WO2012003064A3 - Dockable backlight - Google Patents

Dockable backlight Download PDF

Info

Publication number
WO2012003064A3
WO2012003064A3 PCT/US2011/038868 US2011038868W WO2012003064A3 WO 2012003064 A3 WO2012003064 A3 WO 2012003064A3 US 2011038868 W US2011038868 W US 2011038868W WO 2012003064 A3 WO2012003064 A3 WO 2012003064A3
Authority
WO
WIPO (PCT)
Prior art keywords
gantry
profile light
docking station
docking
disengaged
Prior art date
Application number
PCT/US2011/038868
Other languages
French (fr)
Other versions
WO2012003064A2 (en
Inventor
Timothy G. Moriarty
Original Assignee
Quality Vision International
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Quality Vision International filed Critical Quality Vision International
Priority to JP2013518407A priority Critical patent/JP5468181B2/en
Priority to EP11801309.3A priority patent/EP2548001B1/en
Publication of WO2012003064A2 publication Critical patent/WO2012003064A2/en
Publication of WO2012003064A3 publication Critical patent/WO2012003064A3/en

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B35/00—Stereoscopic photography
    • G03B35/02—Stereoscopic photography by sequential recording
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features

Abstract

A machine vision system includes a table having a fixture for supporting an object under inspection above the table, a gantry supporting a camera further above the table, a docking station, and a profile light movable together with the gantry between an inspection position beneath the object and a docking position next to the docking station. Fittings are provided for releasably securing the profile light to the gantry and for releasably securing the profile light to the docking station. The profile light can be disengaged from the gantry and engaged with the docking station for moving the profile light to the docking position or disengaged from the docking station and reengaged with the gantry for moving the profile light to the inspection position.
PCT/US2011/038868 2010-07-02 2011-06-02 Dockable backlight WO2012003064A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2013518407A JP5468181B2 (en) 2010-07-02 2011-06-02 Backlight that can be placed in the dock
EP11801309.3A EP2548001B1 (en) 2010-07-02 2011-06-02 Dockable backlight

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/829,619 2010-07-02
US12/829,619 US8325226B2 (en) 2010-07-02 2010-07-02 Dockable backlight

Publications (2)

Publication Number Publication Date
WO2012003064A2 WO2012003064A2 (en) 2012-01-05
WO2012003064A3 true WO2012003064A3 (en) 2012-04-05

Family

ID=45399425

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2011/038868 WO2012003064A2 (en) 2010-07-02 2011-06-02 Dockable backlight

Country Status (4)

Country Link
US (1) US8325226B2 (en)
EP (1) EP2548001B1 (en)
JP (1) JP5468181B2 (en)
WO (1) WO2012003064A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102331239B (en) * 2011-10-09 2013-04-10 湘潭电机力源模具有限公司 Solar thermal power generating system and detection device of condenser reflection surface thereof
CN104697446A (en) * 2013-12-09 2015-06-10 首航节能光热技术股份有限公司 Groove type condenser measuring instrument and measuring method thereof
CN104048606A (en) * 2014-06-25 2014-09-17 燕山大学 Machine vision non-contact automatic precise measuring device for size of railway turnout steel rail part
CN106052558A (en) * 2016-06-22 2016-10-26 首航节能光热技术股份有限公司 Single-camera solar heat collector steel structure support assembling quality detection system

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040075834A1 (en) * 2002-10-16 2004-04-22 Hinds Instruments, Inc. Birefringence measurement of large-format samples
US20040227948A1 (en) * 2003-02-07 2004-11-18 University Of Southern California Reflectometry apparatus and method
JP2008151707A (en) * 2006-12-19 2008-07-03 Sharp Corp Inspection device for display panel

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8330412D0 (en) 1983-11-15 1983-12-21 Renishaw Plc Tool change apparatus
US4629319A (en) * 1984-02-14 1986-12-16 Diffracto Ltd. Panel surface flaw inspection
US4711579A (en) * 1986-08-12 1987-12-08 H. Fred Johnston System for automatically inspecting a flat workpiece for holes
US5754294A (en) * 1996-05-03 1998-05-19 Virginia Semiconductor, Inc. Optical micrometer for measuring thickness of transparent wafers
US6161940A (en) 1998-11-05 2000-12-19 Optical Gaging Products, Inc. Large area collimated substage illuminators for gaging applications
JP3759506B2 (en) * 2003-02-24 2006-03-29 新光電子株式会社 Article shape measuring device
US7266420B2 (en) 2004-04-03 2007-09-04 Gerald Walter Budd Automatic detection system for broken tools in CNC machining centers using advanced machine vision techniques
US7815355B2 (en) * 2005-08-27 2010-10-19 3M Innovative Properties Company Direct-lit backlight having light recycling cavity with concave transflector
CN101551234B (en) * 2008-04-03 2012-05-23 鸿富锦精密工业（深圳）有限公司 Linkage mechanism
GB0818625D0 (en) * 2008-10-10 2008-11-19 Renishaw Plc Backlit vision machine

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040075834A1 (en) * 2002-10-16 2004-04-22 Hinds Instruments, Inc. Birefringence measurement of large-format samples
US20040227948A1 (en) * 2003-02-07 2004-11-18 University Of Southern California Reflectometry apparatus and method
JP2008151707A (en) * 2006-12-19 2008-07-03 Sharp Corp Inspection device for display panel

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2548001A4 *

Also Published As

Publication number Publication date
JP2013533973A (en) 2013-08-29
US20120002039A1 (en) 2012-01-05
EP2548001A2 (en) 2013-01-23
WO2012003064A2 (en) 2012-01-05
EP2548001A4 (en) 2013-02-27
US8325226B2 (en) 2012-12-04
JP5468181B2 (en) 2014-04-09
EP2548001B1 (en) 2013-11-20

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