WO2011116196A1 - Intensity noise reduction methods and apparatus for interferometric sensing and imaging systems - Google Patents
Intensity noise reduction methods and apparatus for interferometric sensing and imaging systems Download PDFInfo
- Publication number
- WO2011116196A1 WO2011116196A1 PCT/US2011/028826 US2011028826W WO2011116196A1 WO 2011116196 A1 WO2011116196 A1 WO 2011116196A1 US 2011028826 W US2011028826 W US 2011028826W WO 2011116196 A1 WO2011116196 A1 WO 2011116196A1
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- Prior art keywords
- attenuator
- signal
- laser
- amplifier
- control signal
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03G—CONTROL OF AMPLIFICATION
- H03G3/00—Gain control in amplifiers or frequency changers without distortion of the input signal
- H03G3/20—Automatic control
- H03G3/30—Automatic control in amplifiers having semiconductor devices
- H03G3/3084—Automatic control in amplifiers having semiconductor devices in receivers or transmitters for electromagnetic waves other than radiowaves, e.g. lightwaves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
- G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
- G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
- G01B9/02074—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer of the detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02083—Interferometers characterised by particular signal processing and presentation
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/60—Receivers
- H04B10/61—Coherent receivers
- H04B10/616—Details of the electronic signal processing in coherent optical receivers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/60—Receivers
- H04B10/66—Non-coherent receivers, e.g. using direct detection
- H04B10/67—Optical arrangements in the receiver
- H04B10/671—Optical arrangements in the receiver for controlling the input optical signal
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Computer Networks & Wireless Communication (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA2765416A CA2765416C (en) | 2010-03-17 | 2011-03-17 | Intensity noise reduction methods and apparatus for interferometric sensing and imaging systems |
JP2012541238A JP5666617B2 (en) | 2010-03-17 | 2011-03-17 | Method and apparatus for reducing intensity noise for interference sensing and image acquisition systems |
EP11710638.5A EP2547982B1 (en) | 2010-03-17 | 2011-03-17 | Intensity noise reduction methods and apparatus for interferometric sensing and imaging systems |
AU2011227178A AU2011227178B2 (en) | 2010-03-17 | 2011-03-17 | Intensity noise reduction methods and apparatus for interferometric sensing and imaging systems |
ES11710638.5T ES2645392T3 (en) | 2010-03-17 | 2011-03-17 | Methods and apparatus for intensity noise reduction for interferometric detection and imaging systems |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US31475910P | 2010-03-17 | 2010-03-17 | |
US61/314,759 | 2010-03-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2011116196A1 true WO2011116196A1 (en) | 2011-09-22 |
Family
ID=44115579
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2011/028826 WO2011116196A1 (en) | 2010-03-17 | 2011-03-17 | Intensity noise reduction methods and apparatus for interferometric sensing and imaging systems |
Country Status (7)
Country | Link |
---|---|
US (3) | US8948613B2 (en) |
EP (1) | EP2547982B1 (en) |
JP (2) | JP5666617B2 (en) |
AU (1) | AU2011227178B2 (en) |
CA (1) | CA2765416C (en) |
ES (1) | ES2645392T3 (en) |
WO (1) | WO2011116196A1 (en) |
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US9702686B2 (en) | 2011-08-19 | 2017-07-11 | Michelson Diagnostics Ltd | Multiple measurement channel detector circuit for interferometers |
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2011
- 2011-03-17 JP JP2012541238A patent/JP5666617B2/en active Active
- 2011-03-17 CA CA2765416A patent/CA2765416C/en active Active
- 2011-03-17 WO PCT/US2011/028826 patent/WO2011116196A1/en active Application Filing
- 2011-03-17 EP EP11710638.5A patent/EP2547982B1/en active Active
- 2011-03-17 US US13/050,410 patent/US8948613B2/en active Active
- 2011-03-17 AU AU2011227178A patent/AU2011227178B2/en active Active
- 2011-03-17 ES ES11710638.5T patent/ES2645392T3/en active Active
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2014
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2018
- 2018-06-25 US US16/017,545 patent/US20180306569A1/en not_active Abandoned
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Cited By (7)
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US9702686B2 (en) | 2011-08-19 | 2017-07-11 | Michelson Diagnostics Ltd | Multiple measurement channel detector circuit for interferometers |
WO2021102349A1 (en) * | 2019-11-22 | 2021-05-27 | Lightmatter Inc. | Linear photonic processors and related methods |
US11093215B2 (en) | 2019-11-22 | 2021-08-17 | Lightmatter, Inc. | Linear photonic processors and related methods |
US11169780B2 (en) | 2019-11-22 | 2021-11-09 | Lightmatter, Inc. | Linear photonic processors and related methods |
US11609742B2 (en) | 2019-11-22 | 2023-03-21 | Lightmatter, Inc. | Linear photonic processors and related methods |
US11768662B1 (en) | 2019-11-22 | 2023-09-26 | Lightmatter, Inc. | Linear photonic processors and related methods |
US11700078B2 (en) | 2020-07-24 | 2023-07-11 | Lightmatter, Inc. | Systems and methods for utilizing photonic degrees of freedom in a photonic processor |
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US8948613B2 (en) | 2015-02-03 |
CA2765416A1 (en) | 2011-09-22 |
ES2645392T3 (en) | 2017-12-05 |
US10006753B2 (en) | 2018-06-26 |
AU2011227178A1 (en) | 2012-01-19 |
US20110228280A1 (en) | 2011-09-22 |
JP2015108626A (en) | 2015-06-11 |
JP2013512441A (en) | 2013-04-11 |
US20150153157A1 (en) | 2015-06-04 |
US20180306569A1 (en) | 2018-10-25 |
EP2547982A1 (en) | 2013-01-23 |
CA2765416C (en) | 2014-05-13 |
JP5913544B2 (en) | 2016-04-27 |
EP2547982B1 (en) | 2017-09-13 |
JP5666617B2 (en) | 2015-02-12 |
AU2011227178B2 (en) | 2013-11-07 |
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