WO2010031220A1

WO2010031220A1 - A testing connector flat roof having multi-group connection trays

Info

Publication number: WO2010031220A1
Application number: PCT/CN2008/072431
Authority: WO
Inventors: 江斌; 沈奶连; 涂建坤; 池敏雁; 尹莹; 龚江疆
Original assignee: 上海电缆研究所; 上海赛克力光电缆有限责任公司
Priority date: 2008-09-18
Filing date: 2008-09-19
Publication date: 2010-03-25
Also published as: CN101676736A; CN101676736B; CH702178B1

Abstract

A testing connector flat roof having multi-group connection trays(1,3), which includes at least two group connection trays. Each group connection tray has the same structure, so it may test conveniently to reduce the time of testing. Each group connection tray has different structure to adapt for different testing condition.

Description

Test wiring platform with multiple sets of wiring pads

Technical field

The present invention relates to a combined clamp device for testing cable performance parameters, and more particularly to a wiring platform that can be quickly wired or tested for cables with higher frequency requirements. Background technique

The wiring device used for cable testing determines the test conditions of the cable according to the structure of the fixture itself. The higher the test frequency, the shorter the cable stripping length must be, which puts higher requirements on the structure and shielding effect of the entire wiring device.

The Chinese utility model patent with the bulletin number CN2709992Y relates to such a cable test platform. It is wired by crimping. The utility model comprises a test body mounted on the base, and a cavity connected to the base line in the test body, the cavity body comprises a wiring clamp, a circuit board connecting the test lines in the base, and a shielding material. Wherein, the circuit board is disposed under the cavity, the wiring fixture is on the upper surface of the circuit board, and the button and the connector are further disposed on the fixture. The cable is passed from the outside to the clamp and the circuit board. The clamp is pressed down by the button, the contact spring in the connector is opened, the cable pair extends into the wiring hole, and after the button is released, the spring is closed, so that the connector is reliably clamped. Wiring is achieved by attaching the cable pair to the board. After the test is complete, simply press the button again to pull the line pair out. Very convenient to use. There may be a plurality of wiring jigs arranged in a fan shape. A plurality of pairs of such a cable can be sequentially inserted into the cavity, and connected to the test line through a wire jig in the cavity. The shielding material in the cavity and the cavity serves as a shielding.

From this point of view, this test platform has the advantages of quick connection and disassembly of the wire pair, and also has a certain shielding effect. Meets the needs of most cable testing. However, since the clamp is fixed by inserting the wire pair into the cavity, the clamping is completed only when the pair of strands enters the cavity. If the space left between the clamps to be inserted into the cable is too small, it is very likely that the first pair will be operated. When the other pairs are operated, they need to be bent before they can be operated smoothly, which is easy to cause the pair structure. Changes (such as changes in the shield, etc.), thus affecting high frequency testing. Since this is determined by the structure of the fixture itself, it is difficult to further adjust the structure of the entire test platform to shorten the length of the stripping to accommodate higher frequency testing and shielding requirements. Summary of the invention

One technical problem to be solved by the present invention is to provide a cable test wiring platform that can be quickly wired for cable testing, and also for testing cables with higher frequency requirements, to meet the requirements of different cable test conditions.

In order to solve the above technical problems, the present invention adopts the following technical solutions: A test wiring platform comprising a plurality of sets of wiring pads, comprising at least two sets of wiring pads.

Preferably, the wiring board comprises a quick wiring tray and a high frequency wiring board, the high frequency wiring board comprises a disk body and a first clamp, the first clamp comprises a first base, and is pivotally connected with the first base A cover mechanism is disposed between the first base and the cover plate, and the first base is provided with a contact, and the cover plate is provided with a pressing column at a position corresponding to the contact.

Preferably, the first base comprises a first groove, and the contact is disposed in the first groove, and the pressing column on the cover plate can be embedded in the first groove.

Preferably, the first base and the cover are pivotally connected at respective ends, and the first groove is disposed at a beginning end of the first base. Further, the disk body of the high frequency wiring board is provided with a second groove, and the first jig is embedded in the second groove. Preferably, the first clip has a plurality of, and is evenly distributed on the high frequency wiring board in the circumferential direction.

Further, the center of the disc body of the high frequency wiring board is provided with a through counterbore.

Preferably, the high frequency terminal block further includes a first wire latch that cooperates with the counterbore, and the first wire pin is provided with a third groove that communicates with the first groove.

Preferably, the high frequency wiring board further comprises a second wire latch matched with the counterbore, the second wire pin is provided with a fourth groove communicating with the first groove, and the center is provided with a through hole.

Further, the high frequency wiring board further includes a second clamp that clamps the cable in a vertical direction.

Preferably, the first and second panels are further included, and the quick wiring tray and the high frequency wiring board are respectively disposed on the first and second panels.

The invention may comprise two or more sets of test pads. The same structure can be used between each group of wiring panels, which can facilitate testing and shorten the test time; each group of wiring panels can also have different structures to adapt to different test conditions. When using the wiring platform, if testing the cable with lower frequency requirements, connect it to the quick wiring terminal; if you need cable test for higher frequency requirements, connect the high frequency wiring terminal, you can choose different according to different frequency test requirements. Wiring terminal.

Preferably, the invention realizes the wiring by the matching arrangement of the pressing column and the contact: the first groove is provided with a contact, the cable pair enters the first groove, the first clamp is closed, and the pressing column can press the wire pair down On the contacts, the connection is made and the locking mechanism ensures good contact of the pairs with the contacts.

Since the first clamp is a clamshell clamp, after the cover is opened, sufficient space is reserved for the cable to be connected. As long as each wire pair can be in contact with the contact, the cover can be closed. Compared with prior art plug-in jigs, such jigs can greatly shorten the stripping length, preferably, the arrangement of the first jig in the circumferential direction, and the design of the first groove at the front end of the first jig can be more effective. Shorten the cable stripping length. Therefore, the present invention can be used for higher frequency testing.

In addition, the present invention fully considers the shielding effect: the embedded fit of the pressing column and the first groove; the entire first fixture is buried In the second groove of the high frequency terminal block; and the cooperation of the central counterbore with the first and second wire pins, the effective shielding can be ensured.

DRAWINGS

1 is a perspective view of a test wiring platform including a plurality of sets of wiring pads according to the present invention.

2 is a schematic structural view of a high frequency wiring board according to the present invention.

FIG. 3 is a schematic structural view of the first jig and the first groove in the high frequency wiring board.

Figure 4 is a plan view of the high frequency wiring board after the second jig is removed.

Figure 5 is a schematic view showing the assembly of the high frequency wiring board and the first and second wire pins.

Figure 6 is a schematic view showing the structure of the first wire latch.

Figure 7 is a schematic view showing the structure of the second wire latch.

among them,

Quick wiring pad

2. First panel

3. High frequency wiring board

4. Second panel

31. Second base

32. First fixture

33. Second fixture

34. Second groove

35. Counterbore

36. First wire latch

37. Second wire latch

38. Contacts

321. First groove

322. Locking mechanism

323. Pressure column

324. Cover

325. First base

361. Third groove

371. Fourth groove detailed description

As shown in Figures 1-7, Figure 1 shows a test platform to which the present invention relates. It consists of two panels in different directions. A pair of quick wiring pads 1 are arranged on the first panel 2, and a test body is arranged on the base of the quick wiring board 1. The test body has a cavity therein, and the cavity body comprises four plug-in clamps (third clamp), and the base is The test board is connected to the board, as well as the shielding material. The fixtures are arranged in a fan-shaped manner, the cable is split into four pairs of wires, and the chambers of the respective fixtures are sequentially inserted, and the connection between the pair of wires and the circuit board in the cavity is realized by pressing down. It is convenient to use this type of wiring to enter and draw the wire, but since the clamp is fixed by inserting the wire into the cavity, the clamping is completed only when the pair of wires enters the cavity. If the space left between the clamps to be inserted into the cable is too small, it is very likely that the first pair will be operated. When the other pairs are operated, they need to be bent before they can be operated smoothly, which is easy to cause the pair structure. Changes (such as changes in the shield, etc.), thus affecting high frequency testing. With this type of clamp clamping cable test, the cable stripping length is required to be long, and since the outer surface of the cable is exposed on the base, the shielding effect is not optimal, so the wiring board is suitable for testing of lower frequency cables.

The second panel 4 is provided with a pair of high frequency wiring pads 3. See the structural diagram of Figure 2. The terminal block includes a second base 31. The second base 31 is provided with four second recesses 34 equally spaced in the circumferential direction, and a first clamp 32 is embedded in each of the recesses. The first clamp 32 includes a first base 325 and a cover 324. The cover 324 is pivotally coupled to the first base 325 at respective ends, and the first base 325 is fixedly coupled to the second recess 34. A locking mechanism 322 is provided at an intermediate portion of the first base 325 and the cover 324. The cover 324 is turned down and closed with the first base 325, and the locking mechanism 322 can fasten the two. The cover 324 may be slightly longer than the first base 325. The first end 325 is provided with a first recess 321 at the beginning of the first base 325, and the first recess 321 is provided with a contact 38, the contact 38 and the second base 31. The board or test signal line is connected. A pressing column 323 is disposed at a corresponding position of the cover plate 324. When the cover plate 324 and the first base 325 are closed, the pressing column 323 can be embedded in the first recess 321 . When the wire is coming in, due to the downward pressure of the pressing column 323 , the pair of wires can be connected to the contacts 38.

The high frequency terminal block is wired with a flip type clamp compared to the quick wiring pad. The first recess 321 is provided with a contact 38. When the cable pair enters the first recess 321 and the first clamp 32 is closed, the pressing column 323 can press the pair on the contact 38 to realize the connection and lock. The tightening mechanism 322 ensures good contact of the pairs with the contacts 38.

Since the first jig 32 is a clamshell type jig, after the cover plate is opened, sufficient space is reserved for the cable to be connected, and as long as each wire pair can be in contact with the contact, the cover plate 32 can be closed. This type of jig can greatly shorten the stripping length compared to prior art plug-in jigs. Preferably, the arrangement of the first jig 32 in the circumferential direction and the design of the first groove 321 at the front end of the first jig 32 can better shorten the length of the cable stripping.

In addition, the press post 323 is fitted into the first recess 321 , and the entire first clamp 32 is embedded in the high frequency wiring board 3 . Both of the grooves 34 can provide a good shielding effect.

Preferably, the center of the high frequency terminal block 3 is provided with a through counterbore 35, and correspondingly, a first wire pin 36 and a second wire pin 37 are respectively engaged therewith. The first wire latch 36 has almost the same shape as the second wire latch 37, and is provided with four third grooves 361 (or fourth grooves 371) corresponding to the four first clamps 32 (ie, simultaneously and A groove 321 corresponds to the communication. The only difference is that the second wire latch 37 is also provided with a through hole 372 at the center. The two fittings are inserted into the counterbore 35 and fixed to the high frequency terminal block 3. The purpose of the groove is to not only fix the wire pair but also shield the effect. The wire pairs can be perforated into the cable clamp from different directions according to the actual needs of the test. The first wire latch 36 is used when the cable enters the test from the front of the high frequency terminal block 3. The cable is vertically clamped by the second jig 33, and the pair is separated at the center of the high frequency terminal 3, and sequentially enters the respective third groove 361 and the first groove 321 under the first jig 32. When the cable enters from the reverse direction, the second wire latch 37 can be inserted.

The high-frequency wiring strip has a short stripping length of only 19 mm and a good shielding effect, which is more suitable for high-frequency testing. When testing, the same wiring harness is used in pairs, one end of the cable is connected to one high frequency wiring board, and the other end is connected to another high frequency wiring board. The same is true for cable connections when testing at lower frequencies.

When the measurement frequency is relatively low, the length of the stripping is allowed to be long. The quick wiring board can achieve the purpose of quick wiring and ensure the measurement accuracy. When the measurement frequency is high, the stripping length is allowed to be short, and the stripping length is at this time. The wire pair has a strong rigidity, the wire loading requirements are relatively high, and a corresponding fixture is required, so the wire loading cycle is relatively long. Through this combination, the invention can select a suitable test wiring board on the same equipment according to different test requirements, and meet the test requirements of various cables.

Claims

Rights request

1. A test wiring platform comprising a plurality of sets of wiring pads, characterized in that it comprises at least two sets of wiring pads.

2. The test wiring platform comprising a plurality of sets of wiring boards according to claim 1, wherein: said wiring board comprises a quick wiring board (1) and a high frequency wiring board (3), said high frequency wiring board ( 3) comprising a disk body and a first clamp, the first clamp (32) comprising a first base (325), and a cover plate (324) pivotally connected to the first base (325), the first base ( A locking mechanism (322) is disposed between the 325) and the cover plate (324), and the first base (325) is provided with a contact (38), and the cover plate (324) is located at a position corresponding to the contact (38). There is a pressure column (323).

3. The test wiring platform according to claim 2, wherein: the first base (325) comprises a first recess (321), and the contact (38) is disposed in the first recess. In the groove (321), the pressing column (323) on the cover plate (324) can be embedded in the first groove (321).

4. The test wiring platform of the multi-group wiring board according to claim 3, wherein: the first base (325) and the cover plate (324) are pivotally connected at respective ends, the first groove (321) Located at the beginning of the first base (325).

The test wiring platform of the multi-group wiring board according to claim 4, wherein: the disk body of the high frequency wiring board (3) is provided with a second groove (34), the first The clamp (32) is embedded in the second recess (34).

6. The test wiring platform comprising a plurality of sets of wiring boards according to claim 5, wherein: the plurality of first clamps (32) are pluralityed and distributed on the high frequency wiring board (3) in the circumferential direction.

7. The test wiring platform comprising a plurality of sets of wiring boards according to claim 6, wherein: the center of the disk body of the high frequency wiring board (3) is provided with a through hole (35).

8. The test wiring platform comprising a plurality of sets of wiring pads according to claim ,, characterized in that: the high frequency wiring board (3) further comprises a first wire latch (36) cooperating with the counterbore (35), The first wire latch (36) is provided with a third groove (361) communicating with the first groove (321).

9. The test wiring platform comprising a plurality of sets of wiring pads according to claim ,, characterized in that: the high frequency wiring board (3) further comprises a second wire latch (37) cooperating with the counterbore (35), The second wire latch (37) is provided with a fourth groove (371) communicating with the first groove (321), and a through hole (372) is provided at the center.

10. The test wiring platform comprising a plurality of sets of wiring boards according to claim 8, wherein: said high frequency wiring board (3) further comprises a second clamp (33) for holding the cable in a vertical direction.

The test wiring platform with a plurality of sets of wiring boards according to any one of claims 1 to 10, further comprising first and second panels (2, 4), the quick wiring tray (1) ) and the high frequency wiring board (3) are respectively arranged on the first and second panels (2, 4).