Temperature control within storage device testing systems

Family Applications Before (1)

Application Number Title Priority Date Filing Date
PCT/US2009/039934 WO2009129104A2 (en) 2008-04-17 2009-04-08 Temperature control within disk drive testing systems

Country Status (5)

Country Link
US (1) US8102173B2 (en)
JP (1) JP2011520211A (en)
CN (1) CN102067058A (en)
MY (1) MY149745A (en)
WO (2) WO2009129104A2 (en)

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US8102173B2 (en) 2012-01-24
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JP2011520211A (en) 2011-07-14
US20090261228A1 (en) 2009-10-22
WO2009129403A3 (en) 2009-12-23
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WO2009129403A2 (en) 2009-10-22
CN102067058A (en) 2011-05-18

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